TWI744562B - 晶片封裝組件及其製造方法 - Google Patents

晶片封裝組件及其製造方法 Download PDF

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TWI744562B
TWI744562B TW107137518A TW107137518A TWI744562B TW I744562 B TWI744562 B TW I744562B TW 107137518 A TW107137518 A TW 107137518A TW 107137518 A TW107137518 A TW 107137518A TW I744562 B TWI744562 B TW I744562B
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package assembly
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陳世傑
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大陸商矽力杰半導體技術(杭州)有限公司
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Abstract

本發明提供了一種晶片封裝組件及其製造方法,透過在位於晶片承載盤周圍的接腳上安裝晶片,以使諸如二極體這樣的裝置在封裝組件的內部與其它晶片電連接,提高的晶片的整合度,減小了週邊電路的體積。

Description

晶片封裝組件及其製造方法
本發明有關半導體技術領域,尤其有關一種晶片封裝組件及其製造方法。
目前的QFN封裝中所採用的引線框架如圖1所示,其包括位於中間的承載盤11和位於承載盤11周圍的接腳12。為了提高封裝組件的整合度,在QFN封裝中,通常會封裝多塊晶片(裸晶片),但所封裝的晶片只疊層或平鋪在引線框架中間的承載盤上,如圖2所示,晶片21與晶片22疊層安裝在承載盤11上,晶片22上電極透過導線221電連接到晶片21上,晶片21上的電極在透過導線211電連接到接腳12上,或者如圖3所示,晶片21與晶片22平鋪在承載盤11上,晶片21與晶片22上的電極分別透過導線211與221電連接到接腳12上。 然而,在某些應用上,希望晶片上的I/O能串聯二極體等晶片,以用於給週邊電路做驅動或保護IC的埠,這時,如圖2與圖3所述,QFN無法將控制晶片或MOS電晶體晶片與二極體晶片整合在同一封裝體內,而是只能在封裝好的晶片週邊電路和獨立的二極體裝置串聯。
有鑑於此,本發明提供了一種晶片封裝組件及其製造方法,以實現將二極體與其它晶片一起整合在封裝體的內部,以實現二極體與其它晶片在封裝體內部的串聯連接。 一種晶片封裝組件,其特徵在於,包括: 引線框架,具有承載盤和位於所述承載盤周圍的多個接腳, 第一晶片,所述第一晶片位於所述承載盤之上, 至少一個第二晶片,所述第二晶片位於所述接腳之上。 較佳地,每一個所述第二晶片位於一個所述接腳上。 較佳地,所述第二晶片的第一表面上具有第一電極,所述第二晶片的第二表面上具有第二電極, 所述第二晶片第二表面朝向所述接腳的第一表面,所述第二電極與所述接腳的第一表面電連接, 所述第一電極透過第一導線與所述第一晶片電連接,以將所述第二晶片與第一晶片串聯連接。 較佳地,所述第一晶片的第一表面為有源面,所述第一晶片的第二表面貼在所述承載盤的第一表面上, 所述第一電極透過第一導線與所述有源面上的一個電極電連接,所述有源面上的剩餘電極透過第二導線與除用於承載所述第二晶片外的所述接腳的第一表面電連接。 較佳地,所述第二晶片為二極體, 所述第一電極為二極體的陽極和陰極中的一個,所述第二電極為二極體的陽極和陰極中的另一個。 較佳地,所述二極體為瞬態抑制二極體或肖特基二極體。 較佳地,所述的晶片封裝組件還包括用於包封所述第一晶片與第二晶片的塑封體, 所述接腳的第二表面和所述承載盤的第二表面裸露在所述塑封體的表面。 較佳地,所述晶片封裝組件為DFN或QFN封裝。 一種晶片封裝組件的製造方法,其特徵在於,包括: 在引線框架的承載盤上安裝第一晶片, 在引線框架的接腳上安裝第二晶片,所述接腳位於所述承載盤的周圍。 較佳地,所述的製造方法還包括在安裝所述第一晶片與第二晶片之前,根據所述第二晶片的尺寸設計所述接腳的結構與尺寸。 較佳地,將所述第二晶片採用導電層貼裝在一個所述接腳上。 較佳地,對所述第一晶片和第二晶片進行DFN或QFN封裝。 由上可見,在本發明提供的晶片封裝組件及其製造方法中,利用在位於晶片承載盤周圍的接腳上安裝晶片,從而可以使諸如二極體這樣的裝置在封裝組件的內部與其它晶片電連接,提高了晶片的整合度,減小了週邊電路的體積。
以下將參照圖式更詳細地描述本發明。在各個圖式中,相同的組成部分採用類似的圖式標記來表示。為了清楚起見,圖式中的各個部分沒有按比例繪製。此外,可能未示出某些眾所周知的部分。為了簡明起見,可以在一幅圖中描述經過數個步驟後獲得的結構。在下文中描述了本發明的許多特定的細節,例如每個組成部分的結構、材料、尺寸、處理工藝和技術,以便更清楚地理解本發明。但正如本發明所屬技術領域人員具有通常知識者能夠理解的那樣,可以不按照這些特定的細節來實現本發明。此外,在本發明中,晶片是指半導體裸晶片。 圖4為依據本發明實施例提供的晶片封裝組件的剖面結構示意圖,圖5為依據本發明實施例提供的晶片封裝組件的俯視圖,下面將結合圖4與圖5來具體闡述本發明。 本發明提供的晶片封裝組件主要包括引線框架、至少一個第一晶片、至少一個第二晶片。其中,所述的引線框架由承載盤11和位於承載盤12周圍的多個接腳12構成,多個接腳12可以對稱地排列在承載盤11的四邊的,也可以僅對稱地排列在承載盤11相對的兩邊。 第一晶片21位於第一承載盤的之上,其包括相對的第一表面與第二表面,第一晶片21的第一表面為有源面,第二表面黏貼在承載盤11上。第二晶片31位於接腳12之上,具體的,每一個第一晶片31均位於一個接腳12上,接腳12用於引出第二晶片31的一個電極,以使該電極與外部其它裝置或電路電連接,接腳12還用於承載第二晶片31,即接腳12為第二晶片31提供機械支撐。 第二晶片31具有相對的第一表面與第二表面,其第一表面上具有第一電極,第二表面上具有第二電極,第二晶片31以第二表面朝向接腳12的第一表面的方式貼裝在接腳12上,使得第二電極與接腳12的第一表面電連接,而第二晶片21的第一電極則透過導線311與第一晶片21的有源面上的電極電連接,第一晶片的有源面上的剩餘電極透過導線211與除用於承載第二晶片21外的接腳12的第一表面電連接。在晶片封裝結構中,第二晶片31與第二晶片21串聯連接。 在本發明實施例提供的晶片封裝組件中,第二晶片31為二極體,則所述的第一電極為二極體的陽極和陰極中的一個,所述第二電極為二極體的陽極和陰極中的另一個。第二晶片31可以具體為瞬態抑制二極體或肖特基二極體。第一晶片21可以為MOS電晶體,如功率MOS電晶體,也可以為控制晶片。 此外,所述的晶片封裝組件還進一步包括塑封體41,塑封體41用於包封第一晶片21和第二晶片31,且接腳12第二表面和承載盤的第二表面均裸露在塑封體41的表面,以作為所述晶片封裝組件與外部電連接的外接腳。 根據接腳12在承載盤11周圍的排列情況,所述晶片封裝組件可以為DFN或QFN封裝。且在所述晶片封裝組件中,還可以包括第三晶片(圖4和圖5中未畫出),所述第三晶片堆疊在第一晶片21之上或者與第一晶片21一起平鋪在承載盤11上。若第三晶片堆疊在第一晶片21之上,則所述第三晶片上的電極透過導線先電連接到第一晶片21的第一表面上,然後再透過導線由第一表面引出到接腳12上,若第三晶片平鋪在承載盤11上,則第三晶片上的電極直接透過導線與接腳12電連接。在所述晶片封裝組件中,還可包括多個第二晶片,每一個第二晶片安裝在一個接腳上。 此外,本發明還提供了一種晶片封裝組件的製造方法,該方法主要包括在引線框架的承載盤上安裝第一晶片,而在引線框架的接腳上安裝第二晶片,所述接腳位於承載盤的周圍。所述製造方法還進一步包括形成所述引線框架,在形成所述引線框架時,根據所述第二晶片的尺寸設計所述接腳的結構與尺寸,以使得所述接腳與所述第二晶片相匹配。可以採用DFN或QFN封裝來對第一晶片和第二晶片進行封裝。具體地,在安裝第二晶片的過程中,可以使第二晶片透過導電層貼裝在所述接腳上,使得所述接腳既用作所述第二晶片與外部電路或裝置電連接的觸點,又作為所述第二晶片的機械支撐體,以承載所述第二晶片。 由上可見,在本發明提供的晶片封裝組件及其製造方法中,利用在位於晶片承載盤周圍的接腳上安裝晶片,從而可以使諸如二極體這樣的裝置在封裝組件的內部與其它晶片電連接,提高的晶片的整合度,減小了週邊電路的體積。 依照本發明的實施例如上文所述,這些實施例並沒有詳盡敘述所有的細節,也不限制該發明僅為所述的具體實施例。顯然,根據以上描述,可作很多的修改和變化。本說明書選取並具體描述這些實施例,是為了更好地解釋本發明的原理和實際應用,從而使本發明所屬技術技術領域人員具有通常知識者能很好地利用本發明以及在本發明基礎上的修改使用。本發明僅受申請專利範圍及其全部範圍和等效物的限制。
11‧‧‧承載盤 12‧‧‧接腳 21‧‧‧晶片 22‧‧‧晶片 31‧‧‧晶片 41‧‧‧晶片 211‧‧‧導線 221‧‧‧導線 311‧‧‧導線
透過以下參照圖式對本發明實施例的描述,本發明的上述以及其他目的、特徵和優點將更為清楚,在圖式中: 圖1為QFN封裝組件中的引線框架的結構示意圖; 圖2為現有技術實現的一種多晶片整合的QFN封裝組件結構示意圖; 圖3為現有技術實現的另一種多晶片整合的QFN封裝組件結構示意圖; 圖4為依據本發明實施例提供的晶片封裝組件的剖面結構示意圖; 圖5為依據本發明實施例提供的晶片封裝組件的俯視圖。
11‧‧‧承載盤
12‧‧‧接腳
21‧‧‧晶片
31‧‧‧晶片
41‧‧‧晶片
211‧‧‧導線
311‧‧‧導線

Claims (10)

  1. 一種晶片封裝組件,其特徵在於,該晶片封裝組件包括:引線框架,具有承載盤和位於該承載盤周圍的多個與該承載盤分離的接腳;第一晶片,該第一晶片位於該承載盤之上;以及至少一個第二晶片,該第二晶片位於該接腳之上,其中該第一晶片的I/O端透過第一導線直接與該第二晶片串聯連接,並且,該第一晶片的有源面透過第二導線與沒有用於承載該第二晶片的該接腳電連接,且該晶片封裝組件為DFN或QFN封裝。
  2. 根據申請專利範圍第1項所述的晶片封裝組件,其中,每一個該第二晶片位於一個該接腳上。
  3. 根據申請專利範圍第2項所述的晶片封裝組件,其中,該第二晶片的第一表面上具有第一電極,該第二晶片的第二表面上具有第二電極,該第二晶片第二表面朝向該接腳的第一表面,該第二電極與該接腳的第一表面電連接,且該第一電極透過該第一導線與該第一晶片電連接。
  4. 根據申請專利範圍第3項所述的晶片封裝組件,其中,該第一晶片的第一表面為該有源面,該第一晶片的第二表面貼在該承載盤的第一表面上,且該第一電極透過該第一導線與該有源面上的一個電極電連接,該第一晶片的該有源面上的剩餘電極透過該第二導線與用於承載該第二晶片外的該接腳的第一表面電連接。
  5. 根據申請專利範圍第3項所述的晶片封裝組件,其中,該第二晶片為二極體,該第一電極為二極體的陽極和陰極中的一個,該第二電極為二極體的陽極和陰極中的另一個。
  6. 根據申請專利範圍第5項所述的晶片封裝組件,其中,該二極體為瞬態抑制二極體或肖特基二極體。
  7. 根據申請專利範圍第4項所述的晶片封裝組件,其中,還包括用於包封該第一晶片與第二晶片的塑封體,該接腳的第二表面和該承載盤的第二表面裸露在該塑封體的表面。
  8. 一種晶片封裝組件的製造方法,其特徵在於,該製造 方法包括:在引線框架的承載盤上安裝第一晶片,在引線框架的接腳上安裝第二晶片,該接腳位於該承載盤的周圍且與該承載盤分離,以及以第一導線直接串聯連接該第一晶片的I/O端與該第二晶片,並且,以第二導線電連接該第一晶片的有源面與沒有用於承載該第二晶片的該接腳,該晶片封裝組件為DFN或QFN封裝。
  9. 根據申請專利範圍第8項所述的製造方法,其中,還包括在安裝該第一晶片與第二晶片之前,根據該第二晶片的尺寸設計該接腳的結構與尺寸。
  10. 根據申請專利範圍第8項所述的製造方法,其中,將該第二晶片採用導電層貼裝在一個該接腳上。
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US11380631B2 (en) * 2019-11-27 2022-07-05 Texas Instruments Incorporated Lead frame for multi-chip modules with integrated surge protection
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030003630A1 (en) * 2001-06-28 2003-01-02 Junichi Iimura Hybrid integrated circuit device
CN1461051A (zh) * 2002-05-22 2003-12-10 松下电器产业株式会社 半导体装置
US20070216011A1 (en) * 2006-03-17 2007-09-20 Ralf Otremba Multichip module with improved system carrier
CN201681864U (zh) * 2010-04-26 2010-12-22 江苏长电科技股份有限公司 埋入型单基岛多圈引脚无源器件封装结构

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4007798B2 (ja) * 2001-11-15 2007-11-14 三洋電機株式会社 板状体の製造方法およびそれを用いた回路装置の製造方法
JP4413054B2 (ja) * 2004-03-29 2010-02-10 三洋電機株式会社 混成集積回路装置の製造方法
JP5390064B2 (ja) * 2006-08-30 2014-01-15 ルネサスエレクトロニクス株式会社 半導体装置
TWI453844B (zh) * 2010-03-12 2014-09-21 矽品精密工業股份有限公司 四方平面無導腳半導體封裝件及其製法
CN102074541B (zh) 2010-11-26 2014-09-03 天水华天科技股份有限公司 一种无载体无引脚栅格阵列ic芯片封装件及其生产方法
US9397017B2 (en) * 2014-11-06 2016-07-19 Semiconductor Components Industries, Llc Substrate structures and methods of manufacture
CN204289446U (zh) * 2014-12-17 2015-04-22 东莞市欧思科光电科技有限公司 具有发光功能的led驱动ic封装结构
US20190214332A1 (en) * 2018-01-10 2019-07-11 Sirectifier Electronic Co., Ltd. Serially-connected transistor device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030003630A1 (en) * 2001-06-28 2003-01-02 Junichi Iimura Hybrid integrated circuit device
CN1461051A (zh) * 2002-05-22 2003-12-10 松下电器产业株式会社 半导体装置
US20070216011A1 (en) * 2006-03-17 2007-09-20 Ralf Otremba Multichip module with improved system carrier
CN201681864U (zh) * 2010-04-26 2010-12-22 江苏长电科技股份有限公司 埋入型单基岛多圈引脚无源器件封装结构

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