TWI704196B - 導電性塗料及使用其之屏蔽封裝體之製造方法 - Google Patents
導電性塗料及使用其之屏蔽封裝體之製造方法 Download PDFInfo
- Publication number
- TWI704196B TWI704196B TW106108721A TW106108721A TWI704196B TW I704196 B TWI704196 B TW I704196B TW 106108721 A TW106108721 A TW 106108721A TW 106108721 A TW106108721 A TW 106108721A TW I704196 B TWI704196 B TW I704196B
- Authority
- TW
- Taiwan
- Prior art keywords
- package
- parts
- mass
- conductive paint
- epoxy resin
- Prior art date
Links
- 239000003973 paint Substances 0.000 title claims abstract description 57
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 15
- 238000000576 coating method Methods 0.000 claims abstract description 70
- 239000011248 coating agent Substances 0.000 claims abstract description 69
- 239000003822 epoxy resin Substances 0.000 claims abstract description 35
- 229920000647 polyepoxide Polymers 0.000 claims abstract description 35
- 239000002904 solvent Substances 0.000 claims abstract description 23
- 239000011230 binding agent Substances 0.000 claims abstract description 22
- 239000007787 solid Substances 0.000 claims abstract description 22
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 claims abstract description 21
- 239000002923 metal particle Substances 0.000 claims abstract description 21
- 239000007788 liquid Substances 0.000 claims abstract description 10
- 239000004850 liquid epoxy resins (LERs) Substances 0.000 claims abstract description 10
- 239000004848 polyfunctional curative Substances 0.000 claims description 34
- 239000000758 substrate Substances 0.000 claims description 24
- -1 acrylate compound Chemical class 0.000 claims description 20
- KJCVRFUGPWSIIH-UHFFFAOYSA-N 1-naphthol Chemical compound C1=CC=C2C(O)=CC=CC2=C1 KJCVRFUGPWSIIH-UHFFFAOYSA-N 0.000 claims description 9
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 claims description 9
- 239000003566 sealing material Substances 0.000 claims description 8
- 238000005520 cutting process Methods 0.000 claims description 7
- 238000007789 sealing Methods 0.000 claims description 7
- 239000007921 spray Substances 0.000 claims description 7
- 238000010438 heat treatment Methods 0.000 claims description 6
- 238000011049 filling Methods 0.000 claims description 3
- 125000002883 imidazolyl group Chemical group 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 2
- 238000004806 packaging method and process Methods 0.000 claims 1
- 238000005507 spraying Methods 0.000 abstract description 14
- 239000003795 chemical substances by application Substances 0.000 abstract description 12
- 238000000034 method Methods 0.000 abstract description 10
- 239000010408 film Substances 0.000 description 44
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 19
- 229910052802 copper Inorganic materials 0.000 description 12
- 239000010949 copper Substances 0.000 description 12
- 239000002245 particle Substances 0.000 description 12
- 230000000052 comparative effect Effects 0.000 description 8
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- 239000011889 copper foil Substances 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 239000005011 phenolic resin Substances 0.000 description 5
- 229920001721 polyimide Polymers 0.000 description 5
- 239000010409 thin film Substances 0.000 description 5
- 239000004593 Epoxy Substances 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 4
- 239000004843 novolac epoxy resin Substances 0.000 description 4
- 150000003254 radicals Chemical class 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 3
- 229930185605 Bisphenol Natural products 0.000 description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 3
- BAPJBEWLBFYGME-UHFFFAOYSA-N acrylic acid methyl ester Natural products COC(=O)C=C BAPJBEWLBFYGME-UHFFFAOYSA-N 0.000 description 3
- MTHSVFCYNBDYFN-UHFFFAOYSA-N anhydrous diethylene glycol Natural products OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 3
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 239000003607 modifier Substances 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- 238000005476 soldering Methods 0.000 description 3
- 238000003860 storage Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- XLLIQLLCWZCATF-UHFFFAOYSA-N 2-methoxyethyl acetate Chemical compound COCCOC(C)=O XLLIQLLCWZCATF-UHFFFAOYSA-N 0.000 description 2
- SESYNEDUKZDRJL-UHFFFAOYSA-N 3-(2-methylimidazol-1-yl)propanenitrile Chemical compound CC1=NC=CN1CCC#N SESYNEDUKZDRJL-UHFFFAOYSA-N 0.000 description 2
- KWOLFJPFCHCOCG-UHFFFAOYSA-N Acetophenone Chemical compound CC(=O)C1=CC=CC=C1 KWOLFJPFCHCOCG-UHFFFAOYSA-N 0.000 description 2
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 2
- 101000942680 Sus scrofa Clusterin Proteins 0.000 description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 150000001412 amines Chemical class 0.000 description 2
- WTEOIRVLGSZEPR-UHFFFAOYSA-N boron trifluoride Chemical compound FB(F)F WTEOIRVLGSZEPR-UHFFFAOYSA-N 0.000 description 2
- 125000002091 cationic group Chemical group 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- GYZLOYUZLJXAJU-UHFFFAOYSA-N diglycidyl ether Chemical compound C1OC1COCC1CO1 GYZLOYUZLJXAJU-UHFFFAOYSA-N 0.000 description 2
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical compound C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 2
- 238000007598 dipping method Methods 0.000 description 2
- LYCAIKOWRPUZTN-UHFFFAOYSA-N ethylene glycol Natural products OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 2
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 239000003595 mist Substances 0.000 description 2
- UHOVQNZJYSORNB-UHFFFAOYSA-N monobenzene Natural products C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- ZNXKLRKQUSZVQY-UHFFFAOYSA-N 1,6-diisocyanatohexane ethyl carbamate 2-(phenoxymethyl)oxirane prop-2-enoic acid Chemical compound OC(=O)C=C.CCOC(N)=O.C1OC1COC1=CC=CC=C1.O=C=NCCCCCCN=C=O ZNXKLRKQUSZVQY-UHFFFAOYSA-N 0.000 description 1
- AEUZJPHUNWZRCJ-UHFFFAOYSA-N 1-butyl-2-propan-2-ylbenzene Chemical group CCCCC1=CC=CC=C1C(C)C AEUZJPHUNWZRCJ-UHFFFAOYSA-N 0.000 description 1
- SBASXUCJHJRPEV-UHFFFAOYSA-N 2-(2-methoxyethoxy)ethanol Chemical compound COCCOCCO SBASXUCJHJRPEV-UHFFFAOYSA-N 0.000 description 1
- XMNIXWIUMCBBBL-UHFFFAOYSA-N 2-(2-phenylpropan-2-ylperoxy)propan-2-ylbenzene Chemical compound C=1C=CC=CC=1C(C)(C)OOC(C)(C)C1=CC=CC=C1 XMNIXWIUMCBBBL-UHFFFAOYSA-N 0.000 description 1
- PJGMVHVKKXYDAI-UHFFFAOYSA-O 2-(2-undecyl-1h-imidazol-1-ium-1-yl)propanenitrile Chemical compound CCCCCCCCCCCC1=NC=C[NH+]1C(C)C#N PJGMVHVKKXYDAI-UHFFFAOYSA-O 0.000 description 1
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 1
- STHCTMWQPJVCGN-UHFFFAOYSA-N 2-[[2-[1,1,2-tris[2-(oxiran-2-ylmethoxy)phenyl]ethyl]phenoxy]methyl]oxirane Chemical compound C1OC1COC1=CC=CC=C1CC(C=1C(=CC=CC=1)OCC1OC1)(C=1C(=CC=CC=1)OCC1OC1)C1=CC=CC=C1OCC1CO1 STHCTMWQPJVCGN-UHFFFAOYSA-N 0.000 description 1
- UJWXADOOYOEBCW-UHFFFAOYSA-N 2-[[2-[bis[2-(oxiran-2-ylmethoxy)phenyl]methyl]phenoxy]methyl]oxirane Chemical compound C1OC1COC1=CC=CC=C1C(C=1C(=CC=CC=1)OCC1OC1)C1=CC=CC=C1OCC1CO1 UJWXADOOYOEBCW-UHFFFAOYSA-N 0.000 description 1
- PQAMFDRRWURCFQ-UHFFFAOYSA-N 2-ethyl-1h-imidazole Chemical compound CCC1=NC=CN1 PQAMFDRRWURCFQ-UHFFFAOYSA-N 0.000 description 1
- YTWBFUCJVWKCCK-UHFFFAOYSA-N 2-heptadecyl-1h-imidazole Chemical compound CCCCCCCCCCCCCCCCCC1=NC=CN1 YTWBFUCJVWKCCK-UHFFFAOYSA-N 0.000 description 1
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 description 1
- LXBGSDVWAMZHDD-UHFFFAOYSA-N 2-methyl-1h-imidazole Chemical compound CC1=NC=CN1 LXBGSDVWAMZHDD-UHFFFAOYSA-N 0.000 description 1
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 1
- ZCUJYXPAKHMBAZ-UHFFFAOYSA-N 2-phenyl-1h-imidazole Chemical compound C1=CNC(C=2C=CC=CC=2)=N1 ZCUJYXPAKHMBAZ-UHFFFAOYSA-N 0.000 description 1
- LLEASVZEQBICSN-UHFFFAOYSA-N 2-undecyl-1h-imidazole Chemical compound CCCCCCCCCCCC1=NC=CN1 LLEASVZEQBICSN-UHFFFAOYSA-N 0.000 description 1
- VEORPZCZECFIRK-UHFFFAOYSA-N 3,3',5,5'-tetrabromobisphenol A Chemical compound C=1C(Br)=C(O)C(Br)=CC=1C(C)(C)C1=CC(Br)=C(O)C(Br)=C1 VEORPZCZECFIRK-UHFFFAOYSA-N 0.000 description 1
- FRIBMENBGGCKPD-UHFFFAOYSA-N 3-(2,3-dimethoxyphenyl)prop-2-enal Chemical compound COC1=CC=CC(C=CC=O)=C1OC FRIBMENBGGCKPD-UHFFFAOYSA-N 0.000 description 1
- UIDDPPKZYZTEGS-UHFFFAOYSA-N 3-(2-ethyl-4-methylimidazol-1-yl)propanenitrile Chemical compound CCC1=NC(C)=CN1CCC#N UIDDPPKZYZTEGS-UHFFFAOYSA-N 0.000 description 1
- SZUPZARBRLCVCB-UHFFFAOYSA-N 3-(2-undecylimidazol-1-yl)propanenitrile Chemical compound CCCCCCCCCCCC1=NC=CN1CCC#N SZUPZARBRLCVCB-UHFFFAOYSA-N 0.000 description 1
- ZVYGIPWYVVJFRW-UHFFFAOYSA-N 3-methylbutyl prop-2-enoate Chemical compound CC(C)CCOC(=O)C=C ZVYGIPWYVVJFRW-UHFFFAOYSA-N 0.000 description 1
- ULKLGIFJWFIQFF-UHFFFAOYSA-N 5K8XI641G3 Chemical compound CCC1=NC=C(C)N1 ULKLGIFJWFIQFF-UHFFFAOYSA-N 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229910015900 BF3 Inorganic materials 0.000 description 1
- BTBUEUYNUDRHOZ-UHFFFAOYSA-N Borate Chemical compound [O-]B([O-])[O-] BTBUEUYNUDRHOZ-UHFFFAOYSA-N 0.000 description 1
- 239000004640 Melamine resin Substances 0.000 description 1
- 229920000877 Melamine resin Polymers 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- XBDQKXXYIPTUBI-UHFFFAOYSA-M Propionate Chemical compound CCC([O-])=O XBDQKXXYIPTUBI-UHFFFAOYSA-M 0.000 description 1
- DAKWPKUUDNSNPN-UHFFFAOYSA-N Trimethylolpropane triacrylate Chemical compound C=CC(=O)OCC(CC)(COC(=O)C=C)COC(=O)C=C DAKWPKUUDNSNPN-UHFFFAOYSA-N 0.000 description 1
- XRMBQHTWUBGQDN-UHFFFAOYSA-N [2-[2,2-bis(prop-2-enoyloxymethyl)butoxymethyl]-2-(prop-2-enoyloxymethyl)butyl] prop-2-enoate Chemical compound C=CC(=O)OCC(COC(=O)C=C)(CC)COCC(CC)(COC(=O)C=C)COC(=O)C=C XRMBQHTWUBGQDN-UHFFFAOYSA-N 0.000 description 1
- KXKVLQRXCPHEJC-UHFFFAOYSA-N acetic acid trimethyl ester Natural products COC(C)=O KXKVLQRXCPHEJC-UHFFFAOYSA-N 0.000 description 1
- 150000001252 acrylic acid derivatives Chemical class 0.000 description 1
- 125000003647 acryloyl group Chemical group O=C([*])C([H])=C([H])[H] 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 239000002390 adhesive tape Substances 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 229920000180 alkyd Polymers 0.000 description 1
- 125000000732 arylene group Chemical group 0.000 description 1
- HLPKYOCVWVMBMR-UHFFFAOYSA-N azane benzylbenzene Chemical compound N.N.C=1C=CC=CC=1CC1=CC=CC=C1 HLPKYOCVWVMBMR-UHFFFAOYSA-N 0.000 description 1
- 125000002619 bicyclic group Chemical group 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000004305 biphenyl Substances 0.000 description 1
- 235000010290 biphenyl Nutrition 0.000 description 1
- NCEXYHBECQHGNR-UHFFFAOYSA-N chembl421 Chemical compound C1=C(O)C(C(=O)O)=CC(N=NC=2C=CC(=CC=2)S(=O)(=O)NC=2N=CC=CC=2)=C1 NCEXYHBECQHGNR-UHFFFAOYSA-N 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 229930003836 cresol Natural products 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 125000003700 epoxy group Chemical group 0.000 description 1
- XTHFKEDIFFGKHM-UHFFFAOYSA-N ethylene glycol dimethyl ether Natural products COCCOC XTHFKEDIFFGKHM-UHFFFAOYSA-N 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 238000009501 film coating Methods 0.000 description 1
- 239000003063 flame retardant Substances 0.000 description 1
- VOOLKNUJNPZAHE-UHFFFAOYSA-N formaldehyde;2-methylphenol Chemical compound O=C.CC1=CC=CC=C1O VOOLKNUJNPZAHE-UHFFFAOYSA-N 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 239000004845 glycidylamine epoxy resin Substances 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- YDKNBNOOCSNPNS-UHFFFAOYSA-N methyl 1,3-benzoxazole-2-carboxylate Chemical compound C1=CC=C2OC(C(=O)OC)=NC2=C1 YDKNBNOOCSNPNS-UHFFFAOYSA-N 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 150000004010 onium ions Chemical class 0.000 description 1
- AFEQENGXSMURHA-UHFFFAOYSA-N oxiran-2-ylmethanamine Chemical compound NCC1CO1 AFEQENGXSMURHA-UHFFFAOYSA-N 0.000 description 1
- 229920001568 phenolic resin Polymers 0.000 description 1
- 150000002989 phenols Chemical class 0.000 description 1
- 239000003505 polymerization initiator Substances 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 230000001568 sexual effect Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 150000003505 terpenes Chemical class 0.000 description 1
- 235000007586 terpenes Nutrition 0.000 description 1
- CIHOLLKRGTVIJN-UHFFFAOYSA-N tert‐butyl hydroperoxide Chemical compound CC(C)(C)OO CIHOLLKRGTVIJN-UHFFFAOYSA-N 0.000 description 1
- BJQWBACJIAKDTJ-UHFFFAOYSA-N tetrabutylphosphanium Chemical compound CCCC[P+](CCCC)(CCCC)CCCC BJQWBACJIAKDTJ-UHFFFAOYSA-N 0.000 description 1
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 1
- 239000002562 thickening agent Substances 0.000 description 1
- 238000001721 transfer moulding Methods 0.000 description 1
- AAAQKTZKLRYKHR-UHFFFAOYSA-N triphenylmethane Chemical compound C1=CC=CC=C1C(C=1C=CC=CC=1)C1=CC=CC=C1 AAAQKTZKLRYKHR-UHFFFAOYSA-N 0.000 description 1
- WLOQLWBIJZDHET-UHFFFAOYSA-N triphenylsulfonium Chemical compound C1=CC=CC=C1[S+](C=1C=CC=CC=1)C1=CC=CC=C1 WLOQLWBIJZDHET-UHFFFAOYSA-N 0.000 description 1
- 239000012953 triphenylsulfonium Substances 0.000 description 1
- 239000013585 weight reducing agent Substances 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D163/00—Coating compositions based on epoxy resins; Coating compositions based on derivatives of epoxy resins
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
- C08G59/32—Epoxy compounds containing three or more epoxy groups
- C08G59/3218—Carbocyclic compounds
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/50—Amines
- C08G59/5046—Amines heterocyclic
- C08G59/5053—Amines heterocyclic containing only nitrogen as a heteroatom
- C08G59/5073—Amines heterocyclic containing only nitrogen as a heteroatom having two nitrogen atoms in the ring
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/62—Alcohols or phenols
- C08G59/621—Phenols
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/02—Elements
- C08K3/08—Metals
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/04—Oxygen-containing compounds
- C08K5/13—Phenols; Phenolates
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/16—Nitrogen-containing compounds
- C08K5/34—Heterocyclic compounds having nitrogen in the ring
- C08K5/3442—Heterocyclic compounds having nitrogen in the ring having two nitrogen atoms in the ring
- C08K5/3445—Five-membered rings
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K7/00—Use of ingredients characterised by shape
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D161/00—Coating compositions based on condensation polymers of aldehydes or ketones; Coating compositions based on derivatives of such polymers
- C09D161/04—Condensation polymers of aldehydes or ketones with phenols only
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D163/00—Coating compositions based on epoxy resins; Coating compositions based on derivatives of epoxy resins
- C09D163/04—Epoxynovolacs
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D163/00—Coating compositions based on epoxy resins; Coating compositions based on derivatives of epoxy resins
- C09D163/10—Epoxy resins modified by unsaturated compounds
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D5/00—Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
- C09D5/24—Electrically-conducting paints
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D7/00—Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
- C09D7/20—Diluents or solvents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D7/00—Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
- C09D7/40—Additives
- C09D7/60—Additives non-macromolecular
- C09D7/61—Additives non-macromolecular inorganic
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D7/00—Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
- C09D7/40—Additives
- C09D7/60—Additives non-macromolecular
- C09D7/63—Additives non-macromolecular organic
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D7/00—Features of coating compositions, not provided for in group C09D5/00; Processes for incorporating ingredients in coating compositions
- C09D7/40—Additives
- C09D7/70—Additives characterised by shape, e.g. fibres, flakes or microspheres
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
- H01B1/22—Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/552—Protection against radiation, e.g. light or electromagnetic waves
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K9/00—Screening of apparatus or components against electric or magnetic fields
- H05K9/0007—Casings
- H05K9/002—Casings with localised screening
- H05K9/0022—Casings with localised screening of components mounted on printed circuit boards [PCB]
- H05K9/0024—Shield cases mounted on a PCB, e.g. cans or caps or conformal shields
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K9/00—Screening of apparatus or components against electric or magnetic fields
- H05K9/0073—Shielding materials
- H05K9/0081—Electromagnetic shielding materials, e.g. EMI, RFI shielding
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K9/00—Screening of apparatus or components against electric or magnetic fields
- H05K9/0073—Shielding materials
- H05K9/0081—Electromagnetic shielding materials, e.g. EMI, RFI shielding
- H05K9/0083—Electromagnetic shielding materials, e.g. EMI, RFI shielding comprising electro-conductive non-fibrous particles embedded in an electrically insulating supporting structure, e.g. powder, flakes, whiskers
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/02—Elements
- C08K3/08—Metals
- C08K2003/0806—Silver
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/02—Elements
- C08K3/08—Metals
- C08K2003/0831—Gold
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/02—Elements
- C08K3/08—Metals
- C08K2003/085—Copper
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/02—Elements
- C08K3/08—Metals
- C08K2003/0862—Nickel
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K2201/00—Specific properties of additives
- C08K2201/001—Conductive additives
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K2201/00—Specific properties of additives
- C08K2201/002—Physical properties
- C08K2201/003—Additives being defined by their diameter
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K9/00—Use of pretreated ingredients
- C08K9/02—Ingredients treated with inorganic substances
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/561—Batch processing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
- H01L23/3121—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Wood Science & Technology (AREA)
- Materials Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Health & Medical Sciences (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Inorganic Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Dispersion Chemistry (AREA)
- Toxicology (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
- Paints Or Removers (AREA)
- Manufacturing & Machinery (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Conductive Materials (AREA)
- Non-Insulated Conductors (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
Abstract
本發明之課題為提供一種藉由噴塗可形成具有良好之屏蔽性、且與封裝體之密著性亦良好之屏蔽層的導電性塗料、及使用其之屏蔽封裝體之製造方法。 本發明所使用之導電性塗料至少含有:(A)包含常溫下為固體之固體環氧樹脂與常溫下為液體之液體環氧樹脂之黏結劑成分100質量份、(B)振實密度為5.3~6.5g/cm3
之金屬粒子500~1800質量份、(C)含有至少一種咪唑系硬化劑之硬化劑0.3~40質量份、及(D)溶劑150~600質量份。
Description
本發明關於導電性塗料及使用其之屏蔽封裝體之製造方法。
於行動電話或平板電腦等電子機器中,近年來安裝有多數個用以傳送大容量資料之無線通訊用電子零件。此種無線通訊用電子零件不僅具有容易產生雜訊之問題,且具有對雜訊之靈敏度高、若曝露於來自外部之雜訊則容易引起誤動作之問題。
另一方面,為了兼具電子機器之小型輕量化與高功能化,要求提高電子零件之安裝密度。然而,若提高安裝密度,有不僅成為雜訊產生源之電子零件增加,且有受到雜訊影響之電子零件亦增加之問題。
先前以來,作為解決上述問題之方法,已知有所謂的屏蔽封裝體,亦即,將作為雜訊產生源之電子零件做成封裝體,並將每個封裝體以屏蔽層覆蓋,藉此防止自電子零件產生雜訊,且防止雜訊入侵。例如於專利文獻1中記載有如下要旨:藉由對封裝體表面噴塗(噴霧)導電性或半導電性材料進行塗佈,可容易獲得屏蔽效果較高之電磁屏蔽構件。然而,使用由金屬粒子與溶劑構成之溶液並藉由噴塗形成屏蔽層時,不僅有無法獲得良好之屏蔽性,且有屏蔽層與封裝體之密著性差之問題。
又,作為有效率地製造屏蔽封裝體之方法,已知有例如如專利文獻2所記載之電路模組之製造方法,其具有以絕緣層被覆複數個IC之步驟、以由導電性塗料構成之屏蔽層被覆該絕緣層之步驟、將形成有屏蔽層之基板分割之步驟(在形成被覆上述絕緣層之屏蔽層之前,預先在絕緣層形成前端部寬度比深度方向之基端部寬度小之切槽,以填充於切槽內之方式塗佈導電性樹脂形成屏蔽層後,沿著切槽之前端部以較前端部之寬度大、較基端部之寬度小之寬度進行切削,將基板分割之方法)。如本文獻所記載般,作為屏蔽層之形成方法,有轉注成型法或灌注法、真空印刷法等,但不論哪一種方法均不僅具有需要巨大設備之問題,且有將導電性樹脂朝槽部填充時容易產生氣泡之問題。
又,關於屏蔽層的厚度,由小型化之觀點來看要求儘可能地薄。所以目前一般的技術為利用濺鍍法形成封膠IC或封裝體上表面之膜厚為約6μm~8μm之屏蔽層,且亦已實現量產化,但具有裝置昂貴、形成屏蔽層所需時間亦長、成本變高的問題、或於電子零件側面難以形成塗膜之問題。
又,至今的導電性塗料中除了使用純銀粉外,很難以10μm以下的膜厚獲得良好的導電性、屏蔽特性。在以薄膜不能獲得導電性時,有必要較厚地塗佈導電性塗料,但較厚地塗佈導電性塗料時溶劑乾燥會變慢,故有時側面的導電性塗料向下流,從而封膠IC或封裝體零件之角部的導電性塗料會變薄。於該導電性塗料變薄的部分無法獲得導電性,故不足以作為電磁波屏蔽。
先行技術文獻 專利文獻 專利文獻1:日本特開2003-258137號公報 專利文獻2:日本特開2008-42152號公報
發明概要 發明欲解決之課題 本發明是鑑於上述問題而完成者,其目的在於提供一種利用噴塗可形成具有良好之屏蔽性、且與封裝體之密著性亦良好之薄膜屏蔽層的導電性塗料,且可形成即使膜厚為10μm以下之薄膜,導電性亦良好之塗膜的導電性塗料。又,本發明之目的在於提供一種可容易地形成上述屏蔽層的屏蔽封裝體之製造方法。
用以解決課題之方法 鑑於上述,本發明之導電性塗料至少含有:(A)包含常溫下為固體之固體環氧樹脂與常溫下為液體之液體環氧樹脂之黏結劑成分、(B)振實密度為5.3~6.5g/cm3
之金屬粒子、(C)含有至少一種咪唑系硬化劑之硬化劑、及(D)溶劑;且 相對於(A)成分100質量份,(B)成分為500~1800質量份、(C)成分為0.3~40質量份、(D)成分為150~600質量份。
前述(A)黏結劑成分可於合計量不超過100質量份之範圍內含有常溫下為固體之固體環氧樹脂5~35質量份與常溫下為液體之液體環氧樹脂20~90質量份。
又,上述(A)黏結劑成分亦可進一步含有(甲基)丙烯酸酯化合物。
上述(B)金屬粒子可為片狀。
上述(C)硬化劑可進一步含有選自由苯酚系硬化劑及萘酚系硬化劑所構成群組中之至少一種。
上述導電性塗料宜藉由錐板式旋轉黏度計以0.5rpm測得之黏度為100mPa.s以上。又,宜藉由單一圓筒形旋轉黏度計使用轉子No.5以10rpm測得之黏度為15dPa.s以下。
上述導電性塗料適合作為電子零件封裝體之屏蔽用。
本發明之屏蔽封裝體之製造方法是藉由屏蔽層來被覆封裝體而成的屏蔽封裝體之製造方法,該封裝體是於基板上搭載有電子零件且藉由密封材密封該電子零件而成者,該屏蔽封裝體之製造方法至少具有以下步驟:於基板上搭載複數個電子零件且於該基板上填充密封材並使之硬化,藉此密封電子零件;在複數個電子零件間切削密封材形成槽部,藉由該等槽部使基板上之各電子零件之封裝體個別化;於經個別化之封裝體表面,藉由噴霧塗佈本發明之導電性塗料;加熱塗佈有導電性塗料之封裝體,使導電性塗料硬化,從而形成屏蔽層;及沿著槽部切斷基板,藉此獲得經單片化之屏蔽封裝體。
發明效果 根據本發明之導電性塗料,即使為約10μm之薄膜厚亦可確保塗膜導電性。因此,溶劑藉由噴塗於封裝體表面可快速乾燥,且由於塗膜較薄而塗膜本身重量較輕,可獲得封裝體側面及封裝體角部部分均勻的導電性薄膜。因此,可容易形成屏蔽效果優異、且與封裝體之密著性優異之屏蔽層。又,由於可以薄膜塗佈,故成本亦優異。
又,根據本發明之屏蔽封裝體之製造方法,可不使用大型裝置地有效率製造上述屏蔽性及與封裝體之密著性優異之屏蔽封裝體。
用以實施發明之形態 本發明之導電性塗料,如上所述至少含有: (A)包含常溫下為固體之固體環氧樹脂與常溫下為液體之液體環氧樹脂之黏結劑成分、(B)振實密度為5.3~6.5g/cm3
之金屬粒子、(C)含有至少一種咪唑系硬化劑之硬化劑、及(D)溶劑;且相對於(A)成分100質量份,(B)成分為500~1800質量份、(C)成分為0.3~40質量份、(D)成分為150~600質量份。此導電性塗料之用途並無特別限定,但適合使用於對單片化前之封裝體或已單片化之封裝體表面以噴塗等進行霧狀噴射而形成屏蔽層,從而獲得屏蔽封裝體。
可於本發明使用之常溫下為固體之固體環氧樹脂及常溫下為液體之液體環氧樹脂只要於分子內具有一個以上的環氧基即可,並無特別限定。作為具體例可列舉:雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂等雙酚型環氧樹脂、螺環型環氧樹脂、萘型環氧樹脂、聯苯型環氧樹脂、萜烯型環氧樹脂、三(縮水甘油氧基苯基)甲烷、四(縮水甘油氧基苯基)乙烷等縮水甘油醚型環氧樹脂、四縮水甘油二胺基二苯基甲烷等縮水甘油胺型環氧樹脂、四溴代雙酚A型環氧樹脂、甲酚酚醛型環氧樹脂、苯酚酚醛型環氧樹脂、α-萘酚酚醛型環氧樹脂、溴化苯酚酚醛型環氧樹脂等酚醛型環氧樹脂、橡膠改性環氧樹脂等。此等可單獨使用一種,亦可併用二種以上。
宜併用常溫下為液狀之環氧樹脂與常溫下為固體之環氧樹脂作為環氧樹脂。所謂常溫下為固體是指於25℃下為無溶劑狀態且不具有流動性之狀態。藉由使用常溫下為固體之環氧樹脂(以下,有時稱為「固體環氧樹脂」),能夠獲得可均勻地塗佈於封裝體表面,形成無不均之屏蔽層的導電性塗料。固體環氧樹脂可溶解於溶劑後使用。使用之溶劑並無特別限定,可自後述者中適當選擇。又,固體環氧樹脂之使用量宜為黏結劑成分100質量份中佔5~35質量份之範圍內,液體環氧樹脂之使用量宜為黏結劑成分100質量份中佔20~90質量份之範圍內。
又,本發明之黏結劑成分可進一步含有(甲基)丙烯酸酯化合物。於此,所謂(甲基)丙烯酸酯化合物為丙烯酸酯化合物或丙烯酸甲酯化合物,只要為具有丙烯醯基或甲基丙烯醯基之化合物即可,並無特別限定。作為(甲基)丙烯酸酯化合物之例,可列舉:異戊基丙烯酸酯、新戊二醇二丙烯酸酯、三羥甲基丙烷三丙烯酸酯、雙三羥甲基丙烷四丙烯酸酯、2-羥基-3-丙烯醯氧基丙基丙烯酸甲酯、苯基縮水甘油醚丙烯酸酯六亞甲基二異氰酸酯胺基甲酸酯預聚物、雙酚A二縮水甘油醚丙烯酸加成物、乙二醇二丙烯酸甲酯、及二乙二醇二丙烯酸甲酯等。此等可單獨使用一種,亦可併用二種以上。
如上所述含有(甲基)丙烯酸酯化合物之情形的含有比率,於環氧樹脂與(甲基)丙烯酸酯化合物之合計量100質量份中以5~95質量份為佳、較佳為20~80質量份。藉由(甲基)丙烯酸酯化合物為5質量份以上,導電性塗料之保存穩定性優異,且可使導電性塗料更快速地硬化,亦可進一步提高導電性。進一步可防止硬化時之塗料垂流。又,(甲基)丙烯酸酯化合物為95質量份以下時,封裝體與屏蔽層之密著性易變得良好。
於黏結劑成分中,除了上述環氧樹脂、(甲基)丙烯酸酯化合物以外,為了使導電性塗料之物性提高,可添加醇酸樹脂、三聚氰胺樹脂、二甲苯樹脂等作為改質劑。
於上述黏結劑成分中摻合改質劑時之含有比率,由導電性塗膜與塗佈對象物之密著性之觀點,宜為黏結劑成分100質量份中40質量份以下、較佳為10質量份以下。
於本發明中,使用用以使上述黏結劑成分硬化之硬化劑。硬化劑宜使用至少一種咪唑系硬化劑,除此之外宜使用選自苯酚系硬化劑及萘酚系硬化劑中之至少一種。進一步關於其他硬化劑,例如亦可使用胺系硬化劑、陽離子系硬化劑、自由基系硬化劑等。硬化劑可單獨使用一種,亦可併用二種以上。
作為咪唑系硬化劑,例如可列舉:咪唑、2-十一烷基咪唑、2-十七烷基咪唑、2-甲基咪唑、2-乙基咪唑、2-苯基咪唑、2-乙基-4-甲基-咪唑、1-氰乙基-2-十一烷基咪唑、1-氰乙基-2-甲基咪唑、1-氰乙基-2-十一烷基咪唑鎓偏苯三酸酯、1-氰乙基-2-乙基-4-甲基咪唑等。
苯酚系硬化劑為於分子中具有至少一個苯酚骨架,可使用作為環氧樹脂之硬化劑的化合物,作為具體例可列舉苯酚酚醛(酚醛型苯酚樹脂)、三苯基甲烷型苯酚樹脂、二環戊二烯型酚醛樹脂等,較佳為酚醛型苯酚樹脂。
萘酚系硬化劑為於分子中具有至少一個萘酚骨架,可使用作為環氧樹脂之硬化劑的化合物,作為具體例可列舉萘酚甲酚甲醛樹脂、苯酚萘酚系芳烷樹脂、芳烷基苯酚(xyloc)型酚醛樹脂等。
作為陽離子系硬化劑之例,可列舉鎓系化合物,其代表性者為:三氟化硼之胺鹽、對甲氧基苯重氮鎓六氟磷酸鹽、二苯基碘鎓六氟磷酸鹽、三苯基硫鎓、四正丁基磷鎓四苯基硼酸鹽、四正丁基磷鎓-o,o-二乙基二硫代磷酸鹽等。
作為自由基系硬化劑(聚合起始劑)之例,可列舉:過氧化二異丙苯、過氧化第三丁基異丙苯、過氧化氫第三丁基、過氧化氫異丙苯等。
硬化劑之含量宜相對於黏結劑成分之合計量100質量份為0.3~40質量份、較佳為0.5~35質量份。若硬化劑之含量為0.3質量份以上,導電性塗膜與塗佈對象物表面之密著性、以及導電性塗膜之導電性變得良好,可獲得屏蔽效果優異之導電性塗膜,若為40質量份以下,則導電性塗料之保存穩定性提高。又,使用自由基系硬化劑作為硬化劑時,其含量宜相對於黏結劑成分之合計量100質量份為0.3~8質量份。若自由基系硬化劑之含量為0.3質量份以上,導電性塗膜與塗佈對象物表面之密著性、以及導電性塗膜之導電性變得良好,可容易獲得屏蔽效果優異之導電性塗膜,若為8質量份以下,則導電性塗料之保存穩定性提高。
可於本發明使用之金屬粒子,只要為具有導電性之粒子即可,並無特別限定,作為具體例可列舉銅粒子、銀粒子、鎳粒子、鍍銀之銅粒子、鍍金之銅粒子、鍍銀之鎳粒子、鍍金之鎳粒子等,由可獲得相對便宜且優異之導電性之觀點來看,較佳為鍍銀之銅粒子。
金屬粒子之振實密度宜為5.3~6.5g/cm3
。若振實密度為上述範圍內,可形成雖然為薄膜但導電性良好之塗膜。
作為金屬粒子之形狀並無特別限定,但由導電性塗料之塗佈穩定性較高、所獲得之導電性塗膜之電阻值較低、可獲得屏蔽性得以進一步提高的導電性塗膜之觀點來看,宜為片狀(鱗片狀)。
又,金屬粒子為片狀之情形時,金屬粒子之縱橫比宜為2~10。若縱橫比為上述範圍內,屏蔽層之導電性變得更良好。
金屬粒子之含量宜相對於黏結劑成分100質量份為500~1800質量份。若金屬粒子之含量為500質量份以上,薄膜屏蔽層之導電性變得良好,若為1800質量份以下,則屏蔽層與封裝體之密著性、及硬化後之導電性塗料之物性變得良好,以後述之切割機切斷時不易產生屏蔽層缺損。
又,金屬粒子之平均粒徑宜為1~300μm。若金屬粒子之平均粒徑為1μm以上,金屬粒子之分散性為良好、可防止凝聚,且不易被氧化,若為300μm以下,與封裝體之接地電路之連接性為良好。
為了藉由噴霧於封裝體表面均勻地塗佈導電性塗料,本發明之導電性塗料宜藉由含有較所謂的導電性膠更多的溶劑而低黏度化。
本發明中使用之溶劑,並無特別限定,例如可列舉:甲基乙基酮、丙酮、苯乙酮、甲基溶纖劑、甲基溶纖劑乙酸酯、甲基卡必醇、二乙二醇二甲醚、四氫呋喃、乙酸甲酯、乙酸丁酯等。此等可單獨使用一種,亦可併用二種以上。
溶劑之含量宜根據導電性塗料之用途或塗佈使用之機器等而適當調整,通常宜相對於黏結劑成分100質量份為150~600質量份。若溶劑之含量為150質量份以上,可獲得10μm薄膜之塗膜,可實現穩定的噴塗性,若為600質量份以下,可於封裝體表面無不均地形成屏蔽層,容易獲得穩定的屏蔽特性。
再者,在不損及發明目的之範圍內,於本發明之導電性塗料中可添加消泡劑、增稠劑、黏著劑、填充劑、阻燃劑、著色劑等周知之添加劑。
本發明之導電性塗料較好的是,若為低黏度以錐板式旋轉黏度計(所謂cone-plate式黏度計)測定黏度,若為高黏度以單一圓筒形旋轉黏度計(所謂B型或BH型黏度計)進行測定。
以錐板式旋轉黏度計進行測定時,較好的是使用布氏(BROOK FIELD)公司之cone spindle CP40(錐板角度:0.8°、錐板半徑:24mm)以0.5rpm測得之黏度為100mPa.s以上、較佳為150mPa.s以上。若黏度為100mPa.s以上,可防止塗佈面非水平時之液體垂流,容易無不均地形成薄膜之導電性塗膜。又,只要為錐板式旋轉黏度計可測定之黏度則無論多高都沒有問題。
以單一圓筒形旋轉黏度計進行測定時,較好的是使用轉子No.5以10rpm測得之黏度為15dPa.s以下、較佳為13dPa.s以下。若黏度為15dPa.s以下可防止噴嘴堵塞、容易無不均地形成均勻薄膜之導電性塗膜。再者,只要為單一圓筒形旋轉黏度計可測定之黏度則無論多低都沒有問題。
使用本發明之導電性塗料形成導電性塗膜之方法並無特別限定,但可使用以下方法。即,藉由周知之空氣噴塗、噴槍等噴塗裝置進行霧狀噴射、均勻地塗佈於塗佈對象物表面。此時的噴射壓力或噴射流量、噴嘴前端部與塗佈對象物的距離可視需要適當調整。接著,視需要加熱塗佈有導電性塗料的塗佈對象物,使溶劑充分乾燥後,進一步加熱使導電性塗料中之黏結劑成分充分硬化,藉此獲得導電性塗膜。此時的加熱溫度及加熱時間可根據黏結劑成分或硬化劑種類等進行適當調整。
將本發明之導電性塗料使用於封裝體屏蔽用時,藉由導電性塗料所獲得之屏蔽層,與以銅箔等形成之接地電路之密著性優異。具體而言,由於自封裝體之一部分露出之接地電路之銅箔與屏蔽層之密著性為良好,故於封裝體表面塗佈導電性塗料而形成屏蔽層後將封裝體切斷而單片化時,可防止屏蔽層因切斷時之衝擊而自接地電路剝離。
作為將本發明之導電性塗料使用於封裝體屏蔽用時之導電性塗料與銅箔之密著性,宜根據JIS K 6850:1999所測得之剪切強度為3.0MPa以上。若剪切強度為3.0MPa以上,可幾乎不存在屏蔽層因切斷單片化前之封裝體時之衝擊而自接地電路剝離之虞。
藉由本發明之導電性塗料形成之屏蔽層之片電阻值宜塗膜之厚度為10μm下為100mΩ/□以下。若片電阻為100mΩ/□以下,屏蔽特性變得良好。
以下,使用圖式就用以使用本發明之導電性塗料獲得屏蔽封裝體之方法之一實施形態進行說明。
首先,如圖1(a)所示,準備於基板1上搭載複數個電子零件(IC等)2,於該等複數個電子零件2間設置有接地電路圖案(銅箔)3者。
接著,如圖1(b)所示,於該等電子零件2及接地電路圖案3上填充密封材4並使之硬化,將電子零件2及接地電路圖案3密封。
接著,如圖1(c)中箭頭所示,於複數個電子零件2間切削密封材4形成槽部,藉由該等槽部使基板1之各電子零件之封裝體個別化。符號A表示各自個別化後之封裝體。接地電路之至少一部分自構成槽之壁面露出,槽之底部並未完全地貫通基板。
另一方面,將上述環氧樹脂、視需要使用之(甲基)丙烯酸酯化合物、金屬粒子、溶劑及硬化劑與視需要使用之改質劑以成為特定調配比率之方式進行混合,準備導電性塗料。
接著,藉由任意之噴塗裝置霧狀地噴射導電性塗料,以封裝體表面及自壁面露出之接地電路被導電性塗料被覆之方式均勻地塗佈。此時的噴射壓力及噴射流量、噴嘴前端部與封裝體表面之距離視需要而適當調整。
然後,將塗佈有導電性塗料之封裝體進行加熱使溶劑充分乾燥後,進一步加熱使導電性塗料中之黏結劑成分充分硬化,如圖1(d)所示,於封裝體表面形成屏蔽層5。此時的加熱條件可適當設定。圖2是顯示此狀態下之基板之俯視圖。符號B1
、B2
、...B9
分別表示單片化前之屏蔽封裝體,符號11~19分別表示此等屏蔽封裝體間之槽。
接著,如圖1(e)中箭頭所示,藉由切割機等沿著單片化前之封裝體之槽之底部將基板切斷,藉此可獲得經單片化之封裝體B。
如此而獲得之經單片化之封裝體B,由於在封裝體表面(上表面部、側面部以及上表面部與側面部之交界之角部)皆形成有均勻之屏蔽層,故可獲得良好之屏蔽特性。又,由於屏蔽層與封裝體表面及接地電路之密著性優異,故可防止屏蔽層因藉由切割機等將封裝體單片化時之衝擊而自封裝體表面或接地電路剝離。
本發明之導電性塗膜由於即使為10μm左右厚度亦可獲得良好的導電性,故具有縱使不改變屏蔽封裝體之尺寸等至今的設計亦可使用之優點,且由於以較少塗佈量即可完成,故成本面上亦優異。
實施例 以下,基於實施例詳細地說明本發明之內容,但本發明並不限定於以下實施例。又,以下未特別說明時,標示「份」或「%」者為質量基準。
1.導電性塗料之調製及評價 [實施例、比較例] 相對於包含環氧樹脂之黏結劑成分100質量份,以表1所記載之比率調配並混合硬化劑、金屬粒子及溶劑,獲得導電性塗料。使用之詳細各成分如下所述。
固體環氧樹脂:三菱化學(股)製、商品名「JER157S70」 液體環氧樹脂1:縮水甘油胺系環氧樹脂、(股)ADEKA製、商品名「EP-3905S」 液體環氧樹脂2:縮水甘油醚系環氧樹脂、(股)ADEKA製、商品名「EP-4400」 (甲基)丙烯酸酯樹脂:2-羥基-3-丙烯醯氧基丙基丙烯酸甲酯、共榮社化學(股)製、商品名「Lightester G-201P」) 硬化劑1:苯酚酚醛、荒川化學工業(股)製、商品名「TAMANOL758」 硬化劑2:1-氰乙基-2-甲基咪唑、四國化成工業(股)製、商品名「2MZ-CN」 硬化劑3:萘酚系硬化劑、群榮化學工業(股)製、商品名「GPNX-70HN」 比較硬化劑:胺系硬化劑、Ajinomoto Fine- Techno(股)製、商品名「Amicure PN-23」 溶劑:乙酸丁酯 金屬粉:片狀鍍銀之銅粉、銀被覆量5質量%、平均粒徑5μm、振實密度6.3g/cm3
、5.6g/cm3
、5.3g/cm3
、5.0g/cm3
(1)黏度 以TVB-10型黏度計或錐板式旋轉黏度計進行上述各實施例及比較例所獲得之導電性塗料(液溫25℃)之黏度測定。TVB-10型黏度計之測定使用轉軸No.5以轉數10rpm進行。錐板式旋轉黏度計之測定時使用布氏(BROOK FIELD)公司之商品名「程式化黏度計DV-II+Pro」、cone spindle CP40以0.5rpm進行。將所測得之黏度顯示於表1。再者,黏度欄中之「-」表示以該黏度計不能測定。
(2)導電性塗膜之導電性 如圖3所示,以聚醯亞胺膠帶遮蔽設置有銅墊21之玻璃環氧樹脂基板中之塗佈位置以外的部份,藉由手動噴塗器(ANEST岩田(股)製、LPH-101A-144LVG)塗佈各實施例及比較例所獲得之導電性塗料,於80℃預加熱60分鐘後,於160℃加熱60分鐘,藉此正式硬化,藉由剝離聚醯亞胺膜,獲得銅墊21間之長度(圖3中之x)60mm、寬度(圖3中之y)5mm、厚度10μm之導電性塗膜22。針對此硬化物樣品使用試驗機測定兩端的電阻值R,由下式(1)計算片電阻。以N=5進行試驗,求出其平均值。若片電阻為100mΩ/□以下,可判斷導電性為良好。
片電阻(Ω/□)=(0.5×R)/6…(1)
(3)薄膜塗佈性 針對上述所獲得之硬化物樣品,分別以測微器測定將聚醯亞胺膜剝離後之部分之玻璃環氧樹脂基板之厚度與和該剝離部分鄰接之形成有導電性塗膜22之玻璃環氧樹脂基板之厚度,藉由後者減去前者而求出導電性塗膜22的厚度。關於黏度較低者進行反覆塗佈而成為10μm膜厚,但塗佈一次就成為12μm以上者記為「×」。
(4)屏蔽層之厚度均勻性 使用玻璃環氧樹脂基板(FR-4)製作寬度15mm×長度15mm×厚度1mm之虛擬晶片。以聚醯亞胺膜遮蔽該虛擬晶片的一半,使用黏著帶以間隔10mm固定成棋盤格狀,一面載置於旋轉台上以160rpm旋轉,一面使用手動噴塗裝置(ANEST岩田(股)製、「LPH-101A-144LVG」)進行噴塗試驗。於噴塗後於80℃乾燥溶劑60分鐘、於160℃加熱60分鐘使之硬化。就硬化後之塗膜評價均勻性。
具體而言,分別以測微器測定將聚醯亞胺膜剝離後之部分之虛擬晶片之厚度與和該剝離部分鄰接之形成有導電性塗膜之虛擬晶片之厚度,藉由後者減去前者而求出上表面的導電性塗膜的厚度。上表面的膜厚測定於任意三個位置進行。側面的膜厚測定於一個位置進行,將(塗膜形成位置之測定值-鄰接的未塗佈部份之測定值)×1/2設為膜厚。樣品以N=5進行,求得平均值。
厚度均勻性評價以由上述上表面與側面厚度的測定值藉由下式(2)所獲得之數值進行,若為75%以上則記為「○」。
厚度均勻性(%)=(側面厚度/上表面厚度)×100…(2)
(5)導電性塗料之密著性(浸焊前後之剪切強度測定) 作為屏蔽層與封裝體表面或接地電路之密著性之評價,根據JIS K 6850:1999測定剪切強度。具體而言,於寬度25mm×長度100mm×厚度1.6mm之銅板上的長度12.5mm區域塗佈導電性塗料,於常溫下放置5分鐘使溶劑乾燥後,於其上貼合寬度25mm×長度100mm×厚度1.6mm之銅板。接著,於80℃加熱60分鐘,進一步於160℃加熱60分鐘,使銅板彼此接著。接著,使用拉伸強度試驗機((股)島津製作所公司製、商品名「Autograph AGS-X」)平行地拉伸接著面,將破斷時之最大荷重除以接著面積,算出剪切強度。若剪切強度為3.0MPa以上,可無問題地使用。
各實施例之剪切強度皆為3.0MPa以上,確認可適合用作屏蔽層。
進一步評價浸焊後之密著性。封裝體於浸焊步驟中曝露於高溫。因此,曝露於高溫後之屏蔽層與封裝體表面及接地電路之密著性亦變得重要。因此,為測定浸焊後之密著性,與上述相同進行將導電性塗料塗佈於銅板並進行貼合,於80℃加熱60分鐘後,於160℃加熱60分鐘,使導電性塗料硬化。然後,測定於260℃加熱30秒鐘後之剪切強度。剪切強度之測定方法與上述相同。
若浸焊後之剪切強度為3.0MPa以上,可無問題地使用作為屏蔽層。各實施例之導電性塗料之剪切強度皆為3.0MPa以上,確認可適合用作屏蔽層。
藉由上述評價方法進行的導電性塗料的塗佈採用下述條件進行。 <噴塗條件> 流量:200L/分鐘 供給壓力:0.5Pa 與塗佈物之距離:約150mm 塗佈時間:2秒×1次~4次
其結果如表1所示,根據各實施例之導電性塗料,導電性均為100mΩ/□,薄膜塗佈性、屏蔽層之厚度均勻性、導電性塗膜之密著性優異。
比較例1由於不含有咪唑系硬化劑,故導電性不佳。
比較例2由於含有的金屬粒子的振實密度並非5.3~6.5g/cm3
,故導電性不佳。
比較例3由於金屬粒子含量未達500質量份、溶劑含量多於600質量份,故黏度過低、不能獲得均勻厚度的屏蔽層。
比較例4由於金屬粒子含量多於1800質量份、溶劑含量未達150,故黏度過高、薄膜塗佈性、導電性塗膜之密著性不佳。再者,由於不能獲得薄膜的屏蔽層,故不能測定導電性、屏蔽層的厚度均勻性。
A‧‧‧基板上經個別化之封裝體
B‧‧‧經單片化之屏蔽封裝體
B1、B2、B9‧‧‧單片化前之屏蔽封裝體
1‧‧‧基板
2‧‧‧電子零件
3‧‧‧接地電路圖案(銅箔)
4‧‧‧密封材
5‧‧‧導電性塗料(屏蔽層)
11~19‧‧‧槽
21‧‧‧銅墊
22‧‧‧導電性塗膜
圖1(a)~(e)是顯示屏蔽封裝體之製造方法之一實施形態的示意剖面圖。 圖2是顯示單片化前之屏蔽封裝體實例的俯視圖。 圖3是使用於導電性塗料之導電性試驗的形成有導電性塗膜的硬化物樣品的示意圖。
符號說明 A…基板上經個別化之封裝體 B…經單片化之屏蔽封裝體 B1
、B2
、B9
…單片化前之屏蔽封裝體 1…基板 2…電子零件 3…接地電路圖案(銅箔) 4…密封材 5…導電性塗料(屏蔽層) 11~19…槽 21…銅墊 22…導電性塗膜
(無)
Claims (9)
- 一種導電性塗料,至少含有: (A)包含常溫下為固體之固體環氧樹脂與常溫下為液體之液體環氧樹脂之黏結劑成分、 (B)振實密度為5.3~6.5g/cm3 之金屬粒子、 (C)含有至少一種咪唑系硬化劑之硬化劑、及 (D)溶劑;且 相對於(A)成分100質量份,(B)成分為500~1800質量份、(C)成分為0.3~40質量份、(D)成分為150~600質量份。
- 如請求項1之導電性塗料,其中前述(A)黏結劑成分於合計量不超過100質量份之範圍內含有常溫下為固體之固體環氧樹脂5~35質量份與常溫下為液體之液體環氧樹脂20~90質量份。
- 如請求項1或2之導電性塗料,其中前述(A)黏結劑成分進一步含有(甲基)丙烯酸酯化合物。
- 如請求項1或2之導電性塗料,其中前述(B)金屬粒子為片狀。
- 如請求項1或2之導電性塗料,其中前述(C)硬化劑進一步含有選自由苯酚系硬化劑及萘酚系硬化劑所構成群組中之至少一種。
- 如請求項1或2之導電性塗料,其藉由錐板式旋轉黏度計以0.5rpm測得之黏度為100mPa.s以上。
- 如請求項1或2之導電性塗料,其藉由單一圓筒形旋轉黏度計使用轉子No.5以10rpm測得之黏度為15dPa.s以下。
- 如請求項1或2之導電性塗料,其係作為電子零件封裝體之屏蔽用。
- 一種屏蔽封裝體之製造方法,是藉由屏蔽層來被覆封裝體而成的屏蔽封裝體之製造方法,該封裝體是於基板上搭載有電子零件且藉由密封材密封該電子零件而成者,該屏蔽封裝體之製造方法至少具有以下步驟: 於基板上搭載複數個電子零件且於該基板上填充密封材並使之硬化,藉此密封前述電子零件; 在前述複數個電子零件間切削密封材形成槽部,藉由該等槽部使基板上之各電子零件之封裝體個別化; 於前述經個別化之封裝體表面,藉由噴霧塗佈如請求項1或2之導電性塗料; 加熱前述塗佈有導電性塗料之封裝體,使前述導電性塗料硬化,從而形成屏蔽層;及 沿著前述槽部切斷前述基板,藉此獲得經單片化之屏蔽封裝體。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016066379 | 2016-03-29 | ||
JP2016-066379 | 2016-03-29 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201807090A TW201807090A (zh) | 2018-03-01 |
TWI704196B true TWI704196B (zh) | 2020-09-11 |
Family
ID=59964545
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW106108721A TWI704196B (zh) | 2016-03-29 | 2017-03-16 | 導電性塗料及使用其之屏蔽封裝體之製造方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US11414554B2 (zh) |
JP (1) | JP6831731B2 (zh) |
KR (1) | KR102355386B1 (zh) |
CN (1) | CN108884358B (zh) |
TW (1) | TWI704196B (zh) |
WO (1) | WO2017170390A1 (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI848937B (zh) | 2018-07-24 | 2024-07-21 | 日商拓自達電線股份有限公司 | 屏蔽封裝體及屏蔽封裝體之製造方法 |
CN112997295B (zh) | 2018-11-21 | 2024-04-16 | 拓自达电线株式会社 | 屏蔽封装体 |
TWI813872B (zh) | 2019-07-25 | 2023-09-01 | 日商拓自達電線股份有限公司 | 導電性塗料及使用其之屏蔽封裝體之製造方法、以及具有屏蔽層之樹脂成形品之製造方法 |
US11597858B1 (en) * | 2020-07-31 | 2023-03-07 | Tatsuta Electric Wire & Cable Co., Ltd. | Conductive adhesive |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003045228A (ja) * | 2001-08-01 | 2003-02-14 | Hitachi Chem Co Ltd | 導電ペースト |
CN1745437A (zh) * | 2002-05-17 | 2006-03-08 | 日立化成工业株式会社 | 导电浆料 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3923687B2 (ja) * | 1999-09-14 | 2007-06-06 | 松下電器産業株式会社 | 電子部品実装用接合剤およびこれを用いた電子部品の実装方法 |
JP2003258137A (ja) | 2002-02-28 | 2003-09-12 | Mitsubishi Electric Corp | 半導体装置 |
JP4109156B2 (ja) * | 2002-05-31 | 2008-07-02 | タツタ電線株式会社 | 導電性ペースト |
JP3986908B2 (ja) * | 2002-07-09 | 2007-10-03 | 住友ベークライト株式会社 | 導電性ペースト |
JP4635412B2 (ja) * | 2003-07-22 | 2011-02-23 | 住友ベークライト株式会社 | 導電性接着フィルムおよびこれを用いた半導体装置 |
JP5022652B2 (ja) * | 2006-08-07 | 2012-09-12 | 太陽誘電株式会社 | 回路モジュールの製造方法及び回路モジュール |
JP2011151372A (ja) * | 2009-12-25 | 2011-08-04 | Murata Mfg Co Ltd | 電子部品モジュールの製造方法及び電子部品モジュール |
TWI500737B (zh) * | 2013-05-06 | 2015-09-21 | Chi Mei Corp | 導電性接著劑 |
JP6163421B2 (ja) | 2013-12-13 | 2017-07-12 | 株式会社東芝 | 半導体装置、および、半導体装置の製造方法 |
JP6269294B2 (ja) * | 2014-04-24 | 2018-01-31 | 味の素株式会社 | プリント配線板の絶縁層用樹脂組成物 |
-
2017
- 2017-03-16 TW TW106108721A patent/TWI704196B/zh active
- 2017-03-23 JP JP2017057914A patent/JP6831731B2/ja active Active
- 2017-03-27 CN CN201780020656.1A patent/CN108884358B/zh active Active
- 2017-03-27 KR KR1020187029254A patent/KR102355386B1/ko active IP Right Grant
- 2017-03-27 US US16/088,213 patent/US11414554B2/en active Active
- 2017-03-27 WO PCT/JP2017/012373 patent/WO2017170390A1/ja active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003045228A (ja) * | 2001-08-01 | 2003-02-14 | Hitachi Chem Co Ltd | 導電ペースト |
CN1745437A (zh) * | 2002-05-17 | 2006-03-08 | 日立化成工业株式会社 | 导电浆料 |
TWI284328B (en) * | 2002-05-17 | 2007-07-21 | Hitachi Chemical Co Ltd | Conductive paste |
Also Published As
Publication number | Publication date |
---|---|
WO2017170390A1 (ja) | 2017-10-05 |
JP6831731B2 (ja) | 2021-02-17 |
CN108884358A (zh) | 2018-11-23 |
TW201807090A (zh) | 2018-03-01 |
US20200299524A1 (en) | 2020-09-24 |
KR20180125991A (ko) | 2018-11-26 |
KR102355386B1 (ko) | 2022-01-24 |
CN108884358B (zh) | 2021-03-30 |
US11414554B2 (en) | 2022-08-16 |
JP2017179362A (ja) | 2017-10-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101725748B1 (ko) | 전자 부품의 패키지의 쉴드용 도전성 도료 및 이것을 이용한 쉴드 패키지의 제조 방법 | |
TWI704196B (zh) | 導電性塗料及使用其之屏蔽封裝體之製造方法 | |
JP6921573B2 (ja) | 導電性塗料及びそれを用いたシールドパッケージの製造方法 | |
TWI722136B (zh) | 導電性塗料及使用其之屏蔽封裝體之製造方法 | |
WO2018012017A1 (ja) | 導電性塗料及びそれを用いたシールドパッケージの製造方法 | |
TWI778233B (zh) | 導電性塗料及使用該導電性塗料之屏蔽封裝體之製造方法 | |
TWI813872B (zh) | 導電性塗料及使用其之屏蔽封裝體之製造方法、以及具有屏蔽層之樹脂成形品之製造方法 | |
JP2020055977A (ja) | 導電性塗料 | |
TWI848227B (zh) | 含金屬粒子之樹脂組成物 |