TWI698952B - 電子部件的實裝裝置與實裝方法,及封裝部件的製造方法 - Google Patents
電子部件的實裝裝置與實裝方法,及封裝部件的製造方法 Download PDFInfo
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- TWI698952B TWI698952B TW108130627A TW108130627A TWI698952B TW I698952 B TWI698952 B TW I698952B TW 108130627 A TW108130627 A TW 108130627A TW 108130627 A TW108130627 A TW 108130627A TW I698952 B TWI698952 B TW I698952B
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67144—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/52—Mounting semiconductor bodies in containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67121—Apparatus for making assemblies not otherwise provided for, e.g. package constructions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Supply And Installment Of Electrical Components (AREA)
- Die Bonding (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017149192A JP6781677B2 (ja) | 2017-08-01 | 2017-08-01 | 電子部品の実装装置と実装方法、およびパッケージ部品の製造方法 |
JP2017-149192 | 2017-08-01 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201943008A TW201943008A (zh) | 2019-11-01 |
TWI698952B true TWI698952B (zh) | 2020-07-11 |
Family
ID=65370256
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW108130627A TWI698952B (zh) | 2017-08-01 | 2018-07-24 | 電子部件的實裝裝置與實裝方法,及封裝部件的製造方法 |
TW107125423A TWI683388B (zh) | 2017-08-01 | 2018-07-24 | 電子部件的實裝裝置與實裝方法,及封裝部件的製造方法 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW107125423A TWI683388B (zh) | 2017-08-01 | 2018-07-24 | 電子部件的實裝裝置與實裝方法,及封裝部件的製造方法 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6781677B2 (ja) |
KR (1) | KR102156690B1 (ja) |
TW (2) | TWI698952B (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2020262783A1 (ko) * | 2019-06-26 | 2020-12-30 | 우영관 | 자동보정 기능을 이용한 인쇄회로기판 부착용 부재플레이트의 부착 방법 |
JP7350696B2 (ja) | 2019-08-29 | 2023-09-26 | 芝浦メカトロニクス株式会社 | 電子部品の実装装置 |
CN112447555B (zh) * | 2019-08-29 | 2024-05-14 | 芝浦机械电子装置株式会社 | 电子零件的安装装置 |
WO2022158076A1 (ja) * | 2021-01-19 | 2022-07-28 | パナソニックIpマネジメント株式会社 | 部品搭載装置および部品搭載方法 |
JP7565240B2 (ja) | 2021-03-19 | 2024-10-10 | ファスフォードテクノロジ株式会社 | ダイボンディング装置および半導体装置の製造方法 |
JPWO2023286245A1 (ja) * | 2021-07-15 | 2023-01-19 | ||
KR102544074B1 (ko) * | 2021-07-30 | 2023-06-15 | 엘지전자 주식회사 | 전자부품 실장 장치 및 그 장치의 제어 방법 |
TWI844313B (zh) | 2022-03-23 | 2024-06-01 | 日商芝浦機械電子裝置股份有限公司 | 電子零件的安裝裝置及安裝方法 |
CN115172220B (zh) * | 2022-07-14 | 2023-05-02 | 先之科半导体科技(东莞)有限公司 | 一种二极管封装设备 |
CN116169074B (zh) * | 2023-02-24 | 2024-01-23 | 江苏福明太阳能有限公司 | 一种电子元器件的制造方法及制造设备 |
JP2024130261A (ja) * | 2023-03-14 | 2024-09-30 | オムロン株式会社 | 位置計測装置、位置計測方法、及び、位置計測プログラム |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100220183A1 (en) * | 2007-06-28 | 2010-09-02 | Yamaha Hatsudoki Kabushiki Kaisha | Component placing apparatus |
US20130120554A1 (en) * | 2011-11-15 | 2013-05-16 | Yamaha Hatsudoki Kabushiki Kaisha | Component transfer apparatus and suction position adjustment method for component transfer apparatus |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4839535B2 (ja) * | 2001-07-13 | 2011-12-21 | ソニー株式会社 | 座標補正方法、座標補正装置、および座標補正用基準治具 |
CN1229010C (zh) * | 2001-08-08 | 2005-11-23 | 松下电器产业株式会社 | 安装电子部件的设备和方法 |
JP2007072714A (ja) | 2005-09-06 | 2007-03-22 | Csk Holdings Corp | 画像サービス提供装置及び画像データの受信端末 |
CN101341587B (zh) * | 2005-12-22 | 2010-10-27 | 芝浦机械电子株式会社 | 电子部件的安装装置及安装方法 |
JP4665863B2 (ja) | 2006-08-08 | 2011-04-06 | パナソニック株式会社 | 電子部品実装方法 |
JP5030843B2 (ja) | 2008-04-14 | 2012-09-19 | 芝浦メカトロニクス株式会社 | 電子部品の実装装置及び実装方法 |
JP5344145B2 (ja) * | 2008-12-25 | 2013-11-20 | 澁谷工業株式会社 | ボンディング装置における電子部品と基板の位置合わせ方法 |
JP5420483B2 (ja) * | 2010-06-30 | 2014-02-19 | ヤマハ発動機株式会社 | 部品搬送方法、部品搬送装置及び部品実装装置 |
JP5358529B2 (ja) * | 2010-07-23 | 2013-12-04 | ヤマハ発動機株式会社 | 実装機 |
JP2013004615A (ja) * | 2011-06-14 | 2013-01-07 | Hitachi High-Tech Instruments Co Ltd | 電子部品実装装置及び電子部品実装方法 |
JP2013058520A (ja) | 2011-09-07 | 2013-03-28 | Dainippon Screen Mfg Co Ltd | 描画装置、データ補正装置、再配線層の形成方法、および、データ補正方法 |
JP2013187434A (ja) * | 2012-03-09 | 2013-09-19 | Fujitsu Ltd | 半導体装置、半導体装置の製造方法、電子装置及び基板 |
JPWO2014157134A1 (ja) * | 2013-03-28 | 2017-02-16 | 東レエンジニアリング株式会社 | 実装方法および実装装置 |
WO2015023232A1 (en) * | 2013-08-14 | 2015-02-19 | Orion Systems Integration Pte Ltd | Apparatus And Method For Bonding A Plurality Of Semiconductor Chips Onto A Substrate |
JP6320239B2 (ja) * | 2013-09-24 | 2018-05-09 | 日東電工株式会社 | 半導体チップ封止用熱硬化性樹脂シート及び半導体パッケージの製造方法 |
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2017
- 2017-08-01 JP JP2017149192A patent/JP6781677B2/ja active Active
-
2018
- 2018-07-24 TW TW108130627A patent/TWI698952B/zh active
- 2018-07-24 TW TW107125423A patent/TWI683388B/zh active
- 2018-08-01 KR KR1020180089852A patent/KR102156690B1/ko active IP Right Grant
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100220183A1 (en) * | 2007-06-28 | 2010-09-02 | Yamaha Hatsudoki Kabushiki Kaisha | Component placing apparatus |
US20130120554A1 (en) * | 2011-11-15 | 2013-05-16 | Yamaha Hatsudoki Kabushiki Kaisha | Component transfer apparatus and suction position adjustment method for component transfer apparatus |
Also Published As
Publication number | Publication date |
---|---|
KR20190013670A (ko) | 2019-02-11 |
TW201943008A (zh) | 2019-11-01 |
JP2019029563A (ja) | 2019-02-21 |
JP6781677B2 (ja) | 2020-11-04 |
TW201911462A (zh) | 2019-03-16 |
KR102156690B1 (ko) | 2020-09-16 |
TWI683388B (zh) | 2020-01-21 |
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