TWI697378B - Device with maintenance area - Google Patents
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- TWI697378B TWI697378B TW106101027A TW106101027A TWI697378B TW I697378 B TWI697378 B TW I697378B TW 106101027 A TW106101027 A TW 106101027A TW 106101027 A TW106101027 A TW 106101027A TW I697378 B TWI697378 B TW I697378B
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- main power
- frame
- panel
- power switch
- maintenance area
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6735—Closed carriers
- H01L21/67379—Closed carriers characterised by coupling elements, kinematic members, handles or elements to be externally gripped
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/67346—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders characterized by being specially adapted for supporting a single substrate or by comprising a stack of such individual supports
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/6735—Closed carriers
- H01L21/67373—Closed carriers characterised by locking systems
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/10—Greenhouse gas [GHG] capture, material saving, heat recovery or other energy efficient measures, e.g. motor control, characterised by manufacturing processes, e.g. for rolling metal or metal working
Abstract
提供即使不卸下框體之蓋體亦可以維修的具 有維修區域的裝置。 Provides tools that can be repaired even without removing the cover of the frame There are devices for maintenance areas.
為一種具有維修區域的裝置(2),其具備: 框體(4);主電源開關(70),其係用以切換主電源之接通和斷開;維修區域,其係被形成在該框體內,於維修之時作業者檢修;開關門(64),其係用以覆蓋該維修區域;面板,其係可以在將該主電源開關對準該主電源成為接通之接通位置之狀態下被固定在該框體,且在將該主電源開關對準該主電源成為斷開之斷開位置之狀態下從該框體卸下;桿體(74),其一端在該面板被按壓卡止;及貫穿安裝部(82),其被形成在該開關門,具有該桿體之另一端側被插入的貫通孔(82a)。 It is a device (2) with a maintenance area, which has: Frame (4); main power switch (70), which is used to switch the main power on and off; the maintenance area, which is formed in the frame, is inspected by the operator during maintenance; open and close the door ( 64), which is used to cover the maintenance area; the panel, which can be fixed on the frame with the main power switch being aligned with the main power to the on position, and the main power The power switch is aligned with the main power source and is removed from the frame when the main power is turned off; the rod body (74), one end of which is pressed and locked on the panel; and the penetrating installation part (82), which is The opening and closing door is formed with a through hole (82a) into which the other end of the rod body is inserted.
Description
本發明係關於具有於維修之時作業員檢修之維修區域的裝置。 The present invention relates to a device having a maintenance area that is checked by an operator during maintenance.
在加工半導體晶圓等之時所使用之各種裝置的框體,收容有各種構成要素。框體係以例如製作裝置之概略外形的骨架,覆蓋骨架之蓋體所構成,於維修內部之構成要素等之時,蓋體之一部分藉由作業員卸下(例如,參照專利文獻1)。 The housings of various devices used in processing semiconductor wafers, etc. contain various components. The frame system is composed of, for example, a skeleton of the outline shape of the manufacturing device and a cover covering the skeleton. When repairing internal components, a part of the cover is removed by an operator (for example, refer to Patent Document 1).
[專利文獻1]日本特開2007-331050號公報 [Patent Document 1] JP 2007-331050 A
但是,每次維修卸下框體之蓋體,也不一定能夠充分提高作業之效率。在此,在此情況下,也有必須 與用以設置裝置之設置空間不同,另外確保用以暫時性保管卸下之蓋體的保管空間的問題。 However, removing the cover of the frame every time for maintenance may not be able to fully improve the efficiency of work. Here, in this case, there must be Different from the installation space for installing the device, there is also a problem of ensuring a storage space for temporarily storing the removed cover.
本發明係鑒於如此之問題點而創作出,其目的在於提供即使不卸下框體之蓋體亦可以維修之具有維修區域的裝置。 The present invention was created in view of such problems, and its purpose is to provide a device with a repair area that can be repaired even without removing the cover of the frame.
若藉由本發明之一態樣時,提供一種具有維修區域的裝置,其特徵在於,具備:框體;主電源開關,其係用以切換主電源之接通和斷開;維修區域,其係被形成在該框體內,於維修時作業者檢修;開關門,其係用以覆蓋該維修區域;面板,其係可以在將該主電源開關對準該主電源成為接通之接通位置之狀態下被固定在該框體,且在將該主電源開關對準該主電源成為斷開之斷開位置之狀態下從該框體卸下;桿體,其一端在該面板被按壓卡止;及貫穿安裝部,其被形成在該開關門,具有該桿體之另一端側被插入的貫通孔,在該關閉該開關門之狀態下,將該面板固定在該框體,且限制該桿體之一端的位置,依此該桿體被定位在另一端側被插入至該貫通孔之貫穿安裝位置,將該主電源開關對準該斷開位置而從該框體卸下該面板,依此該桿體被定位在另一端側從該貫通孔被拔去之拔去位置。 According to one aspect of the present invention, a device with a maintenance area is provided, which is characterized by having: a frame; a main power switch for switching the main power on and off; the maintenance area is It is formed in the frame for maintenance by the operator during maintenance; the door is opened and closed, which is used to cover the maintenance area; the panel, which can be positioned when the main power switch is aligned with the main power source to be turned on It is fixed to the frame in the state and removed from the frame with the main power switch aligned with the main power to the off position; the lever body, one end of which is pressed and locked on the panel And a penetrating mounting portion, which is formed in the opening and closing door, has a through hole into which the other end of the rod body is inserted, and in the state that the opening and closing door is closed, the panel is fixed to the frame and restricts the The position of one end of the rod body, whereby the rod body is positioned at the other end side to be inserted into the penetration installation position of the through hole, the main power switch is aligned to the off position and the panel is removed from the frame, Accordingly, the rod body is positioned at the unplugged position where the other end side is unplugged from the through hole.
在與本發明之一態樣有關的具有維修區域的裝置中,因具備有用以覆蓋被形成在框體之維修區域的開關門,故僅開啟該開關門即可以在維修區域檢修。即是,即使不卸下框體之蓋體亦可以維修裝置。 In the device with a maintenance area related to an aspect of the present invention, since the opening and closing door is provided to cover the maintenance area formed in the frame, the maintenance area can be inspected only by opening the opening and closing door. That is, the device can be repaired without removing the cover of the frame.
再者,在與本發明之一態樣有關之具有維修區域的裝置中,於開啟開關門之時,必須將主電源開關對準主電源成為斷開之斷開位置而使面板從框體卸下,且將另一端側被插入至貫通孔之桿體定位在拔去位置,而將該桿體之另一端側從貫通孔拔去。即是,因在主電源接通之狀態下,無法開啟開關門,故維修之時的安全性變高。 Furthermore, in a device with a maintenance area related to one aspect of the present invention, when opening and closing the door, the main power switch must be aligned with the main power source to be the off position to disconnect the panel from the frame. And position the rod with the other end inserted into the through hole at the removal position, and pull the other end of the rod from the through hole. That is, since the door cannot be opened and closed when the main power is turned on, the safety during maintenance becomes higher.
2:廢液處理裝置(具有維修區域的裝置) 2: Waste liquid treatment device (device with maintenance area)
4:框體 4: Frame
4a:第1開口部 4a: The first opening
4b:第2開口部 4b: The second opening
6:蓋體 6: Lid
8:配管 8: Piping
10:廢液槽 10: Waste tank
12:廢液泵 12: Waste liquid pump
14:配管 14: Piping
16:電磁閥 16: Solenoid valve
18:過濾單元 18: Filter unit
20:過濾器 20: filter
22:濾液承受盤 22: Filtrate receiving plate
24:配管 24: Piping
26:濾液槽 26: Filtrate tank
28:壓力感測器 28: Pressure sensor
30:濾液泵 30: Filtrate pump
32:配管 32: Piping
34:純水生成單元 34: Pure water generation unit
36:紫外線光源 36: Ultraviolet light source
38:配管 38: Piping
40‧‧‧第1離子交換器 40‧‧‧The first ion exchanger
42‧‧‧第2離子交換器 42‧‧‧The second ion exchanger
44‧‧‧電磁閥 44‧‧‧Solenoid valve
46‧‧‧電磁閥 46‧‧‧Solenoid valve
48‧‧‧配管 48‧‧‧Piping
50‧‧‧精密過濾器 50‧‧‧Precision filter
52‧‧‧壓力感測器 52‧‧‧Pressure sensor
54‧‧‧比電阻計 54‧‧‧Resistance Meter
56‧‧‧配管 56‧‧‧Piping
58‧‧‧溫度調整單元 58‧‧‧Temperature adjustment unit
60‧‧‧配管 60‧‧‧Piping
62‧‧‧蓋體 62‧‧‧Cover body
64‧‧‧開關門 64‧‧‧Open and close the door
66‧‧‧輸入墊 66‧‧‧Input Pad
68‧‧‧螢幕 68‧‧‧Screen
70‧‧‧主電源開關 70‧‧‧Main power switch
70a‧‧‧旋轉部 70a‧‧‧Rotating part
72‧‧‧面板 72‧‧‧Panel
72a‧‧‧承受部 72a‧‧‧Receiving Department
74‧‧‧桿體 74‧‧‧Pole body
74a‧‧‧第1凸緣部 74a‧‧‧First flange
74b‧‧‧第2凸緣部 74b‧‧‧Second flange
76‧‧‧第1保持部 76‧‧‧The first holding part
78‧‧‧第2保持部 78‧‧‧Second Holding Part
80‧‧‧線圈彈簧 80‧‧‧Coil spring
82‧‧‧貫穿安裝部 82‧‧‧through the installation department
82a‧‧‧貫通孔 82a‧‧‧Through hole
84‧‧‧螺絲 84‧‧‧Screw
圖1為表示示意性表示廢液處理裝置之外觀的斜視圖。 Fig. 1 is a perspective view schematically showing the appearance of a waste liquid treatment device.
圖2為示意性表示被收容在框體之構成要素之例的圖示。 Fig. 2 is a diagram schematically showing an example of constituent elements housed in a housing.
圖3為用以針對開關門之鎖定機構進行說明的一部分剖面俯視圖。 Fig. 3 is a partial cross-sectional plan view for explaining the locking mechanism for opening and closing doors.
圖4(A)及圖4(B)為用以針對安全機構進行說明的側面圖。 4(A) and 4(B) are side views for explaining the safety mechanism.
圖5為示意性表示開關門之鎖定被解除之狀態的一部分剖面俯視圖。 Fig. 5 is a partial cross-sectional plan view schematically showing a state where the lock of the opening and closing door is released.
參照附件圖面,針對與本發明之一態樣有關之實施型態進行說明。圖1為示意性表示用以處理於半導體晶圓之加工時產生的廢液等之廢液處理裝置之外觀的斜視圖。另外,在本實施型態中,作為具有維修區域之裝置,雖然舉出廢液處理裝置作為例而進行說明,但是與本發明有關之裝置即使為切削裝置、雷射加工裝置、研削裝置、研磨裝置、洗淨裝置等亦可。 With reference to the attached drawings, the implementation type related to one aspect of the present invention will be described. FIG. 1 is a perspective view schematically showing the appearance of a waste liquid processing apparatus for processing waste liquid and the like generated during the processing of semiconductor wafers. In addition, in this embodiment, as a device with a maintenance area, although a waste liquid treatment device is used as an example, the device related to the present invention is even a cutting device, a laser processing device, a grinding device, and a grinding device. Devices, washing devices, etc. are also possible.
如圖1所示般,廢液處理裝置(具有維修區域之裝置)2具備收容、搭載複數之構成要素,被搭載的框體4。框體4以代表例而言係由製作廢液處理裝置2之概略外形的骨架(無圖示),和覆蓋骨架之複數的蓋體6所構成。在框體4之內部形成有用以收容構成要素之收容空間。
As shown in FIG. 1, the waste liquid treatment device (device with a maintenance area) 2 includes a
圖2為示意性表示被收容在框體4之構成要素之例的圖示。在框體4之收容空間如圖2所示般,收容有通過配管8而與切削裝置等之加工裝置(無圖示)連接的廢液槽10。該廢液槽10係通過配管8而貯留從加工裝置接取到的廢液。
FIG. 2 is a diagram schematically showing an example of the constituent elements housed in the
在廢液槽10之上部,設置有用以將被貯留在廢液槽10之廢液送出至後段的廢液泵12。藉由廢液泵12而從廢液槽10被送出之廢液,通過配管14、電磁閥16等而被供給至過濾單元18。過濾單元18具備有用以過濾從廢液槽10被供給之廢液的過濾器20。
On the upper part of the
在過濾器20之下方,設置有接受過濾後之液體(濾液)之濾液承受盤22。在該濾液承受盤22,經由配管24等連接有濾液槽26,以過濾器20過濾廢液而取得的濾液,通過濾液承受盤22而被貯留在濾液槽26。
Below the
另外,在朝過濾單元18供給廢液之配管14,設置有用以檢測出廢液之壓力的壓力感測器28。壓力感測器28被連接於控制單元(無圖示),包含以壓力感測器28所檢測出之壓力之資訊的訊號被送至控制單元。
In addition, the
控制單元係例如當以壓力感測器28所檢測出之廢棄的壓力大於臨界值時,判斷成過濾器20之功能下降而將該訊息通知至作業員。如此之通知係可以以警告燈(無圖示)之發光、通知音之產生、顯示至螢幕68(圖1)等之方法來進行。
For example, when the pressure of the waste detected by the
濾液槽26連接有用以將貯留之濾液送出至後段的濾液泵30。藉由濾液泵30而從濾液槽26被送出之濾液,通過配管32而被供給至純水生成單元34。純水生成單元34具備有用以對從濾液槽26被供給之濾液照射紫外線(紫外光)之紫外線光源36。
The
利用從紫外線光源36被照射之紫外線被殺菌的濾液,通過配管38等而被供給至第1離子交換器40及第2離子交換器42。第1離子交換器40係經電磁閥44而被連接於配管38,第2離子交換器42係經電磁閥46而被連接於配管38。利用控制該些兩個電磁閥44、46,可以將濾液供給至第1離子交換器40及第2離子交換器
42之一方。
The filtrate sterilized by the ultraviolet rays irradiated from the
被供給至第1離子交換器40或第2離子交換器42之濾液,利用第1離子交換器40或第2離子交換器42所包含的離子交換樹脂,被離子交換,成為純水。另外,以如此之方法所生成之純水,也有混入從離子交換樹脂產生之微細的樹脂片等的碎屑之情形。於是,利用經由配管48連接於第1離子交換器40及第2離子交換器42之後段的精密過濾器50除去該碎屑。
The filtrate supplied to the
另外,在朝精密過濾器50供給純水之配管48,設置有用以檢測出純水之壓力的壓力感測器52。壓力感測器52被連接於控制單元,包含以壓力感測器52所檢測出之壓力之資訊的訊號被送至控制單元。控制單元係例如當以壓力感測器52所檢測出之純水的壓力大於臨界值時,判斷成精密過濾器50之功能下降而將該訊息通知至作業員。
In addition, the piping 48 for supplying pure water to the
再者,在朝精密過濾器50供給純水之配管48,設置有用以檢測出純水之比電阻的比電阻計54。比電阻計54被連接於控制單元,包含以比電阻計54所檢測出之比電阻之資訊的訊號被送至控制單元。控制單元係例如當以比電阻計54所檢測出之純水之比電阻低於臨界值時,判斷成第1離子交換器40或第2離子交換器42之功能下降而將訊息通知至作業員。
Furthermore, the piping 48 for supplying pure water to the
以純水生成單元34所生成之純水通過配管56等而被送至溫度調整單元58。以溫度調整單元58被調整
至特定之溫度的純水通過配管60等而被供給至加工裝置。
The pure water produced by the pure
如圖1所示般,在框體4之上部前面側,形成有通往收容空間的第1開口部4a。在第1開口部4a內,配置有例如上述的過濾單元18。再者,在框體4之上面安裝有用以關閉該第1開口部4a之蓋體62。利用開啟蓋體62,作業員可以通過第1開口部4a而更換過濾單元18之過濾器20。
As shown in FIG. 1, on the front side of the upper portion of the
再者,在框體4之前面形成有與第1開口部4a鄰接而通往收容空間的第2開口部4b。於維修廢液處理裝置2之時,例如作業員可以通過第2開口部4b而在收容空間之一部分檢修。即是,該收容空間之一部分成為維修時作業員檢修之維修區域。
Furthermore, on the front surface of the
在維修區域收容例如維修區域之頻率高的電氣裝備零件或配管等之構成要素。但是,被收容在維修區域之構成要素並無限制。在第2開口部4b之前方側,設置有用以覆蓋維修區域之開關門64。開關門64之一方之側部以絞鏈等被連結於框體4,開關門64以該側部為中心旋轉。
In the maintenance area, components such as high-frequency electrical equipment parts or piping in the maintenance area are accommodated. However, there are no restrictions on the components contained in the maintenance area. On the front side of the
在開關門64之上部前面,設置有用以輸入對控制單元之指示等的輸入墊66。在與輸入墊66鄰接之位置,設置有用以顯示各種資訊的螢幕68。
An
在框體4之側面,配置有用以切換廢液處理裝置2具備的主電源(無圖示)之接通和斷開的旋轉式之
主電源開關70。在主電源開關70之周圍,固定有包圍主電源開關70之面板72。該面板72成為用以鎖定開關門64之鎖定機構之一部分。
On the side of the
圖3為用以針對開關門64之鎖定機構進行說明的一部分剖面俯視圖。在圖3中,表示鎖定開關門64之狀態。如圖3所示般,在面板72之背面側(框體4之蓋體6側),接觸構成鎖定機構之圓柱狀之桿體74之一端側(基端側)。該桿體74係例如通過被形成在蓋體6之貫通孔(無圖示),而被插入至框體4之內部。
FIG. 3 is a partial cross-sectional plan view for explaining the locking mechanism of the opening and closing
再者,桿體74係例如在藉由被固定在框體4之上部等之第1保持部76及第2保持部78而能夠滑動之狀態下被保持。在第1保持部76及第2保持部78,分別形成貫通孔(無圖示),桿體74被插入至該貫通孔。
In addition, the
在桿體74之一端側,設置有從桿體74之側面突出至徑向的第1凸緣部74a。在位於第1凸緣部74a和第1保持部76之間的桿體74之周圍,配置有線圈彈簧80。藉由該線圈彈簧80,桿體74朝向面板72之背面側被彈推。即是,在鎖定開關門64之狀態下,桿體74之一端側在面板72以按壓之方式被卡止(被按壓卡止)。
On one end side of the
在桿體74之另一端側(前端側),設置有從桿體74之側面突出至徑向的第2凸緣部74b。藉由該第2凸緣部74b防止桿體74從第2保持部78脫落。另外,第2凸緣部74b被配置在從桿體74之另一端離開至一端側的位置上,桿體74之另一端之側面露出。
On the other end side (front end side) of the
在開關門64之內側設置有與桿體74之另一端側卡止的貫穿安裝部82。在貫穿安裝部82形成有可以插入桿體74之另一端側的貫通孔82a。依此,若在關閉開關門64之狀態下使桿體74滑動,使桿體74定位在另一端側被插入至貫通孔82a之貫穿安裝位置時,可以鎖定開關門64。
A
如上述般,桿體74之一端側在面板72之背面側以按壓之方式被卡止,桿體74之一端側之位置藉由面板72被限制。例如,將桿體74定位在開關門64被鎖定之貫穿安裝位置,係如圖3所示般,若將面板72固定在框體4(蓋體6)而限制桿體74之一端側之位置即可。
As described above, one end of the
對面板72之框體4(蓋體6)的固定例如藉由4個之螺絲84而被進行。另外,解除開關門64之鎖定,若從框體4(蓋體6)卸下面板72,且將桿體74定位在另一端側從貫通孔82a被拔去之拔去位置即可。
The frame 4 (the cover 6) of the
另外,在該鎖定機構,設置有利用將主電源開關70對準主電源成為斷開之斷開位置,使可以解除鎖定之安全機構。即是,只要主電源開關70不對準斷開位置,就算螺絲84鬆開,面板72也不會從框體4(蓋體6)卸下。
In addition, the lock mechanism is provided with a safety mechanism that can release the lock by aligning the
圖4(A)及圖4(B)為用以針對安全機構進行說明的側面圖。另外,在圖4(A)中,表示將主電源開關70對準主電源成為接通之接通位置的狀態,在圖4(B)中,表示將主電源開關70對準主電源成為斷開之斷
開位置的狀態。
4(A) and 4(B) are side views for explaining the safety mechanism. In addition, in FIG. 4(A), it shows a state where the
如圖4(A)及圖4(B)所示般,安全機構包含例如被連結、固定於主電源開關70之旋轉軸的棒狀之旋轉部70a。該旋轉部70a隨著主電源開關70之旋轉而旋轉。另外,在與旋轉部70a之前端對應之位置,配置有被固定於面板72側之承受部72a。
As shown in FIG. 4(A) and FIG. 4(B), the safety mechanism includes, for example, a rod-shaped
如圖4(A)所示般,承受部72a係被配置在將主電源開關70對準接通位置之狀態下旋轉部70a之前端卡合的位置。依此,在將主電源開關70對準接通位置之狀態下,旋轉部70a之前端卡合於承受部72a,主電源開關70和面板72之位置關係被固定。即是,在該狀態下,無法將面板72從框體4(蓋體6)卸下。
As shown in FIG. 4(A), the receiving
另外,當如圖4(B)所示般,使主電源開關70旋轉而對準斷開位置時,旋轉部70a也旋轉,旋轉部70a之前端和承受部72a之卡合被解除。依此,因主電源開關70和面板72之位置關係變成不被固定,故可以從框體4(蓋體6)卸下面板72,而解除開關門64之鎖定。
In addition, as shown in FIG. 4(B), when the
圖5為示意性表示開關門64之鎖定被解除之狀態的一部分剖面俯視圖。如圖5所示般,若在將主電源開關70對準斷開位置之狀態下,鬆開螺絲84時,就可以從框體4(蓋體6)卸下面板72。
FIG. 5 is a partial cross-sectional plan view schematically showing a state where the lock of the opening and closing
當從框體4(蓋體6)卸下面板72時,桿體74被定位在拔去位置,桿體74之另一端側從貫通孔82a被拔去。依此,作業員開啟開關門64而可以在維修區域
檢修。另外,在該狀態下,因主電源成為斷開,故安全性高。
When the
如上述般,在與本實施型態有關的廢液處理裝置(具有維修區域的裝置)2中,因具備有用以覆蓋被形成在框體4之維修區域的開關門64,故僅開啟該開關門64即可以在維修區域檢修。即是,即使不卸下框體4之蓋體6亦可以維修廢液處理裝置2。
As described above, in the waste liquid treatment device (device with a maintenance area) 2 related to this embodiment, since the opening and closing
再者,與本實施型態有關之廢液處理裝置2中,於開啟開關門64之時,必須將主電源開關70對準成為斷開之斷開位置而將面板72從框體4(蓋體6)卸下,且將另一端側被插入至貫通孔82a之桿體74定位在拔去位置,而將該桿體74之另一端從貫通孔82a拔去。即是,因在主電源接通之狀態下,無法開啟開關門64,故維修之時的安全性變高。
Furthermore, in the waste
另外,本發明並不限定於上述實施型態之記載,能夠做各種變更而加以實施。例如,在上述實施型態中,雖然針對與旋轉式之主電源開關70對應的安全機構之一例進行說明,但是安全機構之構成並不特別限制。例如,亦可以使用與按鍵式之主電源開關連動,而電性地使旋轉部旋轉之安全機構等。當然即使在旋轉式之主電源開關組合電性地進行動作的安全機構等亦可。
In addition, the present invention is not limited to the description of the above-mentioned embodiment, and can be implemented with various changes. For example, in the foregoing embodiment, although an example of the safety mechanism corresponding to the rotary
其他,與上述實施型態有關之構造、方法等只要不脫離本發明之目的的範圍,可以做適當變更而加以實施。 In addition, the structures, methods, etc. related to the above-mentioned embodiments can be implemented with appropriate changes as long as they do not depart from the scope of the object of the present invention.
2:廢液處理裝置(具有維修區域的裝置) 2: Waste liquid treatment device (device with maintenance area)
4:框體 4: Frame
4a:第1開口部 4a: The first opening
4b:第2開口部 4b: The second opening
6:蓋體 6: Lid
62:蓋體 62: Lid
64:開關門 64: open and close the door
66:輸入墊 66: input pad
68:螢幕 68: screen
70:主電源開關 70: Main power switch
72:面板 72: Panel
Claims (1)
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JP2016031901A JP6695625B2 (en) | 2016-02-23 | 2016-02-23 | Equipment with maintenance area |
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JP2000325292A (en) * | 1999-05-24 | 2000-11-28 | Olympus Optical Co Ltd | Medical treatment apparatus for endoscope |
JP2012109524A (en) * | 2010-10-25 | 2012-06-07 | Origin Electric Co Ltd | Power supply device |
CN103367059A (en) * | 2013-08-02 | 2013-10-23 | 胡俊兵 | High-voltage intelligent circuit breaker |
CN203480647U (en) * | 2013-09-18 | 2014-03-12 | 刘雪东 | Electric power overhaul safety protector |
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JP2000269299A (en) | 1999-03-18 | 2000-09-29 | Kokusai Electric Co Ltd | Semiconductor manufactureing device |
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JP4119762B2 (en) * | 2003-01-31 | 2008-07-16 | 富士フイルム株式会社 | Recording media protection mechanism |
JP4961168B2 (en) | 2006-06-14 | 2012-06-27 | 株式会社ディスコ | Processing equipment |
TWM327903U (en) * | 2007-09-19 | 2008-03-01 | Taian Etacom Technology Co Ltd | Protective door lock of an insertion-type power distribution box |
JP5086123B2 (en) | 2008-02-15 | 2012-11-28 | 株式会社ディスコ | Processing waste liquid treatment equipment |
TWM366229U (en) * | 2009-05-22 | 2009-10-01 | Taian Etacom Technology Co Ltd | Safety interlocking mechanism of jack-in type distribution box |
CN102312624B (en) | 2011-07-01 | 2013-11-13 | 广东北江开关厂有限公司 | Blocking structure for cubicle switchboard front door and cable chamber door |
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Patent Citations (4)
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JP2000325292A (en) * | 1999-05-24 | 2000-11-28 | Olympus Optical Co Ltd | Medical treatment apparatus for endoscope |
JP2012109524A (en) * | 2010-10-25 | 2012-06-07 | Origin Electric Co Ltd | Power supply device |
CN103367059A (en) * | 2013-08-02 | 2013-10-23 | 胡俊兵 | High-voltage intelligent circuit breaker |
CN203480647U (en) * | 2013-09-18 | 2014-03-12 | 刘雪东 | Electric power overhaul safety protector |
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KR102493113B1 (en) | 2023-01-27 |
JP2017148888A (en) | 2017-08-31 |
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KR20170099366A (en) | 2017-08-31 |
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CN107104066B (en) | 2022-05-03 |
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