TWI695171B - Probe - Google Patents

Probe Download PDF

Info

Publication number
TWI695171B
TWI695171B TW107117371A TW107117371A TWI695171B TW I695171 B TWI695171 B TW I695171B TW 107117371 A TW107117371 A TW 107117371A TW 107117371 A TW107117371 A TW 107117371A TW I695171 B TWI695171 B TW I695171B
Authority
TW
Taiwan
Prior art keywords
needle shaft
fixing member
barrel
cylinder
insertion portion
Prior art date
Application number
TW107117371A
Other languages
Chinese (zh)
Other versions
TW201901159A (en
Inventor
那須美佳
竹内修
Original Assignee
日商日本麥克隆尼股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商日本麥克隆尼股份有限公司 filed Critical 日商日本麥克隆尼股份有限公司
Publication of TW201901159A publication Critical patent/TW201901159A/en
Application granted granted Critical
Publication of TWI695171B publication Critical patent/TWI695171B/en

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755Material aspects
    • G01R1/06761Material aspects related to layers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2886Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

An objective of the present invention is to provide a probe allowing a narrow pitch and having a plunger and a barrel fixed to each other, and a manufacturing method thereof. A probe according to the present invention includes a rod-shaped plunger 11 having a distal end portion 111 and an insertion portion 112 connected to the distal end portion 111, a tubular barrel 12 inside which the insertion portion 112 of the plunger 11 is disposed, and an electrically conductive first fixing member 131 which is disposed in an opposing region of the plunger 11 with the barrel 12 to fix the plunger 11 and the barrel 12 to each other, and has a lower melting point than any material of the plunger 11 and the barrel 12, wherein the space between the plunger 11 and the barrel 12 is buried with the first fixing member 131 in such a state that no gap exists, in a cross-sectional plane of an area where the plunger 11 and the barrel 12 overlap with each other, which includes the area where the first fixing member 131 is disposed.

Description

探針 Probe

本發明係關於一種使用於被檢查體的特性的測定之探針(probe)。 The present invention relates to a probe used for measuring characteristics of a test object.

為了以並未從晶圓分離的狀態測定積體電路等之被檢查體的特性,係使用與被檢查體接觸之探針。探針係採用例如由稱為針軸(plunger)之與被檢查體接觸之小徑的傳導部、與稱為筒體(barrel)之用以使針軸以適當的壓力接觸被檢查體而形成為可伸縮自如之圓筒形狀部相連結而成的構造等(參照例如專利文獻1)。 In order to measure the characteristics of a test object such as an integrated circuit without being separated from the wafer, a probe contacting the test object is used. The probe is formed by using, for example, a small-diameter conductive part called a plunger that is in contact with the object to be inspected, and a barrel called a barrel for the needle shaft to contact the object to be inspected with an appropriate pressure It is the structure etc. which connected the expandable and contractible cylindrical shape part (refer patent document 1 for example).

[先前技術文獻] [Prior Technical Literature] [專利文獻] [Patent Literature]

(專利文獻1)日本特開2013-53931號公報 (Patent Document 1) Japanese Unexamined Patent Publication No. 2013-53931

為了使針軸與筒體相固接,可使用點銲。然而,藉由點銲使針軸與筒體相固接,會發生因點銲之加壓而使筒體向外側鼓起之現象。因此,為了防止探針相接 觸,必須使探針的間隔變寬,而有阻礙了探針的配置的窄間距化之問題。 In order to make the needle shaft and the cylinder fixedly connected, spot welding can be used. However, the spot shaft welds the pin shaft to the cylinder body, and the cylinder body bulges outward due to the pressure of the spot welding. Therefore, in order to prevent the probes from coming into contact, it is necessary to widen the interval of the probes, which has a problem that the arrangement of the probes is narrowed.

有鑑於上述問題點,本發明之目的在於提供一種可窄間距化之由針軸與筒體相固接而成的探針及其製造方法。 In view of the above problems, an object of the present invention is to provide a probe with a narrow pitch that is formed by a fixed connection between a needle shaft and a barrel, and a manufacturing method thereof.

根據本發明之一態樣,提供一種探針,此探針具備有:棒狀的針軸,係具有前端部及連結至前端部之插入部;管狀的筒體,供針軸的插入部配置於其內部;以及導電性的第一固接構件,係配置於針軸與筒體相向的區域以使針軸與筒體相固接且融點比針軸及筒體的材料都低者,其中,在包含配置有第一固接構件的區域之針軸與筒體重疊的區域的切斷面中,針軸與筒體之間係由第一固接構件以沒有空隙之方式加以填滿。 According to one aspect of the present invention, there is provided a probe including: a rod-shaped needle shaft having a front end portion and an insertion portion connected to the front end portion; a tubular cylinder body for disposing the insertion portion of the needle shaft Inside it; and the conductive first fixing member, which is arranged in the area where the needle shaft and the cylinder face so that the needle shaft and the cylinder are fixed and the melting point is lower than the material of the needle shaft and the cylinder, Wherein, in the cut surface of the region where the needle shaft and the cylinder overlap the region where the first fixing member is arranged, the space between the needle shaft and the cylinder is filled by the first fixing member without a gap .

根據本發明之另一態樣,提供一種探針的製造方法,該探針係具有:棒狀的針軸,係具有前端部及連結至前端部之插入部;以及管狀的筒體,係供針軸的插入部配置於其內部;該製造方法係包含:在針軸及筒體的至少其中一者的特定的區域,形成融點比針軸及筒體的任一材料都低之導電性的第一固接構件之步驟;將針軸的插入部從筒體的開口端插入至內部,以使針軸與筒體在特定的區域透過第一固接構件而相連結之步驟;以及使第一固接構件融熔而使針軸與筒體相固接之步驟。 According to another aspect of the present invention, there is provided a method for manufacturing a probe, the probe having: a rod-shaped needle shaft having a front end portion and an insertion portion connected to the front end portion; and a tubular cylinder body for The insertion part of the needle shaft is arranged inside; the manufacturing method includes: forming a specific area of at least one of the needle shaft and the cylinder body, forming a conductivity lower than any material of the needle shaft and the cylinder body The step of the first fixing member; the step of inserting the insertion portion of the needle shaft from the open end of the cylinder into the inside so that the needle shaft and the cylinder are connected through the first fixing member in a specific area; and The step of fusing the first fixing member to fix the needle shaft and the barrel.

根據本發明,可提供一種可窄間距化之由針軸與筒體相固接而成的探針及其製造方法。 According to the present invention, it is possible to provide a probe which can be narrowed and is formed by a fixed connection between a needle shaft and a barrel, and a manufacturing method thereof.

1‧‧‧探針 1‧‧‧ Probe

11、11A‧‧‧針軸 11, 11A‧‧‧Needle shaft

12、12A‧‧‧筒體 12, 12A‧‧‧Cylinder

110‧‧‧阻擋部 110‧‧‧block

111‧‧‧前端部 111‧‧‧Front end

112‧‧‧插入部 112‧‧‧Insert

113‧‧‧凸出區域 113‧‧‧ protruding area

120‧‧‧芯線 120‧‧‧core wire

121‧‧‧內層 121‧‧‧Inner layer

131‧‧‧第一固接構件 131‧‧‧First fixed member

132‧‧‧第二固接構件 132‧‧‧Second fixing member

第1圖係顯示本發明的第一實施形態之探針的構成之示意圖。 Fig. 1 is a schematic diagram showing the configuration of the probe according to the first embodiment of the present invention.

第2圖係顯示本發明的第一實施形態之探針的構成之示意剖視圖。 FIG. 2 is a schematic cross-sectional view showing the configuration of the probe of the first embodiment of the present invention.

第3圖係顯示保持本發明的第一實施形態之探針的例子之示意圖。 Fig. 3 is a schematic diagram showing an example of holding the probe of the first embodiment of the present invention.

第4圖係顯示本發明的第一實施形態之探針的第一固著構件的形成例之示意圖。 FIG. 4 is a schematic diagram showing an example of formation of the first fixing member of the probe according to the first embodiment of the present invention.

第5圖係顯示本發明的第一實施形態之探針的第一固著構件的另一形成例之示意圖,第5圖(a)係顯示配置第一固接構件之前的針軸的狀態,第5圖(b)係顯示配置第一固接構件後的針軸的狀態,第5圖(c)係顯示針軸與筒體相固接後的狀態。 FIG. 5 is a schematic diagram showing another example of formation of the first fixing member of the probe according to the first embodiment of the present invention, and FIG. 5(a) shows the state of the needle shaft before the first fixing member is arranged, FIG. 5(b) shows the state of the needle shaft after the first fixing member is arranged, and FIG. 5(c) shows the state of the needle shaft after being fixed to the barrel.

第6圖係顯示本發明的第一實施形態之探針的第一固著構件的另一形成例之示意圖。 Fig. 6 is a schematic diagram showing another example of formation of the first fixing member of the probe according to the first embodiment of the present invention.

第7圖係顯示本發明的第一實施形態之探針的第一固著構件的另一形成例之示意圖。 Fig. 7 is a schematic diagram showing another example of formation of the first fixing member of the probe according to the first embodiment of the present invention.

第8圖係用來說明比較例之探針的製造方法之模式的斷面圖。 FIG. 8 is a schematic cross-sectional view for explaining the method of manufacturing the probe of the comparative example.

第9圖係顯示比較例之探針的形狀之示意圖。 Fig. 9 is a schematic diagram showing the shape of the probe of the comparative example.

第10圖係用來說明筒體的形成方法之示意圖。 Fig. 10 is a schematic diagram for explaining the method of forming the cylinder.

第11圖係顯示筒體的構成之示意剖視圖。 Fig. 11 is a schematic cross-sectional view showing the structure of the cylinder.

第12圖係顯示本發明的第一實施形態的變形例之探針的構成之示意圖。 Fig. 12 is a schematic diagram showing the configuration of a probe according to a modification of the first embodiment of the present invention.

第13圖係顯示本發明的第二實施形態之探針的構成之示意圖。 Fig. 13 is a schematic diagram showing the configuration of the probe according to the second embodiment of the present invention.

第14圖係顯示第13圖所示之探針中的第二固接構件的形成方法之示意剖視圖。 FIG. 14 is a schematic cross-sectional view showing a method of forming the second fixing member in the probe shown in FIG. 13.

第15圖係顯示本發明的其他實施形態之探針的構成之示意圖。 Fig. 15 is a schematic diagram showing the configuration of a probe according to another embodiment of the present invention.

以下,參照圖式來說明本發明的實施形態。在以下的圖式的記載中,相同或類似的部分都標示相同或類似的符號。不過,應注意圖式為示意圖,各部的厚度的比例等與實際者並不相同。當然,圖式相互間也含有相互的尺寸的關係及比例不同的部分。以下揭示的實施形態只是舉例揭示用來使本發明的技術思想具體化之裝置及方法而已,本發明的實施形態並非用來將構成零件的材質、形狀、構造、配置等限定在以下所述的例子。 Hereinafter, an embodiment of the present invention will be described with reference to the drawings. In the description of the following drawings, the same or similar parts are marked with the same or similar symbols. However, it should be noted that the drawing is a schematic diagram, and the thickness ratio of each part is different from the actual one. Of course, the drawings also include parts in which the relationship and ratio of the sizes are different. The embodiments disclosed below are only examples of devices and methods for embodying the technical idea of the present invention. The embodiments of the present invention are not intended to limit the materials, shapes, structures, arrangements, etc. of components to the following example.

(第一實施形態) (First embodiment)

本發明的第一實施形態之探針1係如第1圖所示,具備有:棒狀的針軸11,係具有前端部111及連結至前端部111之插入部112;管狀的筒體12,係供針軸11的插入部 112配置於其內部;以及第一固接構件131,係使針軸11與筒體12相固接。第一固接構件131係配置於針軸11與筒體12相對向的區域,且為融點比針軸11及筒體12的任一材料都低之構件。如第1圖所示,筒體12的外徑為一定。另外,為了易於了解,以劃斜線的方式顯示第一固接構件131(以下亦同)。 As shown in FIG. 1, the probe 1 of the first embodiment of the present invention includes: a rod-shaped needle shaft 11 having a front end portion 111 and an insertion portion 112 connected to the front end portion 111; a tubular barrel 12 , The insertion portion 112 of the needle shaft 11 is arranged inside thereof; and the first fixing member 131 is to fix the needle shaft 11 and the barrel 12. The first fixing member 131 is disposed in a region where the needle shaft 11 and the barrel 12 face each other, and has a melting point lower than that of any material of the needle shaft 11 and the barrel 12. As shown in FIG. 1, the outer diameter of the cylinder 12 is constant. In addition, for easy understanding, the first fixing member 131 is shown in a diagonal line (the same applies hereinafter).

第2圖中顯示利用第一固接構件131使針軸11與筒體12相固接之區域的剖面形狀。如第2圖所示,在包含配置有第一固接構件131的區域之針軸11與筒體12重疊的區域的切斷面中,針軸11的表面與筒體12的內壁面之間係由第一固接構件131以沒有空隙之方式加以填滿。 FIG. 2 shows the cross-sectional shape of the region where the needle shaft 11 is fixed to the barrel 12 by the first fixing member 131. As shown in FIG. 2, between the surface of the needle shaft 11 and the inner wall surface of the cylinder 12 in the cut surface of the region where the needle shaft 11 and the cylinder 12 overlap the region where the first fixing member 131 is arranged The first fixing member 131 is filled with no gap.

第1圖所示之探針1係為從筒體12的兩端的開口端分別插入有針軸11之構成。探針1係使用於例如被檢查體的電氣特性的取得。在此情況下,一端的針軸11的前端部111與被檢查體接觸,另一端的針軸11的前端部111與配線基板等的端子接觸,透過配線基板而與測試機(tester)等測試機器電性連接。 The probe 1 shown in FIG. 1 has a configuration in which needle shafts 11 are inserted from the opening ends of both ends of the cylindrical body 12, respectively. The probe 1 is used, for example, to acquire the electrical characteristics of a subject. In this case, the front end portion 111 of the needle shaft 11 at one end is in contact with the subject, and the front end portion 111 of the needle shaft 11 at the other end is in contact with a terminal such as a wiring board and is tested with a tester or the like through the wiring board The machine is electrically connected.

因此,針軸11與筒體12係採用導電性的材料。例如,針軸11係採用AgPdCu材等,筒體12係採用Ni材等。由於針軸11與筒體12透過第一固接構件131而電性連接,所以第一固接構件131也採用導電性的材料。 Therefore, the needle shaft 11 and the barrel 12 are made of conductive materials. For example, the needle shaft 11 is made of AgPdCu, etc., and the cylinder 12 is made of Ni. Since the needle shaft 11 and the cylinder 12 are electrically connected through the first fixing member 131, the first fixing member 131 also uses a conductive material.

如第1圖所示,形成有貫通筒體12之側面之螺旋狀的切縫,使筒體12的一部分形成為彈簧狀。藉此, 筒體12可在軸方向伸縮自如。因而,可利用適當的壓力使針軸11與被檢查體及配線基板接觸。另外,在內部並沒有配置針軸11之區域未形成切縫。 As shown in FIG. 1, a spiral slit penetrating the side surface of the cylindrical body 12 is formed, and a part of the cylindrical body 12 is formed into a spring shape. Thereby, the cylinder 12 can expand and contract freely in the axial direction. Therefore, the needle shaft 11 can be brought into contact with the object to be inspected and the wiring board with an appropriate pressure. In addition, no slit is formed in the area where the needle shaft 11 is not arranged.

探針1如第3圖所示由插座(socket)2所保持。被檢查體的測定所需的個數的針軸11係貫通插座2而配置。從插座2的一個主面露出之針軸11係與被檢查體接觸,從插座2的另一個主面露出之針軸11係與測試機器電性連接。 The probe 1 is held by a socket 2 as shown in FIG. 3. The number of needle shafts 11 required for the measurement of the subject is arranged through the socket 2. The pin shaft 11 exposed from one main surface of the socket 2 is in contact with the object to be inspected, and the pin shaft 11 exposed from the other main surface of the socket 2 is electrically connected to the testing machine.

以下,說明第1圖所示之探針1的製造方法。以下所述的探針1的製造方法只是一例,包含此變形例在內,當然可利用此處說明的方法以外的各種製造方法加以實現。 Hereinafter, a method of manufacturing the probe 1 shown in FIG. 1 will be described. The manufacturing method of the probe 1 described below is just an example, and including this modified example, it can of course be realized by various manufacturing methods other than the method described here.

首先,在針軸11與筒體12的至少其中一者的特定的區域,形成融點比針軸11及筒體12的任一材料都低之導電性的第一固接構件131。例如,如第4圖所示,在針軸11的表面形成第一固接構件131。形成第一固接構件131之區域係如第4圖中以一點鏈線所示,對應於與筒體12的開口端相距一定的距離之區域。 First, in a specific area of at least one of the needle shaft 11 and the barrel 12, a first fixing member 131 having a conductivity lower than that of any material of the needle shaft 11 and the barrel 12 is formed. For example, as shown in FIG. 4, the first fixing member 131 is formed on the surface of the needle shaft 11. The area where the first fixing member 131 is formed is shown by a dotted line in FIG. 4, and corresponds to a certain distance from the open end of the cylinder 12.

然後,將針軸11的插入部112從筒體12的開口端插入至內部以使針軸11與筒體12在特定的區域透過第一固接構件131而相連結。然後,使第一固接構件131融熔而使針軸11與筒體12相固接。 Then, the insertion portion 112 of the needle shaft 11 is inserted into the inside from the open end of the cylindrical body 12 to connect the needle shaft 11 and the cylindrical body 12 through the first fixing member 131 in a specific area. Then, the first fixing member 131 is melted to fix the needle shaft 11 and the cylinder 12.

第一固接構件131係可利用例如加熱處理而融熔。例如,藉由回焊(reflow)而使第一固接構件131 在高溫環境下融熔。 The first fixing member 131 can be melted by, for example, heat treatment. For example, the first fixing member 131 is melted in a high-temperature environment by reflow.

此外,在上述的製造方法中之形成第一固接構件131之特定的區域,係指在針軸11與筒體12相連接後的狀態下針軸11與筒體12兩者相對向的區域,以下將之稱為「固接區域」。為了在固接區域形成第一固接構件13之方法,可依據第一固接構件131的種類等而採用各種方法。形成第一固接構件13之方法有例如形成Au/Sn鍍層之方法、或塗覆錫膏之方法。 In addition, the specific area where the first fixing member 131 is formed in the above-mentioned manufacturing method refers to an area where the needle shaft 11 and the barrel 12 are opposed when the needle shaft 11 and the barrel 12 are connected , Hereinafter referred to as "fixed area". In order to form the first fixing member 13 in the fixing region, various methods can be adopted according to the type of the first fixing member 131 and the like. The method of forming the first fixing member 13 includes, for example, a method of forming an Au/Sn plating layer, or a method of applying solder paste.

如前述,在探針1中,電氣訊號係經由針軸11及筒體12而傳遞。因此,針軸11與筒體12之間的電阻必須要低。因而,使針軸11與筒體12電性連接之第一固接構件131,最好能夠不留空隙地將針軸11與筒體12之間的間隙填滿。因此,將第一固接構件131朝圓周方向連續地形成於針軸11的側面上。藉此,在形成有第一固接構件131之固接區域的切斷面中,使針軸11與筒體12之間的間隙由融熔的第一固接構件131以沒有空隙之方式填滿。 As described above, in the probe 1, the electrical signal is transmitted through the needle shaft 11 and the barrel 12. Therefore, the resistance between the needle shaft 11 and the barrel 12 must be low. Therefore, it is preferable that the first fixing member 131 that electrically connects the needle shaft 11 and the barrel 12 can fill the gap between the needle shaft 11 and the barrel 12 without leaving a gap. Therefore, the first fixing member 131 is continuously formed on the side surface of the needle shaft 11 in the circumferential direction. Thereby, in the cut surface where the fixing region of the first fixing member 131 is formed, the gap between the needle shaft 11 and the barrel 12 is filled by the melted first fixing member 131 without a gap full.

另外,可如第5圖(a)所示在針軸11的插入部112的表面設置具有外緣之凹部,然後如第5圖(b)所示在該凹部的內部形成第一固接構件131。使第5圖(b)所示的狀態之針軸11與筒體12相固接之後的狀態係如第5圖(c)所示。 In addition, as shown in FIG. 5(a), a concave portion having an outer edge may be provided on the surface of the insertion portion 112 of the needle shaft 11, and then a first fixing member may be formed inside the concave portion as shown in FIG. 5(b). 131. The state after the needle shaft 11 and the cylindrical body 12 in the state shown in FIG. 5(b) are fixed to each other is as shown in FIG. 5(c).

藉由在設於插入部112的表面之凹部形成第一固接構件131,而如第5圖(c)所示使未形成凹部之針 軸11與筒體12的間隔變窄。藉此,可使流至探針1之電流的容許量增大。另外,在固接區域以外的區域中,亦可使針軸11的表面與筒體12的內壁面相接合。因此,可更加減低針軸11與筒體12之間的電阻。 By forming the first fixing member 131 in the concave portion provided on the surface of the insertion portion 112, as shown in FIG. 5(c), the interval between the needle shaft 11 and the cylindrical body 12 where the concave portion is not formed is narrowed. With this, the allowable amount of current flowing to the probe 1 can be increased. In addition, in a region other than the fixed region, the surface of the needle shaft 11 may be joined to the inner wall surface of the barrel 12. Therefore, the resistance between the needle shaft 11 and the barrel 12 can be further reduced.

以上雖然揭示將第一固接構件131形成於針軸11的例子,但第一固接構件131亦可形成於固接前的針軸11及筒體12的任一者。或者,亦可在針軸11及筒體12之雙方都形成第一固接構件131。 Although the example in which the first fixing member 131 is formed on the needle shaft 11 is disclosed above, the first fixing member 131 may be formed on any one of the needle shaft 11 and the cylinder 12 before fixing. Alternatively, the first fixing member 131 may be formed on both the needle shaft 11 and the barrel 12.

第6圖中顯示在筒體12的表面形成第一固接構件131之例。此外,亦可如第7圖所示將第一固接構件131形成於設在筒體12的內壁面之凹部。藉由在凹部的內部形成第一固接構件131,可使在固接區域以外的區域之針軸11與筒體12的間隔變窄。藉此,如上所述可使流至針軸11之電流的容許量增大、使針軸11與筒體12之間的電阻減低。此外,亦可在針軸11的插入部112的表面及筒體12的內壁面都設置凹部,在該等凹部的內部都形成第一固接構件131。 FIG. 6 shows an example in which the first fixing member 131 is formed on the surface of the cylindrical body 12. In addition, as shown in FIG. 7, the first fixing member 131 may be formed in a concave portion provided on the inner wall surface of the cylindrical body 12. By forming the first fixing member 131 inside the concave portion, the interval between the needle shaft 11 and the cylinder 12 in a region other than the fixing region can be narrowed. As a result, as described above, the allowable amount of current flowing to the needle shaft 11 can be increased, and the resistance between the needle shaft 11 and the barrel 12 can be reduced. In addition, recesses may be provided on both the surface of the insertion portion 112 of the needle shaft 11 and the inner wall surface of the cylindrical body 12, and the first fixing member 131 may be formed inside these recesses.

第8圖中顯示作為比較例之以點銲使針軸11A與筒體12A相固接之方法。點銲係利用電極100一邊朝箭號的方向對針軸11A及筒體12A施壓(press),一邊使電流流通於針軸11A及筒體12A。藉此,使針軸11A與筒體12A的接觸面產生熱阻,利用此熱阻使針軸11A及筒體12A的內部發生金屬的融熔凝固,而使針軸11A與筒體12A相熔接。由於此時的壓力,會如第9圖所示造成變形而使 筒體12A的表面產生鼓起。 FIG. 8 shows a method of fixing the pin shaft 11A and the barrel 12A by spot welding as a comparative example. The spot welding system uses the electrode 100 to press the needle shaft 11A and the cylinder 12A in the direction of the arrow, while flowing current through the needle shaft 11A and the cylinder 12A. As a result, the contact surface between the needle shaft 11A and the barrel 12A generates thermal resistance, and the heat resistance causes metal fusion and solidification inside the needle shaft 11A and the barrel 12A, so that the needle shaft 11A and the barrel 12A are welded together . The pressure at this time causes deformation as shown in Fig. 9 and causes the surface of the cylinder 12A to swell.

當探針的表面產生鼓起時,為了防止探針間之接觸,就必須使探針的間隔變寬。因此,會阻礙到探針的配置的窄間距化。 When bulging occurs on the surface of the probe, in order to prevent contact between the probes, the interval between the probes must be widened. Therefore, the narrow pitch of the probe arrangement is hindered.

相對於此,根據上述說明之本發明的第一實施形態之探針1的製造方法,不須在針軸11與筒體12的固接中施加壓力。因此,不會在使針軸11與筒體12相固接之固接區域發生隆起的情形,筒體12的外徑會保持一定。因而,可實現探針的配置的窄間距化。 In contrast, according to the method of manufacturing the probe 1 according to the first embodiment of the present invention described above, it is not necessary to apply pressure to the fixed connection of the needle shaft 11 and the barrel 12. Therefore, the outer diameter of the cylindrical body 12 is kept constant without bulging in the fixed area where the needle shaft 11 and the cylindrical body 12 are fixed. Therefore, it is possible to narrow the pitch of the probe arrangement.

此外,係在如第10圖所示之在筒體12的內部穿入芯線120之狀態下在筒體12形成螺旋形之切縫。例如採用光刻(photolithography)技術來形成切縫。此時,最好如第11圖所示將筒體12形成為多層構造。例如,將內層121設為Au材,將外層122設為Ni材。藉此,可在對筒體12的側面進行蝕刻時利用內層121防止蝕刻材從筒體12的裏側繞入。而且,藉由將內層121設為Au材,可順利地將芯線120從筒體12抽出。 In addition, a spiral slit is formed in the cylinder 12 in a state where the core wire 120 is inserted into the cylinder 12 as shown in FIG. 10. For example, photolithography technology is used to form the slit. At this time, it is preferable to form the cylindrical body 12 into a multilayer structure as shown in FIG. 11. For example, the inner layer 121 is made of Au material, and the outer layer 122 is made of Ni material. Thereby, the inner layer 121 can be used to prevent the etching material from getting in from the back side of the cylinder 12 when the side surface of the cylinder 12 is etched. Furthermore, by making the inner layer 121 an Au material, the core wire 120 can be smoothly drawn out from the cylindrical body 12.

另外,將筒體12形成為多層構造時,可採用會與融熔的第一固接構件131反應而形成合金之材料來作為內層121。藉此,可使針軸11與筒體12更牢固地相固接。 In addition, when the cylindrical body 12 is formed into a multilayer structure, a material that will react with the melted first fixing member 131 to form an alloy may be used as the inner layer 121. Thereby, the needle shaft 11 and the barrel 12 can be more firmly fixed.

<變形例> <Modification>

第12圖所示之第一實施形態的變形例之探針1,係在針軸11的插入部112形成有阻擋部110。阻擋部110係形成於插入部112之比與第一固接構件131相接的區域更靠近針軸11所插入的筒體12的開口部之區域,且配置在筒體12的內部。利用阻擋部110防止第一固接構件131往筒體12的開口部移動。阻擋部110係形成為外徑比與第一固接構件131相接的區域更大之凸緣狀。 In the probe 1 of the modified example of the first embodiment shown in FIG. 12, a blocking portion 110 is formed in the insertion portion 112 of the needle shaft 11. The blocking portion 110 is formed in the area of the insertion portion 112 closer to the opening of the barrel 12 into which the needle shaft 11 is inserted than the area in contact with the first fixing member 131, and is arranged inside the barrel 12. The blocking portion 110 prevents the first fixing member 131 from moving toward the opening of the cylindrical body 12. The blocking portion 110 is formed in a flange shape having an outer diameter larger than a region in contact with the first fixing member 131.

阻擋部110的外徑最好為在阻擋部110可插入至筒體12的內部之範圍內的大小。藉此,可有效地抑制第一固接構件131在凝固前流到針軸11的前端部111。 The outer diameter of the blocking portion 110 is preferably within a range where the blocking portion 110 can be inserted into the inside of the cylinder 12. With this, the first fixing member 131 can be effectively prevented from flowing to the front end portion 111 of the needle shaft 11 before solidification.

(第二實施形態) (Second embodiment)

第13圖顯示本發明的第二實施形態之探針1。第13圖所示之探針1,其針軸11係在前端部111與插入部112之間具有外徑比筒體12的內徑更大之凸出區域113。 Fig. 13 shows the probe 1 of the second embodiment of the present invention. In the probe 1 shown in FIG. 13, the needle shaft 11 has a protruding region 113 having an outer diameter larger than the inner diameter of the barrel 12 between the front end portion 111 and the insertion portion 112.

第13圖所示之探針1係如第14圖所示,在凸出區域113之與筒體12的開口端的端面相對向之面形成第二固接構件132。藉此,在將針軸11的插入部112插入筒體12的內部之情況時,利用第二固接構件132使針軸11的凸出區域113與筒體12的開口端的端面相固接。 As shown in FIG. 14, the probe 1 shown in FIG. 13 is formed with a second fixing member 132 on the surface of the protruding region 113 facing the end surface of the opening end of the cylindrical body 12. Thereby, when the insertion portion 112 of the needle shaft 11 is inserted into the barrel 12, the protruding region 113 of the needle shaft 11 is fixed to the end surface of the open end of the barrel 12 by the second fixing member 132.

根據第13圖所示之探針1,融熔的第二固接構件132的位置會很穩定。亦即,可抑制融熔的第二固接構件132從預定的位置流出。 According to the probe 1 shown in FIG. 13, the position of the melted second fixing member 132 will be stable. That is, the melted second fixing member 132 can be suppressed from flowing out from a predetermined position.

以上雖揭示在針軸11的凸出區域113形成第二固接構件132之例,但亦可在筒體12的開口端的端面形成第二固接構件132。或者,可在針軸11的凸出區域113及筒體12的開口端的端面都形成第二固接構件132。 Although the example of forming the second fixing member 132 in the protruding region 113 of the needle shaft 11 is disclosed above, the second fixing member 132 may be formed on the end surface of the open end of the cylindrical body 12. Alternatively, the second fixing member 132 may be formed on both the protruding region 113 of the needle shaft 11 and the end surface of the open end of the barrel 12.

又,可如第15圖所示,在針軸11的插入部112與筒體12的內壁面之間配置第一固接構件131,且在針軸11的凸出區域113與筒體12的開口端的端面之間配置第二固接構件132,將該等兩方的區域都作為固接區域。藉此,可利用複數個連接區域使針軸11與筒體12更牢固地相固接。 In addition, as shown in FIG. 15, the first fixing member 131 may be disposed between the insertion portion 112 of the needle shaft 11 and the inner wall surface of the barrel 12, and between the protruding area 113 of the needle shaft 11 and the barrel 12 The second fixing member 132 is disposed between the end surfaces of the open end, and both of these areas are used as the fixing area. Thereby, the pin shaft 11 and the barrel 12 can be more firmly fixed by using a plurality of connecting regions.

(其他的實施形態) (Other embodiments)

如上述利用實施形態進行了本發明之揭示,但不應將屬於此揭示的一部分之說明及圖式理解成是限制本發明者。本發明相關技術領域的業者當可從上述揭示輕易地想到各種替代實施形態、實施例及運用技術。 The present invention has been disclosed using the embodiments as described above, but the description and drawings that are part of this disclosure should not be construed as limiting the present invention. Those skilled in the art related to the present invention can easily think of various alternative embodiments, examples, and application techniques from the above disclosure.

例如,上述揭示說明的雖然是探針1的剖面的形狀為圓形之情況,但剖面的形狀亦可為四角形等多角形。 For example, the above disclosure describes the case where the cross-sectional shape of the probe 1 is circular, but the cross-sectional shape may also be a polygon such as a quadrangle.

如上所述,此處未載明的各種實施形態等當然都包含在本發明中。因此,本發明的技術範圍只由就上述的說明而言為妥當的申請專利範圍中界定的發明特定事項所決定。 As described above, various embodiments and the like not described here are naturally included in the present invention. Therefore, the technical scope of the present invention is determined only by the specific matters of the invention defined in the scope of patent application that is appropriate for the above description.

1‧‧‧探針 1‧‧‧ Probe

11‧‧‧針軸 11‧‧‧ Needle shaft

12‧‧‧筒體 12‧‧‧Cylinder

111‧‧‧前端部 111‧‧‧Front end

112‧‧‧插入部 112‧‧‧Insert

131‧‧‧第一固接構件 131‧‧‧First fixed member

Claims (16)

一種探針,係具備有:棒狀的針軸,係具有前端部及連結至前述前端部之插入部;管狀的筒體,供前述針軸的前述插入部配置於其內部;以及導電性的第一固接構件,係配置於前述針軸與前述筒體相向的區域以使前述針軸與前述筒體相固接且融點比前述針軸及前述筒體的任一材料都低者;其中,在包含配置有前述第一固接構件的區域之前述針軸與前述筒體重疊的區域的切斷面中,前述針軸與前述筒體之間係由前述第一固接構件以沒有空隙之方式加以填滿;且在前述插入部之比與前述第一固接構件相接的區域更靠近前述針軸所插入的前述筒體的開口部之區域,形成有配置在前述筒體的內部且防止前述第一固接構件往前述開口部移動之阻擋部。 A probe is provided with: a rod-shaped needle shaft having a front end portion and an insertion portion connected to the front end portion; a tubular barrel in which the insertion portion of the needle shaft is arranged inside; and a conductive The first fixing member is arranged in a region where the needle shaft and the cylinder body are opposed so that the needle shaft and the cylinder body are fixedly connected and the melting point is lower than any material of the needle shaft and the cylinder body; Wherein, in the cut surface including the region where the needle shaft overlaps the cylinder in the region where the first fixing member is arranged, the first fixing member prevents the needle shaft and the cylinder from Fill up the gap; and the area of the insertion portion closer to the opening of the barrel into which the needle shaft is inserted than the area in contact with the first fixing member is formed in the barrel A blocking portion inside that prevents the first fixing member from moving toward the opening. 如申請專利範圍第1項所述之探針,其中,前述阻擋部係形成為外徑比與前述第一固接構件相接的區域更大之凸緣狀。 The probe according to item 1 of the scope of the patent application, wherein the barrier portion is formed in a flange shape having an outer diameter larger than a region in contact with the first fixing member. 如申請專利範圍第1或2項所述之探針,其中,前述第一固接構件係配置於設在前述插入部的表面之凹部。 The probe according to item 1 or 2 of the patent application scope, wherein the first fixing member is disposed in a concave portion provided on the surface of the insertion portion. 如申請專利範圍第1或2項所述之探針,其中, 前述第一固接構件係配置於設在前述筒體的內壁面之凹部。 The probe according to item 1 or 2 of the patent application scope, wherein, The first fixing member is arranged in a concave portion provided on the inner wall surface of the cylindrical body. 如申請專利範圍第1或2項所述之探針,其中,前述筒體係為具有外層及內層之多層構造。 The probe according to item 1 or 2 of the patent application scope, wherein the barrel system has a multilayer structure having an outer layer and an inner layer. 如申請專利範圍第5項所述之探針,其中,在前述筒體的前述內層之與前述第一固接構件相接之區域,配置有會與前述第一固接構件形成合金之材料。 The probe according to item 5 of the scope of the patent application, wherein a material that will form an alloy with the first fixed member is disposed in a region of the inner layer of the barrel that is in contact with the first fixed member . 一種探針,係具備有:棒狀的針軸,係具有前端部及連結至前述前端部之插入部;管狀的筒體,供前述針軸的前述插入部配置於其內部;以及導電性的第一固接構件,係配置於前述針軸與前述筒體相向的區域以使前述針軸與前述筒體相固接且融點比前述針軸及前述筒體的任一材料都低者;其中,在包含配置有前述第一固接構件的區域之前述針軸與前述筒體重疊的區域的切斷面中,前述針軸與前述筒體之間係由前述第一固接構件以沒有空隙之方式加以填滿;前述針軸係在前述前端部與前述插入部之間具有外徑比前述筒體的內徑更大之凸出區域,前述針軸的前述凸出區域與前述筒體的開口端的端面係藉由第二固接構件而相固接。 A probe is provided with: a rod-shaped needle shaft having a front end portion and an insertion portion connected to the front end portion; a tubular barrel in which the insertion portion of the needle shaft is arranged inside; and a conductive The first fixing member is arranged in a region where the needle shaft and the cylinder body are opposed so that the needle shaft and the cylinder body are fixedly connected and the melting point is lower than any material of the needle shaft and the cylinder body; Wherein, in the cut surface including the region where the needle shaft overlaps the cylinder in the region where the first fixing member is arranged, the first fixing member prevents the needle shaft and the cylinder from The gap is filled; the needle shaft has a protruding area with an outer diameter greater than the inner diameter of the barrel between the front end portion and the insertion portion, the protruding area of the needle shaft and the barrel The end face of the open end is fixedly connected by a second fixing member. 一種探針的製造方法,該探針係具有:棒狀的針軸,係具有前端部及連結至前述前端部之插入部;以及管狀的筒體,供前述針軸的前述插入部配置於其內部;該製造方法係包含:在前述針軸及前述筒體的至少其中一者的特定的區域,形成融點比前述針軸及前述筒體的任一材料都低之導電性的第一固接構件之步驟;在前述插入部之比與前述第一固接構件相接的區域更靠近前述針軸所插入的前述筒體的開口部之區域,形成配置在前述筒體的內部且防止前述第一固接構件往前述開口部移動之阻擋部之步驟;將前述針軸的前述插入部從前述筒體的開口端插入內部,以使前述針軸與前述筒體在前述特定的區域透過前述第一固接構件而相連結之步驟;以及使前述第一固接構件融熔而使前述針軸與前述筒體相固接之步驟;其中,在前述針軸的側面上朝圓周方向連續地形成前述第一固接構件,使得在包含形成有前述第一固接構件的區域之前述針軸與前述筒體重疊的區域的切斷面中,前述針軸與前述筒體之間係由融熔的前述第一固接構件以沒有空隙之方式填滿。 A method for manufacturing a probe having a rod-shaped needle shaft having a front end portion and an insertion portion connected to the front end portion; and a tubular cylinder in which the insertion portion of the needle shaft is arranged Internal; the manufacturing method includes: forming a first solid at a specific area of at least one of the needle shaft and the barrel with a lower melting point than any material of the needle shaft and the barrel The step of connecting the member; forming an area arranged inside the cylinder and preventing the aforesaid insertion portion from being closer to the opening of the cylinder into which the needle shaft is inserted than the area where the first fixing member is in contact with The step of the first fixed member moving toward the opening of the blocking portion; inserting the insertion portion of the needle shaft into the inside from the opening end of the cylinder body, so that the needle shaft and the cylinder body penetrate through the specific area in the specific area A step of connecting the first fixing member; and a step of melting the first fixing member to fix the needle shaft and the cylinder; wherein, the side surface of the needle shaft is continuous in the circumferential direction The first fixing member is formed so that in a cut surface including a region where the needle shaft overlaps the cylindrical body in a region where the first fixing member is formed, the needle shaft and the cylindrical body are melted The melted first fixing member is filled without voids. 如申請專利範圍第8項所述之探針的製造方法,其中,利用加熱處理使前述第一固接構件融熔。 The method for manufacturing a probe according to Item 8 of the patent application scope, wherein the first fixing member is melted by heat treatment. 如申請專利範圍第8或9項所述之探針的製造方法, 其中,在前述插入部的表面形成前述第一固接構件。 The method of manufacturing a probe as described in item 8 or 9 of the patent scope, Among them, the first fixing member is formed on the surface of the insertion portion. 如申請專利範圍第10項所述之探針的製造方法,其中,在設於前述插入部的表面之凹部形成前述第一固接構件。 The method for manufacturing a probe according to item 10 of the patent application scope, wherein the first fixing member is formed in a concave portion provided on the surface of the insertion portion. 如申請專利範圍第8或9項所述之探針的製造方法,其中,在前述筒體的內壁面形成前述第一固接構件。 The method for manufacturing a probe according to claim 8 or 9, wherein the first fixing member is formed on the inner wall surface of the cylinder. 如申請專利範圍第12項所述之探針的製造方法,其中,在設於前述筒體的內壁面之凹部形成前述第一固接構件。 The method for manufacturing a probe according to item 12 of the patent application scope, wherein the first fixing member is formed in a recess provided on the inner wall surface of the cylinder. 如申請專利範圍第8或9項所述之探針的製造方法,其中,前述筒體係為具有外層及內層之多層構造。 The method for manufacturing a probe according to item 8 or 9 of the patent application, wherein the barrel system has a multilayer structure having an outer layer and an inner layer. 如申請專利範圍第14項所述之探針的製造方法,其中,在前述筒體的前述內層之與前述第一固接構件相接之區域,為會與前述第一固接構件形成合金之材料。 The method for manufacturing a probe according to item 14 of the scope of the patent application, wherein an area where the inner layer of the cylindrical body is in contact with the first fixed member is to form an alloy with the first fixed member Of material. 一種探針的製造方法,該探針係具有:棒狀的針軸,係具有前端部及連結至前述前端部之插入部;以及管狀的筒體,供前述針軸的前述插入部配置於其內部;該製造方法係包含:在前述針軸及前述筒體的至少其中一者的特定的區域,形成融點比前述針軸及前述筒體的任一材料都低之導電性的第一固接構件之步驟; 將前述針軸的前述插入部從前述筒體的開口端插入內部,以使前述針軸與前述筒體在前述特定的區域透過前述第一固接構件而相連結之步驟;以及使前述第一固接構件融熔而使前述針軸與前述筒體相固接之步驟;其中,準備在前述前端部與前述插入部之間具有外徑比前述筒體的內徑更大的凸出區域之前述針軸,藉由第二固接構件使前述針軸的前述凸出區域與前述筒體的開口端的端面相固接。 A method for manufacturing a probe having a rod-shaped needle shaft having a front end portion and an insertion portion connected to the front end portion; and a tubular cylinder in which the insertion portion of the needle shaft is arranged Internal; the manufacturing method includes: forming a first solid at a specific area of at least one of the needle shaft and the barrel with a lower melting point than any material of the needle shaft and the barrel Steps for connecting components; The step of inserting the insertion portion of the needle shaft into the inside from the open end of the cylindrical body, so that the needle shaft and the cylindrical body are connected through the first fixing member in the specific region; and the first A step of melting the fixing member to fix the needle shaft and the cylinder; wherein, a protruding area having an outer diameter larger than the inner diameter of the cylinder is prepared between the front end portion and the insertion portion In the needle shaft, the protruding region of the needle shaft is fixed to the end surface of the open end of the cylinder by a second fixing member.
TW107117371A 2017-05-23 2018-05-22 Probe TWI695171B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017101766A JP6980410B2 (en) 2017-05-23 2017-05-23 probe
JP2017-101766 2017-05-23

Publications (2)

Publication Number Publication Date
TW201901159A TW201901159A (en) 2019-01-01
TWI695171B true TWI695171B (en) 2020-06-01

Family

ID=64396759

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107117371A TWI695171B (en) 2017-05-23 2018-05-22 Probe

Country Status (7)

Country Link
US (1) US11204370B2 (en)
EP (1) EP3633391B1 (en)
JP (1) JP6980410B2 (en)
KR (1) KR102234964B1 (en)
CN (1) CN110662971B (en)
TW (1) TWI695171B (en)
WO (1) WO2018216588A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114930175A (en) * 2020-01-10 2022-08-19 日本电产理德股份有限公司 Contactor, inspection jig, inspection device, and method for manufacturing contactor

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05203670A (en) * 1992-01-24 1993-08-10 Fujitsu Ltd Contact probe
JP2002267686A (en) * 2001-03-12 2002-09-18 Japan Electronic Materials Corp Probe and vertical probe card using it
JP2009063381A (en) * 2007-09-05 2009-03-26 Japan Electronic Materials Corp Probe
JP2012058129A (en) * 2010-09-10 2012-03-22 Hideo Nishikawa Contactor and method of manufacturing the same
TWM453149U (en) * 2013-01-04 2013-05-11 Ccp Contact Probes Co Ltd Concentric testing pins
TW201530152A (en) * 2014-01-28 2015-08-01 Mpi Corp Spring barrel type probe and manufacturing method thereof

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002042945A (en) 2000-07-31 2002-02-08 Kita Seisakusho:Kk Electric connection device
JP2003014779A (en) * 2001-07-02 2003-01-15 Nhk Spring Co Ltd Conductive contactor
JP4242199B2 (en) * 2003-04-25 2009-03-18 株式会社ヨコオ IC socket
JP4020017B2 (en) * 2003-05-28 2007-12-12 三菱電機株式会社 High frequency signal probe and semiconductor test apparatus using the probe
JP4089976B2 (en) * 2004-05-17 2008-05-28 リーノ アイエヌディー.インコーポレイテッド High current probe
JP4031007B2 (en) * 2005-07-15 2008-01-09 日本電子材料株式会社 Vertical coil spring probe and probe unit using the same
JP2012007904A (en) * 2010-06-22 2012-01-12 Japan Electronic Materials Corp Structure for mounting component on substrate
JP5821432B2 (en) * 2011-09-05 2015-11-24 日本電産リード株式会社 Connection terminal and connection jig
KR101282324B1 (en) * 2011-10-14 2013-07-04 (주)마이크로컨텍솔루션 Probe pin
CN103968697A (en) * 2014-05-19 2014-08-06 宁波惠康实业有限公司 Heat exchange tube structure and manufacturing method
JP6411169B2 (en) * 2014-10-22 2018-10-24 株式会社日本マイクロニクス Electrical contact and electrical connection device
JP6890921B2 (en) * 2015-10-21 2021-06-18 株式会社日本マイクロニクス Probe card and contact inspection device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05203670A (en) * 1992-01-24 1993-08-10 Fujitsu Ltd Contact probe
JP2002267686A (en) * 2001-03-12 2002-09-18 Japan Electronic Materials Corp Probe and vertical probe card using it
JP2009063381A (en) * 2007-09-05 2009-03-26 Japan Electronic Materials Corp Probe
JP2012058129A (en) * 2010-09-10 2012-03-22 Hideo Nishikawa Contactor and method of manufacturing the same
TWM453149U (en) * 2013-01-04 2013-05-11 Ccp Contact Probes Co Ltd Concentric testing pins
TW201530152A (en) * 2014-01-28 2015-08-01 Mpi Corp Spring barrel type probe and manufacturing method thereof

Also Published As

Publication number Publication date
EP3633391B1 (en) 2023-08-02
WO2018216588A1 (en) 2018-11-29
KR102234964B1 (en) 2021-03-31
EP3633391A4 (en) 2021-03-03
EP3633391A1 (en) 2020-04-08
KR20200005625A (en) 2020-01-15
US20200174038A1 (en) 2020-06-04
CN110662971B (en) 2021-12-28
JP6980410B2 (en) 2021-12-15
CN110662971A (en) 2020-01-07
TW201901159A (en) 2019-01-01
US11204370B2 (en) 2021-12-21
JP2018197671A (en) 2018-12-13

Similar Documents

Publication Publication Date Title
KR101365095B1 (en) Probe and fixture
TWI422829B (en) Inspection fixture, electrode structure and method for manufacturing electrode structure
US9787047B2 (en) Sensor and method of producing the same
US10585117B2 (en) Contact probe and inspection jig
TWI695171B (en) Probe
JPWO2018181776A1 (en) Contact probe and probe unit
TWI677688B (en) Probe and method of manufacturing same
TWI682180B (en) Electrical connection device
TWI672507B (en) Probe and method for manufacturing the same
JP6530327B2 (en) Temperature sensor and method of manufacturing the same
JP2008256362A (en) Inspection tool
WO2018181273A1 (en) Probe, probe unit, and semiconductor inspection device provided with probe unit
JP2009210366A (en) Current sensing resistor
WO2020153114A1 (en) Probe and manufacturing method for same
JP2019090633A (en) Probe and method for manufacturing the same
JP6889067B2 (en) Electrical connection device
JP7017373B2 (en) Probe and its manufacturing method
JP5421234B2 (en) Method for resistance welding metal member and method for manufacturing sensor
JP6967431B2 (en) How to make a shunt resistor
JP2020118667A (en) Probe and manufacturing method thereof
JP2006058005A (en) Ceramic glow plug and its manufacturing method
JP2019174433A (en) Spring probe and plunger