TWI695171B - Probe - Google Patents
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- TWI695171B TWI695171B TW107117371A TW107117371A TWI695171B TW I695171 B TWI695171 B TW I695171B TW 107117371 A TW107117371 A TW 107117371A TW 107117371 A TW107117371 A TW 107117371A TW I695171 B TWI695171 B TW I695171B
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- needle shaft
- fixing member
- barrel
- cylinder
- insertion portion
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
- G01R1/06761—Material aspects related to layers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
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- General Physics & Mathematics (AREA)
- Geometry (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Description
本發明係關於一種使用於被檢查體的特性的測定之探針(probe)。 The present invention relates to a probe used for measuring characteristics of a test object.
為了以並未從晶圓分離的狀態測定積體電路等之被檢查體的特性,係使用與被檢查體接觸之探針。探針係採用例如由稱為針軸(plunger)之與被檢查體接觸之小徑的傳導部、與稱為筒體(barrel)之用以使針軸以適當的壓力接觸被檢查體而形成為可伸縮自如之圓筒形狀部相連結而成的構造等(參照例如專利文獻1)。 In order to measure the characteristics of a test object such as an integrated circuit without being separated from the wafer, a probe contacting the test object is used. The probe is formed by using, for example, a small-diameter conductive part called a plunger that is in contact with the object to be inspected, and a barrel called a barrel for the needle shaft to contact the object to be inspected with an appropriate pressure It is the structure etc. which connected the expandable and contractible cylindrical shape part (refer
(專利文獻1)日本特開2013-53931號公報 (Patent Document 1) Japanese Unexamined Patent Publication No. 2013-53931
為了使針軸與筒體相固接,可使用點銲。然而,藉由點銲使針軸與筒體相固接,會發生因點銲之加壓而使筒體向外側鼓起之現象。因此,為了防止探針相接 觸,必須使探針的間隔變寬,而有阻礙了探針的配置的窄間距化之問題。 In order to make the needle shaft and the cylinder fixedly connected, spot welding can be used. However, the spot shaft welds the pin shaft to the cylinder body, and the cylinder body bulges outward due to the pressure of the spot welding. Therefore, in order to prevent the probes from coming into contact, it is necessary to widen the interval of the probes, which has a problem that the arrangement of the probes is narrowed.
有鑑於上述問題點,本發明之目的在於提供一種可窄間距化之由針軸與筒體相固接而成的探針及其製造方法。 In view of the above problems, an object of the present invention is to provide a probe with a narrow pitch that is formed by a fixed connection between a needle shaft and a barrel, and a manufacturing method thereof.
根據本發明之一態樣,提供一種探針,此探針具備有:棒狀的針軸,係具有前端部及連結至前端部之插入部;管狀的筒體,供針軸的插入部配置於其內部;以及導電性的第一固接構件,係配置於針軸與筒體相向的區域以使針軸與筒體相固接且融點比針軸及筒體的材料都低者,其中,在包含配置有第一固接構件的區域之針軸與筒體重疊的區域的切斷面中,針軸與筒體之間係由第一固接構件以沒有空隙之方式加以填滿。 According to one aspect of the present invention, there is provided a probe including: a rod-shaped needle shaft having a front end portion and an insertion portion connected to the front end portion; a tubular cylinder body for disposing the insertion portion of the needle shaft Inside it; and the conductive first fixing member, which is arranged in the area where the needle shaft and the cylinder face so that the needle shaft and the cylinder are fixed and the melting point is lower than the material of the needle shaft and the cylinder, Wherein, in the cut surface of the region where the needle shaft and the cylinder overlap the region where the first fixing member is arranged, the space between the needle shaft and the cylinder is filled by the first fixing member without a gap .
根據本發明之另一態樣,提供一種探針的製造方法,該探針係具有:棒狀的針軸,係具有前端部及連結至前端部之插入部;以及管狀的筒體,係供針軸的插入部配置於其內部;該製造方法係包含:在針軸及筒體的至少其中一者的特定的區域,形成融點比針軸及筒體的任一材料都低之導電性的第一固接構件之步驟;將針軸的插入部從筒體的開口端插入至內部,以使針軸與筒體在特定的區域透過第一固接構件而相連結之步驟;以及使第一固接構件融熔而使針軸與筒體相固接之步驟。 According to another aspect of the present invention, there is provided a method for manufacturing a probe, the probe having: a rod-shaped needle shaft having a front end portion and an insertion portion connected to the front end portion; and a tubular cylinder body for The insertion part of the needle shaft is arranged inside; the manufacturing method includes: forming a specific area of at least one of the needle shaft and the cylinder body, forming a conductivity lower than any material of the needle shaft and the cylinder body The step of the first fixing member; the step of inserting the insertion portion of the needle shaft from the open end of the cylinder into the inside so that the needle shaft and the cylinder are connected through the first fixing member in a specific area; and The step of fusing the first fixing member to fix the needle shaft and the barrel.
根據本發明,可提供一種可窄間距化之由針軸與筒體相固接而成的探針及其製造方法。 According to the present invention, it is possible to provide a probe which can be narrowed and is formed by a fixed connection between a needle shaft and a barrel, and a manufacturing method thereof.
1‧‧‧探針 1‧‧‧ Probe
11、11A‧‧‧針軸 11, 11A‧‧‧Needle shaft
12、12A‧‧‧筒體 12, 12A‧‧‧Cylinder
110‧‧‧阻擋部 110‧‧‧block
111‧‧‧前端部 111‧‧‧Front end
112‧‧‧插入部 112‧‧‧Insert
113‧‧‧凸出區域 113‧‧‧ protruding area
120‧‧‧芯線 120‧‧‧core wire
121‧‧‧內層 121‧‧‧Inner layer
131‧‧‧第一固接構件 131‧‧‧First fixed member
132‧‧‧第二固接構件 132‧‧‧Second fixing member
第1圖係顯示本發明的第一實施形態之探針的構成之示意圖。 Fig. 1 is a schematic diagram showing the configuration of the probe according to the first embodiment of the present invention.
第2圖係顯示本發明的第一實施形態之探針的構成之示意剖視圖。 FIG. 2 is a schematic cross-sectional view showing the configuration of the probe of the first embodiment of the present invention.
第3圖係顯示保持本發明的第一實施形態之探針的例子之示意圖。 Fig. 3 is a schematic diagram showing an example of holding the probe of the first embodiment of the present invention.
第4圖係顯示本發明的第一實施形態之探針的第一固著構件的形成例之示意圖。 FIG. 4 is a schematic diagram showing an example of formation of the first fixing member of the probe according to the first embodiment of the present invention.
第5圖係顯示本發明的第一實施形態之探針的第一固著構件的另一形成例之示意圖,第5圖(a)係顯示配置第一固接構件之前的針軸的狀態,第5圖(b)係顯示配置第一固接構件後的針軸的狀態,第5圖(c)係顯示針軸與筒體相固接後的狀態。 FIG. 5 is a schematic diagram showing another example of formation of the first fixing member of the probe according to the first embodiment of the present invention, and FIG. 5(a) shows the state of the needle shaft before the first fixing member is arranged, FIG. 5(b) shows the state of the needle shaft after the first fixing member is arranged, and FIG. 5(c) shows the state of the needle shaft after being fixed to the barrel.
第6圖係顯示本發明的第一實施形態之探針的第一固著構件的另一形成例之示意圖。 Fig. 6 is a schematic diagram showing another example of formation of the first fixing member of the probe according to the first embodiment of the present invention.
第7圖係顯示本發明的第一實施形態之探針的第一固著構件的另一形成例之示意圖。 Fig. 7 is a schematic diagram showing another example of formation of the first fixing member of the probe according to the first embodiment of the present invention.
第8圖係用來說明比較例之探針的製造方法之模式的斷面圖。 FIG. 8 is a schematic cross-sectional view for explaining the method of manufacturing the probe of the comparative example.
第9圖係顯示比較例之探針的形狀之示意圖。 Fig. 9 is a schematic diagram showing the shape of the probe of the comparative example.
第10圖係用來說明筒體的形成方法之示意圖。 Fig. 10 is a schematic diagram for explaining the method of forming the cylinder.
第11圖係顯示筒體的構成之示意剖視圖。 Fig. 11 is a schematic cross-sectional view showing the structure of the cylinder.
第12圖係顯示本發明的第一實施形態的變形例之探針的構成之示意圖。 Fig. 12 is a schematic diagram showing the configuration of a probe according to a modification of the first embodiment of the present invention.
第13圖係顯示本發明的第二實施形態之探針的構成之示意圖。 Fig. 13 is a schematic diagram showing the configuration of the probe according to the second embodiment of the present invention.
第14圖係顯示第13圖所示之探針中的第二固接構件的形成方法之示意剖視圖。 FIG. 14 is a schematic cross-sectional view showing a method of forming the second fixing member in the probe shown in FIG. 13.
第15圖係顯示本發明的其他實施形態之探針的構成之示意圖。 Fig. 15 is a schematic diagram showing the configuration of a probe according to another embodiment of the present invention.
以下,參照圖式來說明本發明的實施形態。在以下的圖式的記載中,相同或類似的部分都標示相同或類似的符號。不過,應注意圖式為示意圖,各部的厚度的比例等與實際者並不相同。當然,圖式相互間也含有相互的尺寸的關係及比例不同的部分。以下揭示的實施形態只是舉例揭示用來使本發明的技術思想具體化之裝置及方法而已,本發明的實施形態並非用來將構成零件的材質、形狀、構造、配置等限定在以下所述的例子。 Hereinafter, an embodiment of the present invention will be described with reference to the drawings. In the description of the following drawings, the same or similar parts are marked with the same or similar symbols. However, it should be noted that the drawing is a schematic diagram, and the thickness ratio of each part is different from the actual one. Of course, the drawings also include parts in which the relationship and ratio of the sizes are different. The embodiments disclosed below are only examples of devices and methods for embodying the technical idea of the present invention. The embodiments of the present invention are not intended to limit the materials, shapes, structures, arrangements, etc. of components to the following example.
本發明的第一實施形態之探針1係如第1圖所示,具備有:棒狀的針軸11,係具有前端部111及連結至前端部111之插入部112;管狀的筒體12,係供針軸11的插入部 112配置於其內部;以及第一固接構件131,係使針軸11與筒體12相固接。第一固接構件131係配置於針軸11與筒體12相對向的區域,且為融點比針軸11及筒體12的任一材料都低之構件。如第1圖所示,筒體12的外徑為一定。另外,為了易於了解,以劃斜線的方式顯示第一固接構件131(以下亦同)。 As shown in FIG. 1, the
第2圖中顯示利用第一固接構件131使針軸11與筒體12相固接之區域的剖面形狀。如第2圖所示,在包含配置有第一固接構件131的區域之針軸11與筒體12重疊的區域的切斷面中,針軸11的表面與筒體12的內壁面之間係由第一固接構件131以沒有空隙之方式加以填滿。 FIG. 2 shows the cross-sectional shape of the region where the
第1圖所示之探針1係為從筒體12的兩端的開口端分別插入有針軸11之構成。探針1係使用於例如被檢查體的電氣特性的取得。在此情況下,一端的針軸11的前端部111與被檢查體接觸,另一端的針軸11的前端部111與配線基板等的端子接觸,透過配線基板而與測試機(tester)等測試機器電性連接。 The
因此,針軸11與筒體12係採用導電性的材料。例如,針軸11係採用AgPdCu材等,筒體12係採用Ni材等。由於針軸11與筒體12透過第一固接構件131而電性連接,所以第一固接構件131也採用導電性的材料。 Therefore, the
如第1圖所示,形成有貫通筒體12之側面之螺旋狀的切縫,使筒體12的一部分形成為彈簧狀。藉此, 筒體12可在軸方向伸縮自如。因而,可利用適當的壓力使針軸11與被檢查體及配線基板接觸。另外,在內部並沒有配置針軸11之區域未形成切縫。 As shown in FIG. 1, a spiral slit penetrating the side surface of the
探針1如第3圖所示由插座(socket)2所保持。被檢查體的測定所需的個數的針軸11係貫通插座2而配置。從插座2的一個主面露出之針軸11係與被檢查體接觸,從插座2的另一個主面露出之針軸11係與測試機器電性連接。 The
以下,說明第1圖所示之探針1的製造方法。以下所述的探針1的製造方法只是一例,包含此變形例在內,當然可利用此處說明的方法以外的各種製造方法加以實現。 Hereinafter, a method of manufacturing the
首先,在針軸11與筒體12的至少其中一者的特定的區域,形成融點比針軸11及筒體12的任一材料都低之導電性的第一固接構件131。例如,如第4圖所示,在針軸11的表面形成第一固接構件131。形成第一固接構件131之區域係如第4圖中以一點鏈線所示,對應於與筒體12的開口端相距一定的距離之區域。 First, in a specific area of at least one of the
然後,將針軸11的插入部112從筒體12的開口端插入至內部以使針軸11與筒體12在特定的區域透過第一固接構件131而相連結。然後,使第一固接構件131融熔而使針軸11與筒體12相固接。 Then, the
第一固接構件131係可利用例如加熱處理而融熔。例如,藉由回焊(reflow)而使第一固接構件131 在高溫環境下融熔。 The
此外,在上述的製造方法中之形成第一固接構件131之特定的區域,係指在針軸11與筒體12相連接後的狀態下針軸11與筒體12兩者相對向的區域,以下將之稱為「固接區域」。為了在固接區域形成第一固接構件13之方法,可依據第一固接構件131的種類等而採用各種方法。形成第一固接構件13之方法有例如形成Au/Sn鍍層之方法、或塗覆錫膏之方法。 In addition, the specific area where the first fixing
如前述,在探針1中,電氣訊號係經由針軸11及筒體12而傳遞。因此,針軸11與筒體12之間的電阻必須要低。因而,使針軸11與筒體12電性連接之第一固接構件131,最好能夠不留空隙地將針軸11與筒體12之間的間隙填滿。因此,將第一固接構件131朝圓周方向連續地形成於針軸11的側面上。藉此,在形成有第一固接構件131之固接區域的切斷面中,使針軸11與筒體12之間的間隙由融熔的第一固接構件131以沒有空隙之方式填滿。 As described above, in the
另外,可如第5圖(a)所示在針軸11的插入部112的表面設置具有外緣之凹部,然後如第5圖(b)所示在該凹部的內部形成第一固接構件131。使第5圖(b)所示的狀態之針軸11與筒體12相固接之後的狀態係如第5圖(c)所示。 In addition, as shown in FIG. 5(a), a concave portion having an outer edge may be provided on the surface of the
藉由在設於插入部112的表面之凹部形成第一固接構件131,而如第5圖(c)所示使未形成凹部之針 軸11與筒體12的間隔變窄。藉此,可使流至探針1之電流的容許量增大。另外,在固接區域以外的區域中,亦可使針軸11的表面與筒體12的內壁面相接合。因此,可更加減低針軸11與筒體12之間的電阻。 By forming the first fixing
以上雖然揭示將第一固接構件131形成於針軸11的例子,但第一固接構件131亦可形成於固接前的針軸11及筒體12的任一者。或者,亦可在針軸11及筒體12之雙方都形成第一固接構件131。 Although the example in which the first fixing
第6圖中顯示在筒體12的表面形成第一固接構件131之例。此外,亦可如第7圖所示將第一固接構件131形成於設在筒體12的內壁面之凹部。藉由在凹部的內部形成第一固接構件131,可使在固接區域以外的區域之針軸11與筒體12的間隔變窄。藉此,如上所述可使流至針軸11之電流的容許量增大、使針軸11與筒體12之間的電阻減低。此外,亦可在針軸11的插入部112的表面及筒體12的內壁面都設置凹部,在該等凹部的內部都形成第一固接構件131。 FIG. 6 shows an example in which the first fixing
第8圖中顯示作為比較例之以點銲使針軸11A與筒體12A相固接之方法。點銲係利用電極100一邊朝箭號的方向對針軸11A及筒體12A施壓(press),一邊使電流流通於針軸11A及筒體12A。藉此,使針軸11A與筒體12A的接觸面產生熱阻,利用此熱阻使針軸11A及筒體12A的內部發生金屬的融熔凝固,而使針軸11A與筒體12A相熔接。由於此時的壓力,會如第9圖所示造成變形而使 筒體12A的表面產生鼓起。 FIG. 8 shows a method of fixing the
當探針的表面產生鼓起時,為了防止探針間之接觸,就必須使探針的間隔變寬。因此,會阻礙到探針的配置的窄間距化。 When bulging occurs on the surface of the probe, in order to prevent contact between the probes, the interval between the probes must be widened. Therefore, the narrow pitch of the probe arrangement is hindered.
相對於此,根據上述說明之本發明的第一實施形態之探針1的製造方法,不須在針軸11與筒體12的固接中施加壓力。因此,不會在使針軸11與筒體12相固接之固接區域發生隆起的情形,筒體12的外徑會保持一定。因而,可實現探針的配置的窄間距化。 In contrast, according to the method of manufacturing the
此外,係在如第10圖所示之在筒體12的內部穿入芯線120之狀態下在筒體12形成螺旋形之切縫。例如採用光刻(photolithography)技術來形成切縫。此時,最好如第11圖所示將筒體12形成為多層構造。例如,將內層121設為Au材,將外層122設為Ni材。藉此,可在對筒體12的側面進行蝕刻時利用內層121防止蝕刻材從筒體12的裏側繞入。而且,藉由將內層121設為Au材,可順利地將芯線120從筒體12抽出。 In addition, a spiral slit is formed in the
另外,將筒體12形成為多層構造時,可採用會與融熔的第一固接構件131反應而形成合金之材料來作為內層121。藉此,可使針軸11與筒體12更牢固地相固接。 In addition, when the
第12圖所示之第一實施形態的變形例之探針1,係在針軸11的插入部112形成有阻擋部110。阻擋部110係形成於插入部112之比與第一固接構件131相接的區域更靠近針軸11所插入的筒體12的開口部之區域,且配置在筒體12的內部。利用阻擋部110防止第一固接構件131往筒體12的開口部移動。阻擋部110係形成為外徑比與第一固接構件131相接的區域更大之凸緣狀。
In the
阻擋部110的外徑最好為在阻擋部110可插入至筒體12的內部之範圍內的大小。藉此,可有效地抑制第一固接構件131在凝固前流到針軸11的前端部111。
The outer diameter of the blocking
第13圖顯示本發明的第二實施形態之探針1。第13圖所示之探針1,其針軸11係在前端部111與插入部112之間具有外徑比筒體12的內徑更大之凸出區域113。
Fig. 13 shows the
第13圖所示之探針1係如第14圖所示,在凸出區域113之與筒體12的開口端的端面相對向之面形成第二固接構件132。藉此,在將針軸11的插入部112插入筒體12的內部之情況時,利用第二固接構件132使針軸11的凸出區域113與筒體12的開口端的端面相固接。
As shown in FIG. 14, the
根據第13圖所示之探針1,融熔的第二固接構件132的位置會很穩定。亦即,可抑制融熔的第二固接構件132從預定的位置流出。
According to the
以上雖揭示在針軸11的凸出區域113形成第二固接構件132之例,但亦可在筒體12的開口端的端面形成第二固接構件132。或者,可在針軸11的凸出區域113及筒體12的開口端的端面都形成第二固接構件132。 Although the example of forming the second fixing
又,可如第15圖所示,在針軸11的插入部112與筒體12的內壁面之間配置第一固接構件131,且在針軸11的凸出區域113與筒體12的開口端的端面之間配置第二固接構件132,將該等兩方的區域都作為固接區域。藉此,可利用複數個連接區域使針軸11與筒體12更牢固地相固接。 In addition, as shown in FIG. 15, the first fixing
如上述利用實施形態進行了本發明之揭示,但不應將屬於此揭示的一部分之說明及圖式理解成是限制本發明者。本發明相關技術領域的業者當可從上述揭示輕易地想到各種替代實施形態、實施例及運用技術。 The present invention has been disclosed using the embodiments as described above, but the description and drawings that are part of this disclosure should not be construed as limiting the present invention. Those skilled in the art related to the present invention can easily think of various alternative embodiments, examples, and application techniques from the above disclosure.
例如,上述揭示說明的雖然是探針1的剖面的形狀為圓形之情況,但剖面的形狀亦可為四角形等多角形。 For example, the above disclosure describes the case where the cross-sectional shape of the
如上所述,此處未載明的各種實施形態等當然都包含在本發明中。因此,本發明的技術範圍只由就上述的說明而言為妥當的申請專利範圍中界定的發明特定事項所決定。 As described above, various embodiments and the like not described here are naturally included in the present invention. Therefore, the technical scope of the present invention is determined only by the specific matters of the invention defined in the scope of patent application that is appropriate for the above description.
1‧‧‧探針 1‧‧‧ Probe
11‧‧‧針軸 11‧‧‧ Needle shaft
12‧‧‧筒體 12‧‧‧Cylinder
111‧‧‧前端部 111‧‧‧Front end
112‧‧‧插入部 112‧‧‧Insert
131‧‧‧第一固接構件 131‧‧‧First fixed member
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- 2017-05-23 JP JP2017101766A patent/JP6980410B2/en active Active
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- 2018-05-17 EP EP18806064.4A patent/EP3633391B1/en active Active
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- 2018-05-17 WO PCT/JP2018/019040 patent/WO2018216588A1/en active Application Filing
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EP3633391B1 (en) | 2023-08-02 |
WO2018216588A1 (en) | 2018-11-29 |
KR102234964B1 (en) | 2021-03-31 |
EP3633391A4 (en) | 2021-03-03 |
EP3633391A1 (en) | 2020-04-08 |
KR20200005625A (en) | 2020-01-15 |
US20200174038A1 (en) | 2020-06-04 |
CN110662971B (en) | 2021-12-28 |
JP6980410B2 (en) | 2021-12-15 |
CN110662971A (en) | 2020-01-07 |
TW201901159A (en) | 2019-01-01 |
US11204370B2 (en) | 2021-12-21 |
JP2018197671A (en) | 2018-12-13 |
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