TWI671519B - Non-contact repair method for polyimine film defects - Google Patents

Non-contact repair method for polyimine film defects Download PDF

Info

Publication number
TWI671519B
TWI671519B TW107142866A TW107142866A TWI671519B TW I671519 B TWI671519 B TW I671519B TW 107142866 A TW107142866 A TW 107142866A TW 107142866 A TW107142866 A TW 107142866A TW I671519 B TWI671519 B TW I671519B
Authority
TW
Taiwan
Prior art keywords
polyimide film
repair
needle
defect
polyimide
Prior art date
Application number
TW107142866A
Other languages
Chinese (zh)
Other versions
TW202022354A (en
Inventor
蔡孟偉
Original Assignee
帆宣系統科技股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 帆宣系統科技股份有限公司 filed Critical 帆宣系統科技股份有限公司
Priority to TW107142866A priority Critical patent/TWI671519B/en
Application granted granted Critical
Publication of TWI671519B publication Critical patent/TWI671519B/en
Publication of TW202022354A publication Critical patent/TW202022354A/en

Links

Landscapes

  • Liquid Crystal (AREA)

Abstract

本創作係一種聚醯亞胺膜缺陷之非接觸式修補方法,係於使用一聚醯亞胺膜修補裝置執行,該聚醯亞胺膜缺陷之非接觸式修補方法係以影像辨視手段,偵測並傳遞面板基材之聚醯亞胺膜缺陷三維位置資料及缺陷範圍大小資料至控制裝置,並依據缺陷範圍大小資料及三維位置資料,控制所述聚醯亞胺膜修補裝置之修補針針尖與聚醯亞胺膜之間的高度距離,使所述修補針的針尖能在不接觸所述聚醯亞胺膜的情形下,將聚醯亞胺液沾附於聚醯亞胺膜的缺陷處,以達到修補聚醯亞胺膜缺陷的效果,能有效避免所述修補針的針尖磨耗問題,進而提高聚醯亞胺膜缺陷修補作業之精準性。This creation is a non-contact repair method for polyimide film defects, which is performed using a polyimide film repair device. The non-contact repair method for polyimide film defects is based on image inspection. Detect and transmit the 3D position data of the polyimide film defect and the size data of the panel substrate to the control device, and control the repair pin of the polyimide film repair device according to the defect size data and the 3D position data. The height distance between the needle tip and the polyimide film enables the needle tip of the repair needle to adhere the polyimide solution to the polyimide film without contacting the polyimide film. Defects, in order to achieve the effect of repairing polyimide film defects, can effectively avoid the problem of abrasion of the needle tip of the repair needle, thereby improving the accuracy of the polyimide film defect repairing operation.

Description

聚醯亞胺膜缺陷之非接觸式修補方法Non-contact repairing method for polyimide film defects

本創作係一種聚醯亞胺膜缺陷之非接觸式修補方法,尤指用以修補聚醯亞胺膜缺陷之修補方法。 This creation is a non-contact repair method for polyimide film defects, especially a repair method for repairing polyimide film defects.

在顯示器面板的領域中,面板基材包含一玻璃基板及一聚醯亞胺膜(簡稱PI膜),所述聚醯亞胺膜會塗佈於所述玻璃基板上,其中,當所述面板基材應用於可撓性有機發光二極體(OLED)面板時,會以聚醯亞胺膜為基底,並在所述聚醯亞胺模上進行加工或其他的製程,在該聚醯亞胺膜上進行相關元件(例如:半導體材料膜、電極、介電膜…等)的製程;而當所述面板基材應用於液晶面板(LCD)時,會透過在所述聚醯亞胺膜上進行加工,藉此控制液晶分子的排列方向及角度。 In the field of display panels, a panel substrate includes a glass substrate and a polyimide film (referred to as a PI film). The polyimide film is coated on the glass substrate, and when the panel is When the substrate is applied to a flexible organic light emitting diode (OLED) panel, a polyimide film is used as a base, and a processing or other process is performed on the polyimide mold. The related components (such as semiconductor material films, electrodes, dielectric films, etc.) are processed on the amine film; and when the panel substrate is applied to a liquid crystal panel (LCD), it will pass through the polyimide film Processing, thereby controlling the alignment direction and angle of the liquid crystal molecules.

其中,若所述聚醯亞胺膜塗佈於所述玻璃基板上有厚度不均或是有破損等缺陷時,容易導致影響後續製程以及面板產品之品質,故必須進行所述聚醯亞胺膜之修補作業,而現今在聚醯亞胺膜的修補作業中,會透過一聚醯亞胺膜修補裝置將聚醯亞胺液塗佈於所述聚醯亞胺膜之待修補位置,以達到修補聚醯亞胺膜之目的,所述聚醯亞胺膜修補裝置能設置於一外部的平面位移裝置上,所述聚醯亞胺膜修補裝置包含一支撐架、複數針座及複數修補針,該支撐架上形成複數間隔排列之容槽,該複數針座係可上下移動地設置於該支撐架上,並該複數針座的位置係分別位於該複數容槽之上方,該複數修補針分別 可拆組地設置於該複數針座上,且該複數修補針的針尖能分別伸入該複數容槽內。 Wherein, if the polyimide film is coated on the glass substrate and has defects such as uneven thickness or damage, it may easily affect subsequent processes and the quality of the panel product, so the polyimide must be performed. Film repair operation, and now in the repair operation of polyimide film, polyimide liquid is applied to the position of the polyimide film to be repaired through a polyimide film repair device To achieve the purpose of repairing polyimide film, the polyimide film repairing device can be arranged on an external plane displacement device. The polyimide film repairing device includes a support frame, a plurality of needle seats and a plurality of repairs. A plurality of spaced-apart receiving grooves are formed on the support frame. The plurality of needle seats are movably arranged on the support frame. The positions of the plurality of needle seats are respectively located above the plurality of grooves. Needle separately The plurality of needle seats are detachably arranged on the plurality of needle seats, and the needle tips of the plurality of repairing needles can respectively extend into the plurality of receiving grooves.

當在使用所述聚醯亞胺膜修補裝置進行聚醯亞胺膜的修補作業前,能先將複數填充有聚醯亞胺液之光阻盒置放於該支撐架之各容槽內,該聚醯亞胺膜修補裝置能受控於外部的平面位移裝置而移動至聚醯亞胺膜的缺陷處上方,接著藉由控制針座向下移動,使修補針的針尖穿過對應之光阻盒並抵至聚醯亞胺膜之缺陷處,此時,所述光阻盒內的聚醯亞胺液會被所述修補針帶至聚醯亞胺膜的缺陷處,以達到修補聚醯亞胺膜缺陷之效果。 Before the polyimide film repairing device is used for repairing the polyimide film, a plurality of photoresist boxes filled with a polyimide solution can be placed in the respective tanks of the support frame. The polyimide film repairing device can be controlled by an external plane displacement device to move above the defect of the polyimide film, and then control the needle seat to move downward so that the tip of the repairing needle passes through the corresponding light. The blocking box does not reach the defect of the polyimide film. At this time, the polyimide solution in the photoresist box will be brought to the defect of the polyimide film by the repair pin to repair the polyimide film.效果 Effect of imine film defect.

然而在前述的修補作業中,所述修補針的針尖在接觸聚醯亞胺膜之缺陷處時,會產生微量的磨耗,在長時間及多次的進行修補作業時,所述修補針的針尖容易在長期的磨耗下產生變形或端部面積增加,故在長時間或多次進行聚醯亞胺膜修補作業時,聚醯亞胺液塗佈的面積會隨著修補針的針尖磨耗程度而逐漸增加,進而影響修補作業之精確性。 However, in the aforementioned repair operation, when the tip of the repair needle contacts the defect of the polyimide film, a small amount of abrasion will be generated. When the repair operation is performed for a long time and multiple times, the tip of the repair needle It is easy to produce deformation or increase the end area under long-term wear. Therefore, when the polyimide film is repaired for a long time or multiple times, the area coated with the polyimide solution will vary with the wear of the needle tip. Gradually increase, which affects the accuracy of repair operations.

本創作之主要目的在於提供一聚醯亞胺膜缺陷之非接觸式修補方法,希藉此改善現今在進行聚醯亞胺膜修補作業時,有修補針磨耗而影響修補作業之精確性的問題。 The main purpose of this creation is to provide a non-contact repair method for polyimide film defects, in order to improve the problem that the repair of the polyimide film has abrasion of the repair pins and affects the accuracy of the repair operation. .

為達成前揭目的,本創作之聚醯亞胺膜缺陷之非接觸式修補方法其係使用一聚醯亞胺膜修補裝置、一平面位移裝置及一控制裝置來執行,該聚醯亞胺膜修補裝置於其複數容槽內分別置放填充有聚醯亞胺液之光阻盒,並以位於所述容槽上方且能上下移動的複數針座中的修補針的針尖分別伸入該複數容槽內,該聚醯亞胺膜缺陷之非接觸式修補方法包含:將待修補之一面板基材置放定位於一承載台上; 利用影像辨視手段偵測定位於該承載台上的面板基材的聚醯亞胺膜缺陷,並將所述聚醯亞胺膜之缺陷的三維位置資料以及缺陷範圍大小資料傳輸至該控制裝置;由該控制裝置依據所述缺陷範圍大小資料運算出一沾附高度位置資料,所述沾附高度位置資料係依據修補針之針尖與聚醯亞胺膜之間的距離與聚醯亞胺液沾附於聚醯亞胺膜的範圍大小成反比之關係而得,再由該控制裝置依據所述沾附高度位置資料及所述三維位置資料運算出一下針距離資料,接續由該控制裝置進行下列步驟:依據所述三維位置資料,控制該平面位移裝置驅動該聚醯亞胺膜修補裝置,使該聚醯亞胺膜修補裝置之修補針移動至該面板基材之聚醯亞胺膜缺陷位置上方;以及依據所述下針距離資料,控制該聚醯亞胺膜修補裝置之針座向下移動,使所述針座上的修補針之針尖穿透對應之光阻盒並移動至該聚醯亞胺膜缺陷位置的上方預定位置,且所述針尖與該聚醯亞胺膜之間的距離符合所述沾附高度位置資料,使聚醯亞胺膜修補裝置之光阻盒內的聚醯亞胺液沿著所述針尖沾附至與所述聚醯亞胺膜之缺陷位置,修補所述聚醯亞胺膜之缺陷。 In order to achieve the purpose of the previous disclosure, the non-contact repair method for polyimide film defects of this creation is performed using a polyimide film repair device, a plane displacement device, and a control device. The polyimide film The repairing device respectively puts a photoresist box filled with polyfluorene imine in its plurality of holding tanks, and the needle tips of the repairing needles in the plurality of needle holders which are located above the holding tank and can be moved up and down respectively extend into the plurality of holding tanks. In the tank, the non-contact repair method for the polyimide film defect includes: placing a panel substrate to be repaired on a bearing platform; Detecting defects of the polyimide film of the panel substrate positioned on the supporting platform by using image recognition means, and transmitting the three-dimensional position data of the defects of the polyimide film and the size data of the defect range to the control device ; The control device calculates an adhesion height position data according to the size of the defect range, the adhesion height position data is based on the distance between the tip of the repair needle and the polyimide film and the polyimide solution The range attached to the polyimide film is inversely proportional, and then the control device calculates the needle distance data based on the attached height position data and the three-dimensional position data, and then is performed by the control device. The following steps: based on the three-dimensional position data, controlling the plane displacement device to drive the polyimide film repair device to move the repair pin of the polyimide film repair device to the polyimide film defect of the panel substrate Above the position; and controlling the needle base of the polyimide film repair device to move downward according to the lower needle distance data, so that the needle tip of the repair needle on the needle base penetrates the corresponding one The blocking box is moved to a predetermined position above the position of the polyimide film defect, and the distance between the needle tip and the polyimide film conforms to the position data of the adhesion height, so that the polyimide film repair device The polyimide solution in the photoresist box adheres to the defect position of the polyimide film along the needle tip, and repairs the defects of the polyimide film.

本創作聚醯亞胺膜缺陷之非接觸式修補方法主要係依據修補針之針尖與聚醯亞胺膜之間的距離與聚醯亞胺液沾附於聚醯亞胺膜的範圍大小成反比的特性,透過以影像辨視手段偵測出聚醯亞胺膜缺陷的三維位置資料以及缺陷範圍大小資料,使控制裝置能依據缺陷範圍大小資料運算出符合所述缺陷範圍大小的沾附高度位置資料,並再進一步以所述沾附高度位置資料與所述聚醯亞胺膜缺陷的三維位置資料運算出下針距離資料,使控制裝置得以精確地控制該聚醯亞胺膜修補裝置,使該聚醯亞胺膜修補裝置之修補針針尖得以移動置 缺陷位置上方的預定位置,使聚醯亞胺液得以沿著所述針尖沾附至與所述聚醯亞胺膜之缺陷位置。 The non-contact repair method of polyimide film defects is mainly based on the distance between the tip of the repair needle and the polyimide film, and the range of the polyimide solution adhering to the polyimide film is inversely proportional. By detecting the three-dimensional position data of the polyimide film defect and the size data of the defect range by means of image recognition, the control device can calculate the position of the attached height that conforms to the size of the defect range according to the size data of the defect range. Data, and further calculate the lower needle distance data using the adhesion height position data and the three-dimensional position data of the polyimide film defect, so that the control device can accurately control the polyimide film repair device, so that The tip of the repair needle of the polyimide film repair device can be moved A predetermined position above the defect position allows the polyimide solution to adhere to the defect position of the polyimide film along the needle tip.

透過控制所述聚醯亞胺膜修補裝置之修補針針尖與聚醯亞胺膜之間的高度距離的方式,使所述修補針的針尖能在不接觸所述聚醯亞胺膜的情形下,將聚醯亞胺液沾附於聚醯亞胺膜的缺陷處,以達到修補聚醯亞胺膜缺陷的效果,能有效避免所述修補針的針尖磨耗問題,進而提高聚醯亞胺膜缺陷修補作業之精準性。 By controlling the height distance between the repair needle tip of the polyimide film repair device and the polyimide film, the needle tip of the repair needle can contact the polyimide film without contacting the polyimide film. The polyimide solution is adhered to the defects of the polyimide film to achieve the effect of repairing the defects of the polyimide film, which can effectively avoid the problem of abrasion of the needle tip of the repair needle, thereby improving the polyimide film. Accuracy of defect repair operations.

10‧‧‧聚醯亞胺膜修補裝置 10‧‧‧Polyimide film repair device

11‧‧‧支撐架 11‧‧‧ support

12‧‧‧針座 12‧‧‧ Needle Block

13‧‧‧修補針 13‧‧‧ repair needle

131‧‧‧針尖 131‧‧‧ Needle tip

14‧‧‧容槽 14‧‧‧ tank

15‧‧‧光阻盒 15‧‧‧Photoresistance Box

151‧‧‧聚醯亞胺液 151‧‧‧Polyimide

20‧‧‧面板基材 20‧‧‧ Panel substrate

21‧‧‧玻璃基板 21‧‧‧ glass substrate

22‧‧‧聚醯亞胺膜 22‧‧‧Polyimide film

23‧‧‧缺陷 23‧‧‧ Defect

30‧‧‧承載台 30‧‧‧bearing platform

圖1:為本創作聚醯亞胺膜缺陷之非接觸式修補方法的聚醯亞胺膜修補裝置示意圖。 Fig. 1: Schematic diagram of a polyimide film repairing device for a non-contact repair method for creating a polyimide film defect.

圖2:為本創作聚醯亞胺膜缺陷之非接觸式修補方法之下針動作示意圖(一)。 Fig. 2: Schematic diagram of needle action under the non-contact repair method for polyimide film defects of this creation (1).

圖3:為本創作聚醯亞胺膜缺陷之非接觸式修補方法之下針動作示意圖(二)。 Fig. 3: Schematic diagram of needle action under the non-contact repair method of polyimide film defects for this creation (2).

圖4:為本創作聚醯亞胺膜缺陷之非接觸式修補方法之下針動作示意圖(三)。 Figure 4: Schematic diagram of needle action under the non-contact repair method for polyimide film defects (C).

請參閱圖1、圖2,本創作聚醯亞胺膜缺陷之非接觸式修補方法係使用一聚醯亞胺膜修補裝置10執行,其中,該聚醯亞胺膜修補裝置10係用以設置於一外部的平面位移裝置(圖未示)上,並位於一承載台30上方,所述聚醯亞胺膜修補裝置10包含一支撐架11、複數針座12及複數修補針13,該支撐架11 上形成複數間隔排列之容槽14,該複數針座12係可上下移動地設置於該支撐架11上,且該複數針座12的位置係分別位於該複數容槽14之上方,該複數修補針13分別可拆組地設置於該複數針座12上,且該複數修補針13的針尖131能分別伸入該複數容槽14內,所述聚醯亞胺膜修補裝置10之容槽14內能分別置放一填充有聚醯亞胺液151之光阻盒15。 Please refer to FIG. 1 and FIG. 2. The non-contact repairing method of the polyimide film defect of the present invention is performed by using a polyimide film repair device 10, wherein the polyimide film repair device 10 is used for setting On an external plane displacement device (not shown), and located above a loading platform 30, the polyimide film repair device 10 includes a support frame 11, a plurality of needle seats 12, and a plurality of repair needles 13, the support Shelf 11 A plurality of spaced-apart receptacles 14 are formed thereon, and the plurality of needle receptacles 12 are movably disposed on the support frame 11. The positions of the plurality of needle receptacles 12 are respectively located above the plurality of receptacles 14. Needles 13 are detachably arranged on the plurality of needle seats 12, and the needle tips 131 of the plurality of repair pins 13 can be respectively extended into the plurality of receiving grooves 14, the receiving grooves 14 of the polyimide film repairing device 10. A photoresist box 15 filled with a polyfluorene solution 151 can be placed in each of them.

請參閱圖2,在進行聚醯亞胺膜22修補作業時,作業人員能將待修補之一面板基材20置放定位於所述承載台30上,所述面板基材20包含一玻璃基板21及一塗佈於玻璃基板21表面的聚醯亞胺膜22,接著利用影像辨視手段偵測該面板基材20的聚醯亞胺膜22缺陷23,並將所述聚醯亞胺膜22之缺陷23的三維位置資料以及缺陷範圍大小資料傳輸至一控制裝置(圖未示)。 Please refer to FIG. 2, when performing the polyimide film 22 repair operation, an operator can place one of the panel substrates 20 to be repaired on the supporting platform 30, and the panel substrate 20 includes a glass substrate 21 and a polyimide film 22 coated on the surface of the glass substrate 21, and then detect the defects 23 of the polyimide film 22 of the panel substrate 20 by means of image recognition, and apply the polyimide film The three-dimensional position data of the defect 22 and the size data of the defect range are transmitted to a control device (not shown).

該控制裝置依據所述缺陷範圍大小資料運算出一沾附高度位置資料,再依據所述沾附高度位置資料及所述三維位置資料運算出一下針距離資料,其中,所述沾附高度位置資料係依據修補針13之針尖131與聚醯亞胺膜22之間的距離與聚醯亞胺液151沾附於聚醯亞胺膜22的範圍大小成反比的特性,並藉由所述缺陷範圍大小資料運算出符合所述缺陷23範圍大小的修補針13之針尖131與聚醯亞胺膜22之間的最佳距離參數,而所述下針距離資料則係依據所述三維位置資料與所述沾附高度位置資料所運算出之針座12帶動修補針13之針尖131下移的距離參數。 The control device calculates a sticking height position data according to the defect range size data, and then calculates a needle distance data based on the sticking height position data and the three-dimensional position data, wherein the sticking height position data It is based on the characteristic that the distance between the tip 131 of the repair needle 13 and the polyimide film 22 is inversely proportional to the range in which the polyimide solution 151 adheres to the polyimide film 22, and by the defect range The size data calculates the optimal distance parameter between the tip 131 of the repair needle 13 and the polyimide film 22 that matches the size of the defect 23, and the lower needle distance data is based on the three-dimensional position data and the The parameter of the distance that the needle base 12 calculated by the attached height position data drives the needle tip 131 of the repair needle 13 to move down is described.

接著,請配合參看圖2,該控制裝置會依據所述三維位置資料,控制一平面位移裝置驅動該聚醯亞胺膜修補裝置10,使該聚醯亞胺膜修補裝置10之修補針13移動至該面板基材20之缺陷23位置上方。 Next, please refer to FIG. 2. The control device will control a planar displacement device to drive the polyimide film repair device 10 according to the three-dimensional position data, so that the repair needle 13 of the polyimide film repair device 10 moves. To the position of the defect 23 of the panel substrate 20.

請參看圖2至圖4,再依據所述下針距離資料,控制該聚醯亞胺膜修補裝置10之針座12向下移動,使所述針座12上的修補針13之針尖131穿透對應之光阻盒15並移動至該聚醯亞胺膜22缺陷23位置的上方預定位置,使該針 尖131與聚醯亞胺膜22之間的距離符合所述沾附高度位置資料,進而使聚醯亞胺膜修補裝置10之光阻盒15內的聚醯亞胺液151能沿著所述針尖131沾附至與所述聚醯亞胺膜22之缺陷23位置,修補所述聚醯亞胺膜22之缺陷23。 Please refer to FIG. 2 to FIG. 4, and then control the needle base 12 of the polyimide membrane repair device 10 to move downward according to the lower needle distance data, so that the needle tip 131 of the repair needle 13 on the needle base 12 passes through. Penetrate the corresponding photoresist box 15 and move to a predetermined position above the position 23 of the polyimide film 22 defect, so that the needle The distance between the tip 131 and the polyimide film 22 conforms to the position data of the adhesion height, so that the polyimide solution 151 in the photoresist box 15 of the polyimide film repair device 10 can follow the The needle tip 131 is attached to the position of the defect 23 of the polyimide film 22 to repair the defect 23 of the polyimide film 22.

綜上所述,本創作聚醯亞胺膜缺陷之非接觸式修補方法主要係透過控制所述聚醯亞胺膜修補裝置10之修補針13針尖131與聚醯亞胺膜22之間的高度距離的方式,使所述修補針13的針尖131能在不接觸所述聚醯亞胺膜22的情形下,將聚醯亞胺液151沾附於聚醯亞胺膜22的缺陷23處,以達到修補聚醯亞胺膜22缺陷23的效果,能有效避免所述修補針13的針尖131磨耗問題,進而提高聚醯亞胺膜22缺陷23修補作業之精準性。 To sum up, the non-contact repair method for the polyimide film defect of this creation is mainly by controlling the height between the needle 13 of the repair pin 13 and the polyimide film 22 of the polyimide film repair device 10 The distance method enables the needle tip 131 of the repair needle 13 to attach the polyimide solution 151 to the defect 23 of the polyimide film 22 without contacting the polyimide film 22, In order to achieve the effect of repairing the defect 23 of the polyimide film 22, the problem of wear of the needle tip 131 of the repair needle 13 can be effectively avoided, and the accuracy of the repair operation of the defect 23 of the polyimide film 22 can be effectively improved.

Claims (1)

一種聚醯亞胺膜缺陷之非接觸式修補方法,其係使用一聚醯亞胺膜修補裝置、一平面位移裝置及一控制裝置來執行,該聚醯亞胺膜修補裝置於其複數容槽內分別置放填充有聚醯亞胺液之光阻盒,並以位於所述容槽上方且能上下移動的複數針座中的修補針的針尖分別伸入該複數容槽內,該聚醯亞胺膜缺陷之非接觸式修補方法包含:將待修補之一面板基材置放定位於一承載台上;利用影像辨視手段偵測定位於該承載台上的面板基材的聚醯亞胺膜缺陷,並將所述聚醯亞胺膜之缺陷的三維位置資料以及缺陷範圍大小資料傳輸至該控制裝置;由該控制裝置依據所述缺陷範圍大小資料運算出一沾附高度位置資料,所述沾附高度位置資料係依據修補針之針尖與聚醯亞胺膜之間的距離與聚醯亞胺液沾附於聚醯亞胺膜的範圍大小成反比之關係而得;再由該控制裝置依據所述沾附高度位置資料及所述三維位置資料運算出一下針距離資料,接續由該控制裝置進行下列步驟:依據所述三維位置資料,控制該平面位移裝置驅動該聚醯亞胺膜修補裝置,使該聚醯亞胺膜修補裝置之修補針移動至該面板基材之聚醯亞胺膜缺陷位置上方;以及依據所述下針距離資料,控制該聚醯亞胺膜修補裝置之針座向下移動,使所述針座上的修補針之針尖穿透對應之光阻盒並移動至該聚醯亞胺膜缺陷位置的上方預定位置,且所述針尖與該聚醯亞胺膜之間的距離符合所述沾附高度位置資料,使聚醯亞胺膜修補裝置之光阻盒內的聚醯亞胺液沿著所述針尖沾附至與所述聚醯亞胺膜之缺陷位置,修補所述聚醯亞胺膜之缺陷。A non-contact repair method for polyimide film defects, which is performed using a polyimide film repair device, a plane displacement device and a control device. The polyimide film repair device is in a plurality of tanks. Photoresist boxes filled with polyfluorene imine are respectively placed therein, and the tips of the repair pins in the plurality of needle holders which are located above the holding groove and can move up and down are respectively extended into the plurality of holding grooves, and the polysilicon A non-contact repair method for an imine film defect includes: placing a panel substrate to be repaired on a supporting platform; and using image recognition means to detect a polysilicon of the panel substrate positioned on the supporting platform. The amine film defect, and transmits the three-dimensional position data of the defect of the polyimide film and the size data of the defect range to the control device; the control device calculates an attached height position data according to the size data of the defect range, The position data of the adhesion height is obtained based on an inverse relationship between the distance between the tip of the repair needle and the polyimide film and the range in which the polyimide solution adheres to the polyimide film; Control device The attached height position data and the three-dimensional position data are used to calculate the needle distance data, and then the control device performs the following steps: according to the three-dimensional position data, controlling the plane displacement device to drive the polyimide film repair device Moving the repair pin of the polyimide film repair device above the position of the polyimide film defect on the panel substrate; and controlling the needle base of the polyimide film repair device according to the lower needle distance data Move down to make the needle tip of the repair pin on the needle base penetrate the corresponding photoresist box and move to a predetermined position above the polyimide film defect position, and the needle tip and the polyimide film The distance between them is in accordance with the position data of the adhesion height, so that the polyimide solution in the photoresist box of the polyimide film repair device adheres to the defect position of the polyimide film along the needle tip. To repair the defects of the polyfluoreneimide film.
TW107142866A 2018-11-30 2018-11-30 Non-contact repair method for polyimine film defects TWI671519B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW107142866A TWI671519B (en) 2018-11-30 2018-11-30 Non-contact repair method for polyimine film defects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW107142866A TWI671519B (en) 2018-11-30 2018-11-30 Non-contact repair method for polyimine film defects

Publications (2)

Publication Number Publication Date
TWI671519B true TWI671519B (en) 2019-09-11
TW202022354A TW202022354A (en) 2020-06-16

Family

ID=68619220

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107142866A TWI671519B (en) 2018-11-30 2018-11-30 Non-contact repair method for polyimine film defects

Country Status (1)

Country Link
TW (1) TWI671519B (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI373648B (en) * 2004-06-28 2012-10-01 Ntn Toyo Bearing Co Ltd Fine pattern modification device and modification method of the fine pattern defect
TWI589970B (en) * 2016-09-22 2017-07-01 Alignment membrane repair device
TW201728237A (en) * 2016-01-19 2017-08-01 財團法人工業技術研究院 Flexible substrate with repair structure, manufacturing method thereof and method of inspection and repair of flexible substrate
CN108520916A (en) * 2018-05-21 2018-09-11 武汉华星光电半导体显示技术有限公司 A kind of flexible base board and its bubble repair structure

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI373648B (en) * 2004-06-28 2012-10-01 Ntn Toyo Bearing Co Ltd Fine pattern modification device and modification method of the fine pattern defect
TW201728237A (en) * 2016-01-19 2017-08-01 財團法人工業技術研究院 Flexible substrate with repair structure, manufacturing method thereof and method of inspection and repair of flexible substrate
TWI589970B (en) * 2016-09-22 2017-07-01 Alignment membrane repair device
CN108520916A (en) * 2018-05-21 2018-09-11 武汉华星光电半导体显示技术有限公司 A kind of flexible base board and its bubble repair structure

Also Published As

Publication number Publication date
TW202022354A (en) 2020-06-16

Similar Documents

Publication Publication Date Title
US20140102221A1 (en) Method and device for determining the pressure distribution for bonding
US9459198B2 (en) Pressing and tearing apparatus and method for peeling rate tests
CN107193139B (en) Display panel test equipment and test method
US8468943B2 (en) Imprint method, computer storage medium and imprint apparatus
KR20120077289A (en) Array test apparatus
TWI491896B (en) Array test apparatus having a plurality of head units
KR102605917B1 (en) Scribing apparatus
JP4513960B2 (en) Slit coat type coating apparatus and slit coat type coating method
TWI671519B (en) Non-contact repair method for polyimine film defects
CN104503112A (en) Method and system for repairing array substrate
KR101578859B1 (en) Attaching Apparatus For Touch Screen Display Assembly
JP5416143B2 (en) Method for predicting conformability of sheet material to reference plane
KR20110136436A (en) Align mark forming apparatus
JP6100571B2 (en) Display device manufacturing apparatus and display device manufacturing method
CN105116626A (en) Alignment film coating device and coating method thereof
TWI389744B (en) Method of controlling coating apparatus
KR20200065211A (en) Scribing apparatus
KR101949331B1 (en) Array test apparatus
MX2013004672A (en) Method and apparatus for preventing light leakage from light guide plate and display device having light guide plate painted with reflective material.
CN111267376A (en) Non-contact type repairing method for polyimide film defect
KR101740383B1 (en) Equal spread equipments for embrocation
CN208384287U (en) A kind of detection device of etch structures
KR20150095377A (en) Automatically compensating location apparatus for probe card of probe test apparatus for flat pannel display
JP6852735B2 (en) Glass substrate strain measuring method and glass substrate strain measuring device
TW202039226A (en) Method for repairing polyimide film with which an image recognition means is used to detect a defect location and controller is used to control a surface moving device to move a repairing device to the defect location