TWI662796B - 錯誤校正及解碼 - Google Patents

錯誤校正及解碼 Download PDF

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Publication number
TWI662796B
TWI662796B TW107106147A TW107106147A TWI662796B TW I662796 B TWI662796 B TW I662796B TW 107106147 A TW107106147 A TW 107106147A TW 107106147 A TW107106147 A TW 107106147A TW I662796 B TWI662796 B TW I662796B
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TW
Taiwan
Prior art keywords
output
error
syndrome
correction
position decoder
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TW107106147A
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English (en)
Chinese (zh)
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TW201818666A (zh
Inventor
金聖克
崔莎拉
宋秉圭
那泰惠
金吉穌
金正丕
金頌詠
金泰煥
康承赫
Original Assignee
美商高通公司
韓國延世大學校產學協力團
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Application filed by 美商高通公司, 韓國延世大學校產學協力團 filed Critical 美商高通公司
Publication of TW201818666A publication Critical patent/TW201818666A/zh
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/61Aspects and characteristics of methods and arrangements for error correction or error detection, not provided for otherwise
    • H03M13/615Use of computational or mathematical techniques
    • H03M13/616Matrix operations, especially for generator matrices or check matrices, e.g. column or row permutations
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1012Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/03Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
    • H03M13/05Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
    • H03M13/13Linear codes
    • H03M13/15Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes
    • H03M13/151Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes using error location or error correction polynomials
    • H03M13/152Bose-Chaudhuri-Hocquenghem [BCH] codes
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/03Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
    • H03M13/05Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
    • H03M13/13Linear codes
    • H03M13/15Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes
    • H03M13/151Cyclic codes, i.e. cyclic shifts of codewords produce other codewords, e.g. codes defined by a generator polynomial, Bose-Chaudhuri-Hocquenghem [BCH] codes using error location or error correction polynomials
    • H03M13/1575Direct decoding, e.g. by a direct determination of the error locator polynomial from syndromes and subsequent analysis or by matrix operations involving syndromes, e.g. for codes with a small minimum Hamming distance
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/61Aspects and characteristics of methods and arrangements for error correction or error detection, not provided for otherwise
    • H03M13/615Use of computational or mathematical techniques
    • H03M13/617Polynomial operations, e.g. operations related to generator polynomials or parity-check polynomials
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/65Purpose and implementation aspects
    • H03M13/6502Reduction of hardware complexity or efficient processing

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Pure & Applied Mathematics (AREA)
  • Probability & Statistics with Applications (AREA)
  • Algebra (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Error Detection And Correction (AREA)
  • Detection And Correction Of Errors (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
TW107106147A 2015-09-14 2016-08-29 錯誤校正及解碼 TWI662796B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/852,988 US9800271B2 (en) 2015-09-14 2015-09-14 Error correction and decoding
US14/852,988 2015-09-14

Publications (2)

Publication Number Publication Date
TW201818666A TW201818666A (zh) 2018-05-16
TWI662796B true TWI662796B (zh) 2019-06-11

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TW105127673A TWI625943B (zh) 2015-09-14 2016-08-29 錯誤校正及解碼

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Country Status (7)

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US (2) US9800271B2 (enExample)
EP (1) EP3350930B1 (enExample)
JP (1) JP6884138B2 (enExample)
KR (1) KR102599033B1 (enExample)
CN (1) CN108055876B (enExample)
TW (2) TWI662796B (enExample)
WO (1) WO2017048474A1 (enExample)

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KR102583797B1 (ko) * 2018-04-09 2023-10-05 에스케이하이닉스 주식회사 메모리 시스템 및 메모리 시스템의 동작 방법
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CN111835320A (zh) * 2019-04-22 2020-10-27 珠海格力电器股份有限公司 一种信号的边沿检测装置
KR102705065B1 (ko) * 2019-07-29 2024-09-09 에스케이하이닉스 주식회사 낮은 레이턴시를 갖는 에러정정코드 디코더
US11095313B2 (en) 2019-10-21 2021-08-17 International Business Machines Corporation Employing single error correction and triple error detection to optimize bandwidth and resilience under multiple bit failures
KR20210092391A (ko) * 2020-01-16 2021-07-26 삼성전자주식회사 반도체 메모리 장치의 에러 정정 회로 및 반도체 메모리 장치
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Also Published As

Publication number Publication date
WO2017048474A1 (en) 2017-03-23
EP3350930A1 (en) 2018-07-25
CN108055876A (zh) 2018-05-18
US9800271B2 (en) 2017-10-24
EP3350930B1 (en) 2023-07-26
JP6884138B2 (ja) 2021-06-09
TWI625943B (zh) 2018-06-01
TW201818666A (zh) 2018-05-16
CN108055876B (zh) 2022-11-18
US20170077963A1 (en) 2017-03-16
US10263645B2 (en) 2019-04-16
TW201714411A (zh) 2017-04-16
KR20180053700A (ko) 2018-05-23
KR102599033B1 (ko) 2023-11-03
JP2018533254A (ja) 2018-11-08
US20180019767A1 (en) 2018-01-18

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