TWI654750B - 固態影像擷取裝置及其製造方法與電子設備 - Google Patents
固態影像擷取裝置及其製造方法與電子設備Info
- Publication number
- TWI654750B TWI654750B TW103122164A TW103122164A TWI654750B TW I654750 B TWI654750 B TW I654750B TW 103122164 A TW103122164 A TW 103122164A TW 103122164 A TW103122164 A TW 103122164A TW I654750 B TWI654750 B TW I654750B
- Authority
- TW
- Taiwan
- Prior art keywords
- pixel
- layer
- light shielding
- image capturing
- refractive index
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 28
- 238000001514 detection method Methods 0.000 claims abstract description 36
- 238000000034 method Methods 0.000 claims abstract description 24
- 239000000463 material Substances 0.000 claims description 33
- 239000000758 substrate Substances 0.000 claims description 18
- 239000010410 layer Substances 0.000 description 334
- 239000004065 semiconductor Substances 0.000 description 28
- 238000010586 diagram Methods 0.000 description 23
- 238000012545 processing Methods 0.000 description 17
- 239000011347 resin Substances 0.000 description 15
- 229920005989 resin Polymers 0.000 description 15
- 238000005286 illumination Methods 0.000 description 10
- 230000015556 catabolic process Effects 0.000 description 9
- 238000006731 degradation reaction Methods 0.000 description 9
- 230000004048 modification Effects 0.000 description 9
- 238000012986 modification Methods 0.000 description 9
- 210000001747 pupil Anatomy 0.000 description 8
- 230000000694 effects Effects 0.000 description 7
- 230000035945 sensitivity Effects 0.000 description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 230000000875 corresponding effect Effects 0.000 description 6
- 230000001965 increasing effect Effects 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 5
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 239000004925 Acrylic resin Substances 0.000 description 4
- 229920000178 Acrylic resin Polymers 0.000 description 4
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 4
- 239000003086 colorant Substances 0.000 description 4
- 230000001419 dependent effect Effects 0.000 description 4
- 238000009826 distribution Methods 0.000 description 4
- 239000011229 interlayer Substances 0.000 description 4
- 239000000049 pigment Substances 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 3
- 229910052681 coesite Inorganic materials 0.000 description 3
- 229910052906 cristobalite Inorganic materials 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 238000000059 patterning Methods 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 239000000377 silicon dioxide Substances 0.000 description 3
- 235000012239 silicon dioxide Nutrition 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 229910052682 stishovite Inorganic materials 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- 229910052905 tridymite Inorganic materials 0.000 description 3
- 229920006026 co-polymeric resin Polymers 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 150000004767 nitrides Chemical class 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- 229910001925 ruthenium oxide Inorganic materials 0.000 description 2
- WOCIAKWEIIZHES-UHFFFAOYSA-N ruthenium(iv) oxide Chemical compound O=[Ru]=O WOCIAKWEIIZHES-UHFFFAOYSA-N 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 229920001909 styrene-acrylic polymer Polymers 0.000 description 2
- 229920001187 thermosetting polymer Polymers 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000001413 cellular effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- CJNBYAVZURUTKZ-UHFFFAOYSA-N hafnium(IV) oxide Inorganic materials O=[Hf]=O CJNBYAVZURUTKZ-UHFFFAOYSA-N 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- NFFIWVVINABMKP-UHFFFAOYSA-N methylidynetantalum Chemical compound [Ta]#C NFFIWVVINABMKP-UHFFFAOYSA-N 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910003468 tantalcarbide Inorganic materials 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14623—Optical shielding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14621—Colour filter arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
- H01L27/14627—Microlenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1464—Back illuminated imager structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14685—Process for coatings or optical elements
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Color Television Image Signal Generators (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013-139832 | 2013-07-03 | ||
JP2013139832A JP6103301B2 (ja) | 2013-07-03 | 2013-07-03 | 固体撮像装置およびその製造方法、並びに電子機器 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201508905A TW201508905A (zh) | 2015-03-01 |
TWI654750B true TWI654750B (zh) | 2019-03-21 |
Family
ID=51210705
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW103122164A TWI654750B (zh) | 2013-07-03 | 2014-06-26 | 固態影像擷取裝置及其製造方法與電子設備 |
Country Status (6)
Country | Link |
---|---|
US (4) | US9978786B2 (ja) |
JP (1) | JP6103301B2 (ja) |
KR (2) | KR20160029727A (ja) |
CN (2) | CN109728014B (ja) |
TW (1) | TWI654750B (ja) |
WO (1) | WO2015001769A2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI792016B (zh) * | 2019-12-11 | 2023-02-11 | 神盾股份有限公司 | 指紋感測系統及其使用方法 |
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JP6103301B2 (ja) | 2013-07-03 | 2017-03-29 | ソニー株式会社 | 固体撮像装置およびその製造方法、並びに電子機器 |
JP2015076475A (ja) * | 2013-10-08 | 2015-04-20 | ソニー株式会社 | 固体撮像装置およびその製造方法、並びに電子機器 |
JP6115787B2 (ja) * | 2013-12-18 | 2017-04-19 | ソニー株式会社 | 固体撮像装置およびその製造方法、並びに電子機器 |
KR20160123757A (ko) * | 2015-04-17 | 2016-10-26 | 삼성전자주식회사 | 이미지 촬영 장치 및 이미지 촬영 방법 |
US10672813B2 (en) | 2015-06-03 | 2020-06-02 | Sony Corporation | Solid-state imaging device, imaging apparatus, and manufacturing method of solid-state imaging device with pixels that include light shielding portions |
JP6566734B2 (ja) * | 2015-06-11 | 2019-08-28 | キヤノン株式会社 | 固体撮像素子 |
JP6758747B2 (ja) | 2015-09-18 | 2020-09-23 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像装置および電子機器 |
US9905605B2 (en) * | 2015-10-15 | 2018-02-27 | Taiwan Semiconductor Manufacturing Co., Ltd. | Phase detection autofocus techniques |
US9832399B2 (en) * | 2016-01-29 | 2017-11-28 | Taiwan Semiconductor Manufacturing Co., Ltd. | Image sensor and method for manufacturing the same |
JP2017195342A (ja) * | 2016-04-22 | 2017-10-26 | 株式会社ニコン | 撮像素子および電子機器 |
CN113489904B (zh) * | 2016-07-13 | 2023-07-21 | 索尼公司 | 成像装置、成像器件和图像处理装置 |
JP6895724B2 (ja) * | 2016-09-06 | 2021-06-30 | キヤノン株式会社 | 撮像素子及び撮像装置 |
KR101892184B1 (ko) * | 2017-02-14 | 2018-08-29 | 크루셜텍(주) | 다중 생체 인식 장치 및 이를 포함하는 출입 시스템 |
CN108804985A (zh) * | 2017-05-03 | 2018-11-13 | 上海箩箕技术有限公司 | 指纹成像模组和电子设备 |
KR102375989B1 (ko) | 2017-08-10 | 2022-03-18 | 삼성전자주식회사 | 화소 사이의 신호 차이를 보상하는 이미지 센서 |
WO2019065143A1 (ja) * | 2017-09-26 | 2019-04-04 | 富士フイルム株式会社 | 積層体、及び、固体撮像素子 |
KR20200075828A (ko) * | 2017-10-19 | 2020-06-26 | 소니 주식회사 | 촬상 소자, 화상 처리 장치, 화상 처리 방법, 및 프로그램 |
JP7383876B2 (ja) * | 2018-02-02 | 2023-11-21 | 株式会社ニコン | 撮像素子、及び、撮像装置 |
KR102507207B1 (ko) * | 2018-04-11 | 2023-03-09 | 에스케이하이닉스 주식회사 | 낮은 굴절률을 갖는 패싱 필터를 포함하는 이미지 센서 |
CN210325801U (zh) * | 2018-07-18 | 2020-04-14 | 索尼半导体解决方案公司 | 受光元件以及测距模块 |
KR102593949B1 (ko) * | 2018-07-25 | 2023-10-27 | 삼성전자주식회사 | 이미지 센서 |
KR102638740B1 (ko) | 2018-12-12 | 2024-02-22 | 삼성전자주식회사 | 3차원 반도체 메모리 소자 |
JPWO2020195825A1 (ja) * | 2019-03-25 | 2020-10-01 | ||
KR20210029466A (ko) * | 2019-09-06 | 2021-03-16 | 에스케이하이닉스 주식회사 | 이미지 센싱 장치 |
JP7503399B2 (ja) * | 2020-03-16 | 2024-06-20 | ソニーセミコンダクタソリューションズ株式会社 | 固体撮像装置及びその製造方法、並びに電子機器 |
JP2021175048A (ja) * | 2020-04-22 | 2021-11-01 | ソニーセミコンダクタソリューションズ株式会社 | 電子機器 |
US11276793B2 (en) * | 2020-06-04 | 2022-03-15 | Visera Technologies Company Limited | Semiconductor device |
US11495048B2 (en) | 2020-08-17 | 2022-11-08 | Au Optronics Corporation | Fingerprint sensing module |
US20240321917A1 (en) * | 2021-08-06 | 2024-09-26 | Sony Semiconductor Solutions Corporation | Imaging device |
CN114040083A (zh) * | 2021-11-30 | 2022-02-11 | 维沃移动通信有限公司 | 图像传感器、摄像模组以及电子设备 |
JP2023150251A (ja) * | 2022-03-31 | 2023-10-16 | ソニーセミコンダクタソリューションズ株式会社 | 光検出装置及び電子機器 |
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US20130015545A1 (en) | 2011-07-12 | 2013-01-17 | Sony Corporation | Solid-state imaging device, manufacturing method of solid-state imaging device and electronic apparatus |
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JP4968893B2 (ja) | 2006-09-14 | 2012-07-04 | キヤノン株式会社 | 撮像素子及び撮像システム |
JP5076679B2 (ja) * | 2007-06-28 | 2012-11-21 | ソニー株式会社 | 固体撮像装置及びカメラモジュール |
JP2009059824A (ja) * | 2007-08-30 | 2009-03-19 | Sharp Corp | 固体撮像素子およびその製造方法、電子情報機器 |
JP2010093081A (ja) * | 2008-10-08 | 2010-04-22 | Panasonic Corp | 固体撮像装置およびその製造方法 |
KR101583263B1 (ko) * | 2009-04-27 | 2016-01-11 | 삼성디스플레이 주식회사 | 표시기판, 이의 제조방법 및 이를 갖는 표시장치 |
JP2011100900A (ja) * | 2009-11-06 | 2011-05-19 | Sony Corp | 固体撮像装置及びその製造方法と設計方法並びに電子機器 |
JP2011176715A (ja) * | 2010-02-25 | 2011-09-08 | Nikon Corp | 裏面照射型撮像素子および撮像装置 |
JP2011210981A (ja) * | 2010-03-30 | 2011-10-20 | Sony Corp | 固体撮像装置、固体撮像装置の製造方法、電子機器 |
WO2011158567A1 (ja) * | 2010-06-18 | 2011-12-22 | 富士フイルム株式会社 | 固体撮像素子及びデジタルカメラ |
JP2010258466A (ja) * | 2010-06-23 | 2010-11-11 | Panasonic Corp | 固体撮像装置およびその製造方法 |
JP5736755B2 (ja) * | 2010-12-09 | 2015-06-17 | ソニー株式会社 | 固体撮像装置とその製造方法、及び電子機器 |
JP5956718B2 (ja) | 2011-01-20 | 2016-07-27 | キヤノン株式会社 | 撮像素子及び撮像装置 |
JP5664270B2 (ja) * | 2011-01-21 | 2015-02-04 | ソニー株式会社 | 撮像素子および撮像装置 |
JP5861257B2 (ja) * | 2011-02-21 | 2016-02-16 | ソニー株式会社 | 撮像素子および撮像装置 |
KR101853817B1 (ko) | 2011-07-20 | 2018-05-02 | 삼성전자주식회사 | 촬상 소자 |
JP5902468B2 (ja) * | 2011-12-21 | 2016-04-13 | 株式会社ネクスコ東日本エンジニアリング | 埋設ジョイント構造の施工方法および埋設ジョイント構造ならびに埋設ジョイント施工金具組立体 |
JP6095268B2 (ja) * | 2012-02-24 | 2017-03-15 | キヤノン株式会社 | 固体撮像装置、及び撮像システム |
JP6148530B2 (ja) * | 2013-05-02 | 2017-06-14 | キヤノン株式会社 | 固体撮像装置及びカメラ |
JP2015005619A (ja) * | 2013-06-20 | 2015-01-08 | キヤノン株式会社 | 固体撮像装置、その製造方法、およびカメラ |
JP6103301B2 (ja) | 2013-07-03 | 2017-03-29 | ソニー株式会社 | 固体撮像装置およびその製造方法、並びに電子機器 |
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2013
- 2013-07-03 JP JP2013139832A patent/JP6103301B2/ja active Active
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2014
- 2014-06-25 CN CN201811241434.5A patent/CN109728014B/zh active Active
- 2014-06-25 CN CN201480023244.XA patent/CN105190891B/zh active Active
- 2014-06-25 KR KR1020157025832A patent/KR20160029727A/ko not_active IP Right Cessation
- 2014-06-25 US US14/900,242 patent/US9978786B2/en active Active
- 2014-06-25 WO PCT/JP2014/003401 patent/WO2015001769A2/en active Application Filing
- 2014-06-25 KR KR1020217010404A patent/KR102383190B1/ko active IP Right Grant
- 2014-06-26 TW TW103122164A patent/TWI654750B/zh active
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2018
- 2018-04-10 US US15/949,678 patent/US10685998B2/en active Active
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2020
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TWI792016B (zh) * | 2019-12-11 | 2023-02-11 | 神盾股份有限公司 | 指紋感測系統及其使用方法 |
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Also Published As
Publication number | Publication date |
---|---|
CN105190891A (zh) | 2015-12-23 |
WO2015001769A3 (en) | 2015-03-05 |
KR20210043002A (ko) | 2021-04-20 |
US12087787B2 (en) | 2024-09-10 |
CN109728014A (zh) | 2019-05-07 |
JP6103301B2 (ja) | 2017-03-29 |
JP2015015295A (ja) | 2015-01-22 |
US11211410B2 (en) | 2021-12-28 |
CN105190891B (zh) | 2019-05-10 |
US20180366501A1 (en) | 2018-12-20 |
CN109728014B (zh) | 2022-11-18 |
KR102383190B1 (ko) | 2022-04-08 |
US10685998B2 (en) | 2020-06-16 |
US20200279882A1 (en) | 2020-09-03 |
KR20160029727A (ko) | 2016-03-15 |
US20220102400A1 (en) | 2022-03-31 |
US20160343753A1 (en) | 2016-11-24 |
TW201508905A (zh) | 2015-03-01 |
WO2015001769A2 (en) | 2015-01-08 |
US9978786B2 (en) | 2018-05-22 |
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