TWI616333B - Resin sheet with support - Google Patents

Resin sheet with support Download PDF

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Publication number
TWI616333B
TWI616333B TW102121946A TW102121946A TWI616333B TW I616333 B TWI616333 B TW I616333B TW 102121946 A TW102121946 A TW 102121946A TW 102121946 A TW102121946 A TW 102121946A TW I616333 B TWI616333 B TW I616333B
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Taiwan
Prior art keywords
support
resin sheet
layer
insulating layer
resin
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TW102121946A
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Chinese (zh)
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TW201414606A (en
Inventor
西村嘉生
川合賢司
中村茂雄
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味之素股份有限公司
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/38Layered products comprising a layer of synthetic resin comprising epoxy resins
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/06Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B27/08Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/18Layered products comprising a layer of synthetic resin characterised by the use of special additives
    • B32B27/20Layered products comprising a layer of synthetic resin characterised by the use of special additives using fillers, pigments, thixotroping agents
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/20Properties of the layers or laminate having particular electrical or magnetic properties, e.g. piezoelectric
    • B32B2307/206Insulating
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2457/00Electrical equipment
    • B32B2457/08PCBs, i.e. printed circuit boards
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits

Abstract

本發明之課題為提供介電正接、線熱膨脹係數雖低,但膠渣去除性、鍍敷剝離強度優良之附支持體之樹脂薄片。 An object of the present invention is to provide a resin sheet with a support which has a dielectric positive connection and a low coefficient of thermal expansion, but which has excellent slag removal property and plating peel strength.

其解決手段為,藉由使用一種附支持體之樹脂薄片,其特徵為具有支持體、形成於前述支持體上之特定的第1層、與形成於前述第1層上之特定的第2層,而完成了本發明。 The solution is to use a resin sheet with a support having a support, a specific first layer formed on the support, and a specific second layer formed on the first layer. The present invention has been completed.

Description

附支持體之樹脂薄片 Resin sheet with support

本發明係關於附支持體之樹脂薄片。進一步係關於含有該附支持體之樹脂薄片的多層印刷配線板、半導體裝置。 The present invention relates to a resin sheet with a support. Further, the present invention relates to a multilayer printed wiring board and a semiconductor device including the resin sheet with the support.

近年來,隨著電子機器之小型化、高性能化,半導體封裝基板中,增層(build-up layer)係多層化,要求配線之微細化及高密度化。 In recent years, with the miniaturization and high performance of electronic equipment, in the semiconductor package substrate, the build-up layer is multilayered, and wiring is required to be made finer and higher in density.

對於此,進行了各種探討。例如專利文獻1中,揭示了含有環氧樹脂、活性酯樹脂之樹脂組成物。記載了藉由該等之組成物所形成之絕緣層,可兼顧介電特性與耐熱性。但是,其性能未必可得到滿足。 Various discussions have been made on this. For example, Patent Document 1 discloses a resin composition containing an epoxy resin and an active ester resin. It is described that the insulating layer formed by the composition can achieve both dielectric properties and heat resistance. However, its performance may not be met.

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開2009-235165號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2009-235165

樹脂組成物中,欲成為介電特性優良的硬化物,較佳為摻混多量的活性酯化合物;欲使熱膨脹率降低,較佳為摻混多量的無機填充材,但此情況時,以碳酸氣雷射所為之通孔形成當中,新發現了雷射加工性或膠渣去除性會容易惡化之問題。另一方面,隨著將活性酯化合物減量時,膠渣去除性雖改善,但介電正接會上昇,確認了關於去膠渣後所形成之鍍銅會有鍍敷剝離強度變得容易降低之問題。 In the resin composition, it is preferred to blend a large amount of the active ester compound to obtain a cured product having excellent dielectric properties; and to reduce the thermal expansion rate, it is preferred to blend a large amount of the inorganic filler, but in this case, carbonic acid is used. In the formation of through-holes by gas lasers, it has been newly discovered that laser processing properties or slag removal properties are likely to deteriorate. On the other hand, as the amount of the active ester compound is reduced, the slag removal property is improved, but the dielectric positive connection is increased, and it is confirmed that the plating peeling strength after the desmear formation is likely to be lowered. problem.

本發明係鑑於上述實情而為者,本發明所欲解決之課題,係提供介電正接、線熱膨脹係數雖低,但膠渣去除性、鍍敷剝離強度優良之附支持體之樹脂薄片。 The present invention has been made in view of the above-mentioned circumstances, and it is an object of the present invention to provide a resin sheet with a support which has a dielectric positive connection and a low coefficient of thermal expansion, but which has excellent slag removal property and plating peel strength.

本發明者為了解決上述課題而銳意研究的結果,藉由使用一種附支持體之樹脂薄片,其特徵為具有支持體、形成於前述支持體上之特定的第1層、與形成於前述第1層上之特定的第2層,而完成了本發明。 As a result of intensive studies to solve the above problems, the present inventors have used a resin sheet with a support having a support, a specific first layer formed on the support, and a first layer formed thereon. The present invention has been completed by a specific second layer on the layer.

亦即,本發明係包含以下內容者。 That is, the present invention includes the following.

[1]一種附支持體之樹脂薄片,其特徵為具有支持體;形成於前述支持體上之含有環氧樹脂、活性酯化合物及無機填充材的第1層,其中前述第1層中之不揮發成分為100質量%時,活性酯化合物為5質量%以上;與形成於前述第1層上之含有環氧樹脂、活性酯化合物及無機填 充材之第2層,其中前述第2層中之不揮發成分為100質量%時,活性酯化合物為5質量%以下。 [1] A resin sheet with a support comprising a support; a first layer comprising an epoxy resin, an active ester compound, and an inorganic filler formed on the support, wherein the first layer is not When the volatile component is 100% by mass, the active ester compound is 5% by mass or more; and the epoxy resin, the active ester compound, and the inorganic filler are formed on the first layer. In the second layer of the filler, when the nonvolatile component in the second layer is 100% by mass, the active ester compound is 5% by mass or less.

[2]如上述[1]記載之附支持體之樹脂薄片,其中前述無機填充材之平均粒徑為0.01~3μm。 [2] The resin sheet according to the above [1], wherein the inorganic filler has an average particle diameter of 0.01 to 3 μm.

[3]如[1]或[2]記載之附支持體之樹脂薄片,其中前述無機填充材之含量為40~90質量%。 [3] The resin sheet with a support according to [1] or [2], wherein the content of the inorganic filler is 40 to 90% by mass.

[4]如[1]~[3]中任一項記載之附支持體之樹脂薄片,其中前述無機填充材係經表面處理劑表面處理。 [4] The resin sheet with a support according to any one of [1] to [3] wherein the inorganic filler is surface-treated with a surface treatment agent.

[5]如[4]記載之附支持體之樹脂薄片,其中前述無機填充材之每單位表面積之碳量為0.02~1mg/m2[5] The resin sheet with a support according to [4], wherein the inorganic filler has a carbon amount per unit surface area of 0.02 to 1 mg/m 2 .

[6]如[1]~[5]中任一項記載之附支持體之樹脂薄片,其中前述第2層之厚度為2μm以上。 [6] The resin sheet with a support according to any one of [1] to [5] wherein the thickness of the second layer is 2 μm or more.

[7]如[1]~[6]中任一項記載之附支持體之樹脂薄片,其中將前述樹脂薄片熱硬化而形成絕緣層,該絕緣層之線熱膨脹係數為25ppm以下。 [7] The resin sheet with a support according to any one of [1] to [6] wherein the resin sheet is thermally cured to form an insulating layer having a linear thermal expansion coefficient of 25 ppm or less.

[8]如[1]~[7]中任一項記載之附支持體之樹脂薄片,其中將前述樹脂薄片熱硬化而形成絕緣層,該絕緣層之介電正接(測定頻率5.8GHz)為0.0065以下。 [8] The resin sheet with a support according to any one of [1], wherein the resin sheet is thermally cured to form an insulating layer, and the dielectric front of the insulating layer (measuring frequency: 5.8 GHz) is Below 0.0065.

[9]如[1]~[8]中任一項記載之附支持體之樹脂薄片,其中將前述樹脂薄片熱硬化而形成絕緣層,將該絕緣層表面粗化處理後之算術平均粗度(Ra)為150nm以下、均方根粗度(Rq)為220nm以下。 [9] The resin sheet with a support according to any one of [1] to [8] wherein the resin sheet is thermally cured to form an insulating layer, and the arithmetic mean roughness after roughening the surface of the insulating layer (Ra) is 150 nm or less, and the root mean square roughness (Rq) is 220 nm or less.

[10]如[1]~[9]中任一項記載之附支持體之樹脂薄片,其中將前述樹脂薄片熱硬化而形成絕緣層,將該絕緣層表 面粗化處理並鍍敷而得之導體層與該絕緣層之剝離強度為0.5kgf/cm以上。 [10] The resin sheet with a support according to any one of [1] to [9] wherein the resin sheet is thermally cured to form an insulating layer, and the insulating layer is formed. The peeling strength of the conductor layer and the insulating layer obtained by the surface roughening treatment and plating is 0.5 kgf/cm or more.

[11]如[1]~[10]中任一項記載之附支持體之樹脂薄片,其係多層印刷配線板之絕緣層用附支持體之樹脂薄片。 [11] The resin sheet with a support according to any one of [1] to [10], which is a resin sheet with a support for an insulating layer of a multilayer printed wiring board.

[12]如[1]~[11]中任一項記載之附支持體之樹脂薄片,其係多層印刷配線板之增層(build-up layer)用附支持體之樹脂薄片。 [12] The resin sheet with a support according to any one of [1] to [11], which is a resin sheet with a support for a build-up layer of a multilayer printed wiring board.

[13]一種多層印刷配線板之製造方法,其係含有(A)將[1]~[12]中任一項記載之附支持體之樹脂薄片層合於內層電路基板之單面或兩面之步驟、(B)將附支持體之樹脂薄片熱硬化而形成絕緣層之步驟、(C)對絕緣層進行開孔加工以形成通孔之步驟、(D)使支持體剝離之步驟、(E)將絕緣層表面進行粗化處理之步驟、(F)對粗化處理後之絕緣層表面鍍敷而形成導體層之步驟的多層印刷配線板之製造方法,其中前述(C)對絕緣層進行開孔加工以形成通孔之步驟中,絕緣層之通孔的頂徑(直徑)為65μm以下。 [13] A method of producing a multilayer printed wiring board, comprising: (A) laminating a resin sheet with a support according to any one of [1] to [12] on one or both sides of an inner layer circuit board; And (B) a step of thermally hardening the resin sheet with the support to form an insulating layer, (C) a step of drilling the insulating layer to form a through hole, and (D) a step of peeling the support, ( E) a method of manufacturing a multilayer printed wiring board by a step of roughening the surface of the insulating layer, and (F) a step of forming a conductor layer by plating the surface of the insulating layer after the roughening treatment, wherein the (C) pair of insulating layers In the step of performing the hole drilling to form the through hole, the top diameter (diameter) of the through hole of the insulating layer is 65 μm or less.

[14]一種半導體裝置,其特徵為使用藉由如[13]記載之方法所製造之多層印刷配線板。 [14] A semiconductor device characterized by using a multilayer printed wiring board manufactured by the method according to [13].

藉由使用一種附支持體之樹脂薄片,其特徵為具有支持體、形成於前述支持體上之特定的第1層、與 形成於前述第1層上之特定的第2層,而可提供介電正接、線熱膨脹係數雖低,但膠渣去除性、鍍敷剝離強度優良之附支持體之樹脂薄片。 By using a resin sheet with a support, which is characterized by having a support, a specific first layer formed on the support, and The specific second layer formed on the first layer can provide a resin sheet with a support which has a dielectric positive connection and a low coefficient of thermal expansion, but which has excellent slag removal property and plating peel strength.

[附支持體之樹脂薄片] [Resin sheet with support]

本發明之附支持體之樹脂薄片,其特徵為具有支持體、形成於前述支持體上之含有環氧樹脂、活性酯化合物及無機填充材的第1層、與形成於前述第1層上之含有環氧樹脂、活性酯化合物及無機填充材的第2層,以前述第1層中之不揮發成分為100質量%時,活性酯化合物為5質量%以上;以前述第2層中之不揮發成分為100質量%時,活性酯化合物為5質量%以下。再者,於第2層之露出面側,為了防止廢棄物等之附著,亦可具有保護薄膜。 The resin sheet with a support according to the present invention is characterized by comprising a support, a first layer containing an epoxy resin, an active ester compound, and an inorganic filler formed on the support, and a first layer formed on the first layer. In the second layer containing the epoxy resin, the active ester compound, and the inorganic filler, when the nonvolatile content in the first layer is 100% by mass, the active ester compound is 5% by mass or more; and the second layer is not When the volatile component is 100% by mass, the active ester compound is 5% by mass or less. Further, a protective film may be provided on the exposed surface side of the second layer in order to prevent adhesion of waste or the like.

本發明之附支持體之樹脂薄片中,藉由以第1層中之不揮發成分為100質量%時,活性酯化合物為5質量%以上,可使介電正接為低、鍍敷剝離強度成為良好。此外,藉由以第2層中之不揮發成分為100質量%時,活性酯化合物為5質量%以下,可使熱膨脹係數降低,於碳酸氣雷射加工之膠渣去除性成為良好。因此,多層印刷配線板之層間導通信賴性優良,適合作為多層印刷配線板之絕緣層用附支持體之樹脂薄片。進一步地,可更加適合地使用於作為多層印刷配線板之增層用附支持體之樹脂薄 片、或用以藉由鍍敷形成導體層之附支持體之樹脂薄片。 In the resin sheet with a support of the present invention, when the non-volatile content in the first layer is 100% by mass, the active ester compound is 5% by mass or more, the dielectric positive connection can be made low, and the plating peel strength can be made. good. In addition, when the nonvolatile content in the second layer is 100% by mass, the active ester compound is 5% by mass or less, the thermal expansion coefficient can be lowered, and the slag removal property in the carbonation laser processing is good. Therefore, the multilayer printed wiring board is excellent in interlayer communication and is suitable as a resin sheet for supporting the insulating layer of the multilayer printed wiring board. Further, it can be more suitably used as a resin thinner as a support for a build-up layer of a multilayer printed wiring board. A sheet or a resin sheet for supporting the support of the conductor layer by plating.

[支持體] [Support]

本發明之支持體,可列舉塑膠薄膜或金屬箔。具體而言,作為塑膠薄膜,較佳為聚對苯二甲酸乙二酯(以下亦有略稱為「PET」者)、聚萘二甲酸乙二酯等之聚酯、聚碳酸酯、壓克力、環狀聚烯烴、三乙醯基纖維素、硫化聚醚、聚醚酮、聚醯亞胺等。其中尤以聚對苯二甲酸乙二酯薄膜、聚萘二甲酸乙二酯薄膜較佳,特別以價格便宜的聚對苯二甲酸乙二酯薄膜為佳。金屬箔可列舉銅箔、鋁箔等。由泛用性觀點而言,較佳為塑膠薄膜,使用塑膠薄膜時,為了提高剝離性,較佳為使用與第1層接觸的面經脫模處理之支持體。脫模處理所使用之脫模劑,只要第1層可由支持體剝離則無特殊限定,可列舉例如矽系脫模劑、醇酸樹脂系脫模劑、聚烯烴樹脂、胺基甲酸酯樹脂、氟樹脂等。再者,亦可使用市售之附有脫模層之塑膠薄膜,較佳者可列舉例如具有以醇酸樹脂系脫模劑為主成分之脫模層的PET薄膜之SK-1、AL-5、AL-7(Lintec(股)製)等。又,塑膠薄膜亦可施以霧面(matte)處理、電暈處理,亦可於該處理面上形成脫模層。另一方面,金屬箔可藉由蝕刻溶液去除、亦可不去除而將該金屬箔作為導體層利用。支持體之厚度並無特殊限定,較佳為10~150μm之範圍、更佳為25~50μm之範圍。 The support of the present invention may be a plastic film or a metal foil. Specifically, as the plastic film, polyethylene terephthalate (hereinafter also referred to as "PET"), polyester such as polyethylene naphthalate, polycarbonate, and acrylic are preferable. Force, cyclic polyolefin, triacetyl cellulose, sulfurized polyether, polyether ketone, polyimine, and the like. Among them, a polyethylene terephthalate film or a polyethylene naphthalate film is preferable, and a polyethylene terephthalate film having an inexpensive price is particularly preferable. Examples of the metal foil include copper foil, aluminum foil, and the like. From the viewpoint of general use, it is preferably a plastic film. When a plastic film is used, in order to improve the peeling property, it is preferred to use a support which is subjected to mold release treatment in contact with the first layer. The release agent to be used for the release treatment is not particularly limited as long as the first layer can be peeled off from the support, and examples thereof include a oxime release agent, an alkyd resin release agent, a polyolefin resin, and a urethane resin. , fluororesin, etc. Further, a commercially available plastic film with a release layer may be used, and preferably, for example, SK-1, AL- of a PET film having a release layer containing an alkyd-based release agent as a main component. 5, AL-7 (Lintec (share) system) and so on. Further, the plastic film may be subjected to a matte treatment or a corona treatment, and a release layer may be formed on the treated surface. On the other hand, the metal foil can be used as a conductor layer by removing it with or without removing the etching solution. The thickness of the support is not particularly limited, and is preferably in the range of 10 to 150 μm, more preferably in the range of 25 to 50 μm.

具有保護薄膜的情況時,可使用與支持體同 樣的塑膠薄膜。又,亦可對保護薄膜施以霧面處理、電暈處理等之表面處理,亦可與施以與上述同樣之脫模處理。保護薄膜之厚度較佳為3~30μm。 In the case of a protective film, it can be used with the support Kind of plastic film. Further, the protective film may be subjected to a surface treatment such as matte treatment or corona treatment, or may be subjected to a release treatment similar to the above. The thickness of the protective film is preferably from 3 to 30 μm.

[樹脂組成物] [Resin composition]

本發明之第1層與第2層,係使樹脂組成物經過層形成之樹脂薄片。樹脂組成物只要係含有環氧樹脂、活性酯化合物及無機填充材,則可無特殊限制地使用。又,亦可進一步摻混熱可塑性樹脂或硬化促進劑、其他成分。以下,敘述摻混成分。 The first layer and the second layer of the present invention are resin sheets in which a resin composition is formed through a layer. The resin composition can be used without particular limitation as long as it contains an epoxy resin, an active ester compound, and an inorganic filler. Further, a thermoplastic resin, a curing accelerator, and other components may be further blended. Hereinafter, the blending component will be described.

(a)環氧樹脂 (a) Epoxy resin

本發明中使用之環氧樹脂,雖無特殊限定,但較佳為含有1分子中具有2個以上之環氧基的環氧樹脂。具體而言可列舉雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、苯酚酚醛清漆型環氧樹脂、tert-丁基-兒茶酚型環氧樹脂、萘酚型環氧樹脂、萘型環氧樹脂、伸萘基醚型環氧樹脂、環氧丙基胺型環氧樹脂、環氧丙基酯型環氧樹脂、甲酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、蒽型環氧樹脂、線狀脂肪族環氧樹脂、具有丁二烯結構之環氧樹脂、脂環式環氧樹脂、雜環式環氧樹脂、含有螺環之環氧樹脂、環己烷二甲醇型環氧樹脂、三羥甲基型環氧樹脂、鹵化環氧樹脂等。該等可使用1種或組合2種以上使用。 The epoxy resin used in the present invention is preferably an epoxy resin having two or more epoxy groups in one molecule, although it is not particularly limited. Specific examples thereof include bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, bisphenol AF type epoxy resin, phenol novolak type epoxy resin, tert-butyl- Catechol epoxy resin, naphthol epoxy resin, naphthalene epoxy resin, naphthyl ether epoxy resin, epoxypropyl amine epoxy resin, epoxypropyl ester epoxy resin, Cresol novolak type epoxy resin, biphenyl type epoxy resin, bismuth type epoxy resin, linear aliphatic epoxy resin, epoxy resin having butadiene structure, alicyclic epoxy resin, heterocyclic type Epoxy resin, epoxy resin containing spiro ring, cyclohexane dimethanol type epoxy resin, trimethylol type epoxy resin, halogenated epoxy resin, and the like. These may be used alone or in combination of two or more.

該等之中,以提高耐熱性之觀點而言,尤以雙酚A型環氧樹脂、雙酚F型環氧樹脂、萘酚型環氧樹脂、萘型環氧樹脂、聯苯型環氧樹脂、伸萘基醚型環氧樹脂、環氧丙基酯型環氧樹脂、蒽型環氧樹脂、具有丁二烯結構之環氧樹脂較佳。具體而言可列舉例如雙酚A型環氧樹脂(三菱化學(股)製「Epikote 828EL」、「YL980」)、雙酚F型環氧樹脂(三菱化學(股)製「jER806H」、「YL983U」)、萘型2官能環氧樹脂(DIC(股)製「HP4032」、「HP4032D」、「HP4032SS」、「EXA4032SS」)、萘型4官能環氧樹脂(DIC(股)製「HP4700」、「HP4710」)、萘酚型環氧樹脂(新日鐵化學(股)製「ESN-475V」)、具有丁二烯結構之環氧樹脂(Daicel化學工業(股)製「PB-3600」)、具有聯苯結構之環氧樹脂(日本化藥(股)製「NC3000H」、「NC3000L」、「NC3100」、三菱化學(股)製「YX4000」、「YX4000H」、「YX4000HK」、「YL6121」)、蒽型環氧樹脂(三菱化學(股)製「YX8800」)、伸萘基醚型環氧樹脂(DIC(股)製「EXA-7310」、「EXA-7311」、「EXA-7311L」、「EXA7311-G3」)、環氧丙基酯型環氧樹脂(Nagase ChemteX(股)製「EX711」、「EX721」、(股)Printec製「R540」)等。 Among these, in view of improving heat resistance, a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, a naphthol type epoxy resin, a naphthalene type epoxy resin, and a biphenyl type epoxy resin are particularly preferable. The resin, the naphthyl ether type epoxy resin, the epoxy propyl ester type epoxy resin, the fluorene type epoxy resin, and the epoxy resin having a butadiene structure are preferable. Specific examples thereof include bisphenol A type epoxy resin ("Epikote 828EL" manufactured by Mitsubishi Chemical Corporation, "YL980"), and bisphenol F type epoxy resin ("JER806H" manufactured by Mitsubishi Chemical Corporation", "YL983U" "), a naphthalene type bifunctional epoxy resin ("HP4032", "HP4032D", "HP4032SS", "EXA4032SS") made of DIC), a naphthalene type 4-functional epoxy resin ("HP4700" made by DIC) "HP4710"), naphthol type epoxy resin ("ESN-475V" manufactured by Nippon Steel Chemical Co., Ltd.), and epoxy resin having a butadiene structure ("PB-3600" manufactured by Daicel Chemical Industry Co., Ltd.) Epoxy resin with a biphenyl structure ("NC3000H", "NC3000L", "NC3100", "YX4000", "YX4000H", "YX4000HK", "YL6121" made by Nippon Chemical Co., Ltd. ), 蒽-type epoxy resin ("YX8800" manufactured by Mitsubishi Chemical Corporation), and naphthyl ether epoxy resin (EXA-7310, "EXA-7311", "EXA-7311L" made by DIC) "EXA7311-G3"), epoxy acrylate type epoxy resin ("AV711" manufactured by Nagase ChemteX Co., Ltd., "EX721", "R540" manufactured by Printec).

環氧樹脂藉由含有液狀環氧樹脂,可提高樹脂薄片之操作性。進一步地,較佳為合併使用液狀環氧樹 脂與固體狀環氧樹脂。作為液狀環氧樹脂,較佳為1分子中具有2個以上環氧基,且於溫度20℃為液狀之芳香族系環氧樹脂,固體狀環氧樹脂,較佳為1分子中具有3個以上環氧基,且於溫度20℃為固體狀之芳香族系環氧樹脂。再者,本發明中所指的芳香族系環氧樹脂,意指於其分子內具有芳香環結構之環氧樹脂。作為環氧樹脂,合併使用液狀環氧樹脂與固體狀環氧樹脂時,就具備樹脂組成物之硬化物性之平衡的觀點而言,其摻混比例(液狀環氧樹脂:固體狀環氧樹脂)以質量比計較佳為1:0.1~1:2之範圍、更佳為1:0.3~1:1.8之範圍、又更佳為1:0.6~1:1.5之範圍。 The epoxy resin can improve the handleability of the resin sheet by containing a liquid epoxy resin. Further, it is preferred to use a liquid epoxy tree in combination Grease and solid epoxy resin. The liquid epoxy resin is preferably an aromatic epoxy resin having two or more epoxy groups in one molecule and being liquid at a temperature of 20 ° C, and preferably has a solid epoxy resin in one molecule. An aromatic epoxy resin having three or more epoxy groups and being solid at a temperature of 20 ° C. Further, the aromatic epoxy resin referred to in the present invention means an epoxy resin having an aromatic ring structure in its molecule. When a liquid epoxy resin and a solid epoxy resin are used in combination as an epoxy resin, the blending ratio (liquid epoxy resin: solid epoxy) is obtained from the viewpoint of the balance of the cured physical properties of the resin composition. The resin is preferably in the range of 1:0.1 to 1:2, more preferably in the range of 1:0.3 to 1:1.8, and still more preferably in the range of 1:0.6 to 1:1.5.

液狀環氧樹脂較佳為雙酚A型環氧樹脂、雙酚F型環氧樹脂、苯酚酚醛清漆型環氧樹脂、環氧丙基酯型環氧樹脂、萘型環氧樹脂;更佳為雙酚A型環氧樹脂、雙酚F型環氧樹脂、萘型環氧樹脂。該等可使用1種或組合2種以上使用。固體狀環氧樹脂較佳為4官能萘型環氧樹脂、甲酚酚醛清漆型環氧樹脂、二環戊二烯型環氧樹脂、三酚環氧樹脂、萘酚型環氧樹脂、蒽型環氧樹脂、聯苯型環氧樹脂、伸萘基醚型環氧樹脂;更佳為萘酚型環氧樹脂、聯苯型環氧樹脂。該等可使用1種或組合2種以上使用。 The liquid epoxy resin is preferably a bisphenol A epoxy resin, a bisphenol F epoxy resin, a phenol novolak epoxy resin, a epoxy propyl ester epoxy resin, or a naphthalene epoxy resin; It is a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, and a naphthalene type epoxy resin. These may be used alone or in combination of two or more. The solid epoxy resin is preferably a 4-functional naphthalene type epoxy resin, a cresol novolac type epoxy resin, a dicyclopentadiene type epoxy resin, a trisphenol epoxy resin, a naphthol type epoxy resin, or a quinoid type. Epoxy resin, biphenyl type epoxy resin, and naphthyl ether type epoxy resin; more preferably naphthol type epoxy resin, biphenyl type epoxy resin. These may be used alone or in combination of two or more.

環氧樹脂之含量,就降低樹脂薄片之硬化物的線熱膨脹係數之觀點而言,以第1層中之不揮發成分為100質量%時,較佳為3~40質量%、更佳為5~30質量%、 又更佳為7~20質量%。第2層亦以同樣範圍較佳。 The content of the epoxy resin is preferably from 3 to 40% by mass, more preferably from 3 to 40% by mass, more preferably from 5 to 40% by mass in terms of the non-volatile content in the first layer, from the viewpoint of lowering the linear thermal expansion coefficient of the cured product of the resin sheet. ~30% by mass, More preferably, it is 7 to 20% by mass. The second layer is also preferably in the same range.

(b)活性酯化合物 (b) Active ester compound

本發明中使用之活性酯化合物,係1分子中具有1個以上活性酯基之化合物。活性酯化合物可與環氧樹脂等反應,較佳為1分子中具有2個以上活性酯基之化合物。一般而言,較佳可使用酚酯類、硫酚酯類、N-羥基胺酯類、雜環羥基化合物之酯類等於1分子中具有2個以上反應活性高的酯基之化合物。 The active ester compound used in the present invention is a compound having one or more active ester groups in one molecule. The active ester compound can be reacted with an epoxy resin or the like, and is preferably a compound having two or more active ester groups in one molecule. In general, a compound having a phenol ester, a thiophenol ester, an N-hydroxylamine, or a heterocyclic hydroxy compound is preferably used, which has two or more ester groups having a high reactivity.

由提高耐熱性之觀點而言,更佳為由使羧酸化合物及/或硫代羧酸化合物、與羥基化合物及/或硫醇化合物進行縮合反應者所得之活性酯化合物。而又更佳為由使羧酸化合物與由酚化合物、萘酚化合物、硫醇化合物中選擇之1種或2種以上反應者所得之活性酯化合物。而又再更佳為由使羧酸化合物與具有酚性羥基之芳香族化合物反應者所得之於1分子中具有2個以上活性酯基之芳香族化合物。而又再更佳為由使1分子中具有至少2個以上之羧酸的化合物、與具有酚性羥基之芳香族化合物反應者所得之芳香族化合物,且該芳香族化合物之1分子中具有2個以上之活性酯基的芳香族化合物。又,直鏈狀或多分支狀均可。又,1分子中具有至少2個以上之羧酸的化合物若為含有脂肪族鏈的化合物,則與樹脂組成物之相溶性可增高,若為具有芳香族環之化合物,則可使耐熱性增高。 From the viewpoint of improving heat resistance, an active ester compound obtained by subjecting a carboxylic acid compound and/or a thiocarboxylic acid compound to a condensation reaction with a hydroxy compound and/or a thiol compound is more preferable. Further, it is more preferably an active ester compound obtained by reacting a carboxylic acid compound with one or more selected from the group consisting of a phenol compound, a naphthol compound, and a thiol compound. Further, it is more preferably an aromatic compound having two or more active ester groups in one molecule obtained by reacting a carboxylic acid compound with an aromatic compound having a phenolic hydroxyl group. Further, it is more preferably an aromatic compound obtained by reacting a compound having at least two or more carboxylic acids in one molecule with an aromatic compound having a phenolic hydroxyl group, and having 2 in one molecule of the aromatic compound More than one active ester group aromatic compound. Further, it may be linear or multi-branched. In addition, when a compound having at least two or more carboxylic acids in one molecule is a compound containing an aliphatic chain, the compatibility with the resin composition can be increased, and if it is a compound having an aromatic ring, heat resistance can be increased. .

羧酸化合物具體而言可列舉安息香酸、乙 酸、琥珀酸、馬來酸、伊康酸、鄰苯二甲酸、間苯二甲酸、對苯二甲酸、苯均四酸等。其中以耐熱性的觀點而言尤以琥珀酸、馬來酸、伊康酸、鄰苯二甲酸、間苯二甲酸、對苯二甲酸較佳;更佳為間苯二甲酸、對苯二甲酸。硫代羧酸化合物具體而言可列舉硫代乙酸、硫代安息香酸等。 Specific examples of the carboxylic acid compound include benzoic acid and B. Acid, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, terephthalic acid, pyromellitic acid, and the like. Among them, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, and terephthalic acid are preferred from the viewpoint of heat resistance; more preferably, isophthalic acid or terephthalic acid . Specific examples of the thiocarboxylic acid compound include thioacetic acid, thiobenzoic acid, and the like.

酚化合物或萘酚化合物具體而言可列舉氫醌、間苯二酚、雙酚A、雙酚F、雙酚S、酚酞、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、酚、o-甲酚、m-甲酚、p-甲酚、兒茶酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚、苯三酚、二環戊二烯基二酚、苯酚酚醛清漆等。其中以提高耐熱性、提高溶解性之觀點而言,尤以雙酚A、雙酚F、雙酚S、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、兒茶酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚、苯三酚、二環戊二烯基二酚、苯酚酚醛清漆較佳;更佳為兒茶酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚、苯三酚、二環戊二烯基二酚、苯酚酚醛清漆;又更佳為1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、二環戊二烯基二酚、苯酚酚醛清漆;又再更 佳為1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二環戊二烯基二酚、苯酚酚醛清漆;又再更佳為1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二環戊二烯基二酚;特佳為二環戊二烯基二酚。硫醇化合物具體而言可列舉苯二硫醇、三嗪二硫醇等。活性酯化合物可使用1種或合併使用2種以上。 Specific examples of the phenol compound or the naphthol compound include hydroquinone, resorcin, bisphenol A, bisphenol F, bisphenol S, phenolphthalein, methylated bisphenol A, methylated bisphenol F, and methylation. Bisphenol S, phenol, o-cresol, m-cresol, p-cresol, catechol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene , 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, phloroglucinol, benzenetriol, dicyclopentadienyl diphenol, phenol novolac Varnish, etc. Among them, in view of improving heat resistance and improving solubility, bisphenol A, bisphenol F, bisphenol S, methylated bisphenol A, methylated bisphenol F, methylated bisphenol S, and children are especially used. Tea phenol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone , tetrahydroxybenzophenone, phloroglucinol, benzenetriol, dicyclopentadienyl diphenol, phenol novolak lacquer; more preferably catechol, 1,5-dihydroxynaphthalene, 1,6 -dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, phloroglucinol, benzenetriol, dicyclopentadienyl Phenol, phenol novolac; more preferably 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxyl Benzophenone, dicyclopentadienyl diphenol, phenol novolac; Preferred is 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dicyclopentadienyl diphenol, phenol novolac; and more preferably 1,5-dihydroxy Naphthalene, 1,6-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dicyclopentadienyl diphenol; particularly preferably dicyclopentadienyl diphenol. Specific examples of the thiol compound include benzenedithiol and triazinedithiol. The active ester compound may be used alone or in combination of two or more.

具體而言,較佳為含有二環戊二烯基二酚結構之活性酯化合物、含有萘結構之活性酯化合物、含有苯酚酚醛清漆之乙醯基化物之活性酯化合物、含有苯酚酚醛清漆之苄醯基化物之活性酯化合物,其中尤更佳為含有萘結構之活性酯化合物、含有二環戊二烯基二酚結構之活性酯化合物。作為市售品,含有二環戊二烯基二酚結構之活性酯化合物可列舉EXB9451、EXB9460、EXB9460S、HPC-8000-65T(DIC(股)製);含有萘結構之活性酯化合物可列舉EXB9416-70BK(DIC(股)製);含有苯酚酚醛清漆之乙醯基化物之活性酯化合物可列舉DC808(三菱化學(股)製);含有苯酚酚醛清漆之苄醯基化物之活性酯化合物可列舉YLH1026(三菱化學(股)製)等。 Specifically, it is preferably an active ester compound containing a dicyclopentadienyl diphenol structure, an active ester compound containing a naphthalene structure, an active ester compound containing an acetyl phenol aldehyde varnish, and a benzyl group containing a phenol novolak. The active ester compound of a mercapto compound is more preferably an active ester compound containing a naphthalene structure or an active ester compound containing a dicyclopentadienyl diphenol structure. Examples of the active ester compound containing a dicyclopentadienyl diphenol structure include EXB9451, EXB9460, EXB9460S, and HPC-8000-65T (manufactured by DIC); and an active ester compound containing a naphthalene structure can be cited as EXB9416. -70BK (manufactured by DIC Co., Ltd.); an active ester compound containing an acetohydrin of a phenol novolak; DC 808 (manufactured by Mitsubishi Chemical Corporation); and an active ester compound containing a benzyl sulfonate of a phenol novolak; YLH1026 (Mitsubishi Chemical Co., Ltd.) and so on.

就降低介電正接、提高鍍敷剝離強度的觀點,進而就即使在附支持體之狀態下熱硬化時亦可發揮充分的剝離強度之觀點而言,第1層中之不揮發成分為100質量%時,第1層中所含之活性酯化合物的含量為5質量%以上、較佳為5~30質量%、更佳為5~25質量%、又更佳為5~20質量%。另一方面,就降低線熱膨脹係數,使 於碳酸氣雷射加工之膠渣去除性成為良好的觀點而言,第2層中之不揮發成分為100質量%時,第2層中所含之活性酯化合物的含量為5質量%以下、較佳為0~5質量%、更佳為0.5~5質量%、又更佳為1~4質量%。 From the viewpoint of reducing the dielectric positive connection and improving the plating peel strength, the non-volatile content in the first layer is 100 mass from the viewpoint of exhibiting sufficient peel strength even when thermally cured in the state of the support. In the case of %, the content of the active ester compound contained in the first layer is 5% by mass or more, preferably 5 to 30% by mass, more preferably 5 to 25% by mass, still more preferably 5 to 20% by mass. On the other hand, reduce the linear thermal expansion coefficient so that When the amount of the non-volatile component in the second layer is 100% by mass, the content of the active ester compound contained in the second layer is 5% by mass or less, and the amount of the non-volatile component in the second layer is preferably 5% by mass or less. It is preferably 0 to 5% by mass, more preferably 0.5 to 5% by mass, still more preferably 1 to 4% by mass.

又,以(a)環氧樹脂之環氧基數為1時,就提高硬化物之機械特性的觀點而言,(b)活性酯化合物之反應基數較佳為0.2~2、更佳為0.3~1.5、又更佳為0.4~1。此處,「環氧樹脂之環氧基數」,意指將樹脂組成物中存在之各環氧樹脂的固體成分質量除以環氧當量之值再針對全部之環氧樹脂合計後的值。又,「反應基」意指可與環氧基反應之官能基,「反應基數」,意指將樹脂組成物中存在之活性酯化合物的固體成分質量除以反應基當量之值予以全部合計後之值。 Further, when the number of epoxy groups of the (a) epoxy resin is 1, the number of reactive groups of the (b) active ester compound is preferably 0.2 to 2, more preferably 0.3 to the viewpoint of improving the mechanical properties of the cured product. 1.5, and more preferably 0.4~1. Here, the "epoxy group number of epoxy resin" means a value obtained by dividing the solid content of each epoxy resin present in the resin composition by the value of the epoxy equivalent and then totaling the total epoxy resin. Further, the "reactive group" means a functional group reactive with an epoxy group, and the "number of reactive groups" means that the total mass of the solid component of the active ester compound present in the resin composition is divided by the value of the reactive group equivalent. The value.

(c)無機填充材 (c) Inorganic filler

本發明中使用之無機填充材,可列舉例如二氧化矽、氧化鋁、雲母、雲母、矽酸鹽、硫酸鋇、氫氧化鎂、氧化鈦等,較佳為二氧化矽、氧化鋁,特佳為不定形二氧化矽、熔融二氧化矽、結晶二氧化矽、合成二氧化矽、中空二氧化矽、球狀二氧化矽等之二氧化矽,尤以球狀二氧化矽、熔融二氧化矽為佳。由提高對樹脂薄片之填充性的觀點而言,更佳為球狀熔融二氧化矽。該等可使用1種或2種以上。作為市售之球狀熔融二氧化矽,可列舉(股)Admatechs製「SOC2」、「SOC1」。 The inorganic filler used in the present invention may, for example, be cerium oxide, aluminum oxide, mica, mica, cerium sulphate, barium sulfate, magnesium hydroxide or titanium oxide, preferably cerium oxide or aluminum oxide. It is amorphous cerium oxide, molten cerium oxide, crystalline cerium oxide, synthetic cerium oxide, hollow cerium oxide, spherical cerium oxide, etc., especially spherical cerium oxide, molten cerium oxide. It is better. From the viewpoint of improving the filling property of the resin sheet, it is more preferable to be spherical molten cerium oxide. These may be used alone or in combination of two or more. As a commercially available spherical molten cerium oxide, "SOC2" and "SOC1" manufactured by Admatechs can be cited.

無機填充材之平均粒徑雖無特殊限定,但就對絕緣層上形成微細配線之觀點、使無機填充材之總表面積增大藉以抑制開孔加工時之膠渣產生的觀點而言,較佳為3μm以下、更佳為2μm以下、又更佳為1μm以下、又再更佳為0.8μm以下、又特別更佳為0.6μm以下。另一方面,將樹脂組成物作為清漆時,就使清漆黏度上昇、防止操作性降低之觀點而言,較佳為0.01μm以上、更佳為0.03μm以上、又更佳為0.07μm以上、又再更佳為0.1μm以上。上述無機填充材之平均粒徑,可藉由基於米氏(Mie)散射理論之雷射繞射.散射法來測定。具體而言,可藉由雷射繞射散射式粒度分布測定裝置,以體積基準作成無機填充材之粒度分布,以其中位直徑為平均粒徑來測定。測定樣品較佳可使用將無機填充材以超音波分散於水中者。雷射繞射散射式粒度分布測定裝置,可使用(股)堀場製作所製LA-950等。 Although the average particle diameter of the inorganic filler is not particularly limited, it is preferable from the viewpoint of forming fine wiring on the insulating layer and increasing the total surface area of the inorganic filler to suppress generation of slag during the drilling process. It is 3 μm or less, more preferably 2 μm or less, still more preferably 1 μm or less, still more preferably 0.8 μm or less, and still more preferably 0.6 μm or less. On the other hand, when the resin composition is used as a varnish, it is preferably 0.01 μm or more, more preferably 0.03 μm or more, still more preferably 0.07 μm or more, from the viewpoint of increasing the viscosity of the varnish and preventing the workability from being lowered. More preferably, it is 0.1 μm or more. The average particle diameter of the above inorganic filler can be obtained by laser diffraction based on the Mie scattering theory. Determine by scattering method. Specifically, the particle size distribution of the inorganic filler can be determined on a volume basis by a laser diffraction scattering type particle size distribution measuring apparatus, and the median diameter is measured as an average particle diameter. As the measurement sample, those in which the inorganic filler is dispersed in water by ultrasonic waves can be preferably used. For the laser diffraction scattering type particle size distribution measuring apparatus, LA-950 or the like manufactured by Horiba, Ltd. can be used.

無機填充材之含量雖無特殊限制,但就防止薄片形態之可撓性降低的觀點而言,第1層中之不揮發成分為100質量%時,較佳為90質量%以下、更佳為85質量%以下、又更佳為80質量%以下。第2層亦以同樣範圍較佳。又,就降低絕緣層之熱膨脹率觀點、使無機填充材之總表面積增大而抑制開孔加工時之膠渣產生,粗化處理時容易去除膠渣之觀點而言,第1層中之不揮發成分為100質量%時,較佳為40質量%以上、更佳為50質量%以上、又更佳為60質量%以上、又再更佳為65質量%以 上。第2層亦以同樣範圍較佳。 The content of the inorganic filler is not particularly limited, but when the non-volatile content in the first layer is 100% by mass, it is preferably 90% by mass or less, more preferably, from the viewpoint of preventing the flexibility of the sheet form from being lowered. It is 85 mass% or less, and more preferably 80 mass% or less. The second layer is also preferably in the same range. Further, from the viewpoint of lowering the thermal expansion coefficient of the insulating layer, increasing the total surface area of the inorganic filler, and suppressing generation of slag during the drilling process, it is easy to remove the slag during the roughening treatment, and the first layer is not When the volatile component is 100% by mass, it is preferably 40% by mass or more, more preferably 50% by mass or more, still more preferably 60% by mass or more, and still more preferably 65% by mass. on. The second layer is also preferably in the same range.

無機填充材,為了提高耐濕性、提高分散性,較佳為經表面處理劑表面處理者。表面處理劑較佳為由環氧基矽烷系偶合劑、胺基矽烷系偶合劑、巰基矽烷系偶合劑、矽烷系偶合劑、有機矽氮烷化合物、鈦酸酯系偶合劑中選擇之1種以上。該等之中,尤以胺基矽烷系偶合劑,耐濕性、分散性、硬化物之特性等優良而較佳。作為市售品,可列舉信越化學工業(股)製「KBM403」(3-環氧丙氧基丙基三甲氧基矽烷)、信越化學工業(股)製「KBM803」(3-巰基丙基三甲氧基矽烷)、信越化學工業(股)製「KBE903」(3-胺基丙基三乙氧基矽烷)、信越化學工業(股)製「KBM573」(N-苯基-3-胺基丙基三甲氧基矽烷)、信越化學工業(股)製「KBM103」(苯基三甲氧基矽烷)、信越化學工業(股)製「SZ-31」(六甲基二矽氮烷)等。 In order to improve moisture resistance and to improve dispersibility, the inorganic filler is preferably a surface treatment agent. The surface treatment agent is preferably one selected from the group consisting of an epoxy decane coupling agent, an amino decane coupling agent, a mercapto decane coupling agent, a decane coupling agent, an organic decazane compound, and a titanate coupling agent. the above. Among these, an amine-based decane coupling agent is preferable because it is excellent in moisture resistance, dispersibility, and properties of a cured product. As a commercial product, "KBM403" (3-glycidoxypropyltrimethoxydecane) manufactured by Shin-Etsu Chemical Co., Ltd., and "KBM803" (3-mercaptopropyltrimethyl) manufactured by Shin-Etsu Chemical Co., Ltd. "Ketamine" (Ketamine) "KBE903" (3-aminopropyltriethoxydecane), Shin-Etsu Chemical Co., Ltd. "KBM573" (N-phenyl-3-aminopropyl) "Methyl methoxy decane", "KBM103" (phenyl trimethoxy decane) manufactured by Shin-Etsu Chemical Co., Ltd., and "SZ-31" (hexamethyldioxane) manufactured by Shin-Etsu Chemical Co., Ltd.

又,經表面處理劑表面處理之無機填充材,可測定以溶劑(例如,甲基乙基酮)洗淨處理後無機填充材之每單位表面積的碳量。具體而言,係將作為溶劑充分量的MEK添加於經表面處理劑表面處理之無機填充材中,於25℃超音波洗淨5分鐘。去除上清液,將固體成分乾燥後,可使用碳分析計測定無機填充材之每單位表面積之碳量。碳分析計可使用堀場製作所製「EMIA-320V」等。 Further, the amount of carbon per unit surface area of the inorganic filler after washing with a solvent (for example, methyl ethyl ketone) can be measured by the inorganic filler surface-treated with the surface treatment agent. Specifically, a sufficient amount of MEK as a solvent was added to the inorganic filler surface-treated with a surface treatment agent, and ultrasonically washed at 25 ° C for 5 minutes. After removing the supernatant and drying the solid component, the amount of carbon per unit surface area of the inorganic filler can be measured using a carbon analyzer. For the carbon analyzer, "EMIA-320V" manufactured by Horiba, Ltd. can be used.

無機填充材之每單位表面積之碳量,就提高 無機填充材之分散性的觀點,較佳為0.02mg/m2以上、更佳為0.1mg/m2以上、又更佳為0.2mg/m2以上。另一方面,就防止樹脂清漆之熔融黏度或於薄膜形態之熔融黏度上昇的觀點而言,較佳為1mg/m2以下、更佳為0.8mg/m2以下、又更佳為0.5mg/m2以下。 The amount of carbon per unit surface area of the inorganic filler is preferably 0.02 mg/m 2 or more, more preferably 0.1 mg/m 2 or more, and still more preferably 0.2 mg/m from the viewpoint of improving the dispersibility of the inorganic filler. 2 or more. On the other hand, from the viewpoint of preventing the melt viscosity of the resin varnish or the melt viscosity of the film form from increasing, it is preferably 1 mg/m 2 or less, more preferably 0.8 mg/m 2 or less, still more preferably 0.5 mg/ Below m 2 .

(d)熱可塑性樹脂 (d) Thermoplastic resin

熱可塑性樹脂可列舉例如苯氧基樹脂、聚乙烯縮醛樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚碸樹脂、及聚碸樹脂等,較佳為苯氧基樹脂、聚乙烯縮醛樹脂。熱可塑性樹脂可1種單獨使用、或合併使用2種以上。 The thermoplastic resin may, for example, be a phenoxy resin, a polyvinyl acetal resin, a polyimide resin, a polyamidoximine resin, a polyether oxime resin, or a polyfluorene resin, and is preferably a phenoxy resin. Polyethylene acetal resin. The thermoplastic resin may be used alone or in combination of two or more.

熱可塑性樹脂之以聚苯乙烯換算的重量平均分子量,較佳為8000~70000之範圍、更佳為10000~60000之範圍、又更佳為20000~60000之範圍。熱可塑性樹脂之以聚苯乙烯換算的重量平均分子量,係以凝膠滲透層析(GPC)法測定。具體而言,熱可塑性樹脂之以聚苯乙烯換算的重量平均分子量,可使用(股)島津製作所製LC-9A/RID-6A作為測定裝置、使用昭和電工(股)製Shodex K-800P/K-804L/K-804L作為管柱、使用氯仿等作為移動相,於管柱溫度40℃測定,使用標準聚苯乙烯之校準曲線算出。 The weight average molecular weight of the thermoplastic resin in terms of polystyrene is preferably in the range of 8,000 to 70,000, more preferably in the range of 10,000 to 60,000, still more preferably in the range of 20,000 to 60,000. The weight average molecular weight in terms of polystyrene of the thermoplastic resin is measured by a gel permeation chromatography (GPC) method. Specifically, in the polystyrene-equivalent weight average molecular weight of the thermoplastic resin, LC-9A/RID-6A manufactured by Shimadzu Corporation can be used as a measuring device, and Shodex K-800P/K manufactured by Showa Denko Co., Ltd. can be used. The -804L/K-804L was used as a mobile column as a mobile phase, and was measured at a column temperature of 40 ° C using a calibration curve of standard polystyrene.

苯氧基樹脂較佳為具有由雙酚A骨架、雙酚F骨架、雙酚S骨架、雙酚苯乙酮骨架、酚醛清漆骨架、聯苯骨架、茀骨架、二環戊二烯骨架、降莰烯骨架、萘骨 架、蒽骨架、金剛烷骨架、萜烯骨架、及三甲基環己烷骨架中選擇之1種以上的骨架之苯氧基樹脂。苯氧基樹脂之末端可為酚性羥基、環氧基等之任意的官能基。苯氧基樹脂可1種單獨使用、或合併使用2種以上。苯氧基樹脂之具體例,可列舉三菱化學(股)製「1256」、「4250」(均為含有雙酚A骨架之苯氧基樹脂)、「YX8100」(含有雙酚S骨架之苯氧基樹脂)、「YX6954」(含有雙酚苯乙酮骨架之苯氧基樹脂)、「YL7553」(含有茀骨架之苯氧基樹脂)、東都化成(股)製「FX280」、「FX293」、三菱化學(股)製「YL6794」、「YL7213」、「YL7290」、「YL7482」等。 The phenoxy resin preferably has a bisphenol A skeleton, a bisphenol F skeleton, a bisphenol S skeleton, a bisphenol acetophenone skeleton, a novolac skeleton, a biphenyl skeleton, an anthracene skeleton, a dicyclopentadiene skeleton, and a phenanthrene skeleton. Terpene skeleton, naphthalene bone A phenoxy resin having at least one selected from the group consisting of a framework, an anthracene skeleton, an adamantane skeleton, a terpene skeleton, and a trimethylcyclohexane skeleton. The terminal of the phenoxy resin may be any functional group such as a phenolic hydroxyl group or an epoxy group. The phenoxy resin may be used alone or in combination of two or more. Specific examples of the phenoxy resin include "1256" and "4250" (all are phenoxy resins containing a bisphenol A skeleton) and "YX8100" (a phenoxy group containing a bisphenol S skeleton) manufactured by Mitsubishi Chemical Corporation. "Base resin", "YX6954" (phenoxy resin containing bisphenol acetophenone skeleton), "YL7553" (phenoxy resin containing anthracene skeleton), "FX280" and "FX293" manufactured by Toho Chemical Co., Ltd. Mitsubishi Chemical Corporation's "YL6794", "YL7213", "YL7290" and "YL7482".

聚乙烯縮醛樹脂之具體例可列舉電氣化學工業(股)製之電化Butyral 4000-2、5000-A、6000-C、6000-EP、積水化學工業(股)製之S-LEC BH系列、BX系列、KS系列、BL系列、BM系列等。 Specific examples of the polyvinyl acetal resin include an electrochemically charged Butyral 4000-2, 5000-A, 6000-C, 6000-EP, and S-LEC BH series manufactured by Sekisui Chemical Industry Co., Ltd. BX series, KS series, BL series, BM series, etc.

熱可塑性樹脂之含量,較佳相對於第1層中之不揮發成分100質量%,為0.5~15質量%。第2層亦以同樣之範圍較佳。 The content of the thermoplastic resin is preferably from 0.5 to 15% by mass based on 100% by mass of the nonvolatile component in the first layer. The second layer is also preferably in the same range.

(e)硬化促進劑 (e) hardening accelerator

硬化促進劑可列舉例如有機膦化合物、咪唑化合物、胺加成物化合物、及3級胺化合物等。以環氧樹脂與活性酯化合物之不揮發成分合計為100質量%時,硬化促進劑之含量,較佳為於0.01~3質量%之範圍使用。硬化促進劑 可1種單獨使用、或合併使用2種以上。 Examples of the hardening accelerator include an organic phosphine compound, an imidazole compound, an amine adduct compound, and a tertiary amine compound. When the total amount of the non-volatile components of the epoxy resin and the active ester compound is 100% by mass, the content of the curing accelerator is preferably in the range of 0.01 to 3% by mass. Hardening accelerator These may be used alone or in combination of two or more.

本案發明之樹脂組成物中,亦可進一步適當摻混酚樹脂、氰酸酯樹脂、苯并噁嗪樹脂等之硬化劑;磷系化合物、氫氧化金屬物等之阻燃劑;矽粉末、耐綸粉末、氟粉末、橡膠粒子等之有機填充劑;有機溶劑、添加劑等。 In the resin composition of the invention of the present invention, a curing agent such as a phenol resin, a cyanate resin or a benzoxazine resin; a flame retardant such as a phosphorus compound or a metal hydroxide; Organic fillers such as rayon powder, fluorine powder, and rubber particles; organic solvents, additives, and the like.

本發明之樹脂組成物,係將上述成分適當混合,又,亦可依需要藉由三輥、球磨機、珠磨機、混砂機等之混練手段、或超級混合器、行星式混合器等攪拌手段來混練或混合,以製造為樹脂清漆。 The resin composition of the present invention may be suitably mixed with the above components, or may be stirred by a three-roller, a ball mill, a bead mill, a sand mixer or the like, or a super mixer or a planetary mixer as needed. Means to mix or mix to make a resin varnish.

[第1層] [Layer 1]

本案發明之第1層,可作為層形成樹脂組成物於支持體上的樹脂組成物層而製作。樹脂組成物層,可藉由例如調製含有有機溶劑之樹脂組成物,於支持體上塗佈該樹脂組成物並乾燥、加熱藉以形成樹脂組成物層。乾燥、加熱條件可於80~170℃且1~60分鐘之範圍適當設定,較佳為80~130℃且1~30分鐘。 The first layer of the invention of the present invention can be produced as a resin composition layer on which a resin composition is formed on a support. The resin composition layer can be formed by, for example, preparing a resin composition containing an organic solvent, coating the resin composition on a support, and drying and heating to form a resin composition layer. The drying and heating conditions can be appropriately set in the range of 80 to 170 ° C and 1 to 60 minutes, preferably 80 to 130 ° C and 1 to 30 minutes.

為了使樹脂薄片之介電正接降低、提高鍍敷剝離強度,第1層之厚度較佳為2μm以上、更佳為2~50μm、又更佳為4~35μm。 In order to lower the dielectric continuity of the resin sheet and to improve the plating peel strength, the thickness of the first layer is preferably 2 μm or more, more preferably 2 to 50 μm, still more preferably 4 to 35 μm.

[第2層] [Layer 2]

本案發明之第2層,可作為層形成樹脂組成物於第1 層上之樹脂組成物層而製作。乾燥條件等可與第1層同樣方式適當設定。 The second layer of the invention of the present invention can be used as a layer forming resin composition in the first It is produced by the resin composition layer on the layer. Drying conditions and the like can be appropriately set in the same manner as in the first layer.

為了使樹脂薄片之熱膨脹係數降低、提高膠渣去除性,第2層之厚度較佳為2μm以上、更佳為2~50μm、又更佳為4~35μm。 In order to lower the thermal expansion coefficient of the resin sheet and improve the slag removal property, the thickness of the second layer is preferably 2 μm or more, more preferably 2 to 50 μm, still more preferably 4 to 35 μm.

[附支持體之樹脂薄片之製作方法] [Manufacturing method of resin sheet with support]

附支持體之樹脂薄片之製作方法,可使用各種方法。例如,可於支持體上形成第1層之樹脂組成物層,且於其上塗佈樹脂組成物並乾燥藉以形成第2層之樹脂組成物層。又,亦可列舉分別製作於支持體上形成有第1層之樹脂組成物層者、於別的支持體上形成有第2層之樹脂組成物層者後,將各自的樹脂組成物層面藉由疊層而貼合的方法。藉由疊層而貼合時之條件,較佳為疊層溫度70~110℃、疊層時間5~30秒、疊層壓力1~10kgf/cm2。又,亦可一邊於支持體上塗佈樹脂組成物,同時於其上塗佈別的樹脂組成物,之後使其乾燥,以同時製成第1層與第2層。 Various methods can be used for the method of producing the resin sheet with the support. For example, a resin composition layer of the first layer may be formed on a support, and a resin composition may be applied thereon and dried to form a resin composition layer of the second layer. Further, in the case where the resin composition layer of the first layer is formed on the support, and the resin composition layer of the second layer is formed on the other support, the resin composition layer is borrowed. A method of bonding by lamination. The conditions for lamination by lamination are preferably a lamination temperature of 70 to 110 ° C, a lamination time of 5 to 30 seconds, and a lamination pressure of 1 to 10 kgf/cm 2 . Further, the resin composition may be applied to the support, and another resin composition may be applied thereon, and then dried to form the first layer and the second layer simultaneously.

第1層與第2層之厚度的比,可依照必要之性能作適當設定,較佳為1:9~9:1、更加為3:7~7:3。 The ratio of the thickness of the first layer to the second layer can be appropriately set according to the necessary performance, and is preferably 1:9 to 9:1 and more preferably 3:7 to 7:3.

[使用了附支持體之樹脂薄片的多層印刷配線板] [Multilayer printed wiring board using a resin sheet with a support]

以下,詳述使用了本發明之附支持體之樹脂薄片的多 層印刷配線板之製造方法的一例。 Hereinafter, the details of the resin sheet using the support of the present invention will be described in detail. An example of a method of manufacturing a layer printed wiring board.

本發明之多層印刷配線板之製造方法中,可包含(A)將附支持體之樹脂薄片層合於內層電路基板之單面或兩面之步驟、(B)將附支持體之樹脂薄片熱硬化而形成絕緣層之步驟、(C)對絕緣層進行開孔加工以形成通孔之步驟、(D)使支持體剝離之步驟、(E)將絕緣層表面進行粗化處理之步驟、(F)對粗化處理後之絕緣層表面鍍敷而形成導體層之步驟等。 The method for producing a multilayer printed wiring board according to the present invention may comprise (A) a step of laminating a resin sheet with a support on one side or both sides of the inner layer circuit substrate, and (B) heating the resin sheet with the support. a step of hardening to form an insulating layer, (C) a step of performing an opening process on the insulating layer to form a through hole, (D) a step of peeling off the support, and (E) a step of roughening the surface of the insulating layer, ( F) a step of forming a conductor layer by plating the surface of the insulating layer after the roughening treatment.

(A)將附支持體之樹脂薄片層合於內層電路基板之單面或兩面之步驟((A)步驟)中,以附支持體之樹脂薄片之第2層作為內層電路基板側,層合於內層電路基板之單面或兩面。此處所指的內層電路基板,係指於玻璃環氧基板、金屬基板、聚酯基板、聚醯亞胺基板、BT樹脂基板、熱硬化型聚苯醚基板之單面或兩面具有經圖型加工之(形成有電路之)導體層,於製造多層印刷配線板時,進一步應形成絕緣層及導體層之中間製造物。再者就提高絕緣層與內層電路基板之密合性的觀點,導體層表面較佳為藉由黑化處理等而預先施以粗化處理。 (A) a step of laminating a resin sheet with a support on one or both sides of the inner layer circuit board (step (A)), and using the second layer of the resin sheet with the support as the inner layer circuit substrate side, Laminated on one or both sides of the inner circuit board. The inner layer circuit substrate as used herein refers to a pattern on one or both sides of a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, or a thermosetting polyphenylene ether substrate. The processed (formed circuit) conductor layer further forms an intermediate product of the insulating layer and the conductor layer when manufacturing the multilayer printed wiring board. Further, from the viewpoint of improving the adhesion between the insulating layer and the inner layer circuit board, the surface of the conductor layer is preferably subjected to a roughening treatment in advance by a blackening treatment or the like.

(A)步驟中,附支持體之樹脂薄片具有保護薄膜時,係將該保護薄膜去除後,依需要將附支持體之樹脂薄片及內層電路基板預熱,一邊將附支持體之樹脂薄片加壓及加熱,同時壓合於內層電路基板。本發明之附支持體之樹脂薄片,適合使用藉由真空疊層法於減壓下層合於電路基板之方法。疊層之條件並無特殊限定,例如,壓合 溫度(疊層溫度)較佳為70~140℃、壓合壓力(疊層壓力)較佳為1~11kgf/cm2(9.8×104~107.9×104N/m2)、壓合時間(疊層時間)較佳為5~180秒,於空氣壓20mmHg(26.7hPa)以下之減壓下疊層為佳。又,疊層之方法可為批式亦可為以輥進行的連續式。真空疊層可使用市售之真空疊合機進行。市售之真空疊合機可列舉例如,Nichigo-Morton(股)製真空施用器(vacuum applicator)、(股)名機製作所製真空加壓式疊合機、(股)日立Industries製輥式乾塗佈器、日立AIC(股)製真空疊合機等。 In the step (A), when the resin sheet with the support has a protective film, the protective film is removed, and the resin sheet and the inner layer circuit substrate with the support are preheated as needed, and the resin sheet with the support is attached. Pressurized and heated while being pressed against the inner circuit board. The resin sheet with a support of the present invention is preferably a method in which a circuit board is laminated under reduced pressure by a vacuum lamination method. The conditions of the lamination are not particularly limited. For example, the lamination temperature (stacking temperature) is preferably 70 to 140 ° C, and the lamination pressure (laminating pressure) is preferably 1 to 11 kgf/cm 2 (9.8 × 10 4 ~ 107.9 × 10 4 N/m 2 ), the pressing time (stacking time) is preferably 5 to 180 seconds, and it is preferably laminated under a reduced pressure of 20 mmHg (26.7 hPa) or less. Further, the lamination method may be a batch type or a continuous type by a roll. The vacuum lamination can be carried out using a commercially available vacuum laminator. The commercially available vacuum laminating machine may, for example, be a vacuum applicator manufactured by Nichigo-Morton Co., Ltd., a vacuum pressurizing laminator manufactured by Nihon Seiki Co., Ltd., or a roll dryer made by Hitachi Industries. An applicator, a vacuum laminator made of Hitachi AIC (share), and the like.

(B)將附支持體之樹脂薄片熱硬化而形成絕緣層之步驟((B)步驟),可於將附支持體之樹脂薄片層合於內層電路基板後,藉由將樹脂薄片熱硬化,於內層電路基板上形成絕緣層(硬化物)。熱硬化之條件,只要依樹脂組成物中樹脂成分之種類、含量等適當選擇即可,較佳為於150℃~220℃、20分~180分、更佳為於160℃~210℃、30~120分之範圍選擇。又,藉由不剝離支持體而熱硬化,可防止熱硬化中廢棄物或塵埃等異物附著。 (B) a step of thermally curing a resin sheet with a support to form an insulating layer (step (B)), which can be thermally cured by laminating a resin sheet with a support to the inner layer circuit substrate An insulating layer (hardened material) is formed on the inner layer circuit substrate. The conditions of the heat curing may be appropriately selected depending on the type and content of the resin component in the resin composition, and are preferably from 150 ° C to 220 ° C, from 20 minutes to 180 minutes, more preferably from 160 ° C to 210 ° C, 30. ~120 points range selection. Further, by thermally peeling without peeling off the support, it is possible to prevent foreign matter such as waste or dust from adhering during heat hardening.

將樹脂薄片熱硬化而形成絕緣層,該絕緣層之線熱膨脹係數較佳為25ppm以下、更佳為20ppm以下。下限值雖無特殊限制,一般為4ppm。藉此,可防止增層與配線之變形,得到信賴性高之多層印刷配線板。 The resin sheet is thermally cured to form an insulating layer, and the linear thermal expansion coefficient of the insulating layer is preferably 25 ppm or less, more preferably 20 ppm or less. The lower limit is not particularly limited and is generally 4 ppm. Thereby, deformation of the buildup layer and the wiring can be prevented, and a multilayer printed wiring board having high reliability can be obtained.

將樹脂薄片熱硬化而形成絕緣層,該絕緣層 之介電正接(測定周波數5.8GHz)較佳為0.0065以下、更佳為0.006以下。下限值雖無特殊限制,一般為0.001。藉此,可得到電信號損失少的多層印刷配線板。 Resin the resin sheet to form an insulating layer, the insulating layer The dielectric positive connection (measured cycle number 5.8 GHz) is preferably 0.0065 or less, more preferably 0.006 or less. The lower limit is not particularly limited and is generally 0.001. Thereby, a multilayer printed wiring board having less electrical signal loss can be obtained.

(C)對絕緣層進行開孔加工以形成通孔之步驟((C)步驟)中,係對絕緣層進行開孔加工而形成通孔。開孔加工,可藉由例如鑽頭、雷射、電漿等公知之方法,且依照需要組合該等方法而進行,較佳為碳酸氣雷射、YAG雷射等之雷射的開孔加工,就泛用性之觀點而言更佳為碳酸氣雷射。 (C) In the step of performing the hole processing on the insulating layer to form the through hole (step (C)), the insulating layer is subjected to a hole drilling process to form a through hole. The drilling process can be carried out by a known method such as a drill, a laser, a plasma, or the like, and the methods are combined as needed, and it is preferably a laser drilling process such as a carbon dioxide laser or a YAG laser. More preferably, it is a carbon dioxide laser from the viewpoint of generality.

以碳酸氣雷射形成通孔時,發射數隨著應形成之通孔深度、孔徑而相異,通常係在1~5發射之間選擇。為了提高通孔之加工速度,提高多層印刷配線板之生產性,發射數少者為宜、發射數較佳為1~3。再者,以複數之發射來加工時,可為連續發射之叢發模式、亦可為具有時間上之間隔的複數發射之循環模式。 When a through hole is formed by a carbon dioxide laser, the number of shots varies depending on the depth and aperture of the through hole to be formed, and is usually selected between 1 and 5 shots. In order to improve the processing speed of the through hole and improve the productivity of the multilayer printed wiring board, it is preferable that the number of shots is small, and the number of shots is preferably from 1 to 3. Furthermore, when processing with a plurality of emissions, it may be a burst mode of continuous emission or a cyclic mode of complex emission with temporal intervals.

碳酸氣雷射之脈衝寬度並無特殊限定,可於28μ秒中度範圍至4μ秒之短脈衝的廣範圍中選擇。由效率性觀點而言,更佳為10μ秒~26μ秒。 The pulse width of the carbon dioxide laser is not particularly limited and can be selected from a wide range of short pulses of a moderate range of 28 μsec to 4 μsec. From the viewpoint of efficiency, it is more preferably from 10 μsec to 26 μsec.

藉由碳酸氣雷射進行開孔加工時,本發明之附支持體之樹脂薄片中,就使膠渣去除性良好的觀點而言,較佳為將雷射能量調整為0.1~3W、更佳係調整為0.3~2W。 In the resin sheet with a support of the present invention, it is preferable to adjust the laser energy to 0.1 to 3 W, preferably from the viewpoint of good mold removal property. The system is adjusted to 0.3~2W.

本發明之附支持體之樹脂薄片,膠渣去除性有所提高,因此為了多層印刷配線板之薄膜化,即使絕緣 層之通孔的頂徑(直徑)小,亦可進行良好之開孔加工。具體而言,(C)步驟中,絕緣層之通孔的頂徑(直徑)較佳為65μm以下、更佳為60μm以下、又更佳為55μm以下。另一方面,為了防止通孔內之粗化處理難以進行,通孔之頂徑(直徑)較佳為15μm以上。 In the resin sheet with a support of the present invention, the slag removal property is improved, so that even if the multilayer printed wiring board is thinned, even if it is insulated The top diameter (diameter) of the through hole of the layer is small, and good hole drilling can also be performed. Specifically, in the step (C), the top diameter (diameter) of the through hole of the insulating layer is preferably 65 μm or less, more preferably 60 μm or less, still more preferably 55 μm or less. On the other hand, in order to prevent the roughening treatment in the through hole from being difficult, the top diameter (diameter) of the through hole is preferably 15 μm or more.

(D)使支持體剝離之步驟((D)步驟)中,係將支持體剝離。基材為塑膠薄膜時,基材之剝離可藉由手動或自動剝離裝置機械性地去除而進行。又,基材為金屬箔時,可藉由蝕刻液等溶解金屬箔,而將金屬箔剝離、去除。再者,(D)步驟可在(C)步驟之前進行、亦可於(C)步驟之後進行,就提高膠渣去除性之觀點而言,較佳為於(D)步驟之前進行(C)步驟。 (D) In the step of peeling off the support (step (D)), the support is peeled off. When the substrate is a plastic film, the peeling of the substrate can be performed by mechanical removal by a manual or automatic peeling device. Further, when the substrate is a metal foil, the metal foil can be dissolved and removed by an etching solution or the like to remove the metal foil. Further, the step (D) may be carried out before the step (C) or after the step (C), and it is preferably carried out before the step (D) from the viewpoint of improving the mold removal property. step.

(E)將絕緣層表面進行粗化處理之步驟((E)步驟)中,係將支持體剝離後,將絕緣層表面粗化處理。乾式粗化處理時可列舉電漿處理等、濕式粗化處理時可列舉依序進行膨潤液之膨潤處理、氧化劑之粗化處理及中和液之中和處理的方法。就可一邊於絕緣層表面形成凸凹之錨凹,同時去除通孔內之膠渣的觀點,較佳為濕式粗化處理。 (E) In the step of roughening the surface of the insulating layer (step (E)), after the support is peeled off, the surface of the insulating layer is roughened. In the dry roughening treatment, a plasma treatment or the like may be mentioned, and in the wet roughening treatment, a method of sequentially performing a swelling treatment of a swelling liquid, a roughening treatment of an oxidizing agent, and a neutralization treatment of a neutralizing liquid may be mentioned. It is preferable to use a wet roughening treatment from the viewpoint of forming a concave and convex anchor groove on the surface of the insulating layer while removing the dross in the through hole.

膨潤液之膨潤處理,係藉由將絕緣層於50~80℃浸漬於膨潤液5~20分鐘(較佳為55~70℃、8~15分鐘)來進行。膨潤液可列舉鹼溶液、界面活性劑溶液等,較佳為鹼溶液,該鹼溶液可列舉例如氫氧化鈉溶液、氫氧化鉀溶液等。市售之膨潤液可列舉例如Atotech Japan (股)製之Swelling Dip Securiganth P、Swelling Dip Securiganth SBU等。 The swelling treatment of the swelling liquid is carried out by immersing the insulating layer in the swelling liquid at 50 to 80 ° C for 5 to 20 minutes (preferably 55 to 70 ° C, 8 to 15 minutes). The swelling solution may, for example, be an alkali solution or a surfactant solution, and is preferably an alkali solution, and examples of the alkali solution include a sodium hydroxide solution and a potassium hydroxide solution. Commercially available swelling liquids include, for example, Atotech Japan Swelling Dip Securiganth P, Swelling Dip Securiganth SBU, etc.

氧化劑之粗化處理,係藉由將絕緣層於60~80℃浸漬於氧化劑溶液10~30分鐘(較佳為70~80℃、15~25分鐘)來進行。氧化劑可列舉例如於氫氧化鈉之水溶液中溶解有過錳酸鉀或過錳酸鈉之鹼性過錳酸溶液、重鉻酸鹽、臭氧、過氧化氫/硫酸、硝酸等。又,鹼性過錳酸溶液中,過錳酸鹽之濃度較佳為5~10重量%。市售之氧化劑可列舉例如Atotech Japan(股)製之Concentrate Compact CP、Dosing Solution P等之鹼性過錳酸溶液。 The roughening treatment of the oxidizing agent is carried out by immersing the insulating layer in an oxidizing agent solution at 60 to 80 ° C for 10 to 30 minutes (preferably 70 to 80 ° C, 15 to 25 minutes). The oxidizing agent may, for example, be an alkaline permanganic acid solution in which potassium permanganate or sodium permanganate is dissolved in an aqueous solution of sodium hydroxide, dichromate, ozone, hydrogen peroxide/sulfuric acid, nitric acid or the like. Further, in the alkaline permanganic acid solution, the concentration of the permanganate is preferably 5 to 10% by weight. The commercially available oxidizing agent may, for example, be an alkaline permanganic acid solution such as Concentrate Compact CP or Dosing Solution P manufactured by Atotech Japan Co., Ltd.

中和液之中和處理,係藉由於30~50℃浸漬於中和液3~10分鐘(較佳為35~45℃、3~8分鐘)來進行。中和液較佳為酸性水溶液,市售品可列舉Atotech Japan(股)製之Reduction Solution Securiganth P。 The neutralization treatment of the neutralization solution is carried out by immersing in the neutralization solution at 30 to 50 ° C for 3 to 10 minutes (preferably 35 to 45 ° C, 3 to 8 minutes). The neutralizing liquid is preferably an acidic aqueous solution, and a commercially available product is a Reduction Solution Securiganth P manufactured by Atotech Japan Co., Ltd.

將樹脂薄片熱硬化而形成絕緣層,將該絕緣層表面進行粗化處理後之表面粗度,為了促進微細配線形成,算術平均粗度(Ra)較佳為150nm以下、更佳為100nm以下。算術平均粗度(Ra)之下限值雖無限制,一般而言為10nm以上。均方根粗度(Rq)較佳為220nm以下、更佳為200nm以下、又更佳為150nm以下、又再更佳為100nm以下。均方根粗度(Rq)之下限值雖無限制,一般而言為20nm以上。再者,均方根粗度(Rq)係反映絕緣層表面局部的狀態,因此藉由掌握Rq,可確認形成更緻密且平滑的絕緣層表面。 The resin sheet is thermally cured to form an insulating layer, and the surface roughness of the surface of the insulating layer after roughening treatment is preferably 150 nm or less, and more preferably 100 nm or less in order to promote formation of fine wiring. The lower limit of the arithmetic mean roughness (Ra) is not limited, and is generally 10 nm or more. The root mean square roughness (Rq) is preferably 220 nm or less, more preferably 200 nm or less, still more preferably 150 nm or less, still more preferably 100 nm or less. The lower limit of the root mean square roughness (Rq) is not limited, and is generally 20 nm or more. Further, the root mean square roughness (Rq) reflects the state of the surface of the insulating layer. Therefore, by grasping Rq, it was confirmed that a denser and smoother insulating layer surface was formed.

(F)對粗化處理後之絕緣層表面鍍敷而形成導體層之步驟((F步驟))中,可於絕緣層表面形成導體層。鍍敷形成之方法,可列舉藉由乾式鍍敷或濕式鍍敷於絕緣層上形成導體層。乾式鍍敷可使用蒸鍍、濺鍍、離子鍍等公知之方法。濕式鍍敷可列舉,於粗化處理後,組合無電解鍍敷與電解鍍敷而形成導體層之方法;形成與導體層相反圖型之抗鍍劑,僅以無電解鍍敷形成導體層之方法等。作為之後的圖型形成之方法,可使用例如所屬技術領域中具有通常知識者所公知之減成(subtractive)法、半加成法等。 (F) In the step of forming a conductor layer by plating the surface of the insulating layer after the roughening treatment ((F step)), a conductor layer may be formed on the surface of the insulating layer. The method of forming the plating includes forming a conductor layer on the insulating layer by dry plating or wet plating. Dry plating can be carried out by a known method such as vapor deposition, sputtering, or ion plating. The wet plating may be a method of forming a conductor layer by combining electroless plating and electrolytic plating after the roughening treatment; forming a plating resist having a pattern opposite to that of the conductor layer, and forming the conductor layer only by electroless plating. Method and so on. As a method of forming the pattern later, for example, a subtractive method, a semi-additive method, or the like which is well known to those skilled in the art can be used.

將樹脂薄片熱硬化而形成絕緣層,將該絕緣層表面進行粗化處理,之後鍍敷而得之導體層與該絕緣層之剝離強度,較佳為0.5kgf/cm以上。上限值雖無特殊限制,一般而言為1.2kgf/cm。 The resin sheet is thermally cured to form an insulating layer, and the surface of the insulating layer is subjected to a roughening treatment, and then the peeling strength of the conductor layer and the insulating layer obtained by plating is preferably 0.5 kgf/cm or more. The upper limit is not particularly limited and is generally 1.2 kgf/cm.

藉由重複上述一連串步驟複數次,會成為多段層合了增層的多層印刷配線板。本發明中,雖介電正接、線熱膨脹係數低,但膠渣去除性、鍍敷剝離強度優良,故可適合作為多層印刷配線板之增層用附支持體之樹脂薄片來使用。 By repeating the above-described series of steps plural times, it becomes a multilayer printed wiring board in which a plurality of layers are laminated. In the present invention, since the dielectric positive connection and the linear thermal expansion coefficient are low, the slag removal property and the plating peeling strength are excellent, and therefore it can be suitably used as a resin sheet for a build-up support for a build-up of a multilayer printed wiring board.

<半導體裝置> <semiconductor device>

藉由使用以本發明之方法所製造之多層印刷配線板,可製造半導體裝置。藉由於本發明之多層印刷配線板之導通部位安裝半導體晶片,可製造半導體裝置。「導通部 位」係指「多層印刷配線板中傳達電訊號的部位」,該場所可為表面、亦可為埋入的部位均可。又,半導體晶片只要係以半導體為材料之電氣電路元件則無特殊限定。 A semiconductor device can be manufactured by using a multilayer printed wiring board manufactured by the method of the present invention. A semiconductor device can be manufactured by mounting a semiconductor wafer on a conductive portion of the multilayer printed wiring board of the present invention. "Connecting Department "Bit" means "the part where the electrical signal is transmitted in the multilayer printed wiring board", and the location may be either a surface or a buried portion. Further, the semiconductor wafer is not particularly limited as long as it is an electrical circuit element made of a semiconductor.

製造本發明之半導體裝置時之半導體晶片的安裝方法,只要半導體晶片可有效地發揮功能,則無特殊限定,具體而言可列舉打線接合安裝方法、覆晶安裝方法、無凸塊之增層(BBUL)安裝方法、異向性導電薄膜(ACF)之安裝方法、非導電性薄膜(NCF)之安裝方法等。 The method of mounting the semiconductor wafer in the manufacture of the semiconductor device of the present invention is not particularly limited as long as the semiconductor wafer can function effectively, and specifically, a wire bonding method, a flip chip mounting method, and a bump-free layering ( BBUL) mounting method, mounting method of anisotropic conductive film (ACF), mounting method of non-conductive film (NCF), and the like.

[實施例] [Examples]

以下,藉由實施例具體地說明本發明,但本發明不受該等實施例限定。再者,以下記載中之「份」意指「質量份」。 Hereinafter, the present invention will be specifically described by way of examples, but the present invention is not limited by the examples. In addition, the "parts" in the following description means "parts by mass".

首先,說明本說明書中,物性評估之測定方法.評估方法。 First, the determination method of physical property evaluation in this specification is explained. evaluation method.

<算術平均粗度(Ra值)、均方根粗度(Rq值)、剝離強度之測定用樣品的調製> <Arithmetic mean roughness (Ra value), root mean square thickness (Rq value), and preparation of sample for measurement of peel strength> (1)內層電路基板之基底處理 (1) Base processing of the inner layer circuit substrate

將形成有內層電路之玻璃布基材環氧樹脂兩面銅包覆層合板(銅箔之厚度18μm、基板厚度0.3mm、松下電工(股)製R5715ES)的兩面以MEC(股)製CZ8100蝕刻1um,進行銅表面之粗化處理。 The glass cloth substrate epoxy resin double-sided copper-clad laminate (the thickness of the copper foil is 18 μm, the substrate thickness is 0.3 mm, and the R5715ES made by Matsushita Electric Co., Ltd.) having the inner layer circuit is etched by the CZ8100 manufactured by MEC (stock). 1um, roughening of the copper surface.

(2)附支持體之樹脂薄片之疊層 (2) Lamination of resin sheets with support

將於實施例及比較例中製成之附支持體之樹脂薄片,使用批式真空加壓疊合機MVLP-500(名機(股)製商品名)於內層電路基板之兩面疊層。疊層係藉由30秒減壓使氣壓成為13hPa以下,之後以30秒、100℃、壓力0.74MPa壓合而進行。 The resin sheet with the support prepared in the examples and the comparative examples was laminated on both sides of the inner layer circuit board using a batch vacuum press laminator MVLP-500 (trade name, manufactured by a famous machine). The lamination was performed under reduced pressure for 30 seconds to be 13 hPa or less, and then press-bonded at 30 seconds, 100 ° C, and pressure of 0.74 MPa.

(3)樹脂組成物之硬化 (3) Hardening of resin composition

將經疊層之接著薄膜於80℃持續30分鐘,之後於170℃、30分鐘之硬化條件,將樹脂組成物硬化而形成絕緣層。 The laminated film was laminated at 80 ° C for 30 minutes, and then the resin composition was cured at 170 ° C for 30 minutes to form an insulating layer.

(4)通孔形成 (4) Through hole formation

使用日立Via Mechanics(股)製CO2雷射加工機(LC-2E21B/1C),以遮罩直徑1.60mm、聚焦偏移值0.050、脈衝寬度25μs、功率0.66W、口徑13、發射數2、叢發模式之條件將絕緣層開孔,形成絕緣層表面之通孔頂徑(直徑)為50μm之通孔。之後,將PET薄膜剝離。 Using a CO 2 laser processing machine (LC-2E21B/1C) manufactured by Hitachi Via Mechanics Co., Ltd., with a mask diameter of 1.60 mm, a focus offset value of 0.050, a pulse width of 25 μs, a power of 0.66 W, a diameter of 13, and a number of shots of 2. In the condition of the burst mode, the insulating layer is opened to form a via hole having a top diameter (diameter) of 50 μm in the surface of the insulating layer. Thereafter, the PET film was peeled off.

(5)粗化處理 (5) roughening treatment

將形成有絕緣層之內層電路基板,於60℃浸漬於膨潤液之Atotech Japan(股)之含有二乙二醇單丁基醚之 Swelling Dip Securiganth P(二醇醚類、氫氧化鈉之水溶液)中10分鐘,接著在80℃於作為粗化液之Atotech Japan(股)之Concentrate CompactP(KMnO4:60g/L、NaOH:40g/L之水溶液)中浸漬20分鐘,最後在40℃於作為中和液之Atotech Japan(股)之Reduction Solution Securiganth P(硫酸之水溶液)中浸漬5分鐘,之後於80℃乾燥30分鐘。將此基板作為評估基板A。 An inner layer circuit board having an insulating layer formed thereon, which is immersed in a swelling liquid of Atotech Japan (sand) containing diethylene glycol monobutyl ether at 60 ° C Swelling Dip Securiganth P (glycol ether, aqueous solution of sodium hydroxide) for 10 minutes, followed by Concentrate CompactP (KMnO4: 60 g/L, NaOH: 40 g/L of Atotech Japan) as a roughening solution at 80 °C The aqueous solution was immersed for 20 minutes, and finally immersed in Atotech Japan's Reduction Solution Securiganth P (aqueous solution of sulfuric acid) as a neutralizing solution at 40 ° C for 5 minutes, and then dried at 80 ° C for 30 minutes. This substrate was used as the evaluation substrate A.

(6)半加成工法之鍍敷 (6) Plating with semi-additive method

將評估基板A於40℃浸漬於含有PdCl2之無電解鍍敷用溶液中5分鐘,接著於無電解銅鍍敷液中,25℃浸漬20分鐘。於150℃加熱30分鐘進行退火處理後,形成抗蝕劑,以蝕刻形成圖型後,進行硫酸銅電解鍍敷,以30μm之厚度形成導體層。接著,於200℃進行退火處理60分鐘。將此基板作為評估基板B。 The evaluation substrate A was immersed in a solution for electroless plating containing PdCl 2 at 40 ° C for 5 minutes, and then immersed in an electroless copper plating solution at 25 ° C for 20 minutes. After annealing at 150 ° C for 30 minutes and annealing treatment, a resist was formed, and after etching to form a pattern, copper sulfate electrolytic plating was performed to form a conductor layer with a thickness of 30 μm. Next, annealing treatment was performed at 200 ° C for 60 minutes. This substrate was used as the evaluation substrate B.

<算術平均粗度(Ra值)、均方根粗度(Rq值)之測定及評估> <Arithmetic mean roughness (Ra value), root mean square thickness (Rq value) measurement and evaluation>

將評估基板A,使用非接觸型表面粗度計(Veeco Instruments公司製WYKO NT3300),藉由VSI接觸模式、50倍透鏡,以測定範圍為121μm×92μm而得之數值,來求得Ra值、Rq值。藉由求得分別隨機選擇10點的平均值來測定。評估係如以下所示。 The substrate A was evaluated, and a Ra value was obtained by using a non-contact surface roughness meter (WYKO NT3300, manufactured by Veeco Instruments Co., Ltd.) in a VSI contact mode and a 50-fold lens with a measurement range of 121 μm × 92 μm. Rq value. The average value of 10 points was randomly selected and determined. The evaluation system is as follows.

○:Ra值為150nm以下 ○: Ra value is 150 nm or less

×:Ra值為較150nm大 ×: Ra value is larger than 150 nm

○:Rq值為220nm以下 ○: Rq value is 220 nm or less

×:Rq值為較220nm大 ×: Rq value is larger than 220 nm

<鍍敷導體層之撕裂強度(剝離強度)之測定及評估> <Measurement and evaluation of tear strength (peel strength) of the plated conductor layer>

於評估基板B之導體層切出寬度10mm、長度100mm之部分的切口,將其一端剝離,以夾具(TSE股份有限公司、Auto Com型試驗機AC-50C-SL)夾住,測定於室溫中以50mm/分鐘的速度向垂直方向剝離35mm時的荷重(kgf/cm)。評估係如以下所示。 A slit having a width of 10 mm and a length of 100 mm was cut out from the conductor layer of the evaluation substrate B, and one end thereof was peeled off, and clamped by a jig (TSE Co., Ltd., Auto Com type tester AC-50C-SL), and measured at room temperature. The load (kgf/cm) when peeling 35 mm in the vertical direction at a speed of 50 mm/min. The evaluation system is as follows.

○:剝離強度為0.5kgf/cm以上 ○: Peel strength is 0.5 kgf/cm or more

×:剝離強度為未達0.5kgf/cm ×: peeling strength is less than 0.5 kgf/cm

<通孔底部之膠渣去除性的評估> <Evaluation of the removal of the slag at the bottom of the through hole>

以掃描電子顯微鏡(SEM)觀察通孔底部之周圍,由所得之影像測定由通孔底部之壁面的最大膠渣長。評估係如以下所示。 The periphery of the bottom of the through hole was observed by a scanning electron microscope (SEM), and the maximum slag length of the wall surface at the bottom of the through hole was measured from the obtained image. The evaluation system is as follows.

○:最大膠渣長為未達3μm ○: The maximum slag length is less than 3μm

×:最大膠渣長為3μm以上 ×: The maximum slag length is 3 μm or more

<線熱膨脹係數之測定及評估> <Measurement and evaluation of linear thermal expansion coefficient>

將實施例及比較例中得到之附支持體之樹脂薄片於200℃加熱90分鐘藉以熱硬化,藉由剝離PET薄膜得到薄片狀之硬化物。將該硬化物切斷為寬度約5mm、長度約 15mm之試驗片,使用熱機械分析裝置Thermo Plus TMA8310((股)Rigaku製),以拉伸加重法進行熱機械分析。將試驗片裝設於前述裝置後,以荷重1g、昇溫速度5℃/分鐘之測定條件連續測定2次。算出第2次之測定中由25℃至150℃之平均線熱膨脹係數(ppm)。評估係如以下所示。 The resin sheets of the support obtained in the examples and the comparative examples were heated at 200 ° C for 90 minutes to be thermally cured, and a sheet-like cured product was obtained by peeling off the PET film. The cured product is cut into a width of about 5 mm and a length of about A 15 mm test piece was subjected to thermomechanical analysis by a tensile weighting method using a thermomechanical analysis device Thermo Plus TMA8310 (manufactured by Rigaku Co., Ltd.). After the test piece was placed in the above apparatus, the test piece was continuously measured twice under the measurement conditions of a load of 1 g and a temperature increase rate of 5 ° C /min. The average linear thermal expansion coefficient (ppm) from 25 ° C to 150 ° C in the second measurement was calculated. The evaluation system is as follows.

○:平均線熱膨脹係數未達20ppm ○: The average linear thermal expansion coefficient is less than 20 ppm

△:平均線熱膨脹係數為20ppm以上、25ppm以下 △: The average linear thermal expansion coefficient is 20 ppm or more and 25 ppm or less.

×:平均線熱膨脹係數較25ppm大 ×: The average linear thermal expansion coefficient is larger than 25 ppm.

<介電正接之測定及評估> <Measurement and evaluation of dielectric positive connection>

將實施例及比較例中所得之附支持體之樹脂薄片於200℃加熱90分鐘使其熱硬化,藉由將支持體剝離得到薄片狀之硬化物。將該硬化物切出長80mm、寬2mm,作為評估樣品。對此評估樣品使用Agilent Technologies公司製HP8362B裝置藉由空腔共振擾動法(cavity resonance perturbation method)以測定頻率5.8GHz、測定溫度23℃測定介電正接。對2片試驗片進行測定,算出平均值。評估係如以下所示。 The resin sheets of the support obtained in the examples and the comparative examples were thermally cured at 200 ° C for 90 minutes, and the support was peeled off to obtain a flaky cured product. The cured product was cut out to have a length of 80 mm and a width of 2 mm as an evaluation sample. For this evaluation sample, the dielectric positive connection was measured by a cavity resonance perturbation method using a cavity resonance perturbation method at a measurement frequency of 5.8 GHz and a measurement temperature of 23 ° C. Two test pieces were measured, and the average value was calculated. The evaluation system is as follows.

○:介電正接為0.0065以下 ○: The dielectric connection is below 0.0065

×:介電正接較0.0065大 ×: The dielectric connection is larger than 0.0065

<樹脂清漆1之調製> <Modulation of Resin Varnish 1>

將雙酚型環氧樹脂(新日鐵化學(股)製 「ZX1059」、雙酚A型與雙酚F型之1:1混合品)5份、結晶性2官能環氧樹脂(三菱化學(股)製「YX4000HK」、環氧當量約185)10份、聯苯型環氧樹脂(日本化藥(股)製「NC3000H」)10份、苯氧基樹脂(三菱化學(股)製「YL7553BH30」、固體成分30質量%之MEK溶液)10份,於溶劑石油腦30份中一邊攪拌並且加熱溶解。冷卻至室溫後,對其混合活性酯化合物(DIC(股)製「HPC8000-65T」、活性基當量約223之不揮發成分65質量%之甲苯溶液)40份、硬化促進劑(4-二甲基胺基吡啶、固體成分2質量%之MEK溶液)7份、阻燃劑(三光(股)製「HCA-HQ」、10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-磷雜菲-10-氧化物、平均粒徑2μm)2份、經苯基胺基矽烷系偶合劑(信越化學工業(股)製、「KBM573」)表面處理之球形二氧化矽(平均粒徑0.5μm、(股)Admatechs製「SOC2」、每單位面積之碳量0.39mg/m2)160份,以高速旋轉混合器均勻地分散,製作樹脂清漆1。活性酯化合物為12質量%。 Bisphenol type epoxy resin (ZX1059 made by Nippon Steel Chemical Co., Ltd., 1:1 mixture of bisphenol A type and bisphenol F type), 5 parts of crystalline 2-functional epoxy resin (Mitsubishi Chemical ( 10 parts of "YX4000HK", epoxy equivalent: 185), 10 parts of biphenyl type epoxy resin ("NC3000H" manufactured by Nippon Kayaku Co., Ltd.), and phenoxy resin ("LM7553BH30" manufactured by Mitsubishi Chemical Corporation) 10 parts of a MEK solution having a solid content of 30% by mass, stirred in 30 parts of a solvent petroleum brain and dissolved by heating. After cooling to room temperature, 40 parts of an active ester compound ("HPC8000-65T" manufactured by DIC Co., Ltd., a toluene solution having a non-volatile content of about 223 as a non-volatile component of 223), and a hardening accelerator (4-two) were mixed. 7 parts of methylaminopyridine, a solid content of 2% by mass of MEK solution), a flame retardant ("HCA-HQ" manufactured by Sanguang Co., Ltd., 10-(2,5-dihydroxyphenyl)-10-hydrogen- 9-oxa-10-phosphaphenanthrene-10-oxide, average particle size 2 μm) 2 parts, phenylamino decane-based coupling agent (manufactured by Shin-Etsu Chemical Co., Ltd., "KBM573") 160 parts of cerium oxide (average particle diameter: 0.5 μm, "SOC2" manufactured by Admatechs, and carbon content per unit area of 0.39 mg/m 2 ) were uniformly dispersed in a high-speed rotary mixer to prepare a resin varnish 1. The active ester compound was 12% by mass.

<樹脂清漆2之調製> <Modulation of Resin Varnish 2>

將雙酚型環氧樹脂(新日鐵化學(股)製「ZX1059」、雙酚A型與雙酚F型之1:1混合品)5份、結晶性2官能環氧樹脂(三菱化學(股)製「YX4000HK」、環氧當量約185)10份、聯苯型環氧樹脂(日本化藥(股)製「NC3000H」)10份、苯氧基樹 脂(三菱化學(股)製「YL7553BH30」、固體成分30質量%之MEK溶液)10份,於溶劑石油腦30份中一邊攪拌並且加熱溶解。冷卻至室溫後,對其混合活性酯化合物(DIC(股)製「HPC8000-65T」、活性基當量約223之不揮發成分65質量%之甲苯溶液)20份、萘酚系硬化劑(羥基當量215、新日鐵化學(股)製「SN-485」)之固體成分60%之MEK溶液12份、硬化促進劑(4-二甲基胺基吡啶、固體成分2質量%之MEK溶液)4份、阻燃劑(三光(股)製「HCA-HQ」、10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-磷雜菲-10-氧化物、平均粒徑2μm)2份、經苯基胺基矽烷系偶合劑(信越化學工業(股)製、「KBM573」)表面處理之球形二氧化矽(平均粒徑0.5μm、(股)Admatechs製「SOC2」、每單位面積之碳量0.39mg/m2)150份,以高速旋轉混合器均勻地分散,製作樹脂清漆2。活性酯化合物為6.5質量%。 Bisphenol type epoxy resin (ZX1059 made by Nippon Steel Chemical Co., Ltd., 1:1 mixture of bisphenol A type and bisphenol F type), 5 parts of crystalline 2-functional epoxy resin (Mitsubishi Chemical ( 10 parts of "YX4000HK", epoxy equivalent: 185), 10 parts of biphenyl type epoxy resin ("NC3000H" manufactured by Nippon Kayaku Co., Ltd.), and phenoxy resin ("LM7553BH30" manufactured by Mitsubishi Chemical Corporation) 10 parts of a MEK solution having a solid content of 30% by mass, stirred in 30 parts of a solvent petroleum brain and dissolved by heating. After cooling to room temperature, 20 parts of an active ester compound ("HPC 8000-65T" manufactured by DIC Co., Ltd., a toluene solution having a non-volatile content of about 223 as a non-volatile component of 223), and a naphthol-based curing agent (hydroxyl group) were mixed. 12 parts of MEK solution with 60% solid content of solid 215, SN-485, and a hardening accelerator (4-dimethylaminopyridine, 2% by mass of MEK solution) 4 parts, flame retardant ("HCO-HQ", 10-(2,5-dihydroxyphenyl)-10-hydro-9-oxa-10-phosphaphenanthrene-10-oxide 2 parts of an average particle diameter of 2 μm, and a spherical cerium oxide surface-treated with a phenylamino decane-based coupling agent (manufactured by Shin-Etsu Chemical Co., Ltd., "KBM573") (average particle diameter: 0.5 μm, manufactured by Admatechs) "SOC2" and 150 parts of carbon per unit area of 0.39 mg/m 2 ) were uniformly dispersed in a high-speed rotary mixer to prepare a resin varnish 2 . The active ester compound was 6.5% by mass.

<樹脂清漆3之調製> <Modulation of Resin Varnish 3>

將雙酚型環氧樹脂(新日鐵化學(股)製「ZX1059」、雙酚A型與雙酚F型之1:1混合品)5份、結晶性2官能環氧樹脂(三菱化學(股)製「YX4000HK」、環氧當量約185)10份、聯苯型環氧樹脂(日本化藥(股)製「NC3000H」)10份、苯氧基樹脂(三菱化學(股)製「YL7553BH30」、固體成分30質量%之MEK溶液)10份,於溶劑石油腦30份中一邊攪拌 並且加熱溶解。冷卻至室溫後,對其混合活性酯化合物(DIC(股)製「HPC8000-65T」、活性基當量約223之不揮發成分65質量%之甲苯溶液)10份、含有三嗪之酚系硬化劑(羥基當量146、DIC(股)製「LA-1356」)之固體成分60%之MEK溶液10份、硬化促進劑(4-二甲基胺基吡啶、固體成分2質量%之MEK溶液)3份、阻燃劑(三光(股)製「HCA-HQ」、10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-磷雜菲-10-氧化物、平均粒徑2μm)2份、經苯基胺基矽烷系偶合劑(信越化學工業(股)製、「KBM573」)表面處理之球形二氧化矽(平均粒徑0.5μm、(股)Admatechs製「SOC2」、每單位面積之碳量0.39mg/m2)140份,以高速旋轉混合器均勻地分散,製作樹脂清漆3。活性酯化合物為3.6質量%。 Bisphenol type epoxy resin (ZX1059 made by Nippon Steel Chemical Co., Ltd., 1:1 mixture of bisphenol A type and bisphenol F type), 5 parts of crystalline 2-functional epoxy resin (Mitsubishi Chemical ( 10 parts of "YX4000HK", epoxy equivalent: 185), 10 parts of biphenyl type epoxy resin ("NC3000H" manufactured by Nippon Kayaku Co., Ltd.), and phenoxy resin ("LM7553BH30" manufactured by Mitsubishi Chemical Corporation) 10 parts of a MEK solution having a solid content of 30% by mass, stirred in 30 parts of a solvent petroleum brain and dissolved by heating. After cooling to room temperature, 10 parts of an active ester compound ("HPC8000-65T" manufactured by DIC Co., Ltd., a toluene solution having a non-volatile content of about 223 as a non-volatile component of 223), and a phenol-based hardening containing triazine were mixed. 10 parts of a MEK solution containing 60% solid content of a hydroxyl group equivalent of 146, DIC ("LA-1356"), and a hardening accelerator (4-dimethylaminopyridine, a solid content of 2% by mass of MEK solution) 3 parts, flame retardant (Sanka (HQ-HQ), 10-(2,5-dihydroxyphenyl)-10-hydro-9-oxa-10-phosphaphenanthrene-10-oxide 2 parts of an average particle diameter of 2 μm, and a spherical cerium oxide surface-treated with a phenylamino decane-based coupling agent (manufactured by Shin-Etsu Chemical Co., Ltd., "KBM573") (average particle diameter: 0.5 μm, manufactured by Admatechs) "SOC2", a carbon content of 0.39 mg/m 2 per unit area, 140 parts, was uniformly dispersed by a high-speed rotary mixer to prepare a resin varnish 3. The active ester compound was 3.6% by mass.

<實施例1> <Example 1> (附支持體之樹脂薄片1之製作) (Production of Resin Sheet 1 with Support)

於經ETFE處理之脫模PET(三菱樹脂(股)製「Fluoroju RL50KSE」、厚度50μm)之脫模面,以模具塗佈器塗佈樹脂清漆1,使乾燥後之樹脂組成物層厚度成為15μm,於100℃乾燥1分鐘。進一步,於該樹脂組成物層上以模具塗佈器塗佈樹脂清漆3,使乾燥後之樹脂組成物層總厚度成為30μm,於80~120℃(平均100℃)乾燥4分鐘,於樹脂面貼合厚度15μm之聚丙烯被覆薄膜(王子特殊紙(股)製「ALPHANE MA-411」)之平滑面側,得 到脫模PET/樹脂組成物層1/樹脂組成物層3/被覆薄膜之構成的附支持體之樹脂薄片。 The resin varnish 1 was applied to a release surface of a release PET (Fluoroju RL50KSE, manufactured by Mitsubishi Resin Co., Ltd., thickness: 50 μm) which was subjected to ETFE treatment, and the thickness of the resin composition layer after drying was 15 μm. , dried at 100 ° C for 1 minute. Further, the resin varnish 3 was applied onto the resin composition layer by a die coater, and the total thickness of the dried resin composition layer was 30 μm, and dried at 80 to 120 ° C (average 100 ° C) for 4 minutes on the resin surface. The smooth surface side of a polypropylene-coated film ("ALPHANE MA-411" manufactured by Oji Paper Co., Ltd.) having a thickness of 15 μm is attached. A resin sheet with a support formed by releasing the PET/resin composition layer 1 / the resin composition layer 3 / the coating film.

<實施例2> <Example 2> (附支持體之樹脂薄片2之製作) (Production of Resin Sheet 2 with Support)

與實施例1同樣方式,得到脫模PET/樹脂組成物層2/樹脂組成物層3/被覆薄膜之構成的附支持體之樹脂薄片。 In the same manner as in the first embodiment, a resin sheet with a support of the release PET/resin composition layer 2/resin composition layer 3/coated film was obtained.

<比較例1> <Comparative Example 1> (附支持體之樹脂薄片3之製作) (Production of Resin Sheet 3 with Support)

除了於脫模PET上,以模具塗佈器塗佈樹脂清漆1,使乾燥後之樹脂組成物層厚度成為30μm,且於80~120℃(平均100℃)乾燥5分鐘以外,係與實施例1同樣方式,得到脫模PET/樹脂組成物層1/被覆薄膜之構成的附支持體之樹脂薄片。 In addition to the release of PET, the resin varnish 1 was applied by a die coater to a thickness of 30 μm after drying the resin composition layer, and dried at 80 to 120 ° C (average 100 ° C) for 5 minutes. In the same manner, a resin sheet with a support of a release PET/resin composition layer 1 / a coating film was obtained.

<比較例2> <Comparative Example 2> (附支持體之樹脂薄片4之製作) (Production of Resin Sheet 4 with Support)

除了於脫模PET上,以模具塗佈器塗佈樹脂清漆2,使乾燥後之樹脂組成物層厚度成為30μm,且於80~120℃(平均100℃)乾燥5分鐘以外,係與實施例1同樣方式,得到脫模PET/樹脂組成物層2/被覆薄膜之構成的附支持體之樹脂薄片。 The resin varnish 2 was applied to a release-coated PET by a die coater, and the thickness of the resin composition layer after drying was 30 μm, and dried at 80 to 120 ° C (average 100 ° C) for 5 minutes. In the same manner, a resin sheet with a support of the release PET/resin composition layer 2/coated film was obtained.

<比較例3> <Comparative Example 3> (附支持體之樹脂薄片5之製作) (Production of Resin Sheet 5 with Support)

除了於脫模PET上,以模具塗佈器塗佈樹脂清漆3,使乾燥後之樹脂組成物層厚度成為30μm,且於80~120℃(平均100℃)乾燥5分鐘以外,係與實施例1同樣方式,得到脫模PET/樹脂組成物層3/被覆薄膜之構成的附支持體之樹脂薄片。 The resin varnish 3 was applied to the release-coated PET by a die coater, and the thickness of the resin composition layer after drying was 30 μm, and dried at 80 to 120 ° C (average 100 ° C) for 5 minutes. In the same manner, a resin sheet with a support of the release PET/resin composition layer 3/coated film was obtained.

評估結果如表1所示。 The evaluation results are shown in Table 1.

由表1結果明顯可知,實施例1~2之附支持體之樹脂薄片顯示優良的特性。另一方面,比較例1及2中,膠渣去除性不佳。比較例3中,表面粗度大、剝離強度亦低,且介電正接亦變大。 As is apparent from the results of Table 1, the resin sheets of the support of Examples 1 to 2 exhibited excellent characteristics. On the other hand, in Comparative Examples 1 and 2, the slag removal property was poor. In Comparative Example 3, the surface roughness was large, the peel strength was also low, and the dielectric positive connection was also increased.

[產業上之可利用性] [Industrial availability]

本發明中可提供介電正接、線熱膨脹係數雖低,但膠渣去除性、鍍敷剝離強度優良之附支持體之樹脂薄片。進而可提供使用其之多層印刷配線板、半導體裝置。進一步地,亦可提供搭載該等之電腦、行動電話、數位相機、電視等電子製品,或機車、汽車、電車、船舶、航空器等交通工具。 In the present invention, a resin sheet with a dielectric support and a linear thermal expansion coefficient which is low in binder removal property and excellent in plating peel strength can be provided. Further, a multilayer printed wiring board or a semiconductor device using the same can be provided. Further, electronic products such as computers, mobile phones, digital cameras, televisions, and the like, or vehicles such as locomotives, automobiles, electric cars, ships, and aircraft may be provided.

Claims (14)

一種附支持體之樹脂薄片,其特徵為具有:支持體;形成於前述支持體上之含有環氧樹脂、活性酯化合物及無機填充材之第1層,其中前述第1層中之不揮發成分為100質量%時,活性酯化合物為5質量%以上;與形成於前述第1層上之含有環氧樹脂、活性酯化合物及無機填充材之第2層,其中前述第2層中之不揮發成分為100質量%時,活性酯化合物為5質量%以下。A resin sheet with a support comprising: a support; a first layer comprising an epoxy resin, an active ester compound, and an inorganic filler formed on the support, wherein the non-volatile component in the first layer When the amount is 100% by mass, the active ester compound is 5% by mass or more; and the second layer containing the epoxy resin, the active ester compound, and the inorganic filler formed on the first layer, wherein the second layer is non-volatile When the component is 100% by mass, the active ester compound is 5% by mass or less. 如請求項1之附支持體之樹脂薄片,其中前述無機填充材之平均粒徑為0.01~3μm。The resin sheet of the support of claim 1, wherein the inorganic filler has an average particle diameter of 0.01 to 3 μm. 如請求項1之附支持體之樹脂薄片,其中前述無機填充材之含量為40~90質量%。The resin sheet of the support of claim 1, wherein the content of the inorganic filler is 40 to 90% by mass. 如請求項1之附支持體之樹脂薄片,其中前述無機填充材係經表面處理劑表面處理。A resin sheet according to claim 1, wherein the inorganic filler is surface-treated with a surface treatment agent. 如請求項4之附支持體之樹脂薄片,其中前述無機填充材之每單位表面積的碳量為0.02~1mg/m2The resin sheet of the support of claim 4, wherein the amount of carbon per unit surface area of the inorganic filler is 0.02 to 1 mg/m 2 . 如請求項1之附支持體之樹脂薄片,其中前述第2層之厚度為2μm以上。The resin sheet of the support of claim 1, wherein the thickness of the second layer is 2 μm or more. 如請求項1之附支持體之樹脂薄片,其中將前述樹脂薄片熱硬化而形成絕緣層,該絕緣層之線熱膨脹係數為25ppm以下。The resin sheet of the support of claim 1, wherein the resin sheet is thermally cured to form an insulating layer having a linear thermal expansion coefficient of 25 ppm or less. 如請求項1之附支持體之樹脂薄片,其中將前述樹脂薄片熱硬化而形成絕緣層,該絕緣層之介電正接(測定頻率5.8GHz)為0.0065以下。The resin sheet according to claim 1, wherein the resin sheet is thermally cured to form an insulating layer, and the dielectric layer of the insulating layer (measuring frequency: 5.8 GHz) is 0.0065 or less. 如請求項1之附支持體之樹脂薄片,其中將前述樹脂薄片熱硬化而形成絕緣層,且將該絕緣層表面粗化處理後之算術平均粗度(Ra)為150nm以下、均方根粗度(Rq)為220nm以下。The resin sheet of the support of claim 1, wherein the resin sheet is thermally cured to form an insulating layer, and the arithmetic mean roughness (Ra) after the surface of the insulating layer is roughened is 150 nm or less, and the root mean square is coarse. The degree (Rq) is 220 nm or less. 如請求項1之附支持體之樹脂薄片,其中將前述樹脂薄片熱硬化而形成絕緣層,且將該絕緣層表面粗化處理並鍍敷而得之導體層與該絕緣層之剝離強度為0.5kgf/cm以上。The resin sheet of the support of claim 1, wherein the resin sheet is thermally cured to form an insulating layer, and the surface of the insulating layer is roughened and plated to obtain a peeling strength of the conductor layer and the insulating layer of 0.5. Kgf/cm or more. 如請求項1~10中任一項之附支持體之樹脂薄片,其係多層印刷配線板之絕緣層用附支持體之樹脂薄片。The resin sheet of the support according to any one of claims 1 to 10, which is a resin sheet with a support for the insulating layer of the multilayer printed wiring board. 如請求項1~10中任一項之附支持體之樹脂薄片,其係多層印刷配線板之增層(build-up layer)用附支持體之樹脂薄片。The resin sheet with a support according to any one of claims 1 to 10, which is a resin sheet with a support for a build-up layer of a multilayer printed wiring board. 一種多層印刷配線板之製造方法,其係含有:(A)將如請求項1~10中任一項之附支持體之樹脂薄片層合於內層電路基板之單面或兩面之步驟、(B)將附支持體之樹脂薄片熱硬化而形成絕緣層之步驟、(C)對絕緣層進行開孔加工以形成通孔之步驟、(D)使支持體剝離之步驟、(E)將絕緣層表面進行粗化處理之步驟、(F)對粗化處理後之絕緣層表面鍍敷而形成導體層之步驟之多層印刷配線板之製造方法,其特徵為:前述(C)對絕緣層進行開孔加工以形成通孔之步驟中,絕緣層之通孔的頂徑(top diameter)(直徑)為65μm以下。A method of manufacturing a multilayer printed wiring board, comprising: (A) a step of laminating a resin sheet of the support according to any one of claims 1 to 10 on one or both sides of an inner layer circuit substrate, ( B) a step of thermally hardening the resin sheet with the support to form an insulating layer, (C) a step of drilling the insulating layer to form a through hole, (D) a step of peeling the support, and (E) insulating a method of producing a multilayer printed wiring board by the step of roughening the surface of the layer, and (F) the step of forming a conductor layer by plating the surface of the insulating layer after the roughening treatment, wherein the (C) is performed on the insulating layer In the step of performing the hole forming to form the through hole, the top diameter (diameter) of the through hole of the insulating layer is 65 μm or less. 一種半導體裝置,其特徵為使用藉由如請求項13之方法所製造之多層印刷配線板。A semiconductor device characterized by using a multilayer printed wiring board manufactured by the method of claim 13.
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TW201414606A (en) 2014-04-16

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