TWI607211B - Image generation device, defect inspection device, and defect inspection method - Google Patents

Image generation device, defect inspection device, and defect inspection method Download PDF

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Publication number
TWI607211B
TWI607211B TW103101492A TW103101492A TWI607211B TW I607211 B TWI607211 B TW I607211B TW 103101492 A TW103101492 A TW 103101492A TW 103101492 A TW103101492 A TW 103101492A TW I607211 B TWI607211 B TW I607211B
Authority
TW
Taiwan
Prior art keywords
defect
image data
image
sheet
bit string
Prior art date
Application number
TW103101492A
Other languages
English (en)
Chinese (zh)
Other versions
TW201435332A (zh
Inventor
尾崎麻耶
Original Assignee
住友化學股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 住友化學股份有限公司 filed Critical 住友化學股份有限公司
Publication of TW201435332A publication Critical patent/TW201435332A/zh
Application granted granted Critical
Publication of TWI607211B publication Critical patent/TWI607211B/zh

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Textile Engineering (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
TW103101492A 2013-01-16 2014-01-15 Image generation device, defect inspection device, and defect inspection method TWI607211B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013005686 2013-01-16

Publications (2)

Publication Number Publication Date
TW201435332A TW201435332A (zh) 2014-09-16
TWI607211B true TWI607211B (zh) 2017-12-01

Family

ID=51209737

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103101492A TWI607211B (zh) 2013-01-16 2014-01-15 Image generation device, defect inspection device, and defect inspection method

Country Status (5)

Country Link
JP (1) JP6191622B2 (ja)
KR (1) KR102110006B1 (ja)
CN (1) CN104919305B (ja)
TW (1) TWI607211B (ja)
WO (1) WO2014112652A1 (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6413630B2 (ja) * 2014-10-28 2018-10-31 株式会社ジェイテクト 赤外線応力測定方法および赤外線応力測定装置
JP6144371B1 (ja) * 2016-01-14 2017-06-07 株式会社フジクラ 間欠連結型光ファイバテープの検査方法、検査装置及び製造方法
JP6312052B2 (ja) * 2016-08-09 2018-04-18 カシオ計算機株式会社 選別機、及び選別方法
JP2018047655A (ja) * 2016-09-23 2018-03-29 三菱重工機械システム株式会社 シートの不良除去装置及び方法、シートの不良除去制御装置、段ボールシートの製造装置
JP7185388B2 (ja) * 2016-11-21 2022-12-07 日東電工株式会社 検査装置及び検査方法
JP7080123B2 (ja) * 2018-07-23 2022-06-03 株式会社キーエンス 画像検査装置
CN115042401B (zh) * 2022-08-16 2022-11-04 南通广信塑料机械有限公司 一种微孔发泡注塑制品的质量检测方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201035540A (en) * 2009-02-16 2010-10-01 Nissha Printing Appearance inspection apparatus and method for manufacuring resin molded article

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0650741A (ja) * 1992-07-30 1994-02-25 Kobe Steel Ltd 物体の表面検査装置
JP3247823B2 (ja) * 1995-06-26 2002-01-21 株式会社日立製作所 欠陥検査方法およびその装置並びに薄膜磁気ヘッド用の素子の製造方法
JP3749726B1 (ja) * 2005-06-01 2006-03-01 株式会社ファースト 周期性ノイズ下での低コントラスト欠陥検査方法、繰返しパターン下での低コントラスト欠陥検査方法
JP5006551B2 (ja) 2006-02-14 2012-08-22 住友化学株式会社 欠陥検査装置及び欠陥検査方法
JP5619348B2 (ja) * 2008-11-21 2014-11-05 住友化学株式会社 成形シートの欠陥検査装置
JP4726983B2 (ja) * 2009-10-30 2011-07-20 住友化学株式会社 欠陥検査システム、並びに、それに用いる、欠陥検査用撮影装置、欠陥検査用画像処理装置、欠陥検査用画像処理プログラム、記録媒体、および欠陥検査用画像処理方法
JP2013003062A (ja) 2011-06-20 2013-01-07 Sumitomo Chemical Co Ltd 画像生成装置および欠陥検査装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201035540A (en) * 2009-02-16 2010-10-01 Nissha Printing Appearance inspection apparatus and method for manufacuring resin molded article

Also Published As

Publication number Publication date
TW201435332A (zh) 2014-09-16
KR20150104611A (ko) 2015-09-15
JP6191622B2 (ja) 2017-09-06
CN104919305A (zh) 2015-09-16
JPWO2014112652A1 (ja) 2017-01-19
CN104919305B (zh) 2017-05-10
WO2014112652A1 (ja) 2014-07-24
KR102110006B1 (ko) 2020-05-12

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