TWI597859B - 用於封裝一入射輻射檢測器的方法及封裝的入射輻射檢測器 - Google Patents

用於封裝一入射輻射檢測器的方法及封裝的入射輻射檢測器 Download PDF

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TWI597859B
TWI597859B TW100138076A TW100138076A TWI597859B TW I597859 B TWI597859 B TW I597859B TW 100138076 A TW100138076 A TW 100138076A TW 100138076 A TW100138076 A TW 100138076A TW I597859 B TWI597859 B TW I597859B
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detector
opaque
layer
cover
seal ring
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TW100138076A
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TW201234633A (en
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羅蘭德Ｗ 葛奇
史帝芬Ｈ 布萊克
湯瑪斯Ａ 柯席恩
布 迪柏
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雷神公司
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    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/04—Casings
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    • H01L2924/11—Device type
    • H01L2924/14—Integrated circuits

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TW100138076A 2010-10-21 2011-10-20 用於封裝一入射輻射檢測器的方法及封裝的入射輻射檢測器 TWI597859B (zh)

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US20120096813A1 (en) 2012-04-26
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WO2012054687A1 (en) 2012-04-26
US8809784B2 (en) 2014-08-19
EP2630660A1 (en) 2013-08-28
EP2630660B1 (en) 2018-10-03
IL225715A0 (en) 2013-06-27
TW201234633A (en) 2012-08-16

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