TWI583942B - Check the device and check the method - Google Patents

Check the device and check the method Download PDF

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Publication number
TWI583942B
TWI583942B TW105108180A TW105108180A TWI583942B TW I583942 B TWI583942 B TW I583942B TW 105108180 A TW105108180 A TW 105108180A TW 105108180 A TW105108180 A TW 105108180A TW I583942 B TWI583942 B TW I583942B
Authority
TW
Taiwan
Prior art keywords
hue value
workpiece
distribution profile
peaks
inspection
Prior art date
Application number
TW105108180A
Other languages
English (en)
Chinese (zh)
Other versions
TW201641932A (zh
Inventor
Tadayuki Fujiwara
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of TW201641932A publication Critical patent/TW201641932A/zh
Application granted granted Critical
Publication of TWI583942B publication Critical patent/TWI583942B/zh

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  • Spectrometry And Color Measurement (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
TW105108180A 2015-05-20 2016-03-17 Check the device and check the method TWI583942B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015102588A JP6319184B2 (ja) 2015-05-20 2015-05-20 検査装置及び検査方法

Publications (2)

Publication Number Publication Date
TW201641932A TW201641932A (zh) 2016-12-01
TWI583942B true TWI583942B (zh) 2017-05-21

Family

ID=57580835

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105108180A TWI583942B (zh) 2015-05-20 2016-03-17 Check the device and check the method

Country Status (2)

Country Link
JP (1) JP6319184B2 (ja)
TW (1) TWI583942B (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111413352A (zh) * 2020-05-25 2020-07-14 广西我的科技有限公司 人造板表面缺陷检测装置和方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007102270A (ja) * 2005-09-30 2007-04-19 Omron Corp 画像処理装置
TW200741194A (en) * 2006-03-10 2007-11-01 Omron Tateisi Electronics Co Apparatus and method for inspecting defects
JP2009080004A (ja) * 2007-09-26 2009-04-16 Mitsubishi Electric Engineering Co Ltd 検査装置
US20120326037A1 (en) * 2010-02-26 2012-12-27 Aisin Seiki Kabushiki Kaisha Coating film inspection apparatus and inspection method

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09203664A (ja) * 1996-01-25 1997-08-05 C G A Kk 色合い検査装置
JP3181543B2 (ja) * 1997-10-31 2001-07-03 東京電力株式会社 表面処理された鋼材の劣化・腐食検出判定方法
EP1096249B1 (en) * 1999-10-26 2013-05-01 Hitachi-GE Nuclear Energy, Ltd. Nondestructive flaw inspection method and apparatus
JP4250931B2 (ja) * 2002-08-30 2009-04-08 日本電気株式会社 外観検査装置および外観検査方法
JP2004144545A (ja) * 2002-10-23 2004-05-20 Sumitomo Chem Co Ltd 色むらの検査方法
JP5006147B2 (ja) * 2007-09-21 2012-08-22 株式会社名南製作所 木材の検査方法及び装置及びプログラム

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007102270A (ja) * 2005-09-30 2007-04-19 Omron Corp 画像処理装置
TW200741194A (en) * 2006-03-10 2007-11-01 Omron Tateisi Electronics Co Apparatus and method for inspecting defects
JP2009080004A (ja) * 2007-09-26 2009-04-16 Mitsubishi Electric Engineering Co Ltd 検査装置
US20120326037A1 (en) * 2010-02-26 2012-12-27 Aisin Seiki Kabushiki Kaisha Coating film inspection apparatus and inspection method

Also Published As

Publication number Publication date
JP2016217865A (ja) 2016-12-22
TW201641932A (zh) 2016-12-01
JP6319184B2 (ja) 2018-05-09

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