TWI573200B - Method for producing electronic component, bump-formed plate-like member, electronic component, and method for producing bump-formed plate-like member - Google Patents

Method for producing electronic component, bump-formed plate-like member, electronic component, and method for producing bump-formed plate-like member Download PDF

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TWI573200B
TWI573200B TW104115099A TW104115099A TWI573200B TW I573200 B TWI573200 B TW I573200B TW 104115099 A TW104115099 A TW 104115099A TW 104115099 A TW104115099 A TW 104115099A TW I573200 B TWI573200 B TW I573200B
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plate
resin
electrode
protruding electrode
manufacturing
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TW104115099A
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TW201604973A (en
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岡田博和
浦上浩
天川剛
三浦宗男
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Towa股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D1/00Electroforming
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/565Moulds
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H01L23/3121Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/552Protection against radiation, e.g. light or electromagnetic waves
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/93Batch processes
    • H01L24/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H01L24/97Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0201Thermal arrangements, e.g. for cooling, heating or preventing overheating
    • H05K1/0203Cooling of mounted components
    • H05K1/0209External configuration of printed circuit board adapted for heat dissipation, e.g. lay-out of conductors, coatings
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0213Electrical arrangements not otherwise provided for
    • H05K1/0216Reduction of cross-talk, noise or electromagnetic interference
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/06Thermal details
    • H05K2201/066Heatsink mounted on the surface of the PCB
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10227Other objects, e.g. metallic pieces
    • H05K2201/10371Shields or metal cases
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/28Applying non-metallic protective coatings
    • H05K3/284Applying non-metallic protective coatings for encapsulating mounted components

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Electromagnetism (AREA)
  • Manufacturing & Machinery (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Materials Engineering (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Description

電子零件之製造方法、帶有突起電極之板狀構件、電子零件及帶有突起電極之板狀構件之製造方法 Method for manufacturing electronic component, plate member with protruding electrode, electronic component, and manufacturing method of plate member with protruding electrode

本發明係關於一種電子零件之製造方法、帶有突起電極之板狀構件、電子零件及帶有突起電極之板狀構件之製造方法。 The present invention relates to a method of manufacturing an electronic component, a plate member having a protruding electrode, an electronic component, and a method of manufacturing a plate member having a protruding electrode.

於多數情況下,IC(integrated circuit,積體電路)、半導體晶片等電子零件作為被樹脂密封之電子零件而成形並使用。 In many cases, an electronic component such as an IC (integrated circuit) or a semiconductor wafer is formed and used as an electronic component sealed by a resin.

將上述晶片樹脂密封之電子零件(亦稱為作為成品之電子零件或封裝體等;以下,有簡稱為「電子零件」之情況)有於樹脂中埋入通孔電極而形成之情況。該通孔電極能夠以如下方式形成:例如於被樹脂密封之電子零件(封裝體)之上述樹脂,從封裝體頂面形成用於形成通孔之孔或槽(以下稱為「通孔形成孔」),並使用上述通孔電極形成材料(例如,電鍍、屏蔽材料等)填充上述通孔形成孔。上述通孔形成孔例如能夠藉由從封裝體頂面對上述樹脂進行雷射光照射而形成。又,作為用於形成通孔電極之其他方法,提出了如下一種方法:將具有突起之金屬構造體之上述突起與半導體晶片一同進行樹脂密封後,去除上述金屬構造體之上述突起以外之部分之方法(專利文獻1)。於 該情形時,於電子零件中,只有上述金屬構造體之上述突起以樹脂密封之狀態殘留,其成為通孔電極。 An electronic component in which the wafer resin is sealed (also referred to as an electronic component or a package as a finished product; hereinafter, simply referred to as "electronic component") may be formed by embedding a via electrode in a resin. The via electrode can be formed, for example, in the resin of the electronic component (package) sealed by the resin, and a hole or a groove for forming a through hole is formed from the top surface of the package (hereinafter referred to as "through hole forming hole" And using the above-described through-hole electrode forming material (for example, plating, shielding material, etc.) to fill the above-mentioned through hole forming holes. The through hole forming hole can be formed, for example, by irradiating laser light from the top of the package toward the resin. Further, as another method for forming the via electrode, a method is proposed in which the protrusion of the metal structure having the protrusion is resin-sealed together with the semiconductor wafer, and then the portion other than the protrusion of the metal structure is removed. Method (Patent Document 1). to In this case, in the electronic component, only the protrusion of the metal structure remains in a resin-sealed state, and this becomes a via electrode.

另一方面,電子零件有與用於排出上述晶片產生之熱量而進行冷卻之散熱板(散熱器)、或用於屏蔽上述晶片發出之電磁波之屏蔽板(遮蔽板)等板狀構件一同成形之情況(例如,專利文獻2及3)。 On the other hand, the electronic component is formed together with a heat dissipating plate (heat sink) for discharging heat generated by the wafer, or a plate member such as a shield plate (shield plate) for shielding electromagnetic waves emitted from the wafer. Case (for example, Patent Documents 2 and 3).

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

專利文獻1:日本專利特開2012-015216號公報 Patent Document 1: Japanese Patent Laid-Open Publication No. 2012-015216

專利文獻2:日本專利特開2013-187340號公報 Patent Document 2: Japanese Patent Laid-Open Publication No. 2013-187340

專利文獻3:日本專利特開2007-287937號公報 Patent Document 3: Japanese Patent Laid-Open Publication No. 2007-287937

於樹脂形成通孔形成孔之方法中,例如存在下述(1)~(5)等之問題。 In the method of forming a via hole in a resin, for example, there are problems such as the following (1) to (5).

(1)由於電子零件(封裝體)厚度偏差等,有可能無法於基板之配線圖案上準確適當地形成通孔形成孔之深度等。 (1) Due to variations in thickness of the electronic component (package), the depth of the via hole forming hole or the like may not be accurately formed on the wiring pattern of the substrate.

(2)樹脂材料所包含之填料容易殘留於基板之配線圖案上。 (2) The filler contained in the resin material is likely to remain on the wiring pattern of the substrate.

(3)隨著於上述樹脂上穿過孔形成孔之條件,可能會對搭載有晶片之基板上之配線圖案帶來損傷。 (3) The wiring pattern on the substrate on which the wafer is mounted may be damaged as the hole is formed in the resin through the hole.

(4)與上述(3)相關地,若樹脂材料之填料密度不同,則需要變更用於於上述樹脂上穿過孔形成孔之雷射之加工條件。即,通孔形成孔之形成條件之控制繁雜。 (4) In the case of the above (3), if the packing density of the resin material is different, it is necessary to change the processing conditions for the laser for forming the hole through the hole in the resin. That is, the control of the formation conditions of the through hole forming holes is complicated.

(5)由於上述(1)~(4)之影響,難以提高電子零件(封裝體)製造之良率。 (5) Due to the influence of the above (1) to (4), it is difficult to improve the yield of the electronic component (package).

另一方面,於專利文獻1之方法中,對金屬構造體之上述突起進行樹脂密封後,需要進行去除除上述金屬構造體之上述突起以外之部 分之步驟。因此,電子零件(封裝體)之製造步驟變得繁雜,並且會導致浪費材料。 On the other hand, in the method of Patent Document 1, after the protrusion of the metal structure is resin-sealed, it is necessary to remove the portion other than the protrusion of the metal structure. The steps are divided. Therefore, the manufacturing steps of the electronic component (package) become complicated and result in wasted material.

進而,於上述任一方法中,於形成通孔電極後,必須藉由電鍍等來形成板狀構件,因此導致步驟繁雜。 Further, in any of the above methods, after the via electrodes are formed, it is necessary to form the plate-like members by plating or the like, which causes complicated steps.

又,於專利文獻2及3中,記載了具有板狀構件之電子零件及其製造方法,但並沒有記載於形成通孔電極時可解決上述各方法之課題之方法。 Further, Patent Documents 2 and 3 describe an electronic component having a plate-like member and a method of manufacturing the same, but there is no description of a method for solving the problems of the above methods when forming a via electrode.

如此,能夠簡便且有效地製造具有通孔電極及板狀構件兩者之電子零件之技術還不存在。 Thus, the technique of easily and efficiently manufacturing an electronic component having both a via electrode and a plate member does not exist.

因此,本發明之目的在於提供一種能夠簡便且有效地製造具有通孔電極及板狀構件兩者之電子零件之電子零件之製造方法、帶有突起電極之板狀構件、電子零件、及帶有突起電極之板狀構件之製造方法。 Accordingly, it is an object of the present invention to provide a method of manufacturing an electronic component capable of easily and efficiently manufacturing an electronic component having both a via electrode and a plate member, a plate member having a bump electrode, an electronic component, and A method of manufacturing a plate member of a protruding electrode.

為達到上述目的,本發明之電子零件之製造方法(以下,有時會簡稱為「本發明之製造方法」)之特徵在於,其為將晶片樹脂密封之電子零件之製造方法,且所要製造之上述電子零件係包括基板、晶片、樹脂、板狀構件、及突起電極,並且於上述基板上形成有配線圖案之電子零件,上述製造方法具有用上述樹脂對上述晶片進行密封之樹脂密封步驟,於上述樹脂密封步驟中,於帶有突起電極之板狀構件之上述突起電極之固定面與上述基板之上述配線圖案之形成面之間,用上述樹脂對上述晶片進行密封,並且使上述突起電極與上述配線圖案接觸,其中,帶有突起電極之板狀構件係於上述板狀構件之單面固定有上述突起電極,並且上述突起電極包括可變形之變形部。 In order to achieve the above object, a method of manufacturing an electronic component according to the present invention (hereinafter, simply referred to as "the manufacturing method of the present invention") is characterized in that it is a method of manufacturing an electronic component in which a wafer resin is sealed, and is to be manufactured. The electronic component includes a substrate, a wafer, a resin, a plate member, and a bump electrode, and an electronic component in which a wiring pattern is formed on the substrate, wherein the manufacturing method includes a resin sealing step of sealing the wafer with the resin. In the resin sealing step, the wafer is sealed with the resin between the fixing surface of the protruding electrode of the plate-like member having the protruding electrode and the surface of the wiring pattern of the substrate, and the protruding electrode and the protruding electrode are The wiring pattern is in contact with the plate-shaped member having the protruding electrode, wherein the protruding electrode is fixed to one surface of the plate-shaped member, and the protruding electrode includes a deformable deformable portion.

本發明之帶有突起電極之板狀構件係用於本發明之上述製造方法之帶有突起電極之板狀構件,其特徵在於,上述突起電極固定於上述板狀構件之單面。 The plate-like member with a protruding electrode according to the present invention is a plate-like member having a protruding electrode according to the above-described manufacturing method of the present invention, characterized in that the protruding electrode is fixed to one surface of the plate-shaped member.

本發明之電子零件之特徵在於,其係將晶片樹脂密封之電子零件,且上述電子零件包括基板、晶片、樹脂、及本發明之上述帶有突起電極之板狀構件,上述晶片配置於上述基板上,並且被上述樹脂密封,於上述基板上之上述晶片之配置側,形成有配線圖案,上述突起電極貫通上述樹脂而與上述配線圖案接觸。 The electronic component of the present invention is characterized in that it is an electronic component in which a wafer resin is sealed, and the electronic component includes a substrate, a wafer, a resin, and the above-described plate-like member having a protruding electrode of the present invention, and the wafer is disposed on the substrate And being sealed by the resin, a wiring pattern is formed on the arrangement side of the wafer on the substrate, and the protruding electrode is in contact with the wiring pattern through the resin.

根據本發明,提供一種能夠簡便且有效地製造具有通孔電極(突起電極)及板狀構件兩者之電子零件之電子零件之製造方法、帶有突起電極之板狀構件、電子零件、及帶有突起電極之板狀構件之製造方法。 According to the present invention, there is provided a method of manufacturing an electronic component capable of easily and efficiently manufacturing an electronic component having both a via electrode (protrusion electrode) and a plate member, a plate member having a protruding electrode, an electronic component, and a tape A method of manufacturing a plate member having a protruding electrode.

10‧‧‧帶有突起電極之板狀構件 10‧‧‧Plate-like members with protruding electrodes

11‧‧‧板狀構件 11‧‧‧ Plate-like members

11a‧‧‧散熱片 11a‧‧‧Heatsink

11b‧‧‧壁狀構件 11b‧‧‧Wall members

11c‧‧‧樹脂容納部 11c‧‧‧Resin housing

12‧‧‧突起電極 12‧‧‧ protruding electrode

12a‧‧‧突起電極之下部 12a‧‧‧Under the protruding electrode

12b‧‧‧貫通孔 12b‧‧‧through hole

12c‧‧‧突起 12c‧‧‧ Protrusion

12A‧‧‧變形部 12A‧‧‧Deformation Department

12B‧‧‧剛性部 12B‧‧‧Rigid Department

13‧‧‧孔 13‧‧‧ hole

20‧‧‧電子零件(已樹脂密封之成品電子零件) 20‧‧‧Electronic parts (recycled finished electronic parts)

20'‧‧‧電子零件(已樹脂密封之電子零件) 20'‧‧‧Electronic parts (electronic parts that have been sealed with resin)

21‧‧‧基板 21‧‧‧Substrate

22‧‧‧配線圖案 22‧‧‧Wiring pattern

31‧‧‧晶片(樹脂密封前之電子零件) 31‧‧‧ wafer (electronic parts before resin sealing)

41‧‧‧樹脂(密封樹脂) 41‧‧‧Resin (sealing resin)

41a‧‧‧樹脂(液態樹脂、顆粒樹脂等樹脂材料) 41a‧‧‧Resin (resin material such as liquid resin or granular resin)

41b‧‧‧樹脂(流動性樹脂) 41b‧‧‧Resin (liquid resin)

50‧‧‧成形模 50‧‧‧ Forming die

51‧‧‧上模 51‧‧‧上模

52‧‧‧下模 52‧‧‧Down

53‧‧‧柱塞 53‧‧‧Plunger

54‧‧‧加料腔(孔) 54‧‧‧feeding cavity (hole)

55‧‧‧樹脂通道 55‧‧‧Resin channel

56‧‧‧模腔 56‧‧‧ cavity

57‧‧‧基板設置部 57‧‧‧Substrate setting department

60‧‧‧樹脂供給單元 60‧‧‧Resin supply unit

61‧‧‧樹脂供給部 61‧‧‧Resin Supply Department

62‧‧‧下部閘門 62‧‧‧lower gate

70‧‧‧矩形形狀之框(框體) 70‧‧‧Rectangle frame (frame)

100‧‧‧離型膜 100‧‧‧ release film

101‧‧‧上模 101‧‧‧上模

101a‧‧‧夾具 101a‧‧‧ fixture

102‧‧‧中模(中間板) 102‧‧‧中模(middle board)

102a‧‧‧O型環 102a‧‧‧O-ring

103‧‧‧上模之孔(貫通孔) 103‧‧‧ hole in the upper die (through hole)

104‧‧‧輥 104‧‧‧ Roll

107‧‧‧減壓(抽真空) 107‧‧‧Decompression (vacuum)

111‧‧‧下模 111‧‧‧Down

111a‧‧‧下模腔底面構件 111a‧‧‧ Lower cavity cavity bottom member

111b‧‧‧下模腔 111b‧‧‧ lower cavity

111c、111d‧‧‧空隙(吸附孔) 111c, 111d‧‧‧ gap (adsorption hole)

112、113‧‧‧下模外周構件(下模本體) 112, 113‧‧‧ lower die outer member (lower die body)

114、115‧‧‧基於減壓之吸附 114, 115‧‧‧Based on decompression adsorption

116‧‧‧空氣 116‧‧‧ Air

121‧‧‧下模 121‧‧‧下模

122‧‧‧上模(安裝器) 122‧‧‧Upper (installer)

123‧‧‧真空腔 123‧‧‧vacuum chamber

1001‧‧‧上模 1001‧‧‧上模

1001a‧‧‧夾具 1001a‧‧‧ fixture

1003‧‧‧上模之孔(貫通孔) 1003‧‧‧ hole in the upper die (through hole)

1007‧‧‧減壓(抽真空) 1007‧‧‧Decompression (vacuum)

1011‧‧‧下模 1011‧‧‧Down

1011a‧‧‧下模腔底面構件 1011a‧‧‧ Lower cavity cavity bottom member

1011b‧‧‧下模腔 1011b‧‧‧ lower cavity

1011c、1011d‧‧‧空隙(吸附孔) 1011c, 1011d‧‧‧ gap (adsorption hole)

1012‧‧‧下模外周構件(下模本體) 1012‧‧‧ Lower mold outer member (lower mold body)

1012a‧‧‧O型環 1012a‧‧‧O-ring

1014‧‧‧基於減壓之吸附 1014‧‧‧Based on decompression adsorption

1016‧‧‧空氣 1016‧‧‧ Air

2001‧‧‧上模 2001‧‧‧上模

2001a‧‧‧基板設置部 2001a‧‧‧Substrate Setup Department

2002‧‧‧上模底板 2002‧‧‧Upper mold base plate

2003‧‧‧上模之孔(貫通孔) 2003‧‧‧ hole in the upper die (through hole)

2004‧‧‧上模外氣隔斷構件 2004‧‧‧External air partition member

2004a、2004b‧‧‧O型環 2004a, 2004b‧‧ O-ring

2007‧‧‧減壓(抽真空) 2007‧‧‧Decompression (vacuum)

2010‧‧‧下模底板 2010‧‧‧ Lower mold base plate

2011‧‧‧下模 2011‧‧‧Model

2011a‧‧‧下模腔底面構件 2011a‧‧‧ Lower cavity cavity bottom member

2011b‧‧‧下模腔 2011b‧‧‧ lower cavity

2011c‧‧‧空隙(吸附孔) 2011c‧‧‧Void (adsorption hole)

2012‧‧‧下模外周構件 2012‧‧‧Down die peripheral components

2012a‧‧‧彈性構件 2012a‧‧‧Flexible components

2013‧‧‧下模外氣隔斷構件 2013‧‧‧Under-mold air partition member

2013a‧‧‧O型環 2013a‧‧‧O-ring

2014‧‧‧基於減壓之吸附 2014‧‧‧Based on decompression adsorption

圖1(A)、(B)係表示本發明之帶有突起電極之板狀構件之構造之一例之立體圖。 1(A) and 1(B) are perspective views showing an example of a structure of a plate-like member having a protruding electrode of the present invention.

圖2(A)、(B)係舉例表示本發明之帶有突起電極之板狀構件中之突起電極之構造之立體圖。 2(A) and 2(B) are perspective views showing the structure of a protruding electrode in a plate-like member having a protruding electrode of the present invention.

圖3(A)~(D)係表示本發明之帶有突起電極之板狀構件中之突起電極之構造之另一例之立體圖。 3(A) to 3(D) are perspective views showing another example of the structure of the protruding electrode in the plate-like member having the protruding electrode of the present invention.

圖4(A)~(D)係表示本發明之帶有突起電極之板狀構件中之突起電極之構造之又一例之立體圖。 4(A) to 4(D) are perspective views showing still another example of the structure of the protruding electrode in the plate-like member having the protruding electrode of the present invention.

圖5(A)~(C)係模式性表示本發明之電子零件之構造及其製造步驟之一例之步驟剖視圖。 5(A) to 5(C) are schematic cross sectional views showing an example of a structure of an electronic component of the present invention and a manufacturing procedure thereof.

圖6係舉例表示採用轉移成形之本發明之製造方法之剖視圖。 Fig. 6 is a cross-sectional view showing, by way of example, a manufacturing method of the present invention by transfer molding.

圖7係舉例表示採用壓縮成形之本發明之製造方法中之一例之一步驟之剖視圖。 Fig. 7 is a cross-sectional view showing, by way of example, a step of one of the manufacturing methods of the present invention by compression molding.

圖8係舉例表示與圖7相同之製造方法中另一步驟之剖視圖。 Fig. 8 is a cross-sectional view showing another step in the same manufacturing method as Fig. 7 as an example.

圖9係舉例表示與圖7相同之製造方法中又一步驟之剖視圖。 Fig. 9 is a cross-sectional view showing still another step in the same manufacturing method as Fig. 7.

圖10係舉例表示與圖7相同之製造方法中又一步驟之剖視圖。 Fig. 10 is a cross-sectional view showing still another step in the same manufacturing method as Fig. 7.

圖11係舉例表示採用壓縮成形之本發明之製造方法中之另一步驟之剖視圖。 Figure 11 is a cross-sectional view showing another step in the manufacturing method of the present invention by compression molding.

圖12係舉例表示與圖11相同之製造方法中另一步驟之剖視圖。 Fig. 12 is a cross-sectional view showing another step in the same manufacturing method as Fig. 11 as an example.

圖13係舉例表示採用壓縮成形之本發明之製造方法中又一例之一步驟之剖視圖。 Fig. 13 is a cross-sectional view showing, by way of example, a step of still another example of the manufacturing method of the present invention by compression molding.

圖14係舉例表示與圖13相同之製造方法中另一步驟之剖視圖。 Fig. 14 is a cross-sectional view showing another step in the same manufacturing method as Fig. 13 as an example.

圖15係舉例表示與圖13相同之製造方法中又一步驟之剖視圖。 Fig. 15 is a cross-sectional view showing still another step in the same manufacturing method as Fig. 13;

圖16係舉例表示與圖13相同之製造方法中又一步驟之剖視圖。 Fig. 16 is a cross-sectional view showing still another step in the same manufacturing method as Fig. 13;

圖17係舉例表示採用壓縮成形之本發明之製造方法中又一例之一步驟之剖視圖。 Fig. 17 is a cross-sectional view showing, by way of example, a step of still another example of the manufacturing method of the present invention by compression molding.

圖18係舉例表示採用壓縮成形之本發明之製造方法中又一例之一步驟之剖視圖。 Fig. 18 is a cross-sectional view showing, by way of example, a step of still another example of the manufacturing method of the present invention by compression molding.

圖19係舉例表示本發明之製造方法中又一例之剖視圖。 Fig. 19 is a cross-sectional view showing still another example of the manufacturing method of the present invention.

圖20係舉例表示本發明之製造方法中又一例之剖視圖。 Fig. 20 is a cross-sectional view showing still another example of the manufacturing method of the present invention.

圖21係舉例表示採用壓縮成形之本發明之製造方法中又一例之一步驟之剖視圖。 Fig. 21 is a cross-sectional view showing, by way of example, a step of still another example of the manufacturing method of the present invention by compression molding.

圖22係舉例表示採用壓縮成形之本發明之製造方法中又一例之一步驟之剖視圖。 Fig. 22 is a cross-sectional view showing, by way of example, a step of still another example of the manufacturing method of the present invention by compression molding.

圖23係舉例表示採用壓縮成形之本發明之製造方法中又一例之剖視圖。 Fig. 23 is a cross-sectional view showing still another example of the manufacturing method of the present invention by compression molding.

圖24係舉例表示使用壓縮成形之本發明之製造方法中又一例之剖視圖。 Fig. 24 is a cross-sectional view showing still another example of the manufacturing method of the present invention using compression molding.

接著,舉例對本發明進行進一步詳細說明。但是,本發明並不限定於以下之說明。再者,如下所述,於本發明中,使用由具有變形部之突起電極及板狀構件構成之「具有變形部之帶有突起電極之板狀構件」。又,於本發明中,「晶片」係指樹脂密封前之電子零件,具體而言,例如,可舉出IC、半導體晶片等晶片狀之電子零件。於本發明中,方便起見將樹脂密封前之電子零件稱為「晶片」,此係為了將其與樹脂密封後之電子零件進行區分。但是,本發明中之「晶片」若為樹脂密封前之電子零件,則無特別限定,亦可不為晶片狀之電子零件。又,於本發明中,於僅稱作「電子零件」之情形時,除非特別指明,均指將上述晶片樹脂密封後之電子零件(作為成品之電子零件)。 Next, the present invention will be described in further detail by way of examples. However, the present invention is not limited to the following description. In the present invention, as described below, the "plate-like member having the protruding electrode having the deformed portion" composed of the protruding electrode having the deformed portion and the plate-like member is used. In the present invention, the term "wafer" refers to an electronic component before resin sealing. Specifically, for example, a wafer-shaped electronic component such as an IC or a semiconductor wafer can be cited. In the present invention, the electronic component before the resin sealing is referred to as a "wafer" for convenience, and this is to distinguish the electronic component after sealing with the resin. However, the "wafer" in the present invention is not particularly limited as long as it is an electronic component before resin sealing, and may not be a wafer-shaped electronic component. Further, in the present invention, when it is simply referred to as "electronic component", unless otherwise specified, it refers to an electronic component (as a finished electronic component) in which the wafer resin is sealed.

於本發明之製造方法中,上述突起電極之數量為任意,無特別限定,可為一個,亦可為複數個。上述突起電極之形狀無特別限定。又,上述突起電極為複數個之情形時,其等形狀可互相相同,亦可互不相同。例如,上述突起電極之至少一個為閃電形突起電極亦可。從與上述板狀構件之面方向平行之方向觀察上述閃電形突起電極時,至少上述變形部彎曲成閃電形,藉此上述變形部於與上述板狀構件之面方向垂直之方向上收縮變形亦可。於上述閃電形突起電極中,至少上述變形部為如上所述之閃電形即可,上述變形部以外之部分是不是閃電形均可。更具體而言,上述閃電形突起電極之形狀例如可為下述之圖2之(A)~(B)或圖4之(A)~(C)之形狀。又,例如,上述突起電極中至少一個係帶貫通孔之突起電極亦可。更具體而言,上述帶貫通孔之突起電極上之上述貫通孔為於與上述板狀構件之面方向平行之方向(與板面平行之方向)上貫通之貫通孔,並且上述貫通孔之周圍係可於 與上述板狀構件之面方向垂直之方向上收縮變形之上述變形部亦可。就上述帶貫通孔之突起電極而言,於與固定於上述板狀構件之一端成相反側之一端,具有於與上述板狀構件之板面垂直之方向上突出之突起亦可。更具體而言,此種帶貫通孔之突起電極之形狀例如可為下述之圖3之(A)~(C)或圖4之(A)~(C)之形狀。又,就本發明之上述帶有突起電極之板狀構件而言,上述突起電極之上述變形部之變形可為彈性變形,亦可為塑性變形。即,上述變形部可為可彈性變形之部分(彈性部),亦可為可塑性變形之部分(塑性部)。上述變形為彈性變形還是塑性變形,例如,根據上述突起電極之材質等決定。 In the manufacturing method of the present invention, the number of the protruding electrodes is arbitrary, and is not particularly limited, and may be one or plural. The shape of the above-mentioned protruding electrode is not particularly limited. Further, when the number of the protruding electrodes is plural, the shapes may be the same or different from each other. For example, at least one of the protruding electrodes may be a lightning-shaped protruding electrode. When the lightning-shaped protruding electrode is viewed from a direction parallel to a surface direction of the plate-like member, at least the deformed portion is bent into a lightning shape, whereby the deformed portion is contracted and deformed in a direction perpendicular to a surface direction of the plate-shaped member. can. In the above-described lightning-shaped protruding electrode, at least the deformed portion may have a lightning shape as described above, and a portion other than the deformed portion may be a lightning bolt. More specifically, the shape of the above-described lightning-shaped protruding electrode can be, for example, the shapes of (A) to (B) of FIG. 2 or (A) to (C) of FIG. 4 described below. Further, for example, at least one of the protruding electrodes may be a protruding electrode of the through hole. More specifically, the through hole on the protruding electrode with the through hole is a through hole penetrating in a direction parallel to the surface direction of the plate member (a direction parallel to the plate surface), and the periphery of the through hole Can be The deformation portion that is contracted and deformed in a direction perpendicular to the surface direction of the plate-like member may be used. The protruding electrode with the through hole may have a protrusion that protrudes in a direction perpendicular to a plate surface of the plate-like member at one end opposite to one end of the plate-shaped member. More specifically, the shape of the protruding electrode with the through hole may be, for example, the shapes of (A) to (C) of FIG. 3 or (A) to (C) of FIG. 4 described below. Further, in the above-described plate-shaped member having a protruding electrode according to the present invention, the deformation of the deformed portion of the protruding electrode may be elastic deformation or plastic deformation. That is, the deformed portion may be an elastically deformable portion (elastic portion) or a plastically deformable portion (plastic portion). The deformation is elastic deformation or plastic deformation, and is determined, for example, according to the material of the projection electrode or the like.

於本發明之製造方法中,上述突起電極之至少一個亦可係具有柱狀形狀之柱狀突起電極。作為上述柱狀突起電極之形狀,例如可舉出圓柱狀、稜柱狀、圓錐狀、棱錐狀、圓錐台狀、棱錐台狀等。再者,例如,於使用圓柱狀之突起電極之情形時,其突起電極整體可為可於與板狀構件之面方向垂直之方向上收縮變形之變形部。又,於此情形時,例如,上述圓柱狀之側面可整體膨脹呈撓曲桶狀。 In the manufacturing method of the present invention, at least one of the protruding electrodes may be a columnar protruding electrode having a columnar shape. Examples of the shape of the columnar projection electrode include a columnar shape, a prismatic shape, a conical shape, a pyramid shape, a truncated cone shape, and a truncated cone shape. Further, for example, in the case of using a columnar protruding electrode, the entire protruding electrode may be a deformed portion that can be contracted and deformed in a direction perpendicular to the surface direction of the plate member. Further, in this case, for example, the cylindrical side surface may be integrally expanded in a flexible barrel shape.

又,於本發明之製造方法中,上述突起電極之至少一個亦可係板狀突起電極。於此情形時,上述晶片為複數個,於上述樹脂密封步驟中,藉由上述板狀突起電極將上述基板劃分為複數個區域,並且於各個上述區域內,對上述晶片進行樹脂密封亦可。又,較佳為,上述板狀突起電極具有貫通孔及突起,上述貫通孔於與上述板狀構件之板面平行之方向上貫通上述板狀突起電極,上述貫通孔之周圍係可於與上述板狀構件之面方向相垂直之方向上收縮變形之上述變形部,於上述板狀突起電極之與固定於上述板狀構件之一端成相反側之一端,上述突起於與上述板狀構件之板面垂直之方向上突出。 Further, in the manufacturing method of the present invention, at least one of the protruding electrodes may be a plate-like protruding electrode. In this case, the plurality of wafers are plural. In the resin sealing step, the substrate is divided into a plurality of regions by the plate-like projection electrodes, and the wafer may be resin-sealed in each of the regions. Further, preferably, the plate-like protruding electrode has a through hole and a protrusion, and the through hole penetrates the plate-shaped protruding electrode in a direction parallel to a plate surface of the plate-shaped member, and the periphery of the through hole is The deformation portion which is contracted and deformed in a direction in which the surface direction of the plate member is perpendicular to the plate is formed at one end of the plate-like projection electrode opposite to one end of the plate-shaped member, and the protrusion is formed on the plate and the plate member. The surface protrudes in the direction perpendicular to the surface.

於本發明之製造方法中,上述板狀構件無特別限定,但較佳為散熱板(散熱器)或屏蔽板(遮蔽板)。上述屏蔽板例如可為用於屏蔽從 上述晶片釋放出之電磁波之零件。上述散熱板較佳於與上述突起電極之固定面成相反側之一面具有散熱片。又,對於上述板狀構件之形狀而言,除了固定有上述突起電極以外,無特別限定。例如,於上述板狀構件係散熱板之情形時,就上述散熱板而言,除了上述突起電極以外,用於使散熱效率良好之突起係一個或結合複數個之形狀(例如,散熱片(fin)形狀)等亦可。上述板狀構件之材質亦無特別限定,於上述板狀構件係散熱板或屏蔽板之情形時,例如能夠使用金屬材料、陶瓷材料、樹脂、及金屬蒸鍍膜等。上述金屬蒸鍍膜無特別限定,例如可為將鋁、銀等蒸鍍於膜上之金屬蒸鍍膜。又,上述突起電極之材質亦無特別限定,例如能夠使用金屬材料、陶瓷材料、及樹脂等。作為上述金屬材料,無特別限定,例如可舉出:不鏽鋼、坡莫合金(鐵與鎳之合金)等鐵系材料;黃銅、銅鉬合金、及鈹銅等銅系材料;杜拉鋁等鋁系材料。作為上述陶瓷材料,無特別限定,例如可舉出氮化鋁等氧化鋁系材料、氮化矽等矽系材料、及氧化鋯系材料。作為上述樹脂,無特別限定,例如可舉出:彈性體樹脂等橡膠系材料;於矽系之基體中混合傳導性材料之材料;及對該等材料進行擠壓成形或射出成形之樹脂材料等。又,於上述帶有突起電極之板狀構件中,對上述板狀構件之表面等進行電鍍、塗裝等表面處理,從而形成導電層亦可。再者,上述板狀構件亦可係具有某些功能之功能構件(作用構件)。例如,於上述板狀構件係散熱板(散熱器)之情形時,其係具有散熱功能(散熱作用)之功能構件(作用構件);於上述板狀構件係屏蔽板(遮蔽板)之情形時,其係具有屏蔽功能(屏蔽作用)之功能構件(作用構件)。 In the manufacturing method of the present invention, the plate member is not particularly limited, but is preferably a heat sink (heat sink) or a shield plate (shield plate). The above shielding plate can be used, for example, for shielding from The part of the electromagnetic wave released by the above wafer. Preferably, the heat dissipation plate has a heat sink on one side opposite to the fixing surface of the protruding electrode. Further, the shape of the plate-shaped member is not particularly limited except that the protruding electrode is fixed. For example, in the case of the above-mentioned plate-like member heat-dissipating plate, in addition to the above-mentioned protruding electrode, the above-mentioned heat-dissipating plate is used for one or a plurality of shapes for which heat-dissipating efficiency is good (for example, a fin (fin) )))). The material of the plate-like member is not particularly limited, and in the case of the plate-like member-based heat dissipation plate or the shield plate, for example, a metal material, a ceramic material, a resin, a metal deposition film, or the like can be used. The metal deposition film is not particularly limited, and may be, for example, a metal deposition film obtained by depositing aluminum, silver, or the like on a film. Further, the material of the protruding electrode is not particularly limited, and for example, a metal material, a ceramic material, a resin, or the like can be used. The metal material is not particularly limited, and examples thereof include iron-based materials such as stainless steel and permalloy (alloys of iron and nickel); copper-based materials such as brass, copper-molybdenum alloy, and beryllium copper; Aluminum material. The ceramic material is not particularly limited, and examples thereof include an alumina-based material such as aluminum nitride, a lanthanoid material such as tantalum nitride, and a zirconia-based material. The resin is not particularly limited, and examples thereof include a rubber-based material such as an elastomer resin, a material in which a conductive material is mixed in a matrix of a lanthanoid system, and a resin material obtained by extrusion molding or injection molding of the materials. . Further, in the plate-like member having the protruding electrodes, the surface of the plate-like member may be subjected to surface treatment such as plating or coating to form a conductive layer. Furthermore, the above-mentioned plate-shaped member may be a functional member (acting member) having some functions. For example, in the case where the above-mentioned plate member is a heat dissipation plate (heat sink), it is a functional member (acting member) having a heat dissipation function (heat dissipation function); in the case where the above plate member is a shield plate (shield plate) It is a functional member (acting member) having a shielding function (shielding function).

於上述樹脂密封步驟中,樹脂密封所使用之方法(成形方法)無特別限定,例如可以係轉移成形法、壓縮成形法等任意一種方法。 In the resin sealing step, the method (forming method) used for the resin sealing is not particularly limited, and for example, any one of a transfer molding method and a compression molding method may be employed.

於上述樹脂密封步驟採用壓縮成形之情形時,本發明之製造方法可進而包括將上述樹脂載置於上述帶有突起電極之板狀構件之固定 有上述突起電極之一面上之樹脂載置步驟。又,於此情形時,本發明之製造方法亦可進而包括將上述帶有突起電極之板狀構件搬送至成形模之模腔位置之搬送步驟。又,於上述模腔內,上述晶片浸漬於載置於上述板狀構件上之上述樹脂中之狀態下,將上述樹脂與上述帶有突起電極之板狀構件及上述晶片一同壓縮成形,藉此實施上述樹脂密封步驟亦可。 In the case where the resin sealing step is performed by compression molding, the manufacturing method of the present invention may further comprise fixing the resin to the plate member having the protruding electrode. There is a resin mounting step on one of the above-mentioned bump electrodes. Further, in this case, the manufacturing method of the present invention may further include a transfer step of transporting the plate-like member having the protruding electrode to the cavity position of the molding die. Further, in the cavity, the wafer is immersed in the resin placed on the plate-like member, and the resin is compression-molded together with the plate-shaped member having the protruding electrode and the wafer. It is also possible to carry out the above resin sealing step.

上述樹脂載置步驟及上述搬送步驟之順序無特別限定,先進行其中任意一個步驟亦可,同時進行亦可。例如,於上述搬送步驟中,將上述樹脂於其載置於上述帶有突起電極之板狀構件上之狀態下,與上述帶有突起電極之板狀構件一同搬送至上述成形模模腔之位置亦可。或者,於上述搬送步驟中,將上述帶有突起電極之板狀構件於未載置樹脂之狀態下,搬送至上述成形模之模腔之位置亦可。於此情形時,本發明之製造方法亦可進而包括於進行上述樹脂載置步驟之前,於上述模腔內對上述帶有突起電極之板狀構件進行加熱之加熱步驟。然後,於上述帶有突起電極之板狀構件被加熱之狀態下,於上述模腔內實施上述樹脂載置步驟亦可。 The order of the resin mounting step and the above-described transport step is not particularly limited, and any one of the steps may be performed at the same time. For example, in the above-described transfer step, the resin is placed on the plate-shaped member having the protruding electrode and conveyed to the position of the molding cavity together with the plate-shaped member having the protruding electrode. Also. Alternatively, in the above-described transfer step, the plate-like member having the protruding electrode may be conveyed to the cavity of the molding die without being placed on the resin. In this case, the manufacturing method of the present invention may further include a heating step of heating the plate-like member having the protruding electrodes in the cavity before the resin mounting step. Then, the resin mounting step may be performed in the cavity in a state where the plate-like member having the protruding electrode is heated.

於上述搬送步驟中,於將上述帶有突起電極之板狀構件中固定有上述突起電極之一面朝上而載置於離型膜上之狀態下,將上述帶有突起電極之板狀構件向上述成形模之模腔內搬送亦可。於此情形時,於上述搬送步驟中,於框體與上述帶有突起電極之板狀構件一同載置於上述離型膜上,並且上述帶有突起電極之板狀構件被上述框體包圍之狀態下,將上述帶有突起電極之板狀構件向上述成形模之模腔內搬送亦可。於上述樹脂載置步驟中,較佳為,於上述框體與上述帶有突起電極之板狀構件一同載置於上述離型膜上,並且上述帶有突起電極之板狀構件被上述框體包圍之狀態下,向由上述帶有突起電極之板狀構件及上述框體包圍之空間內供給上述樹脂,藉此將上述樹脂載置於 上述突起電極之固定面上。於此種情形時,上述樹脂載置步驟及上述搬送步驟之順序無特別限定,先實施其中任意一個步驟亦可,同時實施亦可,但較佳為,於上述搬送步驟之前進行上述樹脂載置步驟。 In the above-described transfer step, the plate-like member with the protruding electrode is placed in a state in which one of the protruding electrodes is fixed to the release film and the projection member is placed on the release film. It may be conveyed into the cavity of the above-mentioned forming mold. In this case, in the transporting step, the frame body is placed on the release film together with the plate-like member having the protruding electrode, and the plate-shaped member having the protruding electrode is surrounded by the frame. In this state, the plate-like member having the protruding electrode may be conveyed into the cavity of the molding die. Preferably, in the resin mounting step, the frame body is placed on the release film together with the plate-like member having the protruding electrode, and the plate-shaped member having the protruding electrode is formed by the frame In a state of being surrounded, the resin is supplied into a space surrounded by the plate-like member having the protruding electrode and the frame, whereby the resin is placed thereon. The fixing surface of the above protruding electrode. In this case, the order of the resin mounting step and the transport step is not particularly limited, and any one of the steps may be carried out at the same time. However, it is preferable to carry out the resin mounting before the transport step. step.

又,上述帶有突起電極之板狀構件之與固定有上述突起電極之表面成相反側之表面,藉由黏著劑固定於上述離型膜上亦可。 Further, the surface of the plate-like member having the protruding electrode and the surface opposite to the surface on which the protruding electrode is fixed may be fixed to the release film by an adhesive.

進行上述搬送步驟之搬送單元可為如下單元:於載置有上述樹脂之上述板狀構件載置於離型膜上之狀態下,將上述樹脂向上述成形模之模腔內搬送之單元。於此情形時,進行上述樹脂密封之樹脂密封單元可為如下單元:具有離型膜吸附單元,並且於使上述離型膜吸附於上述離型膜吸附單元之狀態下,進行上述壓縮成形之單元。又,上述成形模無特別限定,例如係金屬模具或陶瓷模具。 The conveying unit that performs the above-described conveying step may be a unit that conveys the resin into the cavity of the molding die in a state where the plate-like member on which the resin is placed is placed on the release film. In this case, the resin sealing unit that performs the above-described resin sealing may be a unit having a release film adsorption unit and performing the above compression molding in a state where the release film is adsorbed to the release film adsorption unit. . Further, the above-mentioned molding die is not particularly limited, and is, for example, a metal mold or a ceramic mold.

如上所述,本發明之帶有突起電極之板狀構件係用於上述本發明之製造方法之帶有突起電極之板狀構件,其特徵在於,上述突起電極固定於上述板狀構件之單面上。如上所述,上述突起電極之數量及形狀無特別限定。如上所述,例如上述突起電極之至少一個係上述板狀突起電極亦可。如上所述,較佳為,上述板狀突起電極具有貫通孔及突起,上述貫通孔於與上述板狀構件之板面平行之方向上貫通上述板狀突起電極,於上述板狀突起電極之與固定於上述板狀構件之一端成相反側之一端,上述突起於與上述板狀構件之板面垂直之方向上突出。又,如上所述,例如上述突起電極之至少一個係帶貫通孔之突起電極亦可。更具體而言,如上所述,上述帶貫通孔之突起電極(12)之上述貫通孔係於與上述板狀構件之板面平行之方向上貫通之貫通孔(12b)亦可。又,上述帶貫通孔之突起電極於與固定於上述板狀構件之一端(12a側)成相反側之一端,具有於與上述板狀構件之板面垂直之方向上突出之突起(12c)亦可。進而,如上所述,上述突起電極之至少一個係具有柱狀形狀(例如,圓柱狀、角柱狀、圓錐狀、角錐 狀、圓錐梯形狀、及角錐梯形狀等)之柱狀突起電極亦可。 As described above, the plate-like member with the protruding electrode of the present invention is used for the above-described manufacturing method of the present invention, and the plate-shaped member having the protruding electrode is characterized in that the protruding electrode is fixed to one side of the plate-shaped member. on. As described above, the number and shape of the above-mentioned bump electrodes are not particularly limited. As described above, for example, at least one of the protruding electrodes may be the above-described plate-like protruding electrode. As described above, it is preferable that the plate-like protruding electrode has a through hole and a protrusion, and the through hole penetrates the plate-shaped protruding electrode in a direction parallel to a plate surface of the plate-shaped member, and the plate-shaped protruding electrode is One end of the plate-like member is fixed to one end of the opposite side, and the protrusion protrudes in a direction perpendicular to the plate surface of the plate-like member. Further, as described above, for example, at least one of the protruding electrodes may be a protruding electrode of the through hole. More specifically, as described above, the through hole of the protruding electrode (12) having the through hole may be a through hole (12b) penetrating in a direction parallel to the plate surface of the plate member. Further, the projection electrode having the through hole has one end opposite to the one end (12a side) fixed to the plate member, and has a projection (12c) protruding in a direction perpendicular to the plate surface of the plate member. can. Further, as described above, at least one of the protruding electrodes has a columnar shape (for example, a columnar shape, a prismatic column shape, a conical shape, and a pyramid shape) Columnar protrusion electrodes of a shape, a trapezoidal shape, a pyramid shape, or the like may be used.

又,如上所述,上述板狀構件之形狀無特別限定,例如,上述板狀構件具有樹脂容納部亦可。更具體而言,例如藉由使上述板狀構件之周緣部向上述板狀構件之上述突起電極之固定面側隆起,使得上述板狀構件之中央部形成上述樹脂容納部亦可。又,就本發明之製造方法而言,於上述樹脂載置步驟中,將上述樹脂載置於上述板狀構件之上述樹脂容納部內,並且,於上述樹脂載置於上述樹脂容納部內之狀態下進行上述樹脂密封步驟亦可。 Further, as described above, the shape of the plate-like member is not particularly limited, and for example, the plate-shaped member may have a resin containing portion. More specifically, for example, the resin accommodating portion may be formed in the central portion of the plate-like member by bulging the peripheral edge portion of the plate-like member toward the fixing surface side of the protruding electrode of the plate-shaped member. Further, in the resin mounting step of the present invention, the resin is placed in the resin containing portion of the plate member, and the resin is placed in the resin containing portion. The above resin sealing step may also be performed.

又,於上述樹脂密封步驟中,以上述配線圖案形成面朝上之方式將上述配線圖案形成面上配置有上述晶片之上述基板載置於基板載置台上,進而,以於上述配線圖案形成面上載置有上述樹脂之狀態,對上述「具有變形部之帶有突起電極之板狀構件」從上述突起電極側向上述樹脂推壓亦可。藉此,能夠使上述突起電極連接於安裝有晶片之基板之配線圖案。 Further, in the resin sealing step, the substrate on which the wafer is placed on the wiring pattern forming surface is placed on the substrate mounting table so that the wiring pattern forming surface faces upward, and the wiring pattern forming surface is further formed on the wiring pattern forming surface. In the state in which the resin is placed, the "plate-shaped member with a protruding electrode having a deformed portion" may be pressed from the protruding electrode side toward the resin. Thereby, the bump electrode can be connected to the wiring pattern of the substrate on which the wafer is mounted.

於本發明之製造方法中,上述樹脂無特別限定,例如係熱塑性樹脂或熱固性樹脂中之任意一種均可。上述樹脂例如可係選自由顆粒狀樹脂、粉末狀樹脂、液態樹脂、板狀樹脂、片狀樹脂、膜狀樹脂、及膏狀樹脂所組成之群中之至少一種。又,上述樹脂例如可係選自由透明樹脂、半透明樹脂、及不透明樹脂所組成之群中之至少一種。 In the production method of the present invention, the resin is not particularly limited, and may be, for example, any of a thermoplastic resin and a thermosetting resin. The resin may be, for example, at least one selected from the group consisting of a particulate resin, a powdered resin, a liquid resin, a plate resin, a sheet resin, a film resin, and a paste resin. Further, the resin may be, for example, at least one selected from the group consisting of a transparent resin, a translucent resin, and an opaque resin.

以下,根據圖式對本發明之實施形態進行說明。為了便於說明,各圖係經過適當省略、放大等而模式性地表示。 Hereinafter, embodiments of the present invention will be described based on the drawings. For convenience of explanation, each drawing is schematically represented by appropriate omission, enlargement, and the like.

[實施例1] [Example 1]

於本實施例中,對本發明之「具有變形部之帶有突起電極之板狀構件」之一例、使用具有上述變形部之帶有突起電極之板狀構件之本發明之電子零件之一例、及使用轉移成形之上述電子零件之製造方法之一例進行說明。 In the present embodiment, an example of the electronic component of the present invention using the plate-shaped member having the protruding electrode having the deformed portion as an example of the "plate-like member having a protruding electrode having a deformed portion" according to the present invention, and An example of a method of manufacturing the above-described electronic component by transfer molding will be described.

圖1之立體圖中,模式性表示了本實施例之具有變形部之帶有突起電極之板狀構件之構造。如圖所示,該具有變形部之帶有突起電極之板狀構件10係具有變形部之突起電極12之圖案固定於板狀構件11之單面上而形成。對突起電極12之長度(高度)無特別限定,例如,能夠根據成品之電子零件(成形封裝體)之厚度進行適當設定。又,於本發明中,上述突起電極之圖案不限定於本實施例(圖1)之圖案,可為任意之圖案。 In the perspective view of Fig. 1, the structure of the plate-like member with the protruding electrode having the deformed portion of the present embodiment is schematically shown. As shown in the figure, the plate-like member 10 having the protruding electrode having the deformed portion is formed by fixing the pattern of the protruding electrode 12 having the deformed portion to one surface of the plate-like member 11. The length (height) of the bump electrode 12 is not particularly limited, and can be appropriately set, for example, according to the thickness of the finished electronic component (molded package). Further, in the present invention, the pattern of the protruding electrodes is not limited to the pattern of the embodiment (Fig. 1), and may be any pattern.

如圖1之立體圖所示之帶有突起電極之板狀構件10之構造如圖1之(A)及(B)這兩個所示。首先,如圖1之(A)所示,就該帶有突起電極之板狀構件10而言,突起電極12之圖案朝向與金屬板(板狀構件)11之面方向垂直之方向而固定於金屬板(板狀構件)11之單面。另一方面,於圖1之(B)中,就帶有突起電極之板狀構件10而言,金屬板(板狀構件)11之一部分被沖裁,並且上述被沖裁之一部分於與板狀構件11之面方向垂直之方向彎曲,從而形成突起電極。如圖1所示,於板狀構件11中,上述被沖裁一部分之部分形成為孔13。除此以外與圖1之(A)相同。 The structure of the plate-like member 10 having the protruding electrodes as shown in the perspective view of Fig. 1 is as shown in Fig. 1 (A) and (B). First, as shown in FIG. 1(A), in the plate-like member 10 having the protruding electrodes, the pattern of the protruding electrodes 12 is fixed in a direction perpendicular to the surface direction of the metal plate (plate-like member) 11. One side of the metal plate (plate member) 11. On the other hand, in Fig. 1(B), in the case of the plate-like member 10 having the projecting electrodes, one portion of the metal plate (plate-like member) 11 is punched, and one of the above-mentioned punched portions is in the same plate The direction in which the surface of the member 11 is perpendicular is curved to form a bump electrode. As shown in FIG. 1, in the plate-like member 11, a part of the above-mentioned punched portion is formed as a hole 13. Other than this, it is the same as (A) of FIG.

突起電極12及其變形部之構造無特別限定。圖2之(A)及(B)係表示圖1之(A)及(B)所示之突起電極12之構造之一例之立體圖。於圖2之(A)及(B)之立體圖中,紙面之上下方向表示與板狀構件11之面方向垂直之方向。於圖2之(A)所示之突起電極12中,於中央部分包含變形部12A,上述中央部分以外之部分由剛性部12B(突起電極12之端部)構成。如圖2之(A)所示,從與板狀構件11之面方向平行之方向觀察變形部12A時,其彎曲成閃電形。而且,如圖2(A)所示,突起電極12之變形部12A可以彎曲成「Z」字狀之方式於上述垂直方向上收縮。又,對於圖2(B)所示之突起電極12,其整體由變形部12A構成。從與板狀構件11之面方向平行之方向觀察圖2(B)之變形部12A時,其亦彎曲成 閃電形。於圖2(B)所示之突起電極12中,整體可以彎曲成「ㄑ」字狀之方式於上述垂直方向上收縮而變形。藉此,例如,即使於將上述突起電極12之高度設計成大於成品之電子零件(成形封裝體)之厚度之情形時,成形時,上述突起電極不發生損傷而與上述厚度相吻合。藉此,由於不需要事先設計與上述厚度相吻合之上述突起電極之高度,因此可簡便且有效地製造具有通孔電極(突起電極)及板狀構件兩者之電子零件。 The structure of the bump electrode 12 and its deformed portion is not particularly limited. 2(A) and 2(B) are perspective views showing an example of the structure of the bump electrode 12 shown in Figs. 1(A) and 1(B). In the perspective views of (A) and (B) of FIG. 2, the upper and lower directions of the paper surface indicate a direction perpendicular to the plane direction of the plate-like member 11. The protruding electrode 12 shown in FIG. 2(A) includes a deformed portion 12A at a central portion thereof, and a portion other than the central portion is formed of a rigid portion 12B (an end portion of the protruding electrode 12). As shown in FIG. 2(A), when the deformation portion 12A is viewed from a direction parallel to the surface direction of the plate-like member 11, it is bent into a lightning bolt shape. Further, as shown in FIG. 2(A), the deformed portion 12A of the bump electrode 12 can be contracted in the vertical direction so as to be curved in a "Z" shape. Further, the projection electrode 12 shown in Fig. 2(B) is entirely composed of the deformed portion 12A. When the deformation portion 12A of Fig. 2(B) is viewed from a direction parallel to the plane direction of the plate member 11, it is also bent into Lightning shape. In the bump electrode 12 shown in Fig. 2(B), the entire body can be bent in a "ㄑ" shape to be contracted and deformed in the vertical direction. Thereby, for example, even when the height of the protruding electrode 12 is designed to be larger than the thickness of the finished electronic component (molding package), the protruding electrode does not damage and conforms to the thickness at the time of molding. Thereby, since it is not necessary to design the height of the above-mentioned protrusion electrode in accordance with the above thickness, it is possible to easily and efficiently manufacture an electronic component having both the via electrode (protrusion electrode) and the plate member.

又,如圖2所示,突起電極12之形狀不限於變形部12A彎曲成閃電形(「Z」字形)之構造。例如,突起電極12之形狀可為具有上述貫通孔12b之形狀,更具體而言,例如,可為圖3所示之形狀。於圖3中,右上側之圖係表示圖1之帶有突起電極之板狀構件10之一部分之立體圖。又,圖3之(A)~(C)為模式性表示突起電極12之構造之一例之立體圖。如圖3之(A)~(C)分別表示,於突起電極12之下部12a(與板狀構件11連接之一側之部分)未開孔。另一方面,於突起電極12之上部(與板狀構件11連接之一側成相反側之部分),於與板狀構件11之板面平行之方向上,開通有貫通突起電極12之孔(貫通孔)12b。又,突起電極12之上端(與固定於板狀構件11之一端成相反側之一端)之一部分向上方(與板狀構件11之板面垂直之方向)突出,從而形成突起12c。突起電極12於突起12c之前端部分可與基板之配線圖案(基板電極)接觸。再者,於圖3(A)中,突起電極12c之數量為2個。圖3(B)中,突起電極12c之數量為1個,除了突起電極12之寬度略窄外,與圖3(A)相同。圖3(C)中,除了突起電極12之寬度更窄外,與圖3(B)相同。如此,突起12c之數量無特別限定,可為1個亦可為複數個。突起12c之數量雖於圖3之(A)~(C)中為1個或2個,但亦可為3個以上。又,孔(貫通孔)12b之數量雖於圖3之(A)~(C)中係1個,但無特別限定,可為任意數量,亦可為複數個。 Further, as shown in FIG. 2, the shape of the bump electrode 12 is not limited to the configuration in which the deformed portion 12A is bent into a lightning bolt shape ("Z" shape). For example, the shape of the bump electrode 12 may have a shape having the above-described through hole 12b, and more specifically, for example, the shape shown in FIG. In Fig. 3, the upper right side view is a perspective view showing a part of the plate-like member 10 having the protruding electrodes of Fig. 1. Further, (A) to (C) of FIG. 3 are perspective views schematically showing an example of the structure of the bump electrode 12. As shown in (A) to (C) of FIG. 3, respectively, the lower portion 12a of the protruding electrode 12 (the portion on the side connected to the plate-like member 11) is not opened. On the other hand, in the upper portion of the protruding electrode 12 (the portion opposite to the side on which the plate-like member 11 is connected), a hole penetrating the protruding electrode 12 is opened in a direction parallel to the plate surface of the plate-like member 11 ( Through hole) 12b. Further, a portion of the upper end of the protruding electrode 12 (one end opposite to one end fixed to one end of the plate-like member 11) protrudes upward (in a direction perpendicular to the plate surface of the plate-like member 11) to form a projection 12c. The protruding electrode 12 is in contact with the wiring pattern (substrate electrode) of the substrate at the end portion of the protrusion 12c. Furthermore, in FIG. 3(A), the number of the bump electrodes 12c is two. In Fig. 3(B), the number of the bump electrodes 12c is one, and is the same as Fig. 3(A) except that the width of the bump electrodes 12 is slightly narrow. In Fig. 3(C), the same as Fig. 3(B) except that the width of the bump electrode 12 is narrower. Thus, the number of the protrusions 12c is not particularly limited, and may be one or plural. Although the number of the projections 12c is one or two in (A) to (C) of FIG. 3, it may be three or more. Further, the number of the holes (through holes) 12b is one in (A) to (C) of FIG. 3, but is not particularly limited, and may be any number or plural.

由於具有突起12c,因此突起電極12不受樹脂干擾,容易與基板之配線圖案(基板電極)接觸。即,藉由突起12c撥開突起電極12與下述圖5之配線圖案22之間之樹脂(例如,熔融樹脂或液態樹脂),突起12c之前端與配線圖案22抵接(物理接觸),並且與其電性連接。又,由於突起電極12具有孔12b,因此更容易對晶片進行樹脂密封。即,樹脂能夠穿過孔12b而流動,因此,樹脂之流動變得更加順暢,進而提高樹脂密封之效率。該效果於採用轉移成形之情形時尤其顯著。進而,突起電極12與配線圖案22抵接(接觸)時,如圖3(D)所示,突起電極12於孔12b附近彎曲,從而可以使突起電極12之高度(長度)變小。即,於具有圖3(A)~(D)所示之形狀之突起電極12中,貫通孔12b周圍係於與板狀構件11之面方向垂直之方向上可收縮之上述變形部。藉此,能夠與電子零件之樹脂厚度(封裝體厚度)相對應地調整突起電極12之高度。考慮到該方面,可預先將突起電極12之高度(長度)設定為比上述樹脂厚度(封裝體厚度)稍長。 Since the protrusion 12c is provided, the bump electrode 12 is not interfered by the resin and is easily brought into contact with the wiring pattern (substrate electrode) of the substrate. That is, the resin (for example, molten resin or liquid resin) between the bump electrode 12 and the wiring pattern 22 of FIG. 5 described below is pulled by the protrusion 12c, and the front end of the protrusion 12c abuts (physically contacts) with the wiring pattern 22, and It is electrically connected. Further, since the bump electrode 12 has the hole 12b, it is easier to resin-seal the wafer. That is, the resin can flow through the holes 12b, so that the flow of the resin becomes smoother, thereby improving the efficiency of resin sealing. This effect is particularly remarkable when the transfer forming is employed. Further, when the bump electrode 12 abuts (contacts) the wiring pattern 22, as shown in FIG. 3(D), the bump electrode 12 is bent in the vicinity of the hole 12b, so that the height (length) of the bump electrode 12 can be made small. In other words, in the bump electrode 12 having the shape shown in FIGS. 3(A) to 3(D), the periphery of the through hole 12b is formed by the above-described deformed portion which is contractible in a direction perpendicular to the surface direction of the plate member 11. Thereby, the height of the bump electrode 12 can be adjusted corresponding to the resin thickness (package thickness) of the electronic component. In view of this aspect, the height (length) of the bump electrode 12 can be set to be slightly longer than the above-described resin thickness (package thickness).

又,就突起電極12而言,例如,其可為上述閃電形突起電極且為上述帶貫通孔之突起電極。即,突起電極12可同時具有:從與板狀構件11之面方向平行之方向觀察時彎曲成閃電形(「Z」字形)之上述變形部;及於與板狀構件11之面方向平行之方向上貫通之上述貫通孔。於圖4中,表示了此種構造之一例。於圖4中,右上側之圖係表示圖1之帶有突起電極之板狀構件10之一部分之立體圖。又,圖4之(A)~(C)係模式性表示突起電極12之構造之一例之立體圖。於圖4之(A)~(C)之突起電極12中,除了突起電極12之下部12a(與板狀構件11連接之一側之未開孔之部分)與上部(與板狀構件11連接之一側成相反側之開通有貫通孔12b之部分)藉由變形部12A連接成為一體以外,與圖3之(A)~(C)相同。於圖4之(A)~(C)中,變形部12A與圖2之(A)相同地,從與板狀構件11之面方向平行之方向觀察時彎曲成閃電形(「Z」 字形),且可於與板狀構件11之面方向垂直之方向上收縮。又,於圖4之(A)~(C)之突起電極12中,與圖3之(A)~(C)相同地,突起電極12於孔12b附近彎曲,從而可使突起電極12之高度(長度)變小,例如如圖4(D)所示。 Further, the bump electrode 12 may be, for example, the above-described lightning-shaped bump electrode and the bump electrode with the through hole. In other words, the protruding electrode 12 can have the above-described deformation portion which is bent into a lightning bolt shape ("Z" shape) when viewed from a direction parallel to the surface direction of the plate-like member 11, and is parallel to the surface direction of the plate-like member 11. The through hole penetrating in the direction. An example of such a configuration is shown in FIG. In Fig. 4, the upper right side view is a perspective view showing a part of the plate-like member 10 having the projecting electrodes of Fig. 1. Further, (A) to (C) of FIG. 4 schematically show a perspective view of an example of the structure of the bump electrode 12. In the bump electrode 12 of (A) to (C) of FIG. 4, except for the lower portion 12a of the bump electrode 12 (the portion of the unconnected side on the side connected to the plate member 11) and the upper portion (connected to the plate member 11) The portion on the opposite side that is open to the through hole 12b is the same as (A) to (C) in Fig. 3 except that the deformation portion 12A is integrally connected. In (A) to (C) of FIG. 4, the deformed portion 12A is bent into a lightning shape when viewed from a direction parallel to the plane direction of the plate member 11 ("Z"). The glyph is contracted in a direction perpendicular to the direction of the surface of the plate member 11. Further, in the bump electrode 12 of (A) to (C) of FIG. 4, as in the case of (A) to (C) of FIG. 3, the bump electrode 12 is bent in the vicinity of the hole 12b, so that the height of the bump electrode 12 can be made. The (length) becomes small, for example, as shown in Fig. 4(D).

再者,突起電極12之形狀,除包括上述變形部以外無特別限定,可於圖2~4之形狀之基礎上增加其他形狀或用其他形狀代替。例如,如上所述,突起電極12之至少一個可為具有柱狀形狀之柱狀突起電極。作為上述柱狀突起電極之形狀,如上所述,例如,可以舉出圓柱狀、稜柱狀、圓錐狀、棱錐狀、圓錐台狀、及棱錐台狀等。 Further, the shape of the bump electrode 12 is not particularly limited except for including the above-described deformed portion, and other shapes may be added to the shape of FIGS. 2 to 4 or replaced with other shapes. For example, as described above, at least one of the bump electrodes 12 may be a columnar bump electrode having a columnar shape. As described above, the shape of the columnar projection electrode may be, for example, a columnar shape, a prismatic shape, a conical shape, a pyramid shape, a truncated cone shape, or a truncated cone shape.

又,如上所述,突起電極12之至少一個可為板狀突起電極。於此情形時,如上所述,於本發明之製造方法之上述樹脂密封步驟中,將上述基板藉由上述板狀突起電極劃分為複數個區域,並且於各個上述區域內,對上述晶片進行樹脂密封亦可。又,與圖3(A)~(C)之突起電極相同地,上述板狀突起電極可具有貫通孔及突起。上述貫通孔與圖3(A)~(C)相同地,將上述板狀突起電極向與上述板狀構件之板面平行之方向貫通亦可。又,較佳為,與圖3(A)~(C)相同,上述突起於上述板狀突起電極之與固定於上述板狀構件之一端成相反側之一端上,向與上述板狀構件之板面垂直之方向突出。上述板狀突起電極之上述貫通孔及上述突起之數量亦無特別限定,可為任意數量,但較佳為複數個。上述板狀突起電極具有上述貫通孔及上述突起,從而具有與圖3(A)~(C)之貫通孔12b及突起12c相同之優點。即,首先,上述板狀突起電極具有上述突起,因此上述板狀突起電極不受樹脂干擾,容易與基板之配線圖案(基板電極)接觸。又,由於上述板狀突起電極具有上述貫通孔,樹脂能夠穿過上述貫通孔而流動,因此,樹脂之流動將更加順暢,樹脂密封之效率進而提高。該效果於藉由轉移成形製造電子零件(將晶片與帶有突起電極之板狀構件一同進行樹脂密 封)時尤其顯著。又,進而,上述板狀突起電極還於上述貫通孔附近彎曲,從而可使上述板狀突起電極之高度(長度)變小。藉此,能夠與電子零件之樹脂厚度(封裝體厚度)相對應地調整上述板狀突起電極之高度。考慮到該方面,可預先將上述板狀突起電極之高度(長度)設定為比上述樹脂厚度(封裝體厚度)稍長。 Further, as described above, at least one of the bump electrodes 12 may be a plate-like bump electrode. In this case, as described above, in the resin sealing step of the manufacturing method of the present invention, the substrate is divided into a plurality of regions by the plate-like protruding electrodes, and the wafer is subjected to resin in each of the regions. Sealing is also possible. Further, similarly to the bump electrodes of FIGS. 3(A) to (C), the plate-like bump electrodes may have through holes and protrusions. Similarly to the through holes of FIGS. 3(A) to 3(C), the through-holes may pass through the plate-like projection electrodes in a direction parallel to the plate surface of the plate-like member. Further, in the same manner as in Figs. 3(A) to (C), the projection is preferably formed on one end of the plate-like projection electrode opposite to one end of the plate-like member and is opposite to the plate-like member. The board surface protrudes in the vertical direction. The number of the through holes and the protrusions of the plate-like projection electrode is not particularly limited, and may be any number, but is preferably plural. The plate-like projection electrode has the above-described through hole and the protrusion, and has the same advantages as the through hole 12b and the projection 12c of FIGS. 3(A) to (C). In other words, first, since the plate-like projection electrode has the protrusion, the plate-shaped protrusion electrode is not interfered with by the resin, and is easily brought into contact with the wiring pattern (substrate electrode) of the substrate. Further, since the plate-like projection electrode has the through hole, the resin can flow through the through hole, so that the flow of the resin is smoother and the efficiency of the resin sealing is further improved. This effect is to manufacture electronic parts by transfer molding (the wafer is bonded to the plate-like member with the protruding electrodes for resin sealing) It is especially noticeable when it is sealed. Further, the plate-like projection electrode is also bent in the vicinity of the through hole, and the height (length) of the plate-like projection electrode can be made small. Thereby, the height of the plate-like projecting electrode can be adjusted in accordance with the resin thickness (package thickness) of the electronic component. In view of this aspect, the height (length) of the plate-like projection electrode can be set to be slightly longer than the resin thickness (package thickness).

進而,於本發明中,上述突起電極之上述變形部可於與上述板狀構件之面方向垂直之方向上收縮,但於上述垂直方向上除了收縮以外還可以發生其他任意變形。例如,上述變形部可以呈如下狀態:於與上述板狀構件之面方向垂直之方向上收縮,並且於包括上述板狀構件之面方向(水平面方向)及斜向之整個橫向上擴大。上述變形為何種變形係根據例如上述板狀構件之材質、形狀等決定。 Further, in the invention, the deformed portion of the protruding electrode may be contracted in a direction perpendicular to a surface direction of the plate-like member, but may be deformed in any other manner in addition to contraction in the vertical direction. For example, the deformation portion may be contracted in a direction perpendicular to the surface direction of the plate-like member, and enlarged in the lateral direction (horizontal direction) including the plate-like member and the entire lateral direction of the oblique direction. The deformation of the above-described deformation is determined according to, for example, the material, shape, and the like of the above-described plate member.

再者,本發明之帶有突起電極之板狀構件之製造方法,例如,可舉出:藉由接合板狀構件(金屬板)與突起電極來製造之方法;將金屬板用作板狀構件且對上述金屬板進行沖裁彎曲而製造突起電極之方法等,但不限於該等。具體而言,例如將下列(1)~(6)所示之方法按照常規方法進行,藉此製造如圖1(A)所示之帶有突起電極之板狀構件亦可。 Further, a method for producing a plate-like member having a protruding electrode according to the present invention includes, for example, a method of joining a plate-shaped member (metal plate) and a bump electrode; and using a metal plate as a plate-like member. Further, the metal plate is subjected to punching and bending to produce a bump electrode, and the like, but is not limited thereto. Specifically, for example, the method shown in the following (1) to (6) can be carried out in accordance with a conventional method, whereby a plate-like member having a protruding electrode as shown in Fig. 1(A) can be produced.

(1)藉由對金屬板進行蝕刻來製造之方法; (1) a method of manufacturing by etching a metal plate;

(2)藉由接合金屬板與突起電極來製造之方法; (2) a method of manufacturing by joining a metal plate and a bump electrode;

(3)藉由電鑄來同時成形板狀構件與突起電極之方法; (3) a method of simultaneously forming a plate member and a protruding electrode by electroforming;

(4)例如,使用射出成形法,藉由具有導電性(屏蔽性)之樹脂同時成形板狀構件與突起電極之方法; (4) For example, a method of simultaneously forming a plate-like member and a protruding electrode by a resin having conductivity (shielding property) by using an injection molding method;

(5)藉由將突起電極接合於具有導電性(屏蔽性)之樹脂(板狀構件)而製造之方法; (5) a method of manufacturing a bump electrode by bonding a resin (plate member) having conductivity (shield);

(6)於具有樹脂板與突起部之構件上貼上導電性(屏蔽性)塗膜之方法。 (6) A method of attaching a conductive (shielding) coating film to a member having a resin plate and a projection.

如上所述,本發明之帶有突起電極之板狀構件之製造方法無特別限制,例如將下列(7)所示之方法按照常規方法進行,藉此製造如圖1(B)所示之帶有突起電極之板狀構件亦可。 As described above, the method for producing the plate-like member with the projecting electrode of the present invention is not particularly limited, and for example, the method shown in the following (7) is carried out in accordance with a conventional method, thereby producing a belt as shown in Fig. 1(B). A plate member having a protruding electrode may also be used.

(7)將金屬板用作板狀構件且對上述金屬板進行沖裁彎曲而製造具有變形部之突起電極之方法。例如,首先,於上述金屬板上沖裁出與具有所需形狀變形部之突起電極相對應之形狀,接著,將該沖裁部分相對於上述金屬板進行垂直彎曲,藉此能夠形成具有所需形狀變形部之帶有突起電極之板狀構件。作為具有上述所需形狀之變形部之突起電極,例如,能夠舉出具有帶貫通孔之變形部之突起電極、具有閃電形(「Z」字形)變形部之突起電極。 (7) A method of manufacturing a bump electrode having a deformed portion by using a metal plate as a plate member and punching and bending the metal plate. For example, first, a shape corresponding to a bump electrode having a desired shape deforming portion is punched out on the metal plate, and then the punched portion is vertically bent with respect to the metal plate, whereby it is possible to form a desired A plate-like member having a protruding electrode in the shape deforming portion. Examples of the bump electrode having the deformed portion having the above-described desired shape include a bump electrode having a deformed portion having a through hole and a bump electrode having a lightning-shaped ("Z"-shaped) deformed portion.

於圖5(A)~(C)之剖視圖中,模式性表示了圖1所示之採用帶有突起電極之板狀構件而製造電子零件之步驟之一例。圖5(C)之剖視圖為藉由上述製造步驟製造之本實施例電子零件之構造之模式圖。首先,如圖5(C)所示,該電子零件20包括:基板21、晶片31、樹脂41、板狀構件11、及具有變形部12A之突起電極12。突起電極12固定於板狀構件11之單面上,並且板狀構件11與突起電極12成為一體而形成帶有突起電極之板狀構件。晶片31固定於基板21上,並且被樹脂41密封。於基板21上之晶片31之配置側,形成有配線圖案22。於圖1中亦已說明,突起電極12固定於板狀構件11之單面上。又,突起電極12貫通上述樹脂41而與配線圖案22接觸。 In the cross-sectional views of Figs. 5(A) to 5(C), an example of a step of manufacturing an electronic component using the plate-like member having the protruding electrodes shown in Fig. 1 is schematically shown. Fig. 5(C) is a schematic view showing the configuration of the electronic component of the embodiment manufactured by the above manufacturing steps. First, as shown in FIG. 5(C), the electronic component 20 includes a substrate 21, a wafer 31, a resin 41, a plate-like member 11, and a bump electrode 12 having a deformed portion 12A. The bump electrode 12 is fixed to one surface of the plate member 11, and the plate member 11 and the bump electrode 12 are integrated to form a plate member having the bump electrode. The wafer 31 is fixed to the substrate 21 and sealed by the resin 41. A wiring pattern 22 is formed on the arrangement side of the wafer 31 on the substrate 21. As also shown in Fig. 1, the projecting electrode 12 is fixed to one surface of the plate member 11. Further, the bump electrode 12 penetrates the resin 41 and comes into contact with the wiring pattern 22.

接著,對圖5(A)~(C)之製造步驟進行說明。首先,如圖5(A)所示,準備帶有突起電極之板狀構件10及基板21。如圖5(A)所示,於帶有突起電極之板狀構件10中,突起電極12固定於板狀構件11之單面,板狀構件11與突起電極12成為一體而形成帶有突起電極之板狀構件10。又,於圖5(A)中,將突起電極12之與板狀構件11之面方向垂直之方向上之長度(高度)用箭頭及符號M表示。於基板21上固定有晶片 31。於基板21上之晶片31之配置側,形成有配線圖案22。而且,如圖5A所示,帶有突起電極之板狀構件10及基板21以使突起電極12之固定面與配線圖案22形成面對向之方式配置。 Next, the manufacturing steps of FIGS. 5(A) to (C) will be described. First, as shown in FIG. 5(A), a plate member 10 having a bump electrode and a substrate 21 are prepared. As shown in Fig. 5(A), in the plate-like member 10 having the protruding electrodes, the protruding electrodes 12 are fixed to one side of the plate-like member 11, and the plate-like member 11 and the protruding electrodes 12 are integrated to form a protruding electrode. The plate member 10. Further, in FIG. 5(A), the length (height) of the projection electrode 12 in the direction perpendicular to the surface direction of the plate-like member 11 is indicated by an arrow and a symbol M. A wafer is fixed on the substrate 21 31. A wiring pattern 22 is formed on the arrangement side of the wafer 31 on the substrate 21. Further, as shown in FIG. 5A, the plate-like member 10 having the protruding electrodes and the substrate 21 are disposed such that the fixing faces of the protruding electrodes 12 face the wiring pattern 22.

而且,如圖5(B)所示,於板狀構件11之突起電極12之固定面與基板21之配線圖案22之形成面之間,用樹脂41對晶片31進行密封,從而形成電子零件20'。於該圖5(B)中,具有變形部12A之突起電極12未收縮。即,突起電極12之與板狀構件11之面方向垂直之方向上之長度(高度)為與圖5A相同之M。於該狀態下,若突起電極12與配線圖案22接觸且突起電極12之長度與電子零件之特定之厚度吻合,則將該狀態下之電子零件20'作為成品之電子零件亦可。由於突起電極12之長度不與電子零件之特定之厚度吻合之情形時,電子零件20'不為成品,因此,藉由於與板狀構件11之面方向垂直方向上進行推壓,縮小板狀構件11與基板21之間隔(距離),從而使突起電極12之長度與電子零件之特定之厚度吻合。此時,由於突起電極12與基板21之配線圖案22抵接而產生之推壓力會施加於突起電極12。藉由該推壓力,突起電極12整體相對地於與板狀構件11之面方向垂直之方向上受到推壓。藉由該推壓,如圖5(C)所示,突起電極12藉由其變形部12A之彎曲,於與板狀構件11之面方向垂直之方向上收縮。即,如圖5(C)所示,突起電極12之與板狀構件11之面方向垂直之方向上之長度(高度)變為比圖5(A)及(B)中之M更小之數值N(M>N)。藉此,突起電極12與上述電子零件之特定之厚度(板狀構件11與基板21之間隔)吻合。又,於圖5(C)之狀態下,突起電極12處於與配線圖案22接觸之狀態。如此一來,能夠製造如圖5(C)所示之成品之電子零件20。再者,於圖5中,為便於說明,說明了突起電極12具有閃電形變形部12A之形狀。但是,如上所述,突起電極12之形狀並不限於此,如上所述,可為任意形狀。以下,於包括突起電極12之所有之剖視圖中,都與此相同。 Further, as shown in FIG. 5(B), between the fixed surface of the bump electrode 12 of the plate-like member 11 and the surface on which the wiring pattern 22 of the substrate 21 is formed, the wafer 31 is sealed with the resin 41 to form the electronic component 20. '. In FIG. 5(B), the bump electrode 12 having the deformed portion 12A is not shrunk. That is, the length (height) of the protruding electrode 12 in the direction perpendicular to the surface direction of the plate-like member 11 is M which is the same as that of FIG. 5A. In this state, if the bump electrode 12 is in contact with the wiring pattern 22 and the length of the bump electrode 12 matches the specific thickness of the electronic component, the electronic component 20' in this state may be a finished electronic component. Since the length of the protruding electrode 12 does not match the specific thickness of the electronic component, the electronic component 20' is not a finished product, and therefore, the plate member is reduced by pushing in the direction perpendicular to the plane direction of the plate member 11. The distance (distance) between the substrate 11 and the substrate 21 is such that the length of the bump electrode 12 matches the specific thickness of the electronic component. At this time, a pressing force generated by the bump electrode 12 abutting on the wiring pattern 22 of the substrate 21 is applied to the bump electrode 12. By this pressing force, the entire projection electrode 12 is pressed against the direction perpendicular to the surface direction of the plate-like member 11. By this pressing, as shown in FIG. 5(C), the protruding electrode 12 is contracted in the direction perpendicular to the surface direction of the plate-like member 11 by the bending of the deformed portion 12A. That is, as shown in Fig. 5(C), the length (height) of the projection electrode 12 in the direction perpendicular to the plane direction of the plate-like member 11 becomes smaller than M in Figs. 5(A) and (B). The value N (M>N). Thereby, the bump electrode 12 and the specific thickness of the electronic component (the space between the plate member 11 and the substrate 21) match. Moreover, in the state of FIG. 5(C), the bump electrode 12 is in contact with the wiring pattern 22. In this way, the finished electronic component 20 as shown in FIG. 5(C) can be manufactured. In addition, in FIG. 5, for the convenience of description, the protrusion electrode 12 has the shape of the lightning-shaped deformation part 12A. However, as described above, the shape of the bump electrode 12 is not limited thereto, and may be any shape as described above. Hereinafter, in all of the cross-sectional views including the bump electrodes 12, the same is true.

又,板狀構件11無特別限定,如上所述,例如可為散熱板或遮蔽板(屏蔽板)等。例如,於1個IC(對晶片進行樹脂密封後之電子零件)中配置有複數個晶片(樹脂密封前之電子零件)之情形時等,考慮到各晶片之功能,藉由遮蔽板(屏蔽板)進行電磁屏蔽亦可。 Further, the plate-like member 11 is not particularly limited, and as described above, for example, it may be a heat dissipation plate or a shielding plate (shield plate). For example, when a plurality of wafers (electronic components before resin sealing) are disposed in one IC (electronic component after resin sealing of a wafer), a shielding plate (shield plate) is considered in consideration of the function of each wafer. ) Electromagnetic shielding is also possible.

進而,帶有突起電極之板狀構件可為與1個基板(1個電子零件)對應之板狀構件,如圖1(A)及(B)所示,亦可為與複數個基板(複數個電子零件)對應之板狀構件(矩陣式)。於矩陣式之情形時,例如,將分別固定有晶片及配線圖案之複數個基板與上述矩陣式之帶有突起電極之板狀構件一同進行樹脂密封。此後,藉由切斷等方式,將上述矩陣式之帶有突起電極之板狀構件分割成與各基板對應之各區域亦可。又,例如,如上所述,上述突起電極之至少一個係板狀突起電極亦可。於此情形時,能夠用上述板狀突起電極劃開(劃分)基板面上與1個電子零件(1個製品單位)對應之所需範圍(或具有某特定功能之範圍)。 Further, the plate-like member having the protruding electrode may be a plate-shaped member corresponding to one substrate (one electronic component), and as shown in FIGS. 1(A) and (B), may be a plurality of substrates (plurality Electronic parts) corresponding to the plate-shaped members (matrix type). In the case of the matrix type, for example, a plurality of substrates each having a wafer and a wiring pattern fixed thereon are resin-sealed together with the matrix-shaped plate-like member having the protruding electrodes. Thereafter, the matrix-shaped plate-like member having the protruding electrodes may be divided into regions corresponding to the respective substrates by cutting or the like. Further, for example, as described above, at least one of the protruding electrodes may be a plate-like protruding electrode. In this case, the plate-shaped projection electrode can be used to divide (divide) a desired range (or a range having a specific function) corresponding to one electronic component (one product unit) on the substrate surface.

進而,使用已完成樹脂密封之狀態下之電子零件代替晶片31亦可。於此情形時,電子零件20為對電子零件31再次進行樹脂密封之形態,因此,晶片處於進行複數次樹脂密封之狀態。 Further, instead of the wafer 31, an electronic component in a state in which the resin is sealed may be used. In this case, the electronic component 20 is in a state in which the electronic component 31 is again resin-sealed, and therefore, the wafer is in a state in which a plurality of resin seals are performed.

於圖6之剖視圖中,模式性表示圖5之電子零件之製造方法之一例。如上所述,該製造方法係使用轉移成形之製造方法。 In the cross-sectional view of Fig. 6, an example of a method of manufacturing the electronic component of Fig. 5 is schematically shown. As described above, this manufacturing method uses a manufacturing method of transfer molding.

如圖6所示,該製造方法能夠使用一般之轉移成形用之成形模50而進行。如圖6所示,成形模50由上模51及下模52形成。於上模51之模面設置有用於成形樹脂之模腔56,於下模52之模面設置有用於供給並安裝基板21之基板設置部57,於上述基板21設置有晶片31及配線圖案22。 As shown in Fig. 6, this manufacturing method can be carried out using a general molding die 50 for transfer molding. As shown in FIG. 6, the forming die 50 is formed of an upper die 51 and a lower die 52. A mold cavity 56 for molding a resin is provided on a mold surface of the upper mold 51, and a substrate installation portion 57 for supplying and mounting the substrate 21 is provided on a mold surface of the lower mold 52. The substrate 31 is provided with a wafer 31 and a wiring pattern 22 .

又,於下模52設置有用於供給樹脂材料之加料腔(孔)54,於加料腔內嵌入安裝有用於加壓樹脂之柱塞(plunger)53。 Further, a feeding chamber (hole) 54 for supplying a resin material is provided in the lower mold 52, and a plunger 53 for pressurizing the resin is fitted in the charging chamber.

使用圖6所示之裝置之轉移成形之方法無特別限定,按照一般之 轉移成形方法進行亦可。即,首先,向上述加料腔54內供給樹脂片等樹脂材料,且於上述基板設置部57供給並安裝基板21,然後對上述上模51及下模52這兩個模進行合模。接著,如圖6所示,藉由變形部12A之彎曲,而突起電極12於與板狀構件11之面方向垂直之方向上收縮。藉此,突起電極12與樹脂密封零件之特定之厚度吻合。接著,於上述加料腔54內加熱樹脂而使其熔融化,並且上移柱塞53而對加料腔54內之熔融樹脂41實施加壓,藉此使熔融樹脂41從下模52之加料腔54內經過樹脂通道(料道、流道、澆口)55,從而向上模51之模腔56內注入熔融樹脂。此時,能夠用柱塞53向模腔56內之樹脂施加所需之樹脂壓力。 The method of transfer forming using the apparatus shown in Fig. 6 is not particularly limited, and is generally used. The transfer molding method can also be carried out. In other words, first, a resin material such as a resin sheet is supplied into the charging chamber 54, and the substrate 21 is supplied and mounted in the substrate mounting portion 57, and then the two molds of the upper mold 51 and the lower mold 52 are clamped. Next, as shown in FIG. 6, the projection electrode 12 is contracted in a direction perpendicular to the surface direction of the plate-like member 11 by the bending of the deformation portion 12A. Thereby, the bump electrode 12 coincides with the specific thickness of the resin sealing member. Next, the resin is heated in the charging chamber 54 to be melted, and the plunger 53 is moved up to pressurize the molten resin 41 in the charging chamber 54, whereby the molten resin 41 is supplied from the charging chamber 54 of the lower mold 52. The inside passes through the resin passage (path, runner, gate) 55, thereby injecting molten resin into the cavity 56 of the upper mold 51. At this time, the plunger 53 can be used to apply a desired resin pressure to the resin in the cavity 56.

經過固化所需之時間後,藉由對上模51及下模52這兩個模進行開模,於模腔56內,能將晶片31等密封成形於與模腔之形狀對應之封裝體(樹脂成形體)內(參照圖5所示電子零件20)。 After the time required for curing, the two molds of the upper mold 51 and the lower mold 52 are opened, and in the cavity 56, the wafer 31 or the like can be hermetically formed into a package corresponding to the shape of the cavity ( Inside the resin molded body (see electronic component 20 shown in Fig. 5).

於本實施例中,圖6所示之製造方法(圖5所示之電子零件20之製造),例如能夠以下述方式進行。即,首先,於下模52之模面上(基板設置部),將設置有晶片31及配線圖案22之基板21配置於與上模51之模腔對應之位置上,並且於基板21上,將板狀構件11及突起電極12以與成品之電子零件20(圖5)中之位置關係為相同之位置關係之方式配置。此時,如圖6所示,使基板21之與晶片31配置側成相反之一側與下模52接觸,並且於晶片31配置側之表面上載置帶有突起電極之板狀構件(板狀構件11及突起電極12),從而配線圖案22與突起電極12之前端部以物理方式電性連接。 In the present embodiment, the manufacturing method shown in Fig. 6 (manufacture of the electronic component 20 shown in Fig. 5) can be performed, for example, in the following manner. In other words, first, the substrate 21 on which the wafer 31 and the wiring pattern 22 are provided is placed on the mold surface (substrate mounting portion) of the lower mold 52 at a position corresponding to the cavity of the upper mold 51, and on the substrate 21, The plate-like member 11 and the protruding electrode 12 are disposed in the same positional relationship as the positional relationship in the electronic component 20 (FIG. 5) of the finished product. At this time, as shown in FIG. 6, the substrate 21 is brought into contact with the lower mold 52 on the side opposite to the arrangement side of the wafer 31, and a plate-like member having a protruding electrode is placed on the surface on the side where the wafer 31 is disposed (plate shape). The member 11 and the bump electrode 12) are such that the wiring pattern 22 and the front end portion of the bump electrode 12 are physically electrically connected.

再者,基板21、晶片31、板狀構件11、及突起電極12可以與圖6成上下倒置之狀態下載置於下模52之模面上。即,板狀構件11之與突起電極12之形成面成相反側之表面與下模52接觸,於上述突起電極12之形成面側配置基板21及晶片31亦可。 Further, the substrate 21, the wafer 31, the plate-like member 11, and the bump electrode 12 can be downloaded and placed on the mold surface of the lower mold 52 in a state of being vertically inverted as shown in FIG. In other words, the surface of the plate-like member 11 opposite to the surface on which the projection electrode 12 is formed is in contact with the lower mold 52, and the substrate 21 and the wafer 31 may be disposed on the surface on which the projection electrode 12 is formed.

接著,如圖6所示,對上模51及下模52進行合模。此時,將上模51載置於下模52上,藉此使基板21、晶片31、板狀構件11、及突起電極12容納於上模之模腔內,並使板狀構件11抵接於模腔之頂面。此時,如上所述,於上述合模之過程中,藉由變形部12A之彎曲,突起電極12於與板狀構件11之面方向垂直之方向上收縮。藉此,突起電極12與上述電子零件之厚度吻合。 Next, as shown in FIG. 6, the upper mold 51 and the lower mold 52 are clamped. At this time, the upper mold 51 is placed on the lower mold 52, whereby the substrate 21, the wafer 31, the plate-like member 11, and the protruding electrode 12 are housed in the cavity of the upper mold, and the plate-like member 11 is abutted. On the top surface of the cavity. At this time, as described above, during the above-described mold clamping, the projection electrode 12 is contracted in a direction perpendicular to the surface direction of the plate-like member 11 by the bending of the deformation portion 12A. Thereby, the bump electrode 12 coincides with the thickness of the above electronic component.

於該狀態下,進而,如圖6所示,用柱塞53從下模52之加料腔54經由樹脂通道55向上模51之模腔內注入樹脂41。藉此,對配置於基板21上之晶片31與板狀構件11及突起電極12一同進行樹脂密封。如此一來,能夠製造圖5所示之電子零件20。 In this state, further, as shown in Fig. 6, the resin 41 is injected from the charging chamber 54 of the lower mold 52 through the resin passage 55 into the cavity of the upper mold 51 by the plunger 53. Thereby, the wafer 31 placed on the substrate 21 is resin-sealed together with the plate-like member 11 and the bump electrode 12. In this way, the electronic component 20 shown in FIG. 5 can be manufactured.

再者,於向模腔56內注入樹脂時,於模腔56內,樹脂(熔融樹脂)41能夠於突起電極12之間流動,或者能夠穿過突起電極12之孔12b內而流動。 Further, when resin is injected into the cavity 56, the resin (molten resin) 41 can flow between the protruding electrodes 12 in the cavity 56 or can flow through the holes 12b of the protruding electrodes 12.

又,於上文中,對將基板及帶有突起電極之板狀構件兩者均載置於下模之模面上之後進行合模之方法進行了說明,但本發明並不限於此。例如,將基板21供給並安裝於下模52之模面,將帶有突起電極之板狀構件(板狀構件11)安裝於上模51之模腔頂面上,對上模51與下模52進行合模,向模腔內注入樹脂亦可。此時,如上所述,亦可將板狀構件11及基板21之位置上下倒置。 Further, in the above, a method of performing mold clamping after placing both the substrate and the plate-like member having the protruding electrodes on the die surface of the lower mold has been described, but the present invention is not limited thereto. For example, the substrate 21 is supplied and mounted on the die surface of the lower mold 52, and the plate-like member (plate member 11) having the protruding electrodes is mounted on the top surface of the cavity of the upper mold 51, and the upper mold 51 and the lower mold are attached. 52 mold clamping, and it is also possible to inject resin into the cavity. At this time, as described above, the positions of the plate-like member 11 and the substrate 21 may be inverted upside down.

又,於用轉移成形進行成形(樹脂密封)時,例如將模腔內等設定為特定真空度而進行轉移成形亦可。設定為上述特定真空度之方法亦無特別限定,例如可採用基於一般之轉移成形之方法。 In addition, when molding (resin sealing) by transfer molding, for example, the inside of the cavity may be set to a specific degree of vacuum, and transfer molding may be performed. The method of setting the specific degree of vacuum described above is also not particularly limited, and for example, a method based on general transfer molding can be employed.

用於上述轉移成形之裝置無特別限定,例如與一般之用於轉移成形之裝置相同亦可。又,上述樹脂密封步驟之具體條件亦無特別限定,例如與一般之轉移成形相同亦可。 The apparatus for the above transfer molding is not particularly limited, and for example, it may be the same as the apparatus for general transfer molding. Further, the specific conditions of the resin sealing step are not particularly limited, and may be, for example, the same as general transfer molding.

再者,為了更確實地連接突起電極12與配線圖案22,預先將焊 料插入至突起電極12與配線圖案22之間亦可。於此情形時,例如,於上述樹脂密封步驟之後,藉由回流等方式使上述焊料熔融,藉此接合突起電極12與配線圖案22亦可。於下文中之各實施形態中亦相同。 Furthermore, in order to more reliably connect the bump electrode 12 and the wiring pattern 22, soldering is performed in advance. The material may be inserted between the bump electrode 12 and the wiring pattern 22. In this case, for example, after the resin sealing step, the solder may be melted by reflow or the like to bond the bump electrode 12 and the wiring pattern 22. The same applies to the embodiments below.

如上所述,根據本發明,無需預先按照上述厚度設計上述突起電極之高度,因此能夠簡便且有效地製造具有通孔電極(突起電極)及板狀構件兩者之電子零件。 As described above, according to the present invention, it is not necessary to design the height of the protruding electrode in advance in accordance with the above-described thickness. Therefore, it is possible to easily and efficiently manufacture an electronic component having both the via electrode (protrusion electrode) and the plate member.

又,如上所述,根據本發明,無需為了形成通孔電極而於樹脂上穿過通孔形成孔(槽或孔)。因此,例如可得到下列(1)~(5)之效果。但是,該等效果為舉例表示,不對本發明進行限定。 Further, as described above, according to the present invention, it is not necessary to form a hole (groove or hole) through the through hole on the resin in order to form the via electrode. Therefore, for example, the following effects (1) to (5) can be obtained. However, the effects are exemplified and the invention is not limited.

(1)由於無需於樹脂上穿過通孔形成孔,因此,不存在因被樹脂密封之電子零件(封裝體)之厚度偏差等引起之於基板之配線圖案上無法準確適當地形成通孔形成孔之深度等之情況。 (1) Since it is not necessary to form a hole through the through hole in the resin, there is no possibility that the through hole is formed accurately and appropriately on the wiring pattern of the substrate due to variations in thickness of the electronic component (package) sealed by the resin or the like. The depth of the hole, etc.

(2)由於無需於樹脂上穿過通孔形成孔,因此樹脂材料所包含之填料不會殘留於基板之配線圖案上。 (2) Since it is not necessary to form a hole through the through hole in the resin, the filler contained in the resin material does not remain on the wiring pattern of the substrate.

(3)由於無需於樹脂上穿過通孔形成孔,因此不會對搭載有晶片之基板上之配線圖案造成損傷。 (3) Since it is not necessary to form a hole through the through hole in the resin, the wiring pattern on the substrate on which the wafer is mounted is not damaged.

(4)由於無需於樹脂上穿過通孔形成孔,因此電子零件之製造條件不會受到樹脂材料之填料密度之影響。 (4) Since it is not necessary to form a hole through the through hole in the resin, the manufacturing conditions of the electronic component are not affected by the packing density of the resin material.

(5)藉由上述(1)~(4)之影響,能夠簡便且有效地製造電子零件,因此良率良好。進而,由於基板之配線圖案與突起電極(通孔電極)之連接等變得良好,因此,亦有利於提高電子零件之性能或降低不良品發生率等。 (5) By the influence of the above (1) to (4), the electronic component can be easily and efficiently manufactured, and therefore the yield is good. Further, since the connection between the wiring pattern of the substrate and the bump electrode (via electrode) is good, it is also advantageous in improving the performance of the electronic component or reducing the incidence of defective products.

[實施例2] [Embodiment 2]

接著,使用圖7~圖10,對本發明之其他實施例進行說明。於本實施例中,對採用壓縮成形之上述電子零件之製造方法之一例進行說明。又,本實施例中所使用之帶有突起電極之板狀構件之突起電極具 備變形部。 Next, another embodiment of the present invention will be described with reference to Figs. 7 to 10 . In the present embodiment, an example of a method of manufacturing the above-described electronic component by compression molding will be described. Further, the protruding electrode member of the plate-like member with the protruding electrode used in the embodiment is Prepare the deformation section.

首先,準備壓縮成形裝置(電子零件之製造裝置)。於圖7之步驟剖視圖中,表示該壓縮成形裝置一部分即成形模之一部分之構造。如圖7所示,該壓縮成形裝置以上模101、下模111、及中模(中間板)102作為主要構成要素。下模111包括:下模腔底面構件111a、下模外周構件(下模本體)112及113。下模外周構件(下模本體)112及113為框架狀之下模腔側面構件。更具體而言,下模外周構件112以包圍下模腔底面構件111a周圍之方式配置,進而,下模外周構件113以包圍下模外周構件112以外周之方式配置。於下模腔底面構件111a與下模外周構件112之間,形成有空隙(吸附孔)111c。於下模外周構件112與下模外周構件113之間,形成有空隙(吸附孔)111d。如下所述,使用真空泵(未圖示)對該等空隙111c及111d進行減壓,藉此可吸附離型膜等。下模外周構件112上表面之高度比下模腔底面構件111a及下模外周構件113上表面之高度更高。藉此,形成由下模腔底面構件111a上表面與下模外周構件112內周面包圍之下模腔(凹部)111b。又,於上模101形成有孔(貫通孔)103。如下所述,於進行合模後,用真空泵(未圖示)從孔103進行吸引,藉此至少能夠使下模腔111b內減壓。中模(中間板)102係框狀(環狀)形狀,並以位於下模外周構件113正上方之方式進行配置。能夠於中模102下表面與下模外周構件113上表面之間,固持並固定離型膜100。於中模102上表面之周緣部上,安裝有具有彈性之O型環102a。又,就該壓縮成形裝置而言,如圖7所示,於圖之左右兩側具有輥104。而且,1個長條之離型膜100之兩端分別捲繞於左右之輥104上。藉由左右之輥104,可從圖7之右側向左側、或從左側向右側搬出離型膜100。藉此,如下所述,能夠將帶有突起電極之板狀構件於使其載置於離型膜100上之狀態下,搬送至上述下模腔之位置。即,輥104相當於將上述帶有突起電極之板狀構件搬送至成形模 之模腔位置之搬送單元。又,雖未圖示,但該壓縮成形裝置(電子零件之製造裝置)進而包括樹脂載置單元。上述樹脂載置單元用於於上述帶有突起電極之板狀構件之上述突起電極之形成面上載置樹脂。 First, a compression molding device (manufacturing device for electronic components) is prepared. In the step sectional view of Fig. 7, a configuration of a part of the compression molding apparatus, i.e., a part of the forming mold, is shown. As shown in Fig. 7, the compression molding apparatus upper mold 101, lower mold 111, and middle mold (intermediate plate) 102 are main constituent elements. The lower mold 111 includes a lower cavity bottom surface member 111a and a lower mold outer peripheral member (lower mold body) 112 and 113. The lower die outer peripheral members (lower die bodies) 112 and 113 are frame-shaped lower die cavity side members. More specifically, the lower mold outer peripheral member 112 is disposed to surround the lower cavity bottom surface member 111a, and the lower mold outer peripheral member 113 is disposed to surround the outer periphery of the lower mold outer peripheral member 112. A gap (adsorption hole) 111c is formed between the lower cavity bottom surface member 111a and the lower die outer circumferential member 112. A gap (adsorption hole) 111d is formed between the lower mold outer peripheral member 112 and the lower mold outer peripheral member 113. The voids 111c and 111d are depressurized by a vacuum pump (not shown) as described below, whereby a release film or the like can be adsorbed. The height of the upper surface of the lower mold outer peripheral member 112 is higher than the upper surfaces of the lower cavity bottom surface member 111a and the lower mold outer peripheral member 113. Thereby, a cavity (recess) 111b surrounded by the upper surface of the lower cavity bottom surface member 111a and the inner peripheral surface of the lower die outer peripheral member 112 is formed. Further, a hole (through hole) 103 is formed in the upper mold 101. As described below, after the mold clamping is performed, suction is performed from the hole 103 by a vacuum pump (not shown), whereby at least the inside of the lower mold cavity 111b can be decompressed. The middle mold (intermediate plate) 102 has a frame-like (annular) shape and is disposed so as to be positioned directly above the lower mold outer peripheral member 113. The release film 100 can be held and fixed between the lower surface of the middle mold 102 and the upper surface of the lower mold outer peripheral member 113. An elastic O-ring 102a is attached to the peripheral portion of the upper surface of the intermediate mold 102. Further, in the compression molding apparatus, as shown in Fig. 7, rollers 104 are provided on the left and right sides of the drawing. Further, both ends of one strip of the release film 100 are wound around the left and right rolls 104, respectively. The release film 100 can be carried out from the right side to the left side of FIG. 7 or from the left side to the right side by the left and right rolls 104. Thereby, as described below, the plate-like member with the protruding electrode can be transported to the position of the lower mold cavity while being placed on the release film 100. That is, the roller 104 corresponds to transporting the above-described plate-like member having the protruding electrode to the forming die The transport unit of the cavity position. Further, although not shown, the compression molding apparatus (manufacturing device for electronic components) further includes a resin mounting unit. The resin mounting unit is configured to mount a resin on a surface on which the projection electrode of the plate-like member having the protruding electrode is formed.

接著,如圖7所示,將於單面固定有晶片31之基板21藉由夾具(clamper)101a固定於上模101之下表面。此時,使基板21之晶片31形成面朝向下方。再者,基板21及晶片31與實施例1相同,於基板21與實施例1相同地形成有配線圖案22。進而,如圖7所示,藉由上述樹脂載置單元,將樹脂材料(樹脂)41a載置於板狀構件11之突起電極12之固定面上(樹脂載置步驟)。再者,板狀構件11、突起電極12、及樹脂材料41a與實施例1相同。樹脂材料41a之形態無特別限定,於上述樹脂載置步驟中,較佳使樹脂材料41a不會從板狀構件11之突起電極12之固定面上掉落。例如,於上述樹脂載置步驟中,使片狀之樹脂材料41a於板狀構件11之突起電極12之固定面上層壓(層疊)並對其進行推壓亦可。進而,如圖7所示,將載置有樹脂材料41a之板狀構件11載置於離型膜100上。此時,如圖7所示,使板狀構件11之樹脂材料41a載置面(突起電極12之形成面)朝上(即,與突起電極12之形成面成相反側之一面與離型膜100之上表面接觸)。又,黏著劑(接著層)存在於離型膜100之上表面與板狀構件11之間(未圖示),並且藉由上述黏著劑(接著層)使板狀構件11固定於離型膜100上表面亦可。如此存在上述黏著劑(接著層)時,例如,如圖1(B)所示,即使於板狀構件11處形成有孔13,樹脂材料41a亦難以從孔13漏出,因此從該優點來看較佳。進而,如圖7所示,藉由上述搬送單元,將樹脂材料41a與板狀構件11、突起電極12、及離型膜100一同搬送至下模腔111b之位置。 Next, as shown in FIG. 7, the substrate 21 to which the wafer 31 is fixed on one side is fixed to the lower surface of the upper mold 101 by a clamper 101a. At this time, the wafer 31 forming surface of the substrate 21 is directed downward. Further, the substrate 21 and the wafer 31 are the same as in the first embodiment, and the wiring pattern 22 is formed on the substrate 21 in the same manner as in the first embodiment. Furthermore, as shown in FIG. 7, the resin material (resin) 41a is placed on the fixing surface of the bump electrode 12 of the plate-shaped member 11 by the resin mounting means (resin mounting step). Further, the plate member 11, the bump electrode 12, and the resin material 41a are the same as in the first embodiment. The form of the resin material 41a is not particularly limited. In the resin mounting step, the resin material 41a is preferably not dropped from the fixing surface of the protruding electrode 12 of the plate member 11. For example, in the resin mounting step, the sheet-like resin material 41a may be laminated (laminated) on the fixing surface of the bump electrode 12 of the plate member 11, and may be pressed. Further, as shown in FIG. 7, the plate-like member 11 on which the resin material 41a is placed is placed on the release film 100. At this time, as shown in FIG. 7, the mounting surface of the resin material 41a of the plate-like member 11 (the surface on which the projection electrode 12 is formed) faces upward (that is, the surface opposite to the surface on which the projection electrode 12 is formed and the release film) 100 surface contact). Further, an adhesive (adhesion layer) is present between the upper surface of the release film 100 and the plate member 11 (not shown), and the plate member 11 is fixed to the release film by the above adhesive (adhesion layer). 100 upper surface is also available. When the above-mentioned adhesive (adhesive layer) is present, for example, as shown in FIG. 1(B), even if the hole 13 is formed in the plate member 11, the resin material 41a is hard to leak from the hole 13, and therefore, from the viewpoint of the advantage Preferably. Furthermore, as shown in FIG. 7, the resin material 41a is conveyed together with the plate-shaped member 11, the protrusion electrode 12, and the release film 100 to the position of the lower cavity 111b by the said conveyance means.

接著,如圖8之箭頭114所示,使用真空泵(未圖示)對下模腔底面構件111a與下模外周構件112之間之間隙(空隙111c)進行減壓。而且,如圖8之箭頭115所示,使用真空泵(未圖示)對下模外周構件112與下 模外周構件113之間之間隙(空隙111d)進行減壓。進而,使中模102與O型環102a一同下降,並於中模102下表面與下模外周構件113上表面之間固持離型膜100。藉此,將離型膜100固定於下模外周構件112及下模外周構件113之上表面。又,藉由下模腔111b內之減壓114,能夠使離型膜100覆蓋於下模腔111b之表面上。藉此,如圖8所示,能夠將樹脂材料41a於其載置於板狀構件11上之狀態下,載置於下模腔之模腔面上。 Next, as shown by an arrow 114 in Fig. 8, a gap (void 111c) between the lower cavity bottom surface member 111a and the lower die outer peripheral member 112 is reduced by a vacuum pump (not shown). Further, as shown by an arrow 115 in Fig. 8, a vacuum pump (not shown) is used to the lower mold outer peripheral member 112 and the lower portion. The gap (void 111d) between the outer peripheral members 113 is depressurized. Further, the middle mold 102 is lowered together with the O-ring 102a, and the release film 100 is held between the lower surface of the middle mold 102 and the upper surface of the lower mold outer peripheral member 113. Thereby, the release film 100 is fixed to the upper surfaces of the lower mold outer peripheral member 112 and the lower mold outer peripheral member 113. Further, the release film 100 can be covered on the surface of the lower mold cavity 111b by the pressure reduction 114 in the lower mold cavity 111b. Thereby, as shown in FIG. 8, the resin material 41a can be placed on the cavity surface of the lower cavity in a state where it is placed on the plate-like member 11.

接著,如圖9~10所示,進行上述樹脂密封步驟。又,於圖9中,為了便於說明,省略夾具101a之圖示。 Next, as shown in FIGS. 9 to 10, the above resin sealing step is performed. In addition, in FIG. 9, the illustration of the jig 101a is abbreviate|omitted for convenience of description.

即,首先,如圖9所示,使下模111(下模腔底面構件111a、下模外周構件112及113),與中模102及用於隔斷外氣之O型環102a一同上升。此時,藉由接合上模101之模面與O型環102a之上表面側,至少將下模腔111b內設定為外氣隔斷狀態,從而能夠於上下中模(3個模)形成外氣隔斷空間部。於該狀態下,如箭頭107所示,能夠使用真空泵(未圖示)經由上模101之孔103至少吸引下模腔111b內(外氣隔斷空間部內),從而對其進行減壓。進而,使下模111與中模102成為一體並上升。此時,能夠隔著離型膜100接合下模外周構件112之上表面(下模111)與基板21之表面。 That is, first, as shown in FIG. 9, the lower mold 111 (the lower cavity bottom surface member 111a and the lower mold outer peripheral members 112 and 113) is raised together with the middle mold 102 and the O-ring 102a for blocking the outside air. At this time, by joining the mold surface of the upper mold 101 and the upper surface side of the O-ring 102a, at least the lower mold cavity 111b is set to the outside air shutoff state, so that external air can be formed in the upper and lower middle molds (3 molds). Partition space department. In this state, as indicated by an arrow 107, a vacuum pump (not shown) can be used to at least suction the inside of the lower mold cavity 111b (inside the outer air partition space portion) through the hole 103 of the upper mold 101, thereby reducing the pressure. Further, the lower mold 111 and the middle mold 102 are integrated and raised. At this time, the upper surface (lower mold 111) of the lower mold outer peripheral member 112 and the surface of the substrate 21 can be joined via the release film 100.

接著,使下模腔底面構件111a上升。此時,如圖9所示,藉由加熱等方式,使樹脂材料(樹脂)41a呈流動性樹脂(樹脂)41b之狀態。藉此,首先,於下模腔111b內,能夠將晶片31浸漬於流動性樹脂41b中;接著,能夠使用下模腔底面構件111a對下模腔111b內之流動性樹脂41b進行加壓。因此,如圖10所示,於下模腔111b內,能夠將安裝於基板21之晶片31(包括突起電極及配線圖案22)於由固化樹脂組成之密封樹脂(樹脂)41內壓縮成形(樹脂成形),藉此構成與下模腔111b之形狀對應之成形封裝體(樹脂成形體)。此時,板狀構件11處於安裝於 成形封裝體41之與基板21成相反側之頂面側之狀態。又,此時,於基板21與離型膜100之間具有一些間隙(空隙)亦可。 Next, the lower cavity bottom surface member 111a is raised. At this time, as shown in FIG. 9, the resin material (resin) 41a is in a state of a fluid resin (resin) 41b by heating or the like. Thereby, first, the wafer 31 can be immersed in the fluid resin 41b in the lower cavity 111b, and then the fluid resin 41b in the lower cavity 111b can be pressurized by the lower cavity bottom surface member 111a. Therefore, as shown in FIG. 10, in the lower mold cavity 111b, the wafer 31 (including the bump electrode and the wiring pattern 22) mounted on the substrate 21 can be compression-molded in a sealing resin (resin) 41 composed of a cured resin (resin The molding) constitutes a molded package (resin molded body) corresponding to the shape of the lower cavity 111b. At this time, the plate member 11 is mounted on The state of the top surface side of the formed package 41 opposite to the substrate 21 is formed. Further, at this time, there may be some gap (void) between the substrate 21 and the release film 100.

如上所述,如箭頭107所示,使用真空泵(未圖示)經由上模101之孔103至少對下模腔111b內進行吸引,使其減壓。而且,於該狀態下,將流動性樹脂41b與板狀構件11、突起電極12、晶片31、及基板21一同壓縮成形,從而對晶片31進行樹脂密封。此時,藉由使突起電極12與基板21之配線圖案22抵接而產生之推壓力,突起電極12整體相對地於垂直方向上受到推壓。藉由該推壓,如圖9所示,於設計成其高度大於流動性樹脂41b之厚度之突起電極12中,變形部12A發生彎曲。藉此,突起電極12於與板狀構件11之面方向垂直之方向上收縮(即,於與面方向垂直之方向上之長度變短),從而與樹脂密封零件之特定之厚度吻合。又,此時,突起電極12與形成於基板21上之配線圖案22接觸。進而,使流動性樹脂41b固化,如圖10所示,形成由固化樹脂組成之密封樹脂(樹脂)41。如此一來,能夠進行上述「樹脂密封步驟」,製造電子零件。 As described above, as indicated by an arrow 107, at least the inside of the lower cavity 111b is sucked through the hole 103 of the upper mold 101 using a vacuum pump (not shown) to reduce the pressure. In this state, the fluid resin 41b is compression-molded together with the plate-like member 11, the bump electrode 12, the wafer 31, and the substrate 21, and the wafer 31 is resin-sealed. At this time, the pressing force generated by abutting the bump electrode 12 and the wiring pattern 22 of the substrate 21 causes the entire bump electrode 12 to be pressed in the vertical direction. By this pressing, as shown in Fig. 9, in the projection electrode 12 designed to have a height larger than the thickness of the fluid resin 41b, the deformation portion 12A is bent. Thereby, the projecting electrode 12 is contracted in a direction perpendicular to the surface direction of the plate-like member 11 (that is, the length in the direction perpendicular to the plane direction is shortened) to match the specific thickness of the resin sealing member. Moreover, at this time, the bump electrode 12 is in contact with the wiring pattern 22 formed on the substrate 21. Further, the fluid resin 41b is cured, and as shown in FIG. 10, a sealing resin (resin) 41 composed of a cured resin is formed. In this way, the above-mentioned "resin sealing step" can be performed to manufacture electronic parts.

再者,如上所述,將晶片31浸漬於下模腔111b內之樹脂41中時,上述樹脂呈具有流動性之流動性樹脂41b之狀態。該流動性樹脂41b例如可為液體樹脂(固化前之熱固性樹脂等),或者亦可為將顆粒狀、粉末狀、膏狀等固體狀之樹脂加熱融化後之熔融狀態。樹脂材料41a之加熱,例如亦能夠藉由下模腔底面構件111a之加熱等進行。又,例如,於樹脂材料41a為熱固性樹脂且具有流動性(即,已處於流動性樹脂41b之狀態)之情形時,對下模腔111b內之樹脂材料41a(流動性樹脂41b)進行加熱並進行加壓,使之熱固化亦可。藉此,能夠於與下模腔之形狀對應之樹脂成形體(封裝體)內對晶片31進行樹脂密封成形(壓縮成形)。如此一來,例如,亦可於將板狀構件11露出於樹脂成形體(封裝體)之上表面(與基板成相反側之表面)之狀態下形成。 Further, as described above, when the wafer 31 is immersed in the resin 41 in the lower cavity 111b, the resin is in a state of fluidity of the fluid resin 41b. The fluid resin 41b may be, for example, a liquid resin (a thermosetting resin before curing) or a molten state in which a solid resin such as a pellet, a powder or a paste is heated and melted. The heating of the resin material 41a can be performed, for example, by heating of the lower cavity bottom surface member 111a or the like. Further, for example, when the resin material 41a is a thermosetting resin and has fluidity (that is, in a state of being in the state of the fluid resin 41b), the resin material 41a (flowable resin 41b) in the lower cavity 111b is heated and Pressurize and heat cure. Thereby, the wafer 31 can be resin-sealed (compression-molded) in the resin molded body (package) corresponding to the shape of the lower cavity. In this way, for example, the plate member 11 may be exposed to the upper surface (surface opposite to the substrate) of the resin molded body (package).

於進行壓縮成形(樹脂密封)之後,即,使流動性樹脂41b固化而形成密封樹脂41後,解除經由上模101之孔103對下模腔111b內進行之減壓(圖9之箭頭107)。接著,如圖10所示,使下模111(下模腔底面構件111a、下模外周構件112及113)與中模102及O型環102a一同下降。此時,解除對下模腔底面構件111a與下模外周構件112之間之空隙進行之減壓(抽真空)亦可。又,如箭頭116所示,相反地,亦可將空氣送入至上述空隙。藉此,如圖10所示,離型膜100從下模腔底面構件111a之上表面分離。此時,對下模外周構件112與113之間之空隙進行之減壓(抽真空)未被解除。又,中模102繼續處於與下模外周構件113一同固持離型膜100之狀態。因此,如圖10所示,離型膜100繼續吸附(固定)於下模外周構件112及113上表面。並且,藉由夾具101a,基板21繼續固定於上模101下表面(模面)。而且,樹脂41及板狀構件11與基板21及晶片31一同被壓縮成形,因此藉由下模111之下降,離型膜100從由基板21、板狀構件11、突起電極12、晶片31、及樹脂41形成之電子零件剝離。而且,藉由輥104,離型膜100向圖10中之右側方向或左側方向陸續送出(捲繞)。 After the compression molding (resin sealing), that is, after the fluid resin 41b is cured to form the sealing resin 41, the pressure reduction in the lower cavity 111b via the hole 103 of the upper mold 101 is released (arrow 107 in Fig. 9). . Next, as shown in FIG. 10, the lower mold 111 (the lower mold bottom surface member 111a and the lower mold outer peripheral members 112 and 113) is lowered together with the middle mold 102 and the O-ring 102a. At this time, the pressure reduction (vacuum) of the gap between the lower cavity bottom surface member 111a and the lower die outer circumferential member 112 may be released. Further, as indicated by the arrow 116, conversely, air may be supplied to the gap. Thereby, as shown in FIG. 10, the release film 100 is separated from the upper surface of the lower cavity bottom surface member 111a. At this time, the pressure reduction (vacuum) of the gap between the lower mold outer peripheral members 112 and 113 is not released. Further, the middle mold 102 continues to be in a state of holding the release film 100 together with the lower mold outer peripheral member 113. Therefore, as shown in FIG. 10, the release film 100 continues to be adsorbed (fixed) to the upper surfaces of the lower mold outer peripheral members 112 and 113. Further, the substrate 21 is continuously fixed to the lower surface (die surface) of the upper mold 101 by the jig 101a. Further, since the resin 41 and the plate member 11 are compression-molded together with the substrate 21 and the wafer 31, the release film 100 is lowered from the substrate 21, the plate member 11, the bump electrode 12, the wafer 31, and the like by the lower mold 111. The electronic component formed by the resin 41 is peeled off. Further, by the roller 104, the release film 100 is successively fed (winded) in the right direction or the left direction in FIG.

於本發明中,例如,如本實施例所示,於進行晶片之樹脂密封時,突起電極12整體存在於下模腔111b內之流動性樹脂41b(熔融樹脂或液態樹脂)中。於該狀態下,如上所述,若使下模腔底面構件111a上移,則於流動性樹脂41b中,突起電極12之前端部與基板21之配線圖案22以物理方式抵接而連接。藉由採用該方式,例如,與對晶片進行樹脂密封後穿過通孔形成孔之方法相比,突起電極之前端與基板之配線圖案容易接觸,且不會發生樹脂進入至兩者之間之情況。即,更有利於突起電極與基板之配線圖案之電性連接。例如,於板狀構件為屏蔽板之情形時,這一點對於屏蔽性能方面係有利。又,例如,代替閃電形(「Z」字形)變形部彎曲之方式,或除了此變形部彎曲以外, 又如圖3(A)~(D)或圖4(A)~(D)所示,突起電極12可收縮(高度變小)亦可。即,即使突起電極12之高度略大於樹脂41之厚度,於突起12c之前端與配線圖案22抵接時,突起12c向孔12b側之空隙進行彈性移動(下降),從而使突起電極12可收縮。藉此,如上所述,能夠對應於電子零件之樹脂厚度(封裝體厚度)來調整突起電極12之高度。 In the present invention, for example, as shown in the present embodiment, when the resin sealing of the wafer is performed, the bump electrode 12 as a whole is present in the fluid resin 41b (molten resin or liquid resin) in the lower cavity 111b. In this state, as described above, when the lower cavity bottom surface member 111a is moved upward, the front end portion of the protruding electrode 12 and the wiring pattern 22 of the substrate 21 are physically abutted and connected to each other in the fluid resin 41b. By adopting this method, for example, compared with the method of forming a hole through the through hole after resin sealing the wafer, the front end of the bump electrode is in easy contact with the wiring pattern of the substrate, and the resin does not enter between the two. Happening. That is, it is more advantageous to electrically connect the bump electrodes to the wiring patterns of the substrate. For example, in the case where the plate member is a shield plate, this is advantageous in terms of shielding performance. Further, for example, instead of or in addition to bending of the deformation portion of the lightning bolt ("Z" shape), Further, as shown in FIGS. 3(A) to (D) or FIGS. 4(A) to 4(D), the protruding electrode 12 may be shrunk (the height becomes small). That is, even if the height of the bump electrode 12 is slightly larger than the thickness of the resin 41, when the front end of the projection 12c abuts against the wiring pattern 22, the projection 12c elastically moves (drops) toward the gap on the side of the hole 12b, so that the projection electrode 12 can be shrunk. . Thereby, as described above, the height of the bump electrode 12 can be adjusted in accordance with the resin thickness (package thickness) of the electronic component.

接著,對圖11~12進行說明。於圖7~10中,對如下方法進行了說明:進行將樹脂41載置於板狀構件11上之「樹脂載置步驟」,然後,進行將帶有突起電極之板狀構件搬送至模腔位置之「搬送步驟」之方法。但是,如上所述,上述樹脂載置步驟與上述搬送步驟之順序無特別限定。圖11~12表示於上述搬送步驟後進行上述樹脂載置步驟之上述電子零件製造方法之實施例。如圖11~12所示,用於該方法之壓縮成形裝置(電子零件之製造裝置)除了具有樹脂供給單元60以外,與圖7~10之壓縮成形裝置(電子零件之製造裝置)相同。但是,於圖11~12中,為了簡化,省略了上模101、上模之孔(貫通孔)103、夾具101a、基板21、配線圖案22及晶片31之圖示。如圖11~12所示,樹脂供給單元60由樹脂供給部61及下部閘門62構成。樹脂供給部61為於上端及下端形成有開口之框狀形狀。樹脂供給部(框)61下端之開口被閘門62關閉。藉此,如圖11所示,於由樹脂供給部(框)61與下部閘門62所包圍之空間內,可容納樹脂材料41a。於該狀態下,如圖11所示,使樹脂供給單元60進入至下模腔111b之正上方(下模111與上模101之間之空間內)。而且,如圖12所示,藉由拉開下部閘門62而打開樹脂供給部(框)61下端之開口,能夠使樹脂材料41a從上述開口落下,將樹脂材料41a向下模腔111b內供給(載置)。再者,雖然樹脂材料41a於圖11及12中為顆粒樹脂,但並不特別限定於此。又,於圖7~圖10之步驟之前之上述樹脂載置步驟中,與圖11~12相同,可使用由樹脂供給部61及下部閘門62構成之樹脂供給單元60。 Next, FIGS. 11 to 12 will be described. In FIGS. 7 to 10, the following method has been described: a "resin mounting step" of placing the resin 41 on the plate member 11 is performed, and then the plate member having the protruding electrodes is transferred to the cavity. The method of "transfer step" of the location. However, as described above, the order of the resin mounting step and the above-described transport step is not particularly limited. 11 to 12 show an embodiment of the above-described electronic component manufacturing method in which the resin mounting step is performed after the above-described transfer step. As shown in FIGS. 11 to 12, the compression molding apparatus (manufacturing apparatus for electronic components) used in the method is the same as the compression molding apparatus (manufacturing apparatus for electronic components) of FIGS. 7 to 10 except for the resin supply unit 60. However, in FIGS. 11 to 12, the upper mold 101, the holes (through holes) 103 of the upper mold, the jig 101a, the substrate 21, the wiring pattern 22, and the wafer 31 are omitted for simplification. As shown in FIGS. 11 to 12, the resin supply unit 60 is composed of a resin supply unit 61 and a lower shutter 62. The resin supply portion 61 has a frame shape in which an opening is formed at the upper end and the lower end. The opening at the lower end of the resin supply portion (frame) 61 is closed by the shutter 62. Thereby, as shown in FIG. 11, the resin material 41a can be accommodated in the space surrounded by the resin supply part (frame) 61 and the lower gate 62. In this state, as shown in FIG. 11, the resin supply unit 60 is caused to enter directly above the lower mold cavity 111b (in the space between the lower mold 111 and the upper mold 101). Further, as shown in FIG. 12, by opening the lower shutter 62 and opening the opening of the lower end of the resin supply portion (frame) 61, the resin material 41a can be dropped from the opening, and the resin material 41a can be supplied into the lower mold cavity 111b ( Placed). Further, the resin material 41a is a particulate resin in FIGS. 11 and 12, but is not particularly limited thereto. Further, in the resin mounting step before the steps of FIGS. 7 to 10, similarly to FIGS. 11 to 12, the resin supply unit 60 composed of the resin supply portion 61 and the lower shutter 62 can be used.

於圖11~12所示之方法中,首先,於上述搬送步驟中,除了樹脂材料41a未載置於板狀構件11上以外,進行與圖7~8相同之步驟。藉此,如圖11所示,帶有突起電極之板狀構件(板狀構件11及突起電極12)除未載置樹脂材料41a以外,以與圖8相同之狀態,(隔著離型膜100)載置於下模腔111b之模腔面上。 In the method shown in Figs. 11 to 12, first, in the above-described transfer step, the steps similar to those in Figs. 7 to 8 are performed except that the resin material 41a is not placed on the plate member 11. As a result, as shown in FIG. 11, the plate-like member (the plate-like member 11 and the protruding electrode 12) having the protruding electrodes is in the same state as in FIG. 8 except that the resin material 41a is not placed (the release film is interposed). 100) placed on the cavity surface of the lower mold cavity 111b.

接著,於上述樹脂載置步驟之前,於圖11所示之狀態下,於下模腔內對帶有突起電極之板狀構件進行加熱(加熱步驟)。上述加熱例如能夠藉由下模腔底面構件111a之加熱等進行。於該加熱步驟中,較佳為,使帶有突起電極之板狀構件充分熱膨脹。即,較佳為,於之後進行之樹脂密封步驟中,使帶有突起電極之板狀構件不會由於加熱而發生膨脹。藉此,於上述樹脂密封步驟中,不易發生突起電極12與配線圖案22之位置偏移,容易對準位置。 Next, before the resin mounting step, the plate-like member having the protruding electrodes is heated in the lower cavity in the state shown in Fig. 11 (heating step). The heating can be performed, for example, by heating of the lower cavity bottom surface member 111a or the like. In the heating step, it is preferred that the plate-like member having the protruding electrodes is sufficiently thermally expanded. That is, it is preferable that the plate-like member with the protruding electrode is not expanded by heating in the resin sealing step which is performed later. Thereby, in the resin sealing step, the positional displacement of the bump electrode 12 and the wiring pattern 22 is less likely to occur, and the position is easily aligned.

進而,如圖12所示,於下模腔111b內,將樹脂材料41a載置於板狀構件11之突起電極12之固定面上(樹脂載置步驟)。於該步驟中,例如,拉開下部閘門62而打開樹脂供給部(框)61下端之開口,藉此使樹脂材料41a從上述開口落下,從而向下模腔111b內供給(載置)。之後,以與圖9~10相同之方式,進行上述樹脂密封步驟。再者,樹脂材料41a於圖12中為顆粒樹脂,但並不限定於此。例如,樹脂材料41a可為熱塑性樹脂(例如,顆粒樹脂、粉末樹脂等),亦可藉由帶有突起電極之板狀構件之熱量融化樹脂材料41a形成流動性樹脂41b後,進行冷卻使其固化。又,如上所述,樹脂材料41a可為固化前呈液態之熱固性樹脂,藉由帶有突起電極之板狀構件之熱量使其固化。 Furthermore, as shown in FIG. 12, the resin material 41a is placed in the lower mold cavity 111b on the fixing surface of the bump electrode 12 of the plate-shaped member 11 (resin mounting step). In this step, for example, the lower shutter 62 is opened to open the opening of the lower end of the resin supply portion (frame) 61, whereby the resin material 41a is dropped from the opening and supplied (placed) into the lower mold cavity 111b. Thereafter, the resin sealing step described above was carried out in the same manner as in FIGS. 9 to 10. Further, the resin material 41a is a particulate resin in Fig. 12, but is not limited thereto. For example, the resin material 41a may be a thermoplastic resin (for example, a particulate resin, a powder resin, or the like), and the fluid resin 41b may be formed by the heat-melting resin material 41a of the plate-like member having the protruding electrodes, and then cooled and solidified. . Further, as described above, the resin material 41a may be a thermosetting resin which is liquid before curing, and is cured by heat of a plate-like member having a protruding electrode.

又,於本實施例中,壓縮成形裝置之構造可為任意構造,不限於圖7~10所示構造,例如,與一般之壓縮成形裝置之構造相同或以其為基準亦可。具體而言,上述壓縮成形裝置之構造,例如可與日本專利特開2013-187340號公報、日本專利特開2005-225133號公報、日 本專利特開2010-069656號公報、日本專利特開2007-125783號公報、日本專利特開2010-036542號公報等所公開之構造相同或以其為基準。例如,壓縮成形裝置例如可採用與日本專利特開2013-187340號公報之圖2~6相同之構造(於上模上帶有薄膜壓板而不具有中模之構造)來代替圖7~10所示之構造。使用此種壓縮成形裝置之壓縮成形方法(電子零件之製造方法),例如能夠使其與日本專利特開2013-187340號公報中記載之方法相同,並進行實施。又,關於樹脂供給單元,可為代替圖11及12之樹脂供給單元60之任意構造。例如,上述樹脂供給單元可為日本專利特開2010-036542號公報所公開之樹脂材料之分配單元(包括樹脂材料之投入單元、計量單元、漏斗、及線性振動進料器等)。或者,上述樹脂供給單元係與日本專利特開2007-125783號公報中公開之樹脂供給機構相同,具備儲存部、計量部、投入部、供給部、閘門、托盤、狹縫(slit)等之構造亦可。又,例如,關於未於圖7~10中表示之下模之上下移動機構等,可與上述日本專利特開2005-225133號公報、日本專利特開2010-069656號公報等相同或以其為基準亦可,例如,可將彈性構件與下模腔底面構件之下方連接。 Further, in the present embodiment, the structure of the compression molding apparatus may be of any configuration, and is not limited to the configuration shown in Figs. 7 to 10, and may be the same as or based on the configuration of a general compression molding apparatus. Specifically, the configuration of the above-described compression molding apparatus can be, for example, Japanese Patent Laid-Open Publication No. 2013-187340, Japanese Patent Laid-Open Publication No. 2005-225133 The structures disclosed in the Japanese Patent Laid-Open Publication No. 2010-069656, the Japanese Patent Publication No. 2007-125783, and the Japanese Patent Publication No. 2010-036542 are the same or the same. For example, in the compression molding apparatus, for example, the same configuration as that of Figs. 2 to 6 of Japanese Laid-Open Patent Publication No. 2013-187340 (a structure having a film pressing plate on the upper mold without a middle mold) may be employed instead of Figs. 7 to 10. The structure of the display. The compression molding method (method of manufacturing an electronic component) using such a compression molding apparatus can be carried out, for example, in the same manner as the method described in Japanese Laid-Open Patent Publication No. 2013-187340. Further, the resin supply unit may be of any configuration other than the resin supply unit 60 of FIGS. 11 and 12. For example, the resin supply unit may be a distribution unit of a resin material disclosed in Japanese Laid-Open Patent Publication No. 2010-036542 (including an input unit of a resin material, a metering unit, a funnel, a linear vibrating feeder, etc.). Alternatively, the resin supply unit is the same as the resin supply unit disclosed in Japanese Laid-Open Patent Publication No. 2007-125783, and includes a structure such as a storage unit, a metering unit, an input unit, a supply unit, a shutter, a tray, and a slit. Also. In addition, for example, the above-described lower mold moving mechanism or the like, which is not shown in FIGS. 7 to 10, may be the same as or used in the above-mentioned Japanese Patent Laid-Open Publication No. 2005-225133, Japanese Patent Laid-Open No. 2010-069656, or the like. The reference may also, for example, connect the elastic member to the lower surface of the lower cavity bottom member.

又,於本實施例中,使用了對下模腔內進行減壓而壓縮成形之方法。但是,本發明不限於此,亦可使用其他壓縮成形(壓模)。 Further, in the present embodiment, a method of reducing the pressure in the lower cavity and compressing the molding is used. However, the present invention is not limited thereto, and other compression forming (compression molding) may be used.

又,如上所述,本發明之製造方法係包括上述樹脂密封步驟之製造方法,例如,如本實施例中所示,亦可包括其他任意步驟。 Further, as described above, the manufacturing method of the present invention includes the above-described manufacturing method of the resin sealing step, and for example, as shown in the present embodiment, any other steps may be included.

於本實施例中,如上所述,將上述帶有突起電極之板狀構件載置於離型膜上,於該狀態下,將上述帶有突起電極之板狀構件搬送至成形模之模腔內。藉此,例如,可容易簡化板狀構件及其搬送單元之構造。又,於本實施例中,如上所述,於將上述帶有突起電極之板狀構件載置於上述離型膜上之狀態下,將上述樹脂載置於上述帶有突起電極之板狀構件上。藉此,例如,於圖7~10中,能夠防止樹脂(樹脂 材料41a、流動性樹脂41b及密封樹脂41)與下模腔底面構件111a接觸,並能夠防止上述樹脂進入至下模111與下模外周構件112之空隙內。 In the present embodiment, as described above, the plate-like member having the protruding electrode is placed on the release film, and in this state, the plate-like member having the protruding electrode is transferred to the cavity of the forming die. Inside. Thereby, for example, the structure of the plate-shaped member and the conveying unit can be easily simplified. Further, in the present embodiment, as described above, the resin is placed on the plate-like member having the protruding electrode in a state where the plate-like member having the protruding electrode is placed on the release film. on. Thereby, for example, in FIGS. 7 to 10, resin (resin can be prevented) The material 41a, the fluid resin 41b, and the sealing resin 41) are in contact with the lower cavity bottom surface member 111a, and the resin can be prevented from entering the gap between the lower mold 111 and the lower mold outer peripheral member 112.

再者,於本發明中,搬送上述帶有突起電極之板狀構件(呈載置或未載置樹脂之狀態)之單元(機構)不限於圖7~10之構成,可為具有其他任意構成之搬送單元(搬送機構)。例如,於圖7~10中,上述離型膜之形狀為將長條之離型膜捲成卷之離型膜,但不限於此。例如,上述離型膜之形狀可為短條之離型膜、長條之離型膜、捲成卷之離型膜等任意形狀。例如,於本發明之製造方法中供給離型膜之前,可將長條之離型膜或捲成卷之離型膜切斷(預先切斷)而形成短條之離型膜。於使用經預先切斷之離型膜之情形時,上述搬送步驟(將上述帶有突起電極之板狀構件搬送至成形模模腔之位置之步驟),例如,可與日本專利特開2013-187340號公報之圖1及其說明相同地進行。 Further, in the present invention, the unit (mechanism) for transporting the plate-like member having the protruding electrode (in a state in which the resin is placed or not) is not limited to the configuration of FIGS. 7 to 10, and may have any other configuration. Transfer unit (transport mechanism). For example, in FIGS. 7 to 10, the shape of the release film is a release film in which a long release film is wound into a roll, but is not limited thereto. For example, the shape of the release film may be any shape such as a release film of a short strip, a release film of a long stripe, or a release film wound into a roll. For example, before the release film is supplied in the production method of the present invention, a long release film or a release film wound into a roll may be cut (pre-cut) to form a short release film. In the case of using a pre-cut release film, the above-described transfer step (step of transferring the plate-like member having the protruding electrode to the position of the molding cavity), for example, can be combined with Japanese Patent Laid-Open No. 2013- Figure 1 of the 187340 and the description thereof are performed in the same manner.

[實施例3] [Example 3]

接著,對本發明之又一個實施例進行說明。於本實施例中,表示了使用具有變形部之帶有突起電極之板狀構件來進行壓縮成形之製造方法之又一例。 Next, still another embodiment of the present invention will be described. In the present embodiment, still another example of a manufacturing method in which compression molding is performed using a plate-like member having a protruding electrode having a deformed portion is shown.

於圖13~16之步驟剖視圖中,模式性表示了本實施例之製造方法。如圖13~16所示,本實施例與實施例2(圖7~10)不同之處在於,未使用離型膜100及板狀構件11之形狀不同。 In the cross-sectional view of the steps of Figs. 13 to 16, the manufacturing method of this embodiment is schematically shown. As shown in FIGS. 13 to 16, this embodiment differs from the second embodiment (FIGS. 7 to 10) in that the shape of the release film 100 and the plate member 11 are not used.

於本實施例中,板狀構件11之周緣部隆起,從而中央部成為樹脂容納部。更具體而言,如圖所示,板狀構件11之周緣部向板狀構件11之突起電極12之固定面側隆起,從而形成壁狀構件11b。藉此,板狀構件11之中央部形成為樹脂容納部11c。即,板狀構件11藉由使其周緣部隆起並形成壁狀構件11b,形成托盤型(上表面開放之箱型)之形狀。而且,板狀構件11之中央部形成由板狀構件11之本體(底面部)與 壁狀構件(周緣部)11b所包圍之樹脂容納部(上述托盤型形狀之凹部)11c。又,如圖所示,突起電極12固定於板狀構件11本體(底面部)之上述樹脂容納部(凹部)11c側之面。又,壁狀構件11b係板狀構件11之一部分,與突起電極12不同。壁狀構件11b例如具有作為散熱零件、或用於屏蔽電磁波之屏蔽零件之功能亦可。於板狀構件11具有壁狀構件11b之情形時,突起電極12之形狀無特別限定,可為任意形狀,但較佳為,例如突起電極12之至少一個為上述板狀突起電極。於本實施例中,由於具有樹脂容納部11c,即使不使用離型膜,亦能夠抑制或防止樹脂(樹脂材料41a、流動性樹脂41b及密封樹脂41)與下模腔底面構件接觸,並能夠抑制或防止上述樹脂進入至下模外周構件與下模腔底面構件之間之空隙內。因此,藉由省略離型膜能夠節約成本,並且藉由能夠省略黏貼或吸附離型膜之步驟,因此提高了電子零件之製造效率。 In the present embodiment, the peripheral edge portion of the plate-like member 11 is swelled, so that the central portion becomes a resin accommodating portion. More specifically, as shown in the figure, the peripheral edge portion of the plate-like member 11 is swelled toward the fixing surface side of the protruding electrode 12 of the plate-like member 11, thereby forming the wall-shaped member 11b. Thereby, the central portion of the plate-like member 11 is formed as the resin accommodating portion 11c. In other words, the plate-like member 11 is formed into a tray type (box shape in which the upper surface is open) by bulging its peripheral portion and forming the wall member 11b. Further, the central portion of the plate member 11 is formed by the body (bottom portion) of the plate member 11 and A resin accommodating portion (the above-described tray-shaped recessed portion) 11c surrounded by the wall member (peripheral portion) 11b. Moreover, as shown in the figure, the protruding electrode 12 is fixed to the surface of the main body (bottom portion) of the plate-like member 11 on the side of the resin accommodating portion (recessed portion) 11c. Further, the wall member 11b is a part of the plate-like member 11, which is different from the protruding electrode 12. The wall member 11b may have a function as a heat dissipating member or a shield member for shielding electromagnetic waves, for example. In the case where the plate-like member 11 has the wall-shaped member 11b, the shape of the protruding electrode 12 is not particularly limited, and may be any shape. Preferably, for example, at least one of the protruding electrodes 12 is the above-described plate-like protruding electrode. In the present embodiment, since the resin accommodating portion 11c is provided, it is possible to suppress or prevent the resin (the resin material 41a, the fluid resin 41b, and the sealing resin 41) from coming into contact with the lower cavity bottom member without using the release film, and The resin is inhibited or prevented from entering the gap between the lower mold outer peripheral member and the lower mold cavity bottom member. Therefore, cost can be saved by omitting the release film, and the manufacturing efficiency of the electronic component can be improved by omitting the step of pasting or adsorbing the release film.

於本實施例中,如圖13~16所示,包括成形模(上模及下模)之壓縮成形裝置能夠使用除了不具有離型膜之輥及中模以外與實施例2相同之裝置。具體而言,如圖所示,上述壓縮成形裝置以上模1001與下模1011為主要構成要素。下模1011包括下模腔底面構件1011a及下模外周構件(下模本體)1012。下模外周構件(下模本體)1012為框體狀之下模腔側面構件。更具體而言,下模外周構件1012以包圍下模腔底面構件1011a周圍之方式配置。於下模腔底面構件1011a與下模外周構件1012之間具有空隙(吸附孔)1011c。如圖14及圖15之箭頭1014所示,可使用真空泵(未圖示)對該空隙1011c進行減壓,從而吸附板狀構件。又,於壓縮成形之後,如圖16之箭頭1016所示,相反地從該空隙1011c送入空氣,藉此能使上述板狀構件脫離。下模外周構件1012上表面之高度比下模腔底面構件1011a上表面之高度更高。藉此,形成了由下模腔底面構件1011a上表面與下模外周構件1012內周面所包圍 之下模腔(凹部)1011b。又,於上模1001開通有孔(貫通孔)1003。藉此,如圖15之箭頭1007所示,進行合模後,使用真空泵(未圖示)從孔1003進行吸引,從而至少能夠對下模腔1011b內進行減壓。於下模之外周構件1012上表面之周緣部上,安裝有具有彈性之O型環1012a。又,雖未圖示,該壓縮成形裝置(電子零件之製造裝置)進而包括樹脂載置單元及搬送單元。上述樹脂載置單元將樹脂載置於上述帶有突起電極之板狀構件之上述突起電極之形成面上。上述搬送單元將上述帶有突起電極之板狀構件搬送至成形模之模腔之位置。 In the present embodiment, as shown in Figs. 13 to 16, the compression molding apparatus including the molding die (upper die and lower die) can use the same apparatus as in the second embodiment except for the roller and the intermediate die which do not have the release film. Specifically, as shown in the figure, the above-described compression molding apparatus upper mold 1011 and lower mold 1011 are main components. The lower mold 1011 includes a lower cavity bottom surface member 1011a and a lower mold outer peripheral member (lower mold body) 1012. The lower mold outer peripheral member (lower mold main body) 1012 is a frame-shaped lower mold cavity side member. More specifically, the lower mold outer peripheral member 1012 is disposed to surround the lower cavity bottom surface member 1011a. A gap (adsorption hole) 1011c is provided between the lower cavity bottom surface member 1011a and the lower die outer circumferential member 1012. As shown by an arrow 1014 in FIGS. 14 and 15, the gap 1011c can be decompressed using a vacuum pump (not shown) to adsorb the plate-like member. Further, after the compression molding, as shown by an arrow 1016 in Fig. 16, air is supplied from the gap 1011c in the opposite direction, whereby the plate-like member can be detached. The height of the upper surface of the lower mold peripheral member 1012 is higher than the height of the upper surface of the lower cavity bottom member 1011a. Thereby, the upper surface of the lower cavity bottom surface member 1011a and the inner peripheral surface of the lower mold outer peripheral member 1012 are formed. Lower cavity (recess) 1011b. Further, a hole (through hole) 1003 is opened in the upper mold 1001. Thereby, as shown by an arrow 1007 in Fig. 15, after the mold clamping is performed, suction is performed from the hole 1003 using a vacuum pump (not shown), so that at least the inside of the lower mold cavity 1011b can be depressurized. An elastic O-ring 1012a is attached to the peripheral portion of the upper surface of the lower peripheral member 1012. Further, although not shown, the compression molding apparatus (manufacturing device for electronic components) further includes a resin mounting unit and a conveying unit. The resin mounting unit mounts a resin on a surface on which the projection electrode of the plate-like member having the protruding electrode is formed. The transport unit transports the plate-like member having the protruding electrode to a position of a cavity of the molding die.

如圖13~16所示,本實施例之製造方法於不使用離型膜,將於樹脂容納部11c內載置有樹脂材料41a之板狀構件11搬送至下模腔1011b之位置。又,如圖14之箭頭1014所示,使用真空泵(未圖示)對下模外周構件1012與下模腔底面構件1011a之間之空隙1011c進行減壓,從而使板狀構件11吸附於下模腔1011b(下模腔底面構件1011a上表面及下模外周構件1012內周面)上,以代替使離型膜吸附於下模及下模外周構件上。除此以外,本實施例(圖13~16)之製造方法能夠按與實施例2之圖7~10相同之方式進行。 As shown in FIGS. 13 to 16, the manufacturing method of the present embodiment is carried out at a position where the plate-like member 11 on which the resin material 41a is placed in the resin containing portion 11c is transported to the lower mold cavity 1011b without using a release film. Further, as shown by an arrow 1014 in Fig. 14, the gap 1011c between the lower mold outer peripheral member 1012 and the lower cavity bottom surface member 1011a is depressurized by a vacuum pump (not shown) to adsorb the plate member 11 to the lower mold. Instead of the release film being adsorbed to the lower die and the lower die outer peripheral member, the cavity 1011b (the upper surface of the lower cavity bottom surface member 1011a and the inner peripheral surface of the lower die outer peripheral member 1012) is replaced. Otherwise, the manufacturing method of the present embodiment (Figs. 13 to 16) can be carried out in the same manner as in Figs. 7 to 10 of the second embodiment.

更具體而言,圖15~16所示之步驟(樹脂密封步驟)例如能夠以如下方式進行。即,首先,從圖14之狀態開始,使下模1011上移,從而使上模1001之模面與下模之O型環1012a之上端抵接。此時,使上模面(上模1001之模面)與下模面(下模1011之模面)之間保持所需之間隔。即,於上模1001與下模1011完全合模之前,進行使兩者之間保持所需間隔之中模合模。於進行該中模合模時,用O型環1012a至少使上下兩個模面間與模腔空間部處於外氣隔斷狀態,從而能夠形成外氣隔斷空間部。又,此時,如圖15之箭頭1007所示,從上模之孔1003強制地吸引上述外氣隔斷空間部內之空氣並將其排出,從而能夠將上述外氣隔斷空間部內設定為特定之真空度。接著,閉合上模面(上模 1001之模面)與下模面(下模1011之模面),藉此進行完全合模。進而,使模腔底面零件1011a上移。再者,此時,如圖15所示,使樹脂材料41a處於流動性樹脂41b之狀態。藉此,如圖15所示,接合突起電極12與配線圖案22,且使晶片31浸漬於流動性樹脂41b中,進而,對下模腔1011b內之流動性樹脂41b進行加壓。進而,如下所述,使流動性樹脂41b固化,如圖23所示,形成由固化樹脂組成之密封樹脂(樹脂)41。藉此,能夠將安裝於基板11上之晶片31於所需形狀之樹脂41(固化樹脂)內壓縮成形(密封成形)。更具體而言,如圖16所示,於下模腔1011b內,將安裝於基板21上之晶片31(包括突起電極及配線圖案22)壓縮成形(樹脂成形)於由固化樹脂組成之密封樹脂(樹脂)41內,從而能夠形成與下模腔1011b之形狀對應之成形封裝體(樹脂成形體)。此時,板狀構件11處於安裝於上述成形封裝體之與基板21成相反側之頂面側之狀態。而且,此時,由於模腔底面零件1011a上移產生之推壓力,突起電極12整體相對地於與板狀構件11之面方向垂直之方向上受到推壓。藉由該推壓,如圖所示,於設計成高於流動性樹脂41b厚度之突起電極12中,變形部12A發生彎曲。藉此,突起電極12於與板狀構件11之面方向垂直之方向上收縮,從而與樹脂密封零件之特定厚度吻合。而且,如圖16所示,經過流動性樹脂41b固化所需要之時間後,對上模及下模這兩個模進行開模。具體而言,使下模1011(下模腔底面構件1011a及下模外周構件1012)與O型環1012a一同下降。藉此,開放下模腔1011b內從而解除減壓。此時,解除下模腔底面構件1011a與下模外周構件1012之間之空隙之減壓(抽真空)。如箭頭1016所示,相反地,可將空氣送入至上述空隙中。藉此,能夠製得具有具備樹脂容納部11c之板狀構件11、基板21、晶片31、配線圖案22及突起電極12之電子零件(成形品)。 More specifically, the steps (resin sealing step) shown in FIGS. 15 to 16 can be performed, for example, in the following manner. That is, first, from the state of Fig. 14, the lower mold 1011 is moved up, and the mold surface of the upper mold 1001 is brought into contact with the upper end of the O-ring 1012a of the lower mold. At this time, the required interval is maintained between the upper die face (the die face of the upper die 1001) and the lower die face (the die face of the lower die 1011). That is, before the upper mold 1001 and the lower mold 1011 are completely closed, the mold clamping is performed while maintaining the required interval therebetween. When the middle mold clamping is performed, at least the upper and lower mold faces and the cavity space portion are separated from each other by the O-ring 1012a, so that the outer air partition space portion can be formed. At this time, as shown by an arrow 1007 in Fig. 15, the air in the outer air partition space portion is forcibly sucked and discharged from the hole 1003 of the upper mold, and the inside of the outer air partition space portion can be set to a specific vacuum. degree. Next, close the upper die face (upper die The die face of 1001) and the lower die face (the die face of the lower die 1011) are thereby completely closed. Further, the cavity bottom surface part 1011a is moved up. In this case, as shown in FIG. 15, the resin material 41a is placed in a state of the fluid resin 41b. As a result, as shown in FIG. 15, the bump electrode 12 and the wiring pattern 22 are bonded, and the wafer 31 is immersed in the fluid resin 41b, and the fluid resin 41b in the lower mold cavity 1011b is further pressurized. Further, as described below, the fluid resin 41b is cured, and as shown in Fig. 23, a sealing resin (resin) 41 composed of a cured resin is formed. Thereby, the wafer 31 mounted on the substrate 11 can be compression-molded (sealed and formed) in the resin 41 (cured resin) of a desired shape. More specifically, as shown in FIG. 16, in the lower mold cavity 1011b, the wafer 31 (including the bump electrode and the wiring pattern 22) mounted on the substrate 21 is compression-molded (resin-molded) to a sealing resin composed of a cured resin. In the (resin) 41, a molded package (resin molded body) corresponding to the shape of the lower cavity 1011b can be formed. At this time, the plate-like member 11 is in a state of being attached to the top surface side of the formed package which is opposite to the substrate 21. Further, at this time, due to the pressing force generated by the upward movement of the cavity bottom surface part 1011a, the entire protruding electrode 12 is pressed in the direction perpendicular to the surface direction of the plate-like member 11. By this pressing, as shown in the figure, in the projection electrode 12 designed to be higher than the thickness of the fluid resin 41b, the deformation portion 12A is bent. Thereby, the protruding electrode 12 is contracted in a direction perpendicular to the surface direction of the plate-like member 11 to match the specific thickness of the resin sealing member. Further, as shown in Fig. 16, after the time required for the fluid resin 41b to cure, the two molds of the upper mold and the lower mold are opened. Specifically, the lower mold 1011 (the lower cavity bottom surface member 1011a and the lower mold outer peripheral member 1012) is lowered together with the O-ring 1012a. Thereby, the inside of the lower cavity 1011b is opened to release the pressure reduction. At this time, the pressure reduction (vacuum) of the gap between the lower cavity bottom surface member 1011a and the lower mold outer circumferential member 1012 is released. As indicated by arrow 1016, conversely, air can be delivered into the aforementioned voids. Thereby, an electronic component (molded article) having the plate-like member 11 including the resin containing portion 11c, the substrate 21, the wafer 31, the wiring pattern 22, and the bump electrode 12 can be obtained.

又,本實施例並不限於此,例如,與實施例2之圖11~12相同, 於上述搬送步驟之後進行上述樹脂載置步驟亦可。於此情形時,與實施例2相同,較佳為,於上述樹脂載置步驟之前,於下模腔內對帶有突起電極之板狀構件進行加熱(加熱步驟)。又,於該加熱步驟中,根據與實施例2相同之理由,較佳為,使帶有突起電極之板狀構件充分熱膨脹。 Further, the present embodiment is not limited thereto, and is, for example, the same as FIGS. 11 to 12 of the second embodiment, The resin mounting step may be performed after the above-described transfer step. In this case, as in the second embodiment, it is preferable to heat the plate-like member having the protruding electrode in the lower cavity before the resin mounting step (heating step). Further, in the heating step, for the same reason as in the second embodiment, it is preferred that the plate-like member having the protruding electrode is sufficiently thermally expanded.

再者,於本發明中,上述板狀構件之形狀不限於本實施例及實施例1~2之形狀,可為任意形狀。例如,上述板狀構件之形狀除了突起電極固定於單面以外,可為與專利文獻2(日本專利特開2013-187340)中舉例表示之板狀構件相同之形狀。於圖17及18中,分別表示了變更了板狀構件形狀之製造方法(變化例)之一例。於圖17中,板狀構件11除了於與突起電極12之固定面成相反側之表面(於該圖中為面向下模腔底面構件111a一側之表面)具有散熱片11a以外,與圖7~10(實施例2)相同,能夠使用與圖7~10相同之壓縮成形裝置以與實施例2相同之方式進行。於圖18中,板狀構件11除了於與突起電極12之固定面成相反側之表面(於圖18中,面向下模腔底面構件1011a一側之表面)具有散熱片11a以外,與圖13~16(實施例3)相同,能夠使用與圖13~16相同之壓縮成形裝置並以與實施例3相同之方式進行。再者,於圖18之壓縮成形裝置中,如圖所示,於下模腔底面構件1011a上表面,形成有可與散熱片11a之凹凸形狀嵌合之凹凸形狀。若形成此種形狀,則具有如下優點:板狀構件11於下模腔內穩定,並且下模腔底面構件1011a之上表面不容易受到由散熱片帶來之損傷。又,如圖18所示,較佳為,散熱片11a以無法於下模外周構件1012與板狀構件11之間形成間隙之方式形成其形狀。若採用此種形狀,則容易於下模腔內有效地進行基於減壓之吸引(箭頭1014)。 Furthermore, in the present invention, the shape of the plate-like member is not limited to the shape of the embodiment and the examples 1 and 2, and may be any shape. For example, the shape of the above-mentioned plate-like member may be the same as that of the plate-like member exemplified in Patent Document 2 (Japanese Patent Laid-Open Publication No. 2013-187340), except that the protruding electrode is fixed to one surface. In Figs. 17 and 18, an example of a manufacturing method (variation) in which the shape of the plate member is changed is shown. In Fig. 17, the plate-like member 11 has a heat sink 11a other than the surface on the opposite side to the fixed surface of the bump electrode 12 (the surface facing the lower cavity bottom surface member 111a in the figure), and Fig. 7 In the same manner as in the second embodiment, the same compression molding apparatus as that of Figs. 7 to 10 can be used in the same manner as in the second embodiment. In Fig. 18, the plate-like member 11 has a heat sink 11a other than the surface on the opposite side to the fixed surface of the bump electrode 12 (the surface facing the lower cavity bottom surface member 1011a in Fig. 18), and Fig. 13 In the same manner as in the third embodiment, the same processing as that of the third embodiment can be carried out in the same manner as in the third embodiment. Further, in the compression molding apparatus of Fig. 18, as shown in the drawing, on the upper surface of the lower cavity bottom surface member 1011a, a concavo-convex shape which can be fitted to the uneven shape of the fins 11a is formed. If such a shape is formed, there is an advantage that the plate member 11 is stabilized in the lower cavity, and the upper surface of the lower cavity bottom member 1011a is less susceptible to damage by the fin. Moreover, as shown in FIG. 18, it is preferable that the heat sink 11a is formed in such a shape that a gap cannot be formed between the lower die outer peripheral member 1012 and the plate member 11. When such a shape is adopted, it is easy to efficiently perform suction by decompression in the lower cavity (arrow 1014).

[實施例4] [Example 4]

接著,使用圖19~20,對本發明又一實施例進行說明。於本實 施例中,表示了使用具有變形部之帶有突起電極之板狀構件來製造之方法之又一例。 Next, still another embodiment of the present invention will be described using Figs. Yu Shishi In the embodiment, a further example of a method of manufacturing a plate-like member having a protruding electrode having a deformed portion is shown.

圖19之剖視圖模式性表示本實施例之製造方法。如圖所示,該製造方法使用下模121、上模(安裝器(rmounter))122、及真空腔123而進行。下模121上表面呈平坦面,可載置電子零件之基板。真空腔123係與電子零件之形狀相對應之筒狀形狀,且可載置於上述電子零件之基板上。上模122可與真空腔123之內壁嵌合。 Fig. 19 is a cross-sectional view schematically showing the manufacturing method of this embodiment. As shown, the manufacturing method is performed using a lower mold 121, an upper mold (rmounter) 122, and a vacuum chamber 123. The upper surface of the lower mold 121 has a flat surface, and the substrate of the electronic component can be placed. The vacuum chamber 123 has a cylindrical shape corresponding to the shape of the electronic component, and can be placed on the substrate of the electronic component. The upper mold 122 is engageable with the inner wall of the vacuum chamber 123.

於本實施例之製造方法中,首先,將由液態樹脂(熱固性樹脂)組成之樹脂材料(樹脂)41a印刷於單面固定有晶片31及配線圖案22之基板21之、上述晶片31及配線圖案22之固定面上。接著,使於板狀構件11之單面固定有突起電極12之帶有突起電極之板狀構件之突起電極12,貫通液態樹脂41a而與配線圖案22接觸。藉此,基板21、晶片31、液態樹脂41a、板狀構件11及突起電極12以與成品之電子零件20(圖5)中之位置關係呈相同位置關係之方式配置。而且,例如,如圖19所示,使基板21、晶片31、液態樹脂41a、板狀構件11及突起電極12以呈上述位置關係(配置)之方式配置於下模121之上表面。此時,如圖所示,使基板21之與晶片31配置側相反之一側與下模121之上表面接觸,並且於晶片31配置側之表面上配置帶有突起電極之板狀構件(板狀構件11及具有變形部12A之突起電極12)。 In the manufacturing method of the present embodiment, the resin material (resin) 41a composed of a liquid resin (thermosetting resin) is printed on the wafer 31 and the wiring pattern 22 on the substrate 21 on which the wafer 31 and the wiring pattern 22 are fixed on one side. On the fixed surface. Then, the bump electrode 12 having the plate-like member having the bump electrode on the one surface of the plate member 11 is fixed to the wiring pattern 22 so as to penetrate the liquid resin 41a. Thereby, the substrate 21, the wafer 31, the liquid resin 41a, the plate-like member 11, and the bump electrode 12 are disposed in the same positional relationship with the positional relationship in the electronic component 20 (FIG. 5) of the finished product. Further, for example, as shown in FIG. 19, the substrate 21, the wafer 31, the liquid resin 41a, the plate-like member 11, and the protruding electrode 12 are disposed on the upper surface of the lower mold 121 in the above-described positional relationship (arrangement). At this time, as shown in the figure, one side of the substrate 21 opposite to the side on which the wafer 31 is disposed is brought into contact with the upper surface of the lower mold 121, and a plate-like member having a protruding electrode is disposed on the surface on the side of the arrangement side of the wafer 31 (plate) The member 11 and the protruding electrode 12) having the deformed portion 12A.

接著,將真空腔123載置於基板21上表面之周緣部之、未配置(載置)有液態樹脂41a之部分。藉此,晶片31、液態樹脂41a、板狀構件11及突起電極12之周圍被真空腔123包圍。而且,使上模122從晶片31、液態樹脂41a、板狀構件11及突起電極12之上方下降,並嵌合於真空腔123之內壁。藉此,將晶片31、液態樹脂41a及突起電極12容納於由板狀構件11、真空腔123及上模122包圍密閉之內部空間內。進而,使用真空泵(未圖示)對上述內部空間內進行減壓。藉此,晶片 31、液態樹脂41a、板狀構件11及突起電極12被上模122推壓。此時,具有變形部12A之突起電極12與基板21之配線圖案22抵接。進而,由於上模122之推壓力,突起電極12整體相對地於與板狀構件11之面方向垂直之方向上受到推壓。由於該推壓,於設計成高於液態樹脂41a厚度之突起電極12中,變形部12A發生彎曲。藉此,突起電極12於與板狀構件11之面方向垂直之方向上收縮,從而與樹脂密封零件之特定之厚度吻合。而且,於該狀態下,加熱液態樹脂(熱固性樹脂)41a並使其固化,與板狀構件11及突起電極12一同對晶片31進行樹脂密封。例如能夠藉由下模121之加熱來進行液態樹脂41a之加熱。藉此,能夠製造與圖5所示之電子零件20相同之電子零件。 Next, the vacuum chamber 123 is placed on the peripheral portion of the upper surface of the substrate 21, and the portion where the liquid resin 41a is not placed (mounted). Thereby, the periphery of the wafer 31, the liquid resin 41a, the plate-like member 11, and the bump electrode 12 is surrounded by the vacuum chamber 123. Then, the upper mold 122 is lowered from above the wafer 31, the liquid resin 41a, the plate member 11, and the bump electrode 12, and fitted into the inner wall of the vacuum chamber 123. Thereby, the wafer 31, the liquid resin 41a, and the bump electrode 12 are housed in the sealed internal space surrounded by the plate member 11, the vacuum chamber 123, and the upper mold 122. Further, a pressure is reduced in the internal space by using a vacuum pump (not shown). Thereby, the wafer 31. The liquid resin 41a, the plate member 11, and the protruding electrode 12 are pressed by the upper mold 122. At this time, the bump electrode 12 having the deformed portion 12A is in contact with the wiring pattern 22 of the substrate 21. Further, due to the urging force of the upper mold 122, the entire projection electrode 12 is pressed against the direction perpendicular to the surface direction of the plate-like member 11. Due to this pressing, in the projection electrode 12 designed to be higher than the thickness of the liquid resin 41a, the deformation portion 12A is bent. Thereby, the protruding electrode 12 is contracted in a direction perpendicular to the surface direction of the plate-like member 11 to match the specific thickness of the resin sealing member. In this state, the liquid resin (thermosetting resin) 41a is heated and solidified, and the wafer 31 is resin-sealed together with the plate-like member 11 and the bump electrode 12. For example, heating of the liquid resin 41a can be performed by heating of the lower mold 121. Thereby, the same electronic component as the electronic component 20 shown in FIG. 5 can be manufactured.

再者,於本實施例中,例如,可省略基於真空腔之減壓。但是,例如,於板狀構件與樹脂之間不允許存在空氣或間隙之情形時等,較佳為,進行基於真空腔之減壓。又,於省略基於真空腔之減壓之情形時,基於上模(安裝器)之推壓可進行,亦可不進行。 Furthermore, in the present embodiment, for example, the decompression based on the vacuum chamber can be omitted. However, for example, when air or a gap is not allowed between the plate member and the resin, it is preferable to perform pressure reduction based on the vacuum chamber. Further, when the decompression by the vacuum chamber is omitted, the pressing by the upper mold (mounter) may or may not be performed.

又,圖20之剖視圖模式性表示本實施例之製造方法之變化例。圖20之製造方法,除了將於基板21之晶片31及配線圖案22之固定面上印刷液態樹脂(熱固性樹脂)41a之印刷方式替換為塗佈方式及板狀構件11於與突起電極12之固定面成相反側之表面(於圖20中,面向上模122一側之表面)具有散熱片11a以外,與圖19之製造方法相同。又,於圖19之製造方法中,可與圖20相同地,使用具有散熱片之帶有突起電極之板狀構件;反之於圖20之製造方法中,與圖19相同地,使用不具有散熱片之帶有突起電極之板狀構件亦可。又,例如於圖19或圖20中,藉由薄板樹脂之層壓、樹脂之旋塗等方式,將樹脂41或41a配置於基板21之晶片31及配線圖案22之固定面上來代替樹脂之印刷或塗佈方式亦可。 Moreover, the cross-sectional view of Fig. 20 schematically shows a modification of the manufacturing method of the present embodiment. In the manufacturing method of FIG. 20, the printing method of printing the liquid resin (thermosetting resin) 41a on the fixed surface of the wafer 31 and the wiring pattern 22 of the substrate 21 is replaced with the coating method and the fixing of the plate-like member 11 to the protruding electrode 12. The surface on the opposite side (the surface facing the upper mold 122 in Fig. 20) has the fins 11a, and is the same as the manufacturing method of Fig. 19. Further, in the manufacturing method of Fig. 19, a plate-like member having a bump electrode having a heat sink can be used as in Fig. 20; otherwise, in the manufacturing method of Fig. 20, the heat dissipation is not the same as that of Fig. 19. A plate-like member having a protruding electrode for the sheet may also be used. Further, for example, in FIG. 19 or FIG. 20, the resin 41 or 41a is placed on the fixed surface of the wafer 31 and the wiring pattern 22 of the substrate 21 by lamination of a thin resin or a spin coating of a resin, instead of printing of a resin. Or coating method is also available.

[實施例5] [Example 5]

接著,對本發明又一實施例進行說明。於本實施例中,表示了使用壓縮成形之製造方法之又一例。 Next, another embodiment of the present invention will be described. In the present embodiment, still another example of a manufacturing method using compression molding is shown.

於本實施例中,對使用具有貫通孔(樹脂供給部)之矩形形狀之框(框體)及經預先切斷之離型膜之電子零件製造方法及壓縮成形裝置(電子零件之樹脂密封裝置)進行說明。於本實施例中,於樹脂材料(顆粒樹脂)載置於具有變形部之上述帶有突起電極之板狀構件上之狀態下,將該樹脂材料(顆粒樹脂)搬送至下模腔之位置,並且供給並安裝於下模腔內。 In the present embodiment, a frame (frame) having a rectangular shape having a through hole (resin supply portion) and an electronic component manufacturing method and a compression molding device (resin sealing device for an electronic component) using a pre-cut release film are used. )Be explained. In the present embodiment, the resin material (particle resin) is transferred to the lower mold cavity in a state where the resin material (particle resin) is placed on the plate-like member having the protruding electrode having the deformation portion. And supplied and installed in the lower mold cavity.

於本實施例中,將框體配置於經預先切斷之離型膜上,並將載置有顆粒樹脂之帶有突起電極之板狀構件配置於框體貫通孔(樹脂供給部)內之離型膜上。藉此,能夠防止上述顆粒樹脂從上述帶有突起電極之板狀構件上掉落。再者,於本實施例中,對樹脂材料為顆粒樹脂之情況進行說明,但顆粒樹脂以外之任意樹脂(例如,粉末狀樹脂、液態樹脂、板狀樹脂、片狀樹脂、膜狀樹脂、膏狀樹脂等),亦能夠以相同方式進行。 In the present embodiment, the frame body is placed on the release film which has been cut in advance, and the plate-like member having the protruding electrode on which the granular resin is placed is placed in the frame through hole (resin supply portion). On the release film. Thereby, it is possible to prevent the above-mentioned particulate resin from falling from the above-mentioned plate-like member with the protruding electrodes. In the present embodiment, the case where the resin material is a particulate resin will be described, but any resin other than the particulate resin (for example, a powdery resin, a liquid resin, a plate resin, a sheet resin, a film resin, a paste) The resin or the like can also be carried out in the same manner.

以下,使用圖21~24,對本實施例進行更具體之說明。 Hereinafter, the present embodiment will be described more specifically with reference to Figs. 21 to 24.

首先,使用圖21,對本實施例之壓縮成形裝置(電子零件之製造裝置)進行說明。圖21係表示作為上述壓縮成形裝置一部分之成形模(例如金屬模具或陶瓷模具)之一部分之構造之概略圖。又,圖21表示向該成形模供給樹脂材料之前之開模狀態。 First, a compression molding apparatus (manufacturing apparatus for electronic components) of the present embodiment will be described with reference to Fig. 21 . Fig. 21 is a schematic view showing the structure of a part of a molding die (e.g., a metal mold or a ceramic mold) which is a part of the above-described compression molding apparatus. Moreover, Fig. 21 shows a mold opening state before the supply of the resin material to the molding die.

圖21之壓縮成形裝置與實施例3(圖13~16)相比,於成形模包括上模及下模這一方面與其相同,但於包括上模外氣隔斷構件及下模外氣隔斷構件這一方面與其不同。更具體而言,如下所述。即,如圖21所示,壓縮成形裝置以上模2001及面向上模配置之下模2011作為主要構成要素。上模2001於上模底板2002處以垂下之狀態設置。於上模底板2002上之上模2001之外周位置,設置有上模外氣隔斷構件2004。於 上模外氣隔斷構件2004之上端面(被上模底板2002及上模外氣隔斷構件2004夾住之部分),設置有用於隔斷外氣之O型環2004a。又,於上模外氣隔斷構件2004之下端面,亦設置有用於隔斷外氣之O型環2004b。又,於上模底板2002,設置有用於強制性地吸引模內空間部之空氣並將其排出之孔2003。於上模2001之模面(下表面)設置有基板設置部2001a,其中,於上述基板設置部2001a處,將安裝有晶片31之基板21以晶片31安裝面側朝向下方之方式進行供給並設置(安裝)。基板21例如能夠藉由夾具(未圖示)等安裝於基板設置部2001a。再者,與上述各實施例相同,於基板21之晶片31安裝面上設置有配線圖案22。 The compression molding apparatus of Fig. 21 is the same as that of the third embodiment (Figs. 13 to 16) in that the forming mold includes the upper mold and the lower mold, but includes the upper mold outer air partition member and the lower mold outer air partition member. This aspect is different. More specifically, it is as follows. That is, as shown in Fig. 21, the compression molding apparatus upper mold 2001 and the upper mold arrangement lower mold 2011 are main constituent elements. The upper mold 2001 is disposed in a state of being lowered at the upper mold base plate 2002. An outer mold outer air partition member 2004 is disposed at an outer peripheral position of the upper mold 2001 on the upper mold bottom plate 2002. to The upper end surface of the upper outer mold air partition member 2004 (the portion sandwiched by the upper mold base plate 2002 and the upper mold outer air partition member 2004) is provided with an O-ring 2004a for blocking the outside air. Further, an O-ring 2004b for blocking the outside air is also provided on the lower end surface of the upper die outer air partition member 2004. Further, in the upper mold base plate 2002, a hole 2003 for forcibly sucking the air in the in-mold space portion and discharging it is provided. The substrate mounting portion 2001a is provided on the die surface (lower surface) of the upper mold 2001, and the substrate 21 on which the wafer 31 is mounted is supplied and disposed such that the wafer 31 mounting surface side faces downward in the substrate mounting portion 2001a. (installation). The substrate 21 can be attached to the substrate installation portion 2001a by, for example, a jig (not shown). Further, similarly to the above-described respective embodiments, the wiring pattern 22 is provided on the mounting surface of the wafer 31 of the substrate 21.

又,下模2011由下模腔底面構件2011a、下模外周構件2012及彈性構件2012a而形成。進而,就下模2011而言,於其模面包括作為用於樹脂成形之空間之模腔(下模腔)2011b。下模腔底面構件2011a設置於下模腔2011b之下方。下模外周構件(下模之框體、模腔側面構件)2012以包圍下模腔底面構件2011a周圍之方式配置。下模外周構件2012上表面之高度高於下模腔底面構件2011a上表面之高度。藉此,形成了由下模腔底面構件2011a上表面及下模外周構件2012內周面所包圍之下模腔(凹部)2011b。於下模腔底面構件2011與下模外周構件2012之間,形成有空隙(吸附孔)2011c。如下所述,使用真空泵(未圖示)對該空隙2011c進行減壓,從而可吸附離型膜等。又,下模2011及下模外周構件2012以載置於下模底板2010之狀態設置。於下模外周構件2012與下模底板2010之間設置有用於緩衝之彈性構件2012a。進而,於下模底板2010上之下模外周構件2012之外周位置設置有下模外氣隔斷構件2013。於下模外氣隔斷構件2013之下端面(被下模底板2010及下模外氣隔斷構件2013夾住之部分),設置有用於隔斷外氣之O型環2013a。下模外氣隔斷構件2013配置於上模外氣隔斷構件2004及 用於隔斷外氣之O型環2004b之正下方。藉由具備以上構成,於上模及下模這兩個模進行合模時,藉由接合包括O型環2004a及2004b之上模外氣隔斷構件2004與包括O型環2013a之下模外氣隔斷構件2013,至少能夠使下模腔內處於外氣隔斷狀態。 Further, the lower mold 2011 is formed by the lower cavity bottom surface member 2011a, the lower mold outer circumferential member 2012, and the elastic member 2012a. Further, as for the lower mold 2011, a cavity (lower cavity) 2011b as a space for resin molding is included on the die face. The lower cavity bottom surface member 2011a is disposed below the lower cavity 2011b. The lower mold outer peripheral member (the lower mold frame, the cavity side member) 2012 is disposed to surround the lower cavity bottom surface member 2011a. The height of the upper surface of the lower mold outer peripheral member 2012 is higher than the height of the upper surface of the lower mold cavity bottom surface member 2011a. Thereby, the cavity (concave portion) 2011b surrounded by the upper surface of the lower cavity bottom surface member 2011a and the inner circumferential surface of the lower die outer peripheral member 2012 is formed. A gap (adsorption hole) 2011c is formed between the lower cavity bottom surface member 2011 and the lower die outer peripheral member 2012. The void 2011c is decompressed using a vacuum pump (not shown) as described below, so that a release film or the like can be adsorbed. Further, the lower mold 2011 and the lower mold outer peripheral member 2012 are provided in a state of being placed on the lower mold base plate 2010. An elastic member 2012a for cushioning is provided between the lower mold outer peripheral member 2012 and the lower mold bottom plate 2010. Further, a lower-mold outer air blocking member 2013 is provided at an outer peripheral position of the lower mold outer peripheral member 2012 on the lower mold base plate 2010. The O-ring 2013a for blocking the outside air is provided on the lower end surface of the lower mold outer air partition member 2013 (the portion sandwiched by the lower mold base plate 2010 and the lower mold outer air partition member 2013). The lower die outer air partition member 2013 is disposed on the upper die outer air partition member 2004 and It is directly under the O-ring 2004b for blocking the outside air. By having the above configuration, when the two molds of the upper mold and the lower mold are clamped, the outer mold air partition member 2004 including the O-rings 2004a and 2004b and the outer mold gas including the O-ring 2013a are joined. The partition member 2013 can at least bring the inside of the lower cavity into an external air-off state.

接著,對使用了該壓縮成形裝置之本實施例之電子零件之製造方法進行說明。即,首先,如圖21所示,以如上所述方式將基板21安裝於上模2001之模面(基板設置部2001a)。進而,如圖所示,使用具有貫通孔之矩形形狀之框(框體)70,將顆粒樹脂41供給至下模腔2011b內。更具體而言,如圖所示,將框體70載置於已預先切斷成所需長度(預先切斷)之離型膜100上。此時,於框體70之下表面,吸附並固定經預先切斷之離型膜100亦可。接著,從框體70貫通孔上側之開口部(樹脂供給部),將板狀構件11之單面固定有突起電極12之帶有突起電極之板狀構件載置於離型膜100上。此時,使突起電極12處於朝向上方(離型膜100之相反側)之狀態。再者,於本實施例中,與實施例2(圖7~10)相同,帶有突起電極之板狀構件不具有壁狀構件11b及樹脂容納部(凹部)11c。進而,將顆粒樹脂41a以平坦化之狀態供給(載置)於板狀構件11之突起電極12之固定面上。藉此,如圖21所示,將顆粒樹脂41a供給至由板狀構件11及框體70包圍之空間內,從而能夠形成將其等載置於離型膜100上之「樹脂供給框體」。進而,如圖21所示,搬送上述樹脂供給框體,使其進入至處於開模狀態之上模2001與下模2011之間(下模腔2011b之位置)。 Next, a method of manufacturing the electronic component of the present embodiment using the compression molding apparatus will be described. That is, first, as shown in FIG. 21, the substrate 21 is attached to the mold surface of the upper mold 2001 (substrate setting portion 2001a) as described above. Further, as shown in the drawing, the frame resin 70 having a rectangular shape having a through hole is used to supply the pellet resin 41 into the lower cavity 2011b. More specifically, as shown in the drawing, the frame 70 is placed on the release film 100 which has been previously cut into a desired length (precut). At this time, the release film 100 which has been cut beforehand may be adsorbed and fixed on the lower surface of the casing 70. Then, the frame member 70 is inserted through the opening (resin supply portion) on the upper side of the hole, and the plate-like member having the protruding electrode to which the protruding electrode 12 is fixed on one surface of the plate member 11 is placed on the release film 100. At this time, the bump electrode 12 is placed in a state of being directed upward (opposite side of the release film 100). Further, in the present embodiment, as in the second embodiment (Figs. 7 to 10), the plate-like member having the protruding electrodes does not have the wall member 11b and the resin accommodating portion (concave portion) 11c. Further, the pellet resin 41a is supplied (mounted) on the fixing surface of the bump electrode 12 of the plate-like member 11 in a flat state. As a result, as shown in FIG. 21, the granular resin 41a is supplied into the space surrounded by the plate-shaped member 11 and the frame 70, and the "resin supply frame" placed on the release film 100 can be formed. . Further, as shown in FIG. 21, the resin supply frame is conveyed to enter between the upper mold 2001 and the lower mold 2011 in the mold opening state (the position of the lower mold cavity 2011b).

接著,將上述樹脂供給框體載置於下模2011之模面上。此時,如圖22所示,用框體70與下模外周構件2012夾住離型膜100,並且使框體70貫通孔下側之開口部與下模腔2011b之開口部(下模面)對齊。進而,如圖22之箭頭2014所示,使用真空泵吸附下模之吸附孔2011c,並對其進行減壓。藉此,如圖所示,於下模腔2011b之模腔面上吸附 並被覆離型膜100,將顆粒樹脂41供給並設置於下模腔2011b內。進而,如圖所示,藉由加熱下模2011,使顆粒樹脂41a熔融並成為流動性樹脂41b之狀態。之後,於藉由減壓2014使離型膜100吸附於下模腔2011b之模腔面之狀態下,去除框體70。 Next, the resin supply frame is placed on the mold surface of the lower mold 2011. At this time, as shown in FIG. 22, the release film 100 is sandwiched between the frame body 70 and the lower mold outer peripheral member 2012, and the frame 70 is inserted through the opening portion on the lower side of the hole and the opening portion of the lower mold cavity 2011b (the lower mold surface). ) Align. Further, as shown by an arrow 2014 in Fig. 22, the adsorption hole 2011c of the lower mold is sucked by a vacuum pump, and the pressure is reduced. Thereby, as shown in the figure, the adsorption on the cavity surface of the lower mold cavity 2011b The release film 100 is covered, and the particulate resin 41 is supplied and disposed in the lower mold cavity 2011b. Further, as shown in the figure, by heating the lower mold 2011, the particulate resin 41a is melted and becomes the state of the fluid resin 41b. Thereafter, the casing 70 is removed by adsorbing the release film 100 to the cavity surface of the lower cavity 2011b by the pressure reduction 2014.

接著,對上模及下模這兩個模進行合模。首先,如圖23所示,進行使基板面(基板21之晶片31之固定面)及下模面保持所需間隔之狀態之中間合模。即,首先,於從圖22之構造去除了框體70之狀態下,使下模2011側上移。藉此,如圖23所示,將上模外氣隔斷構件2004及下模外氣隔斷構件2013於夾住O型環2004b之狀態下閉合。藉此,如圖23所示,形成由上模2001、下模2011、上模外氣隔斷構件2004及下模外氣隔斷構件2013所包圍以外氣隔斷空間部。於該狀態下,如圖23之箭頭2007所示,使用真空泵(未圖示),經由上模底板2002之孔2003,至少吸引上述外氣隔斷空間部,並對其進行減壓,從而將其設定為特定之真空度。 Next, the two molds of the upper mold and the lower mold are clamped. First, as shown in FIG. 23, an intermediate mold clamping is performed in a state in which the substrate surface (the fixed surface of the wafer 31 of the substrate 21) and the lower mold surface are maintained at a desired interval. That is, first, in a state where the frame 70 is removed from the structure of Fig. 22, the lower mold 2011 side is moved up. Thereby, as shown in FIG. 23, the upper-mold outer air blocking member 2004 and the lower-mold outer air blocking member 2013 are closed in a state in which the O-ring 2004b is sandwiched. Thereby, as shown in FIG. 23, the air-interrupting space portion surrounded by the upper mold 2001, the lower mold 2011, the upper-mold outer air blocking member 2004, and the lower-mold outer air blocking member 2013 is formed. In this state, as shown by an arrow 2007 in FIG. 23, a vacuum pump (not shown) is used to suck at least the outer air partition space portion through the hole 2003 of the upper mold base plate 2002, and to reduce the pressure. Set to a specific vacuum.

進而,如圖24所示,接合基板面與下模面而進行完全合模。即,從圖23之狀態,使下模2011進一步上移。藉此,如圖24所示,下模外周構件2012之上表面經由(隔著)離型膜100抵接於供給並設置於上模2001處之基板21之基板面(晶片31之固定面)。之後,使下模底板2010進一步上移,藉此使下模腔底面構件2011a進一步上移。此時,如上所述,使樹脂處於流動性樹脂41b之狀態。藉此,如圖24所示,使突起電極12之前端與基板21之配線圖案22抵接(接觸),並且使晶片31於下模腔2011b內,浸漬於流動性樹脂41b中,進而,對流動性樹脂41b進行加壓。此時,藉由下模腔底面構件2011a之推壓力,突起電極12整體相對地於與板狀構件11之面方向垂直之方向上受到推壓。藉由該推壓,如圖所示,於設計成高於流動性樹脂41b厚度之突起電極12中,變形部12A發生彎曲。藉此,突起電極12於與板狀構件11之面方 向垂直之方向上收縮,從而與樹脂密封零件之特定之厚度相吻合。再者,此時,如圖所示,彈性構件2012a、及O型環2004a、2004b、2013a發生收縮,從而發揮緩衝之功能。藉此,如上所述,對流動性樹脂41b進行加壓而壓縮成形。之後,使流動性樹脂41b固化並形成密封樹脂。藉此,於板狀構件11上之突起電極12之固定面與基板21之配線圖案22之形成面之間,藉由上述密封樹脂對晶片31進行密封,並且能夠使突起電極12與配線圖案22接觸(樹脂密封步驟)。於經過流動性樹脂41b之固化所需要之時間後,以與實施例2或3(圖10或16)相同之步驟對上模及下模這兩個模進行開模。藉此,於下模腔2011b內,能夠製得包括基板21、晶片31、配線圖案22、樹脂(密封樹脂)41、突起電極12及板狀構件11之成形品(電子零件)。 Further, as shown in FIG. 24, the substrate surface and the lower mold surface are joined to perform complete mold clamping. That is, from the state of Fig. 23, the lower mold 2011 is further moved up. As a result, as shown in FIG. 24, the upper surface of the lower mold outer peripheral member 2012 is in contact with the substrate surface (the fixed surface of the wafer 31) of the substrate 21 supplied and provided at the upper mold 2001 via the release film 100. . Thereafter, the lower mold base plate 2010 is further moved upward, whereby the lower cavity bottom surface member 2011a is further moved upward. At this time, as described above, the resin is placed in a state of the fluid resin 41b. As a result, as shown in FIG. 24, the front end of the bump electrode 12 is brought into contact (contact) with the wiring pattern 22 of the substrate 21, and the wafer 31 is immersed in the fluid mold resin 41b in the lower mold cavity 2011b, and further, The fluid resin 41b is pressurized. At this time, the entire projection electrode 12 is pressed in the direction perpendicular to the surface direction of the plate-like member 11 by the pressing force of the lower cavity bottom surface member 2011a. By this pressing, as shown in the figure, in the projection electrode 12 designed to be higher than the thickness of the fluid resin 41b, the deformation portion 12A is bent. Thereby, the protruding electrode 12 is on the side of the plate member 11 Shrinks in the vertical direction to match the specific thickness of the resin sealing part. At this time, as shown in the figure, the elastic member 2012a and the O-rings 2004a, 2004b, and 2013a are contracted to function as a buffer. Thereby, as described above, the fluid resin 41b is pressurized and compression-molded. Thereafter, the fluid resin 41b is cured to form a sealing resin. Thereby, between the fixing surface of the bump electrode 12 on the plate member 11 and the surface on which the wiring pattern 22 of the substrate 21 is formed, the wafer 31 is sealed by the sealing resin, and the bump electrode 12 and the wiring pattern 22 can be made. Contact (resin sealing step). After the time required for the curing of the fluid resin 41b, the two molds of the upper mold and the lower mold were opened in the same manner as in Example 2 or 3 (Fig. 10 or 16). Thereby, in the lower cavity 2011b, a molded article (electronic component) including the substrate 21, the wafer 31, the wiring pattern 22, the resin (sealing resin) 41, the bump electrode 12, and the plate member 11 can be obtained.

再者,於本實施例中,壓縮成形裝置(電子零件之製造裝置)之構造不限於圖21~24之構造,例如,可與一般之壓縮成形裝置之構造相同或以其為基準。具體而言,例如,可與日本專利特開2013-187340號公報、日本專利特開2005-225133號公報、日本專利特開2010-069656號公報、日本專利特開2007-125783號公報、及日本專利特開2010-036542號公報等公開之構造相同或以其為基準。 Further, in the present embodiment, the configuration of the compression molding apparatus (manufacturing apparatus for electronic parts) is not limited to the configuration of Figs. 21 to 24, and may be, for example, the same as or based on the configuration of a general compression molding apparatus. Specifically, for example, Japanese Patent Laid-Open Publication No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. The structure disclosed in Japanese Laid-Open Patent Publication No. 2010-036542 or the like is the same or based on it.

本發明不限於上述之實施例,於不脫離本發明主旨之範圍內,根據需要,能夠任意且適當地進行組合、變更、或選擇採用。 The present invention is not limited to the above-described embodiments, and may be combined, changed, or selected as desired, without departing from the spirit and scope of the invention.

例如,帶有突起電極之板狀構件之上述突起電極之形狀不限於圖2~4所示之形狀,可為任意形狀。作為一例,如上所述,於上述突起電極中,至少一部分可以呈板狀形狀。而且,於基板面上,可使用上述板狀之電極來劃分與1個電子零件(1個製品單位)對應之所需之範圍。 For example, the shape of the above-mentioned protruding electrode of the plate-like member having the protruding electrode is not limited to the shape shown in Figs. 2 to 4, and may be any shape. As an example, as described above, at least a part of the protruding electrodes may have a plate shape. Further, on the substrate surface, the plate-shaped electrode can be used to divide the required range corresponding to one electronic component (one product unit).

10‧‧‧帶有突起電極之板狀構件 10‧‧‧Plate-like members with protruding electrodes

11‧‧‧板狀構件 11‧‧‧ Plate-like members

12‧‧‧突起電極 12‧‧‧ protruding electrode

12A‧‧‧變形部 12A‧‧‧Deformation Department

21‧‧‧基板 21‧‧‧Substrate

22‧‧‧配線圖案 22‧‧‧Wiring pattern

31‧‧‧晶片(樹脂密封前之電子零件) 31‧‧‧ wafer (electronic parts before resin sealing)

41‧‧‧樹脂(密封樹脂) 41‧‧‧Resin (sealing resin)

50‧‧‧成形模 50‧‧‧ Forming die

51‧‧‧上模 51‧‧‧上模

52‧‧‧下模 52‧‧‧Down

53‧‧‧柱塞 53‧‧‧Plunger

54‧‧‧加料腔(孔) 54‧‧‧feeding cavity (hole)

55‧‧‧樹脂通道 55‧‧‧Resin channel

56‧‧‧模腔 56‧‧‧ cavity

57‧‧‧基板設置部 57‧‧‧Substrate setting department

Claims (40)

一種製造方法,其特徵在於,其為將晶片予以樹脂密封之電子零件之製造方法,所要製造之上述電子零件係包括基板、晶片、樹脂、板狀構件與突起電極,並且於上述基板上形成有配線圖案之電子零件;上述製造方法具有利用上述樹脂對上述晶片進行密封之樹脂密封步驟;於上述樹脂密封步驟中,帶有突起電極之板狀構件之上述突起電極之固定面與上述基板之上述配線圖案之形成面之間,利用上述樹脂對上述晶片進行密封,並且使上述突起電極與上述配線圖案接觸,其中,於上述帶有突起電極之板狀構件中,於上述板狀構件之單面固定有上述突起電極,並且上述突起電極包括可變形之變形部。 A manufacturing method for manufacturing an electronic component in which a wafer is resin-sealed, wherein the electronic component to be manufactured includes a substrate, a wafer, a resin, a plate member, and a bump electrode, and is formed on the substrate An electronic component of a wiring pattern; wherein the manufacturing method has a resin sealing step of sealing the wafer with the resin; and in the resin sealing step, the fixing surface of the protruding electrode of the plate-shaped member having the protruding electrode and the substrate are Between the formation faces of the wiring patterns, the wafer is sealed by the resin, and the protruding electrodes are brought into contact with the wiring pattern, wherein the plate-shaped member having the protruding electrodes is on one side of the plate-shaped member The above-mentioned protruding electrode is fixed, and the protruding electrode includes a deformable deformation portion. 如請求項1之製造方法,其中上述突起電極之至少一個為閃電形突起電極;從與上述板狀構件之面方向平行之方向觀察上述閃電形突起電極時,至少上述變形部彎曲成閃電形,從而上述變形部可於與上述板狀構件之面方向垂直之方向上收縮。 The manufacturing method of claim 1, wherein at least one of the protruding electrodes is a lightning-shaped protruding electrode; and when the lightning-shaped protruding electrode is viewed from a direction parallel to a surface direction of the plate-shaped member, at least the deformed portion is curved into a lightning bolt shape. Therefore, the deformed portion can be contracted in a direction perpendicular to the surface direction of the plate-like member. 如請求項1或2之製造方法,其中上述突起電極之至少一個為帶貫通孔之突起電極;上述帶貫通孔之突起電極之上述貫通孔為於與上述板狀構件之面方向平行之方向上貫通之貫通孔,上述貫通孔之周圍係可變形之上述變形部,並且,於上述帶貫通孔之突起電極中,於與固定於上述板狀構件之 一端成相反側之一端,具有於與上述板狀構件之板面垂直之方向上突出之突起。 The manufacturing method of claim 1 or 2, wherein at least one of the protruding electrodes is a protruding electrode with a through hole; and the through hole of the protruding electrode with the through hole is in a direction parallel to a plane direction of the plate member a through hole penetrating therethrough, wherein the periphery of the through hole is a deformable deformation portion, and is fixed to the plate member in the protruding electrode with the through hole One end is formed at one end of the opposite side, and has a protrusion that protrudes in a direction perpendicular to the plate surface of the above-mentioned plate-like member. 如請求項1或2之製造方法,其中上述突起電極之至少一個為具有柱狀形狀之柱狀突起電極。 The manufacturing method of claim 1 or 2, wherein at least one of the protruding electrodes is a columnar protruding electrode having a columnar shape. 如請求項1或2之製造方法,其中上述突起電極之至少一個為板狀突起電極;上述晶片為複數個;於上述樹脂密封步驟中,藉由上述板狀突起電極將上述基板劃分為複數個區域,並且於各個上述區域內,對上述晶片進行樹脂密封。 The manufacturing method of claim 1 or 2, wherein at least one of the protruding electrodes is a plate-like protruding electrode; the plurality of the wafers are plural; and in the resin sealing step, the substrate is divided into a plurality of the plurality of the plate-shaped protruding electrodes The wafer is resin-sealed in the region and in each of the above regions. 如請求項5之製造方法,其中上述板狀突起電極具有貫通孔及突起;上述貫通孔於與上述板狀構件之板面平行之方向上貫通上述板狀突起電極,上述貫通孔之周圍係可變形之上述變形部;於上述板狀突起電極之與其固定於上述板狀構件之一端成相反側之一端,上述突起於與上述板狀構件之板面垂直之方向上突出。 The manufacturing method of claim 5, wherein the plate-like projection electrode has a through hole and a protrusion, and the through hole penetrates the plate-shaped projection electrode in a direction parallel to a plate surface of the plate-shaped member, and the periphery of the through hole is The deformed portion is deformed at one end of the plate-like projecting electrode that is fixed to one end of the plate-like member, and the protrusion protrudes in a direction perpendicular to a plate surface of the plate-shaped member. 如請求項1或2之製造方法,其中上述板狀構件為散熱板或屏蔽板。 The manufacturing method of claim 1 or 2, wherein the plate-like member is a heat dissipation plate or a shield plate. 如請求項1或2之製造方法,其中於上述樹脂密封步驟中,藉由轉移成形對上述晶片進行樹脂密封。 The manufacturing method of claim 1 or 2, wherein in the resin sealing step, the wafer is resin-sealed by transfer molding. 如請求項1或2之製造方法,其中於上述樹脂密封步驟中,藉由壓縮成形對上述晶片進行樹脂密封。 The manufacturing method of claim 1 or 2, wherein in the resin sealing step, the wafer is resin-sealed by compression molding. 如請求項9之製造方法,其進而包括:樹脂載置步驟,將上述樹脂載置於上述帶有突起電極之板狀構件之上述突起電極之固定面上;及 搬送步驟,將上述帶有突起電極之板狀構件搬送至成形模之模腔位置;於上述模腔內,上述晶片浸漬於載置於上述板狀構件上之上述樹脂中之狀態下,將上述樹脂與上述帶有突起電極之板狀構件及上述晶片一同壓縮成形,藉此進行上述樹脂密封步驟。 The manufacturing method of claim 9, further comprising: a resin mounting step of placing the resin on a fixing surface of the protruding electrode of the plate-like member having the protruding electrode; a transporting step of transporting the plate-like member having the protruding electrode to a cavity position of the molding die; and in the cavity, the wafer is immersed in the resin placed on the plate-shaped member, and the The resin is subjected to the above-described resin sealing step by compression molding together with the above-described plate-like member having the protruding electrodes and the above-mentioned wafer. 如請求項10之製造方法,其中於上述搬送步驟中,將上述樹脂載置於上述帶有突起電極之板狀構件上之狀態下,將其與上述帶有突起電極之板狀構件一同搬送至上述成形模之模腔位置。 The manufacturing method of claim 10, wherein in the transferring step, the resin is placed on the plate-like member having the protruding electrode, and is transported together with the plate-shaped member having the protruding electrode to The cavity position of the above forming die. 如請求項10之製造方法,其中於上述搬送步驟中,將上述帶有突起電極之板狀構件於未載置樹脂之狀態下,搬送至上述成形模之模腔位置;上述製造方法進而包括,於進行上述樹脂載置步驟之前,於上述模腔內對上述帶有突起電極之板狀構件進行加熱之加熱步驟;於上述帶有突起電極之板狀構件被加熱之狀態下,於上述模腔內進行上述樹脂載置步驟。 The manufacturing method of claim 10, wherein the plate-shaped member having the protruding electrode is conveyed to a cavity position of the molding die without being placed on the resin in the conveying step; the manufacturing method further includes a heating step of heating the plate-like member having the protruding electrode in the cavity before performing the resin mounting step; and in the cavity in a state in which the plate-shaped member with the protruding electrode is heated The resin mounting step described above is carried out. 如請求項10之製造方法,其中於上述搬送步驟中,於上述帶有突起電極之板狀構件以固定有上述突起電極之表面朝上之方式載置於離型膜上之狀態下,將上述帶有突起電極之板狀構件向上述成形模之模腔內搬送。 The manufacturing method of claim 10, wherein in the transporting step, the plate-shaped member having the protruding electrode is placed on the release film with the surface on which the protruding electrode is fixed upward, A plate-like member having a protruding electrode is conveyed into the cavity of the above-mentioned forming die. 如請求項13之製造方法,其中於上述搬送步驟中,於框體與上述帶有突起電極之板狀構件一同載置於上述離型膜上,並且上述帶有突起電極之板狀構件被上述框體包圍之狀態下,將上述帶有突起電極之板狀構件向上述成形模之模腔內搬送。 The manufacturing method of claim 13, wherein in the carrying step, the frame body is placed on the release film together with the plate-like member having the protruding electrode, and the plate-like member having the protruding electrode is The plate-like member having the protruding electrode is conveyed into the cavity of the forming die in a state in which the frame is surrounded. 如請求項14之製造方法,其中於上述樹脂載置步驟中, 於上述框體與上述帶有突起電極之板狀構件一同載置於上述離型膜上,並且上述帶有突起電極之板狀構件被上述框體包圍之狀態下,向由上述帶有突起電極之板狀構件及上述框體包圍之空間內供給上述樹脂,藉此將上述樹脂載置於上述突起電極之固定面上。 The manufacturing method of claim 14, wherein in the resin mounting step, The frame body is placed on the release film together with the plate-like member having the protruding electrode, and the plate-shaped member having the protruding electrode is surrounded by the frame body, and the projection electrode is provided The resin is supplied into the space surrounded by the plate member and the frame, whereby the resin is placed on the fixing surface of the protruding electrode. 如請求項15之製造方法,其中於上述搬送步驟之前進行上述樹脂載置步驟。 The manufacturing method of claim 15, wherein the resin mounting step is performed before the transferring step. 如請求項13之製造方法,其中上述帶有突起電極之板狀構件之與固定有上述突起電極之表面成相反側之表面藉由黏著劑固定於上述離型膜上。 The method of claim 13, wherein the surface of the plate-like member having the protruding electrode and the surface opposite to the surface on which the protruding electrode is fixed is fixed to the release film by an adhesive. 如請求項10之製造方法,其中上述板狀構件具有樹脂容納部;於上述樹脂載置步驟中,於上述樹脂容納部內載置上述樹脂;於上述樹脂容納部內載置有上述樹脂之狀態下,進行上述樹脂密封步驟。 The manufacturing method of claim 10, wherein the plate-shaped member has a resin accommodating portion; in the resin mounting step, the resin is placed in the resin accommodating portion; and the resin is placed in the resin accommodating portion. The above resin sealing step is carried out. 如請求項9之製造方法,其中於上述樹脂密封步驟中,以上述配線圖案之形成面朝上之方式將於上述配線圖案之形成面上配置有上述晶片之上述基板載置於基板載置台上,進而,於上述樹脂載置於上述配線圖案之形成面上之狀態下,對上述樹脂進行推壓。 The manufacturing method of claim 9, wherein in the resin sealing step, the substrate on which the wafer is disposed on the surface on which the wiring pattern is formed is placed on the substrate stage in such a manner that the formation surface of the wiring pattern faces upward Further, the resin is pressed while the resin is placed on the surface on which the wiring pattern is formed. 如請求項1或2之製造方法,其中上述板狀構件為散熱板;上述散熱板於與上述突起電極之固定面成相反側之表面具有散熱片。 The manufacturing method of claim 1 or 2, wherein the plate-like member is a heat dissipation plate; and the heat dissipation plate has a heat sink on a surface opposite to a fixing surface of the protruding electrode. 如請求項1或2之製造方法,其中上述樹脂為熱塑性樹脂或熱固性樹脂。 The manufacturing method of claim 1 or 2, wherein the above resin is a thermoplastic resin or a thermosetting resin. 如請求項1或2之製造方法,其中上述樹脂為選自由顆粒狀樹脂、 粉末狀樹脂、液態樹脂、板狀樹脂、片狀樹脂、膜狀樹脂及膏狀樹脂組成之群中之至少一種。 The manufacturing method of claim 1 or 2, wherein the resin is selected from the group consisting of a granular resin, At least one of a group consisting of a powdery resin, a liquid resin, a plate resin, a sheet resin, a film resin, and a paste resin. 如請求項1或2之製造方法,其中上述樹脂為選自由透明樹脂、半透明樹脂及不透明樹脂組成之群中之至少一種。 The manufacturing method of claim 1 or 2, wherein the resin is at least one selected from the group consisting of a transparent resin, a translucent resin, and an opaque resin. 一種帶有突起電極之板狀構件,其特徵在於,上述帶有突起電極之板狀構件為於如請求項1至23中任一項之製造方法中所使用之帶有突起電極之板狀構件;上述突起電極固定於上述板狀構件之單面。 A plate-like member having a protruding electrode, wherein the plate-like member having the protruding electrode is a plate-like member having a protruding electrode used in the manufacturing method according to any one of claims 1 to 23 The protrusion electrode is fixed to one surface of the plate member. 如請求項24之帶有突起電極之板狀構件,其中上述突起電極之至少一個為如請求項2之上述閃電形突起電極。 A plate-like member having a projecting electrode according to claim 24, wherein at least one of said protruding electrodes is said lightning-shaped protruding electrode as claimed in claim 2. 如請求項24或25之帶有突起電極之板狀構件,其中上述突起電極之至少一個為如請求項5之上述板狀突起電極。 A plate-like member having a projecting electrode according to claim 24 or 25, wherein at least one of said protruding electrodes is said plate-like projecting electrode as claimed in claim 5. 如請求項26之帶有突起電極之板狀構件,其中上述板狀突起電極為如請求項6之具有上述貫通孔及上述突起之板狀突起電極。 A plate-like member having a projecting electrode according to claim 26, wherein the plate-like projecting electrode is a plate-like projecting electrode having the through hole and the protrusion as claimed in claim 6. 如請求項24或25之帶有突起電極之板狀構件,其中上述突起電極之至少一個為如請求項3之上述帶貫通孔之突起電極。 A plate-like member having a projecting electrode according to claim 24 or 25, wherein at least one of said protruding electrodes is the above-mentioned protruding electrode with a through hole as claimed in claim 3. 如請求項24或25之帶有突起電極之板狀構件,其中上述突起電極之至少一個為如請求項4之柱狀突起電極。 A plate-like member having a projecting electrode according to claim 24 or 25, wherein at least one of said protruding electrodes is a columnar projecting electrode as claimed in claim 4. 如請求項24或25之帶有突起電極之板狀構件,其中上述板狀構件具有樹脂容納部。 A plate-like member having a projecting electrode according to claim 24 or 25, wherein said plate-like member has a resin containing portion. 如請求項30之帶有突起電極之板狀構件,其中上述板狀構件之周緣部向上述板狀構件之上述突起電極之固定面側隆起,從而上述板狀構件之中央部形成上述樹脂容納部。 The plate-like member having the projecting electrode of claim 30, wherein a peripheral edge portion of the plate-like member is swelled toward a fixing surface side of the protruding electrode of the plate-shaped member, and a central portion of the plate-shaped member forms the resin accommodating portion . 如請求項24或25之帶有突起電極之板狀構件,其中上述板狀構件之一部分被沖裁,被沖裁之上述一部分於與上述板狀構件之面方向垂直之方向上彎曲,從而形成上述突起電極。 A plate-like member having a projecting electrode according to claim 24 or 25, wherein one of the plate-like members is partially punched, and the punched portion is bent in a direction perpendicular to a direction of a surface of the plate-like member, thereby forming The above protruding electrode. 一種如請求項24至32中任一項之帶有突起電極之板狀構件之製造方法,其包括藉由對由金屬板形成之上述板狀構件進行蝕刻而形成上述突起電極之步驟。 A method of producing a plate-like member having a protruding electrode according to any one of claims 24 to 32, comprising the step of forming said protruding electrode by etching said plate-shaped member formed of a metal plate. 一種如請求項24至32中任一項之帶有突起電極之板狀構件之製造方法,其包括將由金屬板形成之上述板狀構件與上述突起電極接合之步驟。 A method of producing a plate-like member having a protruding electrode according to any one of claims 24 to 32, comprising the step of joining said plate-like member formed of a metal plate to said protruding electrode. 一種如請求項24至32中任一項之帶有突起電極之板狀構件之製造方法,其包括藉由電鑄而同時成形上述板狀構件與上述突起電極之步驟。 A method of producing a plate-like member having a projecting electrode according to any one of claims 24 to 32, comprising the step of simultaneously molding said plate-like member and said projecting electrode by electroforming. 一種如請求項24至32中任一項之帶有突起電極之板狀構件之製造方法,其包括藉由導電性樹脂而同時成形上述板狀構件與上述突起電極之步驟。 A method of producing a plate-like member having a protruding electrode according to any one of claims 24 to 32, comprising the step of simultaneously molding the plate-like member and the protruding electrode by a conductive resin. 一種如請求項24至32中任一項之帶有突起電極之板狀構件之製造方法,其包括對由導電性樹脂形成之上述板狀構件接合上述突起電極之步驟。 A method of producing a plate-like member having a protruding electrode according to any one of claims 24 to 32, comprising the step of joining said protruding electrode to said plate-like member formed of a conductive resin. 一種如請求項24至32中任一項之帶有突起電極之板狀構件之製造方法,其中上述板狀構件由樹脂板形成;上述製造方法包括將導電性塗膜貼於上述板狀構件及上述突起電極之步驟。 A method of manufacturing a plate-like member having a projecting electrode according to any one of claims 24 to 32, wherein said plate-like member is formed of a resin plate; and said manufacturing method comprises attaching a conductive coating film to said plate-like member and The above steps of protruding electrodes. 一種如請求項24至32中任一項之帶有突起電極之板狀構件之製造方法,其中上述板狀構件由金屬板形成;上述製造方法包括對上述金屬板之一部分進行沖裁後將其彎曲,從而形成上述突起電極之步驟。 A method of manufacturing a plate-like member having a protruding electrode according to any one of claims 24 to 32, wherein said plate-like member is formed of a metal plate; and said manufacturing method comprises punching a portion of said metal plate The step of bending to form the above-mentioned protruding electrode. 一種電子零件,其特徵在於, 上述電子零件為將晶片予以樹脂密封之電子零件;上述電子零件包括基板、晶片、樹脂、及如請求項24至32中任一項之帶有突起電極之板狀構件;上述晶片配置於上述基板上,並被上述樹脂密封;於上述基板上之上述晶片之配置側,形成有配線圖案;上述突起電極貫通上述樹脂而與上述配線圖案接觸。 An electronic component characterized in that The electronic component is an electronic component that resin-seales the wafer; the electronic component includes a substrate, a wafer, a resin, and a plate-like member having a protruding electrode according to any one of claims 24 to 32; wherein the wafer is disposed on the substrate And being sealed by the resin; a wiring pattern is formed on the side of the wafer on the substrate; and the protruding electrode is in contact with the wiring pattern through the resin.
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