TWI568703B - In-Ga-Sn-based oxide sintered body - Google Patents

In-Ga-Sn-based oxide sintered body Download PDF

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Publication number
TWI568703B
TWI568703B TW101130510A TW101130510A TWI568703B TW I568703 B TWI568703 B TW I568703B TW 101130510 A TW101130510 A TW 101130510A TW 101130510 A TW101130510 A TW 101130510A TW I568703 B TWI568703 B TW I568703B
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Taiwan
Prior art keywords
sintered body
oxide
oxide sintered
region
film
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TW101130510A
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English (en)
Chinese (zh)
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TW201309616A (zh
Inventor
Mami Nishimura
Koki Yano
Masayuki Itose
Masashi Kasami
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Idemitsu Kosan Co
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Publication of TW201309616A publication Critical patent/TW201309616A/zh
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Publication of TWI568703B publication Critical patent/TWI568703B/zh

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    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/786Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/7869Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate
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TW101130510A 2011-08-22 2012-08-22 In-Ga-Sn-based oxide sintered body TWI568703B (zh)

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JP2011180929 2011-08-22

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TW201309616A TW201309616A (zh) 2013-03-01
TWI568703B true TWI568703B (zh) 2017-02-01

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WO (1) WO2013027391A1 (ja)

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US9224820B2 (en) * 2012-05-31 2015-12-29 Samsung Corning Advanced Glass, Llc Oxide semiconductor sputtering target, method of manufacturing thin-film transistors using the same, and thin film transistor manufactured using the same
TWI566413B (zh) * 2013-09-09 2017-01-11 元太科技工業股份有限公司 薄膜電晶體
US10515787B2 (en) 2013-11-29 2019-12-24 Kobelco Research Institute, Inc. Oxide sintered body and sputtering target, and method for producing same
JP5952891B2 (ja) * 2014-02-14 2016-07-13 株式会社コベルコ科研 酸化物焼結体、およびスパッタリングターゲットの製造方法
WO2016035503A1 (ja) * 2014-09-02 2016-03-10 株式会社神戸製鋼所 薄膜トランジスタ
JP2016054171A (ja) * 2014-09-02 2016-04-14 株式会社神戸製鋼所 薄膜トランジスタの酸化物半導体薄膜、薄膜トランジスタ、およびスパッタリングターゲット
JP6659255B2 (ja) * 2014-09-02 2020-03-04 株式会社神戸製鋼所 薄膜トランジスタ
CN108886059A (zh) * 2016-04-04 2018-11-23 株式会社神户制钢所 薄膜晶体管
WO2019111603A1 (ja) 2017-12-05 2019-06-13 ソニー株式会社 撮像素子、積層型撮像素子及び固体撮像装置
KR102653048B1 (ko) 2018-04-20 2024-04-01 소니그룹주식회사 촬상 소자, 적층형 촬상 소자 및 고체 촬상 장치
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