TWI567813B - Grinding method - Google Patents

Grinding method Download PDF

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Publication number
TWI567813B
TWI567813B TW102123143A TW102123143A TWI567813B TW I567813 B TWI567813 B TW I567813B TW 102123143 A TW102123143 A TW 102123143A TW 102123143 A TW102123143 A TW 102123143A TW I567813 B TWI567813 B TW I567813B
Authority
TW
Taiwan
Prior art keywords
polishing
wafer
film thickness
film
thickness
Prior art date
Application number
TW102123143A
Other languages
English (en)
Chinese (zh)
Other versions
TW201403700A (zh
Inventor
飯泉健
渡辺和英
小林洋一
Original Assignee
荏原製作所股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 荏原製作所股份有限公司 filed Critical 荏原製作所股份有限公司
Publication of TW201403700A publication Critical patent/TW201403700A/zh
Application granted granted Critical
Publication of TWI567813B publication Critical patent/TWI567813B/zh

Links

Classifications

    • H10P52/00—
    • H10P52/403—
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/005—Control means for lapping machines or devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/005—Control means for lapping machines or devices
    • B24B37/013—Devices or means for detecting lapping completion
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/11—Lapping tools
    • B24B37/20—Lapping pads for working plane surfaces
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/27—Work carriers
    • B24B37/30—Work carriers for single side lapping of plane surfaces
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0683—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating measurement during deposition or removal of the layer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
    • H10P52/402—
    • H10P72/0422—
    • H10P72/0428—
    • H10P72/0604—
    • H10P74/203—
    • H10P74/23—
    • H10P95/062—
    • H10P95/064—
    • H10W10/014—
    • H10W10/17—
    • H10W20/062—
    • H10W20/092—

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
TW102123143A 2012-07-10 2013-06-28 Grinding method TWI567813B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012154975A JP6046933B2 (ja) 2012-07-10 2012-07-10 研磨方法

Publications (2)

Publication Number Publication Date
TW201403700A TW201403700A (zh) 2014-01-16
TWI567813B true TWI567813B (zh) 2017-01-21

Family

ID=49914311

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102123143A TWI567813B (zh) 2012-07-10 2013-06-28 Grinding method

Country Status (4)

Country Link
US (2) US8951813B2 (enExample)
JP (1) JP6046933B2 (enExample)
KR (1) KR101767291B1 (enExample)
TW (1) TWI567813B (enExample)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI635929B (zh) * 2013-07-11 2018-09-21 日商荏原製作所股份有限公司 研磨裝置及研磨狀態監視方法
US9997420B2 (en) * 2013-12-27 2018-06-12 Taiwan Semiconductor Manufacturing Company Limited Method and/or system for chemical mechanical planarization (CMP)
JP6293519B2 (ja) * 2014-03-05 2018-03-14 株式会社荏原製作所 研磨装置および研磨方法
JP6266493B2 (ja) 2014-03-20 2018-01-24 株式会社荏原製作所 研磨装置及び研磨方法
JP6370084B2 (ja) * 2014-04-10 2018-08-08 株式会社荏原製作所 基板処理装置
KR102431971B1 (ko) 2014-04-18 2022-08-16 가부시키가이샤 에바라 세이사꾸쇼 기판 처리 장치 및 기판 처리 방법
KR102388170B1 (ko) * 2014-09-02 2022-04-19 가부시키가이샤 에바라 세이사꾸쇼 종점 검출 방법, 연마 장치 및 연마 방법
JP6321579B2 (ja) * 2015-06-01 2018-05-09 株式会社日立国際電気 半導体装置の製造方法、基板処理システム、基板処理装置及びプログラム
JP6566897B2 (ja) * 2016-03-17 2019-08-28 東京エレクトロン株式会社 制御装置、基板処理システム、基板処理方法及びプログラム
US11626315B2 (en) * 2016-11-29 2023-04-11 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor structure and planarization method thereof
JP7023063B2 (ja) * 2017-08-08 2022-02-21 株式会社荏原製作所 基板研磨装置及び方法
JP6902452B2 (ja) * 2017-10-19 2021-07-14 株式会社荏原製作所 研磨装置
JP7081919B2 (ja) * 2017-12-26 2022-06-07 株式会社ディスコ 加工装置
JP7316785B2 (ja) 2018-12-26 2023-07-28 株式会社荏原製作所 光学式膜厚測定システムの洗浄方法
US11623320B2 (en) * 2019-08-21 2023-04-11 Applied Materials, Inc. Polishing head with membrane position control
JP7517832B2 (ja) * 2020-01-17 2024-07-17 株式会社荏原製作所 研磨ヘッドシステムおよび研磨装置
JP7361637B2 (ja) * 2020-03-09 2023-10-16 株式会社荏原製作所 研磨方法、研磨装置、およびプログラムを記録したコンピュータ読み取り可能な記録媒体
JP7503418B2 (ja) * 2020-05-14 2024-06-20 株式会社荏原製作所 膜厚測定装置、研磨装置及び膜厚測定方法
JP7466434B2 (ja) * 2020-11-19 2024-04-12 株式会社荏原製作所 基板処理装置および基板処理方法
US12343840B2 (en) 2021-03-05 2025-07-01 Applied Materials, Inc. Control of processing parameters for substrate polishing with substrate precession
CN114000192B (zh) * 2021-10-29 2023-10-13 北京北方华创微电子装备有限公司 半导体工艺设备以及晶圆位置状态的监测方法
JP7680347B2 (ja) * 2021-12-24 2025-05-20 株式会社荏原製作所 膜厚測定方法および膜厚測定装置
JP2024155058A (ja) * 2023-04-20 2024-10-31 株式会社荏原製作所 膜厚測定装置、膜厚測定方法及び基板研磨装置
CN119897756B (zh) * 2025-04-02 2025-07-11 天通控股股份有限公司 一种提高钽酸锂键合片膜厚均匀性的方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040029489A1 (en) * 2000-06-30 2004-02-12 Manabu Tsujimura Polishing apparatus
US20060194511A1 (en) * 2005-02-25 2006-08-31 Speedfam Co., Ltd. Thickness control method and double side polisher

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3218881B2 (ja) * 1994-03-22 2001-10-15 三菱マテリアル株式会社 ウェーハ膜厚測定装置、ウェーハ膜厚測定方法およびウェーハ研磨装置
US5492594A (en) 1994-09-26 1996-02-20 International Business Machines Corp. Chemical-mechanical polishing tool with end point measurement station
JPH08240413A (ja) * 1995-01-06 1996-09-17 Toshiba Corp 膜厚測定装置及びポリシング装置
IL113829A (en) 1995-05-23 2000-12-06 Nova Measuring Instr Ltd Apparatus for optical inspection of wafers during polishing
JP3863624B2 (ja) * 1997-03-24 2006-12-27 不二越機械工業株式会社 ウェーハの研磨装置及びウェーハの研磨方法
US6447370B1 (en) 2001-04-17 2002-09-10 Speedfam-Ipec Corporation Inline metrology device
US6939198B1 (en) 2001-12-28 2005-09-06 Applied Materials, Inc. Polishing system with in-line and in-situ metrology
JP2004012302A (ja) 2002-06-07 2004-01-15 Hitachi Ltd 膜厚分布計測方法及びその装置
JP2005203729A (ja) 2003-12-19 2005-07-28 Ebara Corp 基板研磨装置
US7118451B2 (en) 2004-02-27 2006-10-10 Taiwan Semiconductor Manufacturing Co., Ltd. CMP apparatus and process sequence method
JP2010186866A (ja) * 2009-02-12 2010-08-26 Ebara Corp 研磨方法
JP2010087243A (ja) * 2008-09-30 2010-04-15 Panasonic Corp 半導体装置の製造方法
US20110300776A1 (en) 2010-06-03 2011-12-08 Applied Materials, Inc. Tuning of polishing process in multi-carrier head per platen polishing station
JP2012009692A (ja) * 2010-06-25 2012-01-12 Toshiba Corp ドレス方法、研磨方法および研磨装置
US20140141694A1 (en) 2012-11-21 2014-05-22 Applied Materials, Inc. In-Sequence Spectrographic Sensor

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040029489A1 (en) * 2000-06-30 2004-02-12 Manabu Tsujimura Polishing apparatus
US20060194511A1 (en) * 2005-02-25 2006-08-31 Speedfam Co., Ltd. Thickness control method and double side polisher

Also Published As

Publication number Publication date
US20140017824A1 (en) 2014-01-16
KR20140007753A (ko) 2014-01-20
US20150111314A1 (en) 2015-04-23
JP2014017418A (ja) 2014-01-30
JP6046933B2 (ja) 2016-12-21
US8951813B2 (en) 2015-02-10
TW201403700A (zh) 2014-01-16
KR101767291B1 (ko) 2017-08-10

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