TWI561839B - Integrated circuit testing interface and automatic test equipment - Google Patents

Integrated circuit testing interface and automatic test equipment

Info

Publication number
TWI561839B
TWI561839B TW103119788A TW103119788A TWI561839B TW I561839 B TWI561839 B TW I561839B TW 103119788 A TW103119788 A TW 103119788A TW 103119788 A TW103119788 A TW 103119788A TW I561839 B TWI561839 B TW I561839B
Authority
TW
Taiwan
Prior art keywords
integrated circuit
test equipment
automatic test
circuit testing
testing interface
Prior art date
Application number
TW103119788A
Other languages
English (en)
Other versions
TW201530171A (zh
Inventor
Chun Chi Chen
Hung Wei Lai
Tsung Jun Lee
Original Assignee
Sitronix Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sitronix Technology Corp filed Critical Sitronix Technology Corp
Priority to CN201420393185.2U priority Critical patent/CN204044309U/zh
Priority to CN201410338702.0A priority patent/CN104808133B/zh
Priority to US14/492,067 priority patent/US9435863B2/en
Priority to KR1020140147058A priority patent/KR101581874B1/ko
Priority to JP2014005752U priority patent/JP3195366U/ja
Publication of TW201530171A publication Critical patent/TW201530171A/zh
Application granted granted Critical
Publication of TWI561839B publication Critical patent/TWI561839B/zh

Links

TW103119788A 2014-01-24 2014-06-06 Integrated circuit testing interface and automatic test equipment TWI561839B (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
CN201420393185.2U CN204044309U (zh) 2014-01-24 2014-07-16 自动测试设备和升级自动测试设备的集成电路测试界面
CN201410338702.0A CN104808133B (zh) 2014-01-24 2014-07-16 自动测试设备和升级自动测试设备的集成电路测试界面
US14/492,067 US9435863B2 (en) 2014-01-24 2014-09-21 Integrated circuit testing interface on automatic test equipment
KR1020140147058A KR101581874B1 (ko) 2014-01-24 2014-10-28 자동 테스트 장비에 대한 집적 회로 테스트 인터페이스
JP2014005752U JP3195366U (ja) 2014-01-24 2014-10-29 自動試験装置における集積回路テストインターフェース

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201461930970P 2014-01-24 2014-01-24

Publications (2)

Publication Number Publication Date
TW201530171A TW201530171A (zh) 2015-08-01
TWI561839B true TWI561839B (en) 2016-12-11

Family

ID=52109529

Family Applications (2)

Application Number Title Priority Date Filing Date
TW103119788A TWI561839B (en) 2014-01-24 2014-06-06 Integrated circuit testing interface and automatic test equipment
TW103210068U TWM488641U (zh) 2014-01-24 2014-06-06 自動測試設備的積體電路測試介面

Family Applications After (1)

Application Number Title Priority Date Filing Date
TW103210068U TWM488641U (zh) 2014-01-24 2014-06-06 自動測試設備的積體電路測試介面

Country Status (1)

Country Link
TW (2) TWI561839B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3771912A1 (en) 2019-08-01 2021-02-03 Cheng Uei Precision Industry Co., Ltd. Automatic circuit board test system and automatic circuit board test method applied therein
TWI742726B (zh) * 2019-06-19 2021-10-11 韓商泰克元股份有限公司 測試板及測試腔室

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN204044309U (zh) 2014-01-24 2014-12-24 矽创电子股份有限公司 自动测试设备和升级自动测试设备的集成电路测试界面
TWI561839B (en) * 2014-01-24 2016-12-11 Sitronix Technology Corp Integrated circuit testing interface and automatic test equipment
TWI773403B (zh) * 2021-06-24 2022-08-01 英業達股份有限公司 產生正反面插接訊號以測試連接介面之系統及方法
TWI808694B (zh) * 2022-03-23 2023-07-11 英業達股份有限公司 以電路板之電路傳送指令測試連接介面之裝置、系統及方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040059971A1 (en) * 2002-09-23 2004-03-25 Lsi Logic Corporation Device under test interface card with on-board testing
US20070162800A1 (en) * 2004-08-26 2007-07-12 Test Research Laboratories Inc. Semiconductor test system
TWI421517B (zh) * 2010-08-02 2014-01-01 Macronix Int Co Ltd 積體電路測試系統和方法
TWM488641U (zh) * 2014-01-24 2014-10-21 Sitronix Technology Corp 自動測試設備的積體電路測試介面

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040059971A1 (en) * 2002-09-23 2004-03-25 Lsi Logic Corporation Device under test interface card with on-board testing
US20070162800A1 (en) * 2004-08-26 2007-07-12 Test Research Laboratories Inc. Semiconductor test system
TWI421517B (zh) * 2010-08-02 2014-01-01 Macronix Int Co Ltd 積體電路測試系統和方法
TWM488641U (zh) * 2014-01-24 2014-10-21 Sitronix Technology Corp 自動測試設備的積體電路測試介面

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI742726B (zh) * 2019-06-19 2021-10-11 韓商泰克元股份有限公司 測試板及測試腔室
EP3771912A1 (en) 2019-08-01 2021-02-03 Cheng Uei Precision Industry Co., Ltd. Automatic circuit board test system and automatic circuit board test method applied therein
EP3879287A1 (en) 2019-08-01 2021-09-15 Cheng Uei Precision Industry Co., Ltd. Automatic circuit board test method

Also Published As

Publication number Publication date
TW201530171A (zh) 2015-08-01
TWM488641U (zh) 2014-10-21

Similar Documents

Publication Publication Date Title
TWI563275B (en) Automated test equipment and testing methods
GB2506825B (en) Functional testing of an integrated circuit chip
TWI561839B (en) Integrated circuit testing interface and automatic test equipment
GB201507510D0 (en) Electrochemical Test Device
GB201405520D0 (en) A circuit for use in scan testing
GB2506826B (en) Monitoring functional testing of an integrated circuit chip
SG10201501865PA (en) Device For Testing Electronic Components
SG11201610683PA (en) Semiconductor device tester with dut data streaming
ZA201702133B (en) Test device and method
SG11201802457VA (en) Manipulator in automatic test equipment
GB2546847B (en) Urine test device
ZA201803803B (en) Device for performing an allergy test
GB201309302D0 (en) Method and test enviroment for testing an integrated circuit
SG11202002291TA (en) Test device
TWI560453B (en) Circuit board and testing method
GB201518615D0 (en) Test methods and apparatus
EP3625579C0 (fr) Appareil de test et procede de test d'un circuit integre
SG11201610470RA (en) Integrated circuit chip tester with an anti-rotation link
GB201507508D0 (en) Electrochemical Test Device
GB2541856B (en) Cable testing device and method
SG11201705393QA (en) Pre-alignment measuring device and method
GB201405010D0 (en) Testing methods and apparatus
GB201417622D0 (en) Ring circuit continuity tester
GB201408522D0 (en) Device testing
SG11201610260XA (en) Testing device and testing method