TWI561839B - Integrated circuit testing interface and automatic test equipment - Google Patents
Integrated circuit testing interface and automatic test equipmentInfo
- Publication number
- TWI561839B TWI561839B TW103119788A TW103119788A TWI561839B TW I561839 B TWI561839 B TW I561839B TW 103119788 A TW103119788 A TW 103119788A TW 103119788 A TW103119788 A TW 103119788A TW I561839 B TWI561839 B TW I561839B
- Authority
- TW
- Taiwan
- Prior art keywords
- integrated circuit
- test equipment
- automatic test
- circuit testing
- testing interface
- Prior art date
Links
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201420393185.2U CN204044309U (zh) | 2014-01-24 | 2014-07-16 | 自动测试设备和升级自动测试设备的集成电路测试界面 |
CN201410338702.0A CN104808133B (zh) | 2014-01-24 | 2014-07-16 | 自动测试设备和升级自动测试设备的集成电路测试界面 |
US14/492,067 US9435863B2 (en) | 2014-01-24 | 2014-09-21 | Integrated circuit testing interface on automatic test equipment |
KR1020140147058A KR101581874B1 (ko) | 2014-01-24 | 2014-10-28 | 자동 테스트 장비에 대한 집적 회로 테스트 인터페이스 |
JP2014005752U JP3195366U (ja) | 2014-01-24 | 2014-10-29 | 自動試験装置における集積回路テストインターフェース |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201461930970P | 2014-01-24 | 2014-01-24 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201530171A TW201530171A (zh) | 2015-08-01 |
TWI561839B true TWI561839B (en) | 2016-12-11 |
Family
ID=52109529
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW103119788A TWI561839B (en) | 2014-01-24 | 2014-06-06 | Integrated circuit testing interface and automatic test equipment |
TW103210068U TWM488641U (zh) | 2014-01-24 | 2014-06-06 | 自動測試設備的積體電路測試介面 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW103210068U TWM488641U (zh) | 2014-01-24 | 2014-06-06 | 自動測試設備的積體電路測試介面 |
Country Status (1)
Country | Link |
---|---|
TW (2) | TWI561839B (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3771912A1 (en) | 2019-08-01 | 2021-02-03 | Cheng Uei Precision Industry Co., Ltd. | Automatic circuit board test system and automatic circuit board test method applied therein |
TWI742726B (zh) * | 2019-06-19 | 2021-10-11 | 韓商泰克元股份有限公司 | 測試板及測試腔室 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN204044309U (zh) | 2014-01-24 | 2014-12-24 | 矽创电子股份有限公司 | 自动测试设备和升级自动测试设备的集成电路测试界面 |
TWI561839B (en) * | 2014-01-24 | 2016-12-11 | Sitronix Technology Corp | Integrated circuit testing interface and automatic test equipment |
TWI773403B (zh) * | 2021-06-24 | 2022-08-01 | 英業達股份有限公司 | 產生正反面插接訊號以測試連接介面之系統及方法 |
TWI808694B (zh) * | 2022-03-23 | 2023-07-11 | 英業達股份有限公司 | 以電路板之電路傳送指令測試連接介面之裝置、系統及方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040059971A1 (en) * | 2002-09-23 | 2004-03-25 | Lsi Logic Corporation | Device under test interface card with on-board testing |
US20070162800A1 (en) * | 2004-08-26 | 2007-07-12 | Test Research Laboratories Inc. | Semiconductor test system |
TWI421517B (zh) * | 2010-08-02 | 2014-01-01 | Macronix Int Co Ltd | 積體電路測試系統和方法 |
TWM488641U (zh) * | 2014-01-24 | 2014-10-21 | Sitronix Technology Corp | 自動測試設備的積體電路測試介面 |
-
2014
- 2014-06-06 TW TW103119788A patent/TWI561839B/zh active
- 2014-06-06 TW TW103210068U patent/TWM488641U/zh unknown
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040059971A1 (en) * | 2002-09-23 | 2004-03-25 | Lsi Logic Corporation | Device under test interface card with on-board testing |
US20070162800A1 (en) * | 2004-08-26 | 2007-07-12 | Test Research Laboratories Inc. | Semiconductor test system |
TWI421517B (zh) * | 2010-08-02 | 2014-01-01 | Macronix Int Co Ltd | 積體電路測試系統和方法 |
TWM488641U (zh) * | 2014-01-24 | 2014-10-21 | Sitronix Technology Corp | 自動測試設備的積體電路測試介面 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI742726B (zh) * | 2019-06-19 | 2021-10-11 | 韓商泰克元股份有限公司 | 測試板及測試腔室 |
EP3771912A1 (en) | 2019-08-01 | 2021-02-03 | Cheng Uei Precision Industry Co., Ltd. | Automatic circuit board test system and automatic circuit board test method applied therein |
EP3879287A1 (en) | 2019-08-01 | 2021-09-15 | Cheng Uei Precision Industry Co., Ltd. | Automatic circuit board test method |
Also Published As
Publication number | Publication date |
---|---|
TW201530171A (zh) | 2015-08-01 |
TWM488641U (zh) | 2014-10-21 |
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