SG11201610683PA - Semiconductor device tester with dut data streaming - Google Patents

Semiconductor device tester with dut data streaming

Info

Publication number
SG11201610683PA
SG11201610683PA SG11201610683PA SG11201610683PA SG11201610683PA SG 11201610683P A SG11201610683P A SG 11201610683PA SG 11201610683P A SG11201610683P A SG 11201610683PA SG 11201610683P A SG11201610683P A SG 11201610683PA SG 11201610683P A SG11201610683P A SG 11201610683PA
Authority
SG
Singapore
Prior art keywords
semiconductor device
data streaming
device tester
dut data
dut
Prior art date
Application number
SG11201610683PA
Inventor
James Neeb
Vineet Pancholi
Gerard Mcsweeney
Shelby Rollins
Chris Johnson
Nathan Blackwell
Bradly L Inman
Steven Lill
Rodney J Christner
Phillip Barnes
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of SG11201610683PA publication Critical patent/SG11201610683PA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/025—General constructional details concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
SG11201610683PA 2014-07-28 2014-07-28 Semiconductor device tester with dut data streaming SG11201610683PA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2014/048509 WO2016018236A1 (en) 2014-07-28 2014-07-28 Semiconductor device tester with dut data streaming

Publications (1)

Publication Number Publication Date
SG11201610683PA true SG11201610683PA (en) 2017-01-27

Family

ID=55217960

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201610683PA SG11201610683PA (en) 2014-07-28 2014-07-28 Semiconductor device tester with dut data streaming

Country Status (6)

Country Link
US (1) US20160313370A1 (en)
KR (1) KR20170010007A (en)
CN (1) CN106561085A (en)
DE (1) DE112014006642T5 (en)
SG (1) SG11201610683PA (en)
WO (1) WO2016018236A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9696775B2 (en) * 2015-03-02 2017-07-04 Intel IP Corporation Integrated circuit with on-chip power profiling
US10795742B1 (en) * 2016-09-28 2020-10-06 Amazon Technologies, Inc. Isolating unresponsive customer logic from a bus
US10223317B2 (en) 2016-09-28 2019-03-05 Amazon Technologies, Inc. Configurable logic platform
CN109212342B (en) * 2017-07-06 2020-12-15 中国船舶重工集团公司第七一一研究所 Detection circuit for frequency converter
US10896106B2 (en) * 2018-05-10 2021-01-19 Teradyne, Inc. Bus synchronization system that aggregates status
EP3734297A1 (en) * 2019-04-30 2020-11-04 Rohde & Schwarz GmbH & Co. KG Test or measurement instrument and method
CN111045964B (en) * 2019-12-06 2021-07-20 上海国微思尔芯技术股份有限公司 PCIE interface-based high-speed transmission method, storage medium and terminal

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6449741B1 (en) * 1998-10-30 2002-09-10 Ltx Corporation Single platform electronic tester
US6466007B1 (en) * 2000-08-14 2002-10-15 Teradyne, Inc. Test system for smart card and indentification devices and the like
JP2004086451A (en) * 2002-08-26 2004-03-18 Matsushita Electric Ind Co Ltd Semiconductor integrated circuit
JP4111955B2 (en) * 2003-03-03 2008-07-02 富士通株式会社 Semiconductor device testing equipment
JP4836488B2 (en) * 2005-05-09 2011-12-14 株式会社東芝 Data transfer device and semiconductor integrated circuit device
DE602005002131T2 (en) * 2005-05-20 2008-05-15 Verigy (Singapore) Pte. Ltd. Test device with adaptation of the test parameter
JP2007066126A (en) * 2005-09-01 2007-03-15 Hitachi Global Storage Technologies Netherlands Bv Test method for data storage device and method of manufacturing data storage device
US7676713B2 (en) * 2005-10-28 2010-03-09 Integrated Device Technology, Inc. Automated device testing using intertwined stimulus-generation and response validation specifications for managing DUT's that generate out-of-order responses
US7962823B2 (en) * 2006-06-06 2011-06-14 Litepoint Corporation System and method for testing multiple packet data transmitters
WO2008020555A1 (en) * 2006-08-14 2008-02-21 Advantest Corporation Test device and test method
US8269520B2 (en) * 2009-10-08 2012-09-18 Teradyne, Inc. Using pattern generators to control flow of data to and from a semiconductor device under test
KR101789848B1 (en) * 2010-05-28 2017-10-25 주식회사 아도반테스토 Flexible storage interface tester with variable parallelism and firmware upgradeability

Also Published As

Publication number Publication date
WO2016018236A1 (en) 2016-02-04
CN106561085A (en) 2017-04-12
DE112014006642T5 (en) 2017-01-19
US20160313370A1 (en) 2016-10-27
KR20170010007A (en) 2017-01-25

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