TWI561650B - Sputtering target for forming transparent oxide film and manufacturing method of the same - Google Patents

Sputtering target for forming transparent oxide film and manufacturing method of the same

Info

Publication number
TWI561650B
TWI561650B TW102128640A TW102128640A TWI561650B TW I561650 B TWI561650 B TW I561650B TW 102128640 A TW102128640 A TW 102128640A TW 102128640 A TW102128640 A TW 102128640A TW I561650 B TWI561650 B TW I561650B
Authority
TW
Taiwan
Prior art keywords
manufacturing
oxide film
same
sputtering target
transparent oxide
Prior art date
Application number
TW102128640A
Other languages
English (en)
Other versions
TW201413014A (zh
Inventor
Atsushi Saito
Shoubin Zhang
Gou Yamaguchi
Yuichi Kondo
Original Assignee
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Publication of TW201413014A publication Critical patent/TW201413014A/zh
Application granted granted Critical
Publication of TWI561650B publication Critical patent/TWI561650B/zh

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B35/00Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/01Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
    • C04B35/453Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B35/00Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/622Forming processes; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/64Burning or sintering processes
    • C04B35/645Pressure sintering
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/08Oxides
    • C23C14/086Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/241Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
    • G11B7/252Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
    • G11B7/254Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of protective topcoat layers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/26Apparatus or processes specially adapted for the manufacture of record carriers
    • G11B7/266Sputtering or spin-coating layers
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3217Aluminum oxide or oxide forming salts thereof, e.g. bauxite, alpha-alumina
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/32Metal oxides, mixed metal oxides, or oxide-forming salts thereof, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3286Gallium oxides, gallates, indium oxides, indates, thallium oxides, thallates or oxide forming salts thereof, e.g. zinc gallate
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/34Non-metal oxides, non-metal mixed oxides, or salts thereof that form the non-metal oxides upon heating, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3418Silicon oxide, silicic acids or oxide forming salts thereof, e.g. silica sol, fused silica, silica fume, cristobalite, quartz or flint
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/30Constituents and secondary phases not being of a fibrous nature
    • C04B2235/34Non-metal oxides, non-metal mixed oxides, or salts thereof that form the non-metal oxides upon heating, e.g. carbonates, nitrates, (oxy)hydroxides, chlorides
    • C04B2235/3427Silicates other than clay, e.g. water glass
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/50Constituents or additives of the starting mixture chosen for their shape or used because of their shape or their physical appearance
    • C04B2235/54Particle size related information
    • C04B2235/5418Particle size related information expressed by the size of the particles or aggregates thereof
    • C04B2235/5436Particle size related information expressed by the size of the particles or aggregates thereof micrometer sized, i.e. from 1 to 100 micron
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/50Constituents or additives of the starting mixture chosen for their shape or used because of their shape or their physical appearance
    • C04B2235/54Particle size related information
    • C04B2235/5418Particle size related information expressed by the size of the particles or aggregates thereof
    • C04B2235/5445Particle size related information expressed by the size of the particles or aggregates thereof submicron sized, i.e. from 0,1 to 1 micron
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/70Aspects relating to sintered or melt-casted ceramic products
    • C04B2235/74Physical characteristics
    • C04B2235/76Crystal structural characteristics, e.g. symmetry
    • C04B2235/762Cubic symmetry, e.g. beta-SiC
    • C04B2235/763Spinel structure AB2O4
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/70Aspects relating to sintered or melt-casted ceramic products
    • C04B2235/74Physical characteristics
    • C04B2235/78Grain sizes and shapes, product microstructures, e.g. acicular grains, equiaxed grains, platelet-structures
    • C04B2235/786Micrometer sized grains, i.e. from 1 to 100 micron
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/70Aspects relating to sintered or melt-casted ceramic products
    • C04B2235/80Phases present in the sintered or melt-cast ceramic products other than the main phase
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/241Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
    • G11B7/252Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
    • G11B7/254Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of protective topcoat layers
    • G11B2007/25408Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of protective topcoat layers consisting essentially of inorganic materials
    • G11B2007/25411Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of protective topcoat layers consisting essentially of inorganic materials containing transition metal elements (Zn, Fe, Co, Ni, Pt)
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/241Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
    • G11B7/252Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
    • G11B7/254Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of protective topcoat layers
    • G11B2007/25408Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of protective topcoat layers consisting essentially of inorganic materials
    • G11B2007/25414Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of protective topcoat layers consisting essentially of inorganic materials containing Group 13 elements (B, Al, Ga)
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/24Record carriers characterised by shape, structure or physical properties, or by the selection of the material
    • G11B7/241Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material
    • G11B7/252Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers
    • G11B7/254Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of protective topcoat layers
    • G11B2007/25408Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of protective topcoat layers consisting essentially of inorganic materials
    • G11B2007/25417Record carriers characterised by shape, structure or physical properties, or by the selection of the material characterised by the selection of the material of layers other than recording layers of protective topcoat layers consisting essentially of inorganic materials containing Group 14 elements (C, Si, Ge, Sn)

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Ceramic Engineering (AREA)
  • Materials Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Structural Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Inorganic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Compositions Of Oxide Ceramics (AREA)
  • Optical Record Carriers And Manufacture Thereof (AREA)
TW102128640A 2012-08-10 2013-08-09 Sputtering target for forming transparent oxide film and manufacturing method of the same TWI561650B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2012178802 2012-08-10
JP2013150310A JP6278229B2 (ja) 2012-08-10 2013-07-19 透明酸化物膜形成用スパッタリングターゲット及びその製造方法

Publications (2)

Publication Number Publication Date
TW201413014A TW201413014A (zh) 2014-04-01
TWI561650B true TWI561650B (en) 2016-12-11

Family

ID=50068234

Family Applications (1)

Application Number Title Priority Date Filing Date
TW102128640A TWI561650B (en) 2012-08-10 2013-08-09 Sputtering target for forming transparent oxide film and manufacturing method of the same

Country Status (5)

Country Link
JP (1) JP6278229B2 (zh)
KR (1) KR101990663B1 (zh)
CN (1) CN104540976B (zh)
TW (1) TWI561650B (zh)
WO (1) WO2014025017A1 (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102281399B1 (ko) 2013-12-26 2021-07-23 고쿠리츠다이가쿠호진 토쿄고교 다이가꾸 금속 산화물의 박막, 그 박막을 구비한 유기 일렉트로 루미네선스 소자, 태양전지, 및 유기 태양전지
CN107207356B (zh) 2015-02-27 2020-12-08 捷客斯金属株式会社 氧化物烧结体、氧化物溅射靶和氧化物薄膜
JP6677058B2 (ja) * 2016-03-04 2020-04-08 住友金属鉱山株式会社 Sn−Zn−O系酸化物焼結体とその製造方法
CN107523794A (zh) * 2017-09-07 2017-12-29 于盟盟 一种用于溅射透明导电薄膜的靶材
WO2019155577A1 (ja) * 2018-02-08 2019-08-15 三菱マテリアル株式会社 酸化物スパッタリングターゲット、及び酸化物スパッタリングターゲットの製造方法
WO2019163811A1 (ja) * 2018-02-22 2019-08-29 三菱マテリアル株式会社 酸化物膜、酸化物膜の製造方法、及び、窒素含有酸化物スパッタリングターゲット
WO2019187269A1 (ja) * 2018-03-30 2019-10-03 三井金属鉱業株式会社 酸化物焼結体、スパッタリングターゲットおよび透明導電膜
CN114127029A (zh) * 2019-10-23 2022-03-01 三菱综合材料株式会社 氧化物溅射靶

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201026629A (en) * 2008-08-18 2010-07-16 Tosoh Corp Composite oxide sinter, method for producing composite oxide sinter, sputtering target and method for producing thin film

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4067141B2 (ja) * 1994-08-17 2008-03-26 Agcセラミックス株式会社 透明導電膜とその製造方法およびスパッタリングターゲット
JP3841388B2 (ja) * 1998-02-16 2006-11-01 日鉱金属株式会社 光ディスク用保護膜及び光ディスクの保護膜形成用スパッタリングターゲット
JPH11236219A (ja) * 1998-02-20 1999-08-31 Sumitomo Metal Mining Co Ltd ZnO系焼結体およびその製法
JPH11256320A (ja) * 1998-03-13 1999-09-21 Sumitomo Metal Mining Co Ltd ZnO系焼結体
EP1211679B1 (en) * 1999-08-12 2005-10-19 Nikko Materials Co., Ltd. Light-transmitting film and sputtering target for forming the light-transmitting film
JP3628566B2 (ja) * 1999-11-09 2005-03-16 株式会社日鉱マテリアルズ スパッタリングターゲット及びその製造方法
JP3890362B2 (ja) * 2004-06-17 2007-03-07 国立大学法人室蘭工業大学 表面プラズモン共鳴現象測定装置
WO2006129410A1 (ja) * 2005-05-30 2006-12-07 Nippon Mining & Metals Co., Ltd. スパッタリングターゲット及びその製造方法
JP4788463B2 (ja) 2006-04-25 2011-10-05 住友金属鉱山株式会社 酸化物焼結体、透明酸化物膜、ガスバリア性透明樹脂基板、ガスバリア性透明導電性樹脂基板およびフレキシブル表示素子
JP5358891B2 (ja) * 2006-08-11 2013-12-04 日立金属株式会社 酸化亜鉛焼結体の製造方法
WO2009145152A1 (ja) * 2008-05-27 2009-12-03 株式会社カネカ 透明導電膜およびその製造方法
JP5582279B2 (ja) * 2008-10-22 2014-09-03 戸田工業株式会社 Ni−Zn−Cu系フェライト焼結体からなるインダクタンス素子
JP2010202451A (ja) * 2009-03-03 2010-09-16 Sumitomo Electric Ind Ltd In−Ga−Zn系複合酸化物焼結体の製造方法
JP5596963B2 (ja) * 2009-11-19 2014-09-24 出光興産株式会社 スパッタリングターゲット及びそれを用いた薄膜トランジスタ
JP2011179056A (ja) * 2010-02-26 2011-09-15 Taiheiyo Cement Corp スパッタリングターゲット
JP2012144410A (ja) * 2011-01-14 2012-08-02 Kobelco Kaken:Kk 酸化物焼結体およびスパッタリングターゲット
JP2012102403A (ja) * 2011-12-15 2012-05-31 Kanazawa Inst Of Technology 酸化亜鉛系透明導電膜、マグネトロンスパッタリング用焼結体ターゲット、液晶ディスプレイ及びタッチパネル、ならびに酸化亜鉛系透明導電膜を含んでなる機器

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201026629A (en) * 2008-08-18 2010-07-16 Tosoh Corp Composite oxide sinter, method for producing composite oxide sinter, sputtering target and method for producing thin film

Also Published As

Publication number Publication date
KR101990663B1 (ko) 2019-06-19
CN104540976B (zh) 2017-02-22
JP6278229B2 (ja) 2018-02-14
CN104540976A (zh) 2015-04-22
KR20150040273A (ko) 2015-04-14
TW201413014A (zh) 2014-04-01
WO2014025017A1 (ja) 2014-02-13
JP2014055348A (ja) 2014-03-27

Similar Documents

Publication Publication Date Title
SG11201505097QA (en) Method for using sputtering target and method for manufacturing oxide film
TWI561655B (en) Sputtering target, method for manufacturing sputtering target, and method for forming thin film
TWI561650B (en) Sputtering target for forming transparent oxide film and manufacturing method of the same
EP2840107A4 (en) HARD COATING FILM AND METHOD FOR THE PRODUCTION THEREOF
EP3070063A4 (en) Intermediate film for laminated glass and laminated glass
EP3037569A4 (en) Mos2 thin film and method for manufacturing same
EP3009411A4 (en) Intermediate film for laminated glass and laminated glass
EP3088181A4 (en) Multilayered film and method for manufacturing same
SG11201501590PA (en) Composite film and method of forming the same
GB201210001D0 (en) Oxide thin film transistor and method of fabricating the same
EP3053969A4 (en) Release film and manufacturing method therefor
SG11201401542YA (en) Magnetic material sputtering target and manufacturing method thereof
EP2548993A4 (en) CATHODIC SPUTTER TARGET AND MANUFACTURING METHOD THEREOF
IL231042A0 (en) The purpose of the thesis and method for its production
EP2855148A4 (en) SUBSTRATE SLIDE AND SINTERED METHODS
SG11201404314WA (en) Magnetic material sputtering target and manufacturing method for same
EP2808302A4 (en) INDIUM CONTAINING OXIDE LAYER AND METHOD FOR MANUFACTURING THE SAME
SG11201404072YA (en) Sputtering target for forming magnetic recording film and process for producing same
EP2813540A4 (en) MULTILAYER FOIL AND METHOD FOR THE PRODUCTION THEREOF
SG11201506426TA (en) FePt-C-BASED SPUTTERING TARGET AND METHOD FOR MANUFACTURING SAME
SG11201500762SA (en) Fe-Pt-BASED SINTERED COMPACT SPUTTERING TARGET AND MANUFACTURING METHOD THEREFOR
EP2960355A4 (en) Sputtering target and production method therefor
EP2735893A4 (en) ANTIREFLECTION FILM HAVING HIGH CONTRAST RATIO AND METHOD OF MANUFACTURING THE SAME
SG11201602431SA (en) Sputtering target and production method
EP2818574A4 (en) SPRAY TARGET AND METHOD FOR PRODUCING THE SAME

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees