TWI561620B - Cmp slurry compositions and methods for aluminum polishing - Google Patents
Cmp slurry compositions and methods for aluminum polishingInfo
- Publication number
- TWI561620B TWI561620B TW104115074A TW104115074A TWI561620B TW I561620 B TWI561620 B TW I561620B TW 104115074 A TW104115074 A TW 104115074A TW 104115074 A TW104115074 A TW 104115074A TW I561620 B TWI561620 B TW I561620B
- Authority
- TW
- Taiwan
- Prior art keywords
- methods
- cmp slurry
- slurry compositions
- aluminum polishing
- polishing
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F3/00—Brightening metals by chemical means
- C23F3/02—Light metals
- C23F3/03—Light metals with acidic solutions
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F3/00—Brightening metals by chemical means
- C23F3/02—Light metals
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201462015084P | 2014-06-20 | 2014-06-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201600591A TW201600591A (zh) | 2016-01-01 |
TWI561620B true TWI561620B (en) | 2016-12-11 |
Family
ID=54869067
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW104115074A TWI561620B (en) | 2014-06-20 | 2015-05-12 | Cmp slurry compositions and methods for aluminum polishing |
Country Status (6)
Country | Link |
---|---|
US (1) | US20150368515A1 (zh) |
JP (1) | JP6800418B2 (zh) |
KR (2) | KR20230007519A (zh) |
CN (1) | CN106661427B (zh) |
TW (1) | TWI561620B (zh) |
WO (1) | WO2015195946A1 (zh) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9359686B1 (en) | 2015-01-09 | 2016-06-07 | Apple Inc. | Processes to reduce interfacial enrichment of alloying elements under anodic oxide films and improve anodized appearance of heat treatable alloys |
US20160289858A1 (en) * | 2015-04-03 | 2016-10-06 | Apple Inc. | Process to mitigate grain texture differential growth rates in mirror-finish anodized aluminum |
US11352708B2 (en) | 2016-08-10 | 2022-06-07 | Apple Inc. | Colored multilayer oxide coatings |
US11242614B2 (en) | 2017-02-17 | 2022-02-08 | Apple Inc. | Oxide coatings for providing corrosion resistance on parts with edges and convex features |
US11043151B2 (en) * | 2017-10-03 | 2021-06-22 | Cmc Materials, Inc. | Surface treated abrasive particles for tungsten buff applications |
JP7034667B2 (ja) * | 2017-10-24 | 2022-03-14 | 山口精研工業株式会社 | 磁気ディスク基板用研磨剤組成物 |
KR102533083B1 (ko) * | 2017-12-18 | 2023-05-17 | 주식회사 케이씨텍 | 다결정실리콘을 함유하는 웨이퍼의 연마 슬러리 조성물 |
US11549191B2 (en) | 2018-09-10 | 2023-01-10 | Apple Inc. | Corrosion resistance for anodized parts having convex surface features |
CN113710761B (zh) * | 2019-04-17 | 2024-04-09 | Cmc材料有限责任公司 | 用于钨擦光应用的经表面涂覆的研磨剂颗粒 |
CN111020590A (zh) * | 2019-11-25 | 2020-04-17 | 昆山兰博旺新材料技术服务有限公司 | 环保型铝合金化学抛光液 |
CN115198275B (zh) * | 2022-06-07 | 2024-02-09 | 湖北奥美伦科技有限公司 | 一种砂面铝合金掩蔽剂及其制备方法和应用 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130224955A1 (en) * | 2008-03-21 | 2013-08-29 | Cabot Microelectronics Corporation | Method for polishing aluminum/copper and titanium in damascene structures |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20010046395A (ko) * | 1999-11-12 | 2001-06-15 | 안복현 | 연마용 조성물 |
US7232514B2 (en) * | 2001-03-14 | 2007-06-19 | Applied Materials, Inc. | Method and composition for polishing a substrate |
US6755721B2 (en) * | 2002-02-22 | 2004-06-29 | Saint-Gobain Ceramics And Plastics, Inc. | Chemical mechanical polishing of nickel phosphorous alloys |
US20060096179A1 (en) * | 2004-11-05 | 2006-05-11 | Cabot Microelectronics Corporation | CMP composition containing surface-modified abrasive particles |
US9343330B2 (en) * | 2006-12-06 | 2016-05-17 | Cabot Microelectronics Corporation | Compositions for polishing aluminum/copper and titanium in damascene structures |
US7994057B2 (en) * | 2007-09-21 | 2011-08-09 | Cabot Microelectronics Corporation | Polishing composition and method utilizing abrasive particles treated with an aminosilane |
MY154861A (en) * | 2008-12-22 | 2015-08-14 | Kao Corp | Polishing liquid composition for magnetic-disk substrate |
JP5613422B2 (ja) * | 2010-02-12 | 2014-10-22 | 花王株式会社 | 磁気ディスク基板用研磨液組成物 |
US20130005149A1 (en) * | 2010-02-22 | 2013-01-03 | Basf Se | Chemical-mechanical planarization of substrates containing copper, ruthenium, and tantalum layers |
US8623766B2 (en) * | 2011-09-20 | 2014-01-07 | Cabot Microelectronics Corporation | Composition and method for polishing aluminum semiconductor substrates |
JP6050934B2 (ja) * | 2011-11-08 | 2016-12-21 | 株式会社フジミインコーポレーテッド | 研磨用組成物並びにそれを用いた研磨方法及び基板の製造方法 |
-
2015
- 2015-05-12 TW TW104115074A patent/TWI561620B/zh active
- 2015-06-18 KR KR1020227043670A patent/KR20230007519A/ko not_active Application Discontinuation
- 2015-06-18 WO PCT/US2015/036477 patent/WO2015195946A1/en active Application Filing
- 2015-06-18 KR KR1020177001259A patent/KR20170023080A/ko not_active Application Discontinuation
- 2015-06-18 US US14/743,583 patent/US20150368515A1/en not_active Abandoned
- 2015-06-18 JP JP2016574054A patent/JP6800418B2/ja active Active
- 2015-06-18 CN CN201580033196.7A patent/CN106661427B/zh active Active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130224955A1 (en) * | 2008-03-21 | 2013-08-29 | Cabot Microelectronics Corporation | Method for polishing aluminum/copper and titanium in damascene structures |
Also Published As
Publication number | Publication date |
---|---|
JP2017527446A (ja) | 2017-09-21 |
CN106661427A (zh) | 2017-05-10 |
KR20170023080A (ko) | 2017-03-02 |
KR20230007519A (ko) | 2023-01-12 |
CN106661427B (zh) | 2019-06-28 |
JP6800418B2 (ja) | 2020-12-16 |
US20150368515A1 (en) | 2015-12-24 |
TW201600591A (zh) | 2016-01-01 |
WO2015195946A1 (en) | 2015-12-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI561621B (en) | Tungsten chemical-mechanical polishing composition | |
TWI561619B (en) | Mixed abrasive tungsten cmp composition | |
TWI561622B (en) | Colloidal silica chemical-mechanical polishing composition | |
TWI561620B (en) | Cmp slurry compositions and methods for aluminum polishing | |
EP3161095B8 (en) | Copper barrier chemical-mechanical polishing composition | |
EP3123498A4 (en) | Mixed abrasive tungsten cmp composition | |
SG11201702915QA (en) | Polishing composition | |
EP3800229C0 (en) | POLISHING COMPOSITION | |
EP3112436A4 (en) | Polishing composition | |
SG11201607553QA (en) | Polishing composition | |
EP3679878C0 (en) | ABRASIVE ELEMENTS FOR ROTATING ATHERECTOMY SYSTEMS | |
SG11201803364WA (en) | Polishing composition | |
SG11201707842PA (en) | Polishing pad | |
SG11201608128UA (en) | Polishing composition and polishing method | |
SG10201501193YA (en) | Polishing apparatus | |
SG11201706046PA (en) | Polishing composition | |
EP3169765A4 (en) | Cleaning composition following cmp and methods related thereto | |
SG11201803362VA (en) | Polishing composition | |
TWI563073B (en) | Cmp compositions and methods for polishing rigid disk surfaces | |
ZA201706132B (en) | Polycrystalline abrasive constructions | |
SG11201800067VA (en) | Grinding disc | |
SG10201602672UA (en) | Cmp composition and method for polishing rigid disks | |
SG10201600749RA (en) | Abrasive grindstone | |
EP3195979A4 (en) | Polishing pad | |
SG11201608131WA (en) | Polishing composition |