TWI521652B - Resin sealing device and resin sealing method - Google Patents

Resin sealing device and resin sealing method Download PDF

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Publication number
TWI521652B
TWI521652B TW102103131A TW102103131A TWI521652B TW I521652 B TWI521652 B TW I521652B TW 102103131 A TW102103131 A TW 102103131A TW 102103131 A TW102103131 A TW 102103131A TW I521652 B TWI521652 B TW I521652B
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Taiwan
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mold
frame
resin
resin sealing
gap
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TW102103131A
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Chinese (zh)
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TW201344855A (en
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Toshihide Miyama
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Sumitomo Heavy Industries
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C43/00Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
    • B29C43/02Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles
    • B29C43/18Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles incorporating preformed parts or layers, e.g. compression moulding around inserts or for coating articles
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C43/00Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
    • B29C43/32Component parts, details or accessories; Auxiliary operations
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C43/00Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
    • B29C43/32Component parts, details or accessories; Auxiliary operations
    • B29C43/56Compression moulding under special conditions, e.g. vacuum
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
  • Casting Or Compression Moulding Of Plastics Or The Like (AREA)

Description

樹脂密封裝置及樹脂密封方法 Resin sealing device and resin sealing method

本發明係有關一種樹脂密封裝置及樹脂密封方法的技術領域。 The present invention relates to the technical field of a resin sealing device and a resin sealing method.

以往,如專利文獻1所示,提出有如下樹脂密封裝置,該樹脂密封裝置具有上模及能夠與該上模相對靠近或分離之下模,該下模具有:具備貫穿孔之框狀模具及嵌合於該貫穿孔而配置之成形模具之結構,並進行配置於形成在該上模與該下模之間之型腔之基板的樹脂密封。 Conventionally, as disclosed in Patent Document 1, there is proposed a resin sealing device having an upper mold and a mold which can be relatively close to or separated from the upper mold, and the lower mold has a frame mold having a through hole and The structure of the molding die that is fitted in the through hole is configured to seal the resin placed on the substrate formed between the upper mold and the lower mold.

(先前技術文獻) (previous technical literature) (專利文獻) (Patent Literature)

專利文獻1:日本特開2011-230423號公報 Patent Document 1: Japanese Laid-Open Patent Publication No. 2011-230423

如專利文獻1所示之樹脂密封裝置中,在與基板接觸之下模的部份(夾緊面)設置有用於在進行閉模 來夾緊基板時排出型腔內的氣體之槽(排氣槽)。藉由該排氣槽,在樹脂密封時與型腔內的空氣一同排出伴隨樹脂的熔融而產生之空氣或揮發成份等氣體,並防止被樹脂密封之基板(成形品)中產生空隙或樹脂的未填充等。 In the resin sealing device shown in Patent Document 1, a portion (clamping surface) of the mold is placed under contact with the substrate for performing mold closing The groove (exhaust groove) of the gas in the cavity is discharged when the substrate is clamped. By the venting groove, when the resin is sealed, air such as air or volatile components generated by melting of the resin is discharged together with the air in the cavity, and voids or resin are generated in the substrate (molded article) sealed by the resin. Not filled, etc.

但是,在被夾緊在下模之基板的表面上,先導銷用(基板定位用)的孔等的凹凸以每個基板不同之方式存在。若這種凹凸與設置於下模之排氣槽干擾,則有可能產生樹脂從在該處產生之間隙漏出之不良情況。因此,以往需對模具進行在確認基板的凹凸之基礎上定位排氣槽這種設計,模具的設計或製作上需要相應的時間。 However, on the surface of the substrate clamped to the lower mold, irregularities such as holes for the pilot pin (for substrate positioning) exist in a different manner for each substrate. If such unevenness interferes with the exhaust groove provided in the lower mold, there is a possibility that the resin leaks from the gap generated there. Therefore, in the past, it has been necessary to design a mold to align the vent groove on the basis of the unevenness of the substrate, and it takes a corresponding time to design or manufacture the mold.

因此,本發明係為了解決前述問題點而完成者,本發明的課題在於提供一種無需考慮每個被成形品的凹凸,而且還能夠避免成形品中產生空隙或未填充之樹脂密封裝置及樹脂密封方法。 Therefore, the present invention has been made in order to solve the above problems, and an object of the present invention is to provide a resin sealing device and a resin seal which can prevent voids or unfilled in a molded article without considering the unevenness of each molded article. method.

本發明係藉由如下方式解決上述課題者,一種樹脂密封裝置,其具有:第1模具;及第2模具,該第2模具能夠與該第1模具相對靠近或分離,且具有:具備貫穿孔之框狀模具和嵌合於該貫穿孔而配置之成形模具之結構;並且進行配置於在該第1模具與該第2膜具之間形成之型腔之被成形品的樹脂密封,其特 徵為:具備控制前述框狀模具在前述能夠靠近或分離之方向上之位置的移動控制機構,在前述成形模具與前述第1模具靠近期間,該框狀模具相對於該第1模具之位置藉由該移動控制機構來鎖定,且在該框狀模具與前述被成形品之間設置間隙來進行前述樹脂密封。 The present invention is directed to a resin sealing apparatus comprising: a first mold; and a second mold which is capable of being relatively close to or separated from the first mold and having a through hole a frame mold and a molding die that are fitted to the through hole, and a resin seal that is placed on a molded article formed between the first mold and the second film. And a movement control mechanism for controlling a position of the frame mold in a direction in which the frame mold can be approached or separated, wherein the frame mold is borrowed from a position of the first mold while the molding die is adjacent to the first mold The movement control mechanism locks, and a gap is provided between the frame mold and the molded article to perform the resin sealing.

以往,採用了即使閉模,型腔內外仍連通之排氣槽,但是本發明不限於所謂習知之閉模這種概念,而是在成形模具與第1模具靠近期間,藉由鎖定框狀模具相對第1模具之位置,在框狀模具與被成形品之間設置間隙。 Conventionally, an exhaust groove that communicates inside and outside the cavity even when the mold is closed has been used. However, the present invention is not limited to the concept of the conventional closed mold, but the frame mold is locked by the mold while being close to the first mold. A gap is provided between the frame-shaped mold and the molded article with respect to the position of the first mold.

另外,本發明還能夠理解為如下的樹脂密封方法,該方法是使用:第1模具;及第2模具,該第2模具能夠與該第1模具相對靠近或分離,具具有:具備貫穿孔之框狀模具和嵌合於該貫穿孔而配置之成形模具之結構;並且進行配置於在該第1模具與該第2膜具之間形成之型腔之被成形品的樹脂密封,其特徵為,包含:在前述成形模具與前述第1模具靠近期間,該框狀模具相對於該第1模具之位置藉由控制前述框狀模具在前述能夠靠近或分離之方向上之位置之移動控制機構來鎖定,且在該框狀模具與前述被成形品之間設置間隙之製程;及設置該間隙來進行前述樹脂密封之製程。 Further, the present invention can also be understood as a resin sealing method using a first mold and a second mold which can be relatively close to or separated from the first mold, and has a through hole. a frame mold and a structure of a molding die that is fitted to the through hole; and a resin seal that is disposed on a molded article formed in a cavity formed between the first mold and the second film, and is characterized in that The method of controlling the movement of the frame mold relative to the first mold by controlling a position of the frame mold in a direction in which the frame mold can be approached or separated is provided when the molding die is adjacent to the first mold. And a process of providing a gap between the frame mold and the molded article; and providing the gap to perform the resin sealing process.

依本發明,無需考慮每個被成形品的凹凸,而且還能夠避免成形品中產生空隙或未填充。 According to the present invention, it is not necessary to consider the unevenness of each molded article, and it is also possible to prevent voids or unfilling in the molded article.

100、300、400、500‧‧‧樹脂密封裝置 100, 300, 400, 500‧‧‧ resin sealing device

102、202、302、402、502‧‧‧基板 102, 202, 302, 402, 502‧‧‧ substrates

104、304、404、504‧‧‧半導體晶片 104, 304, 404, 504‧‧‧ semiconductor wafer

106、406、506‧‧‧樹脂 106, 406, 506‧‧‧ resin

107、207‧‧‧成形品 107, 207‧‧‧ molded products

108、208、308、408、508‧‧‧脫模膜 108, 208, 308, 408, 508‧‧‧ release film

110、310‧‧‧固定壓板 110, 310‧‧‧ fixed platen

112、312‧‧‧可動壓板 112, 312‧‧‧ movable platen

114、314‧‧‧模具 114, 314‧‧‧ mould

116‧‧‧減壓流路 116‧‧‧Decompression flow path

118‧‧‧基板吸附流路 118‧‧‧Substrate adsorption flow path

120、320‧‧‧上模 120, 320‧‧‧上模

122、222、422、522‧‧‧上壓縮模具 122, 222, 422, 522‧‧‧ upper compression mould

124、224、424、524‧‧‧上框模 124, 224, 424, 524‧‧‧ upper frame

126、136‧‧‧彈簧 126, 136‧ ‧ spring

128‧‧‧銷 128‧‧ ‧ sales

130、330‧‧‧下模 130, 330‧‧‧

132、232、332、432、532‧‧‧下壓縮模具 132, 232, 332, 432, 532‧‧‧ compression mold

134、234、334、434、534‧‧‧下框模 134, 234, 334, 434, 534‧‧‧ lower frame mode

135‧‧‧薄膜吸附流路 135‧‧‧film adsorption flow path

138、338、438、538‧‧‧移動控制機構 138, 338, 438, 538‧‧‧ mobile control agencies

第1圖係本發明的第1實施形態之樹脂密封裝置的一例之模式圖。 Fig. 1 is a schematic view showing an example of a resin sealing device according to a first embodiment of the present invention.

第2圖係基於相同樹脂密封裝置之樹脂密封的前半步驟的一例示圖。 Fig. 2 is a view showing an example of the first half of the resin sealing based on the same resin sealing device.

第3圖係上接第2圖之樹脂密封的後半步驟的一例示圖。 Fig. 3 is a view showing an example of the second half of the resin sealing of Fig. 2;

第4圖中(A)、(B)係第1實施形態中之基板與下框模之間的樣子之模式圖,及(C)係第2實施形態中之基板與下框模之間的樣子之模式圖。 (A) and (B) are schematic diagrams showing a state between a substrate and a lower frame mold in the first embodiment, and (C) is a relationship between the substrate and the lower frame mold in the second embodiment. The pattern of the pattern.

第5圖係本發明的第3實施形態之樹脂密封裝置的一例之模式圖。 Fig. 5 is a schematic view showing an example of a resin sealing device according to a third embodiment of the present invention.

第6圖係本發明的第4實施形態之樹脂密封裝置的一例之模式圖。 Fig. 6 is a schematic view showing an example of a resin sealing device according to a fourth embodiment of the present invention.

第7圖係本發明的第5實施形態之樹脂密封裝置的一例之模式圖。 Fig. 7 is a schematic view showing an example of a resin sealing device according to a fifth embodiment of the present invention.

以下,參閱附圖對本發明的第1實施形態的一例進行詳細說明。 Hereinafter, an example of the first embodiment of the present invention will be described in detail with reference to the drawings.

最初利用第1圖對本發明的實施形態之樹脂密封裝置的概略結構進行說明。 First, a schematic configuration of a resin sealing device according to an embodiment of the present invention will be described with reference to Fig. 1 .

樹脂密封裝置100為樹脂106直接配置於型腔之壓縮成形型,如第1圖所示,其具有上模120(第1模具)和能夠與上模120相對靠近或分離之下模130(第2模具)(另外,由上模120和下模130構成模具114)。其下模130是具有:具備貫穿孔134B之下框模134(框狀模具)和嵌合於貫穿孔134B而配置之下壓縮模具132(成形模具)之結構。並且,樹脂密封裝置100進行配置於在上模120與下模130之間形成之型腔之基板102(被成形品)的樹脂密封。在此,樹脂密封裝置100具備控制下框模134在Z方向(能夠靠近或分離之方向)上之位置之移動控制機構138。並且,在下壓縮模具132和上模120靠近期間,下框模134相對上模120之位置藉由移動控制機構138鎖定,且在下框模134與基板102之間設置間隙Gp來進行樹脂密封。另外,嚴格來講,間隙Gp能夠在脫模膜108的上面與基板102的下面之間形成,但是本實施形態中將脫模膜108的厚度當作零。 The resin sealing device 100 is a compression molding type in which the resin 106 is directly disposed in a cavity. As shown in Fig. 1, it has an upper die 120 (first die) and can be relatively close to or separated from the upper die 120 (first) 2 mold) (In addition, the mold 114 is composed of the upper mold 120 and the lower mold 130). The lower mold 130 has a structure in which a frame mold 134 (frame mold) having a through hole 134B and a compression mold 132 (forming mold) disposed to be fitted to the through hole 134B. Further, the resin sealing device 100 performs resin sealing of the substrate 102 (formed product) disposed in the cavity formed between the upper mold 120 and the lower mold 130. Here, the resin sealing device 100 is provided with a movement control mechanism 138 that controls the position of the lower frame mold 134 in the Z direction (a direction in which it can approach or separate). Further, during the approach of the lower compression mold 132 and the upper mold 120, the position of the lower frame mold 134 with respect to the upper mold 120 is locked by the movement control mechanism 138, and a gap Gp is provided between the lower frame mold 134 and the substrate 102 to perform resin sealing. Further, strictly speaking, the gap Gp can be formed between the upper surface of the release film 108 and the lower surface of the substrate 102. However, in the present embodiment, the thickness of the release film 108 is regarded as zero.

另外,基板102係作為支撐PCB基板或引線框架這種半導體晶片者的代表例來表示。本實施形態中,作為被成形品是示出基板102,但是半導體晶片104或連接基板102與半導體晶片104之接合線等亦包含在被成形品中。並且,樹脂106表示熱硬化性樹 脂,本實施形態中設為預先成形之平板形狀(固體),但亦可為粉狀、粒狀、或液狀。並且,脫模膜108伸縮自如,即使受到加熱,從下模130及樹脂密封後的基板102(成形品107)的剝離性亦良好。另外,脫模膜為連續供給之形態,但是亦可設為長條狀,亦可無脫模膜。 Further, the substrate 102 is represented as a representative example of a semiconductor wafer such as a support PCB substrate or a lead frame. In the present embodiment, the substrate 102 is shown as a molded article, but a bonding wire or the like of the semiconductor wafer 104 or the connection substrate 102 and the semiconductor wafer 104 is also included in the molded article. Also, the resin 106 represents a thermosetting tree In the present embodiment, the fat is a flat plate shape (solid) formed in advance, but may be in the form of powder, granules, or liquid. Further, the release film 108 is stretchable and contractible, and the peeling property from the lower mold 130 and the resin-sealed substrate 102 (molded article 107) is good even when heated. Further, the release film is in a form of continuous supply, but may be in the form of a strip or a release film.

以下,對構成要件進行具體說明。 Hereinafter, the constituent elements will be specifically described.

如第1圖所示,模具114中的上模120具備上壓縮模具122和上框模124。上壓縮模具122安裝在固定壓板110而固定。在上壓縮模具122的內部設置減壓流路116,與設置在上壓縮模具122的下模側表面之減壓口116A連通。在減壓流路116上連接有未圖示之減壓機構。因此,能夠對型腔內部進行減壓而成為真空狀態。並且,在上壓縮模具122的內部設置基板吸附流路118,與設置在上壓縮模具122的下模側表面之基板吸附口118A連通。在基板吸附流路118上連接有未圖示之吸引機構。因此,能夠將基板102吸附或保持在上壓縮模具122的下模側表面。 As shown in Fig. 1, the upper mold 120 in the mold 114 is provided with an upper compression mold 122 and an upper frame mold 124. The upper compression mold 122 is attached to the fixed platen 110 and fixed. A pressure reducing flow path 116 is provided inside the upper compression mold 122, and communicates with a pressure reducing port 116A provided on the lower mold side surface of the upper compression mold 122. A pressure reducing mechanism (not shown) is connected to the pressure reducing flow path 116. Therefore, the inside of the cavity can be depressurized to be in a vacuum state. Further, a substrate adsorption flow path 118 is provided inside the upper compression mold 122, and communicates with the substrate adsorption port 118A provided on the lower mold side surface of the upper compression mold 122. A suction mechanism (not shown) is connected to the substrate adsorption flow path 118. Therefore, the substrate 102 can be adsorbed or held on the lower mold side surface of the upper compression mold 122.

如第1圖所示,上框模124具備貫穿孔124B,上壓縮模具122嵌合於該貫穿孔124B而配置。亦即,上框模124為圍繞上壓縮模具122的外周之框形狀,經由彈簧126安裝於上壓縮模具122。另外,彈簧126使上框模124朝Z方向下側施力。因此,上框模124能夠相對於上壓縮模具122以Z方向相對移 動。在上框模124之與下模130相對向之面上設置有密封構件124A(O形環等)。另外,在上壓縮模具122與上框模124的滑動面上亦設置有未圖示之密封構件。並且,基板吸附口118A與減壓口116A之間,亦即在保持基板102之區域的外側位置設置有複數個能夠朝Z方向下側移動之銷128。銷128藉由未圖示之彈簧朝Z方向下側施力。 As shown in FIG. 1, the upper frame mold 124 is provided with a through hole 124B, and the upper compression mold 122 is fitted to the through hole 124B. That is, the upper frame mold 124 is in a frame shape surrounding the outer circumference of the upper compression mold 122, and is attached to the upper compression mold 122 via the spring 126. Further, the spring 126 urges the upper frame mold 124 toward the lower side in the Z direction. Therefore, the upper frame mold 124 can be moved relative to the upper compression mold 122 in the Z direction. move. A sealing member 124A (O-ring or the like) is provided on a surface of the upper frame mold 124 opposite to the lower mold 130. Further, a sealing member (not shown) is also provided on the sliding surface of the upper compression mold 122 and the upper frame mold 124. Further, a plurality of pins 128 that are movable toward the lower side in the Z direction are provided between the substrate suction port 118A and the pressure reducing port 116A, that is, at positions outside the region where the substrate 102 is held. The pin 128 is biased toward the lower side in the Z direction by a spring (not shown).

另外,本實施形態中,上模120具備上壓縮模具122和上框模124,但是這些並非必須結構,可設為一體。並且亦可無銷128。另外,亦可無密封構件124A或減壓流路116等。 Further, in the present embodiment, the upper mold 120 includes the upper compression mold 122 and the upper frame mold 124. However, these are not essential structures and may be integrated. And there is no sales 128. Further, there is no sealing member 124A, pressure reducing flow path 116, or the like.

如第1圖所示,下模130具備下壓縮模具132和下框模134。下壓縮模具132安裝於藉由未圖示之驅動機構上下移動之可動壓板112。因此,下模130能夠在Z方向上相對於上模120相對靠近或分離(另外,亦可以下模安裝於固定壓板,上模安裝於可動壓板)。在下框模134的內部設置薄膜吸附流路135,與設置在下壓縮模具132與下框模134之間之間隙連通。在薄膜吸附流路135上連接有未圖示之薄膜吸引機構。因此,能夠將脫模膜108吸附或保持在下模130的表面(另外,可無脫模膜,亦可為基板吸附於下模且脫模膜吸附於上模之形態)。 As shown in FIG. 1, the lower mold 130 is provided with a lower compression mold 132 and a lower frame mold 134. The lower compression mold 132 is attached to a movable platen 112 that is moved up and down by a drive mechanism (not shown). Therefore, the lower mold 130 can be relatively close to or separated from the upper mold 120 in the Z direction (in addition, the lower mold can be attached to the fixed pressure plate, and the upper mold can be attached to the movable pressure plate). A film adsorption flow path 135 is provided inside the lower frame mold 134 to communicate with a gap provided between the lower compression mold 132 and the lower frame mold 134. A film suction mechanism (not shown) is connected to the film adsorption flow path 135. Therefore, the release film 108 can be adsorbed or held on the surface of the lower mold 130 (in addition, the release film can be removed, or the substrate can be adsorbed to the lower mold and the release film can be adsorbed to the upper mold).

如第1圖所示,在下框模134的上模側表面與銷128的位置對應地設置有凹部134A。藉由將銷128 對應下框模134的位置插入於下框模134的凹部134A來固定脫模膜108,使脫模膜108的伸縮變形量形成最小。下框模134具備貫穿孔134B,下壓縮模具132嵌合於該貫穿孔134B而配置。亦即,下框模134為圍繞下壓縮模具132的外周之框形狀,經由彈簧136安裝於下壓縮模具132。另外,彈簧136使下框模134朝Z方向上側施力(彈簧136設成比彈簧126或用於銷128之彈簧更強力)。因此,下框模134能夠相對於下壓縮模具132以Z方向相對移動。當上模120與下模130靠近時,下框模134能夠經由脫模膜108與上框模124抵接。 As shown in Fig. 1, a concave portion 134A is provided on the upper mold side surface of the lower frame mold 134 corresponding to the position of the pin 128. By placing pin 128 The position corresponding to the lower frame mold 134 is inserted into the concave portion 134A of the lower frame mold 134 to fix the release film 108, and the amount of expansion and contraction of the release film 108 is minimized. The lower frame mold 134 includes a through hole 134B, and the lower compression mold 132 is fitted to the through hole 134B. That is, the lower frame mold 134 is in a frame shape surrounding the outer circumference of the lower compression mold 132, and is attached to the lower compression mold 132 via the spring 136. In addition, the spring 136 urges the lower frame mold 134 toward the upper side in the Z direction (the spring 136 is set to be stronger than the spring 126 or the spring for the pin 128). Therefore, the lower frame mold 134 can relatively move in the Z direction with respect to the lower compression mold 132. When the upper mold 120 approaches the lower mold 130, the lower frame mold 134 can abut against the upper frame mold 124 via the release film 108.

如第1圖所示,移動控制機構138抵接於一體設置在下模130的外周之端部134B而配置。移動控制機構138具備鉤部138A和支撐部138B,其中前述鉤部用於從上方抑制欲藉由彈簧136的力朝Z方向上側移動之下框模134,前述支撐部連接於鉤部138A且能夠相對於可動壓板112自如地控制鉤部138A在Z方向之位置。亦即,移動控制機構138與可動壓板112一同上下移動,但能夠藉由鉤部138A自如地控制下框模134的位置。 As shown in FIG. 1, the movement control mechanism 138 is placed in contact with the end portion 134B integrally provided on the outer circumference of the lower mold 130. The movement control mechanism 138 includes a hook portion 138A for restraining the frame mold 134 to be moved toward the upper side in the Z direction by the force of the spring 136, and a support portion 138B which is connected to the hook portion 138A and capable of being attached from above. The position of the hook portion 138A in the Z direction is freely controlled with respect to the movable platen 112. That is, the movement control mechanism 138 moves up and down together with the movable platen 112, but the position of the lower frame mold 134 can be freely controlled by the hook portion 138A.

另外,第1圖中雖未圖示,但是在上模120和下模130上埋入有複數個加熱器。藉由該加熱器,模具114被加熱至用於樹脂密封的預定溫度(例如175度)。 Further, although not shown in the first drawing, a plurality of heaters are embedded in the upper mold 120 and the lower mold 130. With the heater, the mold 114 is heated to a predetermined temperature (for example, 175 degrees) for resin sealing.

樹脂密封裝置100的一連串動作由未圖示之處理裝置(控制手段)規定,模具114或移動控制機構138等的動作受到自動控制。 The series of operations of the resin sealing device 100 are defined by a processing device (control means) not shown, and the operations of the mold 114, the movement control mechanism 138, and the like are automatically controlled.

接著,利用第2圖~第3圖對樹脂密封裝置100的動作進行說明。另外,以一點鏈線表示之位置WP表示成為所移動之下模130的基準之初始位置(待機位置)。 Next, the operation of the resin sealing device 100 will be described with reference to FIGS. 2 to 3 . Further, the position WP indicated by a one-dot chain line indicates the initial position (standby position) which is the reference of the moving lower mold 130.

首先,在上模120和下模130分離之狀態下,基板102藉由未圖示之輸送機構輸送至上壓縮模具122的附近。此時,未圖示之吸引機構動作(空心箭頭),基板102藉由經由基板吸附流路118產生於基板吸附口118A之負壓,被吸附或固定於上壓縮模具122。並且,脫模膜108配置於下模130上。並且,未圖示之薄膜吸引機構動作(空心箭頭),脫模膜108藉由經由薄膜吸附流路135所產生之負壓,被吸附或固定於下模130(第2圖(A))。此時,下框模134的上面與下壓縮模具132的上面的位置藉由移動控制機構138成為相同。另外,模具114被加熱至樹脂密封時的恆定溫度(例如175度)。 First, in a state in which the upper mold 120 and the lower mold 130 are separated, the substrate 102 is transported to the vicinity of the upper compression mold 122 by a transport mechanism (not shown). At this time, the suction mechanism (not shown) operates (open arrow), and the substrate 102 is adsorbed or fixed to the upper compression mold 122 by the negative pressure generated in the substrate adsorption port 118A via the substrate adsorption flow path 118. Further, the release film 108 is disposed on the lower mold 130. Further, the film suction mechanism (not shown) operates (open arrow), and the release film 108 is adsorbed or fixed to the lower mold 130 by the negative pressure generated by the film adsorption flow path 135 (Fig. 2(A)). At this time, the upper surface of the lower frame mold 134 and the upper surface of the lower compression mold 132 are the same by the movement control mechanism 138. In addition, the mold 114 is heated to a constant temperature (for example, 175 degrees) at the time of resin sealing.

接著,樹脂106藉由未圖示之樹脂輸送機構配置於脫模膜108上的預定位置(第2圖(B))。 Next, the resin 106 is placed on a predetermined position on the release film 108 by a resin transfer mechanism (not shown) (Fig. 2(B)).

接著,使可動壓板112向上方移動而使下模130靠近上模120。藉此,從上壓縮模具122突出之銷128與脫模膜108一同插入於設置在下框模134之凹 部134A,脫模膜108被夾緊。接著,上框模124的密封構件124A抵接於下框模134上的脫模膜108,藉由上模120和下模130構成密封狀態。在該階段中暫時停止可動壓板112的上昇,使未圖示之減壓機構相對於模具114動作(黑色箭頭),經由減壓流路116從減壓口116A開始減壓動作(第2圖(C))。另外,在該時刻,下模130上樹脂106不與吸附於上模120之基板102接觸。 Next, the movable platen 112 is moved upward to bring the lower mold 130 closer to the upper mold 120. Thereby, the pin 128 protruding from the upper compression mold 122 is inserted into the concave portion provided in the lower frame mold 134 together with the release film 108. The portion 134A, the release film 108 is clamped. Next, the sealing member 124A of the upper frame mold 124 abuts against the release film 108 on the lower frame mold 134, and the upper mold 120 and the lower mold 130 constitute a sealed state. At this stage, the rise of the movable platen 112 is temporarily stopped, and the pressure reducing mechanism (not shown) is operated with respect to the mold 114 (black arrow), and the pressure reducing operation is started from the pressure reducing port 116A via the pressure reducing flow path 116 (Fig. 2 (Fig. 2 ( C)). Further, at this time, the resin 106 on the lower mold 130 is not in contact with the substrate 102 adsorbed to the upper mold 120.

接著,使可動壓板112再次向上方移動,使樹脂106與接合線或者使樹脂106與半導體晶片104接觸(第2圖(D))。在該階段中再次停止可動壓板112的上昇。直到該時刻為止,下框模134的上面與下壓縮模具132的上面的位置藉由移動控制機構138成為相同。 Next, the movable platen 112 is moved upward again to bring the resin 106 into contact with the bonding wire or the resin 106 and the semiconductor wafer 104 (Fig. 2(D)). The rise of the movable platen 112 is stopped again in this stage. Up to this point, the upper surface of the lower frame mold 134 and the upper surface of the lower compression mold 132 are the same by the movement control mechanism 138.

接著,藉由移動控制機構138開始下框模134相對於下壓縮模具132的上昇。並且,使下框模134移動直到下框模134與基板102之間成為間隙Gp之位置為止,藉由移動控制機構138使下框模134的位置停止(第3圖(A))、第4圖(A))。本實施形態中,間隙Gp設為氣體可洩漏之程度的厚度,同時為不會產生樹脂的洩漏之程度的厚度(寬度),具體而言,藉由型腔的形狀或體積或施加於樹脂之壓力等完成間隙Gp的最佳化。 Next, the rise of the lower frame mold 134 with respect to the lower compression mold 132 is started by the movement control mechanism 138. Then, the lower frame mold 134 is moved until the position between the lower frame mold 134 and the substrate 102 becomes the gap Gp, and the position of the lower frame mold 134 is stopped by the movement control unit 138 (Fig. 3(A)) and 4 Figure (A)). In the present embodiment, the gap Gp is a thickness to which the gas can be leaked, and is a thickness (width) which does not cause leakage of the resin, specifically, a shape or a volume of the cavity or application to the resin. The pressure or the like completes the optimization of the gap Gp.

接著,使可動壓板112再次向上方移動。並且, 下壓縮模具132上昇來壓縮樹脂106。此時,藉由下框模134的移動相對吸附或保持於上模120之基板102保持恆定間隙Gp。亦即,移動控制機構138使下框模134朝向與可動壓板112的移動的相反方向移動,相對於下壓縮模具132壓低下框模134。亦即,在下壓縮模具132與上模120靠近期間,下框模134相對於上模120之位置藉由移動控制機構138(結果上)鎖定,在下框模134與基板102之間設置(恆定)間隙Gp。並且,即使壓縮壓力(基於樹脂之壓力)上昇之後,該間隙Gp亦藉由移動控制機構138的動作得以保持。在壓縮壓力成為預定壓力(用於形成良品之成形品107之壓力)之階段中,停止可動壓板112的移動,保持其壓縮壓力(第1圖、第3圖(B)、第4圖(B)的保壓狀態)。保壓狀態的壓縮壓力是以在熟化(固化)時,在成形品107不產生“縮痕(基於樹脂的固化收縮之成形異常)或空隙、未填充”之方式規定。並且,直到保壓狀態結束為止,保持恆定間隙Gp。亦即,在基於移動控制機構138之下框模134之位置的鎖定持續而設置間隙Gp之狀態下,完成樹脂密封。 Next, the movable platen 112 is moved upward again. and, The lower compression mold 132 is raised to compress the resin 106. At this time, the substrate 102 which is adsorbed or held by the upper mold 120 by the movement of the lower frame mold 134 maintains a constant gap Gp. That is, the movement control mechanism 138 moves the lower frame mold 134 in the opposite direction to the movement of the movable platen 112, and lowers the lower frame mold 134 with respect to the lower compression mold 132. That is, during the approach of the lower compression mold 132 and the upper mold 120, the position of the lower frame mold 134 relative to the upper mold 120 is locked (resultably) by the movement control mechanism 138, and is set between the lower frame mold 134 and the substrate 102 (constant). Clearance Gp. Further, even after the compression pressure (based on the pressure of the resin) rises, the gap Gp is maintained by the movement of the movement control mechanism 138. In the stage where the compression pressure becomes a predetermined pressure (pressure for forming a good molded article 107), the movement of the movable platen 112 is stopped, and the compression pressure is maintained (Fig. 1, Fig. 3(B), Fig. 4(B). ) the pressure holding state). The compression pressure in the pressure-retaining state is defined so that the molded article 107 does not cause "shrink marks (formation abnormality due to curing shrinkage of the resin) or voids or unfilled" during the aging (curing). And, until the pressure holding state ends, the constant gap Gp is maintained. That is, the resin sealing is completed in a state where the gap Gp is set based on the locking of the position of the frame mold 134 below the movement control mechanism 138.

接著,經過用於熟化之時間之後,使可動壓板112向下方移動而使上模120和下模130分離(第3圖(C))。此時,為了使減壓流路116洩漏,並且使基板102從上模120順利脫離,將基板吸附流路 118的負壓變更為正壓、亦即鼓風(空心箭頭)。並且,使成形品107殘留於下模側。 Next, after the aging time is passed, the movable platen 112 is moved downward to separate the upper mold 120 from the lower mold 130 (Fig. 3(C)). At this time, in order to leak the pressure reducing flow path 116 and smoothly detach the substrate 102 from the upper mold 120, the substrate adsorption flow path is adopted. The negative pressure of 118 is changed to positive pressure, that is, blast (open arrow). Further, the molded article 107 is left on the lower mold side.

接著,使可動壓板112進一步向下方移動,並使上模120和下模130完全分離,使下框模134的上面的位置返回到待機位置WP(第3圖(D))。之後,使可動壓板112與移動控制機構138動作,以使下框模134的表面與下壓縮模具132的表面形成與待機位置WP相同,藉由未圖示之輸送裝置從脫模膜108卸下成形品107。 Next, the movable platen 112 is further moved downward, and the upper mold 120 and the lower mold 130 are completely separated, and the upper position of the lower frame mold 134 is returned to the standby position WP (Fig. 3(D)). Thereafter, the movable platen 112 and the movement control mechanism 138 are operated such that the surface of the lower frame mold 134 and the surface of the lower compression mold 132 are formed in the same manner as the standby position WP, and are removed from the release film 108 by a conveying device (not shown). Molded product 107.

如此,本實施形態中,不限於所謂習知之閉模這種概念,而是在下壓縮模具132與上模120靠近期間,藉由鎖定下框模134相對於上模120之位置而在下框模134與基板102之間設置間隙Gp。因此,能夠在鎖定下框模134相對於上模120之位置期間之恆定期間,不變更其厚度(寬度)就能夠確保用於排出型腔內的氣體之間隙Gp,能夠無需設置習知之排氣槽(當然,亦可設置排氣槽)。並且,在該一定期間內厚度(寬度)不變之間隙Gp遍及基板102的外周而設置,所以不會如排氣槽那樣局部地排出空氣,而能夠從全周排出型腔內的氣體。因此,與利用習知之排氣槽相比能夠進一步降低成形品107之空隙或未填充。同時,能夠使該間隙Gp的厚度比習知之排氣槽的厚度更薄,所以與習知之排氣槽相比能夠更降低樹脂洩漏的可能性。 As described above, the present embodiment is not limited to the so-called closed mold concept, but the lower frame mold 134 is locked by locking the position of the lower frame mold 134 with respect to the upper mold 120 while the lower compression mold 132 is close to the upper mold 120. A gap Gp is provided between the substrate 102 and the substrate 102. Therefore, it is possible to ensure the gap Gp for discharging the gas in the cavity without changing the thickness (width) while locking the position of the lower frame mold 134 with respect to the upper mold 120, and it is possible to eliminate the need to provide a conventional exhaust gas. Slot (of course, a venting groove can also be provided). Further, since the gap Gp in which the thickness (width) does not change during the predetermined period is provided over the outer circumference of the substrate 102, the air in the cavity can be discharged from the entire circumference without partially discharging the air as in the exhaust groove. Therefore, the void or unfilling of the molded article 107 can be further reduced as compared with the conventional exhaust groove. At the same time, the thickness of the gap Gp can be made thinner than the thickness of the conventional exhaust groove, so that the possibility of resin leakage can be further reduced as compared with the conventional exhaust groove.

並且,本實施形態中,在基於移動控制機構138之下框模134之位置的鎖定持續而設置間隙Gp之狀態下,完成樹脂密封。因此,能夠進一步降低成形品107之空隙或未填充。 Further, in the present embodiment, the resin sealing is completed in a state where the gap Gp is provided by the locking of the position of the frame mold 134 below the movement control mechanism 138. Therefore, the void or unfilled of the molded article 107 can be further reduced.

亦即,依本實施形態,無需考慮每個基板102的凹凸,而且還能夠避免成形品107中產生空隙或未填充。 That is, according to the present embodiment, it is not necessary to consider the unevenness of each of the substrates 102, and it is also possible to avoid occurrence of voids or unfilling in the molded article 107.

另外,可以如第4圖(C)所示之第2實施形態,而不是如第1實施形態在設置間隙Gp之狀態下完成樹脂密封。第2實施形態是在解除基於移動控制機構之下框型234之位置的鎖定而消除間隙Gp之狀態下,完成樹脂密封。此時,例如在壓縮壓力上昇之時間點,使下框模234移動而消除間隙Gp。該時間點可監控壓縮壓力並將其作為觸發,亦可監控可動壓板的位置並將其作為觸發。因此,比起第1實施形態,能夠進一步降低樹脂洩漏的可能性。另外,第2實施形態的樹脂密封裝置的結構或功能與第1實施形態相同,所以將符號的後兩位數設為相同,省略上述以外的說明。 Further, as in the second embodiment shown in Fig. 4(C), the resin sealing can be completed in a state where the gap Gp is provided as in the first embodiment. In the second embodiment, the resin sealing is completed in a state where the lock of the frame type 234 under the movement control means is released and the gap Gp is eliminated. At this time, for example, at the time when the compression pressure rises, the lower frame mold 234 is moved to eliminate the gap Gp. At this point in time, the compression pressure can be monitored and used as a trigger, and the position of the movable platen can be monitored and used as a trigger. Therefore, compared with the first embodiment, the possibility of resin leakage can be further reduced. In addition, since the configuration and function of the resin sealing device of the second embodiment are the same as those of the first embodiment, the latter two digits of the reference numerals are the same, and the descriptions other than the above are omitted.

另外,第2實施形態是一口氣消除間隙Gp,但是亦可階段性(包含連續地或非連續地)縮小而消除間隙Gp,亦可僅縮小間隙Gp。並且,將間隙Gp設為即使產生樹脂的洩漏亦可之程度的厚度,當壓縮壓力上昇時,亦可設為不產生樹脂的洩漏之程度的厚 度。 Further, the second embodiment is a one-tone elimination gap Gp, but may be reduced in a stepwise manner (including continuously or discontinuously) to eliminate the gap Gp, or may only narrow the gap Gp. Further, the gap Gp is set to a thickness that is likely to cause leakage of the resin, and when the compression pressure is increased, it may be set to a thickness that does not cause leakage of the resin. degree.

並且,可如第5圖所示之第3實施形態,而不是如上述實施形態由移動控制機構直接自如地控制下框模。第3實施形態中,移動控制機構338具有制動部338A和支撐部338B。制動部338A為能夠朝X方向移動之構件,能夠插入在上模320與下模330的下框模334之間。制動部338A是被設為在插入於上模320和下框模334之間時,能夠在吸附於上模320之基板302與下框模334之間構成間隙Gp之厚度(亦可制動部的厚度與間隙Gp的厚度相同,制動部能夠插入在基板與下框模之間)。支撐部338B安裝於固定壓板310,能夠使制動部338A朝X方向驅動。並且,支撐部338B能夠調整制動部338A在Z方向之位置。另外,上模320為一體結構,但是亦可為與第1、第2實施形態相同的結構。並且,簡略表示下模330,但是亦可為與第1、第2實施形態相同的結構。 Further, as in the third embodiment shown in Fig. 5, the lower frame mold can be directly and freely controlled by the movement control means as in the above embodiment. In the third embodiment, the movement control mechanism 338 has a braking portion 338A and a supporting portion 338B. The braking portion 338A is a member that can move in the X direction, and can be inserted between the upper mold 320 and the lower frame mold 334 of the lower mold 330. When the brake portion 338A is inserted between the upper mold 320 and the lower frame mold 334, the thickness of the gap Gp can be formed between the substrate 302 and the lower frame mold 334 adsorbed to the upper mold 320 (the brake portion can also be used). The thickness is the same as the thickness of the gap Gp, and the braking portion can be inserted between the substrate and the lower frame mold). The support portion 338B is attached to the fixed platen 310, and the brake portion 338A can be driven in the X direction. Further, the support portion 338B can adjust the position of the braking portion 338A in the Z direction. Further, the upper mold 320 has an integral structure, but may have the same configuration as that of the first and second embodiments. Further, although the lower mold 330 is schematically shown, it may have the same configuration as that of the first and second embodiments.

當進行樹脂密封時,制動部338A抵接於上模320的下面而配置。並且,正當下壓縮模具332伴隨可動壓板312的上昇而靠近上模320時,藉由制動部338A限制下框模334的上昇,鎖定下框模334相對於上模320之位置且在下框模334與基板302之間設置間隙Gp。在壓縮壓力上昇之時間點將制動部338A從上模320與下框模334之間拔出,消除間隙Gp而 由下框模334夾緊基板302(亦可在設置間隙Gp之狀態下完成樹脂密封)。另外,為了取得壓縮壓力上昇之時間點,能夠與第2實施形態相同地觸發壓力或位置。並且,將基板302樹脂密封。另外,移動控制機構亦可為不具有制動部,而是支撐部位於與下框模相對向之位置,並直接控制下框模的位置之結構。亦即,支撐部亦可具有制動部的功能。此時,亦可從設置間隙Gp時起固定間隙,亦可為藉由支撐部朝Z方向移動而變更間隙Gp之結構(第6圖的第4實施形態的移動控制機構438相當於該支撐部)。或者,亦可以如第7圖的第5實施形態,在上壓縮模具522與下框模534之間配置移動控制機構538,固定地設置間隙Gp。 When the resin sealing is performed, the braking portion 338A is placed in contact with the lower surface of the upper mold 320. Further, when the lower compression mold 332 approaches the upper mold 320 with the rise of the movable platen 312, the rising of the lower frame mold 334 is restricted by the braking portion 338A, and the position of the lower frame mold 334 with respect to the upper mold 320 is locked and the lower frame mold 334 is locked. A gap Gp is provided between the substrate 302 and the substrate 302. When the compression pressure rises, the braking portion 338A is pulled out from between the upper mold 320 and the lower frame mold 334, and the gap Gp is eliminated. The substrate 302 is clamped by the lower frame mold 334 (the resin sealing can also be completed in a state where the gap Gp is set). Further, in order to obtain the time point at which the compression pressure rises, the pressure or the position can be triggered in the same manner as in the second embodiment. Further, the substrate 302 is resin-sealed. Further, the movement control mechanism may have a structure in which the support portion is located at a position opposed to the lower frame mold and the position of the lower frame mold is directly controlled without the brake portion. That is, the support portion may also have the function of a braking portion. In this case, the gap may be fixed from the time when the gap Gp is provided, or the gap Gp may be changed by the movement of the support portion in the Z direction (the movement control mechanism 438 according to the fourth embodiment of Fig. 6 corresponds to the support portion). ). Alternatively, as in the fifth embodiment of Fig. 7, the movement control mechanism 538 may be disposed between the upper compression mold 522 and the lower frame mold 534, and the gap Gp may be fixedly provided.

關於本發明舉出上述實施形態進行了說明,但是本發明並不限定於上述實施形態。亦即,當然可在不脫離本發明的宗旨之範圍內進行改良以及設計的變更。 Although the above embodiment has been described in the present invention, the present invention is not limited to the above embodiment. That is, modifications and design changes may be made without departing from the spirit and scope of the invention.

〔產業上的可利用性〕 [Industrial Availability]

本發明的樹脂密封裝置尤其能夠廣泛應用於直接將樹脂配置於型腔之壓縮成形模中。 The resin sealing device of the present invention can be widely applied to a compression molding die in which a resin is directly disposed in a cavity.

100‧‧‧樹脂密封裝置 100‧‧‧Resin sealing device

116‧‧‧減壓流路 116‧‧‧Decompression flow path

118‧‧‧基板吸附流路 118‧‧‧Substrate adsorption flow path

124B‧‧‧貫穿孔 124B‧‧‧through hole

126‧‧‧彈簧 126‧‧ ‧ spring

128‧‧‧銷 128‧‧ ‧ sales

104‧‧‧半導體晶片 104‧‧‧Semiconductor wafer

Gp‧‧‧間隙 Gp‧‧‧ gap

124A‧‧‧密封構件 124A‧‧‧ Sealing member

116A‧‧‧減壓口 116A‧‧‧Decompression port

118A‧‧‧基板吸附口 118A‧‧‧Substrate adsorption port

134A‧‧‧凹部 134A‧‧‧ recess

135‧‧‧薄膜吸附流路 135‧‧‧film adsorption flow path

136‧‧‧彈簧 136‧‧ ‧ spring

134B‧‧‧貫穿孔 134B‧‧‧through hole

138B‧‧‧支撐部 138B‧‧‧Support

110‧‧‧固定壓板 110‧‧‧Fixed platen

114‧‧‧模具 114‧‧‧Mold

108‧‧‧脫模膜 108‧‧‧ release film

122‧‧‧上壓縮模具 122‧‧‧Upper compression mould

102‧‧‧基板 102‧‧‧Substrate

120‧‧‧上模 120‧‧‧上模

124‧‧‧上框模 124‧‧‧Upper frame

138‧‧‧移動控制機構 138‧‧‧Mobile Control Agency

132‧‧‧下壓縮模具 132‧‧‧ Lower compression mould

134‧‧‧下框模 134‧‧‧Bottom mode

130‧‧‧下模 130‧‧‧下模

112‧‧‧可動壓板 112‧‧‧ movable platen

138A‧‧‧鉤部 138A‧‧‧ hook

Claims (2)

一種樹脂密封裝置,其具有:第1模具;及第2模具,該第2模具能夠與該第1模具相對靠近或分離,且具有:具備貫穿孔之框狀模具和嵌合於該貫穿孔而配置之成形模具之結構;並且進行配置於在該第1模具與該第2模具之間形成之型腔之被成形品的樹脂密封,其特徵為:具備控制前述框狀模具在前述能夠靠近或分離之方向上之位置的移動控制機構,在前述成形模具與前述第1模具靠近期間,該框狀模具相對於該第1模具之位置藉由該移動控制機構來鎖定,且在該框狀模具與前述被成形品之間設置間隙,在解除基於前述移動控制機構之前述框狀模具位置的鎖定且消除該間隙之狀態下,完成前述樹脂密封。 A resin sealing device comprising: a first mold; and a second mold that is capable of being relatively close to or separated from the first mold, and having a frame-shaped mold having a through hole and being fitted into the through hole a structure of the molding die disposed; and a resin sealing of the molded article disposed in a cavity formed between the first die and the second die, wherein the frame mold is controlled to be close to or a movement control mechanism at a position in the direction of separation, wherein the position of the frame mold relative to the first mold is locked by the movement control mechanism while the molding die is adjacent to the first mold, and the frame mold is A gap is provided between the molded article and the resin is sealed by releasing the lock based on the position of the frame mold of the movement control mechanism and eliminating the gap. 一種樹脂密封方法,是使用:第1模具;及第2模具,該第2模具能夠與該第1模具相對靠近或分離,且具有:具備貫穿孔之框狀模具和嵌合於該貫穿孔而配置之成形模具之結構;並且進行配置於在該第1模具與該第2模具之間形成之型腔之被成形品的樹脂密封,其特徵為:包含:在前述成形模具與前述第1模具靠近期間,該框狀模具相對於該第1模具之位置藉由控制前述框狀模 具在前述能夠靠近或分離之方向上之位置之移動控制機構來鎖定,且在該框狀模具與前述被成形品之間設置間隙之製程;及在解除基於前述移動控制機構之前述框狀模具位置的鎖定且消除該間隙之狀態下,完成前述樹脂密封之製程。 A resin sealing method using: a first mold; and a second mold that is capable of being relatively close to or separated from the first mold, and having a frame-shaped mold having a through hole and being fitted into the through hole And a resin seal of the molded article disposed in a cavity formed between the first die and the second die, and comprising: the molding die and the first die During the approach, the position of the frame mold relative to the first mold is controlled by the frame mold a process of locking with a movement control mechanism at a position in the direction that can be approached or separated, and providing a gap between the frame mold and the molded article; and releasing the frame mold based on the movement control mechanism The process of sealing the foregoing resin is completed in a state where the position is locked and the gap is eliminated.
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