TWI502693B - 封裝式鏡片組 - Google Patents
封裝式鏡片組 Download PDFInfo
- Publication number
- TWI502693B TWI502693B TW097144531A TW97144531A TWI502693B TW I502693 B TWI502693 B TW I502693B TW 097144531 A TW097144531 A TW 097144531A TW 97144531 A TW97144531 A TW 97144531A TW I502693 B TWI502693 B TW I502693B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- optical
- transparent
- spacer
- substrates
- Prior art date
Links
- 239000000758 substrate Substances 0.000 claims description 237
- 230000003287 optical effect Effects 0.000 claims description 185
- 125000006850 spacer group Chemical group 0.000 claims description 56
- 230000007246 mechanism Effects 0.000 claims description 33
- 238000000034 method Methods 0.000 claims description 20
- 238000004519 manufacturing process Methods 0.000 claims description 16
- 239000000463 material Substances 0.000 claims description 11
- 239000004065 semiconductor Substances 0.000 claims description 9
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 5
- 238000003384 imaging method Methods 0.000 claims description 5
- 229910052732 germanium Inorganic materials 0.000 claims description 4
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 4
- 230000003362 replicative effect Effects 0.000 claims 2
- 230000015572 biosynthetic process Effects 0.000 claims 1
- 235000012431 wafers Nutrition 0.000 description 97
- 230000010076 replication Effects 0.000 description 31
- 238000013461 design Methods 0.000 description 20
- 230000005693 optoelectronics Effects 0.000 description 7
- 238000011109 contamination Methods 0.000 description 3
- 239000006059 cover glass Substances 0.000 description 3
- 239000004033 plastic Substances 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 2
- 238000004049 embossing Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 230000011218 segmentation Effects 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 239000006117 anti-reflective coating Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000748 compression moulding Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000001746 injection moulding Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000012876 topography Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
- H10F39/8063—Microlenses
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29D—PRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
- B29D11/00—Producing optical elements, e.g. lenses or prisms
- B29D11/00009—Production of simple or compound lenses
- B29D11/00278—Lenticular sheets
- B29D11/00307—Producing lens wafers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B3/00—Simple or compound lenses
- G02B3/0006—Arrays
- G02B3/0037—Arrays characterized by the distribution or form of lenses
- G02B3/0062—Stacked lens arrays, i.e. refractive surfaces arranged in at least two planes, without structurally separate optical elements in-between
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/57—Mechanical or electrical details of cameras or camera modules specially adapted for being embedded in other devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
- H10F39/024—Manufacture or treatment of image sensors covered by group H10F39/12 of coatings or optical elements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/162—Disposition
- H01L2924/16235—Connecting to a semiconductor or solid-state bodies, i.e. cap-to-chip
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Manufacturing & Machinery (AREA)
- Ophthalmology & Optometry (AREA)
- Mechanical Engineering (AREA)
- Health & Medical Sciences (AREA)
- Lens Barrels (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Studio Devices (AREA)
- Semiconductor Lasers (AREA)
- Packaging Frangible Articles (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US99045107P | 2007-11-27 | 2007-11-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200929456A TW200929456A (en) | 2009-07-01 |
| TWI502693B true TWI502693B (zh) | 2015-10-01 |
Family
ID=40350035
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW097144531A TWI502693B (zh) | 2007-11-27 | 2008-11-18 | 封裝式鏡片組 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US20110031510A1 (cg-RX-API-DMAC7.html) |
| EP (1) | EP2220684A1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP5580207B2 (cg-RX-API-DMAC7.html) |
| KR (1) | KR101575915B1 (cg-RX-API-DMAC7.html) |
| CN (1) | CN101990711B (cg-RX-API-DMAC7.html) |
| TW (1) | TWI502693B (cg-RX-API-DMAC7.html) |
| WO (1) | WO2009067832A1 (cg-RX-API-DMAC7.html) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010020062A1 (en) | 2008-08-20 | 2010-02-25 | Heptagon Oy | Method of manufacturing a pluralty of optical devices |
| JP5352392B2 (ja) * | 2009-09-14 | 2013-11-27 | 富士フイルム株式会社 | ウェハレベルレンズアレイの製造方法、ウェハレベルレンズアレイ、レンズモジュール及び撮像ユニット |
| TWI425825B (zh) * | 2009-12-31 | 2014-02-01 | 勝開科技股份有限公司 | 免調焦距影像感測器封裝結構 |
| US8982269B2 (en) | 2010-09-27 | 2015-03-17 | Omnivision Technologies, Inc. | Mechanical assembly for fine focus of a wafer-level camera module, and associated methods |
| SG10201605834YA (en) | 2011-07-19 | 2016-09-29 | Heptagon Micro Optics Pte Ltd | Method for manufacturing passive optical components, and devices comprising the same |
| WO2013020238A1 (en) * | 2011-08-10 | 2013-02-14 | Heptagon Micro Optics Pte. Ltd. | Opto-electronic module and method for manufacturing the same |
| WO2013026175A1 (en) * | 2011-08-25 | 2013-02-28 | Heptagon Micro Optics Pte. Ltd. | Wafer-level fabrication of optical devices with front focal length correction |
| CN103959125A (zh) * | 2011-10-05 | 2014-07-30 | 新加坡恒立私人有限公司 | 微光学系统及其制造方法 |
| WO2013091829A1 (en) * | 2011-12-22 | 2013-06-27 | Heptagon Micro Optics Pte. Ltd. | Opto-electronic modules, in particular flash modules, and method for manufacturing the same |
| US8791489B2 (en) * | 2012-04-05 | 2014-07-29 | Heptagon Micro Optics Pte. Ltd. | Opto-electronic module |
| US9634050B2 (en) | 2012-08-20 | 2017-04-25 | Heptagon Micro Optics Pte. Ltd. | Fabrication of optics wafer |
| US8606057B1 (en) | 2012-11-02 | 2013-12-10 | Heptagon Micro Optics Pte. Ltd. | Opto-electronic modules including electrically conductive connections for integration with an electronic device |
| SG11201504456YA (en) * | 2012-12-27 | 2015-07-30 | Heptagon Micro Optics Pte Ltd | Fabrication of optical elements and modules incorporating the same |
| CN103050502A (zh) * | 2012-12-28 | 2013-04-17 | 格科微电子(上海)有限公司 | 晶圆级镜头模组阵列、阵列组合及两者的制作方法 |
| US9746349B2 (en) | 2013-09-02 | 2017-08-29 | Heptagon Micro Optics Pte. Ltd. | Opto-electronic module including a non-transparent separation member between a light emitting element and a light detecting element |
| US9921393B2 (en) * | 2014-09-04 | 2018-03-20 | Omnivision Technologies, Inc. | Wafer-level methods for making apertured lenses involving sequential layering of biplanar transparent film, opaque layer, spacer wafer, and lens wafer |
| US11808959B2 (en) * | 2020-08-11 | 2023-11-07 | Himax Technologies Limited | Optical element and wafer level optical module |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040040648A1 (en) * | 1997-10-03 | 2004-03-04 | Brian Harden | Method for replicating optical elements, particularly on a wafer level, and replicas formed thereby |
| WO2005041561A1 (en) * | 2003-10-27 | 2005-05-06 | Koninklijke Philips Electronics N.V. | Camera module and manufacturing method for such a camera module |
| TW200723469A (en) * | 2005-11-22 | 2007-06-16 | Honeywell Int Inc | MEMS flip-chip packaging |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6242558A (ja) * | 1985-08-20 | 1987-02-24 | Matsushita Electronics Corp | 固体撮像装置 |
| US6235141B1 (en) * | 1996-09-27 | 2001-05-22 | Digital Optics Corporation | Method of mass producing and packaging integrated optical subsystems |
| US6381072B1 (en) * | 1998-01-23 | 2002-04-30 | Proxemics | Lenslet array systems and methods |
| US6426829B1 (en) * | 1998-03-26 | 2002-07-30 | Digital Optics Corp. | Integrated micro-optical systems |
| JPH11330442A (ja) * | 1998-05-20 | 1999-11-30 | Sony Corp | 光学装置 |
| JP2000314876A (ja) * | 1999-04-28 | 2000-11-14 | Hitachi Ltd | 液晶表示素子および液晶表示装置 |
| US6285064B1 (en) * | 2000-03-28 | 2001-09-04 | Omnivision Technologies, Inc. | Chip scale packaging technique for optical image sensing integrated circuits |
| JP2002252338A (ja) * | 2000-12-18 | 2002-09-06 | Canon Inc | 撮像装置及び撮像システム |
| US6635941B2 (en) * | 2001-03-21 | 2003-10-21 | Canon Kabushiki Kaisha | Structure of semiconductor device with improved reliability |
| JP2002368235A (ja) | 2001-03-21 | 2002-12-20 | Canon Inc | 半導体装置及びその製造方法 |
| JP2002290842A (ja) * | 2001-03-23 | 2002-10-04 | Sanyo Electric Co Ltd | 固体撮像素子の製造方法 |
| JP4190204B2 (ja) * | 2002-05-16 | 2008-12-03 | オリンパス株式会社 | 接合レンズアレイ |
| KR20070089889A (ko) * | 2002-09-17 | 2007-09-03 | 앤터온 비.브이. | 카메라 디바이스, 카메라 디바이스 제조 방법, 웨이퍼스케일 패키지 및 광학 어셈블리 |
| JP2004233483A (ja) * | 2003-01-29 | 2004-08-19 | Sanyo Electric Co Ltd | カメラモジュール |
| WO2008011003A2 (en) * | 2006-07-17 | 2008-01-24 | Tessera North America, Inc. | Camera system and associated methods |
| KR100539259B1 (ko) * | 2004-04-26 | 2005-12-27 | 삼성전자주식회사 | 자동으로 정렬되는 렌즈를 포함하는 이미지 센서 모듈, 그제조방법 및 렌즈의 자동 초점 조절방법 |
| JP4421962B2 (ja) * | 2004-07-13 | 2010-02-24 | カンタツ株式会社 | 携帯電話搭載用小型撮像モジュール |
| US7692256B2 (en) * | 2007-03-23 | 2010-04-06 | Heptagon Oy | Method of producing a wafer scale package |
-
2008
- 2008-11-18 JP JP2010535188A patent/JP5580207B2/ja active Active
- 2008-11-18 KR KR1020107013690A patent/KR101575915B1/ko active Active
- 2008-11-18 US US12/744,833 patent/US20110031510A1/en not_active Abandoned
- 2008-11-18 TW TW097144531A patent/TWI502693B/zh active
- 2008-11-18 WO PCT/CH2008/000487 patent/WO2009067832A1/en not_active Ceased
- 2008-11-18 CN CN200880126027.8A patent/CN101990711B/zh active Active
- 2008-11-18 EP EP08855609A patent/EP2220684A1/en not_active Ceased
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040040648A1 (en) * | 1997-10-03 | 2004-03-04 | Brian Harden | Method for replicating optical elements, particularly on a wafer level, and replicas formed thereby |
| WO2005041561A1 (en) * | 2003-10-27 | 2005-05-06 | Koninklijke Philips Electronics N.V. | Camera module and manufacturing method for such a camera module |
| TW200723469A (en) * | 2005-11-22 | 2007-06-16 | Honeywell Int Inc | MEMS flip-chip packaging |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200929456A (en) | 2009-07-01 |
| KR20100087755A (ko) | 2010-08-05 |
| CN101990711A (zh) | 2011-03-23 |
| JP2011507219A (ja) | 2011-03-03 |
| US20110031510A1 (en) | 2011-02-10 |
| CN101990711B (zh) | 2017-05-17 |
| EP2220684A1 (en) | 2010-08-25 |
| KR101575915B1 (ko) | 2015-12-08 |
| JP5580207B2 (ja) | 2014-08-27 |
| WO2009067832A1 (en) | 2009-06-04 |
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