TWI498056B - Printed circuit board with burried element and method for manufacture same and package structure - Google Patents
Printed circuit board with burried element and method for manufacture same and package structure Download PDFInfo
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- TWI498056B TWI498056B TW102102147A TW102102147A TWI498056B TW I498056 B TWI498056 B TW I498056B TW 102102147 A TW102102147 A TW 102102147A TW 102102147 A TW102102147 A TW 102102147A TW I498056 B TWI498056 B TW I498056B
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- insulating substrate
- conductive line
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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Description
本發明涉及具有內埋元件的電路板製作領域,尤其涉及一種具有內埋電子元件的具有內埋元件的電路板、具有內埋元件的電路板的製作方法及封裝結構。 The present invention relates to the field of circuit board manufacturing with buried components, and more particularly to a circuit board having buried components having buried electronic components, a method of fabricating a circuit board having embedded components, and a package structure.
印刷電路板因具有裝配密度高等優點而得到了廣泛的應用。關於電路板的應用請參見文獻Takahashi,A.Ooki,N.Nagai,A.Akahoshi,H.Mukoh,A.Wajima,M.Res.Lab,High density multilayer printed circuit board for HITAC M-880,IEEE Trans.on Components,Packaging,and Manufacturing Technology,1992,15(4):418-425。常見的電路板的外層導電線路的焊盤暴露於電路板的同一側,且暴露於同一側的焊盤處於同一平面上。當電子元件構裝於暴露於外的焊盤上時,焊盤均位於電子元件的下方,從而增加了具有電子元件的電路板的高度,擴大了封裝有晶片的具有內埋元件的電路板的封裝結構的體積。 Printed circuit boards have been widely used due to their high assembly density. For application of the circuit board, please refer to the literature Takahashi, A.Ooki, N.Nagai, A.Akahoshi, H.Mukoh, A.Wajima,M.Res.Lab,High density multilayer printed circuit board for HITAC M-880,IEEE Trans .on Components, Packaging, and Manufacturing Technology, 1992, 15(4): 418-425. The pads of the outer conductive traces of a common circuit board are exposed on the same side of the board, and the pads exposed on the same side are on the same plane. When the electronic component is mounted on the exposed pad, the pad is located under the electronic component, thereby increasing the height of the circuit board having the electronic component, and enlarging the circuit board with the embedded component encapsulating the chip. The volume of the package structure.
有鑒於此,有必要提供一種具有內埋元件的電路板、具有內埋元件的電路板的製作方法及具有該具有內埋元件的電路板的封裝結構,以使電子元件埋入具有內埋元件的電路板中,從而減少具有 內埋元件的電路板的厚度,縮小具有電子元件的具有內埋元件的電路板的體積,進而縮小封裝有晶片的具有內埋元件的電路板的體積。 In view of the above, it is necessary to provide a circuit board having a buried component, a manufacturing method of the circuit board having the embedded component, and a package structure having the circuit board having the embedded component, so that the electronic component is buried with the embedded component In the board, thus reducing The thickness of the circuit board of the embedded component reduces the volume of the circuit board having the embedded component with the electronic component, thereby reducing the volume of the circuit board having the embedded component in which the wafer is packaged.
一種具有內埋元件的電路板的製作方法,包括步驟:提供一個電路基板,所述電路基板包括一個電子元件、一個絕緣基板及一個第一介電膠片,所述絕緣基板具有相對的第一表面及第二表面,所述絕緣基板還具有一個貫穿所述第一表面及第二表面的第一通孔,所述第一通孔的橫截面積大於所述電子元件的橫截面積,所述電子元件收容於所述第一通孔中,所述第一介電膠片覆蓋所述絕緣基板的第二表面及所述電子元件,且填充所述電子元件與所述絕緣基板之間的空隙;於所述絕緣基板的第一表面上形成一個第一導電線路圖形,於所述第一介電膠片靠近所述第二表面的表面上形成第二導電線路圖形,並電連接所述第一導電線路圖形及第二導電線路圖形,電連接所述第二導電線路圖形及所述電子元件;於所述第一導電線路圖形一側壓合一個第二介電膠片,所述第二介電膠片覆蓋第一導電線路圖形、從第一導電線路圖形露出的絕緣基板的第一表面及電子元件;以及於所述第二介電膠片遠離所述第一表面的表面形成第一外層導電線路層,並電連接所述第一外層導電線路層及電子元件,電連接所述第一外層導電線路層及第一導電線路圖形,以獲得所述具有內埋元件的電路板。 A method of fabricating a circuit board having a buried component, comprising the steps of: providing a circuit substrate, the circuit substrate comprising an electronic component, an insulating substrate and a first dielectric film, the insulating substrate having an opposite first surface And the second surface, the insulating substrate further has a first through hole penetrating the first surface and the second surface, the first through hole having a cross-sectional area larger than a cross-sectional area of the electronic component, The electronic component is received in the first through hole, the first dielectric film covers the second surface of the insulating substrate and the electronic component, and fills a gap between the electronic component and the insulating substrate; Forming a first conductive line pattern on the first surface of the insulating substrate, forming a second conductive line pattern on the surface of the first dielectric film adjacent to the second surface, and electrically connecting the first conductive line a circuit pattern and a second conductive line pattern electrically connecting the second conductive line pattern and the electronic component; pressing a second dielectric film on a side of the first conductive line pattern The second dielectric film covers the first conductive line pattern, the first surface of the insulating substrate exposed from the first conductive line pattern, and the electronic component; and the surface of the second dielectric film away from the first surface a first outer conductive layer, electrically connecting the first outer conductive layer and the electronic component, electrically connecting the first outer conductive layer and the first conductive trace to obtain the circuit board having the embedded component .
一種具有內埋元件的電路板,其包括絕緣基板、電子元件、第一介電膠片、第一導電線路圖形、第二導電線路圖形、第二介電膠片及第一外層導電線路層。所述絕緣基板具有相對的第一表面及第二表面。所述絕緣基板還設有一個貫穿所述第一表面及第二表 面的第一通孔。所述第一通孔的橫截面積大於所述電子元件的橫截面積。所述電子元件收容於所述第一通孔內。所述第一介電膠片覆蓋所述絕緣基板的第二表面及所述電子元件,並填充絕緣基板與電子元件之間的空隙。所述第一導電線路圖形形成於所述絕緣基板的第一表面上。所述第一介電膠片覆蓋所述絕緣基板的第二表面及所述電子元件,並填充所述電子元件與所述絕緣基板之間的空隙。所述第二導電線路圖形形成於所述第一介電膠片靠近所述第二表面的表面上,與所述第一導電線路圖形電性相連,且通過設於所述第一介電膠片中的導電盲孔與所述電子元件電性相連。所述第二介電膠片覆蓋第一導電線路圖形、從第一導電線路圖形露出的絕緣基板的第一表面及電子元件。所述第一外層導電線路層形成於所述第二介電膠片靠近所述第一表面的表面上,且通過設於所述第二介電膠片中的導電盲孔與所述電子元件及第一導電線路圖形電性相連。 A circuit board having a buried component, comprising an insulating substrate, an electronic component, a first dielectric film, a first conductive trace pattern, a second conductive trace pattern, a second dielectric film, and a first outer conductive layer. The insulating substrate has opposing first and second surfaces. The insulating substrate is further provided with a first surface and a second surface The first through hole of the face. The first through hole has a cross sectional area larger than a cross sectional area of the electronic component. The electronic component is received in the first through hole. The first dielectric film covers the second surface of the insulating substrate and the electronic component, and fills a gap between the insulating substrate and the electronic component. The first conductive line pattern is formed on the first surface of the insulating substrate. The first dielectric film covers the second surface of the insulating substrate and the electronic component, and fills a gap between the electronic component and the insulating substrate. The second conductive line pattern is formed on a surface of the first dielectric film adjacent to the second surface, electrically connected to the first conductive line pattern, and disposed in the first dielectric film The conductive blind hole is electrically connected to the electronic component. The second dielectric film covers the first conductive line pattern, the first surface of the insulating substrate exposed from the first conductive line pattern, and the electronic component. The first outer conductive layer is formed on a surface of the second dielectric film adjacent to the first surface, and through the conductive blind hole provided in the second dielectric film and the electronic component A conductive line pattern is electrically connected.
一種封裝結構,其包括一個晶片及上述的具有內埋元件的電路板,所述具有內埋元件的電路板的第一外層導電線路層包括多個電性接觸墊,所述晶片通過焊球與所述具有內埋元件的電路板的電性接觸墊相互連接。 A package structure comprising a wafer and the above-mentioned circuit board having a buried component, the first outer conductive layer of the circuit board having the embedded component comprising a plurality of electrical contact pads, the wafer being soldered The electrical contact pads of the circuit board with embedded components are connected to each other.
與先前技術相比,本技術方案提供的具有內埋元件的電路板及其製作方法,電子元件埋於所述絕緣基板中,從而減少具有內埋元件的電路板的厚度,縮小具有電子元件的具有內埋元件的電路板的體積,進而縮小封裝有晶片的具有內埋元件的電路板的體積。 Compared with the prior art, the circuit board with embedded components and the manufacturing method thereof are provided in the technical solution, and the electronic components are buried in the insulating substrate, thereby reducing the thickness of the circuit board having the embedded components and reducing the thickness of the circuit board having the embedded components. The volume of the board with embedded components, which in turn reduces the volume of the board with the embedded components encapsulating the wafer.
10‧‧‧電子元件 10‧‧‧Electronic components
11‧‧‧絕緣基板 11‧‧‧Insert substrate
12‧‧‧支撐板 12‧‧‧Support board
101‧‧‧主體 101‧‧‧ Subject
103‧‧‧第一電性連接端 103‧‧‧First electrical connection
105‧‧‧第二電性連接端 105‧‧‧Second electrical connection
11a‧‧‧第一表面 11a‧‧‧ first surface
11b‧‧‧第二表面 11b‧‧‧ second surface
111‧‧‧第一通孔 111‧‧‧First through hole
121‧‧‧離型膜 121‧‧‧ release film
21‧‧‧第一介電膠片 21‧‧‧First dielectric film
100a‧‧‧電路基板 100a‧‧‧ circuit board
211‧‧‧第二通孔 211‧‧‧Second through hole
213‧‧‧第一盲孔 213‧‧‧ first blind hole
110‧‧‧第一導電線路圖形 110‧‧‧First conductive line pattern
120‧‧‧第二導電線路圖形 120‧‧‧Second conductive line pattern
214‧‧‧導電通孔 214‧‧‧ conductive vias
215‧‧‧第一導電盲孔 215‧‧‧First conductive blind hole
110a、120a‧‧‧導電線路 110a, 120a‧‧‧ conductive lines
22‧‧‧第二介電膠片 22‧‧‧Second dielectric film
23‧‧‧第三介電膠片 23‧‧‧ Third dielectric film
216a、216b‧‧‧第二盲孔 216a, 216b‧‧‧ second blind hole
217‧‧‧第三盲孔 217‧‧‧ third blind hole
130‧‧‧第一外層導電線路層 130‧‧‧First outer conductive layer
140‧‧‧第二外層導電線路層 140‧‧‧Second outer conductive layer
218a、218b‧‧‧第二導電盲孔 218a, 218b‧‧‧Second conductive blind hole
219‧‧‧第三導電盲孔 219‧‧‧3rd conductive blind hole
131‧‧‧第一電性接觸墊 131‧‧‧First electrical contact pads
141‧‧‧第二電性接觸墊 141‧‧‧Second electrical contact pads
150‧‧‧第一防焊層 150‧‧‧First solder mask
160‧‧‧第二防焊層 160‧‧‧Second solder mask
151‧‧‧第一開口 151‧‧‧ first opening
161‧‧‧第二開口 161‧‧‧ second opening
170‧‧‧第一保護層 170‧‧‧First protective layer
100‧‧‧具有內埋元件的電路板 100‧‧‧Board with embedded components
200‧‧‧封裝結構 200‧‧‧Package structure
300‧‧‧晶片 300‧‧‧ wafer
301‧‧‧第三電性接觸墊 301‧‧‧ Third electrical contact pad
303‧‧‧焊球 303‧‧‧ solder balls
圖1係本技術方案提供的電子元件、絕緣基板及支撐板的剖面示 意圖,所述絕緣基板及電子元件置於所述支撐板上,且所述電子元件收容於所述絕緣基板中。 1 is a cross-sectional view showing an electronic component, an insulating substrate, and a support plate provided by the technical solution. It is intended that the insulating substrate and the electronic component are placed on the support plate, and the electronic component is housed in the insulating substrate.
圖2為於圖1所示的絕緣基板遠離所述支撐板的一側壓合一個第一介電膠片後的剖面示意圖。 2 is a schematic cross-sectional view showing a first dielectric film bonded to a side of the insulating substrate shown in FIG. 1 away from the support plate.
圖3為將圖2中的支撐板移除後所獲得電路基板的剖面示意圖。 3 is a schematic cross-sectional view of a circuit substrate obtained by removing the support plate of FIG. 2.
圖4為於圖3所示所述電路基板上形成一個通孔及於所述第一介電膠片中形成第一盲孔後的剖面示意圖。 4 is a cross-sectional view showing a through hole formed in the circuit substrate shown in FIG. 3 and a first blind hole formed in the first dielectric film.
圖5為於圖4所示的絕緣基板上形成一個第一導電線路圖形,於第一介電膠片的表面上形成第二導電線路圖形,並將通孔製成導電通孔,第一盲孔製成第一導電盲孔後的剖面示意圖。 5 is a first conductive line pattern formed on the insulating substrate shown in FIG. 4, a second conductive line pattern is formed on the surface of the first dielectric film, and the through hole is made into a conductive via, the first blind hole A schematic cross-sectional view of the first conductive blind via.
圖6為於圖5所示的第一導電線路圖形一側壓合一個第二介電膠片,於第二導電線路圖形一側壓合一個第三介電膠片後的剖面示意圖。 FIG. 6 is a cross-sectional view showing a second dielectric film pressed on one side of the first conductive line pattern and a third dielectric film on the side of the second conductive line pattern.
圖7為於圖6所示的所述第二介電膠片中形成一個第二盲孔,於所述第三介電膠片中形成至少一個第三盲孔後的剖面示意圖。 FIG. 7 is a cross-sectional view showing the formation of a second blind via in the second dielectric film shown in FIG. 6 after forming at least one third blind via in the third dielectric film.
圖8為於圖7所示的第二介電膠片的表面形成第一外層導電線路層,於第三介電膠片表面形成第二外層導電線路層,並將所述第二盲孔、第三盲孔分別製成第二導電盲孔、第三導電盲孔後的剖面示意圖。 8 is a first outer conductive layer formed on the surface of the second dielectric film shown in FIG. 7, a second outer conductive layer on the third dielectric film surface, and the second blind hole and the third A schematic cross-sectional view of the blind vias after the second conductive blind vias and the third conductive blind vias are respectively formed.
圖9為於圖8所示的第一外層導電線路層的表面形成第一防焊層,於第二外層導電線路層的表面形成第二防焊層後的剖面示意圖。 FIG. 9 is a schematic cross-sectional view showing the first solder resist layer formed on the surface of the first outer layer conductive layer shown in FIG. 8 and the second solder resist layer formed on the surface of the second outer layer conductive layer.
圖10為於圖9所示的第一外層導電線路層的每個第一電性接觸墊 的表面形成一個第一保護層,於每個第二電性接觸墊的表面形成一個第二保護層後的獲得的具有內埋元件的電路板的剖面示意圖。 Figure 10 is a first electrical contact pad of the first outer conductive layer of the layer shown in Figure 9 The surface forms a first protective layer, and a schematic cross-sectional view of the obtained circuit board with buried components after forming a second protective layer on the surface of each of the second electrical contact pads.
圖11為於圖10所示的具有內埋元件的電路板上構裝一個晶片後所獲得封裝結構的示意圖。 FIG. 11 is a schematic view showing a package structure obtained after a wafer is mounted on a circuit board having a buried component shown in FIG.
本技術方案提供的電路板製作方法包括如下步驟: The circuit board manufacturing method provided by the technical solution includes the following steps:
第一步,請參閱圖1,提供一個電子元件10、一個絕緣基板11及一個支撐板12。 In the first step, referring to FIG. 1, an electronic component 10, an insulating substrate 11, and a support plate 12 are provided.
所述電子元件10可以為如電阻、電容器、晶片等,其包括一個主體101、第一電性連接端103及第二電性連接端105。所述第一電性連接端103及第二電性連接端105中的每個電性連接端均與所述主體101電性相連。本實施方式中,所述電子元件10為業界習知的多層陶瓷電容器;所述主體101為內部形成有多個內電極的陶瓷體;所述第一電性連接端103及第二電性連接端105均為外電極,且分別位於所述主體101的相對兩側。 The electronic component 10 can be a resistor, a capacitor, a wafer, etc., and includes a main body 101, a first electrical connection end 103, and a second electrical connection end 105. Each of the first electrical connection end 103 and the second electrical connection end 105 is electrically connected to the main body 101. In this embodiment, the electronic component 10 is a multilayer ceramic capacitor known in the art; the main body 101 is a ceramic body in which a plurality of internal electrodes are formed; the first electrical connection end 103 and the second electrical connection The ends 105 are all external electrodes and are located on opposite sides of the body 101, respectively.
所述絕緣基板11具有相對的第一表面11a及第二表面11b。所述絕緣基板11還設有一個貫穿所述第一表面11a及第二表面11b的第一通孔111。所述第一通孔111的橫截面積大於所述電子元件10的橫截面積。 The insulating substrate 11 has opposing first and second surfaces 11a, 11b. The insulating substrate 11 is further provided with a first through hole 111 penetrating the first surface 11a and the second surface 11b. The cross-sectional area of the first through hole 111 is larger than the cross-sectional area of the electronic component 10.
接著,將所述絕緣基板11及電子元件10設置於所述支撐板12上,使得所述第一表面11a與所述支撐板12相接觸,所述電子元件10收容於所述第一通孔111中。亦即,所述絕緣基板11及電子元件 10設置於所述支撐板12的上側。優選地,本實施方式中,所述電子元件10遠離所述支撐板12的表面與所述絕緣基板11的第二表面11b平齊,亦即,所述電子元件10的厚度等於所述絕緣基板11的厚度。本發明所屬技術領域中具有通常知識者可以理解,所述電子元件10遠離所述支撐板12的表面也可以凸出所述絕緣基板11的第二表面11b,亦即,所述電子元件10遠離所述支撐板12的表面較所述絕緣基板11的第二表面11b遠離所述支撐板12,即,所述電子元件10的厚度大於所述絕緣基板11的厚度;所述絕緣基板11的第二表面11b也可以凸出所述電子元件10遠離所述支撐板12的表面,亦即,所述電子元件10遠離所述支撐板12的表面較所述絕緣基板11的第二表面11b靠近所述支撐板12,即,所述電子元件10的厚度小於所述絕緣基板11的厚度。 Next, the insulating substrate 11 and the electronic component 10 are disposed on the support plate 12 such that the first surface 11a is in contact with the support plate 12, and the electronic component 10 is received in the first through hole. 111 in. That is, the insulating substrate 11 and electronic components 10 is disposed on an upper side of the support plate 12. Preferably, in the embodiment, the surface of the electronic component 10 away from the support board 12 is flush with the second surface 11b of the insulating substrate 11, that is, the thickness of the electronic component 10 is equal to the insulating substrate. The thickness of 11. It will be understood by those skilled in the art that the surface of the electronic component 10 away from the support plate 12 can also protrude from the second surface 11b of the insulating substrate 11, that is, the electronic component 10 is far away. The surface of the support plate 12 is away from the support plate 12 than the second surface 11b of the insulating substrate 11, that is, the thickness of the electronic component 10 is greater than the thickness of the insulating substrate 11; The two surfaces 11b may also protrude from the surface of the electronic component 10 away from the support plate 12, that is, the surface of the electronic component 10 away from the support plate 12 is closer to the second surface 11b of the insulating substrate 11. The support plate 12, that is, the thickness of the electronic component 10 is smaller than the thickness of the insulating substrate 11.
優選地,本實施例中,為了後續步驟中更好地將所述絕緣基板11及電子元件10與所述支撐板12分離,所述支撐板12靠近所述絕緣基板11的表面上還設有一個離型膜121。亦即,所述離型膜121位於所述支撐板12與絕緣基板11之間。所述離型膜121可以為聚丙烯薄膜、聚乙烯薄膜以及聚對苯二甲酸乙二醇酯等高分子薄膜,優選為聚對苯二甲酸乙二醇酯薄膜,本實施例中即採用聚對苯二甲酸乙二醇酯薄膜作為所述離型膜121。所述離型膜121也可以為其他業界常用的離型紙。 Preferably, in the embodiment, in order to better separate the insulating substrate 11 and the electronic component 10 from the support plate 12 in a subsequent step, the support plate 12 is further disposed on a surface of the insulating substrate 11 A release film 121. That is, the release film 121 is located between the support plate 12 and the insulating substrate 11. The release film 121 may be a polymer film such as a polypropylene film, a polyethylene film, or a polyethylene terephthalate, and is preferably a polyethylene terephthalate film. In this embodiment, a poly film is used. A polyethylene terephthalate film is used as the release film 121. The release film 121 can also be a release paper commonly used in other industries.
第二步,請參閱圖2,於所述絕緣基板11的第二表面11b一側壓合第一介電膠片21,以使所述第一介電膠片21覆蓋所述絕緣基板11的第二表面11b及所述電子元件10遠離所述支撐板12的表面,且填充所述電子元件10與所述絕緣基板11之間的空隙,從而絕緣基 板11、及第一介電膠片21及位於第一通孔111內的電子元件10共同黏結為一個整體,構成一個電路基板100a。 In the second step, referring to FIG. 2, the first dielectric film 21 is pressed on the second surface 11b side of the insulating substrate 11 so that the first dielectric film 21 covers the second of the insulating substrate 11. The surface 11b and the electronic component 10 are away from the surface of the support plate 12, and fill a gap between the electronic component 10 and the insulating substrate 11, thereby insulating the substrate. The board 11 and the first dielectric film 21 and the electronic component 10 located in the first through hole 111 are integrally bonded together to form a circuit substrate 100a.
本步驟中,採用熱壓合的方式將第一介電膠片21壓合於所述絕緣基板11遠離所述支撐板12的一側。第一介電膠片21材料可以為聚醯亞胺(Polyimide,PI)、聚乙烯對苯二甲酸乙二醇酯(Polyethylene Terephthalate,PET)或聚萘二甲酸乙二醇酯(Polyethylene naphthalate,PEN)、PP(Prepreg)或ABF(Ajinomoto Build-up film)等,優選為PP或ABF。 In this step, the first dielectric film 21 is press-fitted to the side of the insulating substrate 11 away from the support plate 12 by thermocompression bonding. The material of the first dielectric film 21 may be Polyimide (PI), Polyethylene Terephthalate (PET) or Polyethylene naphthalate (PEN). PP, Prepreg or ABF (Ajinomoto Build-up film), etc., preferably PP or ABF.
第三步,請一併參閱圖3,將所述支撐板12與所述電路基板100a分離,以獲得所述電路基板100a。 In the third step, referring to FIG. 3 together, the support plate 12 is separated from the circuit substrate 100a to obtain the circuit substrate 100a.
本發明所屬技術領域中具有通常知識者可以理解,第一步中也可以提供兩個絕緣基板11及兩個電子元件10,此種情況下,一個絕緣基板11及一個電子元件10設置於所述支撐板12的上側(如圖1所示),另一個絕緣基板11及另一個電子元件10設置於所述支撐板12的下側,且另一個電子元件10收容於另一個絕緣基板11的第一通孔111中,亦即,支撐板12夾設於所述兩個絕緣基板11之間。此種情況下,於第二步中,於所述絕緣基板11的第二表面11b一側壓合第一介電膠片21的同時,也可以於所述支撐板12的下側壓合另一個第一介電膠片21,該另一個第一介電膠片21覆蓋該另一個絕緣基板11、另一個電子元件10及電子元件於絕緣基板11之間的空隙。如此,移除支撐板12之後可以獲得兩個相分離的電路基板100a。 It is understood by those skilled in the art that two insulating substrates 11 and two electronic components 10 can be provided in the first step. In this case, an insulating substrate 11 and an electronic component 10 are disposed in the The upper side of the support plate 12 (as shown in FIG. 1 ), the other insulating substrate 11 and the other electronic component 10 are disposed on the lower side of the support plate 12 , and the other electronic component 10 is received in the other insulating substrate 11 . In a through hole 111, that is, the support plate 12 is interposed between the two insulating substrates 11. In this case, in the second step, while the first dielectric film 21 is pressed on the second surface 11b side of the insulating substrate 11, the other side of the support plate 12 may be pressed against the other side. The first dielectric film 21 covers the gap between the other insulating substrate 11, the other electronic component 10, and the electronic component between the insulating substrates 11. As such, two phase-separated circuit substrates 100a can be obtained after the support plate 12 is removed.
第四步,請參閱圖4,於所述電路基板100a的所述絕緣基板11及所述第一介電膠片21對應於所述絕緣基板11的區域形成至少一個 第二通孔211,於所述第一介電膠片21對應於所述電子元件10的第一電性連接端103的區域形成一個第一盲孔213。 Referring to FIG. 4, at least one of the insulating substrate 11 and the first dielectric film 21 of the circuit substrate 100a corresponding to the insulating substrate 11 is formed. The second through hole 211 forms a first blind hole 213 in a region of the first dielectric film 21 corresponding to the first electrical connection end 103 of the electronic component 10.
本步驟中,所述第二通孔211及第一盲孔213均可以採用雷射燒蝕的方式形成。所述第二通孔211貫穿所述絕緣基板11及所述第一介電膠片21對應於所述絕緣基板11的區域。第二通孔211也可以採用機械鑽孔的方式形成。第二通孔211的個數可以為一個,也可以為多個。圖4中以形成兩個第二通孔211為例進行說明。所述第一盲孔213僅貫穿所述第一介電膠片21對應於所述電子元件10的第一電性連接端103的區域,以暴露出部分第一電性連接端103。可以理解的是,於此步驟之後,還可以進一步包括去膠渣(desmear)的步驟,以將第二通孔211及第一盲孔213內部的膠渣去除,從而可以有效地防止於後續進行電鍍時,膠渣影響形成的導電孔的導電性。 In this step, the second through hole 211 and the first blind hole 213 may be formed by laser ablation. The second through hole 211 penetrates a region of the insulating substrate 11 and the first dielectric film 21 corresponding to the insulating substrate 11 . The second through hole 211 can also be formed by mechanical drilling. The number of the second through holes 211 may be one or plural. In FIG. 4, two second through holes 211 are formed as an example for description. The first blind via 213 extends only through the region of the first dielectric film 21 corresponding to the first electrical connection end 103 of the electronic component 10 to expose a portion of the first electrical connection end 103. It can be understood that, after this step, a step of desmear may be further included to remove the slag inside the second through hole 211 and the first blind hole 213, thereby effectively preventing subsequent processing. When electroplating, the slag affects the conductivity of the formed conductive holes.
第五步,請參閱圖5,於絕緣基板11的第一表面11a上形成一個第一導電線路圖形110,於第一介電膠片21靠近所述第二表面11b的表面上形成第二導電線路圖形120,並將第二通孔211製成導電通孔214,第一盲孔213製成第一導電盲孔215。所述第一導電線路圖形110包括多條導電線路110a。所述第二導電線路圖形120包括多條導電線路120a。所述導電通孔214電導通所述第一導電線路圖形110及第二導電線路圖形120。所述第一導電盲孔215電導通所述第二導電線路圖形120與所述電子元件10的第一電性連接端103。 In the fifth step, referring to FIG. 5, a first conductive line pattern 110 is formed on the first surface 11a of the insulating substrate 11, and a second conductive line is formed on the surface of the first dielectric film 21 near the second surface 11b. The pattern 120 is formed into a conductive via 214, and the first via 213 is formed as a first conductive via 215. The first conductive line pattern 110 includes a plurality of conductive lines 110a. The second conductive line pattern 120 includes a plurality of conductive lines 120a. The conductive via 214 electrically conducts the first conductive trace pattern 110 and the second conductive trace pattern 120. The first conductive via 215 electrically conducts the second conductive trace pattern 120 and the first electrical connection end 103 of the electronic component 10 .
本步驟具體可採用如下方法: This step can specifically adopt the following methods:
首先,採用化學鍍銅的方式,於第一表面11a、第一介電膠片21 靠近所述第一表面11a的表面及電子元件10靠近所述第一表面11a的表面上形成第一導電種子層,於第二通孔211內壁、第一盲孔213內壁及介電層遠離所述第一表面11a的表面上形成第二導電種子層。 First, the first surface 11a and the first dielectric film 21 are formed by electroless copper plating. Forming a first conductive seed layer on the surface of the first surface 11a and the surface of the electronic component 10 adjacent to the first surface 11a, the inner wall of the second through hole 211, the inner wall of the first blind hole 213, and the dielectric layer A second conductive seed layer is formed on a surface remote from the first surface 11a.
可以理解的是,也可以採用其他方法,如黑化或者化學吸附導電粒子等,於第一表面11a、第一介電膠片21靠近所述第一表面11a的表面及電子元件10靠近所述第一表面11a的表面、第二通孔211內壁、第一盲孔213內壁及介電層遠離所述第一表面11a的表面上形成第一導電種子層及第二導電種子層。 It is to be understood that other methods, such as blackening or chemisorption of conductive particles, may be employed, on the first surface 11a, the surface of the first dielectric film 21 close to the first surface 11a, and the electronic component 10 being close to the first A surface of a surface 11a, an inner wall of the second through hole 211, an inner wall of the first blind hole 213, and a surface of the dielectric layer away from the first surface 11a form a first conductive seed layer and a second conductive seed layer.
其次,於第一導電種子層和第二導電種子層的表面分別形成光致抗蝕劑層,並採用曝光及顯影的方式,將與欲形成第一導電線路圖形110對應的部分去除得到第一光致抗蝕劑圖形,將與欲形成第二導電線路圖形120對應的部分去除得到第二光致抗蝕劑圖形。 Next, a photoresist layer is respectively formed on the surfaces of the first conductive seed layer and the second conductive seed layer, and the portion corresponding to the first conductive line pattern 110 to be formed is removed by exposure and development. The photoresist pattern is removed from the portion corresponding to the second conductive line pattern 120 to form a second photoresist pattern.
接著,於從第一光致抗蝕劑圖形的空隙露出的第一導電種子層表面形成第一電鍍銅層,於從第二光致抗蝕劑圖形露出的第二導電種子層表面形成第二電鍍銅層。 Next, a first electroplated copper layer is formed on the surface of the first conductive seed layer exposed from the void of the first photoresist pattern, and a second surface is formed on the surface of the second conductive seed layer exposed from the second photoresist pattern Electroplated copper layer.
最後,採用剝膜的方式去除第一光致抗蝕劑圖形和第二光致抗蝕劑圖形,並採用微蝕的方式去除原被第一光致抗蝕劑圖形覆蓋的第一導電種子層,去除原被第二光致抗蝕劑圖形覆蓋的第二導電種子層。如此,位於第一表面11a上的第一導電種子層及形成於其上的第一電鍍銅層共同構成第一導電線路圖形110;位於第一介電膠片21遠離所述第一表面11a的表面上的第二導電種子層及形成於其上的第二電鍍銅層共同構成第二導電線路圖形120;位 於第二通孔211內的第二導電種子層及形成上其上的第二電鍍銅層共同構成貫穿絕緣基板11及第一介電膠片21的導電通孔214;位於第一盲孔213內的第二導電種子層形成上其上的第二電鍍銅層共同構成第一導電盲孔215。所述第一導電線路圖形110及第二導電線路圖形120通過所述導電通孔214相互電連通。第二導電線路圖形120及第一電性連接端103的通過第一導電盲孔215相互電連通。 Finally, the first photoresist pattern and the second photoresist pattern are removed by stripping, and the first conductive seed layer originally covered by the first photoresist pattern is removed by microetching. Removing the second conductive seed layer that was originally covered by the second photoresist pattern. Thus, the first conductive seed layer on the first surface 11a and the first electroplated copper layer formed thereon together constitute the first conductive line pattern 110; the surface of the first dielectric film 21 away from the first surface 11a The second conductive seed layer on the second conductive copper layer and the second electroplated copper layer formed thereon jointly form the second conductive line pattern 120; The second conductive seed layer in the second through hole 211 and the second electroplated copper layer formed thereon form a conductive via 214 penetrating through the insulating substrate 11 and the first dielectric film 21; The second conductive seed layer formed on the second conductive seed layer together constitutes the first conductive blind via 215. The first conductive line pattern 110 and the second conductive line pattern 120 are electrically connected to each other through the conductive vias 214. The second conductive line pattern 120 and the first electrical connection end 103 are electrically connected to each other through the first conductive blind via 215.
本發明所屬技術領域中具有通常知識者可以理解,所述導電通孔214也可以通過樹脂塞孔的方式形成。亦即,於從第二光致抗蝕劑圖形露出的第二導電種子層表面形成第二電鍍銅層步驟中,所述第二通孔211中的第二電鍍銅層無需填滿電鍍銅,可以於電鍍完成之後,於第二通孔211中進行樹脂塞孔來填充第二通孔211中的空隙。 It will be understood by those of ordinary skill in the art that the conductive vias 214 can also be formed by means of resin plug holes. That is, in the step of forming a second electroplated copper layer on the surface of the second conductive seed layer exposed from the second photoresist pattern, the second electroplated copper layer in the second via hole 211 does not need to be filled with electroplated copper. After the plating is completed, a resin plug hole may be formed in the second through hole 211 to fill the void in the second through hole 211.
第六步,請參閱圖6,於第一導電線路圖形110一側壓合一個第二介電膠片22,於第二導電線路圖形120一側壓合一個第三介電膠片23。所述第二介電膠片22覆蓋第一導電線路圖形110、從第一導電線路圖形110露出的絕緣基板11的第一表面及電子元件10靠近所述第一表面11a的表面。所述第三介電膠片23覆蓋第二導電線路圖形120及從第二導電線路圖形120露出的第一介電膠片21靠近所述第二表面11b的表面。 In the sixth step, referring to FIG. 6, a second dielectric film 22 is pressed on the side of the first conductive line pattern 110, and a third dielectric film 23 is pressed on the side of the second conductive line pattern 120. The second dielectric film 22 covers the first conductive trace pattern 110, the first surface of the insulating substrate 11 exposed from the first conductive trace pattern 110, and the surface of the electronic component 10 adjacent to the first surface 11a. The third dielectric film 23 covers the second conductive line pattern 120 and the first dielectric film 21 exposed from the second conductive line pattern 120 is adjacent to the surface of the second surface 11b.
本步驟中,採用熱壓合的方式將第二介電膠片22及第三介電膠片23分別壓合於所述第一導電線路圖形110及第二導電線路圖形120。第二介電膠片22及第三介電膠片23材料均可以為聚醯亞胺(Polyimide,PI)、聚乙烯對苯二甲酸乙二醇酯(Polyethylene Terephthalate,PET)或聚萘二甲酸乙二醇酯(Polyethylene naphthalate,PEN)、PP(Prepreg)或ABF(Ajinomoto Build-up film)等,優選為PP或ABF。 In this step, the second dielectric film 22 and the third dielectric film 23 are respectively pressed into the first conductive line pattern 110 and the second conductive line pattern 120 by thermocompression bonding. The second dielectric film 22 and the third dielectric film 23 may each be a polyimide (PI) or a polyethylene terephthalate (Polyethylene). Terephthalate (PET) or polyethylene naphthalate (PEN), PP (Prepreg) or ABF (Ajinomoto Build-up film), etc., preferably PP or ABF.
本發明所屬技術領域中具有通常知識者可以理解,若第二導電線路圖形120包括多個用於與外界電性相連的電性接觸墊,第二導電線路圖形120即可為一個外側導電線路層,此時,第三介電膠片23也可以省略不要。 It will be understood by those skilled in the art that if the second conductive trace pattern 120 includes a plurality of electrical contact pads for electrically connecting to the outside, the second conductive trace pattern 120 can be an outer conductive trace layer. At this time, the third dielectric film 23 can also be omitted.
第七步,請一併參閱圖7,於所述第二介電膠片22對應於所述第二電性連接端105的區域形成一個第二盲孔216a,於所述第二介電膠片22除對應於所述第二電性連接端105的區域之外的區域形成至少一個第二盲孔216b,於所述第三介電膠片23中形成至少一個第三盲孔217。 In the seventh step, referring to FIG. 7, a second blind hole 216a is formed in a region of the second dielectric film 22 corresponding to the second electrical connection end 105, and the second dielectric film 22 is formed on the second dielectric film 22. At least one second blind via 216b is formed in a region other than the region corresponding to the second electrical connection terminal 105, and at least one third blind via 217 is formed in the third dielectric film 23.
本步驟中,所述第二盲孔216a、第二盲孔216b第二盲孔216b、第三盲孔217均可以採用雷射燒蝕的方式形成。所述第二盲孔216a僅貫穿所述第二介電膠片22對應於所述第二電性連接端105的區域,以暴露出部分第二電性連接端105。所述第二盲孔216b僅貫穿所述第二介電膠片22除對應於所述第二電性連接端105的區域之外的區域,以暴露出部分第一導電線路圖形110。所述第三盲孔217僅貫穿所述第三介電膠片23,以暴露出部分第二導電線路圖形120。第三盲孔217的個數可以為一個,也可以為多個,圖7中以形成一個僅貫穿所述第三介電膠片23對應於所述第一電性連接端103區域的第三盲孔217為例進行說明。 In this step, the second blind hole 216a, the second blind hole 216b, the second blind hole 216b, and the third blind hole 217 may be formed by laser ablation. The second blind via 216a extends only through the area of the second dielectric film 22 corresponding to the second electrical connection end 105 to expose a portion of the second electrical connection end 105. The second blind via 216b extends only through the second dielectric film 22 except for the region corresponding to the region of the second electrical connection 105 to expose a portion of the first conductive trace pattern 110. The third blind via 217 extends only through the third dielectric film 23 to expose a portion of the second conductive trace pattern 120. The number of the third blind holes 217 may be one or plural, and FIG. 7 is formed to form a third blind only through the third dielectric film 23 corresponding to the first electrical connection end 103 region. The hole 217 will be described as an example.
可以理解的是,於此步驟之後,還可以進一步包括去膠渣(desmear)的步驟,以將第二盲孔216a、第二盲孔216b及第三盲 孔217內部的膠渣去除,從而可以有效地防止於後續進行電鍍時,膠渣影響形成的導電孔的導電性。 It can be understood that, after this step, a step of desmear may be further included to remove the second blind hole 216a, the second blind hole 216b, and the third blind. The slag inside the hole 217 is removed, so that it is possible to effectively prevent the slag from affecting the conductivity of the formed conductive hole during subsequent plating.
第八步,請參閱圖8,於第二介電膠片22遠離所述絕緣基板11的表面形成第一外層導電線路層130,於第三介電膠片23遠離所述絕緣基板11的表面形成第二外層導電線路層140,並將所述第二盲孔216a、第二盲孔216b及第三盲孔217分別製成第二導電盲孔218a、第二導電盲孔218b及第三導電盲孔219。所述第一外層導電線路層130包括多個第一電性接觸墊131及多條導電線路(圖未示)。所述第二外層導電線路層140包括多個用於與外界進行電連接的第二電性接觸墊141及多條導電線路(圖未示)。所述第二導電盲孔218a電連接所述第一外層導電線路層130及第二電性連接端105。所述第二導電盲孔218b電連接所述第一外層導電線路層130及第一導電線路圖形110。所述第三導電盲孔219電連接所述第二導電線路圖形120及第二外層導電線路層140。 The eighth step, referring to FIG. 8, the first outer conductive layer 130 is formed on the surface of the second dielectric film 22 away from the insulating substrate 11, and the third dielectric film 23 is formed away from the surface of the insulating substrate 11. The second outer conductive layer 140, and the second blind hole 216a, the second blind hole 216b and the third blind hole 217 are respectively formed into a second conductive blind hole 218a, a second conductive blind hole 218b and a third conductive blind hole. 219. The first outer conductive layer 130 includes a plurality of first electrical contact pads 131 and a plurality of conductive traces (not shown). The second outer conductive layer 140 includes a plurality of second electrical contact pads 141 for electrically connecting to the outside and a plurality of conductive lines (not shown). The second conductive via 218a electrically connects the first outer conductive layer 130 and the second electrical connection end 105. The second conductive via 218b electrically connects the first outer conductive layer 130 and the first conductive trace pattern 110. The third conductive via 219 electrically connects the second conductive trace pattern 120 and the second outer conductive trace layer 140.
本步驟可以採用如第五步相似的步驟來完成,於此不再贅述。 This step can be completed by using steps similar to the fifth step, and details are not described herein again.
第九步,請參閱圖9,於第一外層導電線路層130的表面及從所述第一外層導電線路層130露出的第二介電膠片22的表面形成第一防焊層150,於第二外層導電線路層140的表面及從所述第二外層導電線路層140露出的第三介電膠片23的表面形成第二防焊層160。所述第一防焊層150內具有與多個第一電性接觸墊131一一對應的多個第一開口151,每個第一電性接觸墊131均從對應的第一開口151露出。所述第二防焊層160內具有與多個第二電性接觸墊141一一對應的多個第二開口161,每個第二電性接觸墊141均從對應的第二開口161露出。 The ninth step, referring to FIG. 9, forming a first solder resist layer 150 on the surface of the first outer conductive layer 130 and the surface of the second dielectric film 22 exposed from the first outer conductive layer 130, The surface of the outer conductive layer 140 and the surface of the third dielectric film 23 exposed from the second outer conductive layer 140 form a second solder resist layer 160. The first solder resist layer 150 has a plurality of first openings 151 corresponding to the plurality of first electrical contact pads 131 , and each of the first electrical contact pads 131 is exposed from the corresponding first opening 151 . The second solder resist layer 160 has a plurality of second openings 161 corresponding to the plurality of second electrical contact pads 141 , and each of the second electrical contact pads 141 is exposed from the corresponding second opening 161 .
第十步,請參閱圖10,於第一外層導電線路層130的每個第一電性接觸墊131從第一開口151露出的表面形成一個第一保護層170;於每個第二電性接觸墊141從第二開口161露出的表面形成一個第二保護層180。如此,即獲得一個內埋有電子元件10的具有內埋元件的電路板100。 In the tenth step, referring to FIG. 10, a first protective layer 170 is formed on a surface of each of the first electrical contact pads 131 exposed from the first opening 151; and each second electrical property is formed. The contact pad 141 forms a second protective layer 180 from the surface exposed by the second opening 161. Thus, a circuit board 100 having buried components embedded with electronic components 10 is obtained.
本實施例中,所述第一保護層170及第二保護層180可以為錫、鉛、銀、金、鎳、鈀等金屬或其合金的單層結構,也可以為上述金屬中兩種或者兩種以上的多層結構。所述第一保護層170及第二保護層180也可以為有機保焊層(OSP)。當所述第一保護層170及第二保護層180為金屬時,所述第一保護層170及第二保護層180可以採用化學鍍的方式形成。當所述第一保護層170及第二保護層180為有機保焊層時,所述第一保護層170及第二保護層180可以採用化學方法形成。 In this embodiment, the first protective layer 170 and the second protective layer 180 may be a single layer structure of a metal such as tin, lead, silver, gold, nickel, palladium or the like, or an alloy thereof, or may be two of the above metals or Two or more multilayer structures. The first protective layer 170 and the second protective layer 180 may also be an organic solder resist layer (OSP). When the first protective layer 170 and the second protective layer 180 are metal, the first protective layer 170 and the second protective layer 180 may be formed by electroless plating. When the first protective layer 170 and the second protective layer 180 are organic solder resist layers, the first protective layer 170 and the second protective layer 180 may be formed by a chemical method.
本發明所屬技術領域中具有通常知識者可以理解,電子元件10的電性連接端的數量不限於本實施方式中的兩個,也可以為三個、四個或者更多個,應根據實際需要來定。本發明所屬技術領域中具有通常知識者還可以理解,電導通電子元件10的電連接端與導電線路圖形或者導電線路層的導通盲孔的數量也不限於本實施方式中的兩個,也可以為三個、四個或者更多個,應根據電子元件10的電性連接端的數量來設定。 It should be understood by those skilled in the art that the number of electrical connection ends of the electronic component 10 is not limited to two in the embodiment, and may be three, four or more, and should be according to actual needs. set. It is also understood by those skilled in the art that the number of conductive vias of the conductive electronic component 10 and the conduction line pattern or the conductive circuit layer is not limited to two in the embodiment, and may also be Three, four or more should be set according to the number of electrical terminals of the electronic component 10.
請參閱圖10,本技術方案提供一種採用上述方法製作的內埋有電子元件10的具有內埋元件的電路板100,其包括電子元件10、絕緣基板11、第一介電膠片21、第一導電線路圖形110、第二導電線路圖形120、第二介電膠片22及第一外層導電線路層130。所述 絕緣基板11具有相對的第一表面11a及第二表面11b。所述絕緣基板11還設有一個貫穿所述第一表面11a及第二表面11b的第一通孔111。所述第一通孔111的橫截面積大於所述電子元件10的橫截面積。所述電子元件10收容於所述第一通孔111內。所述第一介電膠片21覆蓋所述絕緣基板11的第二表面11b及所述電子元件10,並填充絕緣基板11與電子元件10之間的空隙。所述第一導電線路圖形110形成於所述絕緣基板11的第一表面11a上。所述第二導電線路圖形120形成於所述第一介電膠片21靠近所述第二表面11b的表面上,與所述第一導電線路圖形110電性相連,且通過設於所述第一介電膠片21中的第一導電盲孔215所述電子元件10電性相連。所述第二介電膠片22覆蓋第一導電線路圖形110、從第一導電線路圖形110露出的絕緣基板11的第一表面11a及電子元件10。所述第一外層導電線路層130形成於所述第二介電膠片22靠近所述第一表面11a的表面上。所述第一外層導電線路層130通過設於所述第二介電膠片22中的第二導電盲孔218a與所述電子元件10電性相連,且通過設於所述第二介電膠片22中的第二導電盲孔218b與所述第一導電線路圖形110電性相連。 Referring to FIG. 10 , the technical solution provides a circuit board 100 with embedded components embedded with an electronic component 10 , which includes the electronic component 10 , the insulating substrate 11 , the first dielectric film 21 , and the first Conductive line pattern 110, second conductive line pattern 120, second dielectric film 22, and first outer conductive layer layer 130. Said The insulating substrate 11 has opposing first and second surfaces 11a, 11b. The insulating substrate 11 is further provided with a first through hole 111 penetrating the first surface 11a and the second surface 11b. The cross-sectional area of the first through hole 111 is larger than the cross-sectional area of the electronic component 10. The electronic component 10 is received in the first through hole 111. The first dielectric film 21 covers the second surface 11b of the insulating substrate 11 and the electronic component 10, and fills a gap between the insulating substrate 11 and the electronic component 10. The first conductive line pattern 110 is formed on the first surface 11a of the insulating substrate 11. The second conductive line pattern 120 is formed on the surface of the first dielectric film 21 adjacent to the second surface 11b, electrically connected to the first conductive line pattern 110, and is disposed on the first The electronic component 10 of the first conductive blind via 215 in the dielectric film 21 is electrically connected. The second dielectric film 22 covers the first conductive line pattern 110, the first surface 11a of the insulating substrate 11 exposed from the first conductive line pattern 110, and the electronic component 10. The first outer conductive layer 130 is formed on a surface of the second dielectric film 22 adjacent to the first surface 11a. The first outer conductive layer 130 is electrically connected to the electronic component 10 through a second conductive via 218a disposed in the second dielectric film 22, and is disposed on the second dielectric film 22 The second conductive blind via 218b is electrically connected to the first conductive trace pattern 110.
本技術方案提供的具有內埋元件的電路板及其製作方法,電子元件10埋於所述絕緣基板11中,從而減少具有內埋元件的電路板100的厚度,縮小具有電子元件10的具有內埋元件的電路板100的體積。此外,由於電子元件10與絕緣基板11通過第一介電膠片21黏結為一個整體,故,於製作形成導電盲孔的盲孔時,電子元件10不易相對第一介電膠片21移動,提高了電子元件10與所需形成的盲孔之間的對位精確度,進而提高了具有內埋元件的電路板100的製作效率。 According to the present invention, a circuit board having a buried component and a method of fabricating the same, the electronic component 10 is buried in the insulating substrate 11, thereby reducing the thickness of the circuit board 100 having the embedded component, and reducing the inner portion of the electronic component 10 The volume of the circuit board 100 in which the components are buried. In addition, since the electronic component 10 and the insulating substrate 11 are bonded together through the first dielectric film 21, the electronic component 10 is not easily moved relative to the first dielectric film 21 when the blind via hole forming the conductive blind hole is formed, which is improved. The alignment accuracy between the electronic component 10 and the blind via to be formed, thereby increasing the fabrication efficiency of the circuit board 100 having the embedded component.
請參閱圖11,本技術方案提供一種包括上述具有內埋元件的電路板100的封裝結構200。所述封裝結構200包括具有內埋元件的電路板100及晶片300。 Referring to FIG. 11, the present technical solution provides a package structure 200 including the above-described circuit board 100 having buried components. The package structure 200 includes a circuit board 100 having a buried component and a wafer 300.
所述具有內埋元件的電路板100如上所述,於此不再贅述。 The circuit board 100 having the embedded component is as described above, and details are not described herein again.
所述晶片300封裝於所述具有內埋元件的電路板100。所述晶片300具有與多個第一電性接觸墊131一一對應的多個第三電性接觸墊301。每個第一電性接觸墊131與對應的第三電性接觸墊301通過一個焊球303相互電連通。如此,既可獲得一個構裝有晶片300的封裝結構200。所述焊球303的材質可以為錫、鉛或銅,或者為錫、鉛或銅的合金。本發明所屬技術領域中具有通常知識者可以理解,所述晶片300與多個第一電性接觸墊131之間也可以通過導線鍵合方式相連。 The wafer 300 is packaged in the circuit board 100 having embedded components. The wafer 300 has a plurality of third electrical contact pads 301 that are in one-to-one correspondence with the plurality of first electrical contact pads 131. Each of the first electrical contact pads 131 and the corresponding third electrical contact pads 301 are in electrical communication with one another via a solder ball 303. As such, a package structure 200 incorporating the wafer 300 can be obtained. The material of the solder ball 303 may be tin, lead or copper, or an alloy of tin, lead or copper. It is understood by those skilled in the art that the wafer 300 and the plurality of first electrical contact pads 131 can also be connected by wire bonding.
本技術方案提供的封裝結構200中,電子元件10埋於所述絕緣基板11中,從而減少具有內埋元件的電路板100的厚度,縮小具有電子元件10的具有內埋元件的電路板100的體積,進而縮小了具有晶片300的封裝結構200的體積。 In the package structure 200 provided by the present technical solution, the electronic component 10 is buried in the insulating substrate 11, thereby reducing the thickness of the circuit board 100 having the embedded component, and reducing the circuit board 100 having the embedded component with the electronic component 10. The volume, in turn, reduces the volume of the package structure 200 having the wafer 300.
惟,以上所述者僅為本發明之較佳實施方式,自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士爰依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。 However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.
131‧‧‧第一電性接觸墊 131‧‧‧First electrical contact pads
100‧‧‧具有內埋元件的電路板 100‧‧‧Board with embedded components
200‧‧‧封裝結構 200‧‧‧Package structure
300‧‧‧晶片 300‧‧‧ wafer
301‧‧‧第三電性接觸墊 301‧‧‧ Third electrical contact pad
303‧‧‧焊球 303‧‧‧ solder balls
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