TWI431677B - Segmentation method of packaging substrate - Google Patents

Segmentation method of packaging substrate Download PDF

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TWI431677B
TWI431677B TW97122145A TW97122145A TWI431677B TW I431677 B TWI431677 B TW I431677B TW 97122145 A TW97122145 A TW 97122145A TW 97122145 A TW97122145 A TW 97122145A TW I431677 B TWI431677 B TW I431677B
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cutting
package substrate
chuck table
feed
block
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TW97122145A
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TW200908112A (en
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Satoshi Sawaki
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Disco Corp
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Description

封裝基板之分割方法Method for dividing package substrate 發明領域Field of invention

本發明係有關於一種CSP基板、QFN基板等封裝基板之分割方法。The present invention relates to a method of dividing a package substrate such as a CSP substrate or a QFN substrate.

發明背景Background of the invention

隨著半導體之高積體化,如BGA(球柵陣列,Ball Grid Array)或QFN(四側無引腳扁平封裝,Quad Flat Non-leaded Package)等搭載有IC晶片半導體之封裝基板係藉由切塊裝置等加工裝置於被切削領域上進行加工,且形成為尺寸大致與半導體晶片相同之封裝體。With the high integration of semiconductors, such as BGA (Ball Grid Array) or QFN (Quad Flat Non-leaded Package), etc. A processing device such as a dicing device is processed in the field to be cut and formed into a package having a size substantially the same as that of the semiconductor wafer.

在此,一般之半導體晶圓係於進行為應切削之被切削領域與切削刀片之定位的對準後,切削業經對準之被切削領域,然後,各個被切削領域之間隔地一面分度進給切削刀片一面進行切削,即,對準係僅針對最初進行切削之被切削領域來進行,因此,進行切削之前提是所有被切削領域呈高精度平行地形成。Here, in general, the semiconductor wafer is aligned with the position of the cutting area to be cut and the positioning of the cutting insert, and the cutting industry is aligned with the cutting area, and then the intervals of the respective cutting areas are indexed into one side. The cutting insert is cut on one side, that is, the alignment system is performed only for the cutting area where the cutting is performed first, and therefore, all the fields to be cut are formed in parallel with high precision before cutting.

然而,實際上卻有各被切削領域之角度偏離之情形,特別是在CSP(晶片尺寸封裝,Chip Size Package)基板或QFN基板時,在樹脂鑄模時配線基板上產生應變,且各被切削領域之平行精度容易降低。在被切削領域未呈平行時,若設想如前述般所有被切削領域呈平行地形成而進行切削,則會切削到被切削領域以外之領域,例如晶片領域, 且會有損傷半導體元件之問題。However, in fact, there are cases in which the angles of the various fields are deviated, especially in the case of a CSP (Chip Size Package) substrate or a QFN substrate, strain is generated on the wiring substrate during resin molding, and each of the fields to be cut is used. The parallel accuracy is easily reduced. When the fields to be cut are not parallel, if it is assumed that all the fields to be cut are formed in parallel and cut as described above, they are cut into fields other than the field to be cut, such as the wafer field. There is also the problem of damaging the semiconductor components.

故,如針對所有被切削領域進行對準,並參照每個被切削領域之對準資訊而切削各被切削領域之方法(例如參照專利文獻1),或測定配置於基板對邊之對準目標之距離,並利用加工線數進行分割且算出加工分度並進行切削之方法(例如參照專利文獻2)等,進行特殊之對準且比進行標準對準(以等間隔加工)更高精度地進行加工。Therefore, if the alignment is performed for all the fields to be cut, and the respective fields to be cut are cut with reference to the alignment information of each of the areas to be cut (for example, refer to Patent Document 1), or to measure the alignment target disposed on the opposite side of the substrate. The distance is calculated by dividing the number of processing lines, calculating the machining index and cutting it (for example, see Patent Document 2), and performing special alignment and more precise alignment (equal processing) Processing.

[專利文獻1]日本專利公開公報特開平9-52227號公報[Patent Document 1] Japanese Patent Laid-Open Publication No. Hei 9-52227

[專利文獻2]特開2002-33295號公報[Patent Document 2] JP-A-2002-33295

【發明內容】[Summary of the Invention] 發明揭示Invention

然而,於應變大之基板中,在橫斷、切削封裝體長邊側之多數區塊時,於一線內之誤差大,且即使是如前述特殊之對準,亦會產生切削到被切削領域外等之問題,因此,針對封裝基板在最初每區塊地進行分割,且業經分割之每一區塊皆進行個別化等額外之程序會增加且沒有效率。However, in a substrate having a large strain, when a large number of blocks on the long side of the package are traversed and cut, the error in one line is large, and even if the special alignment is as described above, cutting to the field of cutting is generated. The problem of externality, therefore, additional procedures for partitioning the package substrate at the beginning of each block, and individualizing each of the divided blocks, are increased and inefficient.

本發明係有鑑於前述問題,目的在提供一種即使是應變大的基板,亦可直接於具有應變之一片基板之狀態下有效且精度良好地進行切削加工之封裝基板之分割方法。The present invention has been made in view of the above problems, and an object of the invention is to provide a method for dividing a package substrate which can be efficiently and accurately cut in a state in which a strained substrate is used even in a strained substrate.

為了解決前述問題並達成目的,有關本發明之封裝基板之分割方法係使用切削裝置將封裝基板分割成各個封裝元件,且前述封裝基板係將藉由分割預定線劃分形成預定 數複數元件之區塊排列二塊以上且藉由剩餘連結部連結而形成者,又,前述切削裝置包含有:夾頭台,係保持前述封裝基板且可調整旋轉角度者;切削機構,係具有切削被保持於該夾頭台上之前述封裝基板之切削刀片,且可相對於前述夾頭台之表面朝垂直方向切入、退出者;切削進給機構,係進行切削進給,使前述夾頭台與前述切削機構相對地朝切削進給方向移動者;及分度進給機構,係進行分度進給,使前述夾頭台與前述切削機構相對地朝與前述切削進給方向正交之分度進給方向移動者。又,該封裝基板之分割方法包含有:測定程序,係測定被保持於前述夾頭台上之前述封裝基板之前述區塊單位所有分割預定線之角度;及切削程序,係利用所測定一區塊寬之分割預定線之角度,依序地進行分割預定線之切削,且,於前述切削程序中,在進行前述區塊藉由前述剩餘連結部朝前述切削進給方向排列、連結二塊以上之方向之切削時,反覆進行以下一連串動作,即:前述切削刀片切入前述剩餘連結部並進行一區塊之切削進給,若該切削刀片到達相鄰之前述剩餘連結部,則前述切削機構朝上方暫時地退出。In order to solve the foregoing problems and achieve the object, a method for dividing a package substrate according to the present invention uses a cutting device to divide a package substrate into individual package components, and the package substrate is divided into predetermined lines by a predetermined line. The plurality of blocks of the plurality of elements are arranged in two or more blocks and are connected by the remaining connecting portions. The cutting device includes a chuck table that holds the package substrate and can adjust a rotation angle. The cutting mechanism has a cutting mechanism. Cutting the cutting insert of the package substrate held on the chuck table, and cutting and exiting in a vertical direction with respect to the surface of the chuck table; cutting the feeding mechanism to perform cutting feed to make the chuck The table moves in the cutting feed direction opposite to the cutting mechanism; and the indexing feed mechanism performs indexing feed so that the chuck table and the cutting mechanism face each other orthogonal to the cutting feed direction The indexing feed direction moves. Further, the method for dividing the package substrate includes: measuring a method of measuring an angle of all the planned dividing lines of the block unit of the package substrate held on the chuck stage; and cutting the program using the measured area The cutting of the predetermined dividing line is sequentially performed at an angle of the dividing line of the block width, and in the cutting process, the block is arranged in the cutting feed direction by the remaining connecting portion, and two or more pieces are connected When cutting in the direction, the following series of operations are repeated: the cutting insert cuts into the remaining joint portion and performs cutting feed of one block, and if the cutting insert reaches the adjacent remaining joint portion, the cutting mechanism faces Temporarily exit at the top.

由於有關本發明之封裝基板之分割方法在藉由剩餘連結部連結之長邊側係以區塊單位測定傾斜角度,且利用一區塊寬之分割預定線之角度依序地改變封裝基板之旋轉角度並進行切削,因此,即使於應變大之基板時,亦可藉由良好精度進行切削加工,又,藉由在每次一區塊寬度份之 切削時皆反覆使切削刀片暫時地朝上方退出再使其於剩餘連結部切入之動作,而可直接於具有應變之一片基板之狀態下有效地進行處理。Since the method of dividing the package substrate according to the present invention measures the tilt angle in the block unit by the long side of the remaining connection portion, and sequentially changes the rotation of the package substrate by the angle of the division line of one block width. Cutting at an angle, so that even in the case of a strained substrate, the cutting process can be performed with good precision, and by each block width At the time of cutting, the cutting insert is repeatedly pulled upward and then cut into the remaining joint portion, and the treatment can be efficiently performed directly in a state in which the strained substrate is provided.

用以實施發明之最佳形態The best form for implementing the invention

以下參照圖式,說明使用為本發明較佳實施形態之切削裝置的封裝基板之分割方法。Hereinafter, a method of dividing a package substrate using the cutting device of the preferred embodiment of the present invention will be described with reference to the drawings.

第1圖係顯示適用本發明實施形態之封裝基板之分割方法的切削裝置例之外觀透視圖,第2圖係顯示抽出其切削機構周圍之構造之透視圖。本實施形態之切削裝置10係將構成切削對象之CSP基板等封裝基板11沿著分割預定線進行切削,概略構造如第1圖所示,包含有夾頭台12、攝影機構13、切削機構20及控制機構30。Fig. 1 is an external perspective view showing an example of a cutting apparatus to which a method of dividing a package substrate according to an embodiment of the present invention is applied, and Fig. 2 is a perspective view showing a structure around which a cutting mechanism is taken out. In the cutting apparatus 10 of the present embodiment, the package substrate 11 such as a CSP substrate to be cut is cut along a line to be divided, and the schematic structure is as shown in Fig. 1, and includes a chuck table 12, an image pickup mechanism 13, and a cutting mechanism 20. And control mechanism 30.

切削機構20包含有:主軸22,係裝設有切削刀片21且可自由裝卸者;及外殼23,係將該主軸22支持為可旋轉,並包含進行旋轉驅動之未圖示驅動源且呈圓筒狀者,又,切削刀片21係作用於被保持在夾頭台12上之封裝基板11並進行切削。The cutting mechanism 20 includes a main shaft 22 to which a cutting insert 21 is attached and detachable, and a casing 23 that supports the main shaft 22 so as to be rotatable and includes a driving source (not shown) that is rotationally driven and has a circular shape In the tubular shape, the cutting insert 21 acts on the package substrate 11 held by the chuck table 12 and cuts it.

攝影機構13係搭載有用以將被保持於夾頭台12上之封裝基板11表面進行攝影之CCD攝影機等的顯微鏡,且為提供切削刀片21相對於應切削分割預定線之定位的對準用。如第2圖所示,該攝影機構13係於外殼23之側部設置成於X軸方向中與切削刀片21位於一直線上,且可與切削機構20一體地移動。The photographing mechanism 13 is provided with a microscope for CCD camera or the like for photographing the surface of the package substrate 11 held on the chuck table 12, and is provided for alignment of the cutting insert 21 with respect to the position to be cut. As shown in FIG. 2, the photographing mechanism 13 is disposed on the side portion of the outer casing 23 so as to be aligned with the cutting insert 21 in the X-axis direction, and is movable integrally with the cutting mechanism 20.

封裝基板11係透過保持帶T,於與框體F構成一體之狀態下保持於夾頭台12上,如第2圖所示,保持該封裝基板11之夾頭台12係與旋轉機構14連結且可於水平面內旋轉,旋轉機構14係固定於移動基台15上,在此,切削裝置10包含有用以進行切削動作所必須之進給動作的切削進給機構50、切入進給機構60及分度進給機構70。The package substrate 11 is passed through the holding tape T and held on the chuck table 12 in a state of being integrated with the frame F. As shown in Fig. 2, the chuck table 12 holding the package substrate 11 is coupled to the rotating mechanism 14. And rotating in a horizontal plane, the rotating mechanism 14 is fixed to the moving base 15, wherein the cutting device 10 includes a cutting feed mechanism 50, a cutting feed mechanism 60, and a feed operation necessary for performing a cutting operation. The indexing feed mechanism 70.

切削進給機構50係用以使移動基台15朝X軸方向移動,藉此,使夾頭台12相對於切削機構20相對地朝X軸方向進行切削進給。切削進給機構50包含有:滾珠螺桿51,係配置於X軸方向者;脈衝馬達52,係與滾珠螺桿51之一端連結者;及一對導軌53,係排列成與滾珠螺桿51平行者,又,設置於移動基台15下部之未圖示螺帽係與滾珠螺桿51螺合。滾珠螺桿51係藉由脈衝馬達52驅動並旋轉,且移動基台15隨之受導軌53導引而朝X軸方向移動。The cutting feed mechanism 50 is configured to move the moving base 15 in the X-axis direction, thereby causing the chuck table 12 to perform cutting feed in the X-axis direction with respect to the cutting mechanism 20. The cutting feed mechanism 50 includes a ball screw 51 that is disposed in the X-axis direction, a pulse motor 52 that is coupled to one end of the ball screw 51, and a pair of guide rails 53 that are arranged in parallel with the ball screw 51. Further, a nut (not shown) provided on the lower portion of the moving base 15 is screwed to the ball screw 51. The ball screw 51 is driven and rotated by the pulse motor 52, and the moving base 15 is guided by the guide rail 53 to move in the X-axis direction.

切入進給機構60係用以使支持切削機構20之外殼23的支持部16相對於壁部17相對地朝Z軸方向移動,藉此,使切削機構20升降並控制相對於封裝基板11之切入量。切入進給機構60包含有:滾珠螺桿61,係於壁部17之一側面配置於Z軸方向者;脈衝馬達62,係使該滾珠螺桿61旋動者;及一對導軌63,係排列成與滾珠螺桿61平行者,又,支持部16內部之未圖示螺帽係與滾珠螺桿61螺合。支持部16係藉由脈衝馬達62驅動,且隨著滾珠螺桿61之旋動而受導軌63導引並朝Z軸方向升降,又,受支持部16支持之切削機構20的切削刀片20亦朝Z軸方向升降,藉此,切削機構20可相對 於夾頭台11之表面朝垂直方向切入、退出。The cutting feed mechanism 60 is configured to move the support portion 16 of the outer casing 23 supporting the cutting mechanism 20 relative to the wall portion 17 in the Z-axis direction, thereby moving the cutting mechanism 20 up and down and controlling the cutting with respect to the package substrate 11. the amount. The cutting feed mechanism 60 includes a ball screw 61 that is disposed on one side of the wall portion 17 in the Z-axis direction, a pulse motor 62 that rotates the ball screw 61, and a pair of guide rails 63 that are arranged in a row. In parallel with the ball screw 61, a nut (not shown) inside the support portion 16 is screwed to the ball screw 61. The support portion 16 is driven by the pulse motor 62, and is guided by the guide rail 63 and lifted in the Z-axis direction as the ball screw 61 rotates. Further, the cutting blade 20 of the cutting mechanism 20 supported by the support portion 16 is also directed Lifting in the Z-axis direction, whereby the cutting mechanism 20 can be relatively The surface of the chuck table 11 is cut in and out in a vertical direction.

分度進給機構70係用以使透過支持部16支持切削機構20之外殼23的壁部17朝Y軸方向移動,藉此,使切削機構20相對於夾頭台12相對地朝Y軸方向進行分度進給。分度進給機構70包含有:滾珠螺桿71,係配置於Y軸方向者;脈衝馬達72,係與滾珠螺桿71之一端連結者;及一對導軌73,係排列成與滾珠螺桿71平行者,又,設置於與壁部17一體地形成之移動基台18下部的未圖示螺帽係與滾珠螺桿71螺合。滾珠螺桿71係藉由脈衝馬達72驅動並旋轉,且移動基台18隨之受導軸73導引而朝Y軸方向移動。The indexing feed mechanism 70 is configured to move the wall portion 17 of the outer casing 23 that supports the cutting mechanism 20 through the support portion 16 in the Y-axis direction, thereby causing the cutting mechanism 20 to face the Y-axis direction with respect to the chuck table 12 Perform indexing feed. The index feeding mechanism 70 includes a ball screw 71 disposed in the Y-axis direction, a pulse motor 72 coupled to one end of the ball screw 71, and a pair of guide rails 73 arranged in parallel with the ball screw 71. Further, a nut (not shown) provided on a lower portion of the moving base 18 formed integrally with the wall portion 17 is screwed to the ball screw 71. The ball screw 71 is driven and rotated by the pulse motor 72, and the moving base 18 is guided by the guide shaft 73 to move in the Y-axis direction.

控制機構30係於利用切削刀片21來進行之封裝基板11之切削時,控制攝影機構13、切削機構20、切削進給機構50、切入進給機構60及分度進給機構70等,且實行以下程序,即:測定程序,係測定被保持於夾頭台12上之封裝基板11之區塊單位所有分割預定線之角度者;及切削程序,係利用所測定一區塊寬之分割預定線之角度,依序地進行分割預定線之切削者。此時,於切削程序中,控制成在進行區塊藉由剩餘連結部朝切削進給方向排列、連結二塊以上之方向之切削時反覆以下一連串動作,即:切削刀片21係於剩餘連結部切入並進行一區塊之切削進給,若切削刀片21到達相鄰之剩餘連結部,則切削機構20係朝上方暫時地退出。The control mechanism 30 controls the photographing mechanism 13, the cutting mechanism 20, the cutting feed mechanism 50, the cutting feed mechanism 60, the index feed mechanism 70, and the like when cutting the package substrate 11 by the cutting insert 21, and executes The following procedure, that is, the measurement procedure is to measure the angles of all the division lines of the block unit of the package substrate 11 held on the chuck table 12; and the cutting program is to use the division line of the measured width of one block. At the angle, the cutters dividing the predetermined line are sequentially performed. At this time, in the cutting program, it is controlled to repeat the following series of operations when the cutting is performed in the direction in which the remaining connecting portions are arranged in the cutting feed direction and the two or more pieces are connected, that is, the cutting insert 21 is attached to the remaining joint portion. The cutting feed of one block is cut in and performed, and if the cutting insert 21 reaches the adjacent remaining joint portion, the cutting mechanism 20 temporarily exits upward.

以下詳細說明於利用控制機構30之控制下所實行之本實施形態封裝基板11之分割方法,首先,於本實施形態中, 作成切削對象之封裝基板11係於球狀端子自內面突出之配線基板之表面上積層、結合一片或二片以上之半導體晶片,再利用樹脂將業已結合之半導體晶片進行鑄模,藉此,如第3圖所示,可構成一片基板。在此,封裝基板11係藉由剩餘連結部E連結複數區塊A、B、C、D且形成為細長矩形狀,又,前述複數區塊A、B、C、D係藉由分割預定線(街道)S劃分、形成預定數之複數CSP晶片等元件11a。於第3圖等中,顯示各由3×3=9個之元件11a所構成之四個區塊例,然而,封裝基板11更實際之構造係例如長邊方向之長度L為220mm,同時各由7×5=35個之元件11a所構成之五個區塊係透過寬度6.5mm之剩餘連結部E朝長邊方向連結。Hereinafter, a method of dividing the package substrate 11 of the present embodiment which is carried out under the control of the control unit 30 will be described in detail. First, in the present embodiment, The package substrate 11 to be subjected to the cutting is formed by laminating one or two or more semiconductor wafers on the surface of the wiring substrate from which the spherical terminals protrude from the inner surface, and then molding the bonded semiconductor wafer with a resin, thereby, for example, As shown in Fig. 3, one substrate can be formed. Here, the package substrate 11 is connected to the plurality of blocks A, B, C, and D by the remaining connection portion E and formed into an elongated rectangular shape. Further, the plurality of blocks A, B, C, and D are divided by a predetermined line. (Street) S divides and forms an element 11a such as a predetermined number of CSP chips. In the third diagram and the like, four blocks each composed of 3 × 3 = 9 elements 11a are shown. However, the more practical structure of the package substrate 11 is, for example, the length L of the long side direction is 220 mm, and each The five blocks composed of 7 × 5 = 35 elements 11a are connected to each other in the longitudinal direction through the remaining connecting portion E having a width of 6.5 mm.

又,於封裝基板11中,每分割預定線S地於區塊A~D外之位置形成對準圖案,在此,若著眼於封裝基板11之長邊方向,則規定長邊方向分割預定線S之位置的對準圖案係以區塊A~D單位形成為如A11 、A14 、B11 、B14 、C11 、C14 、D11 、D14 、A21 、~、A41 、A44 、B41 、B44 、C41 、C44 、D41 、D44 ,規定短邊方向分割預定線S之位置的對準圖案亦同樣地形成。此種封裝基板11之應變大,且如第3圖所示,分割預定線S亦常常會彎曲成圓弧狀。Further, in the package substrate 11, an alignment pattern is formed at a position other than the block A to D every predetermined line S. Here, when focusing on the longitudinal direction of the package substrate 11, the longitudinal direction dividing line is defined. The alignment pattern at the position of S is formed as blocks A to D, such as A 11 , A 14 , B 11 , B 14 , C 11 , C 14 , D 11 , D 14 , A 21 , ~, A 41 , A 44 , B 41 , B 44 , C 41 , C 44 , D 41 , and D 44 , and an alignment pattern defining the position of the predetermined line S in the short-side direction is also formed in the same manner. The strain of the package substrate 11 is large, and as shown in Fig. 3, the planned dividing line S is often curved in an arc shape.

首先,欲切削被保持於夾頭台12上之封裝基板11時,最初必須進行應切削分割預定線與切削刀片21之Y軸方向的定位,故,藉由切削進給機構50使夾頭台12朝X軸方向移動,同時藉由分度進給機構70使攝影機構13朝Y軸方向移動,且將封裝基板11定位於攝影機構13之正下方,並將封 裝基板11之表面進行攝影。First, when the package substrate 11 held on the chuck table 12 is to be cut, it is necessary to first position the cutting-to-cut dividing line and the Y-axis direction of the cutting insert 21, so that the chuck table is cut by the cutting feed mechanism 50. 12 moves in the X-axis direction while moving the photographing mechanism 13 in the Y-axis direction by the index feeding mechanism 70, and positions the package substrate 11 directly under the photographing mechanism 13, and seals The surface of the substrate 11 is mounted for photographing.

在此,將各對準圖案依序地進行攝影並求取各對準圖案之X座標及Y座標,藉此,測定被保持於夾頭台12上之封裝基板11之區塊A~D單位所有分割預定線S相對於X軸方向的傾斜角度,舉例言之,如第4圖所示,藉由求取區塊A之對準圖案A11 、A14 之座標,求取分割預定線S11 相對於X軸方向之傾斜角度θ11 ,並使其記憶在未圖示之記憶體中。又,藉由求取區塊B之對準圖案B11 、B14 之座標,求取分割預定線S12 相對於X軸方向之傾斜角度θ12 ,且藉由求取區塊C之對準圖案C11 、C14 之座標,求取分割預定線S13 相對於X軸方向之傾斜角度θ13 ,並藉由求取區塊D之對準圖案D11 、D14 之座標,求取分割預定線S14 相對於X軸方向之傾斜角度θ14 ,且使其記憶在未圖示之記憶體中。以下有關分割預定線S21 ~S44 亦同樣地求取傾斜角度,並使其記憶在未圖示之記憶體中,短邊方向之分割預定線亦依據對準圖案之座標,分別求取相對於Y軸方向之傾斜角度,並使其記憶在未圖示之記憶體中。Here, each of the alignment patterns is sequentially photographed, and the X coordinate and the Y coordinate of each alignment pattern are obtained, thereby measuring the block A to D unit of the package substrate 11 held on the chuck table 12. For example, as shown in FIG. 4, the division line S is obtained by ascertaining the coordinates of the alignment patterns A 11 and A 14 of the block A as shown in FIG. 4 . inclination angle 11 with respect to the X-axis direction of θ 11, and so the memory in the memory (not shown). Further, by determining the coordinates of the alignment patterns B 11 and B 14 of the block B, the inclination angle θ 12 of the division planned line S 12 with respect to the X-axis direction is obtained, and the alignment of the block C is obtained. The coordinates of the patterns C 11 and C 14 are obtained by obtaining the inclination angle θ 13 of the division planned line S 13 with respect to the X-axis direction, and the division is obtained by finding the coordinates of the alignment patterns D 11 and D 14 of the block D. a line S 14 with respect to the X-axis direction of the inclination angle θ 14, and so the memory in the memory (not shown). Similarly, the predetermined dividing lines S 21 to S 44 are similarly obtained by the tilt angle, and are stored in a memory (not shown). The dividing line in the short-side direction is also determined according to the coordinates of the alignment pattern. The angle of inclination in the Y-axis direction is stored in a memory not shown.

其次,利用所測定一區塊寬之分割預定線之角度,依序地進行分割預定線之切削,在此,說明長邊方向之切削。首先,如第5(a)圖所示,藉由旋轉機構14,就傾斜角度θ11 份使夾頭台12旋轉,藉此,將區塊A用之最初分割預定線S11 作成與X軸方向平行。又,藉由分度進給機構70,使切削機構20朝Y軸方向移動,藉此,使切削刀片21之Y座標位置與分割預定線S11 一致。又,於該狀態下,藉由切削進給機構 50,使夾頭台12朝-X軸方向移動,同時藉由切入進給機構60使切削機構20下降,且使高速旋轉之切削刀片21自封裝基板11端部之剩餘連結部E切入,並進行區塊A用一區塊份之切削進給,藉此,形成依從區塊A用之分割預定線S11 的分裂部(切削溝)K11Next, the cutting of the planned dividing line is sequentially performed by the angle of the predetermined dividing line of the measured block width, and the cutting in the longitudinal direction will be described here. First, as shown in FIG. 5 (a) of FIG, 14 by the rotation mechanism, the tilt angle θ 11 parts to enable rotation of the chuck table 12, whereby the first block A with the dividing lines S 11 made with the X-axis The directions are parallel. And, by indexing means 70, the cutting mechanism 20 in the Y-axis direction, whereby the cutting insert 21 of the Y coordinate position coincides with a predetermined dividing line S 11. Further, in this state, the cutting stage 12 is moved in the -X-axis direction by the cutting feed mechanism 50, and the cutting mechanism 20 is lowered by the cutting feed mechanism 60, and the cutting blade 21 which is rotated at a high speed is self-rotating. The remaining connecting portion E of the end portion of the package substrate 11 is cut in, and the cutting of the block A by one block is performed, whereby the split portion (cutting groove) K of the dividing line S 11 for the block A is formed. 11 .

然後,若結束區塊A用一區塊寬度份之分割預定線S11 之全片切削,並到達與相鄰之下個區塊B間的剩餘連結部E,則藉由切入進給機構60使切削機構20朝上方暫時地退出,藉此,中斷切削動作。又,藉由旋轉機構14,就與分割預定線S11 間之相對角度(θ1211 )份使夾頭台12旋轉,藉此,如第5(b)圖所示,將區塊B用之分割預定線S12 作成與X軸方向平行。又,藉由分度進給機構70,使切削機構20朝Y軸方向移動,藉此,使切削刀片21之Y座標位置與分割預定線S12 一致。又,於該狀態下,藉由切削進給機構50,使夾頭台12朝-X軸方向移動,同時藉由切入進給機構60使切削機構20下降,且使高速旋轉之切削刀片21自封裝基板11之區塊A、B間之剩餘連結部E再度地切入,並進行區塊B用一區塊份之切削進給,藉此,形成依從區塊B用之分割預定線S12 的分裂部K12Then, if the end block A is cut by the entire piece of the dividing line S 11 of one block width portion and reaches the remaining joint portion E between the adjacent lower block B, the cutting mechanism 60 is cut by the feed mechanism 60. The cutting mechanism 20 is temporarily withdrawn upward, whereby the cutting operation is interrupted. Further, by the rotation mechanism 14, the chuck table 12 is rotated at a relative angle (θ 12 - θ 11 ) between the predetermined line S 11 and the block 12 is rotated as shown in Fig. 5(b). The dividing line S 12 for B is made parallel to the X-axis direction. And, by indexing means 70, the cutting mechanism 20 in the Y-axis direction, whereby the cutting insert 21 of the Y coordinate position coincides with a predetermined dividing line S 12. Further, in this state, the cutting stage 12 is moved in the -X-axis direction by the cutting feed mechanism 50, and the cutting mechanism 20 is lowered by the cutting feed mechanism 60, and the cutting blade 21 which is rotated at a high speed is self-rotating. The remaining connection portion E between the blocks A and B of the package substrate 11 is again cut in, and the block B is subjected to cutting feed by one block, thereby forming the dividing line S 12 for the block B. Splitting part K 12 .

然後,若結束區塊B用一區塊寬度份之分割預定線S12 之全片切削,並到達與相鄰之下個區塊C間的剩餘連結部E,則藉由切入進給機構60使切削機構20朝上方暫時地退出,藉此,中斷切削動作。又,藉由旋轉機構14,就與分割預定線S12 間之相對角度(θ1312 )份使夾頭台12旋轉,藉 此,如第5(c)圖所示,將區塊C用之分割預定線S13 作成與X軸方向平行。又,藉由分度進給機構70,使切削機構20朝Y軸方向移動,藉此,使切削刀片21之Y座標位置與分割預定線S13 一致。又,於該狀態下,藉由切削進給機構50,使夾頭台12朝-X軸方向移動,同時藉由切入進給機構60使切削機構20下降,且使高速旋轉之切削刀片21自封裝基板11之區塊B、C間之剩餘連結部E再度地切入,並進行區塊C用一區塊份之切削進給,藉此,形成依從區塊C用之分割預定線S13 的分裂部K13Then, if the end block B is cut by the entire piece of the dividing line S 12 of one block width portion and reaches the remaining joint portion E between the adjacent lower block C, the cutting mechanism 60 is cut by the feed mechanism 60. The cutting mechanism 20 is temporarily withdrawn upward, whereby the cutting operation is interrupted. Further, by the rotation mechanism 14, the chuck table 12 is rotated by the relative angle (θ 13 - θ 12 ) between the planned dividing line S 12 and the block 12 is rotated as shown in Fig. 5(c). The dividing line S 13 for C is made parallel to the X-axis direction. And, by indexing means 70, the cutting mechanism 20 in the Y-axis direction, whereby the cutting insert 21 of the Y coordinate position coincides with a predetermined dividing line S 13. Further, in this state, the cutting stage 12 is moved in the -X-axis direction by the cutting feed mechanism 50, and the cutting mechanism 20 is lowered by the cutting feed mechanism 60, and the cutting blade 21 which is rotated at a high speed is self-rotating. The remaining connecting portion E between the blocks B and C of the package substrate 11 is again cut in, and the cutting of the block C is performed by one block, thereby forming the dividing line S 13 for the compliant block C. Splitting part K 13 .

再者,若結束區塊C用一區塊寬度份之分割預定線S13 之全片切削,並到達與相鄰之下個區塊D間的剩餘連結部E,則藉由切入進給機構60使切削機構20朝上方暫時地退出,藉此,中斷切削動作。又,藉由旋轉機構14,就與分割預定線S13 間之相對角度(θ1413 )份使夾頭台12旋轉,藉此,如第5(d)圖所示,將區塊D用之分割預定線S14 作成與X軸方向平行。又,藉由分度進給機構70,使切削機構20朝Y軸方向移動,藉此,使切削刀片21之Y座標位置與分割預定線S14 一致。又,於該狀態下,藉由切削進給機構50,使夾頭台12朝-X軸方向移動,同時藉由切入進給機構60使切削機構20下降,且使高速旋轉之切削刀片21自封裝基板11之區塊C、D間之剩餘連結部E再度地切入,並進行區塊D用一區塊份之切削進給,藉此,形成依從區塊D用之分割預定線S14 的分裂部K14Furthermore, if the end block C is cut by a whole piece of the predetermined dividing line S 13 of one block width portion and reaches the remaining joint portion E between the adjacent lower block D, the cutting feed mechanism is cut by 60 causes the cutting mechanism 20 to temporarily exit upward, thereby interrupting the cutting operation. Further, by the rotation mechanism 14, the chuck table 12 is rotated by the relative angle (θ 14 - θ 13 ) between the predetermined line S 13 and the block 12 is rotated as shown in Fig. 5(d). The dividing line S 14 for D is made parallel to the X-axis direction. And, by indexing means 70, the cutting mechanism 20 in the Y-axis direction, whereby the cutting insert 21 of the Y coordinate position coincides with a predetermined dividing line S 14. Further, in this state, the cutting stage 12 is moved in the -X-axis direction by the cutting feed mechanism 50, and the cutting mechanism 20 is lowered by the cutting feed mechanism 60, and the cutting blade 21 which is rotated at a high speed is self-rotating. The remaining connecting portion E between the blocks C and D of the package substrate 11 is again cut in, and the cutting of the block D is performed by one block, thereby forming the dividing line S 14 for the compliant block D. Splitting part K 14 .

以後,針對各分割預定線S21 ~S44 亦反覆同樣之動作, 藉此,如第6圖所示,形成依從長邊方向之各分割預定線S11 ~S44 的分裂部K11 ~K44 。另,依從短邊方向之各分割預定線之切削處理係如習知般進行。In the following, the same operation is repeated for each of the division planned lines S 21 to S 44 , whereby the splitting portions K 11 to K of the respective divided planned lines S 11 to S 44 in the longitudinal direction are formed as shown in Fig. 6 . 44 . Further, the cutting process in accordance with each of the predetermined dividing lines in the short-side direction is performed as is conventional.

即,若於封裝基板11上未具有應變時,舉例言之,分割預定線S11 、S12 、S13 、S14 部分可作成一條連續之分割預定線而藉由切削刀片21連續地切削,然而,於本實施形態中,考慮因封裝基板11之應變所造成之彎曲等,將一條應連續分割預定線作成分割預定線S11 、S12 、S13 、S14 而分割成複數線份,且每線份地決定其位置或角度,並依據其位置資訊或角度資訊,利用區塊單位之切碎機切削方式進行切削。在此,將一條應連續分割預定線分割成複數線份之邊界係作成區塊間之寬度6.5mm之剩餘連結部E,藉此,可將在一條應連續分割預定線途中改變角度所造成之影響作成最小限度。That is, if there is no strain on the package substrate 11, for example, the portions of the predetermined dividing lines S 11 , S 12 , S 13 , and S 14 can be formed as a continuous dividing line to be continuously cut by the cutting insert 21, However, in the present embodiment, in consideration of the bending or the like due to the strain of the package substrate 11, a predetermined line to be continuously divided is divided into predetermined dividing lines S 11 , S 12 , S 13 , and S 14 and divided into a plurality of lines. And each position determines its position or angle, and according to its position information or angle information, the cutting is performed by the chopper cutting method of the block unit. Here, a boundary line which is divided into a plurality of lines to be divided into a plurality of lines is formed as a remaining joint portion E having a width of 6.5 mm between the blocks, whereby the angle can be changed while a line is to be continuously divided into a predetermined line. The impact is minimal.

依此,若藉由本實施形態之封裝基板11之分割方法,則由於在藉由剩餘連結部E連結之長邊側係以區塊單位測定傾斜角度,且利用一區塊寬之分割預定線之角度依序地改變封裝基板11之旋轉角度並進行切削,因此,即使於應變大之封裝基板11時,亦可藉由良好精度進行切削加工。又,由於在每次一區塊寬度份之切削時皆反覆使切削刀片21暫時地朝上方退出再使其於剩餘連結部E切入之動作,因此可直接於具有應變之一片封裝基板11之狀態下有效地進行處理。According to this, in the method of dividing the package substrate 11 of the present embodiment, the inclination angle is measured in the block unit on the long side connected by the remaining connection portion E, and the division line by one block width is used. Since the angle of rotation of the package substrate 11 is sequentially changed and cut, the cutting process can be performed with good precision even when the package substrate 11 having a large strain is used. Further, since the cutting blade 21 is temporarily pulled upward and then cut in the remaining connecting portion E at the time of cutting each of the block width portions, it can be directly in the state of having the strained one-piece package substrate 11. The processing is effectively performed.

本發明並未限於前述實施形態,只要是未脫離本發明 旨趣之範圍,則可進行各種變形,舉例言之,本實施形態係讀取所有對準圖案之座標並測定各分割預定線之位置、角度,然而,舉例言之,關於區塊A,亦可讀取配置於區塊A對邊之各二個對準圖案A11 、A14 、A41 、A44 之座標並測定其距離,且藉由分割預定線數進行等分割,藉此,決定分割預定線S11 、S21 、S31 、S41 之位置、角度。The present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the scope of the present invention. For example, in the present embodiment, the coordinates of all the alignment patterns are read and the positions of the respective division lines are measured. Angle, however, for example, with respect to the block A, the coordinates of the two alignment patterns A 11 , A 14 , A 41 , A 44 disposed on the opposite sides of the block A can also be read and measured, and By dividing the predetermined number of lines into equal divisions, the positions and angles of the division planned lines S 11 , S 21 , S 31 , and S 41 are determined.

又,本實施形態係說明如CSP基板之封裝基板11的適用例,然而,亦可為QFN基板,再者,被稱作次世代CSP之晶圓級CSP (WL-CSP)等亦可同樣地適用。In the present embodiment, an application example of the package substrate 11 such as a CSP substrate will be described. However, a QFN substrate may be used. Further, a wafer level CSP (WL-CSP) called a next-generation CSP may be similarly used. Be applicable.

10‧‧‧切削裝置10‧‧‧ cutting device

11‧‧‧封裝基板11‧‧‧Package substrate

11a‧‧‧元件11a‧‧‧ components

12‧‧‧夾頭台12‧‧‧ chuck table

13‧‧‧攝影機構13‧‧‧Photography

14‧‧‧旋轉機構14‧‧‧Rotating mechanism

15,18‧‧‧移動基台15,18‧‧‧Mobile abutments

16‧‧‧支持部16‧‧‧Support Department

17‧‧‧壁部17‧‧‧ wall

20‧‧‧切削機構20‧‧‧ cutting mechanism

21‧‧‧切削刀片21‧‧‧Cutting inserts

22‧‧‧主軸22‧‧‧ Spindle

23‧‧‧外殼23‧‧‧ Shell

30‧‧‧控制機構30‧‧‧Control agency

50‧‧‧切削進給機構50‧‧‧ cutting feed mechanism

51,61,71‧‧‧滾珠螺桿51,61,71‧‧‧ball screw

52,62,72‧‧‧脈衝馬達52,62,72‧‧‧pulse motor

53,63,73‧‧‧導軌53,63,73‧‧‧guide

60‧‧‧切入進給機構60‧‧‧ cut into the feeding institution

70‧‧‧分度進給機構70‧‧‧分分进机构

A,B,C,D‧‧‧區塊A, B, C, D‧‧‧ blocks

E‧‧‧剩餘連結部E‧‧‧ remaining link

F‧‧‧框體F‧‧‧ frame

K‧‧‧分裂部K‧‧‧ splitting department

S‧‧‧分割預定線S‧‧‧ dividing line

T‧‧‧保持帶T‧‧‧Retaining belt

第1圖係顯示適用本發明實施形態之封裝基板之分割方法的切削裝置例之外觀透視圖。Fig. 1 is an external perspective view showing an example of a cutting device to which a method of dividing a package substrate according to an embodiment of the present invention is applied.

第2圖係顯示抽出第1圖之切削機構周圍之構造的透視圖。Fig. 2 is a perspective view showing the configuration around the cutting mechanism of Fig. 1 taken out.

第3圖係顯示封裝基板之概略平面圖。Fig. 3 is a schematic plan view showing a package substrate.

第4圖係顯示有關封裝基板之分割預定線測定結果例之概略平面圖。Fig. 4 is a schematic plan view showing an example of measurement results of a dividing line of the package substrate.

第5(a)至5(d)圖係依序地顯示封裝基板之分割處理例之概略平面圖。The fifth (a) to (d) drawings sequentially show a schematic plan view of a division processing example of the package substrate.

第6圖係顯示封裝基板上所形成之分裂部例之概略平面圖。Fig. 6 is a schematic plan view showing an example of a split portion formed on a package substrate.

11‧‧‧封裝基板11‧‧‧Package substrate

A,B,C,D‧‧‧區塊A, B, C, D‧‧‧ blocks

E‧‧‧剩餘連結部E‧‧‧ remaining link

K11 , K12 , K13 , K14 ‧‧‧分裂部K 11 , K 12 , K 13 , K 14 ‧ ‧ division

Claims (1)

一種封裝基板之分割方法,係使用切削裝置將封裝基板分割成各個封裝元件,且前述封裝基板係將藉由分割預定線劃分形成預定數複數元件之區塊排列二塊以上且藉由剩餘連結部連結而形成者,又,前述切削裝置包含有:夾頭台,係保持前述封裝基板且可調整旋轉角度者;切削機構,係具有切削被保持於該夾頭台上之前述封裝基板之切削刀片,且可相對於前述夾頭台之表面朝垂直方向切入、退出者;切削進給機構,係進行切削進給,使前述夾頭台與前述切削機構相對地朝切削進給方向移動者;及分度進給機構,係進行分度進給,使前述夾頭台與前述切削機構相對地朝與前述切削進給方向正交之分度進給方向移動者,又,該封裝基板之分割方法包含有:測定程序,係測定被保持於前述夾頭台上之前述封裝基板之前述區塊單位所有分割預定線之角度;及切削程序,係利用所測定一區塊寬之分割預定線之角度,依序地進行分割預定線之切削,且,於前述切削程序中,在進行前述區塊藉由前述剩餘連結部朝前述切削進給方向排列、連結二塊以上之方向之切削時,反覆進行以下一連串動作,即:前述切削刀片切入前述剩餘連結部並進行一區塊之切削進給,若該切削刀片到達相鄰之前述剩餘連結部,則前述切削機構朝上方暫時地退出。A method for dividing a package substrate, wherein the package substrate is divided into individual package components by using a cutting device, and the package substrate is formed by dividing a predetermined number of blocks by a predetermined dividing line to form two or more blocks and by remaining connecting portions Further, the cutting device includes: a chuck table that holds the package substrate and adjusts a rotation angle; and the cutting mechanism includes a cutting blade that cuts the package substrate held on the chuck table And cutting in and out with respect to the surface of the chuck table in a vertical direction; the cutting feed mechanism performs cutting feed to move the chuck table relative to the cutting mechanism in a cutting feed direction; and The indexing feed mechanism performs indexing feed so that the chuck table and the cutting mechanism move toward the index feed direction orthogonal to the cutting feed direction, and the package substrate is divided. The method includes: measuring a method of measuring an angle of all dividing lines of the block unit of the package substrate held on the chuck table; The cutting program sequentially cuts the predetermined dividing line by the angle of the predetermined dividing line of the measured block width, and in the cutting process, the cutting is performed by the remaining connecting portion toward the cutting When the feed direction is arranged and the cutting is performed in a direction in which two or more pieces are joined, the following series of operations are repeated: the cutting insert cuts into the remaining joint portion and performs cutting feed of one block, if the cutting insert reaches the adjacent one In the remaining connecting portion, the cutting mechanism temporarily exits upward.
TW97122145A 2007-08-10 2008-06-13 Segmentation method of packaging substrate TWI431677B (en)

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