TWI410973B - Memory device program window adjustment - Google Patents
Memory device program window adjustmentInfo
- Publication number
- TWI410973B TWI410973B TW097139781A TW97139781A TWI410973B TW I410973 B TWI410973 B TW I410973B TW 097139781 A TW097139781 A TW 097139781A TW 97139781 A TW97139781 A TW 97139781A TW I410973 B TWI410973 B TW I410973B
- Authority
- TW
- Taiwan
- Prior art keywords
- window
- program
- memory device
- programming
- erase
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
- G06F12/02—Addressing or allocation; Relocation
- G06F12/0223—User address space allocation, e.g. contiguous or non contiguous base addressing
- G06F12/023—Free address space management
- G06F12/0238—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
- G06F12/0246—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2212/00—Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
- G06F2212/72—Details relating to flash memory management
- G06F2212/7211—Wear leveling
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Read Only Memory (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/873,894 US8117375B2 (en) | 2007-10-17 | 2007-10-17 | Memory device program window adjustment |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200926173A TW200926173A (en) | 2009-06-16 |
TWI410973B true TWI410973B (en) | 2013-10-01 |
Family
ID=40564637
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW102102532A TWI502592B (zh) | 2007-10-17 | 2008-10-16 | 記憶體裝置程式窗調整 |
TW097139781A TWI410973B (en) | 2007-10-17 | 2008-10-16 | Memory device program window adjustment |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW102102532A TWI502592B (zh) | 2007-10-17 | 2008-10-16 | 記憶體裝置程式窗調整 |
Country Status (5)
Country | Link |
---|---|
US (3) | US8117375B2 (zh) |
KR (1) | KR101154563B1 (zh) |
CN (2) | CN101821812B (zh) |
TW (2) | TWI502592B (zh) |
WO (1) | WO2009052273A1 (zh) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8014196B2 (en) * | 2008-08-28 | 2011-09-06 | Agere Systems Inc. | Reduced-power programming of multi-level cell (MLC) memory |
US8386884B2 (en) * | 2009-07-14 | 2013-02-26 | Macronix International Co., Ltd. | Memory apparatus with multi-level cells and operation method thereof |
KR101617810B1 (ko) | 2009-08-24 | 2016-05-03 | 삼성전자주식회사 | 불휘발성 메모리 장치, 그것의 프로그램 방법, 그리고 그것을 포함하는 메모리 시스템 |
KR101655306B1 (ko) | 2010-02-24 | 2016-09-07 | 삼성전자주식회사 | 메모리 시스템 및 그것의 액세스 방법 |
CN102456405A (zh) * | 2010-11-02 | 2012-05-16 | 上海华虹集成电路有限责任公司 | 一种应用于Flash EEPROM的动态参考源电路 |
US20130006896A1 (en) * | 2011-06-28 | 2013-01-03 | Seagate Technology Llc | Training Datasets for Memory Devices |
US8687431B2 (en) * | 2011-07-06 | 2014-04-01 | Micron Technology, Inc. | Programming methods and memories |
US8902648B2 (en) | 2011-07-26 | 2014-12-02 | Micron Technology, Inc. | Dynamic program window determination in a memory device |
US9030870B2 (en) | 2011-08-26 | 2015-05-12 | Micron Technology, Inc. | Threshold voltage compensation in a multilevel memory |
US9076547B2 (en) | 2012-04-05 | 2015-07-07 | Micron Technology, Inc. | Level compensation in multilevel memory |
CN102298971B (zh) * | 2011-08-29 | 2014-05-21 | 南京大学 | 一种非挥发性快闪存储器高密度多值存储的操作方法 |
US8990644B2 (en) * | 2011-12-22 | 2015-03-24 | Micron Technology, Inc. | Apparatus and methods of programming memory cells using adjustable charge state level(s) |
US9164836B2 (en) * | 2011-12-28 | 2015-10-20 | Intel Corporation | Cycling endurance extending for memory cells of a non-volatile memory array |
US9430322B2 (en) * | 2012-08-02 | 2016-08-30 | Sandisk Technologies Llc | Device based wear leveling using intrinsic endurance |
US8971128B2 (en) | 2013-01-31 | 2015-03-03 | Sandisk Technologies Inc. | Adaptive initial program voltage for non-volatile memory |
US8879324B2 (en) * | 2013-02-01 | 2014-11-04 | Lsi Corporation | Compensation loop for read voltage adaptation |
KR102127105B1 (ko) | 2013-11-11 | 2020-06-29 | 삼성전자 주식회사 | 비휘발성 메모리 장치의 구동 방법 |
US9312010B1 (en) | 2014-10-07 | 2016-04-12 | Sandisk Technologies Inc. | Programming of drain side word line to reduce program disturb and charge loss |
CN105679368A (zh) * | 2016-01-15 | 2016-06-15 | 上海华虹宏力半导体制造有限公司 | 一种通过调整SONOS字线读电压增加flash窗口的方法 |
JP6249504B1 (ja) * | 2016-08-24 | 2017-12-20 | ウィンボンド エレクトロニクス コーポレーション | 半導体記憶装置 |
US11081170B2 (en) | 2018-12-19 | 2021-08-03 | Micron Technology, Inc. | Apparatus and methods for programming memory cells responsive to an indication of age of the memory cells |
CN110176269B (zh) * | 2019-04-16 | 2020-11-17 | 华中科技大学 | 一种精确调控非易失性存储单元状态的方法及系统 |
US11568942B2 (en) * | 2019-05-31 | 2023-01-31 | Micron Technology, Inc. | Using internal block variables and known pattern information to perform dynamic erase operation in non-volatile memory |
CN113906511A (zh) * | 2019-05-31 | 2022-01-07 | 美光科技公司 | 非易失性存储器装置中的数据读取与编程的安全性及正确性的改进 |
US11004525B1 (en) * | 2020-02-20 | 2021-05-11 | Sandisk Technologies Llc | Modulation of programming voltage during cycling |
US11776629B2 (en) * | 2020-08-17 | 2023-10-03 | Micron Technology, Inc. | Threshold voltage based on program/erase cycles |
US11017142B1 (en) * | 2020-09-02 | 2021-05-25 | Arm Limited | Methods and apparatuses of configurable integrated circuits |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6163484A (en) * | 1998-04-27 | 2000-12-19 | Nec Corporation | Non-volatile semiconductor storage device having improved program/erase/over erase verify |
TW200301487A (en) * | 2001-12-21 | 2003-07-01 | Motorola Inc | Non-volatile memory and method for operating a non-volatile memory |
JP2003242787A (ja) * | 2002-02-14 | 2003-08-29 | Mitsubishi Electric Corp | 不揮発性半導体記憶装置 |
US20060221708A1 (en) * | 2005-03-31 | 2006-10-05 | Masaaki Higashitani | Erasing non-volatile memory utilizing changing word line conditions to compensate for slower erasing memory cells |
TW200701235A (en) * | 2005-01-13 | 2007-01-01 | Spansion Llc | Multi-level ono flash program algorithm for thereshold width control |
US20070025157A1 (en) * | 2005-08-01 | 2007-02-01 | Jun Wan | Method for programming non-volatile memory with self-adjusting maximum program loop |
US7218552B1 (en) * | 2005-09-09 | 2007-05-15 | Sandisk Corporation | Last-first mode and method for programming of non-volatile memory with reduced program disturb |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6917542B2 (en) * | 2003-07-29 | 2005-07-12 | Sandisk Corporation | Detecting over programmed memory |
KR100632940B1 (ko) * | 2004-05-06 | 2006-10-12 | 삼성전자주식회사 | 프로그램 사이클 시간을 가변시킬 수 있는 불 휘발성반도체 메모리 장치 |
US7149121B2 (en) * | 2005-01-26 | 2006-12-12 | Macronix International Co., Ltd. | Method and apparatus for changing operating conditions of nonvolatile memory |
US7339834B2 (en) | 2005-06-03 | 2008-03-04 | Sandisk Corporation | Starting program voltage shift with cycling of non-volatile memory |
US7495966B2 (en) | 2006-05-01 | 2009-02-24 | Micron Technology, Inc. | Memory voltage cycle adjustment |
US7568135B2 (en) * | 2006-05-15 | 2009-07-28 | Apple Inc. | Use of alternative value in cell detection |
JP2008047273A (ja) * | 2006-07-20 | 2008-02-28 | Toshiba Corp | 半導体記憶装置およびその制御方法 |
US7904788B2 (en) * | 2006-11-03 | 2011-03-08 | Sandisk Corporation | Methods of varying read threshold voltage in nonvolatile memory |
-
2007
- 2007-10-17 US US11/873,894 patent/US8117375B2/en active Active
-
2008
- 2008-10-16 CN CN200880111474.6A patent/CN101821812B/zh active Active
- 2008-10-16 CN CN201310359173.8A patent/CN103425593B/zh active Active
- 2008-10-16 KR KR1020107008372A patent/KR101154563B1/ko active IP Right Grant
- 2008-10-16 WO PCT/US2008/080145 patent/WO2009052273A1/en active Application Filing
- 2008-10-16 TW TW102102532A patent/TWI502592B/zh active
- 2008-10-16 TW TW097139781A patent/TWI410973B/zh active
-
2012
- 2012-01-17 US US13/351,525 patent/US8307152B2/en active Active
- 2012-09-07 US US13/606,471 patent/US8713246B2/en active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6163484A (en) * | 1998-04-27 | 2000-12-19 | Nec Corporation | Non-volatile semiconductor storage device having improved program/erase/over erase verify |
TW200301487A (en) * | 2001-12-21 | 2003-07-01 | Motorola Inc | Non-volatile memory and method for operating a non-volatile memory |
JP2003242787A (ja) * | 2002-02-14 | 2003-08-29 | Mitsubishi Electric Corp | 不揮発性半導体記憶装置 |
TW200701235A (en) * | 2005-01-13 | 2007-01-01 | Spansion Llc | Multi-level ono flash program algorithm for thereshold width control |
US20060221708A1 (en) * | 2005-03-31 | 2006-10-05 | Masaaki Higashitani | Erasing non-volatile memory utilizing changing word line conditions to compensate for slower erasing memory cells |
US20070025157A1 (en) * | 2005-08-01 | 2007-02-01 | Jun Wan | Method for programming non-volatile memory with self-adjusting maximum program loop |
US7230854B2 (en) * | 2005-08-01 | 2007-06-12 | Sandisk Corporation | Method for programming non-volatile memory with self-adjusting maximum program loop |
US7218552B1 (en) * | 2005-09-09 | 2007-05-15 | Sandisk Corporation | Last-first mode and method for programming of non-volatile memory with reduced program disturb |
Also Published As
Publication number | Publication date |
---|---|
KR101154563B1 (ko) | 2012-06-08 |
US20090106482A1 (en) | 2009-04-23 |
TW201333960A (zh) | 2013-08-16 |
TWI502592B (zh) | 2015-10-01 |
US8307152B2 (en) | 2012-11-06 |
KR20100068451A (ko) | 2010-06-23 |
CN101821812B (zh) | 2013-09-25 |
TW200926173A (en) | 2009-06-16 |
CN101821812A (zh) | 2010-09-01 |
CN103425593B (zh) | 2016-11-09 |
US20120117313A1 (en) | 2012-05-10 |
CN103425593A (zh) | 2013-12-04 |
US20120331217A1 (en) | 2012-12-27 |
WO2009052273A1 (en) | 2009-04-23 |
US8117375B2 (en) | 2012-02-14 |
US8713246B2 (en) | 2014-04-29 |
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