TWI409119B - Insert-chip, plasma torch and plasma processing device - Google Patents

Insert-chip, plasma torch and plasma processing device Download PDF

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Publication number
TWI409119B
TWI409119B TW099118661A TW99118661A TWI409119B TW I409119 B TWI409119 B TW I409119B TW 099118661 A TW099118661 A TW 099118661A TW 99118661 A TW99118661 A TW 99118661A TW I409119 B TWI409119 B TW I409119B
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plasma
electrode
electrode arrangement
welding
arrangement space
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TW099118661A
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Chinese (zh)
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TW201129437A (en
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Shigeru Sato
Tadashi Hoshino
Kenji Okuyama
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Nippon Steel & Sumikin Welding
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Priority claimed from JP2009177371A external-priority patent/JP5441156B2/en
Priority claimed from JP2009201304A external-priority patent/JP5322859B2/en
Priority claimed from JP2010094727A external-priority patent/JP5578920B2/en
Application filed by Nippon Steel & Sumikin Welding filed Critical Nippon Steel & Sumikin Welding
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/26Plasma torches
    • H05H1/32Plasma torches using an arc
    • H05H1/34Details, e.g. electrodes, nozzles
    • H05H1/3405Arrangements for stabilising or constricting the arc, e.g. by an additional gas flow
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K10/00Welding or cutting by means of a plasma
    • B23K10/02Plasma welding
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/26Plasma torches
    • H05H1/28Cooling arrangements
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/24Generating plasma
    • H05H1/26Plasma torches
    • H05H1/32Plasma torches using an arc
    • H05H1/34Details, e.g. electrodes, nozzles
    • H05H1/3457Nozzle protection devices

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mechanical Engineering (AREA)
  • Plasma Technology (AREA)
  • Arc Welding In General (AREA)

Abstract

PURPOSE: An insert chip, a plasma torch, and a plasma processing apparatus are provided to form one fusion pool with a plurality of arcs by using a plasma torch installed with the insert chip. CONSTITUTION: A chip(1) comprises an opening accepting the electrode on the top. A plurality of electrode arrangement spaces(1a, 1b) is expanded from the opening to the lower end surface of the chip. A plurality of openings(4a, 4b) is distributed along the line perpendicular to the central axis. The openings are formed downward.

Description

嵌入式晶片、電漿火炬及電漿加工裝置Embedded wafer, plasma torch and plasma processing device

本發明係關於一種電漿火炬之嵌入式晶片、使用該嵌入式晶片之電漿火炬,及使用該電漿火炬之電漿加工裝置。The present invention relates to an embedded wafer for a plasma torch, a plasma torch using the embedded wafer, and a plasma processing apparatus using the same.

【背景技術】【Background technique】

電漿火炬具配合熔接、厚壁、切斷等之高熱加工種類之各種形態。於專利文獻1中記載於電極棒10之前端正下方,由側方開始送入線16,對於位處於電極棒前端下方之母材(加工目標材),進行電漿熔接、加熱線形態之電漿熔接、電漿MIG熔接或電漿線厚壁之方法。於專利文獻2中記載由嵌入式晶片111中央之送線通孔,呈垂直地送出線153至下方之母材,藉由平行於線以配置於該線之側方之電極棒126,而將晶片111之下部之該送線通孔打開之電漿孔113,噴射電漿,熔解線前端之電漿MIG熔接火炬。專利文獻3中記載於中心位置以配置電極棒之嵌入式晶片1之電漿噴嘴之下方,由側方以送入線3之加熱線形態之電漿熔接方法及電漿線厚壁方法。專利文獻4中記載朝向嵌入式晶片33之中心位置以配置電極棒之電漿火炬之電漿形成之坑池,由該電漿火炬之側方,傳送供應成為消耗電極之線39之電漿MIG熔接。專利文獻5中記載通過嵌入式晶片9之電漿噴射噴嘴之上方且配置於中心之有底筒狀電漿電極8之成為中心孔之底孔及其下方之噴嘴電漿噴射噴嘴而呈垂直地傳送供應線至下方之母材,藉由電漿電極8生成之電漿而熔解該線之電漿MIG熔接方法。The plasma torch has various forms of high-heat processing types such as welding, thick-walling, and cutting. In Patent Document 1, it is described immediately below the front end of the electrode rod 10, and the feed line 16 is started from the side, and the base material (processing target material) positioned below the tip end of the electrode rod is plasma-welded and heated in the form of a plasma. A method of welding, plasma MIG welding or thickening of plasma lines. Patent Document 2 describes a wire feed hole in the center of the embedded wafer 111, and vertically feeds the wire 153 to the base material below, and the electrode bar 126 disposed on the side of the wire is parallel to the wire. The plasma hole 113 opened by the wire through hole at the lower portion of the wafer 111 is sprayed with plasma, and the plasma MIG welding torch at the front end of the melting line is welded. Patent Document 3 describes a plasma welding method and a plasma line thickening method in which a plasma nozzle of an embedded wafer 1 of an electrode rod is disposed at a center position, and a heating line of a feeding line 3 is provided at a side. Patent Document 4 describes a pit formed by plasma of a plasma torch in which an electrode rod is disposed toward a center position of the embedded wafer 33, and a plasma MIG which is supplied as a line 39 of a consumable electrode is conveyed from the side of the plasma torch. Welding. Patent Document 5 describes that the bottom hole of the bottomed cylindrical plasma electrode 8 disposed in the center of the bottomed cylindrical plasma electrode 8 and the nozzle plasma spray nozzle disposed below the plasma injection nozzle of the embedded wafer 9 is vertically The plasma supply MIG welding method is performed by transferring the supply line to the base material below and melting the plasma generated by the plasma electrode 8.

專利文獻6中記載改良藉由電漿鍵孔熔接所造成之鍵孔剖面形狀之噴嘴形狀。專利文獻7中記載相對於熔接線方向而直交於電極前端之排列以配置二電弧熔接火炬而形成一熔融坑池且藉由 各火炬所造成之同時共付熔接。專利文獻8中記載於電弧熔接之瞄準位置之前方0~2mm處之熔融坑池以照射雷射而進行鍵孔熔接之複合熔接方法(圖十五、【0024】、【0025】)。專利文獻9中記載以先行之第1雷射束進行非貫通熔接,藉由該非貫通熔接形成之孔開口,對準焦點,以第2雷射束進行貫通(鍵孔)熔接之雷射熔接方法。Patent Document 6 describes a nozzle shape which improves the cross-sectional shape of a keyhole caused by welding of a plasma keyhole. Patent Document 7 describes an arrangement in which the two arc welding torches are arranged perpendicular to the welding electrode direction to form a molten pit pool. The torch is caused by the simultaneous welding. Patent Document 8 describes a composite welding method in which a molten pool of 0 to 2 mm in front of an aiming position of arc welding is subjected to keyhole welding by irradiating a laser (FIG. 15, [0024], [0025]). Patent Document 9 describes a laser welding method in which a first laser beam is not penetrated by a first laser beam, and a hole opening formed by the non-through welding is used to align a focus and a second laser beam is penetrated (keyhole). .

【先前技術文獻】[Previous Technical Literature] 【專利文獻】[Patent Literature]

【專利文獻1】日本專利案特公昭39-15267號公報[Patent Document 1] Japanese Patent Publication No. Sho 39-15267

【專利文獻2】日本專利案特開昭52-138038號公報[Patent Document 2] Japanese Patent Laid-Open No. 52-138038

【專利文獻3】日本專利案特開昭53-31544號公報[Patent Document 3] Japanese Patent Laid-Open Publication No. SHO 53-31544

【專利文獻4】日本專利案特表2006-519103號公報[Patent Document 4] Japanese Patent Laid-Open Publication No. 2006-519103

【專利文獻5】日本專利案特開2008-229641號公報[Patent Document 5] Japanese Patent Laid-Open Publication No. 2008-229641

【專利文獻6】日本專利案特開平8-10957號公報[Patent Document 6] Japanese Patent Publication No. 8-10957

【專利文獻7】日本專利案特開平6-155018號公報[Patent Document 7] Japanese Patent Publication No. Hei 6-150518

【專利文獻8】日本專利案特開2004-298896號公報[Patent Document 8] Japanese Patent Laid-Open Publication No. 2004-298896

【專利文獻9】日本專利案特開2008-126315號公報[Patent Document 9] Japanese Patent Laid-Open Publication No. 2008-126315

【發明之概要】[Summary of the Invention]

專利文獻1~4中之任何一種熔接方法及電漿火炬係亦使用一電極棒及一條線,於形成於該電極棒及母材間之電漿流,由電極棒/母材間之側方,傳送供應線進行通電,因此,藉由以線電流而產生之磁通量及以電漿電流而產生之磁通量之相互作用,產生磁性不平衡。亦即,於比起線之更加上側處(嵌入式晶片側)及比起線之更加下側處(母材側),電漿電弧狀態呈不同,線上側之 電漿係於離開線之方向,承受電弧力,線下側之電漿係於接近線之方向,承受電弧力。隨著線前端熔融之搖動,而搖動電漿相對於母材之作用位置,因此,電漿電弧呈不安定。專利文獻5中於有底筒狀電漿電極8之底孔之圓周邊緣,集中電弧,且集中點係往周圍方向移動,因此,電漿仍然搖動,電漿電極8之底孔之圓周邊緣及嵌入式晶片9之噴嘴邊緣之損耗及對熔融線之電漿電極8或對電漿噴嘴9之附著變激烈,無法維持長時間安定之熔接作業。Any of the welding methods and the plasma torch system of Patent Documents 1 to 4 also use an electrode rod and a wire for the plasma flow formed between the electrode rod and the base material, from the side between the electrode rod/base material The transmission supply line is energized, and therefore, the magnetic imbalance is generated by the interaction of the magnetic flux generated by the line current and the magnetic flux generated by the plasma current. That is, the plasma arc state is different at the upper side (the embedded wafer side) and the lower side (the base material side) than the line, and the line side is different. The plasma is in the direction of leaving the line and is subjected to the arc force. The plasma on the lower side of the line is in the direction of the line and is subjected to the arc force. As the front end of the wire is shaken and shakes, the position of the plasma relative to the base material is shaken, so that the plasma arc is unstable. In Patent Document 5, at the circumferential edge of the bottom hole of the bottomed cylindrical plasma electrode 8, the arc is concentrated, and the concentrated point is moved in the peripheral direction. Therefore, the plasma is still shaken, and the circumferential edge of the bottom hole of the plasma electrode 8 is The loss of the nozzle edge of the embedded wafer 9 and the adhesion to the plasma electrode 8 of the molten wire or to the plasma nozzle 9 become intense, and the long-term stable welding operation cannot be maintained.

藉由習知之一火炬所造成之電漿電弧熔接之電漿電弧之橫剖面係正如圖十八之(a)所示之概略圓形。因於板厚未滿3mm時,無法藉由電漿電弧而進行鍵孔熔接,而採用共付熔接(熱傳導型熔接),但即便共付熔接,亦於高速度化時,甲)發生咬邊(undercut),乙)易發生由於寬幅焊珠所造成之高溫破裂(圖十八之(b)),於高速熔接,電流係高電流而成為寬幅電弧,因此,成為寬幅淺熔入之焊珠形狀,於凝固時,易發生高溫破裂。The cross section of the plasma arc welded by the plasma arc caused by one of the conventional torches is as shown in a schematic circular shape as shown in Fig. 18(a). When the thickness of the plate is less than 3 mm, the keyhole welding cannot be performed by the plasma arc, and the co-fusion welding (thermal conduction type welding) is used. However, even if the welding is performed at a high speed, a) undercut occurs. (undercut), B) is prone to high temperature cracking caused by wide bead (Fig. 18 (b)). At high speed welding, the current is high current and becomes a wide arc, so it becomes a wide shallow fusion. The shape of the bead is prone to high temperature cracking during solidification.

藉由習知之一火炬所造成之電漿電弧熔接,於以3~10mm板厚使鍵孔熔接成為高速化時,焊珠形狀正如圖十八之(c)所示,形成中央部隆起之凸形狀且邊緣部下降之咬邊(undercut),因此,不易高速化。亦藉由二條火炬而進行單一坑池高速化,但為成為單一坑池,因此,必須大幅度地傾斜火炬間由於傾斜於相互拉引之電弧力所造成之磁吹(magnetic blow),故,電弧易散亂、變不安定。By welding the plasma arc caused by one of the conventional torches, when the keyhole is welded at a speed of 3 to 10 mm, the shape of the bead is as shown in Fig. 18(c), and the convex portion of the central portion is formed. The shape and the undercut of the edge portion are lowered, so that it is not easy to speed up. There is also a single pit pool speeding up by two torches, but in order to become a single pit pool, it is necessary to greatly tilt the magnetic blows caused by the arc forces inclined to each other between the torches. The arc is easily scattered and unstable.

本發明之目的係提供一種能以高速度以進行高品質之電漿加工之嵌入式晶片、電漿火炬及電漿加工裝置。SUMMARY OF THE INVENTION It is an object of the present invention to provide an embedded wafer, plasma torch and plasma processing apparatus that can perform high quality plasma processing at high speed.

(1)一種嵌入式晶片(1:圖三、圖十四、圖十七、圖二十一、圖二十六、圖二十七),係具備於晶片之上端面具容納非消耗電極之開口且由該開口開始朝向晶片之下端面而延伸,沿著直交於晶片中心軸分布之複數電極配置空間(1a、1b、1c),及直徑比該電極配置空間小,在該電極配置空間到達前述下端面前,連通至該電極配置空間,朝前述下端面之下方而打開之至少一個電漿電弧噴嘴(4a、4b、4c)。(1) An embedded wafer (1: Fig. 3, Fig. 14, Fig. 17, Fig. 21, Fig. 26, Fig. 27), which is provided with an opening at the upper end of the wafer to accommodate a non-consumable electrode And extending from the opening toward the lower end surface of the wafer, along a plurality of electrode arrangement spaces (1a, 1b, 1c) distributed orthogonally to the central axis of the wafer, and having a smaller diameter than the electrode arrangement space, the electrode arrangement space reaching the foregoing In front of the lower end, at least one plasma arc nozzle (4a, 4b, 4c) that is connected to the electrode arrangement space and opens below the lower end surface.

又,為易理解,因此於括號內例舉顯示於圖式且於後敘述之實施例之對應要素或相當要素之記號,附記作為參考。於以下亦相同。In addition, for the sake of easy understanding, the corresponding elements or equivalent elements of the embodiments shown in the drawings are shown in the parentheses, and the attached notes are incorporated by reference. The same is true for the following.

【發明之實施形態】Embodiment of the Invention

(2)又,前述(1)記載之嵌入式晶片(1:圖三,圖五)係尚具由前述之上端面貫通至下端面而同心於晶片中心軸之同芯中央孔(5),前述複數電極配置空間(1a、1b)係於以該中央孔之中心軸作為中心之圓周上,以等角度之間距以分布,前述電漿電弧噴嘴(4a、4b)係於以前述之中心軸作為中心之圓周上,以等角度之間距以布之複數個。(2) The embedded wafer (1: FIG. 3, FIG. 5) described in the above (1) is a core-centered hole (5) that is concentric with the central axis of the wafer from the upper end surface to the lower end surface. The plurality of electrode arrangement spaces (1a, 1b) are distributed on the circumference centered on the central axis of the central hole at equal angular intervals, and the plasma arc nozzles (4a, 4b) are attached to the aforementioned central axis. As the center of the circle, the equal distance between the equal angles is a plurality of cloths.

若藉由該嵌入式晶片,則於通過各噴嘴(4a、4b:圖五)而流動於插入至電極配置空間(1a、1b)之各電極(2a、2b)及加工目標材(16)之間之各電弧電流,分別感應之磁通量Ma、Mb之上部分係相互抵銷,因此,下部分起作用,且藉由弗萊明(Fleming)左手定則而表示之向上力起作用,電弧間係相互拉扯,成為稍微彎曲於上方之對稱形。又,於以噴嘴(4a、4b)及中央孔(5)之中心軸作為中心之圓周上,藉由等角度間距之分布,而於各力相同且以中央孔(5)之中心軸作為中心之圓周上,以等角度之間距分布,因此,電漿之安定性變高。亦即,並無由於磁 吹(magnetic blow)而發生電弧之搖晃。於加工目標材(16)之附近,各電弧電流係加算同一方向,感應合成磁通量Mc,因此,集中電弧之磁性壓緊力變強,對於加工目標材(16)之熱收縮效果(能量密度)變高,並且作用位置無搖晃。According to the embedded wafer, the respective electrodes (2a, 2b) inserted into the electrode arrangement spaces (1a, 1b) and the processing target (16) flow through the respective nozzles (4a, 4b: Fig. 5). The arc currents between the two sensed magnetic fluxes Ma and Mb respectively cancel each other out, so the lower part acts, and the upward force is expressed by the Fleming left-hand rule. Pull each other and become a symmetrical shape that is slightly curved above. Further, on the circumference centered on the central axes of the nozzles (4a, 4b) and the center hole (5), the distribution of the equiangular pitch is the same for each force and centered on the central axis of the center hole (5) On the circumference, the distance between the equiangular angles is distributed, and therefore, the stability of the plasma becomes high. That is, there is no magnetic A magnetic blow occurs and the arc is shaken. In the vicinity of the processing target material (16), each arc current is added to the same direction to induce the resultant magnetic flux Mc. Therefore, the magnetic pressing force of the concentrated arc becomes strong, and the heat shrinkage effect (energy density) for the processing target material (16) is obtained. It becomes high and the action position is not shaken.

(3)前述(2)記載之嵌入式晶片(1)係尚具備打開於連接於前述中央孔(5)並正對於加工目標材(16)之前端面,且直徑大於前述中央孔(5)之大徑之擴大口(1d),前述之噴嘴(4a、4b)係於比起前述前端面之更加內側處,打開前述之擴大口(1d)。若藉由該嵌入式晶片,則流動於插入至電極配置空間(1a、1b)之各電極(2a、2b)及加工目標材(16)之間之各電弧電流係合流於嵌入式晶片之前端面(擴大口1d之母材對向開口)之前後,因此,電漿電弧間係能以最短之近距離合流,故,能縮小由於相互之磁性干涉而造成之電弧彎曲變化,以安定之電弧提高加工精度。(3) The embedded wafer (1) according to the above (2) is further provided to be opened to be connected to the center hole (5) and to face the front end surface of the target material (16), and has a larger diameter than the center hole (5). In the enlarged opening (1d) of the large diameter, the nozzles (4a, 4b) are opened at the inner side of the front end surface, and the enlarged opening (1d) is opened. According to the embedded wafer, the arc currents flowing between the electrodes (2a, 2b) inserted into the electrode arrangement spaces (1a, 1b) and the processing target (16) are combined to flow to the front end surface of the embedded wafer. (Before expanding the opening of the base material of the port 1d), therefore, the plasma arcs can be merged at the shortest distance, so that the arc bending change due to mutual magnetic interference can be reduced, and the arc is stabilized by stability. Precision.

(4)一種電漿火炬(圖二)係具備前述(2)或(3)記載之嵌入式晶片(1),及於該嵌入式晶片(1)之於前述中央孔(5)處導引線(15)之導線件(13g、6),及於前述嵌入式晶片(1)之各電極配置空間(1a、1b)以插入前端部之複數非消耗電極(2a、2b),及用以冷卻前述嵌入式晶片(1)之冷卻水流路(9w),及用以於各電極配置空間(1a、1b)供應導向氣體之導向氣體流路(9p)。(4) A plasma torch (Fig. 2) comprising the embedded wafer (1) according to (2) or (3) above, and guiding the embedded wafer (1) at the central hole (5) a wire member (13g, 6) of the wire (15), and a plurality of electrode arrangement spaces (1a, 1b) of the embedded wafer (1) for inserting a plurality of non-consumable electrodes (2a, 2b) at the front end portion, and The cooling water flow path (9w) of the embedded wafer (1) is cooled, and a guiding gas flow path (9p) for supplying a guiding gas to each electrode arrangement space (1a, 1b).

(5)一種電漿熔接裝置(圖一)係具備前述(4)記載之電漿火炬,及於前述複數非消耗電極(2a、2b)及加工目標材(16)之間,使電極側流動負電漿電弧電流且加工目標材側流動正電漿電弧電流之電源(17、18)。(5) A plasma welding apparatus (Fig. 1) comprising the plasma torch according to (4) above, and between the plurality of non-consumable electrodes (2a, 2b) and the processing target (16), causing the electrode side to flow A negative plasma arc current and a source of positive plasma arc current flowing on the target side (17, 18).

(6)前述(5)記載之電漿熔接裝置(圖六)係於前述線(15) 及加工目標材(16)間,尚具備線側流動負電流且加工目標材側流動正電流之加熱線電源(21)。(6) The plasma welding device (Fig. 6) described in the above (5) is attached to the aforementioned line (15) Between the processing target (16), there is a heating line power supply (21) that flows a negative current on the line side and flows a positive current on the processing target side.

(7)一種電漿MIG熔接裝置(圖七)係具備前述(4)記載之電漿火炬,及於前述複數非消耗電極(2a、2b)及加工目標材(16)間,使電極側流動正電漿電弧電流且加工目標材側流動負電漿電弧電流之電源(17、18),及於前述線(15)及加工目標材(16)間,使線側流動正電流且加工目標材側流動負電流之MIG熔接電源(22)。(7) A plasma MIG welding apparatus (Fig. 7) comprising the plasma torch according to (4) above, and flowing between the plurality of non-consumable electrodes (2a, 2b) and the processing target (16) Positive plasma arc current and power source (17, 18) for flowing negative plasma arc current on the target side, and between the above line (15) and the processing target (16), the positive current flows on the line side and the target side is processed. A negative current MIG welding power supply (22).

(8)一種電漿線厚壁裝置(圖八)係具備前述(4)記載之電漿火炬,及於前述複數非消耗電極(2a、2b)及加工目標材(16)間,使電極側流動負電漿電弧電流且加工目標材側流動正電漿電弧電流之電源(17、18),及於前述線(15)及各電極(2a、2b)間,使線側流動正電流且電極側流動負電流之加熱線電源(21a、21b)。(8) A plasma-line thick-wall apparatus (Fig. 8) comprising the plasma torch described in the above (4), and between the plurality of non-consumable electrodes (2a, 2b) and the processing target (16), and the electrode side a negative negative plasma arc current and a power source (17, 18) for flowing a positive plasma arc current on the target side, and between the line (15) and each of the electrodes (2a, 2b), causing a positive current on the line side and an electrode side A heating line power source (21a, 21b) that flows a negative current.

(9)一種電漿粉體厚壁火炬(圖九)係具備前述(2)或(3)記載之嵌入式晶片(1),及於該嵌入式晶片(1)之前述中央孔(5)導引粉體(23)之粉體導向件(26),及於前述嵌入式晶片(1)之各電極配置空間(1a、1b)插入前端部之複數非消耗電極(2a、2b),及用以冷卻前述嵌入式晶片(1)之冷卻水流路(9w),及用以於各電極配置空間(1a、1b)供應導向氣體之導向氣體流路(9p)。(9) A plasma powder thick-walled torch (Fig. 9) comprising the embedded wafer (1) according to (2) or (3) above, and the central hole (5) of the embedded wafer (1) a powder guiding member (26) for guiding the powder (23), and a plurality of non-consumable electrodes (2a, 2b) inserted into the front end portion of the electrode arrangement spaces (1a, 1b) of the embedded wafer (1), and A cooling water flow path (9w) for cooling the embedded wafer (1), and a guiding gas flow path (9p) for supplying a guiding gas to each electrode arrangement space (1a, 1b).

(10)一種電漿粉體厚壁裝置(圖九)係具備前述(9)記載之電漿粉體厚壁火炬,及於前述複數非消耗電極(2a、2b)及加工目標材(16)間,使電極側流動負電漿電弧電流且加工目標材側流動正電漿電弧電流之電源(17、18),及於前述之粉體導向件(26)以供應粉體之手段(24、25)。(10) A plasma powder thick-wall apparatus (Fig. 9) comprising the plasma powder thick-walled torch according to (9) above, and the plurality of non-consumable electrodes (2a, 2b) and a processing target (16) , the power source (17, 18) for flowing the negative plasma arc current on the electrode side and the positive plasma arc current flowing on the target side, and the powder guide (26) for supplying the powder (24, 25) ).

(11)一種電漿鍵孔熔接火炬(圖十)係具備前述(2)或(3)記載之嵌入式晶片(1),及於該嵌入式晶片(1)之前述中央孔(5)以導引鍵孔氣體(27)之氣體導向件(28),及於前述嵌入式晶片(1)之各電極配置空間(1a、1b)插入前端部之複數非消耗電極(2a、2b),及用以冷卻前述嵌入式晶片(1)之冷卻水流路(9w),及用以於各電極配置空間(1a、1b)供應導向氣體之導向氣體流路(9p)。(11) A plasma keyhole welding torch (Fig. 10) comprising the embedded wafer (1) according to (2) or (3) above, and the central hole (5) of the embedded wafer (1) a gas guiding member (28) for guiding the keyhole gas (27), and a plurality of non-consumable electrodes (2a, 2b) inserted into the front end portion of the electrode arrangement spaces (1a, 1b) of the embedded wafer (1), and A cooling water flow path (9w) for cooling the embedded wafer (1), and a guiding gas flow path (9p) for supplying a guiding gas to each electrode arrangement space (1a, 1b).

(12)一種電漿鍵孔熔接裝置(圖十)係具備前述(11)記載之電漿鍵孔熔接火炬,及於前述複數非消耗電極(2a、2b)及加工目標材(16)間,使電極側流動負電漿電弧電流且加工目標材側流動正電漿電弧電流之電源(17、18)。(12) A plasma keyhole welding device (Fig. 10) comprising the plasma keyhole welding torch according to (11) above, and between the plurality of non-consumable electrodes (2a, 2b) and the processing target material (16), A power source (17, 18) that causes a negative plasma arc current to flow on the electrode side and a positive plasma arc current flows on the target side.

(13)一種電漿切斷火炬(圖十一)係具備前述(2)或(3)記載之嵌入式晶片(1),及於該嵌入式晶片(1)之前述中央孔(5)以導引切斷用氣體(29)之氣體導向件(28),及於前述嵌入式晶片(1)之各電極配置空間(1a、1b)插入前端部之複數非消耗電極(2a、2b),及用以冷卻前述嵌入式晶片(1)之冷卻水流路(9w),及用以於各電極配置空間(1a、1b)以供應導向氣體之導向氣體流路(9p)。(13) A plasma cutting torch (Fig. 11) comprising the embedded wafer (1) according to (2) or (3) above, and the central hole (5) of the embedded wafer (1) a gas guide (28) for guiding the cutting gas (29), and a plurality of non-consumable electrodes (2a, 2b) inserted into the front end portion of the electrode arrangement spaces (1a, 1b) of the embedded wafer (1), And a cooling water flow path (9w) for cooling the embedded wafer (1), and a guiding gas flow path (9p) for supplying a pilot gas to each electrode arrangement space (1a, 1b).

(14)一種電漿切斷裝置(圖十一)係具備前述(13)記載之電漿切斷火炬,及於前述複數非消耗電極(2a、2b)及加工目標材(16)間,使電極側流動負電漿電弧電流且加工目標材側流動正電漿電弧電流之電源(17、18)。即便於前述(4)~(14)中之任何一種形態,亦得前述(2)之效果。(14) A plasma cutting device (Fig. 11) comprising the plasma cutting torch according to (13) above, and between the plurality of non-consumable electrodes (2a, 2b) and the processing target (16) A negative plasma arc current flows on the electrode side and supplies a positive plasma arc current to the target side (17, 18). That is, it is convenient to use any of the above forms (4) to (14), and the effect of the above (2) is also obtained.

(15)前述(1)記載之嵌入式晶片(1),其前述複數電極配置空間(1a、1b)為二個,前述電漿電弧噴嘴(4a、4b)係分布於同一直徑線上且分別連通至各電極配置空間(1a、1b)而正對 平行於前述直徑線之熔接線打開之二個。(15) The embedded wafer (1) according to the above (1), wherein the plurality of electrode arrangement spaces (1a, 1b) are two, and the plasma arc nozzles (4a, 4b) are distributed on the same diameter line and are respectively connected to each other. To each electrode arrangement space (1a, 1b) and facing Two of the weld lines parallel to the aforementioned diameter line are opened.

若藉由裝設該嵌入式晶片(1)之電漿火炬,則可進行藉由二個電弧而形成一熔融坑池之單一坑池之電弧熔接。於該狀態下,電漿電弧之橫剖面係正如圖十八之(d)所示,於熔接之進行方向y,成為細長之熱源,因此,相對於熱量之焊珠幅寬(x方向)係被抑制變窄,即便高速化,亦不發生高溫破裂。又,可藉由成為單一坑池二電弧,而於板厚3~10mm時,以先行電弧以進行鍵孔熔接(圖十八之(c)或(e)),以後行電弧進行寬幅共付熔接,使表面焊珠變平坦(圖十八之(g))。於板厚未滿3mm時,可藉由先行電弧而進行下挖熔接(圖十八之(e)),藉由後行電弧而使表面焊珠變平坦(圖十八之(f))。By installing the plasma torch of the embedded wafer (1), arc welding of a single pit pool forming a pool of molten pits by two arcs can be performed. In this state, the cross section of the plasma arc is as shown in FIG. 18(d), and becomes a slender heat source in the direction y of the welding, so the width of the bead relative to the heat (x direction) is It is suppressed from narrowing, and even if it is speeded up, high temperature cracking does not occur. Moreover, by forming a single pit and two arcs, when the thickness is 3 to 10 mm, the arc is first performed to perform keyhole welding (Fig. 18 (c) or (e)), and then the arc is widened. The welding is performed to flatten the surface bead (Fig. 18(g)). When the thickness of the sheet is less than 3 mm, the surface bead may be flattened by the subsequent arc by the forward arc (Fig. 18 (e)) (Fig. 18 (f)).

可藉由使用離開某程度距離之二條電漿火炬之並聯熔接得稍微類似之效果,但熔接進行方向y之電弧間隔變寬,因此,於短熔接長度之工件(熔接目標材),無法進行同一通道之熔接,必須進行二通道熔接,不易高速化。又,電弧間隔變寬,因此,後行電弧係必須再熔融一度凝固之焊珠,於後行熔接時,需高入熱。若藉由使用於一晶片中具備二噴嘴之本發明之嵌入式晶片之單一坑池二電弧熔接,則噴嘴之間隔變短,因此,解決該些問題。It can be slightly similarly welded by using parallel welding of two plasma torches away from a certain distance, but the arc interval of the welding direction y is widened, so that the workpiece of the short welding length (welding target) cannot be the same For the welding of the channel, it is necessary to perform two-channel welding, which is not easy to speed up. Further, since the arc interval is widened, the trailing arc system must be remelted once to solidify the bead, and when it is welded later, it is required to be heated. If the single-pit two-arc welding of the embedded wafer of the present invention having two nozzles in one wafer is used, the interval between the nozzles becomes short, and therefore, the problems are solved.

(16)前述(15)記載之嵌入式晶片(1)係前述之電漿電弧噴嘴(4a、4b)平行於前述下端面(x、y)之垂直線(z)(圖十四)。(16) The embedded wafer (1) according to the above (15) is characterized in that the plasma arc nozzles (4a, 4b) are parallel to the vertical line (z) of the lower end surface (x, y) (Fig. 14).

(17)前述(15)記載之嵌入式晶片(1)係前述之電漿電弧噴嘴(4a、4b)相對於前述下端面(x、y)之垂直線(z),於前述之直徑線上,噴嘴開口往離開晶片中心軸之方向傾斜(圖十七)。(17) The embedded wafer (1) according to (15) above is a vertical line (z) of the plasma arc nozzle (4a, 4b) with respect to the lower end surface (x, y) on the diameter line. The nozzle opening is inclined away from the central axis of the wafer (Fig. 17).

(18)前述(16)或(17)記載之嵌入式晶片(1)係各電極配置空間(1a、1b)平行於前述下端面(x、y)之垂直線(z)。(18) The embedded wafer (1) according to the above (16) or (17), wherein the respective electrode arrangement spaces (1a, 1b) are parallel to the vertical line (z) of the lower end surface (x, y).

(19)一種電漿火炬(圖十三/圖十六)係具備前述(15)至(17)中任一項所記載之嵌入式晶片(1),及於該嵌入式晶片(1)之各電極配置空間(1a、1b)插入各個前端部之二非消耗電極(2a、2b)。(19) A plasma torch (Fig. 13/16) comprising the embedded wafer (1) according to any one of (15) to (17) above, and the embedded wafer (1) Each of the electrode arrangement spaces (1a, 1b) is inserted into the two non-consumable electrodes (2a, 2b) of the respective front end portions.

(20)一種電漿熔接裝置(圖十二)係具備前述(19)記載之電漿火炬,及於該電漿火炬之第1非消耗電極(2a)供電熔接或預熱電力之第1電源(18ap、18aw),及於第2非消耗電極(2b)供電共付熔接或正式熔接電力之第2電源(18bp、18bw)。(20) A plasma welding apparatus (Fig. 12) comprising the plasma torch according to (19) above, and a first power source for supplying or welding power to the first non-consumable electrode (2a) of the plasma torch (18ap, 18aw), and the second power source (18 bp, 18bw) for supplying the common non-consumable electrode or the main welding power to the second non-consumable electrode (2b).

(21)前述(1)記載之嵌入式晶片(1:圖十九)係前述複數電極配置空間(1a、1b、1c)包含分布於熔接方向(y)之一直線上之前頭電極配置空間(1a)、一以上之中間電極配置空間(1b)及後尾端電極配置空間(1c)。(21) The embedded wafer (1: FIG. 19) according to the above (1), wherein the plurality of electrode arrangement spaces (1a, 1b, 1c) include a head electrode arrangement space (1a) before being distributed on a straight line in the welding direction (y). ), one or more intermediate electrode arrangement spaces (1b) and rear end electrode arrangement spaces (1c).

若藉由裝設該嵌入式晶片(1)之電漿火炬,則可進行藉由三個以上之電弧而形成一熔融坑池之單一坑池多電弧熔接。於該狀態下,電漿電弧之橫剖面係於熔接之進行方向y,成為細長之熱源,因此,相對於熱量之焊珠幅寬(x方向)係被抑制變窄,即便高速化,亦不發生高溫破裂。又,可藉由成為單一坑池多電弧,而於板厚3~10mm時,以前頭電弧以預熱熔接線,以中間電弧以形成由鍵孔所造成之內焊珠,以後尾端電弧進行寬幅共付熔接,呈平坦地形成表面焊珠。於板厚未滿3mm時,可藉由前頭電弧而預熱熔接線,藉由以中間電弧所造成之下挖熔接形成內焊珠,藉由後尾端電弧而使表面焊珠變平坦。即便任何一種,亦藉由前頭電弧之預熱而易形成以中間電弧所造成之內焊珠,因此,能形成良好之內焊珠且進行高速熔接。By installing the plasma torch of the embedded wafer (1), a single pit multi-arc fusion forming a crater pool by three or more arcs can be performed. In this state, the cross section of the plasma arc is in the direction y of the welding, and becomes an elongated heat source. Therefore, the width (x direction) of the bead with respect to heat is suppressed and narrowed, and even if the speed is increased, High temperature cracking occurred. Moreover, by forming a single pit pool and multiple arcs, when the thickness is 3 to 10 mm, the front arc is preheated by the fuse, and the intermediate arc is used to form the inner bead caused by the keyhole, and then the tail end arc is performed. Wide-width co-fusion, flat surface bead formation. When the thickness of the plate is less than 3 mm, the welding wire can be preheated by the front arc, and the inner bead is formed by digging under the arc caused by the intermediate arc, and the surface bead is flattened by the arc at the rear end. Even in any case, the inner bead caused by the intermediate arc is easily formed by the preheating of the front arc, so that a good inner bead can be formed and high-speed welding can be performed.

(22)前述(21)記載之嵌入式晶片(1:圖二十五)係連通至前述中間電極配置空間(1b)及後尾端電極配置空間(1c)之 前述電漿電弧噴嘴(4b、4c)間之距離,更加長於連通至前述前頭電極配置空間(1a)及前述中間電極配置空間(1b)之前述電漿電弧噴嘴(4a、4b)間之距離。(22) The embedded wafer (1: Fig. 25) described in the above (21) is connected to the intermediate electrode arrangement space (1b) and the rear end electrode arrangement space (1c). The distance between the plasma arc nozzles (4b, 4c) is longer than the distance between the plasma arc nozzles (4a, 4b) connected to the front electrode arrangement space (1a) and the intermediate electrode arrangement space (1b).

(23)前述(21)或(22)記載之嵌入式晶片(1:形態1)係在各電極配置空間(1a、1b、1c)連通有電漿電弧噴嘴(4a、4b、4c)。(23) The embedded wafer (1: Form 1) described in (21) or (22) above is connected to the plasma arc nozzles (4a, 4b, 4c) in the respective electrode arrangement spaces (1a, 1b, 1c).

(24)前述(21)或(22)記載之嵌入式晶片(1:形態2/4)係前述前頭電極配置空間(1a)或前述後尾端電極配置空間(1c)為TIG熔接電極以貫通之孔穴。(24) The embedded wafer (1: Form 2/4) according to (21) or (22), wherein the front electrode arrangement space (1a) or the rear end electrode arrangement space (1c) is a TIG fusion electrode. hole.

(25)前述(21)或(22)記載之嵌入式晶片(1:形態3)係前述前頭電極配置空間(1a)及前述後尾端電極配置空間(1c)為TIG熔接電極貫通之孔穴。(25) The embedded wafer (1: Form 3) according to the above (21) or (22), wherein the front electrode arrangement space (1a) and the rear end electrode arrangement space (1c) are holes through which the TIG welding electrodes pass.

(26)前述(21)或(22)記載之嵌入式晶片(1:形態5)係在前述前頭電極配置空間(1a)連通有前述電漿電弧噴嘴,前述中間電極配置空間(1b)及前述後尾端電極配置空間(1c)係TIG熔接電極貫通之孔穴。(26) The embedded wafer (1: aspect 5) according to the above (21) or (22), wherein the plasma arc nozzle is connected to the front electrode arrangement space (1a), the intermediate electrode arrangement space (1b) and the foregoing The rear end electrode arrangement space (1c) is a hole through which the TIG welding electrode penetrates.

(27)一種電漿火炬係具備前述(21)記載之嵌入式晶片(1),及於該嵌入式晶片(1)之各電極配置空間(1a、1b、1c)插入各前端部之複數非消耗電極(2a、2b、2c)。(27) A plasma torch comprising the embedded wafer (1) according to (21) above, and a plurality of non-inserted portions (1a, 1b, 1c) of the embedded wafer (1) inserted into each of the front end portions The electrodes (2a, 2b, 2c) are consumed.

(28)一種電漿熔接裝置係具備前述(27)記載之電漿火炬,及於該電漿火炬之前頭非消耗電極(2a)供電預熱電力之第1電源(18ap、18aw),及於中間非消耗電極(2b)供電內焊珠形成用電力之第2電源(18bp、18bw),及於後尾端非消耗電極(2c)供電共付電力之第3電源(18cp、18cw)。(28) A plasma welding apparatus comprising the plasma torch according to (27) above, and a first power source (18ap, 18aw) for supplying preheating power to the non-consumable electrode (2a) before the plasma torch, and The intermediate non-consumable electrode (2b) supplies a second power source (18 bp, 18bw) for power generation of the bead forming power, and a third power source (18 cp, 18cw) for supplying power to the rear end non-consumable electrode (2c).

(29)一種電漿熔接裝置係具備具於前述(22)記載之嵌入式晶片(1)之各電極配置空間(1a、1b、1c)插入各前端部之複 數非消耗電極(2a、2b、2c)之電漿火炬,及於該電漿火炬之前頭非消耗電極(2a)供電預熱電力之第1電源(18ap、18aw),及於中間非消耗電極(2b)供電鍵孔熔接電力之第2電源(18bp、18bw),及於後尾端非消耗電極(2c)供電共付電力之第3電源(18cp、18cw)。(29) A plasma welding apparatus comprising a plurality of electrode arrangement spaces (1a, 1b, 1c) having the embedded wafer (1) according to (22) inserted into each of the front end portions a plasma torch of the non-consumable electrode (2a, 2b, 2c), and a first power source (18ap, 18aw) for supplying preheating power to the non-consumable electrode (2a) before the plasma torch, and an intermediate non-consumable electrode (2b) The second power source (18 bp, 18bw) for supplying power to the keyhole splicing power, and the third power source (18 cp, 18cw) for supplying power to the rear end non-consumable electrode (2c).

(30)前述(28)或(29)記載之電漿熔接裝置(形態1)係第1、第2及第3電源電漿熔接電源。(30) The plasma welding apparatus (1) of the above (28) or (29) is a first, second, and third power plasma welding power source.

(31)前述(28)或(29)記載之電漿熔接裝置(形態2/4)係前述嵌入式晶片之前述前頭電極配置空間(1a)或前述後尾端電極配置空間(1c)為TIG熔接電極貫通之孔穴,第1電源或第3電源係TIG熔接電源,其他之電源係電漿熔接電源。(31) The plasma welding apparatus (FIG. 2/4) according to (28) or (29), wherein the front electrode arrangement space (1a) or the rear end electrode arrangement space (1c) of the embedded wafer is TIG fusion The hole through which the electrode passes, the first power source or the third power source is a TIG welding power source, and the other power source is a plasma welding power source.

(32)前述(28)或(29)記載之電漿熔接裝置(形態3)係前述嵌入式晶片之前述前頭電極配置空間(1a)及前述後尾端電極配置空間(1c)為TIG熔接電極貫通之孔穴,第1電源及第3電源係TIG熔接電源,第2電源係電漿熔接電源。(32) The plasma welding apparatus according to (28) or (29), wherein the front electrode arrangement space (1a) and the rear end electrode arrangement space (1c) of the embedded wafer are TIG welding electrodes. The hole, the first power source and the third power source are TIG welding power sources, and the second power source is a plasma welding power source.

(33)前述(28)或(29)記載之電漿熔接裝置(形態5)係在前述嵌入式晶片之前述前頭電極配置空間(1a)連通有前述電漿電弧噴嘴,前述中間電極配置空間(1b)及前述後尾端電極配置空間(1c)係TIG熔接電極貫通之孔穴,第1電源係電漿熔接電源,第2及第3電源係TIG熔接電源。(33) The plasma welding apparatus according to (28) or (29), wherein the plasma arc nozzle is connected to the front electrode arrangement space (1a) of the embedded wafer, and the intermediate electrode arrangement space is 1b) and the rear end electrode arrangement space (1c) is a hole through which the TIG welding electrode penetrates, the first power source is a plasma welding power source, and the second and third power sources are TIG welding power sources.

本發明之其他目的及特徵係由參考圖式之以下之實施例之說明而明確地顯示之。The other objects and features of the present invention are clearly shown by the following description of the embodiments of the drawings.

若藉由裝設該嵌入式晶片(1)之電漿火炬,則可進行藉由複數火炬而形成一熔融坑池之單一坑池之複數電弧高速加工。By installing the plasma torch of the embedded wafer (1), a plurality of arc high-speed machining of a single pit pool of a molten pit pool by a plurality of torches can be performed.

1‧‧‧嵌入式晶片1‧‧‧ embedded chip

1a、1b‧‧‧電極配置空間1a, 1b‧‧‧electrode configuration space

1a、1b、1c‧‧‧前頭、中間、後尾端之電極配置空間1a, 1b, 1c‧‧‧ electrode configuration space at the front, middle and rear ends

1d‧‧‧擴大口1d‧‧‧Expanded

2a‧‧‧第1電極(前頭電極)2a‧‧‧1st electrode (front electrode)

2b‧‧‧第2電極、(中間電極)2b‧‧‧2nd electrode, (middle electrode)

2c‧‧‧後尾端電極2c‧‧‧ rear end electrode

3‧‧‧定心石3‧‧‧ Centering Stone

4‧‧‧噴嘴4‧‧‧ nozzle

4a‧‧‧前頭噴嘴4a‧‧‧ front nozzle

4b‧‧‧中間噴嘴4b‧‧‧Intermediate nozzle

4c‧‧‧後尾端噴嘴4c‧‧‧ rear end nozzle

5‧‧‧中央孔5‧‧‧Central hole

6‧‧‧導線件6‧‧‧ wire pieces

7‧‧‧嵌入式蓋罩7‧‧‧Embedded cover

8‧‧‧保護用蓋罩8‧‧‧Protection cover

9‧‧‧絕緣台9‧‧‧Insulation

9w‧‧‧冷卻水路9w‧‧‧Cooling waterway

9p‧‧‧導向氣體流路9p‧‧‧Guided gas flow path

9s‧‧‧保護用氣體流路9s‧‧‧Protective gas flow path

10(10a、10b、10c)‧‧‧電極固定螺絲10 (10a, 10b, 10c) ‧ ‧ electrode fixing screws

11‧‧‧第1電極台、前頭電極台11‧‧‧1st electrode stage, front electrode stage

12‧‧‧第2電極台、後尾端電極台12‧‧‧2nd electrode stage, rear end stage electrode stage

13eb‧‧‧中間電極台13eb‧‧‧Intermediate electrode table

13g‧‧‧導線件13g‧‧‧ wire pieces

14‧‧‧絕緣本體14‧‧‧Insulated body

15‧‧‧線Line 15‧‧‧

16‧‧‧母材16‧‧‧Material

17、18‧‧‧電源17, 18‧‧‧ power supply

19‧‧‧電漿19‧‧‧ Plasma

20‧‧‧坑池20‧‧ ‧ pit pool

Ma‧‧‧第1電弧之感應磁通量Ma‧‧‧1st arc induced magnetic flux

Mb‧‧‧第二電弧之感應磁通量Inductive flux of the second arc of Mb‧‧‧

Mc‧‧‧合成磁通量Mc‧‧‧Synthetic magnetic flux

21、21a、21b‧‧‧加熱線電源21, 21a, 21b‧‧‧ heating wire power supply

22‧‧‧MIG熔接電源22‧‧‧MIG welding power supply

24‧‧‧粉體槽24‧‧‧ powder tank

25‧‧‧粉體供應機25‧‧‧ powder supply machine

26‧‧‧粉體導向件26‧‧‧ powder guides

27‧‧‧鍵孔氣體27‧‧‧Keyhole gas

28‧‧‧粉體導向件28‧‧‧ powder guides

29‧‧‧切斷用氣體29‧‧‧Scissing gas

30‧‧‧外箱30‧‧‧Outer box

圖一係本發明之第1實施例之電漿火炬之縱剖面圖。BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a longitudinal sectional view showing a plasma torch according to a first embodiment of the present invention.

圖二(a)係僅顯示圖一之電漿火炬之縱剖面圖,及圖二(b)係由電漿噴射端部側以觀看之仰視圖。Figure 2 (a) shows only a longitudinal section of the plasma torch of Figure 1, and Figure 2 (b) shows a bottom view of the end of the plasma jet.

圖三係擴大地顯示圖一所示之嵌入式晶片1,及圖三(a)係前視圖,及圖三(b)係於(c)上之2b-2b線之縱剖面圖,及圖三(c)係仰視圖。Figure 3 is an enlarged view showing the embedded wafer 1 shown in Figure 1, and the front view of Figure 3 (a), and Figure 3 (b) is a longitudinal sectional view of the line 2b-2b on (c), and Three (c) is a bottom view.

圖四係顯示圖一所示之電漿火炬之冷卻水路9w、導向氣體流路9p及保護用氣體流路9s,及圖四(a)係顯示冷卻水路9w之縱剖面圖,及圖四(b)係顯示導向氣體流路9p之縱剖面圖且(c)上之4b-4b線之縱剖面圖,及圖四(c)係(b)上之4c-4c線之橫剖面圖,及圖四(d)係顯示保護用氣體流路9s之縱剖面圖且(e)上之4d-4d線之縱剖面圖,及圖四(e)係(d)上之4e-4e線之橫剖面圖。Fig. 4 shows a cooling water passage 9w, a pilot gas flow path 9p and a protective gas flow path 9s of the plasma torch shown in Fig. 1, and Fig. 4(a) shows a longitudinal sectional view of the cooling water passage 9w, and Fig. 4 ( b) is a longitudinal sectional view showing the guiding gas flow path 9p and a longitudinal sectional view of the 4b-4b line on (c), and a cross-sectional view of the 4c-4c line on the line (c) and (b), and Figure 4 (d) shows a longitudinal sectional view of the protective gas flow path 9s and a longitudinal sectional view of the 4d-4d line on (e), and a horizontal line of 4e-4e on the line (e) of Figure 4 (d) Sectional view.

圖五係相當於圖三(b)之嵌入式晶片1之擴大縱剖面圖,顯示藉由第1電極2a及第2電極2b發生之各電弧而感應之各磁通量Ma及Mb及合成磁通量Mc。Fig. 5 is an enlarged longitudinal sectional view of the embedded wafer 1 corresponding to Fig. 3(b), showing the magnetic fluxes Ma and Mb and the combined magnetic flux Mc induced by the arcs generated by the first electrode 2a and the second electrode 2b.

圖六係本發明之第2實施例之電漿火炬之縱剖面圖。Figure 6 is a longitudinal sectional view showing a plasma torch of a second embodiment of the present invention.

圖七係本發明之第3實施例之電漿火炬之縱剖面圖。Figure 7 is a longitudinal sectional view showing a plasma torch of a third embodiment of the present invention.

圖八係本發明之第4實施例之電漿火炬之縱剖面圖。Figure 8 is a longitudinal sectional view showing a plasma torch of a fourth embodiment of the present invention.

圖九係本發明之第5實施例之電漿火炬之縱剖面圖。Figure 9 is a longitudinal sectional view showing a plasma torch of a fifth embodiment of the present invention.

圖十係本發明之第6實施例之電漿火炬之縱剖面圖。Figure 10 is a longitudinal sectional view showing a plasma torch of a sixth embodiment of the present invention.

圖十一係本發明之第7實施例之電漿火炬之縱剖面圖。Figure 11 is a longitudinal sectional view showing a plasma torch of a seventh embodiment of the present invention.

圖十二係使用本發明之第8實施例之電漿火炬之熔接裝置之縱剖面圖及方塊圖。Fig. 12 is a longitudinal sectional view and a block diagram showing a welding device for a plasma torch according to an eighth embodiment of the present invention.

圖十三(a)係圖十二之電漿火炬之縱剖面圖,及圖十三(b)係由電漿噴射端部側以觀看之仰視圖。Figure 13 (a) is a longitudinal sectional view of the plasma torch of Figure 12, and Figure 13 (b) is a bottom view from the side of the plasma injection end.

圖十四係擴大地顯示圖十二所示之第8實施例之電漿火炬之嵌入式晶片1,及圖十四(a)係前視圖,及圖十四(b)係於(c)上之14b-14b線之縱剖面圖,及圖十四(c)係仰視圖。Figure 14 is an enlarged view showing the embedded wafer 1 of the plasma torch of the eighth embodiment shown in Figure 12, and Figure 14 (a) is a front view, and Figure 14 (b) is attached to (c) A longitudinal section of the upper 14b-14b line and a bottom view of Fig. 14(c).

圖十五係呈示意地顯示藉由圖十二所示之熔接裝置而進行單一坑池二電弧熔接時之電漿電弧舉動之擴大剖面圖。Figure 15 is an enlarged cross-sectional view schematically showing the plasma arc behavior when a single pit and two arc welding is performed by the welding device shown in Figure 12.

圖十六係顯示使用第9實施例之嵌入式晶片之第9實施例之電漿火炬之嵌入式晶片周圍之縱剖面圖。Fig. 16 is a longitudinal sectional view showing the periphery of the embedded wafer of the plasma torch of the ninth embodiment using the embedded wafer of the ninth embodiment.

圖十七係擴大地顯示圖十六所示之第9實施例之嵌入式晶片1,及圖十七(a)係前視圖,及圖十七(b)係於(c)上之17b-17b線之縱剖面圖,及圖十七(c)係仰視圖。Figure 17 is an enlarged view showing the embedded wafer 1 of the ninth embodiment shown in Figure 16 and a front view of Figure 17 (a), and Figure 17 (b) is a 17b-(c) A longitudinal section of the 17b line and a bottom view of Fig. 17(c).

圖十八係呈示意地顯示使用習知及本發明之電漿火炬之熔接之電漿電弧剖面及熔接焊珠剖面之剖面圖,及圖十八(a)係顯示習知之電漿火炬產生之電漿電弧之橫剖面,及圖十八(b)係顯示板厚未滿3mm時,易發生習知之高速共付熔接之高溫破裂之焊珠橫剖面圖,及圖十八(c)係以3~10mm程度於習知之高速鍵孔熔接以顯示代表性之焊珠橫剖面,及圖十八(d)係顯示本發明之電漿火炬產生之電漿電弧之橫剖面,及圖十八(e)係顯示使用本發明之電漿火炬之板厚未滿3mm之高速熔接時,藉由先行電弧之預熱或下挖效果以形成之焊珠形狀之橫剖面圖,及圖十八(f)係顯示藉由後行電弧而共付熔接該焊珠之焊珠形狀之橫剖面圖,及圖十八(g)係顯示使用本發明之電漿火炬之3~10mm板厚之高速熔接時,藉由先行電弧之鍵孔熔接以形成(c)所示之焊珠且藉由後行電弧以共付熔接該焊珠之焊珠形狀之橫剖面圖。Figure 18 is a cross-sectional view schematically showing a plasma arc profile and a welded bead profile of a welding using a conventional plasma torch of the present invention, and Figure 18 (a) shows the electricity generated by a conventional plasma torch. The cross section of the slurry arc, and Fig. 18(b) show that the thickness of the weld bead is less than 3 mm, which is prone to the high-temperature co-welding of the high-temperature cracked weld bead, and Figure 18 (c) is 3 ~10mm to the known high-speed keyhole fusion to show a representative bead cross section, and Figure 18(d) shows the cross section of the plasma arc generated by the plasma torch of the present invention, and Figure 18 (e) Is a cross-sectional view showing the shape of the bead formed by the preheating or digging effect of the preceding arc when the thickness of the plasma torch of the present invention is less than 3 mm, and FIG. 18(f) A cross-sectional view showing the shape of a bead in which the bead is welded by a back arc, and FIG. 18(g) shows a high-speed welding using a thickness of 3 to 10 mm of the plasma torch of the present invention. Welding by the keyhole of the preceding arc to form the bead shown in (c) and welding the bead by means of a back-arc The cross-sectional shape of FIG.

圖十九係使用本發明之第10實施例之電漿火炬之熔接裝置之縱剖面圖及方塊圖。Fig. 19 is a longitudinal sectional view and a block diagram showing a welding device for a plasma torch according to a tenth embodiment of the present invention.

圖二十(a)係圖十九之電漿火炬之縱剖面圖,及圖二十(b) 係由電漿噴射端部側觀看之仰視圖。Figure 20 (a) is a longitudinal section of the plasma torch of Figure 19, and Figure 20 (b) It is a bottom view viewed from the side of the plasma jet end.

圖二十一係擴大地顯示圖十九所示之第10實施例之電漿火炬之嵌入式晶片1,及圖二十一(a)係前視圖,及圖二十一(b)係於(c)上之22B-22B線之縱剖面圖,及圖二十一(c)係仰視圖。Figure 21 is an enlarged view showing the embedded wafer 1 of the plasma torch of the tenth embodiment shown in Figure 19, and a front view of Figure 21 (a), and Figure 21 (b) is attached to (c) A longitudinal section of the upper 22B-22B line, and a bottom view of Figure 21 (c).

圖二十二係圖十九所示之電漿火炬之縱剖面圖,及圖二十二(a)係顯示於各電極收納空間供應電漿氣體之管路之概要,及圖二十二(b)係顯示冷卻嵌入式晶片1之冷卻水之流路之概要。Figure 22 is a longitudinal sectional view of the plasma torch shown in Figure 19, and Figure 22 (a) shows an outline of the pipeline for supplying plasma gas in each electrode storage space, and Figure 22 ( b) is an outline showing a flow path for cooling the cooling water of the embedded wafer 1.

圖二十三係呈示意地顯示於使用本發明之電漿火炬之熔接之熔接焊珠剖面之橫剖面圖,及圖二十三(a)係顯示藉由前頭電弧之預熱而形成之焊珠形狀,及圖二十三(b)係顯示藉由中間電弧進行高速鍵孔熔接之焊珠形狀,及圖二十三(c)係顯示藉由後尾端電弧而進行共付熔接之焊珠形狀。Figure 23 is a cross-sectional view schematically showing a cross section of a welded bead of a welding torch using the present invention, and Figure 23 (a) shows a bead formed by preheating of the front arc The shape, and Fig. 23(b) show the shape of the bead which is welded by the high-speed keyhole by the intermediate arc, and Fig. 23(c) shows the shape of the bead which is co-fused by the rear end arc. .

圖二十四係呈示意地顯示藉由圖十九所示之熔接裝置進行單一坑池3之電弧熔接時之電漿電弧舉動之擴大剖面圖。Fig. 24 is a schematic enlarged cross-sectional view showing the plasma arc behavior when the arc welding of the single pit 3 is performed by the welding device shown in Fig. 19.

圖二十五係使用本發明之第11實施例之電漿火炬之熔接裝置之縱剖面圖及方塊圖。Figure 25 is a longitudinal sectional view and a block diagram showing a welding device for a plasma torch according to an eleventh embodiment of the present invention.

圖二十六係使用本發明之第12實施例之電漿火炬之熔接裝置之縱剖面圖及方塊圖。Figure 26 is a longitudinal sectional view and a block diagram showing a welding device for a plasma torch according to a twelfth embodiment of the present invention.

圖二十七係使用本發明之第13實施例之電漿火炬之熔接裝置之縱剖面圖及方塊圖。Figure 27 is a longitudinal sectional view and a block diagram showing a welding device for a plasma torch according to a thirteenth embodiment of the present invention.

-第1實施例--First Embodiment -

圖一顯示第1實施例之電漿熔接裝置,圖二(a)僅顯示圖一所示之電漿火炬、亦即第1實施例之電漿熔接火炬,圖二(b)顯示火炬之前端面。第1實施例之電漿熔接火炬係進行電漿熔接之形態。嵌入式晶片1係藉由以螺絲夾緊嵌入式蓋罩7於絕緣台9, 而固定於絕緣台9。保護用蓋罩8係藉由螺絲夾緊而固定於絕緣台9。以二比例分離於x方向之第1電極11及第2電極12(圖四之(c)、(e))係位處於絕緣體之外箱30之內部。絕緣本體14之中空圓筒狀棒桿係通過第1電極11及第2電極12間之空間,該棒桿之前端部且省略圖示之公螺絲係螺旋入絕緣台9之中心,且省略圖示之母螺絲孔,藉此而夾緊電極台11、12以壓縮於縱方向,絕緣台9、電極台11、12及絕緣本體14係結合成為一體。1 shows a plasma welding device of the first embodiment, FIG. 2(a) shows only the plasma torch shown in FIG. 1, that is, the plasma welding torch of the first embodiment, and FIG. 2(b) shows the front end face of the torch. . The plasma welding torch of the first embodiment is in the form of plasma welding. The embedded wafer 1 is mounted on the insulating table 9 by screwing the embedded cover 7 with a screw. It is fixed to the insulating table 9. The protective cover 8 is fixed to the insulating table 9 by screwing. The first electrode 11 and the second electrode 12 (the (c), (e) of FIG. 4) separated in the x direction are in the inside of the insulator outer case 30. The hollow cylindrical rod of the insulative housing 14 passes through the space between the first electrode 11 and the second electrode 12, and the male screw of the front end portion of the rod is omitted from the center of the insulating table 9 and is omitted. The mother screw holes are shown, whereby the electrode stages 11 and 12 are clamped to be compressed in the longitudinal direction, and the insulating stage 9, the electrode stages 11, 12 and the insulating body 14 are integrally coupled.

於嵌入式晶片1之軸心具中央孔5,於絕緣台9及絕緣本體14之軸心,具同軸於中央孔5之導向孔(於本實施例具導線孔)。於嵌入式晶片1之中央孔5,插入導線件6,亦於絕緣本體14之軸心導向孔,插入導線件13g。插入至絕緣本體14頭部之熔接線15係通過導線件13g及6而送入至嵌入式晶片1。The central hole 5 of the embedded wafer 1 has a central hole 5 at the axis of the insulating table 9 and the insulating body 14, and has a guiding hole coaxial with the central hole 5 (in the present embodiment, a wire hole). The lead member 6 is inserted into the central hole 5 of the embedded wafer 1, and the lead member 13g is also inserted into the axial guiding hole of the insulating body 14. The weld line 15 inserted into the head of the insulative housing 14 is fed to the embedded wafer 1 through the wire members 13g and 6.

於嵌入式晶片1,其係於以中央孔5之中心軸作為中心之圓周上,具以成為以180度之等角度間距分布且平行地位處於中央孔5之二個電極配置空間1a、1b,於各電極配置空間,插入貫通絕緣台9且以螺絲10a、10b以固定於各電極台11、12之第1電極2a、第2電極2b之前端部,於各電極配置空間之軸心位置,以定心石3以進行定位。於嵌入式晶片1正對母材16之前端面,雖然同心於中央孔5,但其直徑大於中央孔5之大徑之擴大口1d,連接於各電極配置空間1a、1b之噴嘴4(4a、4b)係開口於大徑口1d。The embedded wafer 1 is disposed on a circumference centered on a central axis of the central hole 5, and has two electrode arrangement spaces 1a, 1b which are distributed at an angular interval of 180 degrees and which are parallel to the central hole 5. Each of the electrode arrangement spaces is inserted into the insulating substrate 9 and fixed to the front end portions of the first electrode 2a and the second electrode 2b of the electrode pads 11 and 12 by screws 10a and 10b at the axial center position of each electrode arrangement space. Center the stone 3 for positioning. The front end surface of the embedded wafer 1 facing the base material 16 is concentric with the central hole 5, but the enlarged opening 1d having a larger diameter than the central hole 5 is connected to the nozzle 4 of each electrode arrangement space 1a, 1b (4a, 4b) is opened at the large diameter port 1d.

圖三擴大地顯示嵌入式晶片1。於本實施例之嵌入式晶片1,具通孔之中央孔5,打開於連接於該中央孔5正對母材16之前端面且直徑大於中央孔5大徑之擴大口1d,及於以中央孔5之中心軸為中心之圓周上以180度之間距分布且平行地位於中央孔5之二電極配置空間1a、1b,及連通至各電極配置空間1a、1b而打開於擴大口1d,且於以中央孔5之中心軸為中心之圓周上而以180 度之間距分布之二個噴嘴4a、4b,及又,噴嘴4a、4b係於嵌入式晶片1之比起正對母材16之前端面之更加內側,打開於擴大口1d。Figure 3 shows the embedded wafer 1 enlarged. In the embedded wafer 1 of the present embodiment, the central opening 5 having a through hole is opened in the enlarged opening 1d connected to the front end surface of the central hole 5 facing the base material 16 and having a diameter larger than the central opening 5, and is centrally The central axis of the hole 5 is distributed on the circumference of the center of the hole at a distance of 180 degrees and is located in parallel with the two electrode arrangement spaces 1a, 1b of the center hole 5, and is connected to the electrode arrangement spaces 1a, 1b to open the enlarged port 1d, and On the circumference centered on the central axis of the central hole 5 and 180 The two nozzles 4a, 4b are disposed at a distance between the two, and the nozzles 4a, 4b are opened to the enlarged opening 1d in the inner side of the embedded wafer 1 which is closer to the front end surface of the base material 16.

又,於本實施例,成為裝設一對(二個)之電極2a、2b之電漿火炬嵌入式晶片,於三條或四條等使用複數電極之電漿火炬之嵌入式晶片,具備於以中央孔5之中心軸為中心之圓周上而以等角度之間距分布且平行地位於中央孔5之複數電極配置空間,及連通至各電極配置空間而打開於擴大口1d,且於以中央孔5之中心軸作為中心之圓周上而以等角度之間距以分布之複數噴嘴。例如具備三條電極之電漿火炬之嵌入式晶片係具備於以中央孔5之中心軸為中心之圓周上以120度之間距分布且平行地位於中央孔5之三個電極配置空間,及連通至各電極配置空間而打開於擴大口1d,且於以中央孔5之中心軸作為中心之圓周上而以120度之間距以分布之三個噴嘴。又,具備四條電極之電漿火炬之嵌入式晶片,係具備於以中央孔5之中心軸為中心之圓周上而以90度之間距分布且平行地位於中央孔5之四個電極配置空間,及連通至各電極配置空間而打開於擴大口1d,且於以中央孔5之中心軸作為中心之圓周上而以90度之間距以分布之四個噴嘴。Further, in the present embodiment, a plasma torch embedded wafer in which a pair of (two) electrodes 2a and 2b are mounted, and an embedded wafer of a plasma torch using a plurality of electrodes, such as three or four, is provided in the center. The central axis of the hole 5 is on the circumference of the center, and is disposed at equal angular intervals and in parallel with the plurality of electrode arrangement spaces of the central hole 5, and is connected to each electrode arrangement space to open to the enlarged port 1d, and is opened to the central opening 5 The central axis serves as a plurality of nozzles distributed on the circumference of the center at equal angular intervals. For example, the embedded wafer of the plasma torch having three electrodes is provided in three electrode arrangement spaces which are distributed at a distance of 120 degrees on the circumference centering on the central axis of the central hole 5 and are located in parallel in the center hole 5, and are connected to Each of the electrode arrangement spaces is opened to the enlarged port 1d, and three nozzles are disposed at a distance of 120 degrees on the circumference centered on the central axis of the center hole 5. Further, the embedded wafer of the plasma torch having four electrodes is provided in four electrode arrangement spaces which are distributed on the circumference centered on the central axis of the center hole 5 and are spaced apart by 90 degrees and are located in parallel in the center hole 5. And four nozzles which are connected to the respective electrode arrangement spaces and are opened to the enlarged port 1d, and are distributed at a distance of 90 degrees on the circumference centered on the central axis of the center hole 5.

又,省略擴大口1d,能以中央孔5及噴嘴4a、4b之下端開口,作為晶片1平坦之下端面。又,電極配置空間1a、1b(及裝設於此之電極2a、2b)不僅係平行於中央孔5,亦能成為相對於中央孔5具傾斜角之傾斜姿勢。Further, the enlarged opening 1d is omitted, and the lower end of the center hole 5 and the nozzles 4a and 4b can be opened as the flat lower end surface of the wafer 1. Further, the electrode arrangement spaces 1a and 1b (and the electrodes 2a and 2b provided therein) are not only parallel to the center hole 5 but also have an inclined posture with an inclination angle with respect to the center hole 5.

圖四顯示圖二所示之電漿火炬之冷卻水流路9w,導向氣體流路9p及保護用氣體流路9s。冷卻水係通過圖四(a)所示之冷卻水供水流路9wi,而進入至嵌入式晶片1之外圍面及嵌入式蓋罩7之內圍面間之空間,由此開始通過冷卻水排水流路9wo而流出至火炬外。一邊之導向氣體係通過圖四(b)及(c)所示之氣體流 路9pa及電極插入空間而進入至電極配置空間1a,於電極前端部,成為電漿而通過噴嘴4a,接著,通過擴大口1d由火炬之前端面以噴出。其他邊之導向氣體係通過氣體流路9pb及電極插入空間而進入至電極配置空間1b,於電極前端部,成為電漿而通過噴嘴4b,接著,通過擴大口1d而由火炬之前端面噴出。保護用氣體係通過圖四(d)及(e)所示之保護用氣體流路9s而進入至嵌入式蓋罩7及保護用蓋罩8之間之圓筒狀空間,接著,由火炬之前端面噴出。Fig. 4 shows the cooling water flow path 9w of the plasma torch shown in Fig. 2, the pilot gas flow path 9p and the protective gas flow path 9s. The cooling water passes through the cooling water supply flow path 9wi shown in FIG. 4(a), and enters the space between the outer surface of the embedded wafer 1 and the inner surface of the embedded cover 7, thereby starting to drain through the cooling water. The flow path 9wo flows out of the torch. The gas channel of one side passes through the gas flow shown in Figures 4(b) and (c) The path 9pa and the electrode insertion space enter the electrode arrangement space 1a, pass through the nozzle 4a at the tip end portion of the electrode, and then ejected from the front end surface of the torch through the enlarged port 1d. The guide gas system of the other side enters the electrode arrangement space 1b through the gas flow path 9pb and the electrode insertion space, passes through the nozzle 4b at the tip end portion of the electrode, and then is ejected from the front end surface of the torch through the enlarged port 1d. The protective gas system enters the cylindrical space between the embedded cover 7 and the protective cover 8 through the protective gas flow path 9s shown in FIGS. 4(d) and (e), and then, before the torch The end face is ejected.

正如圖一所示藉由於電極2a、2b及母材16間,使電極側流動負電漿電弧電流且母材側流動正電漿電弧電流之電漿電源17、18,於電極2a、2b發生電弧時,電漿電弧電流係流動於各電極2a、2b及母材16間,實現一坑池二電弧熔接。於電漿電弧19,傳送供應線15,正對線15使各電極2a、2b及噴嘴4(4a、4b)位於對稱位置,因此,相對於線15而電漿安定。亦即,於參考圖五時,通過各噴嘴4a、4b而流動於插入至電極配置空間1a、1b之各電極2a、2b及母材16間之各電弧電流,於分別感應之磁通量Ma、Mb間,作用藉由弗萊明(Fleming)左手定則而表示之向上(或向下:z)之力,於同一方向且噴嘴4a、4b之以中央孔5之中心軸為中心之圓周上,藉等角度間距之分布,而於各力相同且以中央孔5之中心軸為中心之圓周上,以等角度之間距分布,因此,得到磁性平衡,電漿之安定性變高。亦即,並無由於磁吹(magnetic blow)而發生電弧之搖晃。於母材16之附近,各電弧電流係加算同一方向,感應合成磁通量Mc,因此,集中電弧之磁性壓緊力變強,對於母材16之熱收縮效果(能量密度)變高,並且作用位置無搖晃。又,線15係由電漿電弧19之上端部開始進入,直至熔融坑池20為止,由電弧開始接受熱,作用成為有效之預熱效果,提高線之熔合效率,形成高速熔接或高能率熔接。習知之,於由 側方傳送供應線之狀態下,線係相對於電漿電弧而幾乎呈直角地進入,因此,必須以僅進入至電漿電弧之距離,以熔落於熔融坑池,幾乎無線之預熱效果。故,降低熔合效率,熔接速度亦變慢。As shown in Fig. 1, by the electrodes 2a, 2b and the base material 16, the plasma electric currents 17, 18 which flow the negative plasma arc current on the electrode side and the positive plasma arc current on the base material side are arced at the electrodes 2a, 2b. At the same time, the plasma arc current flows between the electrodes 2a and 2b and the base material 16 to realize a two-hole arc welding of the pit. In the plasma arc 19, the supply line 15 is conveyed, and the opposing electrode 15 places the electrodes 2a, 2b and the nozzles 4 (4a, 4b) in a symmetrical position, so that the plasma is stabilized with respect to the line 15. That is, when referring to Fig. 5, the arc currents flowing between the electrodes 2a, 2b and the base material 16 inserted into the electrode arrangement spaces 1a, 1b through the respective nozzles 4a, 4b are respectively induced to the magnetic fluxes Ma, Mb The force acting upward (or downward: z) by the Fleming left-hand rule, in the same direction and on the circumference of the nozzles 4a, 4b centered on the central axis of the central hole 5, The distribution of the equiangular pitch is distributed on the circumference centered on the central axis of the central hole 5 at the same force and at equal angular intervals. Therefore, magnetic balance is obtained, and the stability of the plasma becomes high. That is, there is no arc sway due to a magnetic blow. In the vicinity of the base material 16, each arc current is added to the same direction, and the resultant magnetic flux Mc is induced. Therefore, the magnetic pressing force of the concentrated arc becomes strong, and the heat shrinkage effect (energy density) of the base material 16 becomes high, and the action position is increased. No shaking. Further, the line 15 starts from the upper end portion of the plasma arc 19 and reaches the molten pit pool 20, and receives heat from the arc, thereby acting as an effective preheating effect, improving the fusion efficiency of the wire, and forming a high-speed welding or a high-energy fusion welding. . Ignorance In the state in which the supply line is laterally conveyed, the line enters at a substantially right angle with respect to the plasma arc. Therefore, it is necessary to enter only the distance to the plasma arc to melt into the pool of the molten pit, and the wireless preheating effect is almost wireless. . Therefore, the fusion efficiency is lowered and the welding speed is also slowed down.

又,藉第1實施例,則線由中央插入,因此,無線之插入方向性,即便曲線熔接,亦不需控制火炬之旋轉。習知以係線由火炬進行方向插入,因此,於曲線熔接時,需相對於曲線而旋轉控制火炬或線之裝置。Further, according to the first embodiment, since the wire is inserted from the center, the wireless insertion direction is not required to control the rotation of the torch even if the curve is welded. It is conventional to insert the tying line in the direction of the torch. Therefore, when the curve is welded, the device for controlling the torch or the line needs to be rotated relative to the curve.

-第2實施例-- Second embodiment -

圖六顯示第2實施例加熱線形態之電漿熔接裝置。電漿火炬係相同於第1實施例構造之加熱線形態之電漿熔接火炬,嵌入式晶片1係圖三所示之第1實施例同一構造。於本實施例,正如圖六所示,於電極2a、2b及母材16間,具備使電極側流動負電漿電弧電流且母材側流動正電漿電弧電流之電漿電源17、18。該點係相同於第1實施例,於線15及母材16之間,尚具備線側流動負電流且母材側流動正電流之加熱線電源21。以自加熱線電源21之電流係通過火炬內之導向件13g,由導向件13g之前端部附近開始通電至線,於絕緣導向件6內,藉由焦耳熱而加熱線,藉由電漿19而合流於以自電極2a、2b之電漿電弧,流入至母材16。此時,加熱線電流之焦耳熱於電漿區域內最大(集中),因此,熔接入熱量變多,成為高熔合量、高能率熔接,可進行高速熔接。又,加熱線電流及以自電極2a、2b之電漿電弧電流係對稱及同軸,因此,得到磁性平衡,並無由於磁吹(magnetic blow)而發生電弧之搖晃。其他之功能及作用效果係相同於第1實施例。Fig. 6 shows a plasma welding apparatus of the heating wire form of the second embodiment. The plasma torch is the same as the plasma welding torch of the heating wire configuration of the first embodiment, and the embedded wafer 1 is the same structure as the first embodiment shown in FIG. In the present embodiment, as shown in Fig. 6, between the electrodes 2a and 2b and the base material 16, there are provided plasma power sources 17, 18 for flowing a negative plasma arc current on the electrode side and a positive plasma arc current flowing on the base material side. This point is the same as that of the first embodiment, and between the line 15 and the base material 16, there is a heating line power source 21 that flows a negative current on the line side and a positive current flows on the base material side. The current from the heating wire power source 21 passes through the guiding member 13g in the torch, and is energized to the wire from the vicinity of the front end portion of the guiding member 13g. In the insulating guiding member 6, the wire is heated by Joule heat, and the plasma is 19 On the other hand, it merges with the plasma arc from the electrodes 2a and 2b, and flows into the base material 16. At this time, the Joule heat of the heating line current is the largest (concentrated) in the plasma region, so that the heat of fusion is increased, and the high-melting amount and the high-energy rate are welded, and high-speed welding can be performed. Further, since the heating line current and the plasma arc current from the electrodes 2a and 2b are symmetrical and coaxial, magnetic balance is obtained, and there is no arc sway due to magnetic blow. Other functions and effects are the same as in the first embodiment.

-第3實施例-- Third embodiment -

圖七顯示成為第3實施例之電漿MIG熔接裝置。電漿火炬係相同於第1實施例構造之電漿MIG熔接火炬,嵌入式晶片1亦相 同於圖三所示之第1實施例之同一構造。於本實施例,正如圖七所示,於電極2a、2b及母材16間,相反於第1實施例之狀態,具備使電極側流動正電漿電弧電流且母材側流動負電漿電弧電流之電漿電源17、18。又,於線15及母材16間,尚具備線側流動正熔接電流且母材側流動負熔接電流之MIG熔接電源(定電壓熔接電源)22。保護用氣體係Ar或Ar+CO2或CO2或Ar+H2。該電漿MIG熔接裝置具MIG特徵之高能率,深熔入之特性且能進行無濺鍍熔接。又,可於Ar氣氛以進行熔接,熔接金屬中氧化物之生成係亦極為少,適合於高重量高張力材料。又,能防止於鋁熔接之起始部之熔合不良或修復熔合不良。其他之功能及作用效果係相同於第1實施例。Fig. 7 shows a plasma MIG welding device which becomes the third embodiment. The plasma torch is the same as the plasma MIG welding torch constructed in the first embodiment, and the embedded wafer 1 is also The same configuration as the first embodiment shown in FIG. In the present embodiment, as shown in Fig. 7, between the electrodes 2a and 2b and the base material 16, contrary to the state of the first embodiment, the positive electrode arc current flows on the electrode side and the negative plasma arc current flows on the base material side. Plasma power supply 17, 18 Further, between the wire 15 and the base material 16, there is a MIG welding power source (fixed voltage welding power source) 22 which has a line side current welding current and a negative welding current flowing on the base material side. Protect the gas system Ar or Ar+CO2 or CO2 or Ar+H2. The plasma MIG welding device has a high energy rate of MIG characteristics, deep melt characteristics and can be sputter-free welded. Further, it is possible to perform welding in an Ar atmosphere, and the formation of oxides in the molten metal is extremely small, and is suitable for a high-weight, high-tension material. Further, it is possible to prevent fusion failure or repair fusion failure in the initial portion of the aluminum welding. Other functions and effects are the same as in the first embodiment.

-第4實施例-- Fourth embodiment -

圖八顯示第4實施例之電漿線厚壁裝置。電漿火炬係相同於第1實施例構造之電漿線厚壁火炬,嵌入式晶片1亦相同於圖三所示之第1實施例構造。於本實施例,正如圖八所示,具備於電極2a、2b及母材16間,使電極側流動負電漿電弧電流且母材側流動正電漿電弧電流之電漿電源17、18,及於線15及各電極2a、2b之間,使線側流動正電流且電極側流動負電流之加熱線電源21a、21b。線15係藉由以自加熱線電源21a、21b電流之焦耳熱而加熱,於母材16無流動線電流,因此,母材16之熔解量變少,可進行低稀釋之厚壁熔接。於母材16呈垂直地送入線15,因此,即便同時進行振動運動之厚壁熔接,亦無方向性地安定厚壁量。又,亦可進行對於垂直面或傾斜面之厚壁熔接。亦能以安定之厚壁量,進行使用粗徑線之高熔合。加熱線電流係由電極2a、2b開始通過噴嘴4a、4b而流入至線15,相同於電漿電流,相對於火炬軸心呈對稱,呈磁性地進行平衡,故,能進行不發生電弧之搖晃 或磁吹(magnetic blow)現象之安定之厚壁熔接。其他功能及作用效果係相同於第1實施例。Fig. 8 shows a plasma line thick wall device of the fourth embodiment. The plasma torch is the same as the plasma-line thick-walled torch constructed in the first embodiment, and the embedded wafer 1 is also constructed in the same manner as the first embodiment shown in FIG. In the present embodiment, as shown in FIG. 8, a plasma power source 17 and 18 are provided between the electrodes 2a and 2b and the base material 16, and a negative plasma arc current flows on the electrode side and a positive plasma arc current flows on the base material side, and Between the line 15 and each of the electrodes 2a and 2b, a heating line power source 21a, 21b which flows a positive current on the line side and a negative current flows on the electrode side. The line 15 is heated by the Joule heat of the current from the heating line power sources 21a and 21b, and the line material 16 has no flowing current. Therefore, the amount of melting of the base material 16 is reduced, and thick-wall welding with low dilution can be performed. Since the base material 16 is fed perpendicularly to the wire 15, the thickness of the thick wall is not directionally stabilized even if thick-wall welding is performed at the same time. Further, thick wall welding for a vertical surface or an inclined surface can also be performed. It is also possible to carry out high fusion using a thick diameter line with a stable thick wall. The heating line current flows from the electrodes 2a, 2b through the nozzles 4a, 4b to the line 15, which is the same as the plasma current, is symmetric with respect to the axis of the torch, and is magnetically balanced, so that it can be shaken without arcing. Or the thick wall welding of the stability of the magnetic blow phenomenon. Other functions and effects are the same as in the first embodiment.

-第5實施例-- Fifth embodiment -

圖九顯示成為第5實施例之電漿粉體厚壁裝置。電漿火炬係裝設粉體導向件26以取代導線件之電漿粉體厚壁火炬。其他構造係相同於第1實施例,嵌入式晶片1係亦相同於圖三所示之第1實施例之構造。於粉體導向件26,粉體供應機25係以定速度送入位處於粉體槽24之粉體。電漿電源17、18係於電極2a、2b及母材16間,使電極側流動負電漿電弧電流,母材側流動正電漿電弧電流。對於母材呈垂直地傳送供應粉體流,因此,比起由側方開始傳送供應粉體至電漿電弧之習知例,粉體之成品率良好,粉體不易附著於噴嘴,又,形成火炬內之粉體通路變粗而成為直線,故,亦可使用傳送供應性不良之裁切粉。於母材16之正上方,對稱之電漿電弧係合流而相互地撞擊,因此,對於母材16之向下電漿流變弱,故,能進行低稀釋之粉體厚壁。其他之功能及作用效果係相同於第1實施例。Fig. 9 shows a plasma powder thick-wall apparatus which becomes the fifth embodiment. The plasma torch system is provided with a powder guide 26 to replace the plasma powder thick wall torch of the wire member. The other structure is the same as that of the first embodiment, and the embedded wafer 1 is also identical to the configuration of the first embodiment shown in FIG. In the powder guide 26, the powder supply machine 25 feeds the powder in the powder tank 24 at a constant speed. The plasma power sources 17, 18 are connected between the electrodes 2a, 2b and the base material 16, so that a negative plasma arc current flows on the electrode side, and a positive plasma arc current flows on the base material side. Since the base material is vertically conveyed to supply the powder flow, the powder has a good yield and the powder is less likely to adhere to the nozzle, and is formed, compared to the conventional example in which the supply of the powder to the plasma arc is started from the side. The powder passage in the torch becomes thick and becomes a straight line, so it is also possible to use a cutting powder that delivers poor supply. Immediately above the base material 16, the symmetrical plasma arcs merge and collide with each other. Therefore, the downward plasma flow to the base material 16 becomes weak, so that the powder having a low dilution can be thickened. Other functions and effects are the same as in the first embodiment.

-第6實施例-- Sixth embodiment -

圖十顯示第6實施例之電漿鍵孔熔接裝置。電漿火炬係裝設鍵孔氣體導向件28以取代導線件之電漿鍵孔熔接火炬。其他之構造係相同於第1實施例,嵌入式晶片1亦相同於圖三所示之第1實施例之同樣構造。相同於第1實施例之狀態,電漿電源17、18係於電極2a、2b及母材16間,使電極側流動負電漿電弧電流,母材側流動正電漿電弧電流。鍵孔氣體27係Ar或He或Ar+H2或Ar+O2或Ar+He。能藉由以鍵孔氣體導向件28,以噴射鍵孔用小徑高速氣體流,而進行厚板之鍵孔熔接或低入熱深熔入熔接。鍵孔用氣體係不同於通過電極2a、2b之導向氣體(電漿氣體) 之其他路徑,因此,並無氧化消耗電極,故,可於鍵孔用氣體,使用氧化性氣體。又,鍵孔用氣體噴射孔係無關於電漿電流之大小而可成為小徑,因此,亦可縮小鍵孔穴,可進行厚板熔接。其他功能及作用效果係相同於第1實施例。Fig. 10 shows a plasma keyhole welding device of the sixth embodiment. The plasma torch system is provided with a keyhole gas guide 28 to weld the torch in place of the plasma keyhole of the wire member. The other structure is the same as that of the first embodiment, and the embedded wafer 1 is also identical to the first embodiment shown in FIG. In the same manner as in the first embodiment, the plasma power sources 17, 18 are connected between the electrodes 2a, 2b and the base material 16, so that the negative plasma arc current flows on the electrode side and the positive plasma arc current flows on the base material side. The keyhole gas 27 is Ar or He or Ar+H2 or Ar+O2 or Ar+He. The key hole welding or the low-intensity deep-melting fusion welding of the thick plate can be performed by the keyhole gas guiding member 28 by jetting the keyhole with a small-diameter high-speed gas flow. The gas system for the keyhole is different from the gas for directing the plasma 2a, 2b (plasma gas) Since the other paths are not oxidized and consumed, an oxidizing gas can be used for the gas for the keyhole. Further, since the gas injection hole for the keyhole can have a small diameter irrespective of the magnitude of the plasma current, the keyhole can be reduced, and the thick plate can be welded. Other functions and effects are the same as in the first embodiment.

-第7實施例-- Seventh embodiment -

於圖一顯示成為第7實施例之電漿切斷裝置。電漿火炬係裝設切斷用氣體導向件28取代導線件之電漿切斷火炬。其他之構造係相同於第1實施例,嵌入式晶片1係亦相同於圖三所示之第1實施例之同樣構造。相同於第1實施例之狀態,電漿電源17、18係於電極2a、2b及母材16間,使電極側流動負電漿電弧電流,母材側流動正電漿電弧電流。切斷用氣體29係Ar或O2 或N2 或Ar+H2。能藉由以切斷用氣體導向件28,噴射切斷用小徑高速氣體流,而進行細幅寬切斷。若電極2a、2b為鎢電極,則即便不使用昂貴之鉿電極,亦能進行以O2 作為切斷用氣體之強力之電漿切斷。其他之功能及作用效果係相同於第1實施例。A plasma cutting device which becomes the seventh embodiment is shown in Fig. 1. The plasma torch system is provided with a cutting gas guide 28 instead of the plasma of the wire member to cut the torch. The other structure is the same as that of the first embodiment, and the embedded wafer 1 is also the same as that of the first embodiment shown in FIG. In the same manner as in the first embodiment, the plasma power sources 17, 18 are connected between the electrodes 2a, 2b and the base material 16, so that the negative plasma arc current flows on the electrode side and the positive plasma arc current flows on the base material side. Ar gas cutting system 29 or O 2 or N 2 or Ar + H2. The fine width cutting can be performed by jetting the small-diameter high-speed gas flow for cutting with the gas guide 28 for cutting. When the electrodes 2a and 2b are tungsten electrodes, plasma cutting with O 2 as a cutting gas can be performed without using an expensive crucible electrode. Other functions and effects are the same as in the first embodiment.

-第8實施例-- Eighth embodiment -

於圖十二顯示第8實施例之電漿熔接裝置,於圖十三(a)僅顯示圖十二所示之電漿火炬、亦即第8實施例之電漿電弧火炬,於圖十三(b),顯示火炬之前端面。第8實施例之電漿電弧火炬係進行電漿熔接之形態。嵌入式晶片1係藉由以螺絲以夾緊嵌入式蓋罩7於絕緣台9而固定於絕緣台9。保護用蓋罩8係藉由螺絲夾緊而固定於絕緣台9。以二比例分離於x方向之第1電極台11及第2電極台12係位於絕緣體之外箱30之內部。絕緣本體14之棒桿係通過第1電極台11及第2電極台12之間之空間。The plasma welding device of the eighth embodiment is shown in FIG. 12, and only the plasma torch shown in FIG. 12, that is, the plasma arc torch of the eighth embodiment is shown in FIG. (b), showing the front face of the torch. The plasma arc torch of the eighth embodiment is in the form of plasma welding. The embedded wafer 1 is fixed to the insulating stage 9 by clamping the embedded cover 7 to the insulating table 9 with screws. The protective cover 8 is fixed to the insulating table 9 by screwing. The first electrode stage 11 and the second electrode stage 12 which are separated in the x direction by two ratios are located inside the insulator outer case 30. The rod of the insulative housing 14 passes through the space between the first electrode stage 11 and the second electrode stage 12.

於嵌入式晶片1,其係具分布於與晶片之中心軸(z)直交之同一直徑線上且由該中心軸開始位處於等距離之二個電極配置空 間1a、1b,於各電極配置空間,插入貫通絕緣台9且以螺絲10a、10b固定於各電極台11、12之第1電極2a、第2電極2b之前端部,於各電極配置空間1a、1b之軸心位置,以定心石3進行定位。於嵌入式晶片1之連接於各電極配置空間1a、1b之噴嘴4(4a、4b)正對母材16之前端面呈係開口。In the embedded wafer 1, the ties are distributed on the same diameter line orthogonal to the central axis (z) of the wafer, and the two electrodes are equidistant from the starting point of the central axis. The gaps 1a and 1b are inserted into the insulating substrate 9 and fixed to the front end portions of the first electrode 2a and the second electrode 2b of the electrode pads 11 and 12 by screws 10a and 10b, and the space 1a is disposed in each electrode. The position of the axis of 1b is positioned with the centering stone 3. The nozzles 4 (4a, 4b) connected to the respective electrode arrangement spaces 1a, 1b of the embedded wafer 1 are open to the front end surface of the base material 16.

圖十四擴大地顯示嵌入式晶片1。於本實施例之嵌入式晶片1,具備分布於與晶片1之中心軸(z)直交之同一直徑線且由該中心軸開始位於等距離而呈平行地延伸於中心軸(z)之二個電極配置空間1a、1b,及連通至各空間1a、1b而開口於正對母材16之前端面之二噴嘴4a、4b。該些噴嘴4a、4b係亦於本實施例,分布於與晶片之中心軸(z)直交之同一直徑線上,平行於該中心軸且由此開始位於等距離。Figure 14 shows an enlarged view of the embedded wafer 1. The embedded wafer 1 of the present embodiment has two strips which are distributed on the same diameter line orthogonal to the central axis (z) of the wafer 1 and which are equidistant from the central axis and extend parallel to the central axis (z). The electrode arrangement spaces 1a and 1b and the two nozzles 4a and 4b that are connected to the respective spaces 1a and 1b and open to the front end surface of the parent material 16 are opened. The nozzles 4a, 4b, also in this embodiment, are distributed on the same diameter line orthogonal to the central axis (z) of the wafer, parallel to the central axis and thus begin to be equidistant.

於火炬之絕緣台9,具省略圖示之冷卻水流路、導向氣體流路及保護用氣體流路。冷卻水係通過冷卻水供水流路進入至嵌入式晶片1之外圍面及嵌入式蓋罩7之內圍面之間之空間,由此開始通過冷卻水排水流路而流出至火炬外。導向氣體係通過氣體流路及電極插入空間而進入至電極配置空間1a,於電極前端部,成為電漿而通過噴嘴4a,並由火炬之前端面噴出。其他邊之導向氣體係通過其他之氣體流路及電極插入空間進入至電極配置空間1b,於電極前端部,成為電漿而通過噴嘴4b,且由火炬之前端面噴出。保護用氣體係通過保護用氣體流路進入至嵌入式蓋罩7及保護用蓋罩8之間之圓筒狀空間,接著,由火炬之前端面噴出。The insulating table 9 for the torch has a cooling water flow path, a guide gas flow path, and a protective gas flow path (not shown). The cooling water enters the space between the peripheral surface of the embedded wafer 1 and the inner peripheral surface of the embedded cover 7 through the cooling water supply flow path, thereby starting to flow out of the flare through the cooling water drainage flow path. The pilot gas system enters the electrode arrangement space 1a through the gas flow path and the electrode insertion space, passes through the nozzle 4a at the tip end portion of the electrode, and is ejected from the front end surface of the torch. The guide gas system of the other side enters the electrode arrangement space 1b through the other gas flow path and the electrode insertion space, passes through the nozzle 4b at the tip end portion of the electrode, and is ejected from the front end surface of the torch. The protective gas system enters the cylindrical space between the embedded cover 7 and the protective cover 8 through the protective gas flow path, and is then ejected from the front end surface of the torch.

正如圖十二所示,藉由導向電源18ap、18bp而電極2a、2b及晶片1間,產生導向電弧,藉由電極2a、2b及母材16間,使電極側流動負電漿電弧電流且母材側流動正電漿電弧電流之電漿電源18aw(熔接或預熱用)、18bw(共付熔接或正式熔接用),於 產生熔接電弧(電漿電弧)時,電漿電弧電流係流動於各電極2a、2b及母材16間,實現一坑池二電弧熔接。圖十二所示之熔接裝置,進行藉由電極2a之電漿電弧所造成之熔接或預熱及藉由電極2b所造成之共付熔接或正式熔接。又,熔接之進行方法係箭號之y方向。亦即,藉由先行之熔接或預熱而生成之熔融坑池,碰撞後行之共付熔接或正式熔接之電漿電弧,例如將藉由鍵孔熔接以形成之熔融坑池,傳送至後方,後行之共付熔接係平均藉由鍵孔熔接而形成之熔融焊珠(圖十八(c))。藉此成為圖十八(g)所示之滑動地連接於母材表面之共付熔接。於未滿3mm之薄板之狀態下,不可能進行鍵孔熔接,因此,藉由先行之熔接或預熱而形成圖十八(e)所示之焊珠,該焊珠係藉由後行之共付熔接而變化成為圖十八(f)所示之焊珠。正如所習知者,與進行大電流單一坑池寬幅熔接不同,其先行及後行係皆分別分成為各種功能,能以必要之最低限度之低電流,進行焊珠幅寬狹窄之高速熔接。又,即便使用先行電弧以作為預熱而藉由後行電弧以進行正式熔接之方法,亦可進行高速化。As shown in Fig. 12, a guiding arc is generated between the electrodes 2a, 2b and the wafer 1 by the pilot power sources 18ap, 18bp, and the negative plasma arc current flows between the electrodes 2a, 2b and the base material 16 and the mother The plasma power source of the positive-plasma arc current flowing on the material side is 18aw (for welding or preheating), 18bw (for welding or formal welding), When a welding arc (plasma arc) is generated, the plasma arc current flows between the electrodes 2a, 2b and the base material 16 to realize a two-hole arc welding of the pit. The welding device shown in Fig. 12 performs welding or preheating by the plasma arc of the electrode 2a and co-fusing or main welding by the electrode 2b. Moreover, the method of welding is performed in the y direction of the arrow. That is, the pool of molten pits formed by the prior welding or preheating, the plasma arc of the co-fusing or the formal welding after the collision, for example, the molten pit pool formed by the bonding of the keyholes is transferred to the rear. The subsequent co-welding system is a molten bead formed by welding a keyhole on average (Fig. 18(c)). Thereby, it is a co-welding which is slidably connected to the surface of the base material as shown in Fig. 18(g). In the state of a thin plate of less than 3 mm, it is impossible to perform keyhole welding. Therefore, the bead shown in Fig. 18(e) is formed by the prior welding or preheating, and the bead is followed by The weld bead shown in Fig. 18 (f) is changed by the joint welding. As is customary, unlike the wide-width welding of a large current single pit pool, the first and second rows are respectively divided into various functions, and the high-speed welding of the narrow width of the bead can be performed with the minimum necessary low current. . Further, even if a preceding arc is used as the preheating and the subsequent arc is used for the final welding, the speed can be increased.

但平行地流動之二通路之電流(電漿電弧)係分別以通路作為中心而產生旋轉之磁通量,該些磁通量係於二通路間,與磁通量之流動方向呈相反,因此,相互地抵銷磁通量,合成磁通量係環繞二通路之外側。藉由該合成磁通量之磁場及二通路之各個電流之相互作用(弗萊明(Fleming)左手定則)而於二電流(電漿電弧),作用圖十五所示之力F,二電流(電漿電弧)係彎曲於相互接近之方向。假設電弧不安定而該彎曲變大混雜二電流時,亦即合流時,鍵孔熔接及共付熔接之任意時候,皆無法顯現本以企圖之特性。亦即,發生熔接不良或焊珠形狀不良。越係為高電流而該傾向越大。However, the currents (plasma arcs) of the two paths flowing in parallel generate a rotating magnetic flux with the passage as the center, and the magnetic fluxes are between the two passages, which are opposite to the flow direction of the magnetic flux, thereby mutually canceling the magnetic flux. The synthetic magnetic flux surrounds the outside of the two paths. By the magnetic field of the synthetic magnetic flux and the interaction of the respective currents of the two paths (Fleming's left-hand rule) and the two currents (plasma arc), the force F shown in Figure 15 is applied, and the two currents (electricity) The slurry arc is bent in a direction close to each other. Assuming that the arc is unstable and the bending becomes large and mixed with two currents, that is, at the time of joining, the keyhole welding and the co-fusing can not exhibit the characteristics of the attempt at any time. That is, poor welding or poor bead shape occurs. The higher the current, the greater the tendency.

-第9實施例-- Ninth Embodiment -

第9實施例之噴嘴晶片1係為消除二電流混雜之可能性,因此,噴嘴4a、4b傾斜於相反於二電流彎曲向(F)之相反方向。亦即,噴嘴4a、4b相對於晶片端面之垂直線(z)而於晶片之直徑線上,往噴嘴開口離開晶片中心軸之方向傾斜。The nozzle wafer 1 of the ninth embodiment is capable of eliminating the possibility of mixing of two currents, and therefore, the nozzles 4a, 4b are inclined in the opposite direction to the opposite direction of the two current bending directions (F). That is, the nozzles 4a, 4b are inclined on the diameter line of the wafer with respect to the vertical line (z) of the wafer end face, in the direction in which the nozzle opening is away from the central axis of the wafer.

圖十六顯示藉由第9實施例之電漿電弧火炬所造成之單一坑池二電弧熔接形態。噴嘴4(4a、4b)係藉由電弧間之拉扯力F而彎曲電弧時,電弧相對於母材16之撞擊位置係往電極2a、2b之中心軸線傾斜以擴大θ角度部分及熔接進行方向y之電弧間隔之方向而正確或幾乎一致於預定之鍵孔熔接或共付熔接之位置(電極2a、2b之中心軸線混雜於母材表面之位置)。Figure 16 shows a single pit-and-two arc welding configuration caused by the plasma arc torch of the ninth embodiment. When the nozzle 4 (4a, 4b) bends the arc by the pulling force F between the arcs, the impact position of the arc with respect to the base material 16 is inclined toward the central axis of the electrodes 2a, 2b to enlarge the θ angle portion and the welding progress direction y The direction of the arc interval is correct or nearly identical to the position of the predetermined key hole welding or co-fusing (the center axis of the electrodes 2a, 2b is mixed at the position of the surface of the base material).

圖十七顯示圖十六所示之第9實施例之電漿電弧火炬具備之第9實施例之噴嘴晶片1。若藉由第9實施例,則噴嘴4a、4b呈傾斜而擴大熔接進行方向y之電弧間隔,因此,並無所謂藉由電弧電流之磁性作用(F)而混雜二電弧之可能性。Fig. 17 shows a nozzle wafer 1 of a ninth embodiment of the plasma arc torch of the ninth embodiment shown in Fig. 16. According to the ninth embodiment, the nozzles 4a and 4b are inclined to increase the arc interval in the welding direction y. Therefore, there is no possibility that the two arcs are mixed by the magnetic action (F) of the arc current.

-第10實施例-- 10th embodiment -

圖十九顯示成為第10實施例之電漿熔接裝置,圖二十(a)僅顯示圖十九所示之電漿火炬、亦即第10實施例之電漿電弧火炬,於圖二十(b),顯示火炬之前端面。第10實施例之電漿電弧火炬係進行電漿熔接之形態。嵌入式晶片1係藉由以螺絲夾緊嵌入式蓋罩7於絕緣台9,而固定於絕緣台9。保護用蓋罩8係藉由螺絲夾緊,而固定於絕緣台9。以3個比例以分離於x方向之前頭電極台11,中間電極台13eb及後尾端電極台12係位於絕緣體之外箱30之內部。絕緣本體14之棒桿係通過中間電極台13eb及前頭,後尾端電極台11、12之間之空間。Figure 19 shows a plasma welding device of the tenth embodiment, and Figure 20 (a) shows only the plasma torch shown in Figure 19, that is, the plasma arc torch of the tenth embodiment, in Figure 20 ( b), showing the front face of the torch. The plasma arc torch of the tenth embodiment is in the form of plasma welding. The embedded wafer 1 is fixed to the insulating stage 9 by clamping the embedded cover 7 to the insulating stage 9 with a screw. The protective cover 8 is fixed to the insulating table 9 by screwing. The head electrode stage 11 is separated from the x-direction before the x-direction, and the intermediate electrode stage 13eb and the rear-end stage electrode stage 12 are located inside the insulator outer case 30. The rod of the insulative housing 14 passes through the intermediate electrode table 13eb and the space between the front end and the rear end electrode stage 11, 12.

於嵌入式晶片1,具分布於與於晶片之中心軸(z)直交之同 一直徑線上且由該中心軸開始位處於等距離之前頭,後尾端電極配置空間1a、1c及該中心軸位置之中間電極配置空間1b,於各電極配置空間,插入貫通絕緣台9,且以螺絲10a、10b、10c固定於各電極台11、12、13之前頭電極2a、中間電極2b、後尾端電極2c之前端部,於各電極配置空間1a~1c之軸心位置,以定心石3進行定位。於嵌入式晶片1之連接於各電極配置空間1a~1c之噴嘴4(4a、4b、4c)正對母材16(熔接目標材)之前端面係呈開口。In the embedded wafer 1, distributed in the same direction as the central axis (z) of the wafer a head line, a front end electrode arrangement space 1a, 1c, and an intermediate electrode arrangement space 1b at the center axis position are inserted into the through-insulation stage 9 in each electrode arrangement space, and The screws 10a, 10b, and 10c are fixed to the front end portions of the front electrode 2a, the intermediate electrode 2b, and the rear end electrode 2c before the electrode pads 11, 12, and 13, and are positioned at the axial center of each of the electrode arrangement spaces 1a to 1c. 3 Positioning. The nozzles 4 (4a, 4b, 4c) connected to the respective electrode arrangement spaces 1a to 1c of the embedded wafer 1 are open to the front end surface of the base material 16 (welding target material).

圖二十一擴大地顯示嵌入式晶片1。本實施例之嵌入式晶片1,具備分布於與晶片1之中心軸(z)直交之同一直徑線且位於該中心軸位置之中間電極配置空間1b,及由該中心軸開始位處於等距離而呈平行地延伸於中心軸(z)之前頭、後尾端電極配置空間1a、1c,及連通至各空間1a、1b、1c而開口於對向於母材16之前端面之前頭、中間、後尾端之噴嘴4a、4b、4c。該些噴嘴4a、4b、4c係亦於本實施例,分布與晶片之中心軸(z)直交之同一直徑線上,平行於該中心軸且以等間距進行分布。Figure 21 shows an enlarged view of the embedded wafer 1. The embedded wafer 1 of the present embodiment includes an intermediate electrode arrangement space 1b which is distributed on the same diameter line orthogonal to the central axis (z) of the wafer 1 and located at the central axis position, and is equidistant from the start position of the central axis. The head, rear end electrode arrangement spaces 1a, 1c are extended in parallel before the central axis (z), and are connected to the respective spaces 1a, 1b, 1c and open to the front, middle, and rear ends before the end faces of the base material 16 Nozzles 4a, 4b, 4c. The nozzles 4a, 4b, 4c are also distributed on the same diameter line orthogonal to the central axis (z) of the wafer in this embodiment, parallel to the central axis and distributed at equal intervals.

於火炬之絕緣台9,於圖十九上,省略圖示,但具圖二十二上所顯示之導向氣體流路及冷卻水流路。又,具導引保護用氣體至保護用蓋罩8內之保護用氣體流路(省略圖示)。導向氣體係正如圖二十二(a)所示,通過氣體流路及電極插入空間而進入至電極配置空間1a~1c,於電極前端部,成為電漿而通過噴嘴4a~4c,並由火炬之前端面噴出。冷卻水係正如圖二十二(b)所示,通過冷卻水供水流路而進入至嵌入式晶片1之外圍面及嵌入式蓋罩7之內圍面之間之空間,由此開始通過冷卻水排水流路而流出至火炬外。保護用氣體係通過保護用氣體流路而進入至嵌入式蓋罩7及保護用蓋罩8之間之圓筒狀空間,接著,由火炬之前端面噴出。The insulating table 9 for the torch is not shown in Fig. 19, but has a guiding gas flow path and a cooling water flow path as shown in Fig. 22. Further, a protective gas flow path (not shown) for guiding the protective gas into the protective cover 8 is provided. As shown in Fig. 22 (a), the pilot gas system enters the electrode arrangement spaces 1a to 1c through the gas flow path and the electrode insertion space, and passes through the nozzles 4a to 4c at the tip end portion of the electrode, and is torched by the torch. The front end is ejected. As shown in FIG. 22(b), the cooling water system enters the space between the peripheral surface of the embedded wafer 1 and the inner peripheral surface of the embedded cover 7 through the cooling water supply flow path, thereby starting cooling. The water drains the flow path and flows out of the torch. The protective gas system enters the cylindrical space between the embedded cover 7 and the protective cover 8 through the protective gas flow path, and is then ejected from the front end surface of the torch.

正如圖十九所示,藉由導向電源18ap、18bp、18cp而於電極2a、2b、2c及晶片1之間,產生導向電弧,藉由於電極2a、2b、2c及母材16間,使電極側流動負電漿電弧電流且母材側流動正電漿電弧電流之電漿電源18aw(預熱用)、18bw(內焊珠形成用)、18cw(共付熔接用),於產生熔接電弧(電漿電弧)時,電漿電弧電流係流動於各電極2a、2b、2c及母材16間,實現一坑池3電弧熔接。於圖十九所示之熔接裝置,進行藉由電極2a之電漿電弧所造成之預熱,藉由電極2b所造成之內焊珠形成及藉由電極2c所造成之共付熔接。又,熔接之進行方法係箭號之y方向。亦即,中間之焊珠形成係使藉由前頭之預熱而生成之表面部熔融坑池(圖二十三(a))熔融或貫通至母材背面(底面)為止(圖二十三(b)),於3mm以上之厚板之狀態下,例如將藉由鍵孔熔接形成之熔融坑池,傳送至後方,後行之共付熔接係平均藉由鍵孔熔接而形成之熔融焊珠。藉此而成為圖二十三(c)所示之滑動地連接於母材表面之共付熔接焊珠。於未滿3mm之薄板之狀態下,不可能進行鍵孔熔接,因此,藉由前頭之預熱及中間之熔接而形成圖二十三(b)所示之焊珠,該焊珠係藉由後尾端之共付熔接而變化成為圖二十三(c)所示之焊珠。正如所習知者,與進行大電流單一坑池寬幅熔接不同,其中間及後尾端係皆分別分成為各種功能,能以必要之最低限度之低電流,以進行焊珠幅寬狹窄之高速熔接。藉由前頭之預熱而使中間之熔接易達至母材之背面,因此,能以更加高速進行熔接。As shown in FIG. 19, a guiding arc is generated between the electrodes 2a, 2b, 2c and the wafer 1 by the guiding power sources 18ap, 18bp, 18cp, and the electrodes are made between the electrodes 2a, 2b, 2c and the base material 16. A plasma power source 18aw (for preheating), 18bw (for inner bead formation), and 18cw (for common welding) for the side of the negative plasma arc current and the positive plasma arc current flowing on the base material side, to generate a welding arc (electricity) In the case of a slurry arc, a plasma arc current flows between the electrodes 2a, 2b, 2c and the base material 16 to effect arc welding of a pit 3. In the welding device shown in Fig. 19, the preheating by the plasma arc of the electrode 2a is performed, and the inner bead formation by the electrode 2b and the co-existing welding by the electrode 2c are performed. Moreover, the method of welding is performed in the y direction of the arrow. That is, the middle bead formation is such that the surface portion molten pit pool (Fig. 23 (a)) generated by the preheating of the front melts or penetrates to the back surface (bottom surface) of the base material (Fig. 23 ( b)), in the state of a thick plate of 3 mm or more, for example, the molten pit pool formed by the bonding of the keyholes is transferred to the rear, and the subsequent molten fusion bonding system is formed by the fusion of the keyholes. . Thereby, the co-welded bead which is slidably attached to the surface of the base material as shown in Fig. 23(c) is obtained. In the state of a thin plate of less than 3 mm, it is impossible to perform keyhole welding. Therefore, the bead shown in Fig. 23(b) is formed by the preheating of the front and the fusion of the middle, the bead is used by The co-firing of the rear end is changed to become the bead shown in Fig. 23 (c). As is customary, unlike the wide-width welding of a large current single pit pool, the middle and rear end systems are respectively divided into various functions, and the necessary minimum current can be used to carry out the high speed of the bead width. Welding. By the preheating of the front, the fusion in the middle can be easily reached to the back surface of the base material, so that the welding can be performed at a higher speed.

圖十九所示之實施例,藉由前頭電極2a而造成之預熱,減少導向氣體流量成為0.2~1.0(公升/min)而進行淺熔入之預熱。為藉由中間電極2b形成內焊珠,加深熔入,因此,增多導向氣體流量以成為0.5~5.0(公升/min),於母材厚度3mm以上時,藉 由鍵孔熔接,以高流量之導向氣體,而挖掘母材至貫通背面為止,形成內波。於母材厚度未滿3mm時,成為較低流量之導向氣體,藉由直至母材背面為止之熱熔融而形成內焊珠(圖二十三(b))。藉由後尾端電極2c而形成表面焊珠,減少導向氣體流量以成為0.2~1.0(公升/min),藉由淺熔入而熔解表面變薄,變平滑(圖二十三(c))。In the embodiment shown in Fig. 19, the preheating by the front electrode 2a reduces the flow rate of the pilot gas to 0.2 to 1.0 (liter/min) for preheating of shallow fusion. In order to form the inner bead by the intermediate electrode 2b and deepen the fusion, the flow rate of the pilot gas is increased to be 0.5 to 5.0 (liter/min), and when the thickness of the base material is 3 mm or more, The inner hole is formed by welding the key hole and guiding the gas with a high flow rate to excavate the base material to penetrate the back surface. When the thickness of the base material is less than 3 mm, it becomes a pilot gas of a lower flow rate, and the inner bead is formed by heat fusion up to the back surface of the base material (Fig. 23 (b)). The surface bead is formed by the rear end electrode 2c, and the flow rate of the pilot gas is reduced to 0.2 to 1.0 (liter/min), and the molten surface is thinned and smoothed by shallow fusion (Fig. 23(c)).

例如於實施例8~10之一坑池二電弧熔接,能藉由先行電弧電流210A、後行電弧210/160A:30Hz切換之條件,2.3m/min之較高速,相對於板厚1.6mm之母材,進行安定高品質之電漿電弧熔接。相對於此,本實施例中,能藉由前頭電弧電流200A、中間電弧電流210A、後尾端電弧電流210/160A(45Hz切換)之條件,而對於板厚1.6mm之母材,進行3.0m/min之更加高速且安定高品質之電漿電弧熔接。For example, in the embodiment 8 to 10, one of the pits and two arcs can be switched by the condition of the preceding arc current 210A and the trailing arc 210/160A: 30 Hz, and the high speed of 2.3 m/min is relative to the plate thickness of 1.6 mm. The base metal is used for stable high-quality plasma arc welding. On the other hand, in the present embodiment, it is possible to perform 3.0 m/ of the base material having a thickness of 1.6 mm by the conditions of the front arc current 200A, the intermediate arc current 210A, and the rear end arc current 210/160A (45 Hz switching). Min is a more high speed and stable high quality plasma arc welding.

一般而言,平行地流動之二通路之電流(電漿電弧)係分別以通路作為中心而產生旋轉之磁通量,該些磁通量係於二通路之間,磁通量之流動方向呈相反,因此,相互地抵銷磁通量,合成磁通量係環繞二通路之外側。藉由該合成磁通量之磁場及二通路之各個電流之相互作用而於二電流(電漿電弧),作用洛倫茲(Lorentz)力F,二電流(電漿電弧)係彎曲於相互接近之方向。假設電弧不安定而該彎曲變大以混雜二電流時,亦即合流時,無法顯現本企圖之熔接特性。亦即,發生熔接不良或焊珠形狀不良。越係成為高電流而該傾向越大。In general, the currents (plasma arcs) of the two paths flowing in parallel generate a rotating magnetic flux with the passage as a center, and the magnetic fluxes are between the two passages, and the flow directions of the magnetic fluxes are opposite. To offset the magnetic flux, the resultant magnetic flux surrounds the outside of the two paths. By the interaction of the magnetic field of the combined magnetic flux and the respective currents of the two paths, the two currents (plasma arcs) are applied, and the Lorentz force F is applied, and the two currents (plasma arcs) are bent in a direction close to each other. . It is assumed that the arc is unstable and the bending becomes large to mix the two currents, that is, when the current is merged, the welding characteristics of the present attempt cannot be exhibited. That is, poor welding or poor bead shape occurs. The higher the current becomes, the higher the tendency is.

但圖十九所示之第10實施例,正如圖二十四所示,於前頭電極2a及中間電極2b之電弧間,作用成為Fa之拉扯之洛倫茲力,亦於中間電極2b及後尾端電極2c之電弧間,作用成為Fc之拉扯之洛倫茲力,於中間電極2b之電弧,作用Fa及Fc之合成力,該 合成力係僅是抵銷Fa及Fc之殘餘,形成內焊珠之中間電極2b之電弧呈安定,安定內波(內焊珠)之形成。作用於前頭電極2a之預熱電弧之洛倫茲力Fa係於熔接進行方向y,使該電弧搖動於下游側,該電弧相對於熔接進行方向y而成為後進角,但不影響焊珠之形成。作用於後尾端電極2c之共付電弧之洛倫茲力Fc係於熔接進行方向y,使該電弧搖動於上游側,該電弧相對於熔接進行方向y而成為前進角,貢獻於平滑化。亦即,後尾端電極2c之共付電弧之電漿係流動於前方,電弧電漿係不散亂形成於該電弧後方之熔融坑池,因此,表面焊珠係成為平滑且漂亮之焊珠表面。However, the tenth embodiment shown in FIG. 19, as shown in FIG. 24, acts as a Lorentz force for pulling the Fa between the arcs of the front electrode 2a and the intermediate electrode 2b, and also at the intermediate electrode 2b and the rear end. The arc between the end electrodes 2c acts as the Lorentz force of the Fc pull, and the arc of the intermediate electrode 2b acts on the resultant force of Fa and Fc. The synthetic force is only to offset the residual of Fa and Fc, and the arc of the intermediate electrode 2b forming the inner bead is stabilized, and the formation of the internal wave (internal bead) is stabilized. The Lorentz force Fa acting on the preheating arc of the front electrode 2a is in the welding progress direction y, and the arc is rocked on the downstream side, and the arc is in the backward direction with respect to the welding direction y, but does not affect the formation of the bead. . The Lorentz force Fc of the co-payment arc applied to the rear end electrode 2c is in the welding progress direction y, and the arc is oscillated on the upstream side, and the arc is advanced in the direction y with respect to the welding, contributing to smoothing. That is, the plasma of the co-payment arc of the rear end electrode 2c flows in the front, and the arc plasma is not scattered in the crater pool behind the arc, so the surface bead becomes a smooth and beautiful bead surface. .

-第11實施例-- Eleventh embodiment -

於圖二十五顯示適合於厚板之高速熔接之本發明之第11實施例之電漿熔接裝置。於板厚3mm以上時且增多導向氣體流量之鍵孔熔接,於加快熔接速度時,藉由中間電極2b所造成之熔融坑池係變大於熔接方向y,熔融金屬以熔落之可能性變高。故,於第2實施例,比起前頭電極2a及中間電極2b之距離,仍更加長後尾端電極2c相對於中間電極2b之距離,藉由後尾端電極之電漿電弧而對於中間電極2b之鍵孔熔接以形成之熔融坑池開始凝固之位置,進行共付熔接。藉此而即便鍵孔熔接速度成為高速化,亦能抑制熔融金屬之熔落。藉由後尾端電極2c所造成之共付熔接係再加熱凝固金屬而進行熔融,凝固金屬係開始凝固即刻後之高熱,因此,易熔融,適合於高速化。A plasma welding apparatus according to an eleventh embodiment of the present invention, which is suitable for high-speed welding of thick plates, is shown in Fig. 25. When the thickness of the plate is 3 mm or more and the keyhole welding of the pilot gas flow rate is increased, when the welding speed is increased, the molten pit pool caused by the intermediate electrode 2b becomes larger than the welding direction y, and the molten metal is likely to be melted. . Therefore, in the second embodiment, the distance from the front electrode 2a and the intermediate electrode 2b is longer, and the distance between the rear end electrode 2c and the intermediate electrode 2b is longer with respect to the intermediate electrode 2b by the plasma arc of the rear end electrode. The keyhole is welded to form a position where the molten pit pool begins to solidify, and co-fuse is performed. Thereby, even if the keyhole welding speed is increased, the melting of the molten metal can be suppressed. The co-welding system by the rear end electrode 2c reheats the solidified metal to be melted, and the solidified metal starts to solidify immediately after the solidification. Therefore, it is easy to melt and is suitable for high speed.

不限定於電漿電弧熔接,即便藉由TIG熔接,亦可進行預熱或共付。於TIG熔接,不需導向電源,因此,能以低成本,以構成電源裝置。又,保護用氣體係充滿火炬之下端,因此,於TIG熔接,亦可省略由電極配置空間以噴出至母材之導向氣體。故,亦實施下列之表1所示之實施形態。It is not limited to the plasma arc welding, and even if it is welded by TIG, it can be preheated or co-paid. Since the TIG is fused, no power supply is required, and therefore, the power supply device can be constructed at low cost. Further, since the protective gas system is filled at the lower end of the torch, the guide gas which is ejected to the base material by the electrode arrangement space can be omitted in the TIG welding. Therefore, the embodiments shown in Table 1 below are also implemented.

表1上之實施形態1係正如第1、第2實施例,前頭電極2a、中間電極2b及後尾端電極2c之任何一種皆進行電漿電弧熔接。Embodiment 1 of Table 1 is the first and second embodiments, and any one of the front electrode 2a, the intermediate electrode 2b, and the rear end electrode 2c is subjected to plasma arc welding.

-第12實施例-- 12th embodiment -

圖二十六所示之本發明之第12實施例之電漿熔接裝置係表1上之實施形態2。亦即,前頭電極2a係藉由TIG熔接而預熱母材,由嵌入式晶片1之打開於其下端面之電極配置空間之開口開始而更加突出於下方,藉由TIG電弧而預熱熔融母材之表面。中間電極2b及後尾端電極2c係相同於第1、第2實施例,藉由電漿電弧熔接而進行內焊珠之形成及共付。The plasma welding apparatus according to the twelfth embodiment of the present invention shown in Fig. 26 is the second embodiment in Table 1. That is, the front electrode 2a preheats the base material by TIG welding, and starts to protrude from the opening of the electrode arrangement space of the embedded wafer 1 at the lower end surface thereof, and preheats the molten mother by the TIG arc. The surface of the material. The intermediate electrode 2b and the rear end electrode 2c are the same as those of the first and second embodiments, and the inner bead is formed and co-paid by plasma arc welding.

-第13實施例-- 13th embodiment -

圖二十七所示之本發明之第13實施例之電漿熔接裝置係表1上之實施形態3。亦即,前頭電極2a及後尾端電極2c係藉由TIG熔接而預熱及共付母材,由嵌入式晶片1,其之打開於由其下端面之電極配置空間之開口開始而更加突出於下方,藉由TIG電弧而預熱熔融及共付熔接母材之表面。中間電極2b係相同於第1、第2實施例,藉由電漿電弧熔接而進行內焊珠之形成。The plasma welding apparatus according to the thirteenth embodiment of the present invention shown in Fig. 27 is the third embodiment in Table 1. That is, the front electrode 2a and the rear end electrode 2c are preheated and co-paid by the TIG welding, and the embedded wafer 1 is opened by the opening of the electrode arrangement space of the lower end surface thereof to be more prominent. Below, the surface of the base material is preheated and melted by TIG arcing. The intermediate electrode 2b is the same as the first and second embodiments, and the inner bead is formed by plasma arc welding.

於表1上之實施形態4,後尾端電極2c係藉由TIG熔接而共付母材,由嵌入式晶片1之打開於其下端面之電極配置空間之開口開始而更加突出於下方,藉由TIG電弧而共付熔接母材之表 面。前頭電極2a及中間電極2b係相同於第1、第2實施例,藉由電漿電弧熔接而進行預熱及內焊珠之形成。In the fourth embodiment of Table 1, the rear end electrode 2c is co-fed by the TIG welding, and the opening of the electrode arrangement space of the embedded wafer 1 opened at the lower end surface thereof is further protruded downward. TIG arc and co-fired base material surface. The front electrode 2a and the intermediate electrode 2b are the same as the first and second embodiments, and are preheated by the plasma arc welding and formed by the inner bead.

表1上之實施形態5,藉由前頭電極2a之電漿電弧熔接而形成內焊珠。中間電極2b及後尾端電極2c係藉由TIG熔接而分別形成表面焊珠。亦即,藉由二階段而形成表面焊珠。該焊珠係適合於母材熔融金屬之表面張力大之母材。又,即便實施形態4,亦同樣可藉由前頭電極2a之電漿電弧熔接而形成內焊珠,藉由以中間電極2b所造成之電漿電弧熔接及以後尾端電極2c所造成之TIG熔接,而分別形成表面焊珠。In the fifth embodiment of Table 1, the inner bead is formed by welding the plasma arc of the front electrode 2a. The intermediate electrode 2b and the rear end electrode 2c are respectively formed by surface welding beads by TIG welding. That is, the surface bead is formed by the two stages. The bead is suitable for a base material having a large surface tension of the molten metal of the base material. Further, even in the fourth embodiment, the inner bead can be formed by the plasma arc welding of the front electrode 2a, and the plasma arc welding by the intermediate electrode 2b and the TIG welding by the rear end electrode 2c can be performed. And surface bead is formed separately.

又,前述之第11~13實施例及實施形態之任何一種係皆中間電極2b為一條,但若藉由本發明,則亦具使用二條以上之中間電極之形態。但於該狀態下,全部之電極係亦位於延伸於熔接方向之一直線上。例如於使用二條中間電極2b1、2b2之實施形態,能藉由以先行之中間電極2b1所造成之電漿電弧熔接,以挖掘於以一條中間電極所造成之鍵孔熔接而無法貫通至母材背面之厚母材,接著,藉由後行之中間電極2b2所造成之電漿電弧熔接,進行鍵孔熔接而直到母材背面為止。換言之,能以高速對厚板進行鍵孔熔接。Further, in any of the eleventh to thirteenth embodiments and the embodiment, the intermediate electrode 2b is one piece. However, according to the present invention, two or more intermediate electrodes are also used. However, in this state, all of the electrode systems are also located on a straight line extending in the welding direction. For example, in the embodiment in which the two intermediate electrodes 2b1 and 2b2 are used, the plasma arc welding by the preceding intermediate electrode 2b1 can be used to dig the keyhole caused by one intermediate electrode and cannot penetrate to the back surface of the base material. The thick base material is then welded by the plasma arc caused by the succeeding intermediate electrode 2b2, and the keyhole is welded until the back surface of the base material. In other words, the keyhole can be welded to the thick plate at a high speed.

1‧‧‧嵌入式晶片1‧‧‧ embedded chip

1a、1b‧‧‧電極配置空間1a, 1b‧‧‧electrode configuration space

1d‧‧‧擴大口1d‧‧‧Expanded

4a‧‧‧前頭噴嘴4a‧‧‧ front nozzle

4b‧‧‧中間噴嘴4b‧‧‧Intermediate nozzle

5‧‧‧中央孔5‧‧‧Central hole

Claims (33)

一種嵌入式晶片,其特徵為,具備於晶片之上端面具容納非消耗電極之開口,且由該開口開始朝向晶片之下端面而延伸,沿直交於晶片中心軸之直徑線分布之複數電極配置空間,及直徑比該電極配置空間小,在該電極配置空間到達前述下端面前,連通至該電極配置空間,且朝向前述下端面之下方以打開之至少一電漿電弧噴嘴。 An embedded wafer, characterized in that the upper end of the wafer has an opening for accommodating the non-consumable electrode, and the opening extends toward the lower end surface of the wafer, and the plurality of electrode arrangement spaces distributed along the diameter line orthogonal to the central axis of the wafer And at least one plasma arc nozzle that is smaller in diameter than the electrode arrangement space and that is open to the electrode arrangement space before the electrode arrangement space reaches the electrode arrangement space and opens below the lower end surface. 根據申請專利範圍第1項所述之嵌入式晶片,其中,尚有由前述之上端面開始貫通至下端面而同心於晶片中心軸之同芯中央孔,前述複數電極配置空間係於以該中央孔之中心軸作為中心之圓周上,以等角度之間距分布,前述電漿電弧噴嘴係於以前述之中心軸作為中心之圓周上,以等角度之間距分布之複數個。 The embedded wafer according to claim 1, wherein a center hole of the same core is formed from the upper end surface to the lower end surface and concentric with the central axis of the wafer, and the plurality of electrode arrangement spaces are in the center The central axis of the hole is distributed on the circumference of the center at equal angular intervals, and the plasma arc nozzle is distributed on the circumference centered on the central axis as described above, and is distributed in a plurality of equiangular distances. 根據申請專利範圍第2項所述之嵌入式晶片,其中,嵌入式晶片係尚具備打開於連接於前述中央孔並正對加工目標材之前端面,且直徑大於前述中央孔大徑之擴大口,前述之噴嘴係於比前述前端面之更加內側處,打開於前述之擴大口。 The embedded wafer according to claim 2, wherein the embedded wafer system further has an enlarged opening that is opened to the front end surface of the target hole and is larger than the central hole. The nozzle is attached to the inner side of the front end surface and opened to the enlarged opening. 一種電漿火炬,其特徵為,具備申請專利範圍第2或3項所記載之嵌入式晶片,及於該嵌入式晶片之前述中央孔以導引線之導線件,及於前述嵌入式晶片之各電極配置空間以插入前端部之複數非消耗電極,及用以冷卻前述嵌入式晶片之冷卻水流路,及用以於各電極配置空間供應導向氣體之導向氣體流路。 A plasma torch characterized by having an embedded wafer as described in claim 2 or 3, and a wire member for guiding a wire in the central hole of the embedded chip, and the embedded chip Each of the electrode arrangement spaces has a plurality of non-consumable electrodes inserted into the front end portion, a cooling water flow path for cooling the embedded wafer, and a guiding gas flow path for supplying a guiding gas to each electrode arrangement space. 一種電漿熔接裝置,其特徵為,具備申請專利範圍第4項所記載之電漿火炬,及於前述複數非消耗電極及加工目標材間,使電極側流動負電漿電弧電流且加工目標材側流動正電漿電弧電流之電源。 A plasma welding device characterized by comprising the plasma torch described in claim 4, and between the plurality of non-consumable electrodes and the processing target, causing a negative plasma arc current to flow on the electrode side and processing the target material side A power source that flows positive plasma arc current. 根據申請專利範圍第5項所述之電漿熔接裝置,其中,於前述 線及加工目標材間,尚具備線側流動負電流且加工目標材側流動正電流之加熱線電源。 A plasma welding device according to claim 5, wherein Between the wire and the processing target, there is a heating wire power source that flows negative current on the line side and flows positive current on the processing target side. 一種電漿MIG熔接裝置,其特徵為,具備申請專利範圍第4項所記載之電漿火炬,及於前述複數非消耗電極及加工目標材間,使電極側流動正電漿電弧電流且加工目標材側流動負電漿電弧電流之電源,及於前述線及加工目標材間,使線側流動正電流且加工目標材側流動負電流之MIG熔接電源。 A plasma MIG welding device characterized by comprising the plasma torch described in claim 4, and flowing a positive plasma arc current between the plurality of non-consumable electrodes and the processing target, and processing target The power source of the negative plasma arc current flows on the material side, and the MIG welding power source that flows a positive current on the line side and flows a negative current on the processing target side between the line and the processing target. 一種電漿線厚壁裝置,其特徵為,具備申請專利範圍第4項所記載之電漿火炬,及於前述複數非消耗電極及加工目標材間,使電極側流動負電漿電弧電流且加工目標材側流動正電漿電弧電流之電源,及於前述線及各電極間,使線側流動正電流且電極側流動負電流之加熱線電源。 A plasma line thick-wall device, comprising: a plasma torch according to claim 4, and a negative plasma arc current flowing between the plurality of non-consumable electrodes and the processing target, and processing target A power source for the positive plasma arc current flowing on the material side, and a heating line power source for flowing a positive current on the line side and a negative current on the electrode side between the line and each of the electrodes. 一種電漿粉體厚壁火炬,其特徵為,具備申請專利範圍第2或3項所記載之嵌入式晶片,及於該嵌入式晶片之前述中央孔以導引粉體之粉體導向件,及於前述嵌入式晶片之各電極配置空間以插入前端部之複數非消耗電極,及用以冷卻前述嵌入式晶片之冷卻水流路,及用以於各電極配置空間供應導向氣體之導向氣體流路。 A plasma powder thick-walled torch characterized by having the embedded wafer described in claim 2 or 3, and the central hole of the embedded wafer to guide the powder guide of the powder, And a plurality of non-consumable electrodes inserted into the front end portion of the electrode arrangement space of the embedded chip, a cooling water flow path for cooling the embedded chip, and a guiding gas flow path for supplying a guiding gas to each electrode arrangement space. . 一種電漿粉體厚壁裝置,其特徵為,具備申請專利範圍第9項所記載之電漿粉體厚壁火炬,及於前述複數非消耗電極及加工目標材間,使電極側流動負電漿電弧電流且加工目標材側流動正電漿電弧電流之電源,及於前述之粉體導向件供應粉體之手段。 A plasma powder thick-wall device characterized by having a plasma powder thick-walled torch as described in claim 9 and flowing a negative plasma between the plurality of non-consumable electrodes and the processing target material The electric current of the arc current and the flow of the positive plasma arc current on the processing target side, and the means for supplying the powder to the powder guide described above. 一種電漿鍵孔熔接火炬,其特徵為,具備申請專利範圍第2或3項所記載之嵌入式晶片,及於該嵌入式晶片之前述中央孔導引鍵孔氣體之氣體導向件,及於前述嵌入式晶片之各電極配置 空間以插入前端部之複數非消耗電極,及用以冷卻前述嵌入式晶片之冷卻水流路,及用以於各電極配置空間供應導向氣體之導向氣體流路。 A plasma keyhole welding torch, characterized by comprising the embedded wafer described in claim 2 or 3, and a gas guiding member for guiding the keyhole gas in the central hole of the embedded wafer, and Each electrode configuration of the aforementioned embedded wafer The space is a plurality of non-consumable electrodes inserted into the front end portion, a cooling water flow path for cooling the embedded wafer, and a guiding gas flow path for supplying a guiding gas to each electrode arrangement space. 一種電漿鍵孔熔接裝置,其特徵為,具備申請專利範圍第11項所記載之電漿鍵孔熔接火炬,及於前述複數非消耗電極及加工目標材間,使電極側流動負電漿電弧電流且加工目標材側流動正電漿電弧電流之電源。 A plasma keyhole welding device, characterized in that the plasma keyhole welding torch described in claim 11 is provided, and a negative plasma arc current flows between the plurality of non-consumable electrodes and the processing target material And the power source of the positive plasma arc current flowing on the processing target side. 一種電漿切斷火炬,其特徵為,具備申請專利範圍第2或3項所記載之嵌入式晶片,及於該嵌入式晶片之前述中央孔導引切斷用氣體之氣體導向件,及於前述嵌入式晶片之各電極配置空間插入前端部之複數非消耗電極,及用以冷卻前述嵌入式晶片之冷卻水流路,及用以於各電極配置空間供應導向氣體之導向氣體流路。 A plasma cutting torch characterized by comprising the embedded wafer described in claim 2 or 3, and a gas guiding member for guiding the cutting gas to the center hole of the embedded wafer, and Each of the electrode arrangement spaces of the embedded wafer is inserted into a plurality of non-consumable electrodes of the front end portion, a cooling water flow path for cooling the embedded wafer, and a guiding gas flow path for supplying a guiding gas to each electrode arrangement space. 一種電漿切斷裝置,其特徵為,具備申請專利範圍第13項所記載之電漿切斷火炬,及於前述複數非消耗電極及加工目標材間,使電極側流動負電漿電弧電流且加工目標材側流動正電漿電弧電流之電源。 A plasma cutting device comprising: a plasma cutting torch according to claim 13; and a negative plasma arc current flowing between the plurality of non-consumable electrodes and the processing target A power source that flows positive plasma arc current on the target side. 根據申請專利範圍第1項所述之嵌入式晶片,其中,前述複數電極配置空間係二個,前述電漿電弧噴嘴係分布於同一直徑線上且分別連通至各電極配置空間,且正對平行於前述直徑線之熔接線打開之二個。 The embedded wafer according to claim 1, wherein the plurality of electrode arrangement spaces are two, and the plasma arc nozzles are distributed on the same diameter line and are respectively connected to the respective electrode arrangement spaces, and are directly opposite to each other. The aforementioned weld line of the diameter wire is opened. 根據申請專利範圍第15項所述之嵌入式晶片,其中,前述電漿電弧噴嘴係相對於前述下端面之垂直線呈平行。 The embedded wafer according to claim 15, wherein the plasma arc nozzle is parallel to a vertical line of the lower end surface. 根據申請專利範圍第15項所述之嵌入式晶片,其中,前述電漿電弧噴嘴係相對於前述下端面之垂直線,於前述之直徑線上,傾斜於噴嘴開口離開晶片中心軸之方向。 The embedded wafer according to claim 15, wherein the plasma arc nozzle is inclined to a direction perpendicular to the central axis of the wafer from the vertical axis of the lower end surface. 根據申請專利範圍第16或17項所述之嵌入式晶片,其中,各電極配置空間係平行於前述下端面之垂直線。 The embedded wafer according to claim 16 or 17, wherein each electrode arrangement space is parallel to a vertical line of the lower end surface. 一種電漿火炬,其特徵為,具備申請專利範圍第15至17項中任一項所記載之嵌入式晶片,及於該嵌入式晶片之各電極配置空間插入各個前端部之二個非消耗電極。 A plasma torch characterized by comprising the embedded wafer according to any one of claims 15 to 17, and inserting two non-consumable electrodes of each front end portion in each electrode arrangement space of the embedded wafer . 一種電漿熔接裝置,其特徵為,具備申請專利範圍第19項所記載之電漿火炬,及於該電漿火炬之第1非消耗電極供電鍵孔熔接或預熱電力之第1電源,及於第2非消耗電極供電共付熔接或正式熔接電力之第2電源。 A plasma welding device, comprising: a plasma torch according to claim 19; and a first power source for welding or preheating power to a first non-consumable electrode power supply key hole of the plasma torch, and The second non-consumable electrode is supplied with a second power source that is co-fed or officially spliced with electric power. 根據申請專利範圍第1項所述之嵌入式晶片,其中,前述複數電極配置空間係包含分布於熔接方向之一直線上之前頭電極配置空間,及一以上之中間電極配置空間及後尾端電極配置空間。 The embedded wafer according to claim 1, wherein the plurality of electrode arrangement spaces include a head electrode arrangement space before one of the welding directions, and one or more intermediate electrode arrangement spaces and a rear end electrode arrangement space. . 根據申請專利範圍第21項所述之嵌入式晶片,其中,連通至前述前頭中間電極配置空間及後尾端電極配置空間之前述電漿電弧噴嘴間距離,係較連通至前述前頭電極配置空間及前述中間電極配置空間之前述電漿電弧噴嘴間之距離長。 The embedded wafer according to claim 21, wherein the distance between the plasma arc nozzles connected to the front intermediate electrode arrangement space and the rear end electrode arrangement space is communicated to the front electrode arrangement space and the aforementioned The distance between the aforementioned plasma arc nozzles of the intermediate electrode arrangement space is long. 根據申請專利範圍第21或22項所述之嵌入式晶片,其中,各在各電極配線空間連通有電漿電弧噴嘴。 The embedded wafer according to claim 21 or 22, wherein a plasma arc nozzle is connected to each of the electrode wiring spaces. 根據申請專利範圍第21或22項所述之嵌入式晶片,其中,前述前頭電極配置空間或前述後尾端電極配置空間係TIG熔接電極貫通之孔穴。 The embedded wafer according to claim 21 or 22, wherein the front electrode arrangement space or the rear end electrode arrangement space is a hole through which the TIG fusion electrode penetrates. 根據申請專利範圍第21或22項所述之嵌入式晶片,其中,前述前頭電極配置空間及前述後尾端電極配置空間係TIG熔接電極貫通之孔穴。 The embedded wafer according to claim 21 or 22, wherein the front electrode arrangement space and the rear end electrode arrangement space are holes through which the TIG welding electrode penetrates. 根據申請專利範圍第21或22項所述之嵌入式晶片,其中,在 前述前頭電極配置空間連通有前述電漿電弧噴嘴,前述中間電極配置空間及前述後尾端電極配置空間係TIG熔接電極貫通之孔穴。 An embedded wafer according to claim 21 or 22, wherein The plasma arc nozzle is connected to the front electrode arrangement space, and the intermediate electrode arrangement space and the rear end electrode arrangement space are holes through which the TIG welding electrodes pass. 一種電漿火炬,其特徵為,具備申請專利範圍第21項所記載之嵌入式晶片,及於該嵌入式晶片之各電極配置空間插入各前端部之複數非消耗電極。 A plasma torch characterized by comprising the embedded wafer described in claim 21, and a plurality of non-consumable electrodes inserted into each of the front end portions in each electrode arrangement space of the embedded wafer. 一種電漿熔接裝置,其特徵為,具備申請專利範圍第27項所記載之電漿火炬,及於該電漿火炬之前頭非消耗電極以供電預熱電力之第1電源,及於中間非消耗電極以供電內焊珠形成用電力之第2電源,及於後尾端非消耗電極供電共付電力之第3電源。 A plasma welding device characterized by comprising the plasma torch described in claim 27, and the first power source for supplying preheating power to the non-consumable electrode before the plasma torch, and non-consumable in the middle The electrode is a second power source that supplies electric power for forming the inner bead, and a third power source that supplies electric power to the non-consumable electrode at the rear end. 一種電漿熔接裝置,其特徵為,具備具於申請專利範圍第22項所記載之嵌入式晶片之各電極配置空間插入各前端部之複數非消耗電極之電漿火炬,及於該電漿火炬之前頭非消耗電極以供電預熱電力之第1電源,及於中間非消耗電極以供電鍵孔熔接電力之第2電源,及於後尾端非消耗電極供電共付電力之第3電源。 A plasma welding device, comprising: a plasma torch having a plurality of non-consumable electrodes inserted into each of the front end portions of each of the electrode arrangement spaces of the embedded wafers described in claim 22, and the plasma torch The first non-consumable electrode is a first power source for supplying preheated power, and a second power source for splicing power to the power supply key hole in the middle non-consumable electrode, and a third power source for supplying power to the rear end non-consumable electrode. 根據申請專利範圍第28或29項所述之電漿熔接裝置,其中,第1、第2及第3電源係電漿熔接電源。 The plasma welding apparatus according to claim 28 or 29, wherein the first, second, and third power sources are plasma welding power sources. 根據申請專利範圍第28或29項所述之電漿熔接裝置,其中,前述嵌入式晶片之前述前頭電極配置空間或前述後尾端電極配置空間係TIG熔接電極貫通之孔穴,第1電源或第3電源係TIG熔接電源,其他之電源係電漿熔接電源。 The plasma welding apparatus according to claim 28, wherein the front electrode arrangement space or the rear end electrode arrangement space of the embedded wafer is a hole through which the TIG welding electrode penetrates, the first power source or the third power source The power supply is a TIG fusion power supply, and the other power supply is a plasma fusion power supply. 根據申請專利範圍第28或29項所述之電漿熔接裝置,其中,前述嵌入式晶片之前述前頭電極配置空間及前述後尾端電極配置空間係TIG熔接電極貫通之孔穴,第1電源及第3電源係 TIG熔接電源,第2電源係電漿熔接電源。 The plasma welding apparatus according to claim 28, wherein the front electrode arrangement space and the rear end electrode arrangement space of the embedded wafer are holes through which the TIG welding electrode penetrates, the first power source and the third Power system The TIG is fused to the power source, and the second power source is a plasma splicing power source. 根據申請專利範圍第28或29項所述之電漿熔接裝置,其中,前述嵌入式晶片之前述前頭電極配置空間連通有電漿電弧噴嘴,前述中間電極配置空間及前述後尾端電極配置空間係TIG熔接電極貫通之孔穴,第1電源係電漿熔接電源,第2及第3電源係TIG熔接電源。 The plasma welding apparatus according to claim 28, wherein the front electrode arrangement space of the embedded wafer is connected to a plasma arc nozzle, and the intermediate electrode arrangement space and the rear end electrode arrangement space TIG The hole through which the electrode is welded is welded, the first power source is a plasma welding power source, and the second and third power sources are TIG welding power sources.
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Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI554351B (en) * 2011-12-15 2016-10-21 日鐵住金溶接工業股份有限公司 Welding by the use of two electrodes plasma torch
JP6344203B2 (en) * 2014-11-05 2018-06-20 株式会社デンソー Arc welding equipment
JP6811844B2 (en) * 2017-04-04 2021-01-13 株式会社Fuji Plasma generator
CN107363425B (en) * 2017-08-22 2019-07-19 天津大学 A kind of free arc plasma arc welding system of compound compression-
JP2022538202A (en) * 2020-05-22 2022-09-01 フン リ,チャン Surface treatment system and method for cylindrical and annular objects to be treated using atmospheric pressure plasma generator

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2756311A (en) * 1954-03-24 1956-07-24 Union Carbide & Carbon Corp High-speed tandem arc working
US3519780A (en) * 1967-05-12 1970-07-07 Arkady Grigorievich Potapievsk Method of arc welding and building up of parts
US3549857A (en) * 1967-04-05 1970-12-22 British Welding Research Ass Welding processes and apparatus
GB1338866A (en) * 1971-04-01 1973-11-28 Philips Electronic Associated Method of and device for plasma-mig-welding
JPS52138038A (en) * 1976-03-31 1977-11-17 Philips Nv Plasma mig welder
JPH0810957A (en) * 1994-06-27 1996-01-16 Tokyo Gas Co Ltd Torch for plasma key hole welding equipment
TWM308372U (en) * 2006-09-14 2007-03-21 Pu Li Shi Technology Co Ltd Plasma torch device capable of generating air with high activity

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4625616Y1 (en) * 1967-06-07 1971-09-03
NL7603318A (en) * 1976-03-31 1977-10-04 Philips Nv EQUIPMENT AND WELDING TORCH FOR PLASMA-MIG WELDING.
CN1012044B (en) * 1988-05-12 1991-03-20 国家机械工业委员会哈尔滨焊接研究所 Single-power plasma welding method with molten electrode protected by gas
US5144110A (en) * 1988-11-04 1992-09-01 Marantz Daniel Richard Plasma spray gun and method of use
JPH0625616B2 (en) * 1989-02-17 1994-04-06 松下電器産業株式会社 Heating container for microwave oven
US5008511C1 (en) * 1990-06-26 2001-03-20 Univ British Columbia Plasma torch with axial reactant feed
JP2515423Y2 (en) * 1991-10-18 1996-10-30 新日本製鐵株式会社 Welding torch
JPH08267250A (en) * 1995-03-30 1996-10-15 Tadahiro Omi Tig welding method and torch device for tig welding
US6130399A (en) * 1998-07-20 2000-10-10 Hypertherm, Inc. Electrode for a plasma arc torch having an improved insert configuration
JP3714517B2 (en) 1999-05-21 2005-11-09 株式会社小松製作所 Plasma torch, plasma torch electrode and method for manufacturing the same
US8101882B2 (en) * 2005-09-07 2012-01-24 Hypertherm, Inc. Plasma torch electrode with improved insert configurations
DE102006044906A1 (en) * 2006-09-22 2008-04-17 Thermico Gmbh & Co. Kg Plasma burner used in the production of coatings on surfaces comprises a secondary gas stream partially flowing around a material feed to focus the material injection into the center of the plasma produced

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2756311A (en) * 1954-03-24 1956-07-24 Union Carbide & Carbon Corp High-speed tandem arc working
US3549857A (en) * 1967-04-05 1970-12-22 British Welding Research Ass Welding processes and apparatus
US3519780A (en) * 1967-05-12 1970-07-07 Arkady Grigorievich Potapievsk Method of arc welding and building up of parts
GB1338866A (en) * 1971-04-01 1973-11-28 Philips Electronic Associated Method of and device for plasma-mig-welding
JPS52138038A (en) * 1976-03-31 1977-11-17 Philips Nv Plasma mig welder
JPH0810957A (en) * 1994-06-27 1996-01-16 Tokyo Gas Co Ltd Torch for plasma key hole welding equipment
TWM308372U (en) * 2006-09-14 2007-03-21 Pu Li Shi Technology Co Ltd Plasma torch device capable of generating air with high activity

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