TWI372425B - - Google Patents

Info

Publication number
TWI372425B
TWI372425B TW093113761A TW93113761A TWI372425B TW I372425 B TWI372425 B TW I372425B TW 093113761 A TW093113761 A TW 093113761A TW 93113761 A TW93113761 A TW 93113761A TW I372425 B TWI372425 B TW I372425B
Authority
TW
Taiwan
Application number
TW093113761A
Other versions
TW200428516A (en
Inventor
Akira Koshiishi
Masatoshi Kitano
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of TW200428516A publication Critical patent/TW200428516A/zh
Application granted granted Critical
Publication of TWI372425B publication Critical patent/TWI372425B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/3065—Plasma etching; Reactive-ion etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H01J37/32174—Circuits specially adapted for controlling the RF discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082—Radio frequency generated discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32917—Plasma diagnostics
    • H01J37/32935—Monitoring and controlling tubes by information coming from the object and/or discharge
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00—Generating plasma; Handling plasma
    • H05H1/24—Generating plasma
    • H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/905—Cleaning of reaction chamber

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electromagnetism (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Plasma Technology (AREA)
  • Drying Of Semiconductors (AREA)
  • ing And Chemical Polishing (AREA)
TW093113761A 2003-05-16 2004-05-14 Plasma processing apparatus and its control method TW200428516A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003138274A JP4846190B2 (ja) 2003-05-16 2003-05-16 プラズマ処理装置およびその制御方法

Publications (2)

Publication Number Publication Date
TW200428516A TW200428516A (en) 2004-12-16
TWI372425B true TWI372425B (zh) 2012-09-11

Family

ID=33410798

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093113761A TW200428516A (en) 2003-05-16 2004-05-14 Plasma processing apparatus and its control method

Country Status (5)

Country Link
US (2) US20040226815A1 (zh)
JP (1) JP4846190B2 (zh)
KR (1) KR100613195B1 (zh)
CN (1) CN1306567C (zh)
TW (1) TW200428516A (zh)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7250373B2 (en) * 2004-08-27 2007-07-31 Applied Materials, Inc. Method and apparatus for etching material layers with high uniformity of a lateral etch rate across a substrate
JP4502198B2 (ja) * 2004-10-21 2010-07-14 ルネサスエレクトロニクス株式会社 エッチング装置およびエッチング方法
US20070211402A1 (en) * 2006-03-08 2007-09-13 Tokyo Electron Limited Substrate processing apparatus, substrate attracting method, and storage medium
JP5426811B2 (ja) * 2006-11-22 2014-02-26 パール工業株式会社 高周波電源装置
US20080178803A1 (en) * 2007-01-30 2008-07-31 Collins Kenneth S Plasma reactor with ion distribution uniformity controller employing plural vhf sources
US8206691B2 (en) * 2009-11-04 2012-06-26 Conopco, Inc. Sunscreen composition with fatty acid alkanolamides
JP5485950B2 (ja) * 2011-07-25 2014-05-07 東京エレクトロン株式会社 プラズマ処理装置の制御方法
CN104409309B (zh) * 2014-12-01 2016-09-21 逢甲大学 大面积等离子体处理装置与均匀等离子体生成方法
US9577516B1 (en) * 2016-02-18 2017-02-21 Advanced Energy Industries, Inc. Apparatus for controlled overshoot in a RF generator
CN108093551B (zh) * 2017-12-20 2020-03-13 西安交通大学 用于激励产生均匀放电高活性等离子体的复合电源装置
CN109814006B (zh) * 2018-12-20 2020-08-21 北京北方华创微电子装备有限公司 一种蚀刻系统放电异常检测方法和装置
KR20200087694A (ko) * 2019-01-11 2020-07-21 도쿄엘렉트론가부시키가이샤 처리 방법 및 플라즈마 처리 장치
CN114459670B (zh) * 2022-04-12 2022-06-17 季华实验室 一种电容薄膜真空计

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60213026A (ja) * 1984-04-09 1985-10-25 Kokusai Electric Co Ltd ドライエツチング装置
KR0164618B1 (ko) * 1992-02-13 1999-02-01 이노우에 쥰이치 플라즈마 처리방법
JPH0758028A (ja) 1993-08-16 1995-03-03 Sumitomo Metal Ind Ltd Ｅｃｒ−ｃｖｄ装置の試料台
US5865896A (en) * 1993-08-27 1999-02-02 Applied Materials, Inc. High density plasma CVD reactor with combined inductive and capacitive coupling
US5507874A (en) * 1994-06-03 1996-04-16 Applied Materials, Inc. Method of cleaning of an electrostatic chuck in plasma reactors
US5534751A (en) * 1995-07-10 1996-07-09 Lam Research Corporation Plasma etching apparatus utilizing plasma confinement
JPH09167755A (ja) * 1995-12-15 1997-06-24 Nec Corp プラズマ酸化膜処理装置
US5746928A (en) * 1996-06-03 1998-05-05 Taiwan Semiconductor Manufacturing Company Ltd Process for cleaning an electrostatic chuck of a plasma etching apparatus
JPH1022280A (ja) * 1996-07-08 1998-01-23 Hitachi Ltd プラズマｃｖｄ装置およびそのクリーニング方法
US6010967A (en) * 1998-05-22 2000-01-04 Micron Technology, Inc. Plasma etching methods
JP2000195846A (ja) * 1998-12-25 2000-07-14 Fujitsu Ltd ドライエッチング方法およびドライエッチング装置
JP2001127055A (ja) * 1999-10-26 2001-05-11 Hitachi Kokusai Electric Inc プラズマ処理装置
JP2001230239A (ja) * 2000-02-15 2001-08-24 Tokyo Electron Ltd 処理装置及び処理方法
US6478924B1 (en) * 2000-03-07 2002-11-12 Applied Materials, Inc. Plasma chamber support having dual electrodes
JP2002043235A (ja) * 2000-07-28 2002-02-08 Tohoku Techno Arch Co Ltd プラズマ処理装置
JP2002299316A (ja) * 2001-03-29 2002-10-11 Toshiba Corp プラズマ処理方法
JP2003007674A (ja) * 2001-06-19 2003-01-10 Matsushita Electric Ind Co Ltd 半導体装置の製造方法

Also Published As

Publication number Publication date
JP2004342869A (ja) 2004-12-02
US20080135519A1 (en) 2008-06-12
TW200428516A (en) 2004-12-16
US8048327B2 (en) 2011-11-01
KR20040099148A (ko) 2004-11-26
KR100613195B1 (ko) 2006-08-18
CN1551305A (zh) 2004-12-01
CN1306567C (zh) 2007-03-21
US20040226815A1 (en) 2004-11-18
JP4846190B2 (ja) 2011-12-28

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