TWI346972B - System and method for controlling composition for lithography process in real time using near infrared spectrometer - Google Patents
System and method for controlling composition for lithography process in real time using near infrared spectrometerInfo
- Publication number
- TWI346972B TWI346972B TW094107330A TW94107330A TWI346972B TW I346972 B TWI346972 B TW I346972B TW 094107330 A TW094107330 A TW 094107330A TW 94107330 A TW94107330 A TW 94107330A TW I346972 B TWI346972 B TW I346972B
- Authority
- TW
- Taiwan
- Prior art keywords
- real time
- near infrared
- lithography process
- infrared spectrometer
- controlling composition
- Prior art date
Links
- 238000000034 method Methods 0.000 title 2
- 238000001459 lithography Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
-
- G—PHYSICS
- G04—HOROLOGY
- G04B—MECHANICALLY-DRIVEN CLOCKS OR WATCHES; MECHANICAL PARTS OF CLOCKS OR WATCHES IN GENERAL; TIME PIECES USING THE POSITION OF THE SUN, MOON OR STARS
- G04B47/00—Time-pieces combined with other articles which do not interfere with the running or the time-keeping of the time-piece
- G04B47/06—Time-pieces combined with other articles which do not interfere with the running or the time-keeping of the time-piece with attached measuring instruments, e.g. pedometer, barometer, thermometer or compass
- G04B47/063—Time-pieces combined with other articles which do not interfere with the running or the time-keeping of the time-piece with attached measuring instruments, e.g. pedometer, barometer, thermometer or compass measuring physiological quantities, e.g. pedometers, heart-rate sensors, blood pressure gauges and the like
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C22/00—Measuring distance traversed on the ground by vehicles, persons, animals or other moving solid bodies, e.g. using odometers, using pedometers
- G01C22/006—Pedometers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
-
- G—PHYSICS
- G04—HOROLOGY
- G04B—MECHANICALLY-DRIVEN CLOCKS OR WATCHES; MECHANICAL PARTS OF CLOCKS OR WATCHES IN GENERAL; TIME PIECES USING THE POSITION OF THE SUN, MOON OR STARS
- G04B19/00—Indicating the time by visual means
- G04B19/06—Dials
- G04B19/18—Graduations on the crystal or glass, on the bezel, or on the rim
-
- G—PHYSICS
- G04—HOROLOGY
- G04B—MECHANICALLY-DRIVEN CLOCKS OR WATCHES; MECHANICAL PARTS OF CLOCKS OR WATCHES IN GENERAL; TIME PIECES USING THE POSITION OF THE SUN, MOON OR STARS
- G04B37/00—Cases
- G04B37/0008—Cases for pocket watches and wrist watches
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
- H01L21/67086—Apparatus for fluid treatment for etching for wet etching with the semiconductor substrates being dipped in baths or vessels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/10—Devices for withdrawing samples in the liquid or fluent state
- G01N1/20—Devices for withdrawing samples in the liquid or fluent state for flowing or falling materials
- G01N1/2035—Devices for withdrawing samples in the liquid or fluent state for flowing or falling materials by deviating part of a fluid stream, e.g. by drawing-off or tapping
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/05—Flow-through cuvettes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/12—Condition responsive control
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Computer Hardware Design (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Biochemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Biophysics (AREA)
- Cardiology (AREA)
- Heart & Thoracic Surgery (AREA)
- Physiology (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Weting (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20040016638A KR100909184B1 (ko) | 2004-03-11 | 2004-03-11 | 근적외선 분광기를 이용한 리쏘그래피 공정용 조성물의실시간 제어 시스템 및 제어 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200531152A TW200531152A (en) | 2005-09-16 |
TWI346972B true TWI346972B (en) | 2011-08-11 |
Family
ID=34836818
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094107330A TWI346972B (en) | 2004-03-11 | 2005-03-10 | System and method for controlling composition for lithography process in real time using near infrared spectrometer |
Country Status (7)
Country | Link |
---|---|
US (1) | US7307259B2 (zh) |
EP (1) | EP1577662B1 (zh) |
JP (1) | JP4775937B2 (zh) |
KR (1) | KR100909184B1 (zh) |
CN (1) | CN100510969C (zh) |
DE (1) | DE602005014302D1 (zh) |
TW (1) | TWI346972B (zh) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100428183C (zh) * | 2006-01-17 | 2008-10-22 | 奇奕国际股份有限公司 | 自动化蚀刻控制系统、装置与方法 |
JP4850769B2 (ja) * | 2007-03-30 | 2012-01-11 | 東京エレクトロン株式会社 | レジスト濃度測定方法及びレジスト濃度測定装置 |
CN101896640B (zh) | 2007-12-12 | 2012-02-01 | 朗姆研究公司 | 用于电镀液分析和控制的方法和设备 |
KR101023429B1 (ko) * | 2008-12-23 | 2011-03-25 | 송원산업 주식회사 | 푸리에 변환 근적외선 분광학을 이용한 감광성 수지 공중합체의 조성 분석방법 |
AT13262U1 (de) * | 2012-05-16 | 2013-09-15 | Koerner Chemieanlagen | Analysevorrichtung |
US10018555B2 (en) * | 2014-03-12 | 2018-07-10 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Device and method for measuring concentration of etchant |
CN103868866B (zh) * | 2014-03-12 | 2016-03-23 | 深圳市华星光电技术有限公司 | 蚀刻液浓度测量装置及方法 |
CN109690292A (zh) * | 2016-09-15 | 2019-04-26 | 株式会社堀场Stec | 吸光光度计和使用该吸光光度计的半导体制造装置 |
CN106444304B (zh) * | 2016-11-18 | 2019-08-23 | 昆山国显光电有限公司 | 显影装置以及显影液活性度的补偿方法 |
JP6736087B2 (ja) * | 2017-01-23 | 2020-08-05 | 株式会社平間理化研究所 | 現像液の濃度監視装置、及び現像液管理装置 |
JP7491126B2 (ja) | 2020-07-29 | 2024-05-28 | 東京エレクトロン株式会社 | 基板処理装置、及び基板処理方法。 |
CN115420862B (zh) * | 2022-10-17 | 2023-02-03 | 江苏龙东新材料有限公司 | 一种用于剥离液生产的原料多点取样抽检设备 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4778532A (en) * | 1985-06-24 | 1988-10-18 | Cfm Technologies Limited Partnership | Process and apparatus for treating wafers with process fluids |
DE4216628A1 (de) * | 1992-05-20 | 1993-11-25 | Harald Michael | Entwässerungsanlage |
JPH08278635A (ja) * | 1995-04-07 | 1996-10-22 | Tokyo Ohka Kogyo Co Ltd | 現像液の調整方法及び調整装置 |
JPH11133619A (ja) * | 1997-05-01 | 1999-05-21 | Shipley Co Llc | フォトレジストのリサイクリング方法 |
JP2000147785A (ja) * | 1998-11-12 | 2000-05-26 | Tokyo Ohka Kogyo Co Ltd | 現像装置 |
JP3212958B2 (ja) * | 1998-12-11 | 2001-09-25 | 九州日本電気株式会社 | 薬液濃度制御装置 |
US6203659B1 (en) * | 1999-03-30 | 2001-03-20 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and apparatus for controlling the quality of a photoresist stripper bath |
JP2001217185A (ja) * | 2000-02-04 | 2001-08-10 | Sigma Meltec Ltd | 端面薄膜除去装置 |
KR100390553B1 (ko) * | 2000-12-30 | 2003-07-07 | 주식회사 동진쎄미켐 | 근적외선 분광기를 이용한 금속막 에칭 공정 제어방법 및에쳔트 조성물의 재생방법 |
KR100390567B1 (ko) * | 2000-12-30 | 2003-07-07 | 주식회사 동진쎄미켐 | 근적외선 분광기를 이용한 포토레지스트 박리공정제어방법 및 포토레지스트 박리액 조성물의 재생방법 |
EP1283546A1 (en) * | 2001-08-08 | 2003-02-12 | Infineon Technologies AG | Method for detecting removal of organic material from a semiconductor device in a manufacturing process |
KR100414550B1 (ko) * | 2001-09-20 | 2004-01-13 | 주식회사 아큐텍반도체기술 | 다성분 용액의 농도 분석 시스템 및 방법 |
US7344991B2 (en) * | 2002-12-23 | 2008-03-18 | Tokyo Electron Limited | Method and apparatus for multilayer photoresist dry development |
US7127358B2 (en) * | 2004-03-30 | 2006-10-24 | Tokyo Electron Limited | Method and system for run-to-run control |
-
2004
- 2004-03-11 KR KR20040016638A patent/KR100909184B1/ko active IP Right Grant
-
2005
- 2005-03-10 DE DE200560014302 patent/DE602005014302D1/de active Active
- 2005-03-10 US US11/075,806 patent/US7307259B2/en not_active Expired - Fee Related
- 2005-03-10 TW TW094107330A patent/TWI346972B/zh not_active IP Right Cessation
- 2005-03-10 JP JP2005066538A patent/JP4775937B2/ja not_active Expired - Fee Related
- 2005-03-10 EP EP20050005309 patent/EP1577662B1/en not_active Expired - Fee Related
- 2005-03-11 CN CNB2005100538161A patent/CN100510969C/zh active Active
Also Published As
Publication number | Publication date |
---|---|
KR20050091288A (ko) | 2005-09-15 |
JP2005260238A (ja) | 2005-09-22 |
DE602005014302D1 (de) | 2009-06-18 |
TW200531152A (en) | 2005-09-16 |
CN1667514A (zh) | 2005-09-14 |
US20050202564A1 (en) | 2005-09-15 |
EP1577662A3 (en) | 2006-10-11 |
EP1577662A2 (en) | 2005-09-21 |
US7307259B2 (en) | 2007-12-11 |
KR100909184B1 (ko) | 2009-07-23 |
EP1577662B1 (en) | 2009-05-06 |
JP4775937B2 (ja) | 2011-09-21 |
CN100510969C (zh) | 2009-07-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |