TWI346201B - Method for inspecting a transparent film for foreign material - Google Patents

Method for inspecting a transparent film for foreign material

Info

Publication number
TWI346201B
TWI346201B TW093120966A TW93120966A TWI346201B TW I346201 B TWI346201 B TW I346201B TW 093120966 A TW093120966 A TW 093120966A TW 93120966 A TW93120966 A TW 93120966A TW I346201 B TWI346201 B TW I346201B
Authority
TW
Taiwan
Prior art keywords
inspecting
transparent film
foreign material
foreign
transparent
Prior art date
Application number
TW093120966A
Other languages
Chinese (zh)
Other versions
TW200506354A (en
Inventor
Atsuhiko Shinozuka
Satoshi Honda
Nobuo Deguchi
Original Assignee
Sumitomo Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co filed Critical Sumitomo Chemical Co
Publication of TW200506354A publication Critical patent/TW200506354A/en
Application granted granted Critical
Publication of TWI346201B publication Critical patent/TWI346201B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
TW093120966A 2003-07-31 2004-07-14 Method for inspecting a transparent film for foreign material TWI346201B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003204497A JP4396160B2 (en) 2003-07-31 2003-07-31 Foreign film inspection method for transparent film

Publications (2)

Publication Number Publication Date
TW200506354A TW200506354A (en) 2005-02-16
TWI346201B true TWI346201B (en) 2011-08-01

Family

ID=34263485

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093120966A TWI346201B (en) 2003-07-31 2004-07-14 Method for inspecting a transparent film for foreign material

Country Status (4)

Country Link
JP (1) JP4396160B2 (en)
KR (1) KR101125997B1 (en)
CN (1) CN100582752C (en)
TW (1) TWI346201B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI593958B (en) * 2012-05-10 2017-08-01 東友精細化工有限公司 Method for discriminating defect of optical film

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JP2006275843A (en) * 2005-03-30 2006-10-12 Nitto Denko Corp Method of inspecting contamination in insulating film for wiring circuit board
KR100688094B1 (en) 2006-05-04 2007-03-02 삼성전기주식회사 Exposure method and apparatus
JP4960161B2 (en) 2006-10-11 2012-06-27 日東電工株式会社 Inspection data processing apparatus and inspection data processing method
JP5024935B2 (en) * 2007-01-16 2012-09-12 富士フイルム株式会社 Device and method for detecting defect of light transmitting member
JP5167731B2 (en) * 2007-09-06 2013-03-21 大日本印刷株式会社 Inspection apparatus and method
KR101428816B1 (en) 2007-09-28 2014-08-12 엘지전자 주식회사 Method for reselecting a cell and detecting whether a terminal is stationay in mobile telecommunications system
WO2009114433A2 (en) * 2008-03-08 2009-09-17 Redwood Scientific, Inc. Device and method for quantifying a surface's cleanliness
JP5258349B2 (en) * 2008-03-28 2013-08-07 富士フイルム株式会社 Defect detection apparatus and method
JP5446232B2 (en) * 2008-04-10 2014-03-19 凸版印刷株式会社 Defect inspection apparatus and defect inspection method for color filter substrate
CN101672803B (en) * 2008-09-08 2011-12-07 中国建筑材料科学研究总院 Method and device for detecting impurities and defects of tempered glass curtain wall
CN101968453B (en) * 2009-12-01 2012-05-09 北京理工大学 Polarization detection method and device for white and colorless foreign matters in cotton
JP5274622B2 (en) * 2011-06-27 2013-08-28 富士フイルム株式会社 Defect inspection apparatus and method
KR101349662B1 (en) * 2013-05-16 2014-01-13 동우 화인켐 주식회사 Method for discriminating defect of optical films
JP6156820B2 (en) * 2013-08-22 2017-07-05 住友化学株式会社 Defect inspection apparatus, optical member manufacturing system, and optical display device production system
JP6220653B2 (en) * 2013-11-28 2017-10-25 シャープ株式会社 Optical position detection device and electronic apparatus using the same
KR101697071B1 (en) * 2014-04-18 2017-01-17 동우 화인켐 주식회사 Method for discriminating defect of polarizing plate
KR101581385B1 (en) * 2014-05-21 2015-12-31 주식회사 넥스트아이 Instant boiledrice container examination method
CN104390976A (en) * 2014-11-12 2015-03-04 河北铠朗新型材料科技有限公司 Online film coating monitoring system
WO2016194874A1 (en) * 2015-06-05 2016-12-08 住友化学株式会社 Inspection method for defects in light transmissive film, manufacturing method for linear polarizer film, and manufcturing method for polarizing plate
CN107024482B (en) * 2015-12-15 2020-11-20 住友化学株式会社 Defect imaging device and method, film manufacturing device and method, and defect inspection method
CN105699395A (en) * 2016-02-04 2016-06-22 成都泓睿科技有限责任公司 Method for detecting liquid surface foreign matter of transparent glass bottles
CN109781743A (en) * 2017-11-14 2019-05-21 鹤立精工股份有限公司 Optical detecting method
CN108254426A (en) * 2017-12-15 2018-07-06 新乡医学院 It is prepared for dopamine concentration detection miniature electrochemical in animal brain
CN109187577A (en) * 2018-08-29 2019-01-11 深圳市盛波光电科技有限公司 A kind of polaroid recessiveness defect light detection means and method

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4440485B2 (en) * 2000-03-08 2010-03-24 富士フイルム株式会社 Film defect inspection apparatus, defect inspection system, defect inspection method, and method for manufacturing film having birefringence characteristics

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI593958B (en) * 2012-05-10 2017-08-01 東友精細化工有限公司 Method for discriminating defect of optical film

Also Published As

Publication number Publication date
JP4396160B2 (en) 2010-01-13
CN100582752C (en) 2010-01-20
KR20050014684A (en) 2005-02-07
CN1580749A (en) 2005-02-16
TW200506354A (en) 2005-02-16
KR101125997B1 (en) 2012-03-19
JP2005049158A (en) 2005-02-24

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees