TWI346033B - High temperature robot end effector - Google Patents

High temperature robot end effector

Info

Publication number
TWI346033B
TWI346033B TW097101249A TW97101249A TWI346033B TW I346033 B TWI346033 B TW I346033B TW 097101249 A TW097101249 A TW 097101249A TW 97101249 A TW97101249 A TW 97101249A TW I346033 B TWI346033 B TW I346033B
Authority
TW
Taiwan
Prior art keywords
high temperature
end effector
robot end
temperature robot
effector
Prior art date
Application number
TW097101249A
Other languages
English (en)
Other versions
TW200911483A (en
Inventor
Eric Ng
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of TW200911483A publication Critical patent/TW200911483A/zh
Application granted granted Critical
Publication of TWI346033B publication Critical patent/TWI346033B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67742—Mechanical parts of transfer devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J11/00—Manipulators not otherwise provided for
    • B25J11/0095—Manipulators transporting wafers
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J15/00—Gripping heads and other end effectors
    • B25J15/0019—End effectors other than grippers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00—Material or article handling
    • Y10S414/135—Associated with semiconductor wafer handling
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00—Material or article handling
    • Y10S414/135—Associated with semiconductor wafer handling
    • Y10S414/141—Associated with semiconductor wafer handling includes means for gripping wafer

Landscapes

  • Engineering & Computer Science (AREA)
  • Robotics (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Manipulator (AREA)
TW097101249A 2007-01-11 2008-01-11 High temperature robot end effector TWI346033B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US88454207P 2007-01-11 2007-01-11

Publications (2)

Publication Number Publication Date
TW200911483A TW200911483A (en) 2009-03-16
TWI346033B true TWI346033B (en) 2011-08-01

Family

ID=39361369

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097101249A TWI346033B (en) 2007-01-11 2008-01-11 High temperature robot end effector

Country Status (7)

Country Link
US (1) US7717481B2 (zh)
EP (1) EP1944799A2 (zh)
JP (1) JP5675032B2 (zh)
KR (1) KR100973610B1 (zh)
CN (1) CN101226893B (zh)
SG (1) SG144821A1 (zh)
TW (1) TWI346033B (zh)

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KR100989721B1 (ko) * 2007-03-09 2010-10-26 어플라이드 머티어리얼스, 인코포레이티드 기판 이송용 고온 처짐 방지 엔드 이펙터
JP5456287B2 (ja) * 2008-09-05 2014-03-26 東京エレクトロン株式会社 縦型熱処理装置
KR101660241B1 (ko) * 2009-01-11 2016-09-27 어플라이드 머티어리얼스, 인코포레이티드 기판을 이동시키기 위한 시스템, 장치 및 방법
CN102152318B (zh) * 2011-05-04 2012-07-11 中国科学院等离子体物理研究所 在高温真空环境下使用的机器人的驱动机构
WO2013090898A1 (en) * 2011-12-16 2013-06-20 Brooks Automation, Inc. Transport apparatus
KR20160002345A (ko) * 2014-06-30 2016-01-07 에이에스엠 아이피 홀딩 비.브이. 기판 이송 아암 및 이를 포함하는 기판 이송 장치
US10124492B2 (en) * 2015-10-22 2018-11-13 Lam Research Corporation Automated replacement of consumable parts using end effectors interfacing with plasma processing system
US10062599B2 (en) 2015-10-22 2018-08-28 Lam Research Corporation Automated replacement of consumable parts using interfacing chambers
US20170115657A1 (en) 2015-10-22 2017-04-27 Lam Research Corporation Systems for Removing and Replacing Consumable Parts from a Semiconductor Process Module in Situ
KR101810172B1 (ko) * 2015-12-09 2017-12-20 국제엘렉트릭코리아 주식회사 보우트 및 그 보우트를 포함하는 퍼니스형 기판 처리 장치 그리고 클러스터 설비
US10090188B2 (en) * 2016-05-05 2018-10-02 Applied Materials, Inc. Robot subassemblies, end effector assemblies, and methods with reduced cracking
CN107527848B (zh) * 2016-06-20 2020-12-18 上海新昇半导体科技有限公司 一种机械手臂及基板的抓取方法

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US6214119B1 (en) * 1986-04-18 2001-04-10 Applied Materials, Inc. Vacuum substrate processing system having multiple processing chambers and a central load/unload chamber
JP2508540B2 (ja) 1987-11-02 1996-06-19 三菱マテリアル株式会社 ウェ―ハの位置検出装置
JPH04199730A (ja) * 1990-11-29 1992-07-20 Toshiba Corp 搬送装置
JPH0485727U (zh) * 1990-11-30 1992-07-24
JPH04113445U (ja) * 1991-03-20 1992-10-05 株式会社日立製作所 ウエハ移載装置のウエハ吸着板固定装置
JPH0531238U (ja) * 1991-09-30 1993-04-23 京セラ株式会社 ウエーハの移送具
JPH05291375A (ja) * 1992-04-08 1993-11-05 Hitachi Ltd ウエハ搬送アーム
DE69329269T2 (de) * 1992-11-12 2000-12-28 Applied Materials Inc System und Verfahren für automatische Positionierung eines Substrats in einem Prozessraum
JPH0722489A (ja) * 1993-06-29 1995-01-24 Toshiba Corp ウェハーフォーク
JP3395799B2 (ja) * 1993-12-24 2003-04-14 東京エレクトロン株式会社 基板搬送装置および熱処理装置
US6312534B1 (en) * 1994-04-01 2001-11-06 Brush Wellman, Inc. High strength cast aluminum-beryllium alloys containing magnesium
JPH09139412A (ja) * 1995-11-13 1997-05-27 Kokusai Electric Co Ltd ウェーハ搬送プレートの固定装置
US6267423B1 (en) * 1995-12-08 2001-07-31 Applied Materials, Inc. End effector for semiconductor wafer transfer device and method of moving a wafer with an end effector
US5980194A (en) 1996-07-15 1999-11-09 Applied Materials, Inc. Wafer position error detection and correction system
JP3154946B2 (ja) 1996-11-11 2001-04-09 ファナック株式会社 工作機械の熱変位補正方法
US5955858A (en) * 1997-02-14 1999-09-21 Applied Materials, Inc. Mechanically clamping robot wrist
JPH10247680A (ja) * 1997-03-04 1998-09-14 Tokyo Electron Ltd 高温炉への搬送用フォークおよび熱処理装置
US6719516B2 (en) 1998-09-28 2004-04-13 Applied Materials, Inc. Single wafer load lock with internal wafer transport
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US6183026B1 (en) 1999-04-07 2001-02-06 Gasonics International Corporation End effector
US6260894B1 (en) * 1999-05-28 2001-07-17 Applied Materials, Inc. Assembly for wafer handling system
TW543079B (en) 1999-06-03 2003-07-21 Applied Materials Inc Robot blade for semiconductor processing equipment
US6244641B1 (en) * 1999-12-02 2001-06-12 M.E.C. Technology, Inc. Wafer transfer arm
JP2001237295A (ja) 2000-02-24 2001-08-31 Canon Inc 基板搬送用フィンガ
US6413356B1 (en) 2000-05-02 2002-07-02 Applied Materials, Inc. Substrate loader for a semiconductor processing system
US6631935B1 (en) * 2000-08-04 2003-10-14 Tru-Si Technologies, Inc. Detection and handling of semiconductor wafer and wafer-like objects
US6648730B1 (en) 2000-10-30 2003-11-18 Applied Materials, Inc. Calibration tool
JP2002184853A (ja) * 2000-12-15 2002-06-28 Yaskawa Electric Corp ウェハー把持装置
US6556887B2 (en) 2001-07-12 2003-04-29 Applied Materials, Inc. Method for determining a position of a robot
US20030012631A1 (en) * 2001-07-12 2003-01-16 Pencis Christopher H. High temperature substrate transfer robot
KR20050078026A (ko) * 2004-01-30 2005-08-04 삼성전자주식회사 웨이퍼 이송을 위한 로봇 블레이드
US20060113806A1 (en) * 2004-11-29 2006-06-01 Asm Japan K.K. Wafer transfer mechanism
US7290813B2 (en) * 2004-12-16 2007-11-06 Asyst Technologies, Inc. Active edge grip rest pad
CN1824592B (zh) * 2005-02-25 2012-02-29 细美事有限公司 晶片传送装置

Also Published As

Publication number Publication date
KR20080066588A (ko) 2008-07-16
US7717481B2 (en) 2010-05-18
KR100973610B1 (ko) 2010-08-02
CN101226893B (zh) 2010-06-09
US20080170929A1 (en) 2008-07-17
JP2008172241A (ja) 2008-07-24
CN101226893A (zh) 2008-07-23
SG144821A1 (en) 2008-08-28
TW200911483A (en) 2009-03-16
JP5675032B2 (ja) 2015-02-25
EP1944799A2 (en) 2008-07-16

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