TWI340250B - Test apparatus and test method - Google Patents

Test apparatus and test method

Info

Publication number
TWI340250B
TWI340250B TW093127622A TW93127622A TWI340250B TW I340250 B TWI340250 B TW I340250B TW 093127622 A TW093127622 A TW 093127622A TW 93127622 A TW93127622 A TW 93127622A TW I340250 B TWI340250 B TW I340250B
Authority
TW
Taiwan
Prior art keywords
test
test method
test apparatus
Prior art date
Application number
TW093127622A
Other languages
English (en)
Other versions
TW200510745A (en
Inventor
Hironori Kanbayashi
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200510745A publication Critical patent/TW200510745A/zh
Application granted granted Critical
Publication of TWI340250B publication Critical patent/TWI340250B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31716—Testing of input or output with loop-back
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
TW093127622A 2003-09-12 2004-09-13 Test apparatus and test method TWI340250B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003322091A JP4354235B2 (ja) 2003-09-12 2003-09-12 試験装置及び調整方法

Publications (2)

Publication Number Publication Date
TW200510745A TW200510745A (en) 2005-03-16
TWI340250B true TWI340250B (en) 2011-04-11

Family

ID=34308659

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093127622A TWI340250B (en) 2003-09-12 2004-09-13 Test apparatus and test method

Country Status (7)

Country Link
US (1) US7263643B2 (zh)
EP (1) EP1666901A4 (zh)
JP (1) JP4354235B2 (zh)
KR (1) KR20060129165A (zh)
CN (1) CN100458458C (zh)
TW (1) TWI340250B (zh)
WO (1) WO2005026756A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI779714B (zh) * 2021-07-12 2022-10-01 瑞昱半導體股份有限公司 延遲電路測試方法以及測試電路

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080104448A1 (en) * 2006-10-30 2008-05-01 Kenji Tamura Testing apparatus for semiconductor device
US7734976B2 (en) * 2006-11-30 2010-06-08 Electro Scientific Industries, Inc. Synchronizing control of test instruments
US7876118B2 (en) 2009-02-05 2011-01-25 Advantest Corporation Test equipment
JP5633132B2 (ja) * 2009-09-30 2014-12-03 日本電気株式会社 データ伝送システム及び方法、データ送信装置及び受信装置
CN102323543B (zh) * 2011-06-13 2013-10-23 重庆斯凯力科技有限公司 基于虚拟仪器测试温控开关的方法
JP2014109531A (ja) * 2012-12-04 2014-06-12 Toshiba Corp 半導体検査装置および半導体検査方法
CN103728150B (zh) * 2014-01-17 2016-08-17 徐州徐工施维英机械有限公司 一种混凝土搅拌站的故障检测系统和方法
CN104750151B (zh) * 2015-01-29 2017-02-01 重庆川仪自动化股份有限公司 基于pci总线的矩阵电路在温压补偿系统中的控制方法
CN114764118A (zh) * 2021-01-14 2022-07-19 深圳比特微电子科技有限公司 测试电路、测试方法和包括测试电路的计算系统

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2510973B2 (ja) 1985-02-01 1996-06-26 株式会社日立製作所 半導体試験装置
US4928278A (en) * 1987-08-10 1990-05-22 Nippon Telegraph And Telephone Corporation IC test system
JP3799067B2 (ja) * 1992-06-05 2006-07-19 株式会社日立製作所 Ｉｃ試験装置
JP3475686B2 (ja) * 1997-01-10 2003-12-08 株式会社日立製作所 Ｉｃ試験装置及び信号生成装置
JP3616247B2 (ja) * 1998-04-03 2005-02-02 株式会社アドバンテスト Ｉｃ試験装置におけるスキュー調整方法及びこれに用いる疑似デバイス
JP2002074988A (ja) * 2000-08-28 2002-03-15 Mitsubishi Electric Corp 半導体装置および半導体装置のテスト方法
JP4651804B2 (ja) * 2000-11-02 2011-03-16 株式会社アドバンテスト 半導体試験装置
US6570397B2 (en) * 2001-08-07 2003-05-27 Agilent Technologies, Inc. Timing calibration and timing calibration verification of electronic circuit testers
EP1666898B1 (en) * 2003-09-03 2007-11-21 Advantest Corporation Testing apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI779714B (zh) * 2021-07-12 2022-10-01 瑞昱半導體股份有限公司 延遲電路測試方法以及測試電路

Also Published As

Publication number Publication date
EP1666901A4 (en) 2009-08-26
EP1666901A1 (en) 2006-06-07
CN1849518A (zh) 2006-10-18
JP2005091037A (ja) 2005-04-07
KR20060129165A (ko) 2006-12-15
TW200510745A (en) 2005-03-16
US7263643B2 (en) 2007-08-28
US20050138504A1 (en) 2005-06-23
JP4354235B2 (ja) 2009-10-28
CN100458458C (zh) 2009-02-04
WO2005026756A1 (ja) 2005-03-24

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees