TWI332080B - - Google Patents
Download PDFInfo
- Publication number
- TWI332080B TWI332080B TW092134221A TW92134221A TWI332080B TW I332080 B TWI332080 B TW I332080B TW 092134221 A TW092134221 A TW 092134221A TW 92134221 A TW92134221 A TW 92134221A TW I332080 B TWI332080 B TW I332080B
- Authority
- TW
- Taiwan
- Prior art keywords
- protective film
- defect
- polarizing plate
- film
- adhered
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Polarising Elements (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002364771A JP2004198163A (ja) | 2002-12-17 | 2002-12-17 | 保護フィルム粘着偏光板の欠陥検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200415348A TW200415348A (en) | 2004-08-16 |
TWI332080B true TWI332080B (ja) | 2010-10-21 |
Family
ID=32762497
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW092134221A TW200415348A (en) | 2002-12-17 | 2003-12-04 | Defect inspecting method of protection film adhered polarizing plate |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2004198163A (ja) |
KR (1) | KR20040055593A (ja) |
CN (1) | CN100473976C (ja) |
TW (1) | TW200415348A (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI418779B (zh) * | 2011-06-27 | 2013-12-11 | Fujifilm Corp | 缺陷檢查裝置及方法 |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI245892B (en) * | 2004-03-26 | 2005-12-21 | Optimax Tech Corp | Device for checking optical film |
KR100788733B1 (ko) * | 2005-12-05 | 2007-12-26 | 에버테크노 주식회사 | 편광필름 검사장치 및 방법 |
KR100788734B1 (ko) * | 2005-12-05 | 2008-01-02 | 에버테크노 주식회사 | 편광필름 검사장치 및 방법 |
JP4960026B2 (ja) * | 2006-06-09 | 2012-06-27 | 富士フイルム株式会社 | フイルムの欠陥検査装置及びフイルムの製造方法 |
JP4960161B2 (ja) * | 2006-10-11 | 2012-06-27 | 日東電工株式会社 | 検査データ処理装置及び検査データ処理方法 |
JP4785944B2 (ja) | 2008-04-16 | 2011-10-05 | 日東電工株式会社 | 光学表示装置の製造方法 |
KR101188756B1 (ko) * | 2008-09-18 | 2012-10-10 | 주식회사 엘지화학 | 편광판 얼룩 자동 검사 시스템 및 이를 이용한 편광판 얼룩검사 방법 |
JP5422620B2 (ja) * | 2011-08-31 | 2014-02-19 | 富士フイルム株式会社 | パターン化位相差フィルムの欠陥検出装置及び方法、並びに製造方法 |
JP5399453B2 (ja) * | 2011-08-31 | 2014-01-29 | 富士フイルム株式会社 | パターン化位相差フィルムの欠陥検査装置及び方法並びに製造方法 |
KR20140088789A (ko) * | 2013-01-03 | 2014-07-11 | 동우 화인켐 주식회사 | 광학 필름 검사 장치 |
KR101396456B1 (ko) * | 2014-01-13 | 2014-05-22 | 세광테크 주식회사 | Ito필름의 전도성 패턴 검사장치 및 그 검사방법 |
KR101697071B1 (ko) * | 2014-04-18 | 2017-01-17 | 동우 화인켐 주식회사 | 광학 필름의 결함 판별 방법 |
JP2015225041A (ja) * | 2014-05-29 | 2015-12-14 | 住友化学株式会社 | 積層偏光フィルムの欠陥検査方法 |
KR101702841B1 (ko) * | 2014-09-01 | 2017-02-06 | 동우 화인켐 주식회사 | 편광 필름의 결함 모니터링 방법 |
WO2016035864A1 (ja) * | 2014-09-03 | 2016-03-10 | 日本化薬株式会社 | 偏光素子および該偏光素子を有する偏光板、並びに該偏光素子又は該偏光板を有する液晶表示装置 |
KR101998081B1 (ko) * | 2015-06-11 | 2019-07-09 | 동우 화인켐 주식회사 | 복합 필름의 결함 판별 방법 |
CN106353332B (zh) * | 2015-07-15 | 2019-05-28 | 明眼有限公司 | 利用图案透光板的偏光膜检查装置 |
KR102007959B1 (ko) * | 2015-09-08 | 2019-08-06 | 주식회사 엘지화학 | 투영 분석법을 통한 편광판 결함의 분석 방법 |
JP6784540B2 (ja) * | 2015-09-30 | 2020-11-11 | 日東電工株式会社 | 偏光板の検査方法および検査装置 |
JP6807637B2 (ja) * | 2015-09-30 | 2021-01-06 | 日東電工株式会社 | 偏光子の検査方法および偏光板の製造方法 |
KR20190030168A (ko) * | 2017-09-13 | 2019-03-21 | 스미또모 가가꾸 가부시키가이샤 | 결함 검사 장치, 결함 검사 방법, 원 편광판 또는 타원 편광판의 제조 방법 및 위상차판의 제조 방법 |
CN109827759B (zh) * | 2019-03-28 | 2020-11-24 | 歌尔光学科技有限公司 | 应用于光学模组的缺陷检测方法及检测装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001349839A (ja) * | 2000-06-07 | 2001-12-21 | Sumitomo Chem Co Ltd | 偏光フィルムの欠陥検査方法 |
JP3881506B2 (ja) * | 2000-11-24 | 2007-02-14 | 住友化学株式会社 | ロール起因欠陥の判定方法および装置 |
-
2002
- 2002-12-17 JP JP2002364771A patent/JP2004198163A/ja active Pending
-
2003
- 2003-12-04 TW TW092134221A patent/TW200415348A/zh not_active IP Right Cessation
- 2003-12-12 KR KR1020030090788A patent/KR20040055593A/ko not_active IP Right Cessation
- 2003-12-15 CN CNB2003101206037A patent/CN100473976C/zh not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI418779B (zh) * | 2011-06-27 | 2013-12-11 | Fujifilm Corp | 缺陷檢查裝置及方法 |
Also Published As
Publication number | Publication date |
---|---|
TW200415348A (en) | 2004-08-16 |
KR20040055593A (ko) | 2004-06-26 |
CN1508536A (zh) | 2004-06-30 |
CN100473976C (zh) | 2009-04-01 |
JP2004198163A (ja) | 2004-07-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI332080B (ja) | ||
JP4396160B2 (ja) | 透明性フィルムの異物検査方法 | |
TWI422815B (zh) | 檢查資料處理裝置及檢查資料處理方法 | |
KR102522383B1 (ko) | 광학 표시 패널의 제조 방법 및 광학 표시 패널의 제조 시스템 | |
JP6749321B2 (ja) | 光透過性フィルムの欠陥検査方法、直線偏光子フィルムの製造方法及び偏光板の製造方法 | |
US8398806B2 (en) | Method for manufacturing joined sheet material, joined sheet material and method for manufacturing optical display unit | |
TW201113599A (en) | Information storage/readout device for use in continuously manufacturing system for liquid-crystal display elements, and method and system for producing the same | |
JP2011085631A (ja) | 液晶表示素子を連続製造する装置において用いられる情報格納読出演算システム及び情報格納読出演算システムの製造方法 | |
JP2011226957A (ja) | 偏光板の欠陥検査方法及び欠陥検査装置 | |
JP2015017981A (ja) | 偏光板の検査方法 | |
US20100215884A1 (en) | Method for manufacturing connected sheet material, connected sheet material and method for manufacturing optical display unit | |
JP2006337630A (ja) | 積層光学フィルムの製造方法 | |
KR20160044802A (ko) | 시트상 제품 검사 시스템, 시트상 제품 검사 방법 및 그러한 검사에서 사용하기 위한 편광판 | |
TW201132959A (en) | An inspection method for defect in a liquid crystal panel laminated with polarizing plates | |
KR20120129020A (ko) | 필름 결함 모니터링 장치 및 방법 | |
TWI467524B (zh) | A manufacturing method of an optical display device, and a reel material for manufacturing an optical display device | |
JP2001116925A (ja) | 光学シートの検査方法 | |
JP2009186497A (ja) | 液晶表示パネルの製造装置および液晶表示パネルの製造方法 | |
JP2000206333A (ja) | 偏光板および楕円偏光板 | |
JP2005134573A (ja) | 検査方法および検査装置 | |
JP5569791B2 (ja) | 光学フィルム作製用原反フィルム、および光学フィルムの製造方法 | |
EP3786621B1 (en) | Foreign material inspection system of display unit | |
KR100971081B1 (ko) | 편광필름의 검사방법 | |
CN110018582B (zh) | 光学显示面板连续检查方法和装置、连续制造方法和系统 | |
JP4595564B2 (ja) | 透明性フィルムの異物検査用試料の作製方法および異物検査方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |