TWI332080B - - Google Patents

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Publication number
TWI332080B
TWI332080B TW092134221A TW92134221A TWI332080B TW I332080 B TWI332080 B TW I332080B TW 092134221 A TW092134221 A TW 092134221A TW 92134221 A TW92134221 A TW 92134221A TW I332080 B TWI332080 B TW I332080B
Authority
TW
Taiwan
Prior art keywords
protective film
defect
polarizing plate
film
adhered
Prior art date
Application number
TW092134221A
Other languages
English (en)
Chinese (zh)
Other versions
TW200415348A (en
Inventor
Takashi Suzuki
Atsuhiko Shinozuka
Original Assignee
Sumitomo Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co filed Critical Sumitomo Chemical Co
Publication of TW200415348A publication Critical patent/TW200415348A/zh
Application granted granted Critical
Publication of TWI332080B publication Critical patent/TWI332080B/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Polarising Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
TW092134221A 2002-12-17 2003-12-04 Defect inspecting method of protection film adhered polarizing plate TW200415348A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002364771A JP2004198163A (ja) 2002-12-17 2002-12-17 保護フィルム粘着偏光板の欠陥検査方法

Publications (2)

Publication Number Publication Date
TW200415348A TW200415348A (en) 2004-08-16
TWI332080B true TWI332080B (ja) 2010-10-21

Family

ID=32762497

Family Applications (1)

Application Number Title Priority Date Filing Date
TW092134221A TW200415348A (en) 2002-12-17 2003-12-04 Defect inspecting method of protection film adhered polarizing plate

Country Status (4)

Country Link
JP (1) JP2004198163A (ja)
KR (1) KR20040055593A (ja)
CN (1) CN100473976C (ja)
TW (1) TW200415348A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI418779B (zh) * 2011-06-27 2013-12-11 Fujifilm Corp 缺陷檢查裝置及方法

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI245892B (en) * 2004-03-26 2005-12-21 Optimax Tech Corp Device for checking optical film
KR100788733B1 (ko) * 2005-12-05 2007-12-26 에버테크노 주식회사 편광필름 검사장치 및 방법
KR100788734B1 (ko) * 2005-12-05 2008-01-02 에버테크노 주식회사 편광필름 검사장치 및 방법
JP4960026B2 (ja) * 2006-06-09 2012-06-27 富士フイルム株式会社 フイルムの欠陥検査装置及びフイルムの製造方法
JP4960161B2 (ja) * 2006-10-11 2012-06-27 日東電工株式会社 検査データ処理装置及び検査データ処理方法
JP4785944B2 (ja) 2008-04-16 2011-10-05 日東電工株式会社 光学表示装置の製造方法
KR101188756B1 (ko) * 2008-09-18 2012-10-10 주식회사 엘지화학 편광판 얼룩 자동 검사 시스템 및 이를 이용한 편광판 얼룩검사 방법
JP5422620B2 (ja) * 2011-08-31 2014-02-19 富士フイルム株式会社 パターン化位相差フィルムの欠陥検出装置及び方法、並びに製造方法
JP5399453B2 (ja) * 2011-08-31 2014-01-29 富士フイルム株式会社 パターン化位相差フィルムの欠陥検査装置及び方法並びに製造方法
KR20140088789A (ko) * 2013-01-03 2014-07-11 동우 화인켐 주식회사 광학 필름 검사 장치
KR101396456B1 (ko) * 2014-01-13 2014-05-22 세광테크 주식회사 Ito필름의 전도성 패턴 검사장치 및 그 검사방법
KR101697071B1 (ko) * 2014-04-18 2017-01-17 동우 화인켐 주식회사 광학 필름의 결함 판별 방법
JP2015225041A (ja) * 2014-05-29 2015-12-14 住友化学株式会社 積層偏光フィルムの欠陥検査方法
KR101702841B1 (ko) * 2014-09-01 2017-02-06 동우 화인켐 주식회사 편광 필름의 결함 모니터링 방법
WO2016035864A1 (ja) * 2014-09-03 2016-03-10 日本化薬株式会社 偏光素子および該偏光素子を有する偏光板、並びに該偏光素子又は該偏光板を有する液晶表示装置
KR101998081B1 (ko) * 2015-06-11 2019-07-09 동우 화인켐 주식회사 복합 필름의 결함 판별 방법
CN106353332B (zh) * 2015-07-15 2019-05-28 明眼有限公司 利用图案透光板的偏光膜检查装置
KR102007959B1 (ko) * 2015-09-08 2019-08-06 주식회사 엘지화학 투영 분석법을 통한 편광판 결함의 분석 방법
JP6784540B2 (ja) * 2015-09-30 2020-11-11 日東電工株式会社 偏光板の検査方法および検査装置
JP6807637B2 (ja) * 2015-09-30 2021-01-06 日東電工株式会社 偏光子の検査方法および偏光板の製造方法
KR20190030168A (ko) * 2017-09-13 2019-03-21 스미또모 가가꾸 가부시키가이샤 결함 검사 장치, 결함 검사 방법, 원 편광판 또는 타원 편광판의 제조 방법 및 위상차판의 제조 방법
CN109827759B (zh) * 2019-03-28 2020-11-24 歌尔光学科技有限公司 应用于光学模组的缺陷检测方法及检测装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001349839A (ja) * 2000-06-07 2001-12-21 Sumitomo Chem Co Ltd 偏光フィルムの欠陥検査方法
JP3881506B2 (ja) * 2000-11-24 2007-02-14 住友化学株式会社 ロール起因欠陥の判定方法および装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI418779B (zh) * 2011-06-27 2013-12-11 Fujifilm Corp 缺陷檢查裝置及方法

Also Published As

Publication number Publication date
TW200415348A (en) 2004-08-16
KR20040055593A (ko) 2004-06-26
CN1508536A (zh) 2004-06-30
CN100473976C (zh) 2009-04-01
JP2004198163A (ja) 2004-07-15

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