TWI326770B - - Google Patents

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Publication number
TWI326770B
TWI326770B TW96117863A TW96117863A TWI326770B TW I326770 B TWI326770 B TW I326770B TW 96117863 A TW96117863 A TW 96117863A TW 96117863 A TW96117863 A TW 96117863A TW I326770 B TWI326770 B TW I326770B
Authority
TW
Taiwan
Prior art keywords
film
probe card
unit
circuit board
printed circuit
Prior art date
Application number
TW96117863A
Other languages
English (en)
Chinese (zh)
Other versions
TW200846669A (en
Inventor
Hsiu Chu Chou
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW96117863A priority Critical patent/TW200846669A/zh
Publication of TW200846669A publication Critical patent/TW200846669A/zh
Application granted granted Critical
Publication of TWI326770B publication Critical patent/TWI326770B/zh

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
TW96117863A 2007-05-18 2007-05-18 Structure and the assembly method of thin film probe card TW200846669A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW96117863A TW200846669A (en) 2007-05-18 2007-05-18 Structure and the assembly method of thin film probe card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW96117863A TW200846669A (en) 2007-05-18 2007-05-18 Structure and the assembly method of thin film probe card

Publications (2)

Publication Number Publication Date
TW200846669A TW200846669A (en) 2008-12-01
TWI326770B true TWI326770B (ja) 2010-07-01

Family

ID=44823272

Family Applications (1)

Application Number Title Priority Date Filing Date
TW96117863A TW200846669A (en) 2007-05-18 2007-05-18 Structure and the assembly method of thin film probe card

Country Status (1)

Country Link
TW (1) TW200846669A (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114200279B (zh) * 2021-11-29 2023-03-14 强一半导体（苏州）有限公司 一种薄膜探针卡及其探针头
CN114200278B (zh) * 2021-11-29 2022-12-27 强一半导体（苏州）有限公司 一种薄膜探针卡及其探针头

Also Published As

Publication number Publication date
TW200846669A (en) 2008-12-01

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