TWI323822B - Active device array sbustrate, liquid crystal display panel and examining methods thereof - Google Patents

Description

1323822 98-11-12 IX. Description of the Invention: [Technical Fields of the Invention] The present invention relates to a method for detecting a social component, a substrate, and a display, and particularly relates to the fact that it is difficult to have an internal substrate or a liquid. _ face ^ [prior art]

_Because the demand for f is not increasing, so the industry is fully committed to the development of the device. Among them, cathode ray tubes (cathode * CRT) have dominated the display market for many years because of their excellent display quality and technical maturity. However, due to the recent rise of the green ring, the energy consumption is large and the radiation is large, and the singular space is limited, so it cannot meet the market trend of riding light, thin, and low power consumption. Therefore, a thin film transistor having superior characteristics such as high image quality, good space utilization efficiency, low power consumption, and no radiation

Thin film transistor liquid crystal display (TFT-LCD) has gradually become the mainstream of the market. The TFT-LCD module is mainly composed of a liquid crystal display panel and a backlight module. The liquid crystal display panel is generally composed of a thin film transistor array substrate, a color filter substrate, and a liquid crystal layer disposed between the two substrates, and the backlight module The surface light source required for the liquid crystal display panel is provided to enable the liquid crystal 7 98-11-12 display module to achieve the display effect. The thin film transistor array substrate can be divided into a display area (display regi〇n) and a peripheral circuit region, wherein a plurality of pixel units arranged in an array are arranged on the Gugan area, and each of the pixel units ^ A thin film transistor and a pixd electrode connected to the thin film transistor. In addition, a plurality of scan lines and data lines are arranged in the peripheral line area and the display area, wherein the thin film transistors of each of the pixel units are controlled by corresponding scan lines and data lines. After the completion of the process of the thin film transistor array substrate, the halogen element on the thin film array substrate is usually electrically detected to determine whether the halogen element can be operated. When the halogen unit is not working properly, it can repair defective components (such as thin film transistors or halogen electrodes) or circuits. However, in order to manufacture the halogen element, in the thin film transistor, the detection line must be fabricated on the peripheral line area of the column substrate. It is worth noting that these test lines are not only ^ but also make the panel available. For the wiring (_ut) area outside the 'laser cutting' after the test is completed ==; road break a) 'to avoid the impact』 Handling the display panel usually because of external factors, such as artificial i A central clothing, etc., and static electricity accumulation in the panel. If Christine, ^§, the charge accumulates to a certain amount, it may be because the circuit or the thin film transistor on the V-induced thin film transistor array substrate is protected by the 1323822 98-11-12 discharge. Electric rose (electrostatic must be in the f ^ to the upper check · from the electrostatic protection function, then the peripheral line measurement line and electrostatic discharge protection circuit of the Hao thick film transistor array substrate. So:: Yisong Road decoration The bureau is more complicated, and may also produce cloth: = edge: This is relatively unfavorable for the simplification of the process and the improvement of production efficiency = the question of the foot's [invention] The base = the line = the purpose is to provide - active castanets 'The detection line 2: 匕. The purpose of the 耠 耠 种 种 种 种 种 种 种 种 种 种 种 液晶 液晶 液晶 = = = = = = = = = = = = = = = = = = 检测 检测 检测 检测 检测 检测 检测 检测 检测 检测 检测OBJECTIVE AND OTHER OBJECTS The present invention provides an active component strip: j-substrate, a plurality of halogen elements, a plurality of scanning lines, a plurality of beryllium lines, a bead material test line, an internal antistatic ring, and a first: An active component, a plurality of third active components, and a plurality of fourth full components. The substrate has adjacent-display areas and a peripheral line area. I Γ ΓΓ ΓΓ in the display (4). The scan lines and the (four) lines are disposed on the substrate, and the control is Element unit. (4) The line is deployed in the peripheral line 9 98-11-12 Antistatic ring is arranged in the peripheral circuit area, and includes a first line segment, and is electrically connected between the first line segment and the second line segment. 2: active component, second The active component, each of the third active component pole r-fourth active component has a gate, a source, and a idle pole of the 汲 动 动 以及 element and a source connected to the first line segment. 1 is connected again. The gate and the source of the second active component are connected to the second; and the pole is connected to the connecting line segment. The third active component is disposed in the gate and the source of the third active component in the m and The corresponding pole is connected to the odd-numbered scanning lines, and the gate and the source of the active component of the second body are connected to the second line segment, and the corresponding pole is connected to the even-numbered scanning lines. Line r is connected, its two == connected. /, corresponding bungee and even data line test line = invention - embodiment, wherein the internal antistatic ring is located in the data according to the tree [example, its towel per 昼The material element includes the active component and a halogen electrode. 筮石士红_ 弟五与资料线(4) ♦ The wiring line of the electric lining is in accordance with the present invention - the actual '^ and ^; active; ^ pieces are electrically connected. Detecting the 周边 'distributed on the substrate on the periphery: zone: two:: Hungarian 苐 - line segment and The ends of the second line segment are respectively connected to (4) = 10 1323822 98-11-12, and one end of each data test line is respectively connected to one of the detection pads. According to the invention - the embodiment, the wire element_substrate further comprises a plurality of shared wires and a detecting trace connecting the ends of the common wires, wherein the common wires are disposed on the substrate and extend from the display region to the peripheral circuit region, and the detecting traces are disposed in the peripheral circuit region on the substrate. In an embodiment of the invention, the data test line is a dummy data line, and the data test line is located on both sides of the data line. According to an embodiment of the invention, the data test line is another • electrostatic ring. The invention further provides a liquid crystal display panel comprising the above active element array substrate, a color filter substrate and a liquid crystal layer. The liquid helium layer is disposed between the color light-emitting substrate and the active device array substrate. The invention further proposes a method for detecting an active device array substrate, which is suitable for the above-mentioned active device array substrate, and the method for detecting the active device array substrate comprises the following steps. Input the first line segment of the scan-to-internal anti-static % to open the first active component and the fourth active component, and the reckless-scan signal is input to the odd-numbered selection line via the partial third active component Inside. A second scan signal is input to the second line segment of the internal antistatic ring to close the second wire element and a portion of the third active element connected to the even impurity scan line. The first scan signal is a high gate voltage signal (v^), and the second scan signal is a low gate voltage signal (Vgl). One of the first information is sent to the breeding test line, and the first data signal is input to the corresponding data line via part of the fourth active. Measure the voltage of another data test line. 11 1323822 98-11-12 The present invention proposes a method for detecting an active device array substrate. The above-described active device array substrate, the wire element_substrate, includes the following steps. Input the first - scan signal to the first line of internal antistatic production. Wheel a second scan signal to the internal antistatic ring, the line segment. Measure the voltage of the data test line. , One

In accordance with the invention, the first scan signal is a high idle voltage signal and the second scan signal is a low gate voltage signal. Alternatively, both the first scan signal and the second scan signal are high gate voltage signals. The invention proposes a method for detecting an active device array substrate,

In the above-mentioned line element array listening board, the wire element_substrate side includes the following steps. Input the first - scan signal to the first line of the internal antistatic ring. Input a second scan signal to the line segment of the internal antistatic ring. Measure the voltage of the detection trace.

According to an embodiment of the invention, wherein the first scan signal is a high idle voltage signal and the second scan signal is a low gate voltage signal. Alternatively, both the first scan signal and the second scan signal are high gate voltage signals. T

The present invention proposes a method for detecting an active device array substrate, which is applicable to the above-mentioned wire element_substrate's detector, and includes the following steps. Input the first-scanning signal to the first line of the internal anti-static ring. Input a second scan signal to the internal line segment. Wherein, the first scan signal and the second scan signal and the gate voltage signal. One of the input-first-data signals to the data test line i, and the first data signal is routed to the corresponding data line via some of the fourth active components. Measure the voltage of the detection trace. 12 1323822 98-1M2 The present invention provides a method for detecting a liquid crystal display panel, which is suitable for the above liquid crystal display panel, and the detection method comprises the following steps. A light source is provided and the liquid crystal display panel is placed above the light source. A first scan signal is input to the first line segment of the internal antistatic ring. A second scan signal is input to the second line segment of the inner antistatic ring. Enter a first data signal to one of the data test lines. Enter a second data signal to another data test line.

According to an embodiment of the present invention, the first scan signal, the second scan signal, the first data signal, and the second data signal are input to one of the first line segment, the second line segment, and the data test line, and another data test line After that, the liquid crystal display panel has a black face, a white face or a gray picture. According to an embodiment of the invention, the first scan signal, the second scan signal, the first data signal, and the second data signal are input to the first line segment, the first line segment, and the poor material test line—and another data After the test line, the liquid crystal display panel has a straight line or a horizontal strip of bright lines.

After the test line is tested, the liquid is input to the first scan signal, the second scan signal, the first data signal, the second dragon signal to the first line segment, the first line #, and the data test line according to the present invention. One and another asset will not be written on the panel in the future. In summary, the present invention integrates the internal antistatic ring, the first active element and the first active element as detection lines. Therefore, the wiring is relatively simple. There are few car owners and a large layout space. In addition, Shi's, with the fourth active component can read crystal ^ ^: dynamic components line effect. Therefore, it is not necessary to perform the laser two screens and will not be detected. The cutting process will cut off the detection line. 13 1323822 98-11-12 ^No, add the laser cutting machine. Furthermore, the present invention uses a single detection line to measure a countable or even number of scan lines so that the input parity signals do not affect each other. The above and other objects, features, and advantages of the present invention will become more apparent from the aspects of the invention. [Embodiment] FIG. 1 is a diagram showing an active device array substrate according to a preferred embodiment of the present invention. Please refer to FIG. 2, the active device array substrate just includes a package substrate 11G, a plurality of pixel units 12G, a plurality of scanning lines 130, a plurality of lines, a material line 140, a data test line 15A, an internal antistatic ring, A first active 70 member 172, a second active component 174, a plurality of third active 180 components, and a plurality of fourth active components 190. The substrate 110 is, for example, a glass substrate, a quartz substrate or a substrate of other field materials, and the substrate 11G has adjacent display regions 112 and = peripheral line regions 114. The pixel unit 12() is disposed in the display area ι2, and the heart scan line 130 is, for example, a wire formed by an ageing gold wire or other suitable conductor material, and the data line 14 is, for example, a chrome metal wire, an alloy wire or other suitable conductor. The wire formed by the material. Scanning line 13 〇 资料 The data line M0 is disposed on the substrate 11 , to control the 昼 单元 unit. For example, it is a chrome metal wire, a 1-lu alloy wire or other wires formed of a body material, and the data test line i5G is disposed in the peripheral line region 114. The internal antistatic ring (10) is such as a light alloy bimetal conductor or other suitable wire. The inner anti-static ring 160 is disposed in the peripheral line region 114 and includes a first line segment 162, a second line segment 64, and electrically connected to the first line segment 162 and the second line segment. One of the lines 164 connects the line segment 166. The first active element 172, the second active element 174, the third active element 1 0, and the fourth active element 19 are, for example, a thin film transistor, a low temperature p〇ly silic thin film (low temperature p〇ly silic thin film) Tmnsifor, ltps-tft) or other switching elements with three terminals. The first active component 172, the second active component 174, the third active component 180, and the fourth active component 190 are all disposed on the substrate 11A. The first active element 172 has a gate n2g, a source 172s and a drain 174d. The second active component 174 has a gate mg, a source 17 and a drain 174d. Each of the third active elements 18A has a gate 180g source 180s and a gate 180d. Each of the fourth active devices 190 has a gate i9〇g, a source 19〇s, and a drain 19〇d. The gate 113b and the source 172s of the first active device 172 are connected to the first line segment 162, and the drain n2d is connected to the connection line segment 166. The gate 174g of the second active element 174 and the source 174s are connected to the second line segment 164 and the pole 174d is connected to the connecting line segment 166. In other words, the connecting line segment 166 is electrically connected to the first line segment 162 and the second line segment 164 by the first active element 172 and the second active element 174. The third active component 180 is disposed in the peripheral line region 1丨4, wherein the gate electrode I80g of the third active component 180 is connected to the first line segment 162 and the corresponding drain electrode 18〇d is Please connect odd-numbered scan lines. The other part of the third active element 18〇's gate 180g is connected to the source 18〇s 15 98-U-12 98-U-12 to the even number of second line segments 164' and (4) is connected to the secret 180d line 130 . The fourth active element 19 is disposed in the peripheral line region 114@, and the closed pole 190g is connected to the connecting line segment 166, and a part of the source wood 19 0 S / knife is connected to one of the data test lines i 5 . The ί ^ job is reduced by 10 years of age (10), and its scale source 〇s Sot test line 150 is connected to another one and the corresponding drain 9 〇d is connected to the even data line 140. It is to be noted that in the present embodiment, the active device array substrate ι further includes a plurality of detecting electrodes 162a, 164a, 150a disposed in the peripheral circuit region 114 on the substrate 11A. The first line segment 162 of the inner antistatic ring 160 and the ends of the second line segment 164 are respectively connected to the detecting pads 162a, 164a, and one end of each data testing line 150 is connected to one of the detecting pads 15A, respectively. These test pads 162a, 164a, 15A & can be probed by the probe of the test machine to input or read voltage signals. The test pads 62a, 164a, 15 can be disposed at appropriate positions on the substrate 110 to match the probes of the inspection machine. Further, the data test line 150 is a dummy data line, and the data test line 150 is located on both sides of the data line 140, and the internal antistatic ring 16 is located on the outer side of the data test line 150. It should be noted, however, that in other embodiments, the data test line 150 can be another internal antistatic ring 160 and the inner antistatic ring 160 is not limited to the outside of the data test line 150. The active device array substrate 100 of the present embodiment also includes a plurality of common wirings Cs and a detection trace 1 connecting one ends of the common wirings Cs, and the 丄jzjozz 98-11-12 = is disposed on the substrate by the wiring Cs, and The display area ιΐ2 extends Γ Γ ' = the detection line L is arranged on the peripheral line of the substrate ug. I say that the wiring Cs and the detection trace L are not = red members'. Therefore, other solid-wire components (four) substrates are not shared. Wiring Cs and detection trace l. / f shows a partial enlarged view of the area S1G in Fig. 1. Referring to FIG. 2, in the main f-element array substrate _, the pixel unit m includes a fifth main

m and - halogen electrode 124. The fifth active component 122 is, for example, a '', a thick boat transistor, a low temperature polycrystalline dream film transistor or the like having a three-terminal switching element' and is electrically coupled to the corresponding scan line 13G and the data line (10). The pixel electrode 124 is connected to the third wire element m, and the halogen electrode 124 is, for example, a transparent electrode (transp dec dectrode), a reflective electrode _ective electrode, or a transflective electrode (10) two ^ctr: de) . The material of the above-mentioned halogen electrode 124 may be indium tin oxide, indium oxide (ITO), metal or i-conductive material. /'τι

In the active array array substrate 100, the internal antistatic ring 160 and the ith active component 180 can be used to prevent electrostatic damage. The data test line "the four masters, the component 190 also has the same function. For example, when When the static electricity is transmitted to the first line segment 162, the plurality of third active 2 pieces 180 connected to the first line segment 162 must be turned on first, and the static electricity can be transmitted to the scan line 13A. However, only when the third active element 180 is gated When the voltage of the pole 18〇g reaches a certain gate=pressure, the source 18〇s and the drain pole will be turned on, so part of the static electricity will accumulate in the gate 18Qd of the third active component 18〇, and the remaining part 17 1323822 严1曰69=Broom line 130. Since the first line of the internal antistatic ring 160 and the second third active element 180 and the Sweep line 130 are electrically connected, a plurality of conduction paths are formed to form a shunt. After being guided to the 'one moving element 180 and diverting through a plurality of paths, the internal transmission: the static amplitude is lowered. In other words, the damage of the line of the part. Therefore, the == two = static electricity causes the member 174 and the internal antistatic ring 16 〇 可 ^ 执 弟 一 一 一 一

Electrostatic discharge protection circuit of board 1〇〇. In addition: the component array base: the active component m can also be called electrostatic discharge: the component 172 is similar to the above, so no ===== 172, the second active component 174 and the =# active component electrostatic discharge protection circuit, Can be used as: ; = = road main electrostatic ring · the first - with = and the younger active member 174 as the detection line,

= protection line integration, so the wiring is larger than _, detection = quantity ^ planning (1_). The data test line 150 and the fourth main element 190 can also function as an ESD protection line or as a == (four) line. The active device array·- line segment will be described in detail below to turn on the first—:;;== 18 1323822 98-11-12 190, and the first scan signal is input to the odd-numbered scan lines 130 via the partial third active element 18〇. . Then, a second scan signal is input to the second line segment 164 of the internal anti-static ring 160 to turn off the second active device 174 and a portion of the third active device 18A connected to the even-numbered scan lines 130. It should be noted that the first scan signal is a high gate voltage (Vgh) and the second scan signal is a low gate voltage (Vgl). Then, a first data signal is input to one of the data test lines 150, and the first data signal is input to the corresponding data line 130 via the partial fourth active device 190. Then, the voltage of the other data test line 150 is measured. If another voltage test signal is measured while measuring another data test line, a short circuit occurs between the odd data line 14〇 and the even data line 140. The second detection method of the active device array substrate 100 includes the following steps. First, a first scan signal is input to the first line segment 162 of the internal antistatic ring 16A. Next, a second scan signal is input to the second line segment 164 of the internal antistatic ring 160. Then, measure the voltage of the data test line 15〇. When the first scan signal is a high gate voltage signal and the second scan signal is a low gate voltage signal, the first active device 172 and the fourth active device 190 will be turned on, and the third portion is partially The active component 18〇 will also be turned on. In the present embodiment, these turned-on third active elements 18 are connected to an odd number of scanning lines 130. If the measurement data test line is 15 ,, one of the data test lines 150 can be measured to have a voltage signal similar to the first scan signal, which means an odd number of data lines 140 or an even number of data lines wo and an odd number of sweeps. A short circuit occurs between the aiming lines 130. 19 1323822 98-11-12 Traces ^ The measurement under the above conditions is normal, and the first scan signal can be changed to the high gate voltage signal. At this time, the voltage is 15G, and there is no thank-you. The scan signal is =1. The odd data line 140 or the even data line 2: The short circuit between the even lines 13G. It is worth mentioning that if you change the first scan signal to the low gate directly = «change to the high idle voltage signal, you can measure whether there is a transfer number similar to the first sweep (four).

The second 140 or a short circuit between the even data line 140 and the even number of scanning field green 130.

The third detection method of the active device array substrate includes the following steps. ^ First 'input-first-scanning signal to the inner antistatic ring 16〇's first line 162', then a second scanning signal is input to the second line 164 of the internal antistatic ring =0. Then, the voltage of the detection trace L is measured. If the first scanning task is a high voltage signal and the second scanning signal is a low voltage signal, the first active component 172 and the fourth active component 19 will be turned on, and part of the third active component 18 〇 will also be turned on. In the present embodiment, these turned-on third active elements 18 are connected to an odd number of sweep lines 130. If the detection trace L is measured, it can be measured that the detection trace 1 has a voltage signal similar to the first scan signal, which means that a short circuit occurs between the shared wiring Cs and the odd-numbered scan lines 130. According to the above, if the measurement result under the above conditions is normal, the first scan signal and the second scan signal can be changed to the high gate voltage signal. At this time, the measurement of the 4 pairs of test traces L is similar to the electric signal of the second scan signal, and then it can be judged whether a short circuit occurs between the common wiring Cs and the even scan lines 13A by 20 1323822 98-11-12. Similarly, if the scan is changed to a low-secret voltage signal and the second scan signal is changed to a high-gate voltage signal, the detection of the trace L can be similar to the voltage signal of the first scan signal. It is possible to determine whether or not a short circuit occurs between the common wiring Cs and the even scanning line 130.

The fourth detection method of the active element array substrate includes the following steps. First, the 'input-first-scan signal is applied to the internal antistatic ring 16'. Then 'input-second scan signal to internal anti-static

The second line segment 164 of (10). The input-data-to-data test line 150 has a -' and the first data signal is input to the corresponding data line 14G via a portion of the fourth active component. Then, measure the voltage of the detection trace l. And at least one of the above-mentioned first scanning signal and the second scanning signal is a two-gate voltage signal. In this way, the fourth active component carrying will be turned on. If the detection trace L is measured, the voltage signal of the detection trace L having a similar = first-data signal can be measured, which means that the shared wiring Cs occurs between the odd-numbered lean line 140 or the even-numbered data line 14〇. Short circuit. According to the detection method of the active device array substrate 1 可, it can be known that the present invention uses an internal antistatic ring, the first active device and the second active device 2 to detect odd-numbered or even-numbered single-detection lines. , and the round-trip parity signal does not affect each other. (4) The antistatic ring (10) can not only prevent the damage, but also can be used as the d line of the array test of the wire element array substrate (10), and the detection method of the wire element _ remainder (10), + = fast connection detection of the line of the active device array substrate 1 〇〇 . Therefore, it is possible to reduce the time of the test and increase the production capacity of the test process. 21 1323822 98-11-12 The active device array substrate 100 can be used to assemble a liquid crystal display panel. 3 is a top plan view of a liquid crystal display panel assembled using the active device array substrate of FIG. 1. Referring to FIG. 3, the liquid crystal display panel 3 includes an active device array substrate 1A, a liquid crystal layer (not shown), and a color filter substrate 200. The color filter substrate 200 is disposed above the active device array substrate 100, and the liquid crystal layer is disposed between the active device array substrate and the color filter substrate 200. Since the liquid crystal display panel 30 includes the active element array substrate 1A, the detection line on the active device array substrate 1 can be used as a detection line for panel testing. Hereinafter, a method of detecting the liquid crystal display panel 300 will be described in detail with reference to Figs. 1 and 3. The detection method of the liquid crystal display panel 300 includes the following steps. First, a light source is provided and the liquid crystal display panel 300 is placed above the light source. The light source is, for example, a backlight module. Next, a first scan signal is input to the first line segment 162 of the internal antistatic ring 160. Then, a second scan signal is input to the second line segment 162 of the internal antistatic ring 160. Input a first data signal to one of the data test lines 150. Then, a second data signal is input; to another data test line 150. After inputting the first scan signal, the second scan signal, the first data signal, and the second data signal to the first line segment, the second line segment, one of the data test lines, and another data test line, the liquid crystal display panel 300 A variety of different display surfaces can be presented, such as black, white or gray. The black screen can be used to check whether there is a bright point or a bright line on the liquid crystal display panel 300; the white surface can be used to check whether there is a dark point or a dark line on the liquid crystal display panel 300. 98-11-12 is generated; the gray screen is usually used to check whether the display surface of the liquid crystal display panel 300 has a display unevenness (mura). In addition to the display surface described above, the liquid crystal display panel 3 can also be in the form of a straight strip or a strip of bright lines. Under such a display surface, it is easier to check whether the data line 140 or the scan line 130 is broken or short-circuited. In addition, the liquid crystal display panel 3 further presents a picture of a bright dot array, and it is easier to check for bright spots, micro bright spots or flash points (flashp〇int) under this screen.

The spear J can quickly detect the age picture of the liquid crystal display panel 300 by using the above-described detection method of the liquid crystal display panel 3 to reduce the throughput of the detection time detection process. In view of the above, the active device array substrate, the liquid helium plate and the detection methods of the two have at least the following advantages: - The invention has the following advantages: the anti-static ring and the first wire component The larger energy sample path makes the detection circuit and the ESD protection circuit move! 因此ίΓ' so the wiring is simpler and the number of detection pads is small.

Second, Benedict will test the line and :, by the third active element and the fourth active element 22, the discharge is not affected by the detection line, and the special element will be affected by the detection. Therefore, the second panel _ indicates that the surface is not cut, and there is no need to add a laser cutting machine. The τ' cutting process will actively use the antistatic ring, the first active component and the second circuit to make the input parity signal: will be 4 mutually == single-pick of the scan line,: I I I see 23 98-11- 12 inspection: square array: f and liquid crystal display panel liquid crystal display panel of the stem 2 active element array substrate circuit and the remaining process capacity. Therefore, the detection time can be reduced and the detection method can be improved. The detection method can be applied to the existing array inspection machine, and the detection device is additionally purchased. W or the port of the invention of the active device array substrate, liquid crystal display and the two methods of production for small-size display products' help small-scale factory switch

Although the present invention has been disclosed in the above preferred embodiments, it is to be understood that those skilled in the art can make some modifications and refinements without departing from the spirit of the invention. * Subject to the scope of the patent application attached below. BRIEF DESCRIPTION OF THE DRAWINGS An active device array substrate according to a preferred embodiment of the present invention is shown in FIG. 2, which is a partial enlarged view of a region S10 in FIG.

FIG. 3 is a plan view showing a liquid crystal display panel assembled by using the active device array substrate of FIG. 1. [Description of main component symbols] 100: Active device array substrate 110 • Substrate 112: Display area 114: Peripheral line area 24 1323822 98-11-12 120: Alizardin unit 122: Fifth active element '124: Alizarin electrode 130: Scanning line 140: data line 150: data test line 160: internal antistatic ring 162: first line segment #162a, 164a, 150a: detection pad 164 second line segment 166 connecting line segment 172 first active element 172d, 174d, 180d 190d: 汲 173⁄4, 174g, 180g, 190g: gate 172s, 174s, 180s, 190s: source 174: second active device 180: third active device 190: fourth active device 200: color filter substrate 300 .LCD display panel

Cs : shared wiring L: detection trace S10 : area 25

Claims (1)

98-11-12 X. Patent application scope: I. An active device array substrate, comprising: a neighboring display area and a peripheral line area; the prime element is configured in the display area; Configuring on the substrate; a plurality of data lines disposed on the substrate, the greedy line controlling the halogen units; and the l private line and the = data test lines are disposed in the peripheral circuit area; Anti-static;:=static: ring two, the inner line area, and the inner line segment, between the two line segments: one continuous: the segment and the electrical connection the first - the two poles and, the connecting line segment is connected; private connection, The city bungee is connected to the (4) and, connected line segments; the secondary slaves are connected, and the bungee and the inner, each of the third and third wire families are as ;=动:'= her side, and the corresponding bungee is virtual; the other part of the first line segment is the third active element d number, the scan line is connected, and the second line is connected And the corresponding ^j miscellaneous and miscellaneous are connected to the line, and the second; and the pole and the even number of scans 26 98-11-12 the fourth active component has two pieces 'configured in the peripheral line area And the source, the source, and the drain of each of the fourth active components, wherein the source is connected to the terminal, and the portions are connected to the money. = Test line where 'connected, the corresponding f and the data test: phase: part of it (four) pole is connected with the even turn data line. Corresponding to the waves The active device array substrate according to the first item, wherein the electrical ring is located on an outer side of the data test lines. Among them, the first class of Yang Yuan (10) of the substrate is connected, and the ^ 胄 and 胄 711 pieces are electrically connected to the third active element. Further, the active device array substrate according to the first aspect of the application, wherein the second component is disposed in a peripheral circuit region on the substrate, and the first line segment of the disk and the end of the second segment One of the connection lines is measured and one end of each data test line is connected to one of the test pads. 5. The active device array substrate according to claim 1, further comprising a plurality of common wires and a detecting trace connecting one ends of the common wires, wherein the common wires are disposed on the substrate, and The display area extends to the peripheral line area, and the detection trace is disposed in a peripheral line area on the substrate. 27 98-11-12 6. The active device array substrate according to item 1 of the patent application, wherein the lines of her are the pseudo-sample lines, and the money is used to manufacture the two sides of the data lines. 7. The active component array substrate as described in item i of the application scope, /, the data test line is another internal antistatic ring. 8. A liquid crystal display panel, comprising: an active device array substrate, comprising: a display area and a peripheral circuit area substrate having a plurality of adjacent pixel units disposed in the touch area; and a plurality of 2 lines, configured in a plurality of data lines disposed on the data lines to control the plurality of data lines, and the scan lines and the second test lines are disposed in the peripheral circuit area of the 5; the internal antistatic ring includes - in the peripheral circuit area, and the 4*^^^. brother-line segment, a second line segment and the electrical 逯 !! the second line segment-connected line segment pole, wherein the gate and the: The gate ... source and - 汲 and pole are connected to the connecting line segment of the first line segment, and the second active element, the pole, wherein the gate has a gate, a source and a pole The connecting line segment phase=source is connected to the second line segment, and the third active third third active component component is disposed in the peripheral circuit region, each having a gate, a source, and a stack Core, its 2S 1323822 98-11-12 the = three active components of the Some of the closed poles are connected to the source lines, and the other part of the third main airfoil of the third UU (four) poles are connected to the second line segment, and the plurality of poles are connected to the even number of scan lines; Heart Lulu is now sturdy, the active component is disposed in the peripheral circuit area, and its = four active components have a gate, a source and a drain, and the charm of the interlocking component is connected with the remote segment. The source lines are respectively associated with the data test lines, and the ones of the data lines are in phase with the odd data lines, and some of the source systems are respectively associated with the data lines of the data test lines. i is connected, corresponding to the non-polar and the even number of data roll color twilight substrate: and the base is: ^ crystal layer 'disposed on the color filter, optical substrate and enchant element array read master ^ such as patent application The liquid crystal display panel of the eighth aspect, the inner antistatic ring of the mid-line array substrate of the first line is located in the liquid crystal display panel of the data item, such as the special item, the dynamic element array substrate Each of the pixel units includes: ', two connected fifth active components And the corresponding scan line and the data line electrical S-electrode electrode are electrically connected to the third active element. The liquid crystal display panel of the eighth aspect of the invention, wherein the active device array substrate further comprises a plurality of detecting pads disposed on the substrate in the peripheral circuit region, and the internal portion The first line segment of the antistatic ring and the end of the first line segment are respectively connected to one of the detecting pads, and one end of each data shunting line is respectively connected to one of the detecting pads. The liquid crystal display panel of claim 8, wherein the active device array substrate further comprises a plurality of shared wires and a detection trace connecting one of the common two wires, wherein the common wires are disposed on The base extends from the display area to the peripheral line area, and the detection trace is disposed in the peripheral line area on the substrate. The liquid crystal display panel of claim 8, wherein the data test lines of the dynamic element array substrate are pseudo data lines, and the data test lines are located on both sides of the data lines. The liquid crystal display panel of claim 8, wherein the data test lines of the X active device array substrate are another internal antistatic ring. The method for detecting the active device array substrate is applicable to the active device array substrate according to the above item 1. The detection method of the active device array substrate includes: input-first-scanning signal to the internal anti-invention The first green of the electrostatic ring is used to open the first wire element and the (four) four active elements, and the scanning signal is rotated by the part of the third wire elements into the plurality of drawing lines; an input-second Scanning the signal to the second anti-static ring of the second block 30 1323822 98-11-12 'to close the second wire element and connect the portion of the even number of scan lines to the second active element, wherein the first The scan signal is a high gate voltage signal (Vgh), and the second scan signal is a low gate voltage signal (乂); a first data signal is input to one of the data test lines, and the first data signal And inputting the fourth active component to the corresponding data lines; and measuring the voltage of the other data test line. The method for detecting an active device array substrate is applicable to the active device array substrate according to claim 1, wherein the detecting method of the accommodating device array substrate comprises: inputting a first scanning signal to the internal antistatic ring The first line segment; 'Enter a first segment• Sweep 5 to the second line of the internal antistatic ring of § hai and measure the voltage of the data test line. 17. A wire component array substrate as described in claim 16 of the patent application =Detector: The first scan signal is the high gate voltage signal (Vgh), and the second scan signal is the low gate voltage signal (ν^). The active device array substrate method of claim 16, wherein the first scan signal and the second scan signal are high gate voltage signals (Vgh). i, ~19. A method for detecting an active device array substrate, which is suitable for applying the active device array substrate according to item 5 of the special 2, the detection method of the singular element array substrate includes: 31 1323822 98-11-12 line segment input A first scan signal to the first segment of the internal antistatic ring is applied to the second line of the internal antistatic ring to detect the voltage of the trace. 20. The method of detecting according to claim 19, wherein the first-sweeping array of substrates (Yoh) » - j-u, Tian.唬 鬲 鬲 电压 电压 电压 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. 21. The ^ gate voltage signal (Vgh). The tiger is asked 22. The detection method of the active device array substrate is the active component array described in item 5: The following: The method for manufacturing the special substrate includes: L plate sealing K cattle array line ^ input person sweeping as signal The first input to the internal antistatic ring is a second. The scan signal to the internal antistatic ring is the south segment. The first scan signal and the second scan call the first gate voltage signal; A data signal to the data test lines, the first tribute signal is passed through a portion of the fourth active data lines; and the box is inserted into a voltage corresponding to the detection trace. 23.-Wei Jing display surface (four) inspection method, _ in the patent application 32 98-11-12 surrounding the liquid crystal display panel of the eighth item, the detection method comprises: providing a light source, and placing the liquid crystal display panel Above the light source; input a first scan signal to the first line segment of the internal antistatic ring; ' input a second scan signal to the second line segment of the internal antistatic ring; input a first data signal to One of the data test lines; and, input a second data signal to another data test line. 24. The method according to claim 23, wherein the scanning signal, the first scanning signal, the first data signal, and the second tributary signal are rounded to the first line segment, the second line segment, After one of the data test lines and another data test line, the liquid crystal display panel has a black face, a white face or a gray face. 25. The method of detecting according to claim 23, wherein the first scan minus, the second scan signal, the first return signal, and the second data signal female-line segment H segment are input, wherein the data test lines are After the - and the other - data test line, the liquid crystal display panel is presented with a straight strip or a strip of bright lines. 26. The method of detecting according to claim 23, wherein the younger sweeper number, the first scan signal, the first data signal, and the second poor signal are input to the first line segment, the second line segment, the After the data test line - and the other - data test line, the liquid crystal display panel presents the face of the bright dot array. 33