TWI385456B - Active device array substrate and display panel - Google Patents
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本發明是有關於一種主動陣列基板及顯示面板,且特別是有關於一種不易因靜電放電而損害的主動元件陣列基板及顯示面板。The present invention relates to an active array substrate and a display panel, and more particularly to an active device array substrate and a display panel that are less susceptible to damage by electrostatic discharge.
一般而言,液晶顯示面板包括主動元件陣列基板、彩色濾光基板以及液晶層,其中主動元件陣列基板是與彩色濾光基板對向組裝,而液晶層是位於主動元件陣列基板及彩色濾光基板之間。在製作液晶顯示面板的過程中,不論是製造設備、操作人員以及主動元件陣列基板本身都可能會累積許多靜電荷。當主動元件陣列基板在製造過程中接觸到製造設備、操作人員或其他物體時,都很有可能引發靜電放電(Electrostatic Discharge,ESD)的現象。Generally, the liquid crystal display panel includes an active device array substrate, a color filter substrate, and a liquid crystal layer, wherein the active device array substrate is assembled opposite to the color filter substrate, and the liquid crystal layer is located on the active device array substrate and the color filter substrate. between. In the process of fabricating the liquid crystal display panel, both the manufacturing equipment, the operator, and the active device array substrate itself may accumulate a lot of static charges. When the active device array substrate is exposed to a manufacturing device, an operator, or other objects during the manufacturing process, it is likely to cause an electrostatic discharge (ESD) phenomenon.
由於主動元件陣列基板上的線路與元件都非常精細,因此只要稍有靜電放電的現象產生,就很容易產生整個液晶顯示面板需報廢的後果。為解決靜電放電現象造成液晶顯示面板損壞的問題,一般會在主動元件陣列基板上設計靜電放電保護線路。但是,靜電放電保護線路往往是針對主動元件陣列基板中顯示區內的元件所設計,因而顯示區外的周邊線路區中若有靜電放電現象發生仍可能造成液晶顯示面板的損壞。Since the lines and components on the active device array substrate are very fine, as long as a slight electrostatic discharge occurs, it is easy to cause the entire liquid crystal display panel to be scrapped. In order to solve the problem that the electrostatic discharge phenomenon causes damage to the liquid crystal display panel, an electrostatic discharge protection circuit is generally designed on the active device array substrate. However, the ESD protection circuit is often designed for components in the display area of the active device array substrate. Therefore, if an electrostatic discharge phenomenon occurs in the peripheral circuit region outside the display region, the liquid crystal display panel may be damaged.
本發明提供一種主動元件陣列基板,其周邊線路區的元件不易受到靜電放電破壞而具有良好的品質。The present invention provides an active device array substrate in which components of a peripheral line region are less susceptible to electrostatic discharge damage and have good quality.
本發明另提供一種顯示面板,具有良好的品質。The invention further provides a display panel with good quality.
本發明提出一種主動元件陣列基板,包括一基板、一主動元件陣列、多個驅動晶片接墊、多個軟性電路板接墊、一檢測線路、一共用電位線路以及一靜電防護線路。基板具有一顯示區以及位於顯示區周邊的一周邊線路區。主動元件陣列位於顯示區中。驅動晶片接墊位於週邊線路區中並電性連接至主動元件陣列。軟性電路板接墊位於週邊線路區中並電性連接至驅動晶片接墊。檢測線路位於驅動晶片接墊以及軟性電路板接墊之間。共用電位線路電性連接主動元件陣列,其中共用電位線路包括一環形封閉線路。環形封閉線路環繞主動元件陣列,且具有位於檢測線路以及軟性電路板接墊之間的一連接線。靜電防護線路電性連接主動元件陣列以及共用電位線路。The invention provides an active device array substrate, comprising a substrate, an active device array, a plurality of driving die pads, a plurality of flexible circuit board pads, a detecting circuit, a common potential circuit and an electrostatic protection circuit. The substrate has a display area and a peripheral line area located around the display area. The active component array is located in the display area. The drive wafer pads are located in the peripheral line region and are electrically connected to the active device array. The flexible circuit board pads are located in the peripheral wiring area and are electrically connected to the driving wafer pads. The test line is located between the driver die pad and the flexible circuit board pad. The common potential line is electrically connected to the active device array, wherein the common potential line comprises an annular closed circuit. The annular closed circuit surrounds the active element array and has a connection line between the detection line and the flexible circuit board pads. The ESD protection circuit electrically connects the active device array and the common potential line.
本發明另提出一種顯示面板,其包括一如上所述的主動元件陣列基板、一對向基板以及一顯示介質層。對向基板面向主動元件陣列基板,顯示介質層配置於主動元件陣列基板與對向基板之間。The invention further provides a display panel comprising an active device array substrate, a pair of substrates and a display medium layer as described above. The opposite substrate faces the active device array substrate, and the display dielectric layer is disposed between the active device array substrate and the opposite substrate.
基於上述,本發明的主動元件陣列基板中,連接至靜電防護線路的共用電位線路構成一環形封閉的傳導路徑,且部分的共用電位線路位於檢測線路以及軟性電路板接墊之間。因此,檢測線路以及軟性電路板接墊可以受到共用電位線路的保護而避免靜電放電的破壞。換言之,本發明的主動元件陣列基板及應用此主動元件陣列基板之顯示面板具有良好的品質。Based on the above, in the active device array substrate of the present invention, the common potential line connected to the ESD line constitutes an annular closed conduction path, and a part of the common potential line is located between the detection line and the flexible circuit board pad. Therefore, the detection circuit and the flexible circuit board pads can be protected by the common potential line to avoid the destruction of the electrostatic discharge. In other words, the active device array substrate of the present invention and the display panel using the active device array substrate have good quality.
為讓本發明之上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。The above described features and advantages of the present invention will be more apparent from the following description.
圖1繪示為本發明之一實施例的顯示面板,而圖2繪示為本發明之一實施例的主動元件陣列基板之示意圖。請參照圖1,顯示面板10包括一主動元件陣列基板100、一對向基板200以及一顯示介質層300。對向基板200面向該主動元件陣列基板100,而顯示介質層300配置於對向基板200與主動元件陣列基板100之間。在一實施例中,顯示介質層300可以是液晶層。液晶層中的液晶分子可以受到主動元件陣列基板100與對向基板200之間的電場作用而產生狀態改變並進行顯示。在其他實施例中,顯示介質層300還可以是有激發光層或是其他可以作為顯示介質的材料層。1 is a display panel according to an embodiment of the present invention, and FIG. 2 is a schematic diagram of an active device array substrate according to an embodiment of the present invention. Referring to FIG. 1 , the display panel 10 includes an active device array substrate 100 , a pair of substrates 200 , and a display medium layer 300 . The opposite substrate 200 faces the active device array substrate 100, and the display dielectric layer 300 is disposed between the opposite substrate 200 and the active device array substrate 100. In an embodiment, the display medium layer 300 may be a liquid crystal layer. The liquid crystal molecules in the liquid crystal layer can be subjected to an electric field action between the active device array substrate 100 and the opposite substrate 200 to cause a state change and display. In other embodiments, the display medium layer 300 can also be an excitation light layer or other material layer that can serve as a display medium.
接著,請參照圖2,主動元件陣列基板10包括一基板110、一主動元件陣列120、多個驅動晶片接墊130、多個軟性電路板接墊140、一檢測線路150、一共用電位線路160以及一靜電防護線路170。基板110具有一顯示區112以及位於顯示區112周邊的一周邊線路區114。在本實施例中,顯示區112是圖2中的虛線所圍出來的內部區域而虛線至基板110邊緣的區域則是周邊線路區114。Next, referring to FIG. 2 , the active device array substrate 10 includes a substrate 110 , an active device array 120 , a plurality of driving die pads 130 , a plurality of flexible circuit board pads 140 , a detecting circuit 150 , and a common potential line 160 . And an electrostatic protection circuit 170. The substrate 110 has a display area 112 and a peripheral line area 114 located around the display area 112. In the present embodiment, the display area 112 is the inner area surrounded by the broken line in FIG. 2, and the area of the dotted line to the edge of the substrate 110 is the peripheral line area 114.
主動元件陣列120位於顯示區112中。驅動晶片接墊130位於週邊線路區114中並電性連接至主動元件陣列120。軟性電路板接墊140位於週邊線路區114中並電性連接至驅動晶片接墊130。檢測線路150位於驅動晶片接墊130以及軟性電路板接墊140之間。共用電位線路160電性連接主動元件陣列120,其中共用電位線路160包括一環形封閉線路162。環形封閉線路162環繞主動元件陣列120,且具有位於檢測線路150以及軟性電路板接墊140之間的一連接線162A。靜電防護線路170電性連接主動元件陣列120以及共用電位線路160。The active device array 120 is located in the display area 112. The driver die pad 130 is located in the peripheral line region 114 and is electrically connected to the active device array 120. The flexible circuit board pads 140 are located in the peripheral wiring region 114 and are electrically connected to the driving wafer pads 130. The detection line 150 is located between the drive wafer pad 130 and the flexible circuit board pads 140. The common potential line 160 is electrically connected to the active device array 120, wherein the common potential line 160 includes an annular closed line 162. The annular closed line 162 surrounds the active device array 120 and has a connection line 162A between the sense line 150 and the flexible circuit board pads 140. The ESD protection line 170 is electrically connected to the active device array 120 and the common potential line 160.
值得一提的是,圖2僅為主動元件陣列基板100之示意圖,其中有部份的構件由於屬於習知的技術,所以僅以簡單的方式表示而未具體繪示出來。舉例而言,驅動晶片接墊130實際上為多個導電接墊,其用以連接驅動晶片,而在本實施例的圖式中僅以配置驅動晶片的區域來表示而未實際繪示出各個導電接墊。檢測線路150也是僅以其所在區域來表示。另外,驅動晶片接墊130與軟性電路板接墊140之間實際上還有多條未繪示的導線以與彼此電性連接。It is worth mentioning that FIG. 2 is only a schematic diagram of the active device array substrate 100, and some of the components are only shown in a simple manner and are not specifically illustrated because they belong to the prior art. For example, the driving die pad 130 is actually a plurality of conductive pads for connecting the driving wafers, and in the drawings of the embodiment, only the regions configuring the driving wafers are represented without actually depicting each. Conductive pads. The detection line 150 is also represented only by the area in which it is located. In addition, there are actually a plurality of wires (not shown) between the driving die pad 130 and the flexible circuit board pad 140 to be electrically connected to each other.
詳言之,主動元件陣列120包括多條掃描線122、多條資料線124、多條共用線126以及多個畫素單元128。掃描線122電性連接至靜電防護線路170以及部份驅動晶片接墊130。資料線124與掃描線122相交並電性連接至靜電防護線路170以及另一部份驅動晶片接墊130。共用線126電性連接至共用電位線路170以及再一部份驅動晶片接墊130。畫素單元128陣列排列於顯示區112中,且畫素單元128電性連接至對應的掃描線122、資料線124以及共用線126。In detail, the active device array 120 includes a plurality of scan lines 122, a plurality of data lines 124, a plurality of common lines 126, and a plurality of pixel units 128. The scan line 122 is electrically connected to the ESD protection line 170 and a portion of the drive wafer pad 130. The data line 124 intersects the scan line 122 and is electrically connected to the ESD line 170 and another portion of the drive wafer pad 130. The common line 126 is electrically connected to the common potential line 170 and a further portion of the driving wafer pad 130. The pixel units 128 are arranged in an array in the display area 112, and the pixel units 128 are electrically connected to the corresponding scan lines 122, data lines 124, and common lines 126.
另外,主動元件陣列基板100更包括多條傳輸線路180,其至少位於主動元件陣列120之一側並使主動元件陣列120以及驅動晶片接墊130電性連接。在本實施例中,傳輸線路180位於主動元件陣列120的兩側。另外,連接至共用線126的部份傳輸線路180更電性連接至環形封閉線路162。In addition, the active device array substrate 100 further includes a plurality of transmission lines 180 disposed at least on one side of the active device array 120 and electrically connecting the active device array 120 and the driving wafer pads 130. In the present embodiment, the transmission lines 180 are located on both sides of the active device array 120. In addition, a portion of the transmission line 180 connected to the common line 126 is more electrically connected to the annular closed line 162.
在顯示區112的範圍之內配置有掃描線122、資料線124、共用線126等多條傳輸訊號之用的線路。一但任何一條線路受到靜電放電的破壞,主動元件陣列120將可能整個報廢。舉例來說,每一條掃描線122都連接著多數個進行顯示用的畫素單元128。若其中一條掃描線122因為靜電放電的破壞而斷線,則連接於這一條掃描線122上的畫素單元128都無法被開啟而進行顯示。如此一來,主動元件陣列基板100應用於圖1的顯示面板10時,將產生無法正常顯示的亮線或是暗線而使顯示面板10成為不良品。A plurality of lines for transmitting signals such as the scanning line 122, the data line 124, and the common line 126 are disposed within the range of the display area 112. Once any of the lines is damaged by electrostatic discharge, the active device array 120 will likely be completely scrapped. For example, each scan line 122 is connected to a plurality of pixel units 128 for display. If one of the scanning lines 122 is broken due to the destruction of the electrostatic discharge, the pixel unit 128 connected to the scanning line 122 cannot be turned on for display. As a result, when the active device array substrate 100 is applied to the display panel 10 of FIG. 1, a bright line or a dark line that cannot be normally displayed is generated, and the display panel 10 is defective.
更進一步而言,為了具有良好的訊號傳輸特性,這些線路都會以不透光的金屬材質加以製作。不過,這些線路的配置可能使得顯示區112可進行顯示的面積受到限制,亦即顯示開口率受到侷限。因此,製作這些線路時,設計者往往希望將這些線路的線寬變窄以提升顯示面板10的顯示效果。但是,線寬越窄則線路對於靜電放電的承受力越差,也就是越容易因為靜電放電的破壞而斷線。所以,主動元件陣列120的靜電防護相當重要。Furthermore, in order to have good signal transmission characteristics, these lines are made of an opaque metal material. However, the configuration of these lines may limit the area in which the display area 112 can be displayed, that is, the display aperture ratio is limited. Therefore, when fabricating these lines, designers often desire to narrow the line width of these lines to enhance the display effect of the display panel 10. However, the narrower the line width, the worse the line's resistance to electrostatic discharge, that is, the easier it is to break due to the destruction of electrostatic discharge. Therefore, the electrostatic protection of the active device array 120 is quite important.
在本實施例中,靜電防護線路170包括多個第一靜電防護元件172以及多個第二靜電防護元件174。第一靜電防護元件172連接於主動元件陣列120以及第二靜電防護元件174之間,而第二靜電防護元件174連接於第一靜電防護元件172與共用電位線路160之間。靜電防護線路170可以藉由共用電位線路160將主動元件陣列120內所累積的靜電荷傳導至主動元件陣列基板100外以避免靜電放電對各元件所造成的破壞。In the present embodiment, the ESD protection line 170 includes a plurality of first ESD protection elements 172 and a plurality of second ESD protection elements 174. The first ESD protection element 172 is connected between the active device array 120 and the second ESD protection element 174, and the second ESD protection element 174 is connected between the first ESD protection element 172 and the common potential line 160. The static electricity protection circuit 170 can conduct static charges accumulated in the active device array 120 to the outside of the active device array substrate 100 by the common potential line 160 to avoid damage caused to each component by electrostatic discharge.
然而,圖3繪示為圖2之主動元件陣列基板之區域A的局部放大示意圖。請同時參照圖2與圖3,在周邊線路區114中,軟性電路板接墊140與檢測線路150之間往往也會有靜電荷的累積。因此,本實施例的共用電位線路160至少包括環形封閉線路162,其中環形封閉線路162的連接線162A配置於軟性電路板接墊140與檢測線路150之間。一但軟性電路板接墊140與檢測線路150之間有不必要的靜電荷累積,連接線162A便可將這些靜電荷導走。如此一來,軟性電路板接墊140與檢測線路150可以獲得適當的保護而有助於提高主動元件陣列基板100的品質。However, FIG. 3 is a partially enlarged schematic view showing a region A of the active device array substrate of FIG. Referring to FIG. 2 and FIG. 3 simultaneously, in the peripheral line region 114, there is often an accumulation of static charge between the flexible circuit board pads 140 and the detection lines 150. Therefore, the common potential line 160 of the present embodiment includes at least the annular closed line 162, wherein the connecting line 162A of the annular closed line 162 is disposed between the flexible circuit board pad 140 and the detecting line 150. Once there is unnecessary static charge accumulation between the flexible circuit board pads 140 and the sense lines 150, the connection lines 162A can conduct these static charges. As a result, the flexible circuit board pads 140 and the detection lines 150 can obtain appropriate protection to help improve the quality of the active device array substrate 100.
根據實際測試結果,主動元件陣列基板100若未配置連接線162A,則在8000伏特的靜電測試下,檢測線路150會被破壞。不過,本實施例的主動元件陣列基板100配置有連接線162A,所以在8000伏特的靜電測試過程中僅有連接線162A的邊緣出現些許缺陷,而檢測線路150與軟性電路板接墊140仍保有完整的結構。出現於連接線162A邊緣的缺陷並未使得共用電位線路160失去其原本的作用。也就是說,主動元件陣列基板100的各個元件仍可以正常地運作。因此,本實施例的主動元件陣列基板100可以有效地降低因為靜電放電效應對其內部元件的損害。According to the actual test results, if the active device array substrate 100 is not provided with the connection line 162A, the detection line 150 is destroyed under the electrostatic test of 8000 volts. However, the active device array substrate 100 of the present embodiment is provided with the connection line 162A, so that only a slight defect occurs at the edge of the connection line 162A during the electrostatic test of 8000 volts, and the detection circuit 150 and the flexible circuit board pad 140 remain. Complete structure. The defect appearing at the edge of the connection line 162A does not cause the common potential line 160 to lose its original function. That is to say, the respective components of the active device array substrate 100 can still operate normally. Therefore, the active device array substrate 100 of the present embodiment can effectively reduce damage to its internal components due to an electrostatic discharge effect.
綜上所述,本發明之主動元件陣列基板的共用電位線路具有環形封閉線路,且環形封閉線路至少有一部分配置於軟性電路板接墊與檢測線路之間。所以,主動元件陣列基板之週邊線路區中發生不當的靜電荷累積或是發生靜電放電的情形時,環形封閉線路可以有效地將這些靜電導出。亦即,本發明之主動元件陣列基板不易受到靜電放電的破壞而具有良好的品質。當然,本發明之顯示面板具有上述之主動元件陣列基板,所以本發明之顯示面板亦具有良好的品質且不易因靜電放電的破壞而受損。In summary, the common potential line of the active device array substrate of the present invention has an annular closed circuit, and at least a portion of the annular closed circuit is disposed between the flexible circuit board pad and the detection line. Therefore, when improper static charge accumulation or electrostatic discharge occurs in the peripheral line region of the active device array substrate, the annular closed circuit can effectively discharge the static electricity. That is, the active device array substrate of the present invention is less susceptible to damage by electrostatic discharge and has good quality. Of course, the display panel of the present invention has the above-described active device array substrate, so the display panel of the present invention also has good quality and is not easily damaged by the destruction of electrostatic discharge.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,故本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the invention, and any one of ordinary skill in the art can make some modifications and refinements without departing from the spirit and scope of the invention. The scope of the invention is defined by the scope of the appended claims.
10‧‧‧顯示面板10‧‧‧ display panel
100‧‧‧主動元件陣列基板100‧‧‧Active component array substrate
110‧‧‧基板110‧‧‧Substrate
112‧‧‧顯示區112‧‧‧ display area
114‧‧‧周邊線路區114‧‧‧ Peripheral area
120‧‧‧主動元件陣列120‧‧‧Active component array
122‧‧‧掃描線122‧‧‧ scan line
124‧‧‧資料線124‧‧‧Information line
126‧‧‧共用線126‧‧‧Shared line
128‧‧‧畫素單元128‧‧‧ pixel unit
130‧‧‧驅動晶片接墊130‧‧‧Drive wafer pads
140‧‧‧軟性電路板接墊140‧‧‧Soft circuit board pads
150‧‧‧檢測線路150‧‧‧Test line
160‧‧‧共用電位線路160‧‧‧Common potential line
162‧‧‧環形封閉線路162‧‧‧Circular closed circuit
162A‧‧‧連接線162A‧‧‧ connection line
170‧‧‧靜電防護線路170‧‧‧Electrostatic protection lines
172‧‧‧第一靜電防護元件172‧‧‧First Electrostatic Protection Element
174‧‧‧第二靜電防護元件174‧‧‧Second electrostatic protection element
180‧‧‧傳輸線路180‧‧‧ transmission line
200‧‧‧對向基板200‧‧‧ opposite substrate
300‧‧‧顯示介質層300‧‧‧Display media layer
A‧‧‧區域A‧‧‧ area
圖1繪示為本發明之一實施例的顯示面板。FIG. 1 illustrates a display panel according to an embodiment of the present invention.
圖2繪示為本發明之一實施例的主動元件陣列基板之示意圖。2 is a schematic diagram of an active device array substrate according to an embodiment of the present invention.
圖3繪示為圖2之主動元件陣列基板之區域A的局部放大示意圖。3 is a partially enlarged schematic view showing a region A of the active device array substrate of FIG. 2.
100...主動元件陣列基板100. . . Active device array substrate
110...基板110. . . Substrate
112...顯示區112. . . Display area
114...周邊線路區114. . . Peripheral area
120...主動元件陣列120. . . Active component array
122...掃描線122. . . Scanning line
124...資料線124. . . Data line
126...共用線126. . . Shared line
128...畫素單元128. . . Pixel unit
130...驅動晶片接墊130. . . Drive wafer pad
140...軟性電路板接墊140. . . Flexible circuit board pad
150...檢測線路150. . . Detection line
160...共用電位線路160. . . Shared potential line
162...環形封閉線路162. . . Ring closed circuit
162A...連接線162A. . . Cable
170...靜電防護線路170. . . Electrostatic protection circuit
172...第一靜電防護元件172. . . First electrostatic protection element
174...第二靜電防護元件174. . . Second electrostatic protection element
180...傳輸線路180. . . Transmission line
A...區域A. . . region
Claims (10)
Priority Applications (1)
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TW98137157A TWI385456B (en) | 2009-11-02 | 2009-11-02 | Active device array substrate and display panel |
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TW98137157A TWI385456B (en) | 2009-11-02 | 2009-11-02 | Active device array substrate and display panel |
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TW201116913A TW201116913A (en) | 2011-05-16 |
TWI385456B true TWI385456B (en) | 2013-02-11 |
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TWI498654B (en) * | 2012-07-16 | 2015-09-01 | Chunghwa Picture Tubes Ltd | Pixel array substrate and display panel |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6566902B2 (en) * | 2000-12-20 | 2003-05-20 | Lg.Philips Lcd Co., Ltd. | Liquid crystal display device for testing signal line |
TW200727058A (en) * | 2006-01-05 | 2007-07-16 | Chunghwa Picture Tubes Ltd | Active device array substrate, liquid crystal display panel and examining methods thereof |
TW200734776A (en) * | 2006-03-10 | 2007-09-16 | Chunghwa Picture Tubes Ltd | Inspecting layout and fabricating method of liquid crystal display panel |
US20080265250A1 (en) * | 2007-04-27 | 2008-10-30 | Chunghwa Picture Tubes, Ltd. | Active device array substrate |
TWI312890B (en) * | 2005-07-07 | 2009-08-01 | Chunghwa Picture Tubes Ltd | Liquid crystal display panel, thin film transistor array substrate and examining method thereof |
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2009
- 2009-11-02 TW TW98137157A patent/TWI385456B/en not_active IP Right Cessation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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US6566902B2 (en) * | 2000-12-20 | 2003-05-20 | Lg.Philips Lcd Co., Ltd. | Liquid crystal display device for testing signal line |
TWI312890B (en) * | 2005-07-07 | 2009-08-01 | Chunghwa Picture Tubes Ltd | Liquid crystal display panel, thin film transistor array substrate and examining method thereof |
TW200727058A (en) * | 2006-01-05 | 2007-07-16 | Chunghwa Picture Tubes Ltd | Active device array substrate, liquid crystal display panel and examining methods thereof |
TW200734776A (en) * | 2006-03-10 | 2007-09-16 | Chunghwa Picture Tubes Ltd | Inspecting layout and fabricating method of liquid crystal display panel |
US20080265250A1 (en) * | 2007-04-27 | 2008-10-30 | Chunghwa Picture Tubes, Ltd. | Active device array substrate |
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