TWI319838B - Bottom anti-reflective coatings derived from small core molecules with multiple epoxy moieties - Google Patents
Bottom anti-reflective coatings derived from small core molecules with multiple epoxy moietiesInfo
- Publication number
- TWI319838B TWI319838B TW92127924A TW92127924A TWI319838B TW I319838 B TWI319838 B TW I319838B TW 92127924 A TW92127924 A TW 92127924A TW 92127924 A TW92127924 A TW 92127924A TW I319838 B TWI319838 B TW I319838B
- Authority
- TW
- Taiwan
- Prior art keywords
- bottom anti
- reflective coatings
- small core
- core molecules
- epoxy moieties
- Prior art date
Links
- 239000004593 Epoxy Substances 0.000 title 1
- 239000006117 anti-reflective coating Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09B—ORGANIC DYES OR CLOSELY-RELATED COMPOUNDS FOR PRODUCING DYES, e.g. PIGMENTS; MORDANTS; LAKES
- C09B69/00—Dyes not provided for by a single group of this subclass
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
- Y10S430/1053—Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
- Y10S430/1055—Radiation sensitive composition or product or process of making
- Y10S430/106—Binder containing
- Y10S430/111—Polymer of unsaturated acid or ester
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31511—Of epoxy ether
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31511—Of epoxy ether
- Y10T428/31515—As intermediate layer
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Materials For Photolithography (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Paints Or Removers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US41721402P | 2002-10-08 | 2002-10-08 | |
US10/679,521 US7323289B2 (en) | 2002-10-08 | 2003-10-06 | Bottom anti-reflective coatings derived from small core molecules with multiple epoxy moieties |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200422768A TW200422768A (en) | 2004-11-01 |
TWI319838B true TWI319838B (en) | 2010-01-21 |
Family
ID=32096187
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW92127924A TWI319838B (en) | 2002-10-08 | 2003-10-08 | Bottom anti-reflective coatings derived from small core molecules with multiple epoxy moieties |
Country Status (8)
Country | Link |
---|---|
US (1) | US7323289B2 (zh) |
EP (1) | EP1573785B1 (zh) |
JP (1) | JP4559228B2 (zh) |
KR (1) | KR101027606B1 (zh) |
CN (1) | CN1739063B (zh) |
AU (1) | AU2003282554A1 (zh) |
TW (1) | TWI319838B (zh) |
WO (1) | WO2004034435A2 (zh) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6451346B1 (en) * | 1998-12-23 | 2002-09-17 | Amgen Inc | Biodegradable pH/thermosensitive hydrogels for sustained delivery of biologically active agents |
KR101026127B1 (ko) * | 2002-10-09 | 2011-04-05 | 닛산 가가쿠 고교 가부시키 가이샤 | 리소그라피용 반사방지막 형성 조성물 |
US20050163714A1 (en) * | 2003-10-02 | 2005-07-28 | Sukhishvili Svetlana A. | Capsules of multilayered neutral polymer films associated by hydrogen bonding |
JP4697464B2 (ja) * | 2004-10-12 | 2011-06-08 | 日産化学工業株式会社 | 含窒素芳香環構造を含むリソグラフィー用反射防止膜形成組成物 |
US20060147491A1 (en) * | 2005-01-05 | 2006-07-06 | Dewitt David M | Biodegradable coating compositions including multiple layers |
US20060198868A1 (en) * | 2005-01-05 | 2006-09-07 | Dewitt David M | Biodegradable coating compositions comprising blends |
WO2007036982A1 (ja) | 2005-09-27 | 2007-04-05 | Nissan Chemical Industries, Ltd. | イソシアヌル酸化合物と安息香酸化合物との反応生成物を含む反射防止膜形成組成物 |
CN103838086B (zh) * | 2005-09-27 | 2017-10-20 | 日产化学工业株式会社 | 含有异氰脲酸化合物与苯甲酸化合物的反应生成物的形成防反射膜的组合物 |
KR101423056B1 (ko) * | 2006-06-19 | 2014-07-25 | 닛산 가가쿠 고교 가부시키 가이샤 | 수산기 함유 축합계 수지를 함유하는 레지스트 하층막 형성조성물 |
US8383320B2 (en) * | 2007-10-31 | 2013-02-26 | Nissan Chemical Industries, Ltd. | Resist underlayer film forming composition and method of forming resist pattern using the same |
US20090253080A1 (en) * | 2008-04-02 | 2009-10-08 | Dammel Ralph R | Photoresist Image-Forming Process Using Double Patterning |
US20090253081A1 (en) * | 2008-04-02 | 2009-10-08 | David Abdallah | Process for Shrinking Dimensions Between Photoresist Pattern Comprising a Pattern Hardening Step |
KR100894218B1 (ko) * | 2008-04-11 | 2009-04-22 | 금호석유화학 주식회사 | 흡광제 및 이를 포함하는 유기 반사 방지막 조성물 |
US20100040838A1 (en) * | 2008-08-15 | 2010-02-18 | Abdallah David J | Hardmask Process for Forming a Reverse Tone Image |
JP5282917B2 (ja) * | 2008-11-12 | 2013-09-04 | 日産化学工業株式会社 | レジスト下層膜形成組成物及びそれを用いたパターニング方法 |
WO2010083350A1 (en) * | 2009-01-16 | 2010-07-22 | Fujifilm Electronic Materials U.S.A., Inc. | Nonpolymeric binders for semiconductor substrate coatings |
US8084186B2 (en) * | 2009-02-10 | 2011-12-27 | Az Electronic Materials Usa Corp. | Hardmask process for forming a reverse tone image using polysilazane |
JP5794228B2 (ja) * | 2010-03-31 | 2015-10-14 | Jsr株式会社 | レジスト下層膜形成用組成物 |
WO2013109748A1 (en) * | 2012-01-19 | 2013-07-25 | Brewer Science Inc. | Nonpolymeric antireflection compositions containing adamantyl groups |
WO2013163100A1 (en) * | 2012-04-23 | 2013-10-31 | Brewer Science Inc. | Photosensitive, developer-soluble bottom anti-reflective coating material |
JP6196194B2 (ja) * | 2014-08-19 | 2017-09-13 | 信越化学工業株式会社 | 紫外線吸収剤、レジスト下層膜形成用組成物、及びパターン形成方法 |
WO2016159358A1 (ja) * | 2015-04-03 | 2016-10-06 | 日産化学工業株式会社 | 光架橋基を有する段差基板被覆組成物 |
KR20190028651A (ko) | 2016-07-15 | 2019-03-19 | 닛산 가가쿠 가부시키가이샤 | 히단토인환을 갖는 화합물을 포함하는 레지스트 하층막형성 조성물 |
JP7348210B2 (ja) | 2018-06-13 | 2023-09-20 | ブルーワー サイエンス アイ エヌ シー. | Euvリソグラフィ用接着層 |
CN115698857A (zh) * | 2020-06-12 | 2023-02-03 | 日产化学株式会社 | 包含二醇结构的抗蚀剂下层膜形成用组合物 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3776729A (en) * | 1971-02-22 | 1973-12-04 | Ibm | Photosensitive dielectric composition and process of using the same |
JPS6021050A (ja) * | 1983-07-15 | 1985-02-02 | Toray Ind Inc | 湿し水不要平版印刷用原板 |
JPS61123847A (ja) * | 1984-11-21 | 1986-06-11 | Toray Ind Inc | 水なし平版印刷用原板 |
JP3567487B2 (ja) * | 1994-06-24 | 2004-09-22 | 東レ株式会社 | 水なし平版印刷版原版 |
US5607824A (en) | 1994-07-27 | 1997-03-04 | International Business Machines Corporation | Antireflective coating for microlithography |
US5693691A (en) * | 1995-08-21 | 1997-12-02 | Brewer Science, Inc. | Thermosetting anti-reflective coatings compositions |
US5886102A (en) | 1996-06-11 | 1999-03-23 | Shipley Company, L.L.C. | Antireflective coating compositions |
US5939236A (en) | 1997-02-07 | 1999-08-17 | Shipley Company, L.L.C. | Antireflective coating compositions comprising photoacid generators |
US5919599A (en) * | 1997-09-30 | 1999-07-06 | Brewer Science, Inc. | Thermosetting anti-reflective coatings at deep ultraviolet |
US6190839B1 (en) | 1998-01-15 | 2001-02-20 | Shipley Company, L.L.C. | High conformality antireflective coating compositions |
JP3852889B2 (ja) * | 1998-09-24 | 2006-12-06 | 富士写真フイルム株式会社 | フォトレジスト用反射防止膜材料組成物 |
US6316165B1 (en) * | 1999-03-08 | 2001-11-13 | Shipley Company, L.L.C. | Planarizing antireflective coating compositions |
JP2001022084A (ja) * | 1999-05-06 | 2001-01-26 | Tokyo Ohka Kogyo Co Ltd | 微細パターン形成方法 |
US6927266B2 (en) * | 2001-02-22 | 2005-08-09 | Nissan Chemical Industries, Ltd. | Bottom anti-reflective coat forming composition for lithography |
US7332266B2 (en) * | 2001-04-10 | 2008-02-19 | Nissan Chemical Industries, Ltd. | Composition for forming anti-reflective coating for use in lithography |
US6670425B2 (en) * | 2001-06-05 | 2003-12-30 | Brewer Science, Inc. | Anti-reflective coating of polymer with epoxide rings reacted with light attenuating compound and unreacted epoxide rings |
US6846612B2 (en) * | 2002-02-01 | 2005-01-25 | Brewer Science Inc. | Organic anti-reflective coating compositions for advanced microlithography |
-
2003
- 2003-10-06 US US10/679,521 patent/US7323289B2/en not_active Expired - Lifetime
- 2003-10-07 WO PCT/US2003/032091 patent/WO2004034435A2/en active Application Filing
- 2003-10-07 CN CN2003801045620A patent/CN1739063B/zh not_active Expired - Lifetime
- 2003-10-07 KR KR1020057006151A patent/KR101027606B1/ko active IP Right Grant
- 2003-10-07 JP JP2004543632A patent/JP4559228B2/ja not_active Expired - Lifetime
- 2003-10-07 EP EP20030774743 patent/EP1573785B1/en not_active Expired - Lifetime
- 2003-10-07 AU AU2003282554A patent/AU2003282554A1/en not_active Abandoned
- 2003-10-08 TW TW92127924A patent/TWI319838B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR101027606B1 (ko) | 2011-04-06 |
KR20050062606A (ko) | 2005-06-23 |
CN1739063A (zh) | 2006-02-22 |
WO2004034435A2 (en) | 2004-04-22 |
US7323289B2 (en) | 2008-01-29 |
JP2006502448A (ja) | 2006-01-19 |
CN1739063B (zh) | 2011-12-07 |
EP1573785B1 (en) | 2013-02-13 |
AU2003282554A8 (en) | 2004-05-04 |
AU2003282554A1 (en) | 2004-05-04 |
TW200422768A (en) | 2004-11-01 |
WO2004034435A3 (en) | 2005-07-28 |
US20040110089A1 (en) | 2004-06-10 |
JP4559228B2 (ja) | 2010-10-06 |
EP1573785A4 (en) | 2010-11-10 |
EP1573785A2 (en) | 2005-09-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK4A | Expiration of patent term of an invention patent |