TWI310193B - Flash memory card - Google Patents
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- Publication number
- TWI310193B TWI310193B TW095111485A TW95111485A TWI310193B TW I310193 B TWI310193 B TW I310193B TW 095111485 A TW095111485 A TW 095111485A TW 95111485 A TW95111485 A TW 95111485A TW I310193 B TWI310193 B TW I310193B
- Authority
- TW
- Taiwan
- Prior art keywords
- flash
- flash memory
- memory cell
- controller
- memory card
- Prior art date
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0657—Stacked arrangements of devices
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- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
- H01L23/5388—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates for flat cards, e.g. credit cards
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Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Credit Cards Or The Like (AREA)
- Read Only Memory (AREA)
- Wire Bonding (AREA)
- Semiconductor Memories (AREA)
Description
1310193 九、發明說明: 【發明所屬之技術領域】 係關於一種 一本發明係關於一種快閃記憶體,更詳細來說 高密度之快閃記憶卡。 【先前技術】 ^之f社縣大眾消費電子產品所需要,例如 數位相機(digital still camera)、手機、pDA 或者 Mp3 這些產品皆朝肖更小的封裝方式以及高密度發展 變得更迷你且元件密度變得更高的時候,以創新“" 出來 山 ydi « ' 1 内之需求便被提 習知技術在處理更高密度包裝快閃記憶卡時係藉由線接 。-個或多個快閃記麵晶元和—快閃控·來達成。在^理 尺1上,快閃記憶體晶元通常遠大於快閃控 元和快閃控制器是各自獨立地線接合在心記=的 元以軌!用以聯繫快閃控制器、快閃記憶體晶 卡介面中的訊號,接著基版被麟脂塑形或者 以外级覆盍,最後製造成完工的快閃記憶卡。 舉例來說’假如有大約4〇個峨 =^=兩=_=快 上的接口垫,因此,快閃記憶體晶元的尺寸 1310193 必須較,i:以留下空間給線接合塾。再者,由於應用在複數晶元 層之錯綜式接合線(staggering bonding wires)的必要性,也舍產 生生產良率上的問題。 $座 綜上所述,-種系統和方法用以提供高密度、較小的封 方,的快閃記針以應付前述的問殿需要的,H統必須能 簡單實施、節錢本以及翻於财崎境。本發明實 需要。 m 【發明内容】 二種記憶卡包含-基版、-記憶體晶元一控制器晶元以 及一中介物’該記憶體晶元位於該基版上,該控制器晶元位於 該記憶體晶it上’該中介物圍繞該控制器且位於該記憶體晶元 上’其中該中介物使得線接合至該基版實質上得以縮減。一種 根^本,明之系統及方法可達成下列目的:⑴儘可能的利用 大置的6己憶體晶元’藉由縮減基版上的線接合塾數目及嵌入最 大可能之晶;T:至給定之卡内圍,以增加快閃記針的密度;⑺ 更有效地堆疊快閃記’Jt體晶元以增加記憶卡的密度丨以及 (3)儘可能地實質縮減連制基版±的接合線的數目,以 生產良率。 【實施方式】 一本發明係關於-種快閃記憶體,更詳細來說,侧於一種 =度之快閃記憶卡。以下說日關以使該技術領域具有通常知 f者,以實施及使用本發明,且狀專利申請並符合其相關規 ^在此解之實補、—般原理及概係可迅速地被該技術 ::具有通f知識者所瞭解,故本發明之實施態樣並非用來限 之㈣’本發明之侧範圍應根據在此說明之原理及 特徵作最寬廣的解釋。 1310193 包人為—習知的快閃記憶卡1G,此快閃記憶卡10 快pV?二曰,」面11、一快閃記憶控制1112以及一個或多個 接閃卡介面11通扣連接11或是金手指 器12控制位於 透過快閃卡介面丨丨回應來自這些主機裝置的要求。茨且 版I*在’快閃控制11 12和快閃記麵13係嵌在一片美 是已包裝形式:本發;= :稞晶導體元件,且這兩個元件具有不同晶元尺㊁: 取兩=:其;==^^ ^ approach> 式,s體〜元23之習知佈局方 Μ的俯視圖。第3圖為如同ί 2圖2所t相元 乃外而要額外的20個接合墊以容納快閃記憶 ^ 24 1310193 體晶元23的連接。如第3圖所示,基版22係由内部軌跡34、 36及37層壓組合以連接快閃控制器24、快閃記憶體晶元23 及快閃卡介面33。並排方式的製程是相對比較簡單的,然而, ^為基版22上總共需要50個接合線和接合墊,嚴格地限制了 能使用於給定快閃記憶卡21的快閃記憶體和快閃控制器的尺 寸0 、第4圖所示為一個較大快閃記憶體晶元123以及一以堆疊 方式位在基版122的一邊之較小控制器晶元124之習知佈局方 式的俯視圖。第5圖為如同第4圖所示相同佈局的剖面圖。 第4圖所示之堆疊方法中’快閃控制器晶元124被放 置於在基版122上之快閃記憶體晶元123上,導線118、 及138分別連接兩晶元上的接合墊119、127及140至下方其 版的接合墊125、126及135。由於採用多層堆疊的方式1 ,综式的線接合是必須的。基版122 大約3()健合塾以 ^納快閃控制器124的連接,另外需要額外的2()個接合塾以 谷納快閃記憶體晶元123的連接。如第5圖所示,基版12 罐以連接快閃控制器124、快閃記憶體晶元123 由於錯綜式的線接合方式需要基版122更 2二間配接合塾和導線,使得快閃記憶體晶元的尺寸受 J 版需要空間以容納總共5〇個額外的接合線和接合 藝。由於快閃控制器被放置於快閃記憶體晶元上,因此二 f 晶元尺寸上的限制她 是^ 交少的。當秘差不多鱗,且基版村比 較大的控制器晶元將會縮減該快閃的尺寸。 、 本發明兼顧習知並排方式及堆疊方式於快 的尺寸限制’本發日収節省基版上顯線接合的^以及^ 1310193 晶元尺寸且 線接合的複雜度。因此,可容納更多記憶體的較大 可用在並排方式或是堆疊方式。 .本發明之系統和方法可解決上述之問題而達 的.(1)藉由縮減基版上的線接合墊數目,儘可 爭 的快閃記憶體晶元於-給定的幾何空間内,以達=^置匕= δ己憶卡的紐;⑺如有需要’能財效地堆 體曰 元’以增加快閃記憶卡的密度;(3)儘可能地』
之接合線以改善生產良率。 至基版 閱相細地描述本發_舰,請參見以下之詳述並參 第6圖所示為本發明之快閃記憶卡之俯視圖,其 位於基版222上之一較大的快閃記憶體晶元223、二 ί Γ2Γ2以及—快閃控制器晶元224 °第7圖為第6'圖佈 局之nlj面圖。 在本實施例中,如第6圖所示,中介物242位於在基版 222上之快閃記憶體晶元223上,中介物242之 版222,其具有接合墊及預先安排好之連接執跡2料了 其亦可以Hf的、義/聚齡胺製造之單金屬層軟板 (l_metal layer flex drcuit)。中介物242之尺寸恰好足以使得其 接,墊227位於暴露快閃晶元接合墊a6的旁邊。如同第^ 及第7 f所示’中介物242具有接合墊撕及225分別合適地 女排以#近下方快閃憶體晶元223及中央的快閃控制器晶 元224相對應之接合塾226及219,其亦具有相對應之接^塾 240合適地安排以連接在主基版⑽上方且在快閃記憶體晶元 下方之接合墊235。如第7圖所示’這些由中介物242而來的 1310193 導線238疋唯一用以連接到基版222,且經由基版222上之勒 跡234依序連接至快閃卡介面233。 不同於習知方式,本發明幾乎轉移所有從晶元到下方的基 版222的連接線路至快閃卡22!中央的中介物2幻。藉由改g 基版上的接合墊數目由5〇個左右減少到低於1〇個(節省 8〇%) ’以實質地減少基版222所需的接合塾空間,這也使 由於空間供應給接合麵導致無法實現之實質較大快閃記憶 體晶元’在節省基版222的空間後變為可能。再者,藉由;用以 中介物242 ’快閃控制器晶元224不需要直接放置在基版從 上,因此於快閃控制器晶元的尺寸上具有較少的限制 ^堆疊方式有相同的好處。—般而言,本發明改善了快^ 與^際快閃記憶卡尺寸之比例,自大約62%達到 9〇二〇或更,。本發明鱗較大的_記碰晶元,因此 較尚密度的晶元於同樣的快閃記憶卡221設計。 如第6圖及第7圖所示,當快閃控制器晶元224堆疊於 "物242上’亦即位於快閃記憶體晶元223上時,為了不辦加 :介ί242具有位於中間區域之一裁切區22曰8, 224像-個島峡直接坐落在快閃記憶體晶元223 於中介物242上。 个疋位 元,9日圖所示’若需要堆疊更多的快閃記憶體晶 兀叮使用-在曰曰疋上之可彎曲電路中介物3犯。如 =及弟11圖所不’需注意如果有必要的話,此 Γ隹疊的樣子來擴展更多的快閃記憶體= 1310193 及42?、,二斤照本發明使用之兩個快閃記憶體晶元323 Ϊ ^上之曲的電路中介物342以及一位於基 為第8圖之佈局:“日:324之佈局之剖面圖。第9圖所示 324 在=控制器晶元 圖及第11圖所示,假如需要 ^^要=第10 額外的間隔物445是必要的。 1昧門德體曰曰兀523 323 不為+依照本發明應用之三個快閃記憶體晶元 位減Γ,晶元上之可彎曲電路中介物342以及一 圖10 1= 快閃控制器晶元324之佈局剖面圖。第11 圖為第10圖之佈局之側視圖。 理由445之高度小於習知堆疊快閃記憶卡設計, 疋ϋ隔物的高度係為線接合迴圈高度(Wire bonding 如函數,較低的迴圈高度需要較低的間隔物高度。 2 2圖所不,迴圈高度亦為兩個接合塾之間的橫向距離的 函數。 ^第人I2圖所7^,接合塾A及接合墊丑之間的距離為D1 ,接δ墊A及接合墊c之間的距離為D2 153。導線151 別提供給這兩對接合墊,其相對應的迴圈高度分別為 =1 15=及H2 155。較短的橫向距離D1 154需要有較小的迴圈 南度H1 156。如第11圖所示’由於使用中介物342,中介物 342及快閃記憶體晶元523、423及323間相對應的接合墊327 及326能夠物理上地互相鄰近。如第1〇圖所示,中介物342 及快閃控制益晶元324間相對應的接合墊319及318能夠物理 1310193 上地互相鄰近。目此於每個相職的接合狄·邮有最短 的導線’故產生最小的決定性的迴圈高度。較小的間隔物345 及445之整體效能會增加更多快閃記憶體晶元323、似及仍 之堆疊高度的可能性’因此達到快閃記憶卡321的更高密度。 替代性實施例 -替代性實施例佩置鋪H單元於朗赌體晶元的 中間,且在不需要晶对介物之情況下直接使用晶元對晶元 (die-to-die)線接合。 另-替代性實施例係於㈣記憶體上形成晶元再分配芦 (redistribution layer)以代替晶元中介物,唯一不同處在於再| 配層可在快閃a己憶體晶圓上製成,而中介物通常在基版組合 才置入個別的快閃記憶體晶元。 、’ 而不使用晶元上 其他替代性實施例為使用可彎曲的基版, 的可彎曲中介物。 相較於先前技術之優點 不同於習知方式將所有來自快閃控制器及快閃記憔體曰 兀上之接合墊之所有接合線連接至基版,本發明之快閃^憶^ 利用如第6圖所示之晶元中介物縮減接合線的數目。如第7圖 及第8圖所示,中介物位於快閃記憶體晶元上,以接合墊 跡來連接快離制||晶元 '快閃記舰晶元及快閃卡介面 於快閃卡介面訊號被限制在一定的數目(少於1〇),且通常 閃控y器所控制,因此它們是唯一需要被線接合至基版上之^ 號,這將驚人地縮減基版上的線接合墊數目從約5〇個 個,縮減齡。 縱低於 12 1310193 中人長度將比f知方式更平均地分布在晶元 干,使如用同^知f元尺寸及第6圖之本發明晶元尺寸所 二二物以線接合連接於快閃記憶體晶元及快閃控 制器間可有效地減少基版上之線接合 可能的快閃記紐晶元於,_記㈣ f騎使用竑大 間 使用直接線接合之晶元中介物以節省基版周邊線接合空 第9 ΪΠί之ΐ元中介物以容納快閃控制器晶元,如 第9圖所不,域減了整體的高度並且鱗更高的密度。 晶元堆疊 能夠=可f㈣電路晶元中介物使得快閃記憶體 爭縮Ϊ 合的中介物塾’本發日月亦縮減了線接合長度, ^此項㈣之人士均可在不違穌剌之 情況下,對上述實施例進行修改及變化 ^ 利園 應以下述申請專職_錄之内料依據沐案之權利範圍 【圖式簡單說明】 13 1310193 f1圖所示雜呢憶卡示音圖· 第32 =心=之; 接合基版之俯視圖; ^第4瞭她 圖;第5騎示為f知來自多層晶元之錯綜式接合線之剖面 之晶元中介中央裁切區以容納快閃控制器晶元 之晶巾絲她以容峨卩输制器晶元 葉;=示兩個快閃記憶體晶元設計之剖面圖; 第ίο圖ί為ϋ兩個快閃記憶體晶元設計之側視圖,· ϊ 三個快閃記憶體晶元設計之剖面圖; 以及騎4堆⑥二谢綱記紐晶元設計之側視圖; 函數圖圖所不為迴圈高度與兩個接合塾之間的橫向距離的 【主要元件符號說明】 1〇:快閃記憶卡 12:快閃記憶控制器 18:導線 2〇:導線 22:基版 24:控制器晶元 郎:接合墊 34:軌跡 祁:軌跡 11 :快閃卡介面 13 :快閃記憶控制器 19 =接合墊 21 :快閃記憶卡 23 :快閃記憶體晶元 & =接合墊 =接合墊 35 :接合墊 37 ·軌跡 1310193
38 :導線 119 :接合墊 122 :基版 124 :快閃控制器晶元 126 :接合墊 133 :快閃卡介面 135 :接合墊 151 :導線 153 : D2 155 : H2 219 :接合墊 222 :基版 224 :快閃控制器晶元 226 :接合墊 228 :裁切區 235 :接合墊 240 :接合墊 243 :連接執跡 318 :接合墊 321 :快閃記憶卡 323 :快閃記憶體晶元 326 :接合墊 342 :中介物 423 :快閃記憶體晶元 523 :快閃記憶體晶元 118 :導線 120 :導線 123 :快閃記憶體 125 :接合墊 127 :接合墊 134 :執跡 138 :導線 152 :導線 154 : D1 156 : H1 221 :快閃卡 223 :快閃記憶體晶元 225 :接合墊 227 :接合墊 233 :快閃卡介面 238 :導線 242 :中介物 244 :連接軌跡 319 :接合墊 322 :基版 324 :快閃控制器晶元 327 :接合墊 345 :間隔物 445 :間隔物 15
Claims (1)
131 (M°93i485號專利申請案 申請專利範圍替換本(無劃線版本,2009年2月) 十、申請專利範圍: 1. 一種記憶卡,包含: 一基版’該基版包含複數第一接合墊; 一記憶體晶元,位於該基版上,該記憶體晶元包含複 二接合墊,鄰近該複數第一接合塾; 乐 一控制器晶元’位於該記憶體晶元上,該控制器晶元人 複數第三接合墊;以及 一中介物(interposer),耦接於該控制器晶元,且位於該 憶體:曰曰元上,該中介物包含複數第四接合塾,鄰近該複 一、第二及第三接合墊,以使得線接合於其間其中該中 之該複數第四接合墊使得線接合轉移至該中介物,以 物線接合至該基版最少化。 2. 如請求項1所述之記憶卡,其中該中介物圍繞該控制器晶元。 3. 如請求項2所述之記憶卡,包含: 一苐一5己憶體晶元,耗接至該中介物;以及 一間隔物(spacer),用以隔開該記憶體晶元與該第二記情 體晶元。 4.如請求項!所述之記憶卡,其中該中介物包含至少一連接執跡 (connecting trace) ° 5. 如請求項2所述之記憶+ ’其中該中介物包含位於一中間區域 之一裁切區(cutout),該裁切區足以容納該控制器晶元。 如請求項1所述之記憶卡,其中該中介物包含 曲部係可彎曲位在晶元部件上。 1以弓 16 6. 1310193 所述之記憶卡’其中該控制器晶元具有-高度,該 同度係根據圍繞該控制器晶元之該中介物以達成Lr匕 之卡,其中該間隔物之高度係為該中介物 ~5己‘u體晶元間之一打線距離之函數。 9. —種快閃記憶卡,包含: 一基版,該基版包含複數第一 體晶=;=憶=士 =,該第-快_ -快閃ϊίίΓ 鄰近該複數第一接合墊; 閃押綱曰1控曰曰70 ’位於該第一快閃記憶體晶元上,該快 内控制Wtl包含複數第三接合塾; —彎曲中介物,耦接該第一快閃記情俨a 包含複數第四接合塾,鄰近勒曰一曰兀上,該中介物 以使得魂接人私甘# 5X 弟、弟一及第三接合墊, 最3線接5於其間’其中該彎曲中介物使得線接合至該基版 至少一第二快閃記憶體晶元,其中曰一 係輕接於該-曲中介物;以及 H夬門5己隐體曰曰兀 一間隔物,用以隔開該第一快閃記情體晶元 記憶體晶元。 體曰曰兀與該弟一快閃 彎曲中介物包含至少一 10·如請求項9所述之快閃記憶卡,其中該 連接執跡。 〃 17
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US11/237,283 US7411292B2 (en) | 2005-09-27 | 2005-09-27 | Flash memory card |
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KR100810349B1 (ko) * | 2006-08-04 | 2008-03-04 | 삼성전자주식회사 | 인터포저와 그를 이용한 반도체 패키지 |
US8363418B2 (en) * | 2011-04-18 | 2013-01-29 | Morgan/Weiss Technologies Inc. | Above motherboard interposer with peripheral circuits |
US10141314B2 (en) * | 2011-05-04 | 2018-11-27 | Micron Technology, Inc. | Memories and methods to provide configuration information to controllers |
KR101909203B1 (ko) * | 2011-07-21 | 2018-10-17 | 삼성전자 주식회사 | 멀티-채널 패키지 및 그 패키지를 포함한 전자 시스템 |
US10355001B2 (en) | 2012-02-15 | 2019-07-16 | Micron Technology, Inc. | Memories and methods to provide configuration information to controllers |
US9041220B2 (en) | 2013-02-13 | 2015-05-26 | Qualcomm Incorporated | Semiconductor device having stacked memory elements and method of stacking memory elements on a semiconductor device |
US20140233195A1 (en) * | 2013-02-21 | 2014-08-21 | Kabushiki Kaisha Toshiba | Semiconductor device |
US11397687B2 (en) | 2017-01-25 | 2022-07-26 | Samsung Electronics Co., Ltd. | Flash-integrated high bandwidth memory appliance |
US10700028B2 (en) | 2018-02-09 | 2020-06-30 | Sandisk Technologies Llc | Vertical chip interposer and method of making a chip assembly containing the vertical chip interposer |
US10879260B2 (en) | 2019-02-28 | 2020-12-29 | Sandisk Technologies Llc | Bonded assembly of a support die and plural memory dies containing laterally shifted vertical interconnections and methods for making the same |
US11309301B2 (en) | 2020-05-28 | 2022-04-19 | Sandisk Technologies Llc | Stacked die assembly including double-sided inter-die bonding connections and methods of forming the same |
US11335671B2 (en) | 2020-05-28 | 2022-05-17 | Sandisk Technologies Llc | Stacked die assembly including double-sided inter-die bonding connections and methods of forming the same |
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US5790384A (en) * | 1997-06-26 | 1998-08-04 | International Business Machines Corporation | Bare die multiple dies for direct attach |
KR100309161B1 (ko) | 1999-10-11 | 2001-11-02 | 윤종용 | 메모리 카드 및 그 제조방법 |
JP2001175834A (ja) | 1999-12-17 | 2001-06-29 | Toshiba Corp | カード型電子機器およびその製造方法 |
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US6884653B2 (en) | 2001-03-21 | 2005-04-26 | Micron Technology, Inc. | Folded interposer |
US7176506B2 (en) * | 2001-08-28 | 2007-02-13 | Tessera, Inc. | High frequency chip packages with connecting elements |
US6879047B1 (en) | 2003-02-19 | 2005-04-12 | Amkor Technology, Inc. | Stacking structure for semiconductor devices using a folded over flexible substrate and method therefor |
US7126219B2 (en) | 2003-10-09 | 2006-10-24 | Kingpak Technology Inc. | Small memory card |
US7358444B2 (en) * | 2004-10-13 | 2008-04-15 | Intel Corporation | Folded substrate with interposer package for integrated circuit devices |
US20060087013A1 (en) * | 2004-10-21 | 2006-04-27 | Etron Technology, Inc. | Stacked multiple integrated circuit die package assembly |
US7151010B2 (en) * | 2004-12-01 | 2006-12-19 | Kyocera Wireless Corp. | Methods for assembling a stack package for high density integrated circuits |
-
2005
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- 2006-03-31 TW TW095111485A patent/TWI310193B/zh active
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CN1940973A (zh) | 2007-04-04 |
US7411292B2 (en) | 2008-08-12 |
TW200713301A (en) | 2007-04-01 |
CN100492406C (zh) | 2009-05-27 |
US20070069390A1 (en) | 2007-03-29 |
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