1293748 (1) 玖、發明說明 【發明所屬之技術領域】 本發明乃有關電子電路、電子裝置、電子裝置之驅動 方法、光電裝置及電子機器者。 【先前技術】 近年以來，做爲光電裝置之顯示裝置乃囑目於使用有 機電激發光元件的光電裝置。使用此種之有機電激發光元 件之光電裝置中，做爲驅動方式之一，爲主動矩陣驅動方 式。 於主動矩陣驅動方式之光電裝置中，爲控制有機電激 發光元件之亮度，對於各有機電激發光元件，設置各畫素 電路。各畫素電路之有機電激發光元件之亮度色階之控制 乃對應於亮度色陌，經由將資料信號（電壓値或電流値）供 予畫素電路之保持電容加以進行。即，於保持電容中，充 電對應於設定之發光亮度色階的電荷。 然後，對應於保持於保持電容之電荷量，設定驅動用 TFT(薄膜電晶體）之導通狀態，對應於前述導通狀態則供 予有機EL元件（例如參照專利文獻1) 【專利文獻1】國際公開第WO98/3 6406號 【發明內容】 [爲解決發明之課題] 然而，畫素電路乃至少由1個之電晶體等之主動元件 -5- 1293748 (2) 所構成，但將所有主動元件之特性嚴密地加以均化是困難 的。尤其，構成顯示器等之畫素電路的薄膜電晶體（TFT) 爲特性之參差爲大。由此，於輸入特定之資料信號時，要 獲得期望之亮度爲困難的。 又，經由構成畫素電路之主動元件或光電元件之歷時 劣化，特性會有變化之問題。 本發明乃爲解決上述問題點，其目的乃在於可提供高 精度下，檢出電子電路之動作特性之電子電路、電子裝 置、電子裝置之驅動方法、光電裝置及電子機器者。 [爲解決課題之手段] 本發明之第1之電子裝置，屬於具備複數之單位電路 的電子裝置，其特徵係前述各複數之單位電路係包含 第1之電晶體、和將藉由前述第1之電晶體供給之電 氣信號，做爲電性量加以保持之保持元件、和根據保持於 前述保持元件之電性量，導通狀態被控制之第2之電晶 體、和供給相對於前述導通狀態之電流量的被驅動元件、 和與前述第2之電晶體直列連接之第3之電晶體；藉由前 述第3之電晶體，可連接於爲檢出電流量之檢查部。 根據此時，經由將第3之電晶體開啓，相對於欲供予 被驅動元件之第2之電晶體之電荷量的電流量，則藉由相 同第3之電晶體而得。因此，可檢出電子電路之動作特 性。然而，前述第3之電晶體乃可設於各單位電路內亦 可，對於前述複數之單位電路中之數個之單位電路’共通 -6 - 1293748 (3) 加以設置亦可。 本發明之第2之電子裝置，屬於具備複數之單位電路 的電子裝置，其特徵係前述各複數之單位電路係包含 第1之電晶體、和將藉由前述第1之電晶體供給之電 氣信號，做爲電性量加以保持之保持元件、和根據保持於 前述保持元件之電性量，導通狀態被控制之第2之電晶 體、和供給相對於前述導通狀態之電流量的被驅動元件； 前述第2之電晶體係直列連接於第1之電晶體；藉由前述 第1之電晶體，可連接於爲檢出電流量之檢查部。 做爲此第2之電子裝置所對應之實施形態，例如可列 舉做爲後述之第4之實施形態之電氣信號，供給電流信號 之電路構成的電子裝置。 於上述電子裝置中，於前述被驅動元件和前述第2之 電晶體間，連接第4之電晶體。 根據此時，令第4之電晶體成爲關閉狀態，於停止對 前述被驅動元件之電流供給的狀態，經由令前述第3之電 晶體或前述第1之電晶體成爲開啓狀態，藉由第3之電晶 體或前述第1之電晶體加以檢出。即，進行檢出前述檢查 部之期間，前述第4之電晶體乃至少爲關閉狀態爲佳。 於上述電子裝置，前述被驅動元件爲例如有機電激發 光元件等之電流驅動元件亦可。有機電激發光元件乃發光 層以有機材料所構成。 於上述電子裝置中，前述第3之電晶體乃設於各前述 複數之單位電路者爲佳。由此，可檢出前述複數之單位電 (4) 1293748 路之各電流特性之檢出。 於上述電子裝置中，前述保持元件乃例如將供予前述 複數之各單位電路的電氣信號，做爲電荷量加以保持的容 量元件即可。 於上述電子裝置，前述保持元件爲SRAM等之記憶元 件亦可。 於上述電子裝置中，具備記憶對於藉由前述檢查部所 求得之前述第1之電晶體所供給之電氣信號的補正値的記 憶電路。 根據此時，可使用記憶於記憶電路的補正値，補正電 子裝置之動作特性，調整被驅動元件之動作。 本發明之電子裝置之驅動方法，屬於具備第1之電晶 體、和將藉由前述第1之電晶體供給之電氣信號，做爲電 性量加以保持之保持元件、和根據保持於前述保持元件之 電性量，設定導通狀態之第2之電晶體、和供給相對於前 述導通狀態之電流量的被驅動元件，和與前述第2之電晶 體直列連接之第3之電晶體的電子裝置之驅動方法，其特 徵係具備使前述第1之電晶體開啓，根據前述電氣信號， 將電氣量保持於前述保持元件之第1之步驟，和使前述第 3之電晶體爲開啓狀態，將前述第2之電晶體和爲檢出電 流量之檢查部，藉由前述第3之電晶體電氣性連接，檢出 通過包含前述第2之電晶體及前述第3之電晶體的電流路 徑之電流之電流量的第2之步驟。 根據此時，檢查部乃欲供予被驅動元件之電流量，以 1293748 (5) 前述檢查部加以檢出。 於上述電子裝置之驅動方法，其中，前述電流路 不包含被驅動元件爲佳。 於上述電子裝置之驅動方法，其中，前述被驅動 爲有機EL兀件等之電流驅動元件亦可。 本發明之第1之光電裝置，屬於具備對應於複數 瞄線和複數之資料線的交叉部所配置之複數之畫素電 光電裝置，其特徵係前述各複數之畫素電路係包含經 由前述複數之掃瞄線所對應之掃瞄線所供給之掃瞄信 控制導通之第1之電晶體、和將藉由前述複數之資料 對應之資料線及前述第1之電晶體所供給資料線，做 性量加以保持之保持元件、和根據保持於前述保持元 電性量’導通狀態被控制之第2之電晶體、和供給相 前述導通狀態之電流量的光電元件、和與前述第2之 體直列連接之第3之電晶體；前述各複數之畫素電路 由則述第3之電晶體，可連接於爲檢出電流量之檢查· 於上述光電裝置中，前述第3之電晶體乃設於前 複數之畫素電路爲佳，於前述複數之畫素電路之任一 素電路，共通加以設置爲佳。 於上述光電裝置中，前述第3之電晶體乃可藉由 複數之電晶體所對應之資料線，連接於前述檢查部亦 根據此時，即使不設置檢查用配線，可將資料線做爲 用配線加以利用。 本發明之第2之光電裝置，屬於具備對應於複數 徑乃 元件 之掃 路的 由藉 號， 線所 爲電 件之 對於 電晶 係藉 部。 述各 之畫 前述 可 ° 檢查 之掃 -9- (6) 1293748 猫線和複數之資料線的交叉部所配置之複數之畫素電路的 光電裝置’其特徵係前述各複數之畫素電路係包含經由藉 由前述複數之掃瞄線所對應之掃瞄線所供給之掃瞄信號， 控制導通之第1之電晶體、和將藉由前述複數之資料線所 對應之資料線及前述第i之電晶體所供給資料線，做爲電 性量加以保持之保持元件、和根據保持於前述保持元件之 電性量，控制導通狀態，與前述第1之電晶體直列連接之 第2之電晶體、和供給相對於前述導通狀態之電流量的光 電元件；前述各複數之畫素電路係藉由前述第1之電晶 體，可連接於爲檢出電流量之檢查部。 上述光電裝置中，前述檢查部係包含檢出前述電流量 之電流檢出電路、和根據前述電流檢出電路所檢出之電流 量’求得對於前述電氣信號之補正値之補正値算出電路、 和記憶對於前述畫素電路之前述補正値的記憶電路； 將前述電氣信號以前述補正値補正者。 根據此時，經由補正値算出電路，求得爲調整畫素電 路之動作特性之參差之補正値，將對於該畫素電路之前述 補正値，記憶於記憶電路之電路。因此，使用記憶於記憶 電路的電子電路之補正値，令畫素電路補正動作特性，調 整被驅動元件之動作。 本發明之電子機器，係安裝上述之光電裝置。 【實施方式】 [發明之實施形態] -10- 1293748 (7) 以下，將具體化本發明之第1實施形態，根據圖1〜 圖5加以說明。 圖1乃顯示做爲光電裝置之有機電激發光顯示器10 之電路構成的方塊電路圖。圖2乃顯示顯示面板部和資料 線驅動電路之內部電路構成的方塊電路圖。圖3乃顯示畫 素電路之內部電路構成之電路圖。 圖1中，有機電激發光顯示器1 〇乃具備顯示面板部 1 1、資料線驅動電路1 2、掃瞄線驅動電路1 3、記憶體 1 4、振盪電路1 5、選擇電路1 6及控制電路1 7。 有機電激發光顯示器1 〇之各要素1 1〜1 7係各別經由 獨立之電子零件加以構成亦可。例如各要素1 2〜1 7經由1 晶片之半導體積體電路裝置加以構成亦可。又，做爲各要 素11〜17之全部或一部分成爲一體的電子零件加以構成亦 可。例如，於顯示面板部1 1，一體形成資料線驅動電路 1 2和掃瞄線驅動電路1 3亦可。各構成要件1 2〜1 6之全部 或一部分則以可程式1C晶片加以構成，該機能經由寫入 1C晶片的程式，在軟體上加以實現亦可。 顯示面板部1 1乃如圖2所示，具有排列成矩陣之複 數之畫素電路20。即，各畫素電路20乃於沿該列方向延 伸之複數之資料線XI〜Xm(m係整數），和沿該行方向延伸 之複數之掃瞄線Y1〜Yn(n係整數）間，經由各別連接，各 畫素電路20乃排列成爲矩陣狀。於各畫素電路20，做爲 被驅動元件之發光層，具有以有機材料構成之有機EL元 件2 1。然而，形成於畫素電路20內之後述之電晶體乃可 -11 - 1293748 (8) 爲矽基台之電晶體，但本實施形態中’以薄膜電晶體（TFT) 加以構成。 資料線驅動電路1 2乃對於前述各資料線X 1〜Xm ’各 設置資料電壓生成電路12a。各資料電壓生成電路12a乃 各藉由對應之資料線x 1〜Xm ’於畫素電路2 0，供給電氣 信號，即於本實施形態中，供給資料信號（資料電壓 Vdata)。畫素電路20乃對應於此資料電壓Vdata，設定同 畫素電路20之內部狀態時，對應於此，控制流入有機EL 元件2 1之電流値，控制同有機EL元件2 1之亮度。 掃瞄線驅動電路1 3係選擇驅動前述複數之掃瞄線Yn 中之一條，選擇1行分之畫素電路群。掃瞄線Υ1〜Υη乃 各由第1副掃瞄線Va和第2副掃瞄線Vb構成。掃瞄線 驅動電路1 3乃於第1副掃瞄線Va，輸出第1選擇信號 SL1，於第2副掃瞄線Vb輸出第2選擇信號SL2。記憶 體14記憶由電腦1 8加以供給之顯示資料。又，記憶體 1 4乃記憶由構成補正値算出電路之檢查裝置1 9供給之測 試用顯示資料。振盪電路1 5乃將基準動作信號，進行有 機電激發光顯示器1 0之其他之構成要素之供給。 選擇電路1 6乃設於顯示面板部1 1和資料線驅動電路 1 2間。選擇電路1 6乃於各資料線X丨〜Xm，具備切換電路 1 6a。各切換電路〗6a係如圖3所示，由第i閘極電晶體 Q1和第2閘極電晶體q 2加以構成。然後，各選擇電路 16之第1閘極電晶體qi乃各連接對應之資料線 X 1〜Xm，和對應之資料線驅動器3 0。各選擇電路1 ό之第 -12- 1293748 (9) 2閘極電晶體Q2乃各連接對應之資料線X丨〜Xm，和各設 於設在做爲檢查部之檢查裝置1 9對應之資料線χ〗〜Xm的 電流檢出電路19a。第1及第2閘極電晶體qi、Q2乃根 據由控制電路1 7之第1及第2閘極信號G1、G2，各別進 行開啓·關閉控制。 控制電路1 7乃統籌控制前述各要素丨丨〜丨6。控制電 路1 7乃將由記憶於顯示顯示面板部1 1之顯示狀態之前述 I己憶體1 4之電腦1 8的顯不資料（畫像資料），變換爲顯示 各有機EL元件2 1之發光亮度的矩陣資料。矩陣資料乃 包含爲順序選擇1行分之畫素電路群之掃瞄線信號，和決 定設定被選擇之畫素電路群之有機EL元件21之亮度的 資料電壓V data之位準的資料線驅動信號。然後，掃瞄線 驅動信號乃供予掃瞄線驅動電路1 3。又，資料線驅動信 號乃供予資料線驅動電路1 2。 又，控制電路1 7乃有機電激發光顯示器丨〇使用檢查 裝置1 9，進行對於顯示面板部1 1之各畫素電路2 0之檢 查時，成爲測試模式。成爲測試模式時，控制電路1 7係 將由記憶於前述記憶體1 4之檢查裝置1 9的測試用顯示資 料（畫像資料）’變換成顯示各有機EL元件2 1之發光亮度 的矩陣資料（測試用矩陣資料）。 此測試用矩陣資料乃包含爲順序選擇1行分之畫素電 路群之測試用之掃瞄線驅動信號，和決定設定被選擇畫素 電路群之有機EL元件2 1之測試用亮度的測試用之資料 電壓Vdata之位準的測試用之資料線驅動信號。又，測試 -13- 1293748 (10) 用之資料線驅動信號係供予資料線驅動電路1 2。又，於 測試模式，將控制信號G 1、G2供予前述選擇電路丨6。然 而’於非測試模式之通常模式時，控制電路1 7乃僅輸出 第1閘極信號G1，維持令第1閘極電晶體Q 1開啓，令第 2閘極電晶體Q2成爲關閉。 接著，對於畫素電路2 0之內部電路構成，根據圖3 加以說明。在說明的方便上，配置於第m之資料線xm和 第η之掃瞄線Yn之交點，對於連接於兩資料線Xm和掃 瞄線Yn間的畫素電路20，加以說明。 畫素電路20乃本實施形態爲電壓驅動型之畫素電 路，具備做爲被驅動元件之有機EL元件2 1。具備做爲第 2之電晶體之驅動用電晶體Q 1 1，和做爲第1之電晶體之 開關用電晶體Q 1 2、做爲第4之電晶體之發光控制用電晶 體Q 1 3、做爲第3之電晶體之檢出用電晶體Q 14，做爲保 持元件之保持電容器C 1。 開關用電晶體Q 1 2及發光控制用電晶體Q 1 3乃經由 Ν通道TFT所構成。驅動用電晶體Ql 1及檢出用電晶體 Q14乃經由P通道TFT所構成。 驅動用電晶體Q U乃汲極藉由發光控制用電晶體 Q13，連接於前述有機EL元件21之陽極，源極連接於電 源線L 1。於驅動用電晶體Q 1 1之閘極和電源線L 1間，連 接保持電容器C 1。又，驅動用電晶體Q 1 1之閘極乃藉由 開關用電晶體Q 1 2，連接於前述資料線Xm。更且，驅動 用電晶體Q11之汲極乃藉由前述檢出用電晶體Q14，連2 -14- 1293748 (11) 接於前述資料線Xm。 開關用電晶體Q 1 2之閘極乃連接第1副掃瞄線V a。 檢出用電晶體Q 14之源極乃連接於前述第1副掃瞄線 Va。又，發光控制用電晶體Q13及檢出用電晶體Q14之 閘極，乃皆連接於第2副掃瞄線Vb。 接著，將如上述構成之有機電激發光顯示器1 〇之作 用，根據畫素電路20之動作加以競明。 (通常模式） 又，根據將通常模式示於圖4之各信號SL1、S2、 Gl、G2之時間圖，加以說明。 現在，選擇第η之掃瞄線Yn，連接於掃瞄線Yn之各 畫素電路2 0進入發光動作時》由掃猫線驅動電路1 3 ’耒昔 由掃瞄線Yn之第1副掃瞄線Va，輸出開關用電晶體Q 1 2 成爲開啓狀態之第1閘極信號G1，開關用電晶體Q 1 2則 成爲開啓狀態。與此同時，由控制電路1 7，於選擇電路 1 6之各切換電路1 6a，輸出令第1閘極電晶體Q 1成爲開 啓狀態的第1閘極信號G1。第1閘極電晶體Q 1則成爲開 啓狀態。此時，根據開關用電晶體Q12及第1閘極電晶 體Q1之開啓，由各資料電壓生成電路12a向對應之各畫 素電路20之保持電容器C1，各別供給資料電壓Vdata。 經過時間11之後，供給令開關用電晶體Q1 2及第1閘極 電晶體Q1成爲關閉狀態之第1選擇信號S L 1及第1閘極 信號G1，終止資料寫入期間。 -15- 1293748 (12) 藉由令資料電壓Vdata成爲開啓狀態之開關用電晶體 Q12 ’供予畫素電路20之期間，檢出用電晶體q丨4及發 光控制用電晶體Q 1 3乃各別成爲開啓狀態。 時間11之中途或經過時間11後，開始對於驅動用電 晶體Q 1 1之導通狀態電流之有機EL元件的供給。 接著，令發光控制用電晶體Q1 3成爲關閉狀態，停 止對於電流之有機EL元件之供給，等待之後之資料寫入 期間之開始。 然而，將資料電壓Vdata藉由開關用電晶體Q12供予 畫素電路20之期間，檢出用電晶體Q 1 4爲開啓狀態或關 閉狀態之任一者皆可。 但是，藉由在於開啓狀態之檢出用電晶體Q 1 4，流入 畫素電路2 0和資料線Xm間之微小電流會給予資料電壓 V d at a產生攝動的可能性之故，如本實施形態，將資料電 壓Vdata藉由開關用電晶體Q12供予畫素電路20之期 間，檢出用電晶體Q 1 4乃成爲關閉狀態爲佳。 更且，於通常模式之全部期間， 使檢出用電晶體Q 1 4成爲關閉狀態亦無妨。 於本實施形態中，發光控制用電晶體Q 1 3和檢出用 電晶體Q1 4則成爲相互互補動作之電路構成，當然，可 各別加以獨立控制。 經由重複此動慟，在於各掃瞄線Y 1〜Yn上之各畫素 電路20之有機EL元件21乃對應於資料電壓Vdata之亮 度，各別發光控制，有機電激發光顯示器1 〇乃根據由電 -16- 1293748 (13) 腦1 8之顯示資料，顯示畫像。 (測試模式） 接著，對於驅動方法之一形態之測試模式，進行說 明。有機電激發光顯示器1 〇乃經由連接於檢查裝置1 9， 而成爲測試模式。由檢查裝置19向有機電激發光顯示器 1 0輸出測試用顯示資料時，控制電路〗7乃成爲測試模 式，將測試用顯示資料變換爲顯示有機EL元件2 1之發 光之亮度色階的矩陣資料（測試用矩陣資料）。然後，控制 電路1 7乃將測試用之掃瞄線驅動信號及測試用之資料驅 動信號，輸出至掃瞄線驅動電路1 3及資料線驅動電路 12 ° 圖5乃顯示測試模式之各信號s L 1、S L 2、G 1、G 2之 時間圖。現在，例如由掃瞄線驅動電路 1 3向掃瞄線 Υη 之第1副掃瞄線Va，輸出令開關用電晶體Q 1 2成爲開啓 狀態之第1選擇信號S L 1。與此同時，於由控制電路1 7 之選擇電路1 6之各切換電路1 6a，輸出令第1閘極電晶 體Q 1成爲開啓狀態之第1閘極信號G1，各切換電路1 6a 之第1閘極電晶體Q 1則成爲開啓狀態。 由此，藉由在於開啓狀態之開關用電晶體Q 1 2及第1 閘極電晶體Q1，自資料電壓生成電路12a向保持電容器 C1，供給資料電壓Vdata。另一方面，供給測試用資料電 壓Vdata之期間，乃供給令檢出用電晶體Q14成爲關閉狀 態之第2選擇信號SL2，使檢出用電晶體Q 1 4成爲關閉狀 -17- 1293748 (14) 態。 經過時間11後，供給開關用電晶體Q 12及第1閘極 電晶體Q 1成爲關閉狀態之第1選擇信號S L1及第1閘極 信號G 1，終止畫素電路2 0化寫入期間。此時，將檢出用 電晶體Q 1 4及發光控制用電晶體Q 1 3，供給各成開啓狀態 及關閉狀態之第2選擇信號SL2。 接著，由控制電路1 7向選擇電路1 6之各切換電路 1 6a供給令第2閘極電晶體Q2成爲開啓狀態之第2閘極 信號G2，使第2閘極電晶體Q2成爲開啓狀態。於畫素電 路20中，根據此第2閘極電晶體Q2之開啓，流有相對 於根據驅動用電晶體 Q 1 1之動作的測試用之資料電壓 Vdata的電流値的驅動電流。此時，由驅動用電晶體Q11 之驅動電流乃藉由檢出用電晶體Q 1 4及第2閘極電晶體 Q2，各別輸出至在於檢查裝置1 9之掃瞄線Yn上之對於 各畫素電路20設置之各電流檢出電路19a。 然後，將此動作順序對於各掃瞄線Y 1〜Yn之各畫素 電路2 0加以進行，向對於各掃瞄線Y 1〜Yn之各畫素電路 20設置之各電流檢出電路19a，各別輸出。 於檢查裝置19中，對於各掃瞄線Y1〜Yn之各畫素電 路20所設之電流檢出電路19a，數位變換輸入之輸出電 流，將輸出電流値做爲檢出電泡値，各別加以求得。然 後，檢查裝置1 9乃將以各電流檢出電路1 9a所求得之畫 素電路20之檢出電流値，各與對於測試用之資料電壓 V d at a設定之電流値加以比較。然後，檢查裝置1 9乃暫 -18- 1293748 (15) 時記億該比較結果。然而，設定電流量乃於測試用之資料 電壓Vdata，爲自畫素電路20規格上非輸出不可之電流 値，爲預先試驗或邏輯上所得之値。 暫時記憶此此較結果，新使用不同値之測試用資料電 壓Vdata，將同樣之測試，對於有機電激發光顯示器10 加以進行。然後，檢查裝置1 9乃與前述同樣地，將1各 電流檢出電路1 9a所求得之畫素電路20之檢出電流値， 各與對於測試用之資料電壓Vdata的設定電流値比較，記 憶該比較結果。 檢查裝置1 9乃根據對於2種之不同測試用資料電壓 Vdata的比較結果，檢查對於各畫素電路20之資料電壓 Vdata之驅動用電晶體Ql 1之輸出電流特性。然後，檢查 裝置19乃各畫素電路20之特性成爲目標（規格）之特性 地’於每畫素電路20求得補正値。即，將對於設定亮度 之資料電壓Vdata之補正値AVd，求於每畫素電路20。 檢查裝置1 9乃將求得此求得之各畫素電路2 0之補正 値AVd，輸出至有機電激發光顯示器10。於各畫素電路 20求得之補正値AVd乃記憶於內藏於控制電路1 7之非揮 發性記憶等所成記憶體1 7a，終止測試模式。然而，於本 實施形態中，雖記憶於記憶體1 7 a，形成設定補正値之保 險，根據檢查裝置1 9之檢查結果，切斷該保險亦可。 然後，控制電路17係將自電腦18之顯示資料（畫像 資料）’於變換成顯示各有機E L元件2 1之發光之色階的 矩陣資料時，使用補正値AVd。詳細說明時，控制電路 -19- 1293748 (16) 1 7乃將設定根據顯示資料求得之各畫素電路2 0之有機 兀件21之売度的資料電壓Vdata，以各別對應之補正 値AVd，將補正之値成爲新的資料電壓vdata。控制電路 17乃將該各畫素電路20之新的資料電壓vdata，做爲資 料線驅動信號，輸出至資料線驅動電路i 2。 因此，可檢出製造參差所產生之各畫素電路（各電晶 體；尤其驅動用電晶體Q 1 1)之動作特性之參差。而且， 可將補正各畫素電路2 0之動作特性之參差對於各畫素電 路20之有機EL元件21之資料電壓Vd at a的亮度成爲一 定。 又，檢查裝置19乃在檢出電流値不在基準範圍內 時，畫素電路2 0判定爲不能動作時，做爲製品進行可出 貨與否之判斷材料。 接著’將如上所述構成之有機電激發光顯示器1 〇之 特徵記載於以下。 (1) 本實施形態中，於畫素電路20設置開關用電晶體 Q13及檢出用電晶體Q14。然後，於測試模式，藉由檢出 用電晶體Q 1 4，將由驅動用電晶體Q 1 1之對於測試用之資 料電壓Vdata的電流値之驅動電流，可供予檢查裝置1 9 之電流檢出電路1 9 a。 因此’可簡單檢出製造參差所造成畫素電路20之動 作特性。結果，可於出貨前檢查有機電激發光顯示器1 〇 之不良品。 (2) 本實施形態中，於內藏於17.之記憶體17a，檢查 -20- 1293748 (17) 裝置1 9記憶畫素電路20各別求得，根據製造之參差，補 正動作特性之誤差的補正値，即記憶對於設定亮度之資料 電壓Vdata之補正値△ Vd。然後，控制電路17係將設定 根據顯示資料所求得之各畫素電路20之有機EL元件21 之亮度的資料電壓Vdata，以各個對應之補正値△ Vd加以 補正。 — 因此，各畫素電路20乃可將根據顯示資料，對於資 料電壓Vdata —樣之電流値之驅動電流，供予有機EL元 春 件2 1，可將同樣有機電激發光元件，以同樣之亮度加以 發光。而且，可將各畫素電路20以補正値△ Vd可補正製 造參差所成之動作特性之故，爲改善以往將不良品而廢棄 之有機電激發光顯示器做爲製品，而提升有機電激發光顯 示器之製造良率。 (3 )本實施形態中，將爲檢出之驅動電流，利用已有 之資料線X 1〜Xm，供給至電流檢出電路1 9a。因此，可抑 制爲電流檢出之電路規模的增大。 · 然而，於本實施形態中’雖直列連接前述驅動用電晶 體（第2之電晶體）Ql 1和檢出用電晶體（第3之電晶）Q 14 ’ . 於驅動用電晶體Q 1 1和檢出用電晶體Q 1 4之間，插入其 他之元件亦可。此時，對於驅動用電晶體Q 1 1而言，檢 出用電晶體Q 1 4爲直列連接。 (第2實施形態） 接著，對於第2實施形態加以說明。於前述第1實施 -21 - 1293748 (18) 形態時，檢查裝置1 9爲外部裝置時，於本實施形態中， 做爲與前述第1實施形態之有機電激發光顯示器1 〇之各 要素11〜17之同樣要素，構成檢查裝置19。因此，檢查 裝置19乃伴隨有機電激發光顯示器1〇的同時，內藏於安 裝同有機電激發光顯示器10之攜帶型電話、PDA、筆記 型電腦等之攜帶電子機器內。 然而，由於僅於內藏於攜帶電子機器內之部分有特徵 之故，爲說明之方便，與第1之實施例相同之部分則省 略，對於該特徵部分加以說明。 圖6乃顯示本實施形態之檢查裝置1 9之電氣電路。 於圖6，電流檢出電路部 3 1乃由對應於資料線 XI〜Xm之數的電流檢出電路31a所構成。各電流檢出電 路3 1 a乃藉由切換電路1 6 a，各類比檢出對於由資料線 X 1〜Xm供給之驅動用電晶體Q 1 1之測試用之資料電壓 V data的驅動電流。然而，測試用之顯示資料乃預先記憶 於控制電路1 7之記憶體1 7a。 各電流檢出電路3 1 a乃連接於AD變換電路部3 2所 對應之AD變換器32a。各AD變換器32a乃將由資料線 X 1〜Xm供給之驅動電流之電流値，變換成數位値，輸出 至控制電路1 7。 控制電路1 7乃各比較由各AD變換器3 2a之資料線 X 1〜Xm供給之驅動電流之電流値和對於測試用之資料電 壓Vdata之設定電流値。然後，控制電路17，乃暫時記 憶該比較結果。即，本實施形態中，於控制電路1 7中， -22- 1293748 (19) 與前述第1實施形態之檢查裝置l 9同樣地進行檢查處 理。然而，於本實施形態時，於連接於一個掃瞄線上之各 畫素電路20，進行檢查之後，進行下個掃瞄線上之各畫 素電路的檢查。 暫時記憶此比較結果之後，使用新的不同値之測試用 之資料電壓Vdata，將同樣之測試對於有機電激發光顯示 器1 〇加以進行。然後，控制電路1 7乃與前述同樣，將自 各AD變換器32a之資料線XI〜Xm供給之驅動電流之電 流値，各與測試用之資料電壓Vdata之設定電流値加以比 較，記憶該比較結果。 控制電路1 7乃根據對於種不同之測試用之資料電壓 Vdata之比較結果，檢查對於各畫素電路20之資料電壓 Vdata之驅動用電晶體Ql 1之輸出電流特性。然後，控制 電路17乃爲使各畫素電路20之特性成爲目標（規格）之特 性地，於每畫素電路2 0求得補正値。即，將對於設定亮 度之資料電壓Vdata之補正値△ Vd，於每畫素電路20加 以求取。控制電路1 7乃將所求得之補正値△ Vd，記憶於 做爲記憶電路之記憶體1 7a，終止測試模式。然而，控制 電路1 7乃定期進行測試，或於電源投入之後馬上執行。 控制電路1 7乃使用此補正値△ Vd，與前述第1實施形態 同樣地，根據顯示資料驅動控制。 接著，將如上所述構成之有機電激發光顯示器1 〇之 特徵記載於以下。 (1)本實施形態中，於畫素電路20設置開關用電晶體 -23- 1293748 (20) Q 1 3及檢出用電晶體Q 1 4。然後，於測試模式，藉由檢出 用電晶體Q 1 4，將由驅動用電晶體q丨丨之對於測試用之資 料電壓Vdata的電流値之驅動電流，供予控制電路1 7。 然後，於控制電路1 7，檢出各畫素電路20之動作特 性。因此，可不使用大費周章之檢查裝置，可簡單檢出製 造參差所造成畫素電路2 0之動作特性。而且，於控制電 路1 7中，定期地或於電源投入之後等，執行測試模式 時，可檢出經年性之變化、環境溫度之變化所造成之各畫 素電路20之動作特性。 (2)本實施形態中，於內藏於17.之記憶體17a，控制 電路1 7則記憶於各畫素電路20所求得補正根據製造上之 參差、經年性之變化、環境溫度之變化所造成之動作特性 之誤差的補正値，即記憶對於設定亮度之資料電壓Vdata 之補正値△ Vd。然後，控制電路1 7係將設定根據顯示資 料所求得之各畫素電路20之有機EL元件21之亮度的資 料電壓Vdata，以各個對應之補正値△ Vd加以補正。 因此，各畫素電路20乃即使經年性變化、環境溫度 有所變化，對於根據顯示資料之資料電壓Vdata而言，可 將一樣之電流値之驅動電流供予有機EL元件2 1，可將同 樣有機電激發光元件，以同樣之売度加以發光。 (3 )本實施形態中，將爲檢出之驅動電流，利用已有 之資料線XI〜Xm，供給至電流檢出電路19a。因此，可抑 制爲電流檢出之電路規模的增大。 -24- 1293748 (21) (第3實施形態） 接著，對於做爲於第1及第2實施形態所說明之光電 裝置的有機電激發光顯示器1 〇之電子機器的適用性，根 據圖7及圖8加以說明。有機電激發光顯示器1 〇乃可適 用於可攜型之個人電腦、攜帶型電話、；數位攝影機等種 種之電子機器。 圖7乃顯示可攜型之個人電腦之構成的斜視圖。圖7 中，個人電腦5 0乃備有具備鍵盤5 1之本體部5 2，和使 用前述有機電激發光顯示器1 〇之顯示單元5 3。於此時， 使用有機電激發光顯示器1〇之顯示單元53乃可發揮與前 述實施形態同樣之效果。結果，個人電腦5 0可實現缺陷 少的畫像顯示。 圖8乃顯不攜帶型電話之構成的斜視圖。於圖8，攜 帶電話60乃具備複數之操作按鈕61、受話口 62、送話口 63、使用前述有機電激發光顯示器1〇之顯示單元64。此 時，使用有機電激發光顯示器10之顯示單元64乃可發揮 與前述實施形態同樣之效果。結果，攜帶電話60可實現 缺陷少的畫像顯示。 (第4實施形態） 於本實施形態中’對於兼顧開關用電晶體和桃出用電 晶體的實施形態，對於圖9所示之畫素電路加以說明。 於圖9中’各畫素電路20乃具有做爲第2之電晶體 之驅動用電晶體Q20、第1Q21及第2開關用電晶體 -25- 1293748 (22) Q 2 2、發光控制用電晶體Q 2 3及做爲保持元件之保 器C1。驅動用電晶體Q20乃經由P型通道TFT ‘成。第1及第2開關用電晶體Q21、Q22及發光控 晶體Q23乃經由N通道TFT加以構成。 驅動用電晶體 Q20乃汲極藉由發光控制用/ Q23，連接於前述有機EL元件21之陽極，源極則 電源線L 1。於電源線V L中，供給爲驅動前述有機 件21之驅動電壓Vdd。於前述驅動用電晶體Q20 線VL間，連接保持電容器C 1。 又，驅動用電晶體Q20之閘極乃連接於前述身 道用電晶體Q21之汲極。第1通道用電晶體Q21 乃與第2開關用電晶體Q22之汲極連接。又，第 用電晶體Q22之汲極乃與前述驅動用電晶體Q2〇 連接。 更且’第2開關用電晶體Q22之源極乃藉由 Xm ’連接於資料線驅動電路丨2之單一線驅動電路 單一線驅動電路30乃設置資料電流生成電路40a 電流生成電路4〇a乃對於畫素電路20輸出資料信號 後，資料線Xm乃藉由第1開關q〗丨，連接於資料 成電路40a的同時，藉由第2開關Q12，連接於電 電路3 0 b。 於第1及第2開關用電晶體Q21、Q22之閘極 接第1副掃瞄線Va及第2副掃瞄線Vb。由第1副 Va及第2副掃瞄線vb經由第1選擇信號SL1及; 持電容 加以構 芾！J用電 電晶體 連接於 EL元 和電源 ! 1通 之源極 2開關 之汲極 資料線 30。此 。資料 ί I。然 電流生 流檢出 ，各連 掃瞄線 玫 Π -ΒΒ 弟2进 -26- 1293748 (23) 擇信號SL2，第1及第2開關用電晶體Q21、Q22成爲開 啓。更且，經由發光控制用電晶體Q23之閘極經由發光 控制信號Gp加以控制。 第1開關Q1 1、第1開關用電晶體Q21、及第2開關 用電晶體Q223於開啓狀態期間，資料電流生成電路40a 則將資料信號I，藉由資料線Xm輸出時，於畫素電路20 供給資料信號I，於保持電容器C1對應於資料信號I之 電荷量被蓄積，設定驅動電晶體之導通狀態。此爲寫入動 作。 接著，發光控制用電晶體Q23回應將發光控制用電 晶體Q23成爲開啓狀態的發光控制信號Gp，而成爲開啓 狀態時，對應驅動用電晶體Q20之導通狀態之電流量則 供予有機EL元件21。 對此，測試模式中，上述寫入動作基本上雖爲相同， 代替通常之測試資料信號，將對應於測試用之信號之電荷 量，保持於保持電容器。接著，令第1開關用電晶體 Q21、第1之開關Q1 1、及發光控制用電晶體Q23保持爲 關閉狀態，令第2開關用電晶體Q22及第2開關Q12成 爲開啓狀態，將通過驅動用電晶體Q20之電流量，以電 流檢出電路30b加以檢出。 於第4之實施形態中，與第1之實施形態不同，代替 新設置檢出用電晶體，將2個開關電晶體峙一（第2開關 用電晶體Q22)做爲檢出用電晶體加以兼用。 然而，發明之實施形態乃非限定於上述實施形態，如 -27- 1293748 (24) 以下加以實施亦可。 前述第1實施形態中，使用檢查出貨前之有機電激發 光顯示器之檢查裝置1 9，檢查顯示器。將此對於攜帶型 電話、PDA、筆記型電腦等之攜帶型電子機器，令該攜帶 型電子機器之電池，以充電器加以充電時，於該充電中， 將搭載於攜帶型電子機器之有機電激發光顯示器，以檢查 裝置1 9加以檢查亦可。此時，於該充電器需內藏檢查裝 置。然後開始充電時，成爲測試模式，將各畫素電路2 0 進行，電流檢出之檢查。經由如此，對於搭載於攜帶型電 子機器之有機電激發光顯示器，將各畫素電路20之經年 性變化所造成動作特性，於充電時加以修正。 於上述實施形態中，檢查裝置1 9乃雖設置對於顯示 面板部1 1之所有畫素電路20的電流檢出電路19a，第2 實施形態，與資料線X 1〜Xm之數同數地加以實施亦可。 此時，如第2實施形態，於連接於一個之掃瞄線上之各畫 素電路20，進行檢查後，進行下個掃瞄線上之各畫素電 路之檢查。 於前述第1實施形態，將求得檢查裝置1 9之補正値 △ Vd，使用記憶於內藏於控制電路1 7之記憶體1 7a的補 正値△ Vd，作成新的資料電壓Vdata。 於前述實施形態中，做爲電子電路，於畫素電路20 具體化可得適切之效果，於驅動有機EL元件21以外之 例如LED或FED等之發光元件之被驅動元件的電子電路 加以具體化亦可。又，做爲被驅動元件有磁性RAM。因 -28- 1293748 (25) 此，可應於利用該磁性RAM之記憶裝置。 於前述實施形態中，求得補正値△ Vd時 不同測試用之資料電壓 Vdata，進行測試而求 使用1個之測試用之資料電壓Vdata，進行測 3個以上之測試用之資料電壓 Vdata進行測 可。 上述實施形態中，雖將電流藉由資料線 予電流檢出電路，將此於檢出用電晶體Q 1 3 用之配線，藉由此等配線，供予電流檢出電路 亦可。 於上述實施形態中，雖做爲畫素電路之被 對於有機EL元件21加以具體化，但亦可具 電激發光元件。即，亦可應用於由無機電激發 無機電激發光顯示器亦可。 上述實施形態中，畫素電路2 0乃雖具體 動型之畫素電路，應用於電流驅動型之畫素電 激發光顯示器亦可。又，於分時、面積色階等 之畫素電路，應用於有機電激發光顯示器亦可 【圖式簡單說明】 【圖1】顯示本實施形態之有機電激發光 路構成方塊電路圖。 【圖2】顯示顯示面板部和資料線驅動電 路構成的方塊電路圖。 ，使用2個 得。將此， 試，或使用 試而求得亦 XI〜Xm，供 設置檢出專 1加以實施 驅動兀件5 體化於無機 光元件所成 化於電壓驅 路之有機電 之數位驅動 顯示器之電 路之內部電 -29- 1293748 (26) 【圖3】福τκ畫素電路之內部電路構成之電路圖。 【圖4】通常模式之各信號之時間圖。 【圖5】測試模式之各信號之時間圖。 【圖6】爲說明第2實施形態之主要部分電氣方塊 圖。 【圖7】顯示爲說明第3實施形態之可攜型個人電腦 之構成之斜視圖。 【圖8】顯示爲說明第3實施形態之攜帶型電話之構 成之斜視圖。 【圖9】顯示有關第4實施形態之畫素電路構成之電 路圖。 [符號說明] C 1 做爲容量元件之保持電容器 Q 1 1做爲第2電晶體之驅動用電晶體 Q 1 2做爲第1電晶體之開關用電晶體 Q 1 3做爲第4電晶體之發光控制用電晶體 Q 1 4做爲第3電晶體之檢出用電晶體 Υ 1〜Υ η 掃猫線 V a 第1副掃瞄線 Vb 第2副掃瞄線 XI〜Xm 資料線 10 做爲光電裝置之有機電激發光顯示器 11 顯示面板部 -30- 1293748 (27) 17 構成補正値算出電路之控制電路 17a做爲記憶電路之記憶體 19 成補正値算出電路之檢查裝置 19a電流檢出電路 20 做爲電子電路之畫素電路 2 1 做爲被驅動元件之有機EL元件 3 1 a電流檢出電路1293748 (1) Description of the Invention [Technical Field] The present invention relates to an electronic circuit, an electronic device, a driving method of an electronic device, an optoelectronic device, and an electronic device. [Prior Art] In recent years, a display device as an optoelectronic device has been attracting attention to an optoelectronic device using an electromechanical excitation light element. In the photovoltaic device using such an organic electroluminescence element, as one of the driving methods, it is an active matrix driving method. In the photovoltaic device of the active matrix driving method, in order to control the brightness of the organic electroluminescent element, each pixel circuit is provided for each of the organic electroluminescent elements. The control of the luminance gradation of the organic electroluminescence element of each pixel circuit is performed by supplying a data signal (voltage 値 or current 値) to the retention capacitor of the pixel circuit in accordance with the luminance color. That is, in the holding capacitor, the electric charge corresponding to the set illuminance gradation is charged. Then, the conductive state of the driving TFT (thin film transistor) is set in accordance with the amount of charge held in the holding capacitor, and the organic EL element is supplied in accordance with the conductive state (see, for example, Patent Document 1). WO98/3 6406 [Summary of the Invention] [In order to solve the problem of the invention] However, the pixel circuit is composed of at least one active element such as a transistor - 5 - 1293748 (2), but all active elements are It is difficult to rigorously homogenize the characteristics. In particular, a thin film transistor (TFT) constituting a pixel circuit such as a display has a large difference in characteristics. Therefore, it is difficult to obtain a desired brightness when inputting a specific data signal. Further, the characteristics of the active element or the photovoltaic element constituting the pixel circuit deteriorate over time. The present invention has been made to solve the above problems, and an object thereof is to provide an electronic circuit, an electronic device, an electronic device driving method, an optoelectronic device, and an electronic device that can detect an operational characteristic of an electronic circuit with high precision. [Means for Solving the Problem] The electronic device according to the first aspect of the present invention belongs to an electronic device including a plurality of unit circuits, characterized in that each of the plurality of unit circuits includes a first transistor, and the first one is The electric signal supplied by the transistor is a holding element that is held as an electrical quantity, and a second transistor that is controlled in an on state according to an electrical quantity held by the holding element, and a supply is supplied with respect to the conduction state. The driven element of the electric current and the third transistor connected in series with the second transistor are connected to the inspection unit for detecting the amount of current by the third transistor. According to this, the amount of current of the third transistor to be supplied to the driven element is obtained by the same third transistor by turning on the third transistor. Therefore, the operational characteristics of the electronic circuit can be detected. However, the third transistor may be provided in each unit circuit, and may be provided for a plurality of unit circuits 'common -6 - 1293748 (3) of the plurality of unit circuits. An electronic device according to a second aspect of the present invention is an electronic device including a plurality of unit circuits, wherein each of the plurality of unit circuits includes a first transistor and an electrical signal to be supplied by the first transistor. a holding element that is held as an electrical quantity, and a second transistor that is controlled in an on state according to an electrical quantity held by the holding element, and a driven element that supplies a current amount with respect to the on state; The second electro-crystalline system is connected in series to the first transistor; and the first transistor is connected to the inspection unit for detecting the amount of current. In the embodiment corresponding to the second electronic device, for example, an electronic device configured as a circuit for supplying a current signal, which is an electric signal of a fourth embodiment to be described later, may be cited. In the above electronic device, the fourth transistor is connected between the driven element and the second transistor. At this time, the fourth transistor is turned off, and the current supply to the driven element is stopped, and the third transistor or the first transistor is turned on, and the third transistor is turned on. The transistor or the first transistor described above is detected. That is, during the detection of the inspection unit, it is preferable that the fourth transistor is at least in a closed state. In the above electronic device, the driven element may be a current driving element such as an organic electroluminescence element. The organic electroluminescence element is composed of an organic material. In the above electronic device, it is preferable that the third transistor is provided in each of the plurality of unit circuits. Thereby, the detection of the respective current characteristics of the above-mentioned plural unit electric power (4) 1293748 can be detected. In the above electronic device, the holding element may be, for example, a capacitance signal for supplying the plurality of unit circuits of the plurality of units as a capacity element for holding the amount of charge. In the above electronic device, the holding element may be a memory element such as an SRAM. The electronic device includes a memory circuit for storing a correction signal for an electrical signal supplied from the first transistor obtained by the inspection unit. According to this, the correction characteristic stored in the memory circuit can be used to correct the operational characteristics of the electronic device and adjust the operation of the driven element. A driving method of an electronic device according to the present invention is a holding element including a first transistor and an electrical signal supplied from the first transistor, and is held as an electrical quantity, and is held by the holding element The electric quantity, the second transistor in the on state, and the driven element that supplies the current amount in the on state, and the electronic device of the third transistor connected in series with the second transistor The driving method is characterized in that the first transistor is turned on, the electrical quantity is held in the first step of the holding element based on the electrical signal, and the third transistor is turned on. The transistor of 2 and the inspection unit for detecting the amount of current are electrically connected to the third transistor, and the current passing through the current path including the second transistor and the third transistor is detected. The second step of the amount. According to this, the amount of current to be supplied to the driven element by the inspection unit is detected by the inspection unit 1293748 (5). In the above method of driving an electronic device, it is preferable that the current path does not include a driven element. In the above method of driving an electronic device, the current driving element driven by an organic EL element or the like may be used. A photovoltaic device according to a first aspect of the present invention is a pixel electro-optical device comprising a plurality of pixel units arranged at intersections of a plurality of lines of sight and a plurality of data lines, wherein each of the plurality of pixel circuits includes the plurality of pixel circuits The first transistor of the scan signal supplied by the scan line corresponding to the scan line corresponding to the scan line, and the data line corresponding to the data of the plural number and the first crystal are supplied to the data line. a holding element for holding the amount of the element, and a second element of the transistor controlled in the conduction state of the holding element and the amount of current supplied to the conduction state, and the second body The third transistor connected in series; the plurality of pixel circuits described above are connected to the third transistor, and can be connected to the detection of the amount of current detected. In the photoelectric device, the third transistor is provided. Preferably, the pixel circuit of the previous complex number is preferably set in any of the plurality of pixel circuits of the plurality of pixels. In the above photovoltaic device, the third transistor can be connected to the inspection unit by a data line corresponding to a plurality of transistors, and the data line can be used as the inspection line. Wiring is used. According to a second aspect of the present invention, there is provided a photovoltaic device having a plurality of paths corresponding to a plurality of paths, wherein the line is an electric component of the electric component. The above-mentioned various scans can be checked. -9- (6) 1293748 The optoelectronic device of the plurality of pixel circuits arranged at the intersection of the cat line and the plurality of data lines is characterized by the aforementioned plural pixel circuits. And including a first scan transistor connected to the scan line corresponding to the scan line corresponding to the plurality of scan lines, and a data line corresponding to the plurality of data lines and the foregoing i-th a data line supplied from the transistor, a holding element held as an electrical quantity, and a second transistor electrically connected to the first transistor in a controlled state according to an electrical quantity held in the holding element And a photo-electric element that supplies a current amount with respect to the on-state; the plurality of pixel circuits are connected to the inspection unit that detects the amount of current by the first transistor. In the above-described photovoltaic device, the inspection unit includes a current detection circuit that detects the amount of current, and a correction calculation circuit that obtains a correction correction for the electrical signal based on the amount of current detected by the current detection circuit. And a memory circuit for correcting the aforementioned correction of the pixel circuit; and correcting the electrical signal by the correction. At this time, the correction circuit is calculated via the correction ,, and the correction 调整 for adjusting the variation of the operational characteristics of the pixel circuit is obtained, and the correction 对于 for the pixel circuit is stored in the circuit of the memory circuit. Therefore, by using the correction of the electronic circuit stored in the memory circuit, the pixel circuit corrects the operation characteristics and adjusts the operation of the driven element. The electronic device of the present invention is provided with the above-mentioned photovoltaic device. [Embodiment] [Embodiment of the Invention] -10- 1293748 (7) Hereinafter, a first embodiment of the present invention will be described, and will be described with reference to Figs. 1 to 5 . 1 is a block circuit diagram showing the circuit configuration of an organic electroluminescent display 10 as an optoelectronic device. Fig. 2 is a block circuit diagram showing the internal circuit configuration of the display panel portion and the data line driving circuit. Fig. 3 is a circuit diagram showing the internal circuit configuration of the pixel circuit. In FIG. 1, the organic electroluminescent display 1 includes a display panel unit 1 1 , a data line driving circuit 1 2, a scan line driving circuit 13 , a memory 14 , an oscillating circuit 15 , a selection circuit 16 , and a control unit. Circuit 1 7. Each of the elements 1 1 to 1 7 of the organic electroluminescence display 1 may be configured by separate electronic components. For example, each of the elements 1 2 to 1 7 may be configured by a semiconductor integrated circuit device of one wafer. Further, it may be configured as an electronic component in which all or a part of each of the elements 11 to 17 is integrated. For example, the data line driving circuit 12 and the scanning line driving circuit 13 may be integrally formed on the display panel unit 1 1. All or part of each of the constituent elements 1 2 to 16 is constituted by a programmable 1C wafer, and this function can be realized by software writing a 1C wafer. The display panel unit 1 1 has a plurality of pixel circuits 20 arranged in a matrix as shown in Fig. 2 . That is, each of the pixel circuits 20 is between a plurality of data lines XI to Xm (m-integer) extending in the column direction, and a plurality of scanning lines Y1 to Yn (n-number integers) extending in the row direction. The respective pixel circuits 20 are arranged in a matrix shape via respective connections. Each of the pixel circuits 20 serves as a light-emitting layer of the driven element, and has an organic EL element 21 made of an organic material. However, the transistor formed later in the pixel circuit 20 is a transistor of a ruthenium base, but in the present embodiment, it is constituted by a thin film transistor (TFT). The data line drive circuit 12 is provided with a material voltage generating circuit 12a for each of the above-described data lines X 1 to Xm '. Each of the data voltage generating circuits 12a supplies an electric signal to the pixel circuit 20 via the corresponding data lines x 1 to Xm ', that is, in the present embodiment, a material signal (data voltage Vdata) is supplied. When the pixel circuit 20 is set to the internal state of the pixel circuit 20 in response to the data voltage Vdata, the current 値 flowing into the organic EL element 21 is controlled to control the luminance of the organic EL element 21. The scan line drive circuit 13 selects one of the plurality of scan lines Yn to select one of the plurality of pixel circuit groups. The scanning lines Υ1 to Υn are each composed of the first sub scanning line Va and the second sub scanning line Vb. The scan line drive circuit 13 outputs the first selection signal SL1 on the first sub-scanning line Va and the second selection signal SL2 on the second sub-scanning line Vb. The memory 14 memorizes the display material supplied by the computer 18. Further, the memory 14 stores the test display data supplied from the inspection device 19 which constitutes the correction circuit. The oscillation circuit 15 supplies the reference operation signal to other components of the electromechanical excitation light display 10. The selection circuit 16 is provided between the display panel portion 11 and the data line drive circuit 12. The selection circuit 16 is provided with a switching circuit 16a for each of the data lines X丨 to Xm. Each switching circuit 6a is composed of an ith gate transistor Q1 and a second gate transistor q 2 as shown in Fig. 3 . Then, the first gate transistors qi of the respective selection circuits 16 are connected to the corresponding data lines X 1 to Xm and the corresponding data line drivers 30. Each of the selection circuits 1 -12-1293748 (9) 2 The gate transistor Q2 is a data line X丨~Xm corresponding to each connection, and each of the data corresponding to the inspection device 1 9 provided as the inspection unit The current detection circuit 19a of the line 〜 〜 Xm. The first and second gate transistors qi and Q2 are individually turned on and off according to the first and second gate signals G1 and G2 of the control circuit 17. The control circuit 17 is in charge of controlling the aforementioned elements 丨丨 to 丨6. The control circuit 17 converts the display data (image data) of the computer 1 8 stored in the display state of the display panel portion 1 1 to display the luminance of each organic EL element 2 1 . Matrix information. The matrix data includes a scan line signal for sequentially selecting a pixel group of one pixel division, and a data line drive for determining the level of the data voltage V data of the luminance of the organic EL element 21 of the selected pixel circuit group. signal. Then, the scan line drive signal is supplied to the scan line drive circuit 13. Further, the data line drive signal is supplied to the data line drive circuit 12. Further, the control circuit 17 is an organic electroluminescence display 丨〇 using the inspection device 19, and when the inspection of each of the pixel circuits 20 of the display panel unit 1 is performed, it becomes a test mode. In the test mode, the control circuit 17 converts the test display material (image data) of the inspection device 19 stored in the memory 14 into a matrix data indicating the luminance of each organic EL element 2 1 (test) Use matrix data). The test matrix data includes a scan line drive signal for testing a pixel group of one line of pixels in sequence, and a test for determining the brightness of the test for setting the organic EL element 21 of the selected pixel circuit group. The data line driving signal for the test of the data voltage Vdata level. Further, the test -13-1293748 (10) uses the data line drive signal to be supplied to the data line drive circuit 12. Further, in the test mode, the control signals G1, G2 are supplied to the selection circuit 丨6. However, in the normal mode of the non-test mode, the control circuit 17 outputs only the first gate signal G1, and maintains the first gate transistor Q1 on, and turns off the second gate transistor Q2. Next, the internal circuit configuration of the pixel circuit 20 will be described with reference to FIG. 3. For convenience of explanation, the intersection of the mth data line xm and the nth scan line Yn is explained, and the pixel circuit 20 connected between the two data lines Xm and the scanning line Yn will be described. In the present embodiment, the pixel circuit 20 is a voltage-driven pixel circuit, and includes an organic EL element 21 as a driven element. The driving transistor Q 1 1 as the second transistor and the switching transistor Q 1 as the first transistor 2, the light-emitting controlling transistor Q 1 3 as the fourth transistor The detecting transistor Q14 as the third transistor is used as the holding capacitor C1 of the holding element. The switching transistor Q 1 2 and the light-emitting control transistor Q 1 3 are formed via a germanium channel TFT. The driving transistor Q11 and the detecting transistor Q14 are formed by a P-channel TFT. The driving transistor Q U is connected to the anode of the organic EL element 21 via the light-emitting controlling transistor Q13, and the source is connected to the power source line L 1 . A capacitor C 1 is connected between the gate of the driving transistor Q 1 1 and the power supply line L 1 . Further, the gate of the driving transistor Q 1 1 is connected to the data line Xm by the switching transistor Q 1 2 . Further, the drain of the driving transistor Q11 is connected to the above-mentioned data line Xm by the above-mentioned detecting transistor Q14, and 2 - 14 - 1293748 (11). The gate of the switching transistor Q 1 2 is connected to the first sub-scanning line V a . The source of the detection transistor Q 14 is connected to the first sub-scanning line Va. Further, the gates of the light-emitting control transistor Q13 and the detection transistor Q14 are connected to the second sub-scanning line Vb. Next, the organic electroluminescent display 1 constructed as described above is used to compete with the operation of the pixel circuit 20. (Normal Mode) Further, a time chart in which the normal patterns are shown in the respective signals SL1, S2, G1, and G2 of Fig. 4 will be described. Now, the scanning line Yn of the nth is selected, and the pixel circuit 20 connected to the scanning line Yn enters the light-emitting operation". The first sub-scan of the scanning line Yn is controlled by the scanning cat line driving circuit 1 3 ' The line Va is output, the output switching transistor Q 1 2 is turned on, the first gate signal G1 is turned on, and the switching transistor Q 1 2 is turned on. At the same time, the control circuit 17 outputs a first gate signal G1 that causes the first gate transistor Q1 to be turned on in each of the switching circuits 16a of the selection circuit 16. The first gate transistor Q 1 is turned on. At this time, according to the opening of the switching transistor Q12 and the first gate transistor Q1, the material voltage generating circuit 12a supplies the material voltage Vdata to the holding capacitor C1 of each of the corresponding pixel circuits 20, respectively. After the elapse of time 11, the first selection signal S L 1 and the first gate signal G1 in which the switching transistor Q1 2 and the first gate transistor Q1 are turned off are supplied, and the data writing period is terminated. -15- 1293748 (12) During the period in which the switching transistor Q12' in which the data voltage Vdata is turned on is supplied to the pixel circuit 20, the detecting transistor q丨4 and the light-emitting controlling transistor Q1 3 are Each is turned on. After the time 11 or the elapse of time 11, the supply of the organic EL element for driving the on-state current of the transistor Q 1 1 is started. Then, the light-emitting control transistor Q1 3 is turned off, the supply of the organic EL element for current is stopped, and the start of the data writing period after the wait is waited for. However, while the data voltage Vdata is supplied to the pixel circuit 20 by the switching transistor Q12, it is possible to detect either the transistor Q 1 4 is in an on state or a closed state. However, by detecting the transistor Q 1 4 in the on state, a small current flowing between the pixel circuit 20 and the data line Xm gives a possibility that the data voltage V d at a is perturbed, such as this. In the embodiment, it is preferable that the detection transistor Q 1 4 is turned off while the data voltage Vdata is supplied to the pixel circuit 20 by the switching transistor Q12. Further, in the entire period of the normal mode, the detection transistor Q 1 4 may be turned off. In the present embodiment, the light-emitting control transistor Q 1 3 and the detection transistor Q1 4 are configured to complement each other, and of course, they can be independently controlled. By repeating this operation, the organic EL elements 21 of the respective pixel circuits 20 on the respective scanning lines Y 1 to Yn correspond to the brightness of the data voltage Vdata, and the respective light-emitting controls are controlled by the organic electroluminescent display 1 The image is displayed by the display of the data of the brain -16 - 1993748 (13) brain. (Test Mode) Next, a description will be given of a test mode in one of the driving methods. The organic electroluminescent display 1 is connected to the inspection device 1 and becomes a test mode. When the inspection display device 19 outputs the test display material to the organic electroluminescence display 10, the control circuit 7 is in the test mode, and the test display data is converted into a matrix data showing the luminance gradation of the light emitted from the organic EL element 21. (Test matrix data). Then, the control circuit 17 outputs the scan line drive signal for testing and the data drive signal for testing to the scan line drive circuit 13 and the data line drive circuit 12°. FIG. 5 shows the signals of the test mode. Time chart of L 1, SL 2, G 1, G 2 . Now, for example, the scan line drive circuit 1 3 outputs the first selection signal S L 1 for turning on the switching transistor Q 1 2 to the first sub-scanning line Va of the scanning line Υη. At the same time, the first gate signal G1 for turning on the first gate transistor Q1 is turned on by the switching circuit 16a of the selection circuit 16 of the control circuit 17, and the switching circuit 16a is replaced by the first gate signal G1. 1 Gate transistor Q 1 is turned on. As a result, the data voltage Vdata is supplied from the data voltage generating circuit 12a to the holding capacitor C1 by the switching transistor Q1 2 and the first gate transistor Q1 in the on state. On the other hand, during the period in which the test data voltage Vdata is supplied, the second selection signal SL2 for turning off the detection transistor Q14 is supplied, and the detection transistor Q1 4 is turned off. -17-1293748 (14) ) state. After the elapse of time 11, the supply switching transistor Q 12 and the first gate transistor Q 1 are turned off, and the first selection signal S L1 and the first gate signal G 1 are terminated. . At this time, the detection transistor Q 1 4 and the light-emission control transistor Q 1 3 are supplied to the second selection signal SL2 which is turned on and off. Then, the control circuit 17 supplies the second gate signal G2 that turns the second gate transistor Q2 to the on state of each of the switching circuits 16a of the selection circuit 16, and turns on the second gate transistor Q2. In the pixel circuit 20, a drive current of a current 相对 with respect to the data voltage Vdata for testing according to the operation of the driving transistor Q 1 1 flows in accordance with the opening of the second gate transistor Q2. At this time, the driving current from the driving transistor Q11 is output to the scanning line Yn of the inspection device 19 by the detecting transistor Q1 4 and the second gate transistor Q2. Each of the current detecting circuits 19a provided in the pixel circuit 20 is provided. Then, this operation sequence is performed for each of the pixel circuits 20 of the respective scanning lines Y1 to Yn, and the current detecting circuits 19a are provided to the respective pixel circuits 20 for the respective scanning lines Y1 to Yn. Individual output. In the inspection device 19, the current detecting circuit 19a provided in each of the pixel circuits 20 of the respective scanning lines Y1 to Yn digitally converts the input output current, and outputs the current 値 as the detected bubble 値, respectively. Get it. Then, the inspection device 19 compares the detected currents 画 of the pixel circuits 20 obtained by the respective current detecting circuits 19a with the current 设定 set for the data voltage V d at a for testing. Then, the inspection device 1 9 is temporarily -18-1293748 (15). However, the set current amount is the data voltage Vdata for the test, which is a non-output non-current current 规格 of the self-pixel circuit 20 specification, which is a pre-test or logically obtained 値. For this temporary comparison, the new test data voltage Vdata is used, and the same test is performed for the organic electroluminescent display 10. Then, in the same manner as described above, the inspection device 19 compares the detected currents 画 of the pixel circuits 20 obtained by each of the current detecting circuits 19a with the set current 値 for the data voltage Vdata for testing. Memorize the comparison result. The inspection device 19 checks the output current characteristics of the driving transistor Q11 for the data voltage Vdata of each pixel circuit 20 based on the comparison result of the two different test data voltages Vdata. Then, the inspection device 19 determines the characteristics of the respective pixel circuits 20 to be the characteristics of the target (specification) and obtains a correction 每 for each of the pixel circuits 20. That is, the correction 値AVd for the data voltage Vdata of the set luminance is obtained for each pixel circuit 20. The inspection device 19 outputs the corrected 値AVd of each of the obtained pixel circuits 20 to the organic electroluminescent display 10. The correction 値AVd obtained by each pixel circuit 20 is stored in the memory 17a, which is stored in the non-volatile memory of the control circuit 17, and terminates the test mode. However, in the present embodiment, although it is stored in the memory 1 7 a, the risk of setting the correction 形成 is formed, and the insurance may be cut off based on the inspection result of the inspection device 19. Then, the control circuit 17 uses the correction data ΔAVd when converting the display material (image data) from the computer 18 into the matrix data indicating the gradation of the light emission of each of the organic EL elements 2 1 . In the detailed description, the control circuit -19-1293748 (16) 1 7 sets the data voltage Vdata of the temperature of the organic component 21 of each pixel circuit 20 obtained based on the display data, and corrects each corresponding 値AVd, will become the new data voltage vdata. The control circuit 17 outputs the new data voltage vdata of each pixel circuit 20 as a data line drive signal to the data line drive circuit i2. Therefore, it is possible to detect variations in the operational characteristics of the respective pixel circuits (each of the electromorphs; in particular, the driving transistor Q 1 1) generated by the manufacturing variations. Further, the difference in the operational characteristics of the respective pixel circuits 20 can be corrected for the luminance of the data voltage Vd at a of the organic EL elements 21 of the respective pixel circuits 20. Further, when the detection current is not within the reference range, the inspection device 19 determines whether the product is ready for shipment or not when the pixel circuit 20 determines that it is inoperable. Next, the characteristics of the organic electroluminescence display 1 constructed as described above are described below. (1) In the present embodiment, the switching transistor Q13 and the detecting transistor Q14 are provided in the pixel circuit 20. Then, in the test mode, by detecting the transistor Q 1 4, the driving current of the current for the data voltage Vdata for the test by the driving transistor Q 1 1 is supplied to the current detecting device 19 for current detection. Out of the circuit 1 9 a. Therefore, the operational characteristics of the pixel circuit 20 caused by the manufacturing variations can be simply detected. As a result, the defective product of the organic electroluminescent display 1 检查 can be inspected before shipment. (2) In this embodiment, it is contained in 17. The memory 17a, the inspection -20-1293748 (17) The device 1 9 memory pixel circuit 20 is separately determined, and the correction of the error of the correction operation characteristic is corrected according to the manufacturing variation, that is, the data voltage Vdata for the set brightness is memorized. Correction 値 △ Vd. Then, the control circuit 17 corrects the data voltage Vdata of the luminance of the organic EL element 21 of each pixel circuit 20 obtained based on the display data by the corresponding correction 値 Δ Vd . - Therefore, each pixel circuit 20 can supply the driving current of the current 値 of the data voltage Vdata according to the display data to the organic EL element spring element 2, and the same organic electroluminescence element can be used for the same brightness. Glow it. Further, the pixel elements 20 can be corrected by the correction 値 ΔVd to correct the operational characteristics of the manufacturing defects, and the organic electroluminescence display which is discarded by the conventional defective product can be improved as an organic electroluminescence light. The manufacturing yield of the display. (3) In the present embodiment, the detected drive current is supplied to the current detecting circuit 19a using the existing data lines X1 to Xm. Therefore, it is possible to suppress an increase in the scale of the circuit for current detection. In the present embodiment, however, the driving electric crystal (second transistor) Ql 1 and the detecting transistor (third crystal) Q 14 ' are connected in series. It is also possible to insert other elements between the driving transistor Q 1 1 and the detecting transistor Q 1 4 . At this time, for the driving transistor Q 1 1 , the detecting transistor Q 1 4 is connected in series. (Second Embodiment) Next, a second embodiment will be described. In the embodiment of the first embodiment of the invention, the inspection device 19 is an external device, and in the present embodiment, the elements 11 of the organic electroluminescent display 1 of the first embodiment are used. The same elements as ~17 constitute the inspection device 19. Therefore, the inspection device 19 is incorporated in a portable electronic device such as a portable telephone, a PDA, a notebook computer or the like that is mounted with the organic electroluminescent display 10, along with the organic electroluminescent display. However, since only the portion embedded in the portable electronic device is characterized, the same portions as those of the first embodiment are omitted for convenience of explanation, and the feature portion will be described. Fig. 6 is a view showing an electric circuit of the inspection apparatus 19 of the present embodiment. In Fig. 6, the current detecting circuit portion 31 is constituted by a current detecting circuit 31a corresponding to the number of data lines XI to Xm. Each of the current detecting circuits 3 1 a detects the driving current of the data voltage V data for the test for the driving transistor Q 1 1 supplied from the data lines X 1 to Xm by the switching circuit 16 a. . However, the display data for testing is pre-stored in the memory 17a of the control circuit 17. Each of the current detecting circuits 31a is connected to the AD converter 32a corresponding to the AD conversion circuit unit 32. Each of the AD converters 32a converts the current 驱动 of the drive current supplied from the data lines X 1 to Xm into a digital 値, and outputs it to the control circuit 17. The control circuit 17 compares the current 値 of the drive current supplied from the data lines X 1 to Xm of the respective AD converters 3 2a with the set current 値 for the data voltage Vdata for the test. Then, the control circuit 17 temporarily remembers the result of the comparison. That is, in the present embodiment, in the control circuit 17, -22-1293748 (19) is inspected in the same manner as the inspection device 119 of the first embodiment. However, in the present embodiment, after checking each of the pixel circuits 20 connected to one scanning line, the inspection of each of the pixel circuits on the next scanning line is performed. After temporarily memorizing the comparison result, the same test was performed on the organic electroluminescence display 1 using the new data voltage Vdata for the test. Then, the control circuit 17 compares the current 驱动 of the drive current supplied from the data lines XI to Xm of the respective AD converters 32a to the set current 値 of the data voltage Vdata for testing, and memorizes the comparison result. . The control circuit 17 checks the output current characteristics of the driving transistor Q11 for the data voltage Vdata of each pixel circuit 20 based on the comparison result of the different data voltages Vdata for testing. Then, the control circuit 17 obtains a correction 于 for each pixel circuit 20 so that the characteristics of the respective pixel circuits 20 become the target (specification). That is, the correction 値 Δ Vd for the data voltage Vdata of the set brightness is obtained for each pixel circuit 20. The control circuit 17 terminates the test mode by storing the obtained correction 値 Δ Vd in the memory 17 7a as a memory circuit. However, the control circuit 17 is periodically tested or executed immediately after the power is turned on. The control circuit 17 uses the correction 値 Δ Vd to drive control based on the display data in the same manner as in the first embodiment. Next, the characteristics of the organic electroluminescence display 1 constructed as described above are described below. (1) In the present embodiment, the switching transistor 20 is provided with a switching transistor -23-1293748 (20) Q 1 3 and a detecting transistor Q 1 4 . Then, in the test mode, the drive current of the current for the test data voltage Vdata by the driving transistor q is supplied to the control circuit 17 by detecting the transistor Q 1 4 . Then, in the control circuit 17, the operational characteristics of each pixel circuit 20 are detected. Therefore, it is possible to easily detect the operational characteristics of the pixel circuit 20 caused by the manufacturing variation without using an expensive inspection apparatus. Further, in the control circuit 17, the test mode is executed periodically or after the power is turned on, and the operational characteristics of the respective pixel circuits 20 caused by the change in the annual temperature and the environmental temperature can be detected. (2) In the present embodiment, it is contained in 17. In the memory 17a, the control circuit 17 is stored in each pixel circuit 20 to correct the error in the operational characteristics caused by the change in manufacturing, the change in the age, and the change in the ambient temperature, that is, the memory. For the setting of the brightness data voltage Vdata, the correction 値 Δ Vd. Then, the control circuit 17 corrects the material voltage Vdata of the luminance of the organic EL element 21 of each pixel circuit 20 obtained based on the display material, and corrects each corresponding correction 値 Δ Vd . Therefore, even if the temperature of the pixel circuit 20 is changed over the years and the ambient temperature is changed, the driving current of the same current 供 can be supplied to the organic EL element 2 1 according to the data voltage Vdata of the display data. The organic electroluminescent element is also illuminated with the same intensity. (3) In the present embodiment, the detected drive current is supplied to the current detecting circuit 19a by the existing data lines XI to Xm. Therefore, it is possible to suppress an increase in the scale of the circuit for current detection. -24- 1293748 (Third Embodiment) Next, the applicability of the electronic device as the organic electroluminescent display 1 of the photovoltaic device described in the first and second embodiments is based on Fig. 7 and Figure 8 is explained. The organic electroluminescent display 1 is suitable for portable electronic computers such as personal computers, portable telephones, and digital cameras. Fig. 7 is a perspective view showing the configuration of a portable personal computer. In Fig. 7, the personal computer 50 is provided with a main body portion 52 having a keyboard 51 and a display unit 53 using the above-described organic electroluminescent display 1 . At this time, the display unit 53 using the organic electroluminescence display 1 can exhibit the same effects as those of the above-described embodiment. As a result, the personal computer 50 can realize the image display with few defects. Figure 8 is a perspective view showing the configuration of a non-portable type telephone. In Fig. 8, the portable telephone 60 is provided with a plurality of operation buttons 61, a receiving port 62, a mouthpiece 63, and a display unit 64 using the above-described organic electroluminescent display. At this time, the display unit 64 using the organic electroluminescence display 10 can exhibit the same effects as those of the above embodiment. As a result, the portable telephone 60 can realize an image display with few defects. (Fourth Embodiment) In the present embodiment, the pixel circuit shown in Fig. 9 will be described with respect to an embodiment in which both the switching transistor and the peach crystal are used. In Fig. 9, 'each pixel circuit 20 has a driving transistor Q20 as a second transistor, a first Q21, and a second switching transistor-25- 1293748 (22) Q 2 2. Light-emitting control power Crystal Q 2 3 and protector C1 as a holding element. The driving transistor Q20 is formed via a P-channel TFT. The first and second switching transistors Q21 and Q22 and the illuminating crystal Q23 are formed via N-channel TFTs. The driving transistor Q20 is connected to the anode of the organic EL element 21 by the light-emitting control / Q23, and the source is the power supply line L1. In the power source line V L , the driving voltage Vdd for driving the organic device 21 is supplied. A holding capacitor C1 is connected between the driving transistor Q20 line VL. Further, the gate of the driving transistor Q20 is connected to the drain of the above-described transistor Q21 for the body. The first channel transistor Q21 is connected to the drain of the second switching transistor Q22. Further, the drain of the first transistor Q22 is connected to the above-described driving transistor Q2. Further, the source of the second switching transistor Q22 is a single line driving circuit connected to the data line driving circuit 藉2 by Xm'. The single line driving circuit 30 is provided with the data current generating circuit 40a. The current generating circuit 4a is After the pixel circuit 20 outputs the data signal, the data line Xm is connected to the data forming circuit 40a by the first switch q, and is connected to the electric circuit 30b by the second switch Q12. The gates of the first and second switching transistors Q21 and Q22 are connected to the first sub-scanning line Va and the second sub-scanning line Vb. The first sub-Va and the second sub-scanning line vb are configured by the first selection signal SL1 and the holding capacitor! J uses an electric crystal connected to the EL element and the power supply ! 1 source of the source 2 switch's drain data line 30. This. Information ί I. However, the current is detected, and each scan line is 玫-ΒΒ 2 2 -26-1293748 (23) The signal SL2 is selected, and the first and second switching transistors Q21 and Q22 are turned on. Further, the gate via the light-emitting control transistor Q23 is controlled via the light-emission control signal Gp. When the first switch Q1 1 , the first switching transistor Q21 , and the second switching transistor Q223 are in the on state, the material current generating circuit 40a outputs the data signal I through the data line Xm to the pixel circuit. 20 The supply data signal I is accumulated in the holding capacitor C1 corresponding to the data signal I, and the conduction state of the driving transistor is set. This is a write action. Then, when the light-emission control transistor Q23 is turned on in response to the light-emission control signal Gp in which the light-emission control transistor Q23 is turned on, the current amount corresponding to the on-state of the driving transistor Q20 is supplied to the organic EL element 21. . In this regard, in the test mode, the above-described writing operation is basically the same, and instead of the normal test data signal, the amount of charge corresponding to the signal for testing is held in the holding capacitor. Then, the first switching transistor Q21, the first switch Q1 1 , and the light-emitting control transistor Q23 are kept in a closed state, and the second switching transistor Q22 and the second switch Q12 are turned on, and are driven. The current amount of the transistor Q20 is detected by the current detecting circuit 30b. In the fourth embodiment, unlike the first embodiment, instead of newly providing the detection transistor, two switching transistors ( (the second switching transistor Q22) are used as the detection transistor. Both use. However, the embodiment of the invention is not limited to the above embodiment, and may be implemented as described below in -27-1293748 (24). In the first embodiment described above, the display is inspected using an inspection device 1 9 for inspecting the organic electroluminescent display before shipment. In the case of a portable electronic device such as a portable telephone, a PDA, or a notebook computer, when the battery of the portable electronic device is charged by a charger, the organic battery mounted on the portable electronic device is charged during the charging. The excitation light display can be inspected by the inspection device 19. In this case, the charger must have a built-in inspection device. Then, when charging is started, it becomes the test mode, and each pixel circuit 20 is performed, and the current detection is checked. As a result, in the organic electroluminescence display mounted on the portable electronic device, the operational characteristics caused by the aging of the respective pixel circuits 20 are corrected at the time of charging. In the above embodiment, the inspection device 19 is provided with the current detecting circuit 19a for all the pixel circuits 20 of the display panel unit 11, and the second embodiment is provided in the same number as the data lines X1 to Xm. Implementation is also possible. At this time, in the second embodiment, each of the pixel circuits 20 connected to one of the scanning lines is inspected, and then the inspection of each pixel circuit on the next scanning line is performed. In the first embodiment, the correction △ Δ Vd of the inspection device 19 is obtained, and a new data voltage Vdata is created using the correction 値 Δ Vd stored in the memory 17 7 built in the control circuit 17. In the above-described embodiment, as an electronic circuit, the pixel circuit 20 can be embodied in an appropriate manner, and the electronic circuit of the driven element of the light-emitting element such as an LED or FED other than the organic EL element 21 is embodied. Also. Also, as the driven component, there is a magnetic RAM. According to -28-1293748 (25), it is possible to use a memory device using the magnetic RAM. In the above-described embodiment, the data voltage Vdata for different tests for the correction 値 Δ Vd is obtained, and the data voltage Vdata for testing is used for one test, and the data voltage Vdata for testing three or more tests is performed. can. In the above embodiment, the current is supplied to the current detecting circuit by the data line, and the wiring for the detecting transistor Q 1 3 is supplied to the current detecting circuit by wiring. In the above embodiment, the organic EL element 21 is embodied as a pixel circuit, but it may have an electroluminescence element. That is, it can also be applied to an electro-optic excitation-free light display by an inorganic electric excitation. In the above embodiment, the pixel circuit 20 is a pixel circuit of a specific type which is applied to a current-driven pixel-excited light-emitting display. Further, the pixel circuit such as the time division and the area gradation can be applied to the organic electroluminescence display. [Schematic Description] Fig. 1 is a block circuit diagram showing the organic electroluminescence path of the present embodiment. Fig. 2 is a block circuit diagram showing a display panel portion and a data line driving circuit. , use 2 to get. This test, test, or use of the test to obtain XI ~ Xm, for the installation of the detection of the specific 1 to implement the drive element 5 of the organic light element into the voltage drive circuit of the organic drive digital display display circuit Internal electricity -29-1293748 (26) [Fig. 3] Circuit diagram of the internal circuit configuration of the Fuτκ pixel circuit. [Fig. 4] A time chart of each signal in the normal mode. [Fig. 5] A time chart of each signal of the test mode. Fig. 6 is an electrical block diagram showing the main part of the second embodiment. Fig. 7 is a perspective view showing the configuration of a portable personal computer according to a third embodiment. Fig. 8 is a perspective view showing the configuration of a portable telephone according to a third embodiment. Fig. 9 is a circuit diagram showing the configuration of a pixel circuit according to the fourth embodiment. [Description of Symbols] C 1 The holding capacitor Q 1 1 is used as the driving transistor Q 1 2 of the second transistor, and the switching transistor Q 1 3 as the first transistor is used as the fourth transistor. The light-emitting control transistor Q 1 4 is used as the detection transistor for the third transistor Υ 1 to Υ η Sweeping the cat line V a The first sub-scanning line Vb The second sub-scanning line XI to Xm The data line 10 Organic electroluminescence display 11 as photoelectric device Display panel section -30-1293748 (27) 17 Control circuit 17a constituting the correction 値 calculation circuit as a memory of the memory circuit 19 calibrated circuit 检查 calculation circuit 19a current detection The output circuit 20 serves as a pixel circuit 2 of an electronic circuit as an organic EL element 3 1 a current detecting circuit of a driven element