CN1448908A - Electronic device, method for driving electronic device, electrooptical device and electronic apparatus - Google Patents

Electronic device, method for driving electronic device, electrooptical device and electronic apparatus Download PDF

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CN1448908A
CN1448908A CN 03107594 CN03107594A CN1448908A CN 1448908 A CN1448908 A CN 1448908A CN 03107594 CN03107594 CN 03107594 CN 03107594 A CN03107594 A CN 03107594A CN 1448908 A CN1448908 A CN 1448908A
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transistor
current
circuit
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data
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CN1253842C (en
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城宏明
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精工爱普生株式会社
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Abstract

一种能够以高精度来检测电子电路工作特性的电子电路、电子装置、电子电路的驱动方法、光电装置及电子设备。 An electronic circuit can be detected with high accuracy operating characteristics of the electronic circuit, the electronic device, method of driving an electronic circuit, an optoelectronic device and an electronic apparatus. 在像素电路(20)中设置连接于驱动用晶体管(Q11)与有机EL元件(21)之间的开关用晶体管(Q13)、和将驱动用晶体管(Q11)输出的驱动电流提供给电流检测电路(19a)的检测用晶体管(Q14)。 In the pixel circuit (20) is provided connected to the drive transistor (Q13), and a driving current driving transistor (Q11) is supplied to the output current detecting circuit transistor (Q11) switching between the organic EL element (21) (19a) of the detection transistor (Q14). 在开关用晶体管(Q13)截止的状态下,使开关用晶体管(Q12)导通,向保持电容(C1)提供检验用数据电流(Vdata),并使检测用晶体管(Q14)导通,经检测用晶体管(Q14)向电流检测电路(19a)提供来自驱动用晶体管的驱动电流。 In the switching transistor (Q13) off state, the switching transistor (Q12) is turned on, to provide inspection holding capacitor (C1) with a current data (Vdata), and the detection transistor (Q14) is turned on, the detection providing drive current from the driving transistor to the current detection circuit (19a) with a transistor (Q14). 电流检测电路(19a)可检测对检验用数据电流(Vdata)的驱动电流。 A current detecting circuit (19a) of the drive current can be detected current test data (Vdata) of.

Description

电子装置、电子装置的驱动方法、光电装置及电子设备 The electronic device, the electronic device driving method, and electronic equipment optoelectronic device

技术领域 FIELD

本发明涉及一种电子电路、电子装置、电子电路的驱动方法、光电装置及电子设备。 The present invention relates to an electronic circuit, an electronic device, method of driving an electronic circuit, an optoelectronic device and an electronic apparatus.

在有源矩阵驱动方式的光电装置中,为了控制有机EL元件的辉度,对各有机EL元件分别设置像素电路。 In the photovoltaic device of the active matrix driving method, in order to control the luminance of the organic EL element, the organic EL elements of the pixel circuits respectively provided. 通过向像素电路的保持电容提供对应于辉度梯度的数据信号(电压值或电流值)来控制各像素电路中有机EL元件的辉度梯度。 Controlling the luminance gradient of the organic EL element in each pixel circuit provided by the luminance gradient corresponds to the data signal (voltage value or current value) to the storage capacitor of the pixel circuit. 即,向保持电容充电对应于设定发光辉度梯度的电荷。 That is, the charge storage capacitor charges corresponding to the set emission luminance gradient.

另外,对应于保持电容中保持的电荷量来设定驱动用TFT(ThinFilm Transistro)的导通状态,向有机EL元件提供对应于所述导通状态的电流(例如参照国际公开第WO98/36406号公报)。 Further, the amount of charge corresponding to the holding capacitor is held to set a driving TFT (ThinFilm Transistro) a conductive state, current is supplied to the conducting state corresponds to the organic EL element (e.g., see International Publication No. WO98 / 36406 Gazette).

但是,虽然像素电路由至少一个晶体管等有源元件构成,但难以严格均匀化全部有源元件的特性。 However, although the pixel circuit is composed of at least one active element such as a transistor, it is difficult to strictly uniform the characteristics of all the active components. 尤其是构成显示器等像素电路的薄膜晶体管(TFT)的特性差异大。 Especially large difference characteristics of thin film transistor (TFT) constituting the pixel circuit of a display or the like. 因此,在输入规定的数据信号时,难以得到期望的辉度。 Accordingly, when a predetermined input data signal, it is difficult to obtain a desired luminance.

另外,存在特性随着构成像素电路的有源元件或光电元件的经时恶化而变化的问题。 Further, there is deterioration of properties over time as the active element constituting the photovoltaic element or pixel circuit varies problem.

为了消除所述问题,本发明的目的在于提供一种可以高精度检测电子电路工作特性的电子电路、电子装置、电子电路的驱动方法、光电装置及电子设备。 In order to eliminate the above problems, an object of the present invention is to provide an electronic circuit can be accurately detected operating characteristics of the electronic circuit, the electronic device, method of driving an electronic circuit, an optoelectronic device and an electronic apparatus.

本发明的第1电子装置具备多个单元电路,其特征在于:所述多个单元电路的每一个都包含:第1晶体管;保持元件,将经所述第1晶体管提供的电信号保持为电量;第2晶体管,根据所述保持元件中保持的电量来控制导通状态;被驱动元件,提供相对于所述导通状态的电流量;和第3晶体管,与所述第2晶体管串联连接,所述多个单元电路的每一个都可经所述第3晶体管连接于检测电流量用的检查部。 A first electronic device of the present invention includes a plurality of unit circuits, wherein: each of the plurality of unit circuits include: a first transistor; a holding member, via the electric signal supplied to the first transistor holding power ; a second transistor, according to the holding element holding the power to control the conducting state; driven element, providing the conductive state with respect to the amount of current; and a third transistor connected in series with the second transistor, each of the plurality of circuit units can be connected through the third transistor to the current amount detected by the inspection unit.

据此,通过使第3晶体管导通,可经该第3晶体管得到应提供给被驱动元件的相对于来自第2晶体管的电荷量的电流量。 Accordingly, by making the third transistor is turned on, it may be supplied to the driven element with respect to the amount of charge current from the second transistor via the third transistor obtained. 另外,既可在各单元电路内设置所述第3晶体管,也可对所述多个单元电路中的几个单元电路来共同设置所述第3晶体管。 Further, both the third transistor disposed in each unit circuit, may also be the plurality of unit circuits of several commonly provided to the unit circuit of the third transistor.

本发明的第2电子装置具备多个单元电路,其特征在于:所述多个单元电路的每一个都包含:第1晶体管;保持元件,将经所述第1晶体管提供的电信号保持为电量;第2晶体管,根据所述保持元件中保持的电量被控制成为导通状态;和提供相对于所述导通状态的电流量的被驱动元件,所述第2晶体管与所述第1晶体管串联连接,所述多个单元电路的每一个可经所述第1晶体管连接于检测电流量用的检查部上。 The second electronic device according to the present invention includes a plurality of unit circuits, wherein: each of the plurality of unit circuits include: a first transistor; a holding member, via the electric signal supplied to the first transistor holding power ; a second transistor, according to the holding element holding power is controlled to a conducting state; and providing a conductive state with respect to the amount of current driven element, the second transistor connected in series with the first transistor connecting the plurality of unit circuits each of the first transistor may be connected to the current amount detected by the inspection unit.

作为该第2电子装置的对应实施例,例如后述实施例4的具有将电流信号作为电信号来提供的电路构成的电子装置。 Examples of the electronic device corresponding to the second embodiment, described later, for example an electronic device having a circuit configuration of a current signal as an electrical signal according to the fourth embodiment provided.

在所述电子装置中,在所述被驱动元件与所述第2晶体管之间连接第4晶体管。 In the electronic device, the driven element between the second transistor and the fourth transistor is connected.

据此,使第4晶体管为截止状态,在停止向所述被驱动元件提供电流的状态下,通过使所述第3晶体管或所述第1晶体管为导通状态,可经所述第3晶体管或所述第1晶体管检测应提供给所述被驱动元件的通过第2晶体管的电流的电流量。 Accordingly, the first transistor 4 is turned off, in a state where the drive member is stopped is provided to the current through the third transistor or the second transistor in a conducting state, the third transistor may be or the first transistor detecting the amount of current to be supplied to a current through the second transistor of the element to be driven. 即,在所述检查部进行检测期间,至少所述第4晶体管是截止状态。 That is, during the inspection unit detects at least the fourth transistor is turned off.

在所述电子装置中,所述被驱动元件也可以是例如有机EL元件等电流驱动元件。 In the electronic device, the driven element may be, for example, a current-driven organic EL device or the like. 有机EL元件的发光层由有机材料构成。 Emitting layer of the organic EL element comprises an organic material.

在所述电子装置中,最好在所述多个单元电路的每一个中都设置所述第3晶体管。 In the electronic apparatus, preferably each of the plurality of unit circuits are arranged in the third transistor. 由此可检测所述多个单元电路每一个的电流特性。 Whereby said plurality of unit circuits each detecting a current characteristic.

在所述电子装置中,所述保持元件也可以是例如将提供给所述多个单元电路每一个的电信号保持为电荷量的电容元件。 In the electronic device, the retaining element may be provided to an electric signal, for example, each of the plurality of unit circuits of the charge amount of the capacitor holding element.

在所述电子装置中,所述保持元件也可以是SRAM等存储元件。 In the electronic device, the retaining element may be a memory element such as SRAM.

在所述电子装置中,具备存储电路,存储对由所述检查部求出的、经所述第1晶体管提供的电信号的补偿值。 The electronic device includes a memory circuit, a memory, an electric signal by the compensation value of the first transistor is supplied to the portion determined by the inspection.

据此,可使用存储电路中存储的补偿值来补偿电子装置的工作特性,调整被驱动元件的动作。 Accordingly, using the compensation value may be stored in the memory circuit to compensate for operating characteristics of the electronic device, the operation of the driven adjustment element.

本发明的电子装置的驱动方法中,该电子装置具备:第1晶体管;将由所述第1晶体管提供的电信号作为电量而保持的保持元件;根据所述保持元件中保持的电量被设定为导通状态的第2晶体管;提供相对于所述导通状态的电流量的被驱动元件;和与所述第2晶体管串联连接的第3晶体管,其特征在于:具备:使所述第1晶体管导通,将基于所述电信号的电量保持在所述保持元件中的第1步骤;和使所述第3晶体管为导通状态,经所述第3晶体管电连接所述第2晶体管和检测电流量的检查部的第2步骤,检测通过包含所述第2晶体管和所述第3晶体管的电流路径电流的电流量。 The method of driving an electronic device according to the present invention, the electronic device comprising: a first transistor; electric signal provided by the first transistor as a charge holding member is held; is set to the holding element in accordance with the holding power conduction state of the second transistor; providing a drive element relative to the current conducting state; and a third transistor connected in series with the second transistor, wherein: a: the first transistor turned on, the electrical signal based on the charge holding element in said first holding step; and the third transistor to a conducting state, the connection through the third transistor and the second transistor is electrically detected a second step of checking the amount of current unit, comprising detecting the amount of current through the second transistor and the current path of said third transistor.

据此,所述检查部可检测检查部应提供给被驱动元件的电流量。 Accordingly, the checking section checking unit may detect an amount of current to be supplied to the driven element.

在所述电子装置驱动方法中,所述电流路径最好不包含所述被驱动元件。 In the electronic device driving method, the best path does not include the current driven element.

在所述电子装置驱动方法中,所述被驱动元件也可以是有机EL元件等电流驱动元件。 In the electronic device driving method, the driving element is a current-driven elements may be organic EL element.

本发明的第1光电装置具备对应于多个扫描线和多个数据线的交叉部配置的多个像素电路,其特征在于:所述多个像素电路的每一个都包含:由通过所述多个扫描线中对应扫描线提供的扫描信号被控制成为导通状态的第1晶体管;将经所述多个数据线中对应数据线及所述第1晶体管提供的数据信号作为电量而保持的保持元件;根据所述保持元件中保持的电量被控制成为导通状态的第2晶体管;提供相对于所述导通状态的电流量的光电元件;和与所述第2晶体管串联连接的第3晶体管,所述多个像素电路的每一个都可经所述第3晶体管连接于检测电流量的检查部。 The first photovoltaic device according to the present invention includes a plurality of pixel circuits disposed corresponding to intersecting portions plurality of scan lines and a plurality of data lines, wherein: said plurality of pixel circuits each comprising: a plurality of said through scanning lines corresponding to the scanning line a scanning signal supplied first transistor is controlled to the conducting state; a data signal to the plurality of data lines via the corresponding data line and the first power transistor is provided as a holding and retaining element; a second transistor, according to the holding element holding power is controlled to a conducting state; providing a photovoltaic element with respect to the current conducting state; and a third transistor connected in series with the second transistor , each of which may through said third transistor connected to the detection current amount of the inspection portion of the plurality of pixel circuits.

在所述光电装置中,既可在所述多个像素电路的每一个中设置所述第3晶体管,也可在所述多个像素电路中的几个像素电路中共同设置所述第3晶体管。 In the photovoltaic device, either the third transistor disposed in each of the plurality of pixel circuits may also be co-located in the third transistor of the plurality of pixel circuits in several in .

在所述光电装置中,所述第3晶体管也可经所述多个晶体管中对应数据线连接于所述检查部。 In the photovoltaic device, said third transistor of said plurality of transistors is also a corresponding data line connected to the inspection unit may be. 据此,即使不设置检查用布线,也可将数据线用作检查用布线。 Accordingly, even without providing inspection wiring lines may also be used to check the data wiring.

本发明的第2光电装置具备对应于多个扫描线和多个数据线的交叉部配置的多个像素电路,其特征在于:所述多个像素电路的每一个都包含:由通过所述多个扫描线中对应扫描线提供的扫描信号被控制成为导通状态的第1晶体管;将经所述多个数据线中对应数据线及所述第1晶体管提供的数据信号作为电量而保持的保持元件;根据所述保持元件中保持的电量被控制为导通状态并与所述第1晶体管串联连接的第2晶体管;和提供相对于所述导通状态的电流量的光电元件,所述多个像素电路的每一个都可经所述第1晶体管连接于检测电流量的检查部。 A second photovoltaic device according to the present invention includes a plurality of pixel circuits disposed corresponding to intersecting portions plurality of scan lines and a plurality of data lines, wherein: said plurality of pixel circuits each comprising: a plurality of said through scanning lines corresponding to the scanning line a scanning signal supplied first transistor is controlled to the conducting state; a data signal to the plurality of data lines via the corresponding data line and the first power transistor is provided as a holding and retaining element; according to the holding element holding power is controlled to a conducting state and the second transistor connected to the first transistor in series; and providing a conductive state with respect to the amount of current of the photovoltaic element, said plurality each of pixel circuits via the first transistor can be connected to the checking unit detects the amount of current.

在所述光电装置中,所述检查部包含:电流检测电路,检测所述电流量;补偿值计算电路,根据所述电流检测电路检测到的电流量,求出对所述电信号的补偿值;和存储电路,存储对所述像素电路的所述补偿值,在设定所述电信号时,用所述补偿值来补偿所述电信号。 In the photovoltaic device, the inspection unit comprising: a current detection circuit detects the current; current compensation value calculation circuit, according to the current detected by the detection circuit, for obtaining the compensation value of the electric signal ; and a storage circuit for storing the compensation values ​​of the pixel circuit, when the electrical signal is set by the compensation value for compensating the electrical signal.

据此,通过补偿值计算电路来求出用于调整像素电路工作特性差异的补偿值,将对像素电路的所述补偿值存储在存储电路中。 Accordingly, by obtaining the compensation value calculation circuit for compensating the difference value to adjust the operating characteristics of the pixel circuit, the compensation value storage pixel circuit will be in a memory circuit. 因此,可使用存储电路中存储的电子电路补偿值来补偿像素电路的工作特性,调整被驱动元件的动作。 Thus, an electronic circuit using the compensation value stored in the memory circuit to compensate for operating characteristics of the pixel circuit, the adjusting operation of the drive element.

本发明的电子设备安装所述的光电装置。 The electronic device according to the present invention is mounted in the photovoltaic device.

图2是表示显示屏板部和数据线驱动电路的内部电路构成的电路框图。 FIG 2 is a circuit block diagram showing an internal circuit of the display panel unit and the data line driving circuit thereof.

图3是表示像素电路的内部电路构成的电路图。 FIG 3 is a circuit diagram of an internal circuit configuration of a pixel circuit.

图4是通常模式中的各信号的时序图。 FIG 4 is a timing chart of signals in the normal mode.

图5是检验模式中的各信号的时序图。 FIG 5 is a timing chart of signals in the test mode.

图6是说明实施例2的主要部分电路框图。 FIG 6 is a circuit block diagram of a main portion of the embodiment of Example 2.

图7是表示说明实施例3的移动型个人计算机构成的立体图。 FIG 7 is an explanatory perspective view of a mobile personal computer configuration of embodiment 3.

图8是表示说明实施例3的移动电话的构成的立体图。 FIG 8 is an explanatory perspective view showing a configuration of a mobile phone according to the third embodiment.

图9是表示实施例4的像素电路内部电路构成的电路图。 9 is a circuit diagram showing a pixel circuit of an internal circuit configuration of embodiment 4 embodiment.

图中:C1-作为电容元件的保持电容,Q11-作为第2晶体管的驱动用晶体管,Q12-作为第1晶体管的开关用晶体管,Q13-作为第4晶体管的发光控制用晶体管,Q14-作为第3晶体管的检测用晶体管,Y1~Yn-扫描线,Va-第1副扫描线,Vb-第2副扫描线,X1~Xm-数据线,10-作为电光学装置的有机EL显示器,11-显示屏板部,17-构成修正值运算电路的控制电路,17a-作为记忆电路的存储器,19-构成修正值运算电路的检查装置,19a-电路检测电路,20-作为电子电路的像素电路,21-作为被驱动元件的有机EL元件,31a-电流检测电路。 FIG: C1- a holding capacitance of the capacitive element, Q11- second transistor as a drive transistor, Q12- as a first transistor, a switching transistor, Q13- fourth transistor as a light emitting control transistor, Q14- as the detecting third transistor transistor, Y1 ~ Yn- scanning line, Va- a first scan line, the second sub-scanning line Vb -, X1 ~ Xm- data line, an electro-optical apparatus as 10- organic EL display, 11- a display panel unit, 17 constitutes a control circuit of the correction value calculation circuit, a memory 17A-memory circuit, 19 constituting the inspection apparatus correction value computing circuit 19A-circuit detecting circuit, the pixel circuit 20 as an electronic circuit, the organic EL element 21 as a driven element, 31a- current detection circuit.

图1表示作为光电装置的有机EL显示器10的电路构成的电路框图。 1 shows a block circuit diagram of a photoelectric circuit of an organic EL display device 10 is constituted. 图2表示显示屏板部和数据线驱动电路的内部电路构成的电路框图。 2 shows a circuit block diagram of an internal circuit of the display panel unit and the data line driving circuit thereof. 图3表示像素电路的内部电路构成的电路图。 Figure 3 shows a circuit diagram of an internal circuit configuration of a pixel circuit.

图1中,有机EL显示器10具备显示屏板部11、数据线驱动电路12、扫描线驱动电路13、存储器14、振荡电路15、选择电路16及控制电路17。 In FIG. 1, the organic EL display 10 includes a display panel portion 11, 12, the scanning line driving circuit data line driving circuit 13, a memory 14, an oscillation circuit 15, selection circuit 16 and a control circuit 17.

有机EL显示器10的各要素11-17也可由分别独立的电子部件构成。 Each element of the organic EL display 10 may also be composed of 11 to 17 are each independently of the electronic component. 例如,各要素12-17也可由1个芯片的半导体集成电路装置构成。 For example, the elements 12-17 may also be composed of a semiconductor integrated circuit device chip. 另外,各要素11-17的全部或部分也可构成为一体的电子部件。 Further, all or part of the elements 11-17 may also be configured as one of an electronic component. 例如,也可在显示屏板部11中一体形成数据线驱动电路12和扫描线驱动电路13。 For example, it may be formed integrally data line driving circuit 12 and a scanning line driving circuit 13 in the display panel portion 11. 各构成要素12-16的全部或部分也由可编程IC芯片构成,其功能也由写入IC芯片中的程序来软件地实现。 All or part of the constituent elements 12-16 are also constituted by a programmable IC chip, and its function by the program written into the IC chip to be software implemented.

如图2所示,显示屏板部11具有排列成矩阵状的多个像素电路20。 2, the display panel portion 11 has a plurality of pixels arranged in a matrix circuit 20. 即,通过在沿列方向的多个数据线X1-Xm(m为整数)与沿行方向的多个扫描线Y1-Yn(n为整数)之间分别连接各像素电路20,将各像素电路20排列成矩阵状。 That is, each pixel circuit is connected between the column direction by a plurality of data lines X1-Xm (m is an integer) and a plurality of scan lines in the row direction Y1-Yn (n is an integer) are respectively 20, each pixel circuit 20 arranged in a matrix. 在各像素电路20中具有由有机材料构成发光层的有机EL元件21来作为被驱动元件。 An organic EL element comprises an organic material light-emitting layer in each pixel circuit 20 as a driven member 21. 另外,形成于像素电路20内的后述晶体管虽然可以是硅衬底的晶体管,但在本实施例中由薄膜晶体管(TFT)构成。 Further, to be described later is formed on the transistors in the pixel circuit 20 may be a transistor, although a silicon substrate, but is made of a thin film transistor (TFT) in this embodiment.

数据线驱动电路12对所述各数据线X1-Xm分别设置数据电压生成电路12a。 Data line driving circuit 12 are provided to the data voltage generating circuit 12a to the respective data lines X1-Xm. 各数据电压生成电路12a经各自对应的数据线X1-Xm,向像素电路20提供电信号、即在本实施例中为数据信号(数据电压Vdata)。 Each of the data voltage generating circuit 12a via the respective corresponding data lines X1-Xm, provides electrical signals to pixel circuit 20, i.e. in the present embodiment, the data signal (data voltage Vdata). 若像素电路20对应于该数据电压Vdata来设定该像素电路20的内部状态,则与之对应的控制有机EL元件21中流过的电流值,控制该有机EL元件21的辉度。 If the pixel circuit 20 corresponding to the data voltage Vdata is set to the internal state of the pixel circuit 20, the corresponding value of the control current 21 flowing through the organic EL element, to control the luminance of the organic EL element 21.

扫描线驱动电路13选择驱动所述多个扫描线Yn中的一条,选择一行像素电路组。 Scanning line drive circuit 13 selects one scanning line Yn driving of said plurality, the pixel row selection circuit group. 扫描线Y1-Yn分别由第1副扫描线Va和第2副扫描线Vb构成。 Scanning line Y1-Yn, respectively, Vb includes a first sub-scanning line Va and the second sub-scanning line. 扫描线驱动电路13向第1副扫描线Va输出第1选择信号SL1,向第2副扫描线Vb输出第2选择信号SL2。 Scanning line drive circuit 13 to the first sub-scanning line Va outputs a first selection signal SL1, SL2 outputs the second selection signal to the second sub-scanning line Vb. 存储器14存储从计算机18提供的显示数据。 The memory 14 stores data provided by the computer 18. 另外,存储器14存储从构成补偿值计算电路的检查装置19提供的检验用显示数据。 Further, from the configuration memory 14 stores the compensation value calculating circuit 19 validation checking apparatus provided with the display data. 振荡电路15向有机EL显示器10的其它构成要素提供基准动作信号。 A reference oscillation circuit 15 provides an operation signal to the other components of the organic EL display 10.

选择电路16设置于显示屏板部11与数据线驱动电路12之间。 The selection circuit 16 is provided between the display panel unit 11 and the data line driving circuit 12. 各选择电路16在每个数据线X1-Xm中具备切换电路16a。 Each selection circuit 16 includes a switching circuit 16a in each of the data lines X1-Xm. 各切换电路16a如图3所示,分别由第1选通晶体管Q1和第2选通晶体管Q2构成。 Each switching circuit 16a shown in Figure 3, each constituted by a first transistor Q1 and the gate of the second gate transistor Q2. 另外,各选择电路16的第1选通晶体管Q1分别连接对应的数据线X1-Xm和对应的数据电压生成电路30。 Further, each selection circuit 16 of the first gate transistor Q1 is connected to the corresponding data lines X1-Xm and the data corresponding voltage generating circuit 30. 各选择电路16的第2选通晶体管Q2分别连接对应的数据线X1-Xm和设置在作为检查部的检查装置19中的每个对应数据线X1-Xm中设置的电流检测电路19a。 Each selection circuit 16 of the second gate transistor Q2 are connected to the current detecting circuit 19a corresponding to the data lines X1-Xm and setting in each corresponding data lines X1-Xm portion inspection device as in 19. 根据来自控制电路17的第1及第2选通信号G1、G2来分别导通、截止控制第1及第2选通晶体管Q1、Q2。 The control circuit from the first and second gate signal G1 17, G2 of respectively the on-off control of the first and second gate transistors Q1, Q2.

控制电路17统一控制所述各要素11-16。 The control circuit 17 collectively controls the respective elements 11-16. 控制电路17将表示显示屏盘11显示状态的、所述存储器14中存储的、来自计算机18的显示数据(图像数据)变换为表示各有机EL元件21的发光辉度的矩阵数据。 The control circuit 17 indicating the status display 11 to display the disc, stored in the memory 14, the display data (image data) from the computer 18 is converted into a matrix showing the organic EL elements emitting luminance data 21. 矩阵数据包含用于依次选择一行像素电路组的扫描线驱动信号、和决定设定选择像素电路组中有机EL元件21辉度的数据电压Vdata电平的数据线驱动信号。 Comprising matrix data for a row of pixels are sequentially selected scanning line drive circuit group signals, and selecting the pixel circuit group decides to set the data voltage Vdata level 21 of the organic EL element luminance data line driving signals. 另外,将扫描线驱动信号提供给扫描线驱动电路13。 Further, the scanning line driving signal to the scanning line driving circuit 13. 将数据线驱动信号提供给数据线驱动电路12。 The data line driving signal supplied to the data line drive circuit 12.

控制电路17在有机EL显示器10使用检查装置9来对显示屏盘11的各像素电路20进行检查时,变为检验模式。 The control circuit 17 when the circuit 9 to each pixel of a display panel 11 to check the organic EL display 20 using the inspection apparatus 10, into a test mode. 一旦变为检验模式,则控制电路17将所述存储器14中存储的来自检查装置19的检验用显示数据(图像数据)变换为表示各有机EL元件21的发光辉度的矩阵数据(检验用矩阵数据)。 Once the test mode is changed, the control circuit 17 from the test inspection apparatus 19 stored in the memory 14 is converted by the display data (image data) is a data matrix of luminance of each organic EL element 21 (test matrix data).

该检验用矩阵数据包含用于依次选择一行像素电路组的检验用扫描线驱动信号、和决定设定选择像素电路组中有机EL元件21检验用辉度的检验用数据电压Vdata电平的检验用数据线驱动信号。 The test matrix comprising data for sequentially selecting the pixel circuit inspection line drive signal set, and determines the pixel scanning line selection setting circuit group 21 element in the organic EL luminance for inspection test data voltage Vdata level for inspection a data line driving signals. 另外,将检验用扫描线驱动信号提供给扫描线驱动电路13。 Further, the scanning line driving test signals to the scanning line driving circuit 13. 将检验用数据线驱动信号提供给数据线驱动电路12。 The test data line driving signals supplied to the data line driving circuit 12. 在检验模式下,控制电路17将对显示屏盘11的各像素电路20进行检查用的第1及第2选通信号G1、G2提供给所述选择电路16。 In test mode, the control disc 17 will monitor circuit 11 of each pixel circuit 20 of the first and second inspection strobe signal G1, G2 of the selection circuit 16 is supplied to. 因此,在不是检验模式的正常模式时,控制电路17仅输出第1选通信号G1,并保持第1选通晶体管Q1导通、第2选通晶体管Q2截止的状态。 Thus, in the normal mode is not the test mode, the control circuit 17 outputs only the first gate signal G1, and maintain the first gate transistor Q1 is turned on, the gate of the second transistor Q2 is off.

下面,参照图3来说明像素电路20的内部电路构成。 Referring to FIG 3 will be described an internal circuit configuration of the pixel circuit 20. 为了方便说明,说明配置在第m个数据线Xm与第n个扫描线Yn的交点上、连接于两数据线Xm和扫描线Yn之间的像素电路20。 For convenience of description, the configuration in the m-th data line Xm and n-th intersection of the scanning line Yn, the pixel circuit 20 is connected to between the two data lines Xm and the scanning lines Yn.

像素电路20在本实施例中是电压驱动型像素电路,具备作为被驱动元件的有机EL元件21。 The pixel circuit 20 in the present embodiment is a voltage-driven pixel circuit includes an organic EL element 21 as a driven member. 具备作为第2晶体管的驱动用晶体管Q11、作为第1晶体管的开关用晶体管Q12、作为第4晶体管的发光控制用晶体管Q13、作为第3晶体管的检测用晶体管Q14、作为保持元件的保持电容C1。 It includes a first driving transistor of transistor Q11, a switching first transistor with the transistor Q12, the light-emitting fourth transistor control transistor Q13, as the detection of the third transistor of the transistor Q14, as the holding capacitor C1 holding element.

开关用晶体管Q12和发光控制用晶体管Q13由N沟道TFT构成。 Switching control transistor Q12 and the transistor Q13 light emission by an N-channel TFT. 驱动用晶体管Q11和检测用晶体管Q14由P沟道TFT构成。 Constituting the driving transistor Q11 and the transistor Q14 detecting a P-channel TFT.

驱动用晶体管Q11的漏极经开关用晶体管Q13连接于所述有机EL元件21的阳极,源极连接于电源线L1。 The drain of the driving transistor Q11 is connected via the switching transistor Q13 to the anode of the organic EL element 21, a source connected to the power line L1. 在驱动用晶体管Q11的栅极与电源线L1之间连接保持电容C1。 In the power supply line L1 between the gate of the driving transistor Q11 is connected to the holding capacitor C1. 另外,驱动用晶体管Q11的栅极经开关用晶体管Q12连接于所述数据线Xm。 Further, the gate of the driving transistor Q11 through the switching transistor Q12 is connected to the data line Xm. 驱动用晶体管Q11的漏极经所述检测用晶体管Q14连接于所述数据线Xm。 Drain of the driving transistor Q11 through the transistor Q14 is connected to detecting the data line Xm.

开关用晶体管Q12的栅极连接第1副扫描线Va。 Va switching transistor Q12 connected to the gate of the first sub-scanning line. 所述检测用晶体管Q14的源极连接于所述第1副扫描线Va。 Detecting the source of the transistor Q14 is connected to the first sub-scanning line Va. 另外,发光控制用晶体管Q13和检测用晶体管Q14的栅极都连接于第2副扫描线Vb。 Further, the light emission control transistor Q13 and the detector are connected to the second sub-scanning line Vb gate of the transistor Q14.

下面,根据像素电路20的动作来说明所述构成的有机EL显示器10的作用。 Hereinafter, the operation of the pixel circuit 20 will be described the action of the configuration of an organic EL display 10.

(通常模式)首先,根据图4中示出的各信号SL1、SL2、G1、G2的时序图来说明通常模式。 (Normal mode) First, in accordance with various signal SL1 shown in FIG. 4, a timing diagram SL2, G1, G2 will be described in the normal mode.

当前,当选择第n行扫描线Yn,连接于扫描线Yn的各像素电路20进行发光动作时,从扫描线驱动电路12经扫描线Yn的第1副扫描线Va输出使开关用晶体管Q12为导通状态的第1选择信号SL1,使开关用晶体管Q12变为导通状态。 Currently, when selecting the n-th scanning line Yn, when each pixel circuit is connected to the scanning line Yn 20 of the light emitting operation, Yn from 12 via the scan lines driving circuit of the first sub-scanning line Va output of the switching transistor Q12 is first selection signal SL1 conducting state, the switching transistor Q12 is turned on. 与此同时,从控制电路17向选择电路16的各切换电路16a输出使第1选通晶体管Q1为导通状态的第1选通信号G1,使第1选通晶体管Q1变为导通状态。 At the same time, the control circuit 17 16a output from the respective switching circuit selecting circuit 16 to the first gate of the first transistor Q1 gate signal G1 conduction state, the gate of the first transistor Q1 is turned on. 此时,根据开关用晶体管Q12及第1选通晶体管Q1的导通,分别从各数据电压生成电路12a向对应的各像素电路20的保持电容C1提供数据电压Vdata。 At this time, the switching transistor Q12 and the first gate transistor Q1 is turned on, from respective circuit 12a generates a data voltage to the data voltage Vdata corresponding to the storage capacitor C1 of each pixel circuit 20. 经过时间t1后,提供使开关用晶体管Q12和第1选通晶体管Q1为截止状态的第1选择信号SL1和第1选通信号G1,数据写入期间结束。 After time t1, the switching transistor Q12 provides the first gate and the transistor Q1 is in the OFF state of the first select signal SL1 and the end of the period of the first gate signal G1, the data is written.

在经处于导通状态的开关用晶体管Q12向像素电路20提供数据电压Vdata期间,检测用晶体管Q14及发光控制用晶体管Q13分别为导通状态。 During the switch in the conducting state by providing a data voltage Vdata to the pixel circuit 20 of the transistor Q12, the transistor Q14 is detected and the light emitting control transistor Q13 are turned on state.

在时间t1途中或经过时间t1后,开始向有机EL元件提供对应于驱动用晶体管Q11的导通状态的电流。 At time t1 transit or after time t1, the start supplying current corresponding to the conduction state of the driving transistor Q11, the organic EL element.

接着,发光控制用晶体管Q13为截止状态,停止向有机EL元件提供电流,等待下一数据写入期间的开始。 Next, the light emission control transistor Q13 is in the off state, stops supplying current to the organic EL element, waiting for the start of the next data write period.

在经开关用晶体管Q12向像素电路20提供数据电压Vdata的期间中,检测用晶体管Q14可以是导通状态和截止状态的任意一种状态。 During the data voltage Vdata via the switch provided with a transistor Q12 to the pixel circuit 20, the transistor Q14 may be detected by any of a state in the conduction state and an off state.

但是,因为经处于导通状态的检测用晶体管Q14而在像素电路20与数据线Xm之间流动的微小电流可能会扰动数据电压Vdata,所以最好如本实施例那样,在经开关用晶体管Q12向像素电路20提供数据电压Vdata期间,使检测用晶体管Q14为截止状态。 However, since the minute current is detected by the conduction state of transistor Q14 in between the pixel circuit 20 and the data line Xm flow disturbances may be the data voltage Vdata, so the best embodiment of the present embodiment as above, in the transistor Q12 via the switch during the pixel circuit 20 supplies a data voltage Vdata, so that the detection transistor Q14 is turned off.

并且,在通常模式的整体期间中,即使检测用晶体管Q14为截止状态也无妨。 Also, during the entire normal mode, even if the detected state is OFF anyway transistor Q14.

在本实施例中,虽然发光控制用晶体管Q13和检测用晶体管Q14为进行互补动作的电路构成,但不用说也可分别独立控制。 In the present embodiment, although the light emission controlling transistor Q13 and configured to detect complementary transistor Q14 of the circuit operation, but needless to say, can be independently controlled.

通过反复该动作,以对应于数据电压Vdata的辉度来分别控制位于各扫描线Y1-Yn上的各像素电路20的有机EL元件21,有机EL显示器10显示基于来自计算机18的显示数据的图像。 By repeating this operation, the corresponding image based on the display from the computer 18 data to the luminance data voltage Vdata to control the located pixel circuits on the scanning lines Y1-Yn of the organic EL element 2120, the organic EL display 10 .

(检验模式)下面,说明作为驱动方法一形态的检验模式。 (Test Mode) Next, a driving method aspect of the test pattern. 有机EL显示器10通过连接于检查装置19而变为检验模式。 The organic EL display device 10 through the connector 19 becomes the inspection test pattern. 一旦从检查装置19向有机EL显示器10输出检验用显示数据,则控制电路17变为检验模式,将检验用显示数据变换为表示各有机EL元件21的发光辉度梯度的矩阵数据(检验用矩阵数据)。 Once the test output from the inspection apparatus 10 to the organic EL display 19 display data, the control circuit 17 becomes test mode, the test represented by display data is converted into the organic EL elements 21 of the gradient of luminance of the data matrix (a matrix for inspection data). 另外,控制电路17向扫描线驱动电路13及数据线驱动电路12输出检验用扫描线驱动信号及检验用数据线驱动信号。 Further, the control circuit 17 drives an output circuit 12 and the data line driving circuit 13 to the scan line driving test signals and test signal scanning line driving data lines.

图5使表示检验模式中各信号SL1、SL2、G1、G2的时序图。 FIG 5 that the test pattern represented in a timing chart of respective signals SL1, SL2, G1, G2 of. 当前,例如从扫描线驱动电路13向扫描线Yn的第1副扫描线Va输出使开关用晶体管Q12为导通状态的第1选择信号SL1,位于扫描线Yn上的各像素电路20的开关用晶体管Q12变为导通状态。 Currently, for example, the scanning line driving circuit 13 is Yn to the scan line of the first sub-scanning line Va output of the switching transistor Q12 is turned on state of the first selecting signal SL1, located in each of the pixel circuits on the scanning line Yn of the switch 20 with transistor Q12 is turned on. 与此同时,从控制电路17向选择电路16的各切换电路16a输出使第1选通晶体管Q1为导通状态的第1选通信号G1,各切换电路16a的第1选通晶体管Q1变为导通状态。 At the same time, the control circuit 17 from the first gate transistor Q1 of the selection circuit 16 of each switching circuit 16a outputs an ON state of the first gate signal G1, the gate of the first transistor Q1 each switching circuit 16a becomes conducting state.

由此,经位于导通状态的开关用晶体管Q12和第1选通晶体管Q1,从数据电压生成电路12a向保持电容C1提供检验用数据电压Vdata。 Thereby, the conductive state is located in the switching transistor Q12 and the gate of the first transistor Q1, the voltage generation circuit 12a provide inspection data from the data voltage Vdata to the holding capacitor C1. 另一方面,在提供检验用数据电压Vdata的期间中,提供使检测用晶体管Q14为截止状态的第2选择信号SL2,使检测用晶体管Q14成为截止状态。 On the other hand, to provide for inspection during the data voltage Vdata, the transistor Q14 provides the detection of the second selection signal SL2 OFF state of the detection transistor Q14 is turned off.

经过时间t1后,提供使开关用晶体管Q12和第1选通晶体管Q1为截止状态的第1选择信号SL1和第1选通信号G1,像素电路20的数据写入期间结束。 After time t1, the switching transistor Q12 provides the first gate and the transistor Q1 is in the OFF state of the first select signal SL1 and the end of the period of the first gate signal G1, the pixel data write circuit 20. 此时,提供使检测用晶体管Q14和发光控制用晶体管Q13分别为导通状态和截止状态的第2选择信号SL2。 At this time, to provide the detection and the light emitting control transistor Q14 as the second selection signal, respectively, a conducting state and an OFF state of transistor SL2 Q13.

接着,从控制电路17向选择电路16的各切换电路16a提供使第2选通晶体管Q2为导通状态的第2选通信号G2,第2选通晶体管Q2变为导通状态。 Next, the control circuit 17 to the selecting circuit 16a of each switching circuit 16, the second transistor Q2 is selected from the second gate signal G2 conducting state, the second gate transistor Q2 is turned on. 在像素电路20中,根据该第2选通晶体管Q2的导通,流过电流值相对于基于驱动用晶体管Q11动作的检验用数据电压Vdata的驱动电流。 In the pixel circuit 20, based on the second gate transistor Q2 is turned on, the current flowing through the drive current value with respect to the driving transistor Q11 based on the checking operation of the data voltage Vdata. 此时,来自驱动用晶体管Q11的驱动电流经检测用晶体管Q14和第2选通晶体管Q2,分别输出到检查装置19中对位于扫描线Xn上的各像素电路20设置的各电流检测电路19a。 At this time, from the driving transistor Q14 and the second gate transistor Q2, outputs a current detection circuit 19a to the respective inspection device 19 for each pixel located on the scanning line Xn circuit 20 is provided with a drive current of the transistor Q11 is detected.

另外,依次对各扫描线Y1-Yn的各像素电路20进行该动作,分别输出到对各扫描线Y1-Yn的各像素电路20设置的各电流检测电路19a。 Further, each pixel circuit sequentially the scanning lines Y1-Yn performs the operation 20, respectively, to the respective output current detecting circuit 19a of the scanning lines in each pixel circuit 20, Y1-Yn arranged.

在检查装置19中,对各扫描线Y1-Yn的各像素电路20设置的电流检测电路19蒋输入的输出电流进行数字变换后,分别求出输出电流值,作为检测电流值。 After the inspection apparatus 19, the output current of the current detection circuit of each pixel circuit in each of the scanning lines Y1-Yn 20 19 provided Chiang inputted digital conversion, the output current value are respectively determined, as the detected current value. 另外,检查装置19分别比较各电流检测电路19a求出的像素电路20的检测电流值和对检验用数据电压Vdata的设定电流值。 Further, the pixel value of the detected current inspection device 19 are circuit comparing each of the current detecting circuit 19a obtains the set current value 20 and the inspection data voltage Vdata. 另外,检查装置19暂时存储该比较结果。 Further, the inspection apparatus 19 temporarily stores the comparison result. 设定电流值必须以检验用数据电压Vdata从像素电路20标准输出的电流值,是事先经试验或理论得到的值。 A current value must be set current value to verify data voltage Vdata outputted from the standard pixel circuit 20 is a value previously obtained by experiment or theoretical.

在暂时存储该比较结果后,重新使用不同值的检验用数据电压Vdata,对有机EL显示器10进行同样的检验。 After temporarily storing the comparison result re-use check use data voltage Vdata different values, and the organic EL display 10 performs the same test. 检查装置19与所述一样,分别比较各电流检测电路19a求出的像素电路20的检测电流值和对检验用数据电压Vdata的设定电流值,存储该比较结果。 Like the inspection device 19, respectively, comparing the detected current value of each pixel circuit of the current detecting circuit 19a obtains the set current value 20 and the inspection data voltage Vdata, stores the comparison result.

检查装置19根据对两种不同检验用数据电压Vdata的比较结果,检查驱动用晶体管Q11相对各像素电路20的数据电压Vdata的输出电流特性。 The test apparatus 19 tests the comparison results for the two different data voltage Vdata, the driving transistor Q11 to check the relative output current characteristics of the data voltage Vdata to each pixel circuit 20. 检查装置19求出每个像素电路20的补偿值,使各像素电路20的特性变炎目标(标准)特性。 Each inspection apparatus 19 obtains the pixel values ​​of the compensation circuit 20, so that the characteristics of each pixel circuit 20 becomes the target inflammation (standard) characteristic. 即,对每个像素电路20求出对于相对设定辉度的数据电压Vdata的补偿值ΔVd。 That is, each pixel circuit 20 obtains the data voltage Vdata set relative luminance compensation value ΔVd pair.

检查装置19向有机EL显示器10输出对每个像素电路20求出的补偿值ΔVd。 Check the output device 19 to the organic EL display 10 ΔVd compensation value for each pixel circuit 20 is determined. 对每个像素电路20求出的补偿值ΔVd存储在内置于控制电路17中的由非易失性存储器等构成的存储器17a中,检验模式结束。 ΔVd value for each compensation circuit 20 stores the pixel determined to memory 17a of the inner configuration of the control circuit 17 in a nonvolatile memory or the like, the end of the test pattern. 另外,在本实施例中,虽存储在存储器17a中,但也可形成设定补偿值的熔丝,根据检查装置19的检查结果来切断对应熔丝。 Further, in the present embodiment, although stored in the memory 17a, but may also be formed to set the compensation value of the fuse, the fuse is cut according to the check result of the corresponding inspection device 19.

控制电路17在将来自计算机18的显示数据(图像数据)变换为表示各有机EL元件21的发光梯度的矩阵数据时,使用补偿值ΔVd。 When the display data (image data) from the control circuit 17 in the computer 18 is a data transformation matrix organic EL light emitting element 21 of the gradient, using the compensation value ΔVd. 具体而言,控制电路17将分别由对应补偿值ΔVd补偿根据显示数据求出的设定各像素电路20的有机EL元件21辉度的数据电压Vdata后的值设为新的数据电压Vdata。 Specifically, the control circuit 17 respectively by a corresponding compensation value compensation is set ΔVd organic EL element of each pixel circuit 20 according to the display data of the obtained value of the data voltage Vdata 21 as a new luminance data voltage Vdata. 控制电路17将各像素电路20的新的数据电压Vdata作为数据线驱动信号输出到数据线驱动电路12。 The control circuit 17 to a new data voltage Vdata to each pixel circuit 20 as a data line driving signal to the data line driving circuit 12.

因此,可检测因制造差异产生的各像素电路(各晶体管;尤其是驱动用晶体管Q11)r工作特性差异。 Thus, each pixel circuit can be detected due to manufacturing variances generated (transistors; in particular, the driving transistor Q11) r difference in operating characteristics. 因此,可在补偿各像素电路20的工作特性差异后,使各像素电路20的有机EL元件21相对数据电压Vdata的辉度一定。 Thus, differences in the operating characteristics compensation circuit 20 of each pixel, each pixel circuit of the organic EL element 21 relative to the data voltage Vdata 20 constant luminance.

另外,检查装置19在检测电流值不在基准范围内的情况下,若判断像素电路20不能工作,则可以把其作为可否出厂的判断材料。 Further, the inspection apparatus 19 in a case where the detected current value is not within the reference range, determining if the pixel circuit 20 does not work, as it can be determined whether the material is manufactured.

下面说明所述构成的有机EL显示器10的特征。 Wherein the configuration of the organic EL display 10 will be described below.

(1)在本实施例中,在像素电路20中设置开关用晶体管Q13和检测用晶体管Q14。 (1) In the present embodiment, the switch is provided in the pixel circuit 20 with transistors Q13 and detecting transistor Q14. 在检验模式下,经检测用晶体管Q14向检测装置19的电流检测电路19a提供电流值相对于来自驱动用晶体管Q11的检验用数据电流Vdata的驱动电流。 In the test mode, it provides a current detected value for the drive current from the driving transistor Q11 test data Vdata current to the transistor Q14 by the current detection circuit 19 of the detecting device 19a.

因此,可简单检测制造差异产生的各像素电路20的工作特性。 Therefore, the operating characteristics of each pixel circuit can be easily manufactured detect differences generated 20. 结果,可在出厂前检查有机EL显示器10的次品。 As a result, the factory check before the organic EL display 10 is defective.

(2)在本实施例中,在内置于控制电路17中的存储器17a中,存储检查装置19对每个像素电路20求出的、补偿基于制造差异的工作特性误差的补偿值、即对于相对设定辉度的数据电压Vdata的补偿值ΔVd。 (2) In the present embodiment, built into the control circuit 17 in the memory 17a, the compensation value storage device 19 checks each pixel compensation circuit 20 obtains the difference in operating characteristics based manufacturing error, i.e., the relative the data voltage Vdata set luminance compensation value ΔVd. 另外,控制电路17分别用对应的补偿值ΔVd来补偿设定基于显示数据求出的各像素电路20的有机EL元件21辉度的数据电压Vdata。 Further, the control circuit 17 are respectively set to 21 to compensate the data voltage Vdata of the luminance of the organic EL element of each pixel circuit 20 based on the data obtained with the corresponding compensation value display ΔVd.

因此,各像素电路20可向有机EL元件20提供电流值相对基于显示数据的数据电压Vdata一样的驱动电流,使该有机EL元件以同样的辉度发光。 Thus, each pixel circuit 20 may provide current to the organic EL element 20 relative to the same data voltage Vdata based on the display data driving current, the organic EL element so that the luminance of the same. 因此,因为各像素电路20可由补偿值ΔVd来补偿制造差异引起的工作特性,所以可将以前作为次品废弃的有机EL显示器改良为制品,故可提高有机显示器的制造合格率。 Thus, since each pixel circuit 20 may be a compensation value to compensate for operating characteristics ΔVd caused by manufacturing variations, it is possible to previously discarded as defective organic EL display is improved articles, it can improve the manufacturing yield of an organic display.

(3)在本实施例中,利用现有的数据线X1-Xm来向电流检测电路19a提供检测用驱动电流。 (3) In the present embodiment, the use of existing data lines X1-Xm to provide a current detection circuit 19a detects the driving current. 因此,可抑制为了检测电流而增大电路规模。 Accordingly, current can be suppressed in order to detect an increase in circuit scale.

另外,在本实施例中,虽串联连接所述驱动用晶体管(第2晶体管)Q11和检测用晶体管(第3晶体管)Q14,但也可在驱动用晶体管Q11与检测用晶体管Q14之间插入其它元件。 Further, in the present embodiment, although the series connection of the drive and the detection transistor (third transistor) Q14, but may also be inserted between the transistor Q14 by the transistor Q11 and a detection transistor (second transistor) Q11 in the other drive element. 此时,也可相对驱动用晶体管Q11来串联连接检测用晶体管Q14。 In this case, relative to the driving transistor Q11 is connected in series with the detection transistor Q14.

(实施例2)下面说明实施例2。 (Example 2) Example 2 will be described below. 在所述实施例1中,检查装置19是外部装置,但在本实施例中,构成检查装置19,作为与所述实施例1的有机EL显示器10的各要素11-17相同的要素。 In the same element, the inspection apparatus 119 is an external device of the embodiment, but in the present embodiment, the inspection apparatus 19 configured as an organic EL display in Example 1 of the respective elements 10 11-17. 因此,检查装置19与有机EL显示器10一起内置于安装有机EL显示器10的移动电话、PDA、个人计算机等移动电子设备内。 Thus, the mounting inspection apparatus 19 built in the mobile phone, PDA, personal computer, mobile electronic device 10 with the organic EL display with organic EL display 10.

另外,因为特征在于内置于移动电子设备内,所以为了方便说明,省略与实施例1相同的部分,说明特征部分。 Further, since the built-in wherein the mobile electronic device, so for convenience of explanation, the same portions will be omitted in Example 1 described characteristic portion.

图6表示本实施例的检查装置19的电路。 FIG. 6 shows a circuit embodiment of the inspection apparatus 19 of the present embodiment.

在图6中,电流检测电路部31由数量对应于数据线X1-Xm的电流检测电路31a构成。 In FIG. 6, the current detection circuit section 31 by the amount corresponding to the data lines X1-Xm current detection circuit 31a configured. 各电流检测电路31a分别模拟检测相对分别经切换电路16a从数据线X1-Xm提供的来自驱动用晶体管Q11的检验用数据电压Vdata的驱动电流。 Each current detection circuit 31a detects the relative simulate the switching circuit 16a are supplied via the data lines X1-Xm from the driving transistor Q11 test data voltage Vdata of the driving current. 另外,将检验用显示数据事先存储在控制电路17的存储器17a中。 Further, the testing display data previously stored in the memory 17a in the control circuit 17.

各电流检测电路31a连接于AD变换电路部32的对应AD变换器32a上。 Each current detection circuit 31a is connected to the AD converters 32a corresponding to the portion 32 of the AD converting circuit. 各AD变换器32a将从数据线X1-Xm提供的驱动电流的电流值变换为数字值后,输出到控制电路17。 After each of the AD converters 32a from the data lines X1-Xm converts the current value to provide the driving current into a digital value, outputted to the control circuit 17.

控制电路17分别比较来自各AD变换器32的由数据线X1-Xm提供的驱动电流电流值与相对检验用数据电压Vdata的设定电流值。 The control circuit 17 respectively compare the drive current from the respective current value AD supplied by the data lines X1-Xm converter 32 is set to the current value of the data voltage Vdata opposite test. 另外,控制电路17暂时存储该比较结果。 Further, the control circuit 17 temporarily stores the comparison result. 即,在本实施例中,控制电路17进行与所述实施例1的检查装置19相同的检查处理。 That is, in the present embodiment, the control circuit 17 performs the same inspection apparatus 1 of the embodiment 19 of the inspection process. 另外,在本实施例的情况下,当对连接于一条扫描线上的每个像素电路20进行检查后,进行下一扫描线上的各像素电路的检查。 Further, in the present embodiment, when each pixel circuit is connected to a scanning line to check 20, a check of each pixel circuit of the next scan line.

暂时存储该比较结果后,重新使用不同值的检验用数据电压Vdata来对有机EL显示器10进行同样的检验。 After temporarily storing the result of the comparison, again using a different test values ​​to perform the same test on the organic EL display 10 with the data voltage Vdata. 另外,控制电路17与所述一样,分别比较来自各AD变换器32a的由数据线X1-Xm提供的驱动电流电流值和相对检验用数据电压Vdata的设定电流值,存储比较结果。 Further, as the control circuit 17, respectively, each of the AD converter 32a from the comparison of the current value and the drive current setting current value relative test data voltage Vdata is stored in the comparison result provided by the data lines X1-Xm.

控制电路17根据相对两种不同检验用数据电压Vdata的比较结果,检查驱动用晶体管Q11相对各像素电路20的数据电压Vdata的输出电流特性。 The control circuit 17 based on the relative comparison results of two different tests with the data voltage Vdata, the driving transistor Q11 to check the relative output current characteristics of the data voltage Vdata to each pixel circuit 20. 控制电路17对每个像素电路20求出补偿值,使各像素电路20的特性变为目标(标准)特性。 The control circuit 17 obtains a compensation value for each pixel circuit 20, so that the characteristics of each pixel circuit 20 becomes the target (standard) characteristic. 即,对每个像素电路20求出对于相对设定辉度的数据电压Vdata的补偿值ΔVd。 That is, each pixel circuit 20 obtains the data voltage Vdata set relative luminance compensation value ΔVd pair. 控制电路17将求出的补偿值ΔVd存储在作为存储电路的存储器17a中后,检验模式结束。 The control circuit 17 in the memory 17a as a memory circuit, the end of the test pattern obtained compensation values ​​stored ΔVd. 另外,控制电路17定期进行检验模式,或在接通电流后执行检验模式。 Further, the control circuit 17 periodically test mode, a test is performed or after switching on the current mode. 控制电路17使用该补偿值ΔVd,与所述实施例1一样,根据显示数据来驱动控制各像素电路20。 The control circuit 17 uses the compensation value [Delta] Vd, the same as in Example 1, to each of the pixel drive control circuit 20 according to display data.

下面,说明所述构成的有机EL显示器10的特征。 Next, the characteristic configuration of the organic EL display 10.

(1)在本实施例中,在像素电路20中设置开关用晶体管Q13和检测用晶体管Q14。 (1) In the present embodiment, the switch is provided in the pixel circuit 20 with transistors Q13 and detecting transistor Q14. 在检验模式下,经检测用晶体管Q14向控制电路17提供相对于来自驱动用晶体管Q11的检验用数据电流Vdata的驱动电流电流值。 In test mode, the driving current provided by the current detection value with respect to the transistor Q11 from the test with the current data Vdata to the control circuit 17 of transistor Q14.

另外,控制电路17检测各像素电路20的工作特性。 Further, the control circuit 17 detects the operating characteristics of each pixel circuit 20. 因此,不使用大的检查装置就可简单检测制造差异引起的各像素电路20的工作特性。 Thus, without using a large apparatus can check the operating characteristics of the simple detection of each pixel due to the difference producing circuit 20. 因此,即使控制电路17定期或在电源接通后执行检验模式,也可检测经年变化、环境温度变化引起的各像素电路20的工作特性。 Thus, even if the control circuit 17 or a test is performed periodically after power-on mode, the change can be detected over the years, each of the pixel circuits due to changes in ambient temperature of 20 operating characteristics.

(2)在本实施例中,在内置于控制电路17中的存储器17a中,存储该控制电路17对每个像素电路20求出的、补偿基于制造差异、经年变化、环境温度变化引起的工作特性误差的补偿值、即对于相对设定辉度的数据电压Vdata的补偿值ΔVd。 (2) In the present embodiment, a separation control circuit 17a in the memory 17, the memory control circuit 17, the compensation based on manufacturing variations, changes over time, causing changes in the ambient temperature determined for each pixel circuit 20 of error compensation value operating characteristics, i.e., the data voltage Vdata is set relative luminance compensation value ΔVd. 另外,控制电路17分别用对应的补偿值ΔVd来补偿设定基于显示数据求出的各像素电路20的有机EL元件21辉度的数据电压Vdata。 Further, the control circuit 17 are respectively set to 21 to compensate the data voltage Vdata of the luminance of the organic EL element of each pixel circuit 20 based on the data obtained with the corresponding compensation value display ΔVd.

因此,各像素电路20即使经年变化、环境温度变化,也可向有机EL元件21提供电流值相对基于显示数据的数据电压Vdata一样的驱动电流,使该有机EL元件以同样的辉度发光。 Thus, 20 even when the secular change, temperature change of each pixel circuit, may also be provided to the organic EL element 21 a current value corresponding display based on the same data voltage Vdata of the data drive current, so that the organic EL element at the same luminance emission.

(3)在本实施例中,利用现有的数据线X1-Xm来向电流检测电路19a提供检测用驱动电流。 (3) In the present embodiment, the use of existing data lines X1-Xm to provide a current detection circuit 19a detects the driving current. 因此,可抑制为了检测电流而增大电路规模。 Accordingly, current can be suppressed in order to detect an increase in circuit scale.

(实施例3)下面,根据图7及图8来说明作为实施例1和2中说明的光电装置的有机EL显示器10的电子设备适用。 (Example 3) Next, FIG. 7 and FIG. 8 will be described as an organic EL display apparatus described in the second embodiment of the photoelectric 1 and the embodiment of the electronic device 10 is applied. 有机EL显示器10可适用于移动型个人计算机、移动电话、数字式照相机等各种电子设备。 The organic EL display 10 may be applied to a mobile personal computer, a mobile phone, a digital camera, and other electronic devices.

图7是表示移动型个人计算机构成的立体图。 FIG 7 is a perspective view of a mobile personal computer configuration. 在图7中,个人计算机50具备配置键盘5的主体部52、使用所述有机EL显示器10的显示单元53。 In FIG. 7, the personal computer 50 includes a main body portion 5 is arranged a keyboard 52, a display unit using the organic EL display 10 is 53. 此时,使用有机EL显示器10的显示单元53发挥与所述实施例一样的效果。 In this case, an organic EL display using the display unit 10 and 53 exert the same effects as the embodiment. 结果,个人计算机50可实现缺陷少的图像显示。 As a result, the personal computer 50 can be implemented less defective image display.

图8是表示移动电话构成的立体图。 FIG 8 is a perspective view of a mobile phone configuration. 在图8中,移动电话60具备多个操作键61、受话口62、送话口63、使用所述有机EL显示器10的显示单元64。 In FIG. 8, the mobile phone 60 includes a plurality of operation keys 61, an earpiece 62, a mouthpiece 63, using the organic EL display 64 of the display unit 10. 此时,使用有机EL显示器10的显示单元64发挥与所述实施例一样的效果。 At this time, the display unit 64 of the organic EL display 10 exhibit the same effects as the embodiment. 结果,移动电话60可实现缺陷少的图像显示。 As a result, the mobile phone 60 can achieve an image display with few defects.

(实施例4)在本实施例中,对于兼用开关用晶体管和检测用晶体管的实施例,说明图9示出的像素电路。 (Example 4) In the present embodiment, for use either embodiment the switching transistor and the detection transistor described pixel circuit shown in FIG. 9.

图9中,各像素电路20具有作为第2晶体管的驱动用晶体管Q20、第1Q21及第2开关用晶体管Q22、发光控制用晶体管Q23、及作为保持元件的保持电容C1。 In FIG. 9, each pixel circuit 20 as a second transistor having a driving transistor Q20, first and second switching 1Q21 transistor Q22, and Q23 emission control transistor, and a storage capacitor C1 as a holding element. 驱动用晶体管Q20由P沟道TFT构成。 Channel TFT driving transistor Q20 is constituted by P. 第1及第2开关用晶体管Q21、Q22及发光控制用晶体管Q23由N沟道TFT构成。 First and second switching transistors Q21, Q22 and Q23 by the light emission control transistor N channel TFT.

驱动用晶体管Q20的漏极经发光控制用晶体管Q23连接于所述有机EL元件21的阳极,源极连接于电源线L1。 The drain of the driving transistor Q20 is connected via the emission control in the anode 21 of the organic EL element with a transistor Q23, a source connected to the power line L1. 向电源线L1提供驱动所述有机EL元件2用的驱动电压Vdd。 Providing a driving element of the organic EL driving voltage Vdd to a power supply line L1. 在所述驱动用晶体管Q20的栅极与电源线VL之间连接保持电容C1。 Between the gate and the driving power supply line VL of the transistor Q20 is connected to the holding capacitor C1.

另外,驱动用晶体管Q20的栅极经所述第1开关用晶体管Q2 1的漏极上。 Further, the gate of the driving transistor Q20 through the first switching on the drain of the transistor Q2 1. 第1开关用晶体管Q21的源极连接在第2开关用晶体管Q22的漏极上。 A first switch connected to the drain electrode of the second switching transistor Q22 with a source of transistor Q21. 另外,第2开关用晶体管Q22的漏极与所述驱动用晶体管Q20的漏极连接。 Further, the drain of the second switching transistor Q22 is connected to the driving drain of transistor Q20.

第2驱动用晶体管Q22的源极经数据线Xm连接于数据线驱动电路12的单一线驱动电路30上。 The second drive line is connected to a single data line driving circuit 12 with the source driving circuit 30 via the data line Xm of the transistor Q22. 该单一线驱动电路30设置数据电流生成电路40a。 The single line driving circuit 30 is provided to the data current generating circuit 40a. 数据电流生成电路40a向像素电路20输出数据信号I。 Data current generating circuit 40a to the pixel circuit 20 outputs the data signal I. 数据线Xm经第1开关Q11连接于数据电流生成电路40a,同时,经第2开关Q12连接于电流检测电路30b。 Data line Xm through the first switch Q11 is connected to the data current generating circuit 40a, while, through the second switch Q12 is connected to the current detection circuit 30b.

在第1及第2开关用晶体管Q21、Q22的栅极上分别连接第1副扫描线Va及第2副扫描线Vb。 In the first and second switching transistor Q21, are connected to a first scan line and the second sub-scanning line Va Vb to the gate of Q22. 由来自第1副扫描线Va及第2副扫描线Vb的第1扫描信号SL1及第2扫描信号SL2来导通第1及第2开关用晶体管Q21、Q22。 The first scanning signal from the first and second sub-scanning line Va Vb of the sub-scanning line SL2 and the second scanning signal SL1 2 is turned on the first and second switching transistors Q21, Q22. 并且,由发光控制信号Gp第2来控制发光控制用晶体管Q23的栅极。 And, a second gate to control the light emission controlling transistor Q23 by the light emission control signal Gp.

在第1开关Q11、第1开关用晶体管Q21及第2开关用晶体管Q22导通状态期间,若数据电流生成电路40a经数据线Xm输出数据信号I,则向像素电路20提供数据信号I,在保持电容C1中积累对应于数据信号I的电荷量,设定驱动晶体管的导通状态。 The first switch Q11, a first switching transistor Q21 during a second switching state of the transistor Q22 is turned on, if the data current generating circuit 40a through the data line Xm output data signal I, data signal I is provided to the pixel circuit 20, in holding capacitor C1 corresponding to the charge amount accumulated in the data signal I, set the conduction state of the driving transistor. 这是写入动作。 This is a write operation.

接着,若发光控制用晶体管Q23响应使发光控制用晶体管Q23变为导通状态的发光控制信号Gp而变为导通状态,则向有机EL元件21提供对应于驱动用晶体管Q20导通状态的电流量。 Subsequently, when the light emission controlling transistor Q23 in response to the light emission control signal Gp emission control transistor Q23 is turned on and is turned on, then the organic EL element 21 provided corresponding to the drive with electrically conducting state of the transistor Q20 flow.

相反,在检验模式下,虽然所述写入动作基本相同,但保持电容中保持对应于检验用信号的电荷量,代替通常的数据信号。 In contrast, in the test mode, although the write operation is substantially the same, but the holding capacitor holding charge amount corresponding to a test signal, instead of the normal data signal. 其次,第1开关用晶体管Q21、第1开关Q11及发光控制用晶体管Q23为截止状态不变,第2开关用晶体管Q22和第2开关Q12为导通状态,由电流检测电路30b来检测通过驱动晶体管Q20的电流量。 Next, the first switching transistor Q21, Q11 and the first switch unchanged emission control transistor and Q23 OFF state, the second switching transistor Q22 and the second switch Q12 is turned on state, it is detected by the current detecting circuit 30b driven by current of transistor Q20.

在实施例4中,与实施例1不同,将两个开关晶体管中的一个(第2开关晶体管Q22)兼用作检测用晶体管,代替重新设置检测用晶体管。 In Example 4, unlike Example 1, the two switching transistors of a (second switching transistor Q22 is) also serves as a detection transistor, instead of the reset transistor is detected.

另外,发明实施例不限于所述实施例,也可如下来实施。 Further, the invention is not limited to the embodiments described embodiments, may be implemented as follows.

在所述实施例1中,使用检查出厂前的有机EL显示器的检查装置19来检测显示器。 In one embodiment, the organic EL display using the inspection before shipping inspection apparatus 1 of the embodiment of the display 19 is detected. 对于移动电话、PDA、笔记本电脑等移动电子设备而言,当由充电器充电移动电子设备的电池时,也可在充电中由检查装置19检查装载在移动电子设备上的有机EL显示器。 For a mobile phone, PDA, laptop computers and other mobile electronic devices, mobile electronic device when the battery charging by the charger, the charging can also be loaded by the inspection apparatus 19 checks on the mobile electronic device organic EL display. 此时,该充电器中必需内置检查装置。 In this case, the required built-in charger inspection apparatus. 另外,一旦开始充电,则变为检验模式,进行电流检测,检查各像素电路20。 Further, once the charging is started, it becomes test mode, a current detection circuit 20 checks each pixel. 从而,对于装载于移动电子设备上的有机EL显示器而言,可在每次充电时补偿各像素电路20经年变化引起的工作特性。 Thus, for a mobile electronic device mounted on an organic EL display, it can cause operating characteristics when charging over 20 years variation compensation circuit for each pixel.

在所述实施例中,检查装置19对显示屏板部11的全部像素电路20设置电流检测电路19a,但也可如实施例2那样,以与数据线X1-Xm数量相同的数量来实施。 In the illustrated embodiment, the inspection circuit 19 means all the pixels 11 of the display panel portion 20 is provided a current detection circuit 19a, but also as in Example 2 above, with the number of data lines X1-Xm implemented the same number. 此时,如实施例2那样,在对连接于一条扫描线上的各像素电路20进行检查后,进行下一扫描线上各像素电路的检查。 In this case, as in Example 2, after each pixel circuit is connected to a scanning line to check 20, a check of each pixel circuit of the next scan line.

在所述实施例1中,将检查装置19求出的补偿值Vd存储在控制电路17中内置的存储器17a中,使用存储器17a中存储器补偿值Vd,形成新的数据电压Vdata。 In the embodiment in Example 1, the control circuit 17 in the built-in memory 17a, a compensation value memory 17a in the memory device 19 checks Vd obtained compensation value Vd stored to form a new data voltage Vdata.

在所述实施例中,作为电子电路,具体化为像素电路20,得到最佳效果,但也可具体化成驱动有机EL元件21以外的例如LED或FED等发光元件等被驱动元件的电子电路。 In the illustrated embodiment, as an electronic circuit, embodied as the pixel circuit 20, give the best results, but may also be embodied in an electronic circuit is driven drive element other than the organic EL element 21, for example, an LED or other light-emitting element FED. 另外,作为被驱动元件,有磁性RAM。 Further, as a driven element, a magnetic RAM. 因此,也可应用于利用该磁性RAM的存储器装置。 Thus, the memory means may be applied by using the magnetic RAM.

在所述实施例中,在求补偿值ΔVd时,用两个不同的检验用数据电压Vdata来进行检验求出。 In the illustrated embodiment, when seeking compensation value [Delta] Vd, with the two different tests to be tested is determined by the data voltage Vdata. 也可使用一个检验用数据电压Vdata进行检验、或使用3个以上的检验用数据电压Vdata进行检验求出来实施。 May also be tested using a test data voltage Vdata, or three or more test out inspection request data voltages embodiment Vdata.

在所述实施例中,经数据线X1-Xm向电流检测电路提供电流,但也可在检测用晶体管Q13中设置检测专用布线、经这些布线来提供给电流检测电路来实施。 In the illustrated embodiment, via the data lines X1-Xm current is supplied to the current detection circuit, but may be provided in the detection of the detection transistor Q13 dedicated wiring, the wiring provided by the current detection circuit to be implemented.

在所述实施例中,具体化有机EL元件21来作为像素电路的被驱动元件,但也可具体化为无机EL元件。 In the illustrated embodiment, the specific organic EL element 21 as a pixel circuit is driven elements, but may also be embodied as an inorganic EL element. 即,也可应用于由无机EL元件构成的无机EL显示器。 That is, also applicable to an inorganic EL display element formed of an inorganic EL.

在所述实施例中,像素电路20具体化为电压驱动型像素电路,但也可应用于电流驱动型像素电路的有机EL显示器。 In the illustrated embodiment, the pixel circuit 20 embodied as a voltage-driven pixel circuit, but may also be applied to an organic EL display, a current-driven pixel circuit. 另外,也可将时分、面积梯度等数字驱动的像素电路应用于有机EL显示器。 Further, the pixel circuits may be time-division, digital driving area gradients applied to an organic EL display.

Claims (15)

1.一种电子装置,具备多个单元电路,其特征在于:所述多个单元电路的每一个都包含:第1晶体管;将由所述第1晶体管提供的电信号作为电量而保持的保持元件;根据所述保持元件所保持的电量被控制为导通状态的第2晶体管;提供相对于所述导通状态的电流量的被驱动元件;和与所述第2晶体管串联连接的第3晶体管,所述多个单元电路的每一个都可通过所述第3晶体管连接于用于检测电流量的检查部。 An electronic device, comprising a plurality of unit circuits, wherein: each of the plurality of unit circuits include: a first transistor; electric signal provided by the first transistor as the charge retaining member and retaining ; according to the second holding element holding power transistor is controlled to a conducting state; providing a driven element with respect to the current conducting state; and a third transistor connected in series with the second transistor a plurality of unit circuits may each through said third transistor connected to the current detecting section for checking.
2.一种电子装置,具备多个单元电路,其特征在于:所述多个单元电路的每一个都包含:第1晶体管;将由所述第1晶体管提供的电信号作为电量而保持的保持元件;根据所述保持元件中保持的电量被控制为导通状态的第2晶体管;和提供相对于所述导通状态的电流量的被驱动元件,所述第2晶体管与所述第1晶体管串联连接,所述多个单元电路的每一个可通过所述第1晶体管连接于用于检测电流量的检查部上。 An electronic device, comprising a plurality of unit circuits, wherein: each of the plurality of unit circuits include: a first transistor; electric signal provided by the first transistor as the charge retaining member and retaining ; according to the second holding element in the holding power transistor is controlled to the conducting state; and providing a conductive state with respect to the amount of current driven element, the second transistor connected in series with the first transistor connecting the plurality of unit circuits through each of the first transistor is connected to a checking unit for detecting the current amount.
3.根据权利要求1或2所述的电子装置,其特征在于:在所述被驱动元件与所述第2晶体管之间连接第4晶体管。 The electronic device according to claim 1 or claim 2, wherein: the fourth transistor is connected between the driven member and the second transistor.
4.根据权利要求1至3中任意一项所述的电子装置,其特征在于:所述被驱动元件是电流驱动元件。 The electronic device according to any one of 1 to 3 of the claims, wherein: the driven elements are current driven element.
5.根据权利要求3所述的电子装置,其特征在于:在所述检查部进行检测期间,至少所述第4晶体管是截止状态。 The electronic device according to claim 3, wherein: during the inspection portion is detected, at least a fourth transistor is turned off.
6.根据权利要求1所述的电子装置,其特征在于:在所述多个单元电路的每一个中都设置所述第3晶体管。 6. The electronic device according to claim 1, wherein: in each of said plurality of unit circuits are arranged in the third transistor.
7.根据权利要求1至6中任意一项所述的电子装置,其特征在于:具备存储电路,存储对由所述检查部求出的,由所述第1晶体管提供的电信号的补偿值。 The electronic device according to any one of 1 to 6 claim, wherein: a storage circuit stores the compensation value calculated by the inspection portion provided by the first transistor electrical signal .
8.根据权利要求1至7中任意一项所述的电子装置,其特征在于:所述检查部检测流过包含所述第2晶体管的电流路径的电流,所述电流路径不包含所述被驱动元件。 The electronic device according to any one of 1 to 7 claim, wherein: said inspection unit comprises a detection current of the current path of the second transistor flows, the path does not include the current is the drive element.
9.一种电子装置的驱动方法,该电子装置具备:第1晶体管;将由所述第1晶体管提供的电信号作为电量而保持的保持元件;根据所述保持元件中保持的电量被设定为导通状态的第2晶体管;提供相对于所述导通状态的电流量的被驱动元件;和与所述第2晶体管串联连接的第3晶体管,其特征在于:具备:使所述第1晶体管导通,将基于所述电信号的电量保持在所述保持元件中的第1步骤;和使所述第3晶体管为导通状态,经所述第3晶体管电连接所述第2晶体管和检测电流量的检查部,检测流过包含所述第2晶体管和所述第3晶体管的电流路径电流的电流量的第2步骤。 A method of driving an electronic device, the electronic device includes: a first transistor; electric signal provided by the first transistor as a charge holding member is held; is set according to a power of the holding element holding conduction state of the second transistor; providing a drive element relative to the current conducting state; and a third transistor connected in series with the second transistor, wherein: a: the first transistor turned on, the electrical signal based on the charge holding element in said first holding step; and the third transistor to a conducting state, the connection through the third transistor and the second transistor is electrically detected current inspection unit, comprising detecting flowing through the second transistor and the current path of the third transistor of the second current step.
10.根据权利要求9所述的电子装置驱动方法,其特征在于:所述电流路径不包含所述被驱动元件。 The electronic device driving method according to claim 9, wherein: said current path does not include the driven element.
11.一种光电装置,具备对应于多个扫描线和多个数据线的交叉部配置的多个像素电路,其特征在于:所述多个像素电路的每一个都包含:由通过所述多个扫描线中对应扫描线提供的扫描信号被控制为导通状态的第1晶体管;将由对应所述多个数据线的数据线及通过所述第1晶体管提供的数据信号作为电量而保持的保持元件;根据所述保持元件中保持的电量被控制为导通状态的第2晶体管;提供相对于所述导通状态的电流量的光电元件;和与所述第2晶体管串联连接的第3晶体管,所述多个像素电路的每一个都可经所述第3晶体管连接于检测电流量的检查部。 A photovoltaic device comprising a plurality of pixel circuits disposed corresponding to intersecting portions plurality of scan lines and a plurality of data lines, wherein: said plurality of pixel circuits each comprising: a plurality of said through scan line corresponding to the scanning line a scanning signal is provided to control the conduction state of the first transistor; a plurality of data lines by a corresponding said data line and a data signal supplied through the first transistor and a charge holding held element; a second transistor, according to the holding element holding power is controlled to a conducting state; providing a conductive state with respect to the amount of current of the photovoltaic element; and a third transistor connected in series with the second transistor , each of which may through said third transistor connected to the detection current amount of the inspection portion of the plurality of pixel circuits.
12.一种光电装置,具备对应于多个扫描线和多个数据线的交叉部配置的多个像素电路,其特征在于:所述多个像素电路的每一个都包含:由通过所述多个扫描线中对应扫描线提供的扫描信号被控制为导通状态的第1晶体管;将通过所述多个数据线中对应数据线及所述第1晶体管提供的数据信号作为电量而保持的保持元件;根据所述保持元件中保持的电量被控制为导通状态的与所述第1晶体管串联连接的第2晶体管;和提供相对于所述导通状态的电流量的光电元件,所述多个像素电路的每一个都可通过所述第1晶体管连接于用于检测电流量的检查部。 A photovoltaic device comprising a plurality of pixel circuits disposed corresponding to intersecting portions plurality of scan lines and a plurality of data lines, wherein: said plurality of pixel circuits each comprising: a plurality of said through scan line corresponding to the scanning line a scanning signal is provided to control the conduction state of the first transistor; data corresponding to the data signal line and the first power transistor is provided as a holding and retaining the plurality of the data lines by element; a second transistor, according to the holding element holding power is controlled to a conducting state and the first transistor connected in series; and providing a conductive state with respect to the amount of current of the photovoltaic element, said plurality each pixel circuit is available through the first transistor is connected to a current amount detecting portion for checking.
13.根据权利要求11所述的光电装置,其特征在于:所述第3晶体管可通过所述多个数据线中的对应数据线连接于所述检查部。 13. The photovoltaic device according to claim 11, wherein: said third transistor of said plurality of data lines via a corresponding data line is connected to the checking unit.
14.根据权利要求11至13中任意一项所述的光电装置,其特征在于:所述检查部包含:检测所述电流量的电流检测电路;根据所述电流检测电路检测到的电流量,求出对所述电信号的补偿值的补偿值计算电路;和存储对所述像素电路的所述补偿值的存储电路,用所述补偿值来补偿所述电信号。 14. The photovoltaic device of any one of claims 11 to claim 13, wherein: said inspection unit comprising: detecting a current amount of the current detection circuit; the amount of current detected by the current detection circuit, which the calculated value of the compensation value of the electrical signal circuits; and a memory circuit for storing the compensation values ​​of the pixel circuit, using the compensation value for compensating the electrical signal.
15.一种电子设备,安装权利要求11至14中的任意一项所述的光电装置。 15. An electronic device, photovoltaic device installation as claimed in any one of claims 11 to 14.
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