TWI277194B - Vertically oriented nano-circuit and method to form thereof - Google Patents
Vertically oriented nano-circuit and method to form thereof Download PDFInfo
- Publication number
- TWI277194B TWI277194B TW091117917A TW91117917A TWI277194B TW I277194 B TWI277194 B TW I277194B TW 091117917 A TW091117917 A TW 091117917A TW 91117917 A TW91117917 A TW 91117917A TW I277194 B TWI277194 B TW I277194B
- Authority
- TW
- Taiwan
- Prior art keywords
- vertically positioned
- conductive spacer
- conductor
- nanocircuit
- insulator
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/49—Adaptable interconnections, e.g. fuses or antifuses
- H10W20/491—Antifuses, i.e. interconnections changeable from non-conductive to conductive
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/031—Manufacture or treatment of conductive parts of the interconnections
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/031—Manufacture or treatment of conductive parts of the interconnections
- H10W20/056—Manufacture or treatment of conductive parts of the interconnections by filling conductive material into holes, grooves or trenches
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/031—Manufacture or treatment of conductive parts of the interconnections
- H10W20/063—Manufacture or treatment of conductive parts of the interconnections by forming conductive members before forming protective insulating material
- H10W20/0636—Manufacture or treatment of conductive parts of the interconnections by forming conductive members before forming protective insulating material the conductive members being on sidewalls
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/41—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes characterised by their conductive parts
- H10W20/42—Vias, e.g. via plugs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/49—Adaptable interconnections, e.g. fuses or antifuses
- H10W20/493—Fuses, i.e. interconnections changeable from conductive to non-conductive
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
Landscapes
- Design And Manufacture Of Integrated Circuits (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
- Fuses (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/964,770 US6611039B2 (en) | 2001-09-28 | 2001-09-28 | Vertically oriented nano-fuse and nano-resistor circuit elements |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWI277194B true TWI277194B (en) | 2007-03-21 |
Family
ID=25508970
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW091117917A TWI277194B (en) | 2001-09-28 | 2002-08-08 | Vertically oriented nano-circuit and method to form thereof |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6611039B2 (https=) |
| EP (1) | EP1298727A3 (https=) |
| JP (1) | JP4185338B2 (https=) |
| KR (1) | KR100918161B1 (https=) |
| CN (1) | CN100414705C (https=) |
| TW (1) | TWI277194B (https=) |
Families Citing this family (48)
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| JP4107792B2 (ja) * | 2000-08-28 | 2008-06-25 | 独立行政法人科学技術振興機構 | 可視光応答性を有する金属オキシナイトライドからなる光触媒 |
| KR100444228B1 (ko) * | 2001-12-27 | 2004-08-16 | 삼성전기주식회사 | 칩 패키지 및 그 제조방법 |
| US6703652B2 (en) * | 2002-01-16 | 2004-03-09 | Hewlett-Packard Development Company, L.P. | Memory structure and method making |
| US20050127475A1 (en) * | 2003-12-03 | 2005-06-16 | International Business Machines Corporation | Apparatus and method for electronic fuse with improved esd tolerance |
| US20050266242A1 (en) * | 2004-03-31 | 2005-12-01 | Susan Lindquist | Electrical conductors and devices from prion-like proteins |
| KR100586548B1 (ko) * | 2004-06-22 | 2006-06-08 | 주식회사 하이닉스반도체 | 반도체 메모리소자의 퓨즈 및 리페어 방법 |
| JP2006019455A (ja) * | 2004-06-30 | 2006-01-19 | Nec Electronics Corp | 半導体装置およびその製造方法 |
| US7472576B1 (en) | 2004-11-17 | 2009-01-06 | State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Portland State University | Nanometrology device standards for scanning probe microscopes and processes for their fabrication and use |
| WO2007086909A2 (en) * | 2005-05-03 | 2007-08-02 | Nanocomp Technologies, Inc. | Nanotube composite materials and methods of manufacturing the same |
| JP4864093B2 (ja) | 2005-07-28 | 2012-01-25 | ナノコンプ テクノロジーズ インコーポレイテッド | ナノ繊維質材料の形成および収穫に関するシステムおよび方法 |
| JP4964472B2 (ja) * | 2006-01-31 | 2012-06-27 | 半導体特許株式会社 | 半導体装置 |
| KR100735529B1 (ko) * | 2006-02-09 | 2007-07-04 | 삼성전자주식회사 | 반도체 메모리 소자 및 그 제조 방법 |
| KR100855855B1 (ko) * | 2006-10-04 | 2008-09-01 | 주식회사 하이닉스반도체 | 비휘발성 메모리 소자 및 그 제조방법 |
| US7777296B2 (en) * | 2006-12-05 | 2010-08-17 | International Business Machines Corporation | Nano-fuse structural arrangements having blow protection barrier spaced from and surrounding fuse link |
| US8188569B2 (en) * | 2006-12-15 | 2012-05-29 | Qimonda Ag | Phase change random access memory device with transistor, and method for fabricating a memory device |
| US7517235B2 (en) | 2006-12-28 | 2009-04-14 | General Electric Company | Press fit connection for mounting electrical plug-in outlet insulator to a busway aluminum housing |
| JP5257681B2 (ja) | 2007-02-15 | 2013-08-07 | 日本電気株式会社 | カーボンナノチューブ抵抗体及び半導体装置の製造方法 |
| JP5595737B2 (ja) * | 2007-02-27 | 2014-09-24 | ナノコンプ テクノロジーズ インコーポレイテッド | 熱保護材料およびその製造方法 |
| US7785934B2 (en) * | 2007-02-28 | 2010-08-31 | International Business Machines Corporation | Electronic fuses in semiconductor integrated circuits |
| US9061913B2 (en) * | 2007-06-15 | 2015-06-23 | Nanocomp Technologies, Inc. | Injector apparatus and methods for production of nanostructures |
| JP2011508364A (ja) * | 2007-08-07 | 2011-03-10 | ナノコンプ テクノロジーズ インコーポレイテッド | 非金属電気伝導性および熱伝導性ナノ構造体ベースアダプター |
| JP2010537410A (ja) * | 2007-08-14 | 2010-12-02 | ナノコンプ テクノロジーズ インコーポレイテッド | ナノ構造材料ベースの熱電発電装置 |
| WO2009137722A1 (en) | 2008-05-07 | 2009-11-12 | Nanocomp Technologies, Inc. | Carbon nanotube-based coaxial electrical cables and wiring harness |
| JP5968621B2 (ja) * | 2008-05-07 | 2016-08-10 | ナノコンプ テクノロジーズ インコーポレイテッド | ナノ構造体ベースの加熱装置およびその使用方法 |
| US7858506B2 (en) * | 2008-06-18 | 2010-12-28 | Micron Technology, Inc. | Diodes, and methods of forming diodes |
| US7939911B2 (en) * | 2008-08-14 | 2011-05-10 | International Business Machines Corporation | Back-end-of-line resistive semiconductor structures |
| US7977201B2 (en) * | 2008-08-14 | 2011-07-12 | International Business Machines Corporation | Methods for forming back-end-of-line resistive semiconductor structures |
| US8354593B2 (en) * | 2009-07-10 | 2013-01-15 | Nanocomp Technologies, Inc. | Hybrid conductors and method of making same |
| US8344428B2 (en) | 2009-11-30 | 2013-01-01 | International Business Machines Corporation | Nanopillar E-fuse structure and process |
| MY169590A (en) * | 2010-02-02 | 2019-04-22 | Mimos Berhad | Method of fabricating nano-resistors |
| US8609534B2 (en) | 2010-09-27 | 2013-12-17 | International Business Machines Corporation | Electrical fuse structure and method of fabricating same |
| JP6014603B2 (ja) | 2011-01-04 | 2016-10-25 | ナノコンプ テクノロジーズ インコーポレイテッド | ナノチューブベースの絶縁体 |
| US8633707B2 (en) | 2011-03-29 | 2014-01-21 | International Business Machines Corporation | Stacked via structure for metal fuse applications |
| JP2013187325A (ja) * | 2012-03-07 | 2013-09-19 | Seiko Instruments Inc | 半導体装置 |
| JP5902004B2 (ja) * | 2012-03-07 | 2016-04-13 | エスアイアイ・セミコンダクタ株式会社 | 半導体装置の製造方法 |
| JP5959254B2 (ja) * | 2012-03-22 | 2016-08-02 | エスアイアイ・セミコンダクタ株式会社 | 半導体装置 |
| US9496325B2 (en) | 2012-06-26 | 2016-11-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Substrate resistor and method of making same |
| US9718691B2 (en) | 2013-06-17 | 2017-08-01 | Nanocomp Technologies, Inc. | Exfoliating-dispersing agents for nanotubes, bundles and fibers |
| US8836128B1 (en) * | 2013-03-15 | 2014-09-16 | Microchip Technology Incorporated | Forming fence conductors in an integrated circuit |
| JP2014225622A (ja) * | 2013-05-17 | 2014-12-04 | 富士電機株式会社 | ポリシリコンヒューズおよびその製造方法とポリシリコンヒューズを有する半導体装置 |
| US9646929B2 (en) | 2013-06-13 | 2017-05-09 | GlobalFoundries, Inc. | Making an efuse |
| US9214567B2 (en) | 2013-09-06 | 2015-12-15 | Globalfoundries Inc. | Nanowire compatible E-fuse |
| WO2016126818A1 (en) | 2015-02-03 | 2016-08-11 | Nanocomp Technologies, Inc. | Carbon nanotube structures and methods for production thereof |
| US10581082B2 (en) | 2016-11-15 | 2020-03-03 | Nanocomp Technologies, Inc. | Systems and methods for making structures defined by CNT pulp networks |
| US11279836B2 (en) | 2017-01-09 | 2022-03-22 | Nanocomp Technologies, Inc. | Intumescent nanostructured materials and methods of manufacturing same |
| US10276493B2 (en) * | 2017-08-01 | 2019-04-30 | Vanguard Enternational Semiconductor Corporation | Semiconductor structure and method for fabricating the same |
| US11948630B2 (en) * | 2021-11-04 | 2024-04-02 | Applied Materials, Inc. | Two-terminal one-time programmable fuses for memory cells |
| US12002753B2 (en) | 2021-12-08 | 2024-06-04 | International Business Machines Corporation | Electronic fuse with passive two-terminal phase change material and method of fabrication |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US5011791A (en) * | 1989-02-03 | 1991-04-30 | Motorola, Inc. | Fusible link with built-in redundancy |
| US5701027A (en) * | 1991-04-26 | 1997-12-23 | Quicklogic Corporation | Programmable interconnect structures and programmable integrated circuits |
| US5451811A (en) * | 1991-10-08 | 1995-09-19 | Aptix Corporation | Electrically programmable interconnect element for integrated circuits |
| US5244836A (en) * | 1991-12-30 | 1993-09-14 | North American Philips Corporation | Method of manufacturing fusible links in semiconductor devices |
| US5447880A (en) * | 1992-12-22 | 1995-09-05 | At&T Global Information Solutions Company | Method for forming an amorphous silicon programmable element |
| US5572062A (en) * | 1994-03-31 | 1996-11-05 | Crosspoint Solutions, Inc. | Antifuse with silicon spacers |
| JPH0851153A (ja) * | 1994-08-08 | 1996-02-20 | Ricoh Co Ltd | 多層配線を有する半導体装置 |
| US5756367A (en) * | 1994-11-07 | 1998-05-26 | Advanced Micro Devices, Inc. | Method of making a spacer based antifuse structure for low capacitance and high reliability |
| US5835396A (en) * | 1996-10-17 | 1998-11-10 | Zhang; Guobiao | Three-dimensional read-only memory |
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| KR100226742B1 (ko) * | 1996-12-24 | 1999-10-15 | 구본준 | 반도체 소자의 금속배선 형성 방법 |
| US6031287A (en) * | 1997-06-18 | 2000-02-29 | Micron Technology, Inc. | Contact structure and memory element incorporating the same |
| US5807786A (en) * | 1997-07-30 | 1998-09-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of making a barrier layer to protect programmable antifuse structure from damage during fabrication sequence |
| SG70654A1 (en) * | 1997-09-30 | 2000-02-22 | Ibm | Copper stud structure with refractory metal liner |
| US6190986B1 (en) * | 1999-01-04 | 2001-02-20 | International Business Machines Corporation | Method of producing sulithographic fuses using a phase shift mask |
| US6242789B1 (en) * | 1999-02-23 | 2001-06-05 | Infineon Technologies North America Corp. | Vertical fuse and method of fabrication |
| JP3897227B2 (ja) * | 2001-04-16 | 2007-03-22 | ソニー株式会社 | 音出力装置 |
| US6584029B2 (en) * | 2001-08-09 | 2003-06-24 | Hewlett-Packard Development Company, L.P. | One-time programmable memory using fuse/anti-fuse and vertically oriented fuse unit memory cells |
-
2001
- 2001-09-28 US US09/964,770 patent/US6611039B2/en not_active Expired - Fee Related
-
2002
- 2002-08-08 TW TW091117917A patent/TWI277194B/zh not_active IP Right Cessation
- 2002-09-19 JP JP2002273090A patent/JP4185338B2/ja not_active Expired - Fee Related
- 2002-09-25 EP EP02256632A patent/EP1298727A3/en not_active Withdrawn
- 2002-09-27 KR KR1020020058879A patent/KR100918161B1/ko not_active Expired - Fee Related
- 2002-09-28 CN CNB021437793A patent/CN100414705C/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| EP1298727A3 (en) | 2004-10-13 |
| KR20030027823A (ko) | 2003-04-07 |
| KR100918161B1 (ko) | 2009-09-17 |
| EP1298727A2 (en) | 2003-04-02 |
| JP4185338B2 (ja) | 2008-11-26 |
| CN100414705C (zh) | 2008-08-27 |
| US20030062590A1 (en) | 2003-04-03 |
| JP2003162954A (ja) | 2003-06-06 |
| US6611039B2 (en) | 2003-08-26 |
| CN1409396A (zh) | 2003-04-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |