TWI266066B - IC tester - Google Patents

IC tester

Info

Publication number
TWI266066B
TWI266066B TW094112372A TW94112372A TWI266066B TW I266066 B TWI266066 B TW I266066B TW 094112372 A TW094112372 A TW 094112372A TW 94112372 A TW94112372 A TW 94112372A TW I266066 B TWI266066 B TW I266066B
Authority
TW
Taiwan
Prior art keywords
voltages
driver
liquid crystal
voltage
crystal display
Prior art date
Application number
TW094112372A
Other languages
Chinese (zh)
Other versions
TW200540437A (en
Inventor
Isamu Koura
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Publication of TW200540437A publication Critical patent/TW200540437A/en
Application granted granted Critical
Publication of TWI266066B publication Critical patent/TWI266066B/en

Links

Classifications

    • E—FIXED CONSTRUCTIONS
    • E02—HYDRAULIC ENGINEERING; FOUNDATIONS; SOIL SHIFTING
    • E02B—HYDRAULIC ENGINEERING
    • E02B3/00—Engineering works in connection with control or use of streams, rivers, coasts, or other marine sites; Sealings or joints for engineering works in general
    • E02B3/04—Structures or apparatus for, or methods of, protecting banks, coasts, or harbours
    • E02B3/046—Artificial reefs
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02W—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO WASTEWATER TREATMENT OR WASTE MANAGEMENT
    • Y02W30/00—Technologies for solid waste management
    • Y02W30/50—Reuse, recycling or recovery technologies
    • Y02W30/91—Use of waste materials as fillers for mortars or concrete

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Ocean & Marine Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Civil Engineering (AREA)
  • Structural Engineering (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Liquid Crystal (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

To realize an IC tester which can perform a test accurately. The present invention improves IC testers which test a driver for driving a liquid crystal display that outputs voltages corresponding to a plurality of grey levels based on a plurality of reference voltages. An apparatus according to the present invention is characterized by being provided with: a voltage dividing resistor section which generates a plurality of voltages by voltage division; and a plurality of multiplexers each of which selects one of the voltages generated by the voltage dividing resistor section and outputs a reference voltage for the driver for driving the liquid crystal display.
TW094112372A 2004-06-08 2005-04-19 IC tester TWI266066B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004169309A JP4600730B2 (en) 2004-06-08 2004-06-08 IC tester

Publications (2)

Publication Number Publication Date
TW200540437A TW200540437A (en) 2005-12-16
TWI266066B true TWI266066B (en) 2006-11-11

Family

ID=35586252

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094112372A TWI266066B (en) 2004-06-08 2005-04-19 IC tester

Country Status (3)

Country Link
JP (1) JP4600730B2 (en)
KR (1) KR100698565B1 (en)
TW (1) TWI266066B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106908971B (en) * 2017-04-28 2019-02-01 南京中电熊猫平板显示科技有限公司 The binding blocking apparatus and its binding hold-up interception method of liquid crystal display panel
KR102374712B1 (en) * 2017-07-03 2022-03-17 삼성전자주식회사 Test interface board having transmission line to merge signals, test system using the same, and test system

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03156623A (en) * 1989-11-15 1991-07-04 Fanuc Ltd Cooling method for controller
JPH05164576A (en) * 1991-12-13 1993-06-29 Yokogawa Electric Corp Vme measurement system
JPH0634717A (en) * 1992-07-16 1994-02-10 Fujitsu Ltd Testing device for liquid crystal-driven ic device and its testing method
JP3292070B2 (en) * 1995-12-19 2002-06-17 横河電機株式会社 D / A converter
JPH10142277A (en) * 1996-11-06 1998-05-29 Fujitsu Takamizawa Component Kk Signal generating device
JPH10332785A (en) * 1997-05-29 1998-12-18 Ando Electric Co Ltd Calibration circuit
JPH11194155A (en) * 1998-01-06 1999-07-21 Mitsumi Electric Co Ltd Voltage measuring circuit
JP3594125B2 (en) * 2000-07-25 2004-11-24 シャープ株式会社 DA converter and liquid crystal driving device using the same
JP3617621B2 (en) * 2000-09-29 2005-02-09 シャープ株式会社 Semiconductor integrated circuit inspection apparatus and inspection method thereof
JP3874164B2 (en) * 2000-10-26 2007-01-31 横河電機株式会社 IC tester
JP2003131626A (en) * 2001-10-25 2003-05-09 Toshiba Corp Display device

Also Published As

Publication number Publication date
JP4600730B2 (en) 2010-12-15
KR100698565B1 (en) 2007-03-22
TW200540437A (en) 2005-12-16
JP2005351632A (en) 2005-12-22
KR20060045818A (en) 2006-05-17

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees