200540437 九、發明說明： 【發明所屬之技術領域】 本發明係關於一種根據複數個基準電壓，以對於用以 輸出多級電壓之液晶驅動器進行測' 或之積體電路 (，她d Cl謂t，IC)測試器（tester)，尤有關於—種能精 確進行測試的ic測試器。 【先前技術】 液晶驅動器係從複數個接腳（p i n )輪出相對於複數個 基準電壓之多階段（多級）的比電塵，以進行液晶顯示器的 驅動。用以測試此種液晶驅動器的IC測試器，業已揭示於 專利文獻1等。以下使用第2圖說明。 丁、 [專利文獻1]日本特開平6-34717號公報 在第2圖中，電屋產生部M係依照作為被測試對象之 液晶驅動器（以下稱DUT(Device Under如受測試元 件）)1〇之基準電壓接腳的每_通道而設置，以產生美準電 ^再者，電麗產生部Μ係由：D/A(DigitV〇g， 類比）轉換器（晴verter)1、2 ;緩衝器⑽叫3、* ; 5’放大器6所構成°D/A轉換器1係連接於控制 :隹CB’用以輸入基準電壓之電壓資料的上位位元， ::預疋的電壓V1為基準’產生與電壓資料之上位位元 二' 〇Ο/A轉換器2係連接於控制匯流排CB，用 以輸入電愿資料的下位位元，並以内部㈣V2為基準， f生：下位位元對應之電壓。緩衝器3係用以輸入"A ’換為】之輸出。緩衝器4係用以輸入D/A轉換器2之 3】6984 5 200540437 Γ:二算部5係用以加算緩衝器3、4之輸出。放大器6 厂聖㈣之輪出予以放大，並當作斯1〇的基準電 以下說明此種裝置的動作。從未圖示之控制部經由控 匯流？ CB ’將電壓資料輸入於D/A轉換器！、2。D, 輅換1係經由緩衝器3將上位位元之電屢資料的電壓 予輸出而且’ D/A轉換器2係經由緩衝器4將下位 電壓資料的電麼予以輸出。再者，加算部5係將緩 U 、4之輸出^以輸入並加算，再以放大器6將加算部 5的輸出予以放大，並當作而1()的基準電壓而輸出。 者WT 10係從未圖示之數位信號產生部將數位信號 千以輪入’並根據基準電麗，將與數位信號相對應之多級 电壓予以輸出’且根據該輸出’以判定藉由忆 測的DUT 10是否良好。 【發明内容】 [發明所欲解決之課題] /液晶驅動器之基準電壓係隨著近年來的多級化，而必 須有例如18階（level)之複數階。然而，由於使用d/A轉 :器1、2,因此在電壓產生部M之通道間產生誤差，而 會有無法精確進行測試的問題點。 本發明係有鑑於上述問題而研創者，其目的在提供一 種能精確進行測試之1C測試器。 [解決問題之方案] 為了達成此種目的，本發明之申請專利範圍第〗項之 316984 200540437 發明係-種i (:測試器，根據複數個基準電壓而對於用以乂 出多級電壓之液晶驅動器進行測試者，其特徵為具備：= 由分壓以產生複數個電壓之分壓電阻部；以及選擇唁八: 電阻部之電麗，且將前述液晶驅動器之基準電麼予以ς = 之複數個多工器（mu】tiplexer)。 ⑴ 本發明之申請專利範圍第2項之發明係如申 圍第1狀1C測試器，其卜係設有：以前述分壓電阻^ 所產生之丽述複數個電壓之中任一電壓為基準，以200540437 IX. Description of the invention: [Technical field to which the invention belongs] The present invention relates to an integrated circuit (or her integrated circuit) for measuring a liquid crystal driver for outputting multi-level voltages based on a plurality of reference voltages (she d Cl refers to t , IC) tester (tester), especially about an ic tester that can accurately test. [Prior art] The LCD driver uses a plurality of pins (p i n) to rotate the specific electric dust in multiple stages (multi-stages) relative to the plurality of reference voltages to drive the LCD. An IC tester for testing such a liquid crystal driver has been disclosed in Patent Document 1 and the like. The following description uses FIG. 2. D. [Patent Document 1] Japanese Unexamined Patent Publication No. 6-34717 In the second figure, the electric house generation unit M is based on a liquid crystal driver (hereinafter referred to as a DUT (Device Under)) under test 1. The reference voltage pin is set for each channel to generate the US standard power. Furthermore, the power generation unit M is composed of: D / A (DigitV0g, analog) converter (Clear verter) 1, 2; buffer The device tweets 3, *; ° D / A converter 1 composed of 5 'amplifier 6 is connected to the control: 隹 CB' is used to input the upper bit of the voltage data of the reference voltage, :: The pre-voltage V1 is used as the reference 'Generation and voltage data upper bit two' 〇 / A converter 2 is connected to the control bus CB, used to input the lower bit of electrical data, and based on the internal ㈣V2, f: lower bit Corresponding voltage. The buffer 3 is used for inputting " A 'for output. Buffer 4 is used to input 3 of D / A converter 2] 6984 5 200540437 Γ: The second calculation unit 5 is used to add the outputs of buffers 3 and 4. The amplifier of the 6th plant of the amplifier is amplified and used as a reference for the 10th. The operation of this device will be described below. Control flow through control section not shown? CB ’Input the voltage data to the D / A converter! ,2. D, change 1 is to output the voltage of the higher-level data through the buffer 3, and 'D / A converter 2 is to output the voltage of the lower-level voltage data through the buffer 4. In addition, the adding unit 5 inputs and adds the outputs ^ of U and 4, and then amplifies the output of the adding unit 5 with an amplifier 6 and outputs it as a reference voltage of 1 (). The WT 10 is a digital signal generation unit (not shown) turns the digital signal on by turns and outputs a multi-level voltage corresponding to the digital signal according to the reference signal. Tested DUT 10 is good. [Summary of the Invention] [Problems to be Solved by the Invention] / As the reference voltage of the liquid crystal driver has been multi-leveled in recent years, it is necessary to have a plurality of levels such as 18 levels. However, since d / A converters 1 and 2 are used, an error occurs between the channels of the voltage generating section M, and there is a problem that the test cannot be performed accurately. The present invention has been developed in view of the above-mentioned problems, and an object thereof is to provide a 1C tester capable of accurately performing a test. [Solutions to solve the problem] In order to achieve such a purpose, the invention patent application range of the present invention is 316984 200540437. The invention is a kind of i (: tester, according to a plurality of reference voltages, for the liquid crystal used to generate multi-level voltage Drivers who perform tests are characterized by: = a voltage-dividing resistor section that divides the voltage to generate a plurality of voltages; and select 28: the resistance of the resistor section, and the reference voltage of the aforementioned liquid crystal driver is Π = plural Multiplexer (mu) tipper. 发明 The second invention of the scope of patent application of the present invention is the 1st tester 1C of the application, which is provided with: the beautiful description generated by the aforementioned voltage dividing resistor ^ Any one of a plurality of voltages as a reference,
St::器；以及編A轉換器之輸出與前： 壓之加算部。 心巷早电 /發明之申請專利範圍第3項之發明係如 圍第1項或第2項之1C測試器，其中，‘前述八带 由·在爹考（reference)電壓到接地間串聯連 阻所構成。 饭歎個包 ”本發明之申請專利範圍第4項之發明係 裔’根據複數個基準電壓而對於用以輸出多級電 驅動器進行測試者，其特徵為設有：具有至少電壓匯^ 之^板(backplane bGard);對該底板設成可卸除，藉由複數 的分堡’產生複數個電壓，且將前述複數個電麼輸 =河述電壓匯流排之參考電屋板；以及對前述底板設成 =除’經由前述電壓匯流排以選擇前述複數個電璧，且 :載用以輸出前述液晶驅動器之基準電屋之 的铍數個電壓產生板。 夕 316984 200540437 本發明之申請專利範圍第5項之發明係如申請專利範 圍苐4項之IC測試器，其中，前述電壓產生板係具 前述參考電壓板所產生之前述複數個電壓之中任一電壓為 t 丁以產生電壓之D/A轉換器；以及將該D/A轉換 杰之輸出與前述多工哭夕仏 、 纪|、隹+ 。。之輪出予以加算，以當作前述液晶 馬£動裔之基準電壓。 本發明之申諳直如1 ^ m ^ T月專利乾圍弟6項之發明係如申請專利範 国弟1項或弟4項夕τη、日丨^丄、 你Λ 、， 、之ic測減器，其中，前述複數個多工器 Μ艮據刖述基準電壓之電壓資料的上位位元而選擇電壓。 本發明之申請專利範圍第7項之發明係 = 項之1C測試器，其中，前述D"轉換】 電壓。^ 34基準電壓之電壓資料之下位位元對應之 [發明之功效] 依據本發明，係具有下列功效。 多㈣申請專利範圍第1項至第3項之發明，由於係由 夕工器選擇分壓電阻邱 田、V'由 電壓，因此可抑制液：J 設為液晶驅動器之基準 於溫度mf、: 接腳間的誤差。而且，由 電心/不，產生的影響遍及液晶驅動器之所有基準 兔壓接腳，且右用η认， 丨Θ签平 確度會成為問曰員，田"a電壓比的液晶驅動器中，相對精 換丄 ’、^ 此可忽視因溫度漂移所產生的影響。 換舌之，可精確地進行測t式。 依據申請專利範圍笼 ^ LV yV n 弟2項之發明，由於D/ A轉換 ν'以分壓電阻部之分 4供⑽ 土為基午，且將例如下位位元之電壓 316984 200540437 資料的電麼予以輪ψ 、，# 並f出至、、存日，亚赭加异部加异多工器的輸出， 亚褕出至液晶驅動器，因此可维持相對 確地獲得高分解度的輪出。 π%可釦 #依據申請專利範圍第4、5項之發明，由於係 哭 遥擇參考電壓板之分塵，执、曰 00 因此可抑制液晶弓區動哭之技 動器之基準電星’ 漂移（d,產生的影響遍及液晶驅動器之所有基準 成為問題，因此可忽視因溫/^斤動;W相確度會 可精確地進行測試。“㈣產生的f彡響。換言之’ 亚且，由於藉由底板將參考電屡板、電 可卸除之構成，因此可容易進行各板的更換。板故成St :: device; and the output and front of the A converter: the addition unit. Xinxiang Early Electricity / Invention The scope of the invention of the third patent application is the 1C tester of the first or the second, in which the aforementioned eight bands are connected in series from the reference voltage to the ground Resistance. The "invention package" item 4 of the patent application scope of the present invention is based on a plurality of reference voltages for testing a multi-stage electric driver for output, and is characterized by: having at least a voltage sink ^ (Backplane bGard); the base plate is detachable, a plurality of voltages are generated by a plurality of divisions, and the aforementioned plurality of electric power transmission = a reference electric roof board of a river bus; and The bottom plate is set to = Divide 'through the aforementioned voltage bus to select the aforementioned plurality of voltages, and: a beryllium voltage generating board carrying a reference electric house for outputting the aforementioned liquid crystal driver. Xi 316984 200540437 The scope of patent application of the present invention The invention of item 5 is the IC tester as in the scope of application patent item No. 4 item, in which the voltage generating board has any one of the plurality of voltages generated by the reference voltage board as t D to generate voltage D. / A converter; and the output of the D / A converter and the aforementioned multi-tasking cry, ||, 隹 +, etc. are added and used as the reference voltage of the aforementioned liquid crystal horse. invention Shen Xun's 6 inventions, such as 1 ^ m ^ T patent, were patent applications for Fan Guodi 1 or 4 xi τη, RI ^ ^, you Λ,,, ic measuring device, Among them, the aforementioned plurality of multiplexers Mgen select the voltage according to the upper bits of the voltage data of the reference voltage. The invention of item 7 of the present invention's application scope is the 1C tester of item, wherein the aforementioned D " [Transformation] Voltage. ^ 34 [Effect of Invention] corresponding to the bits below the voltage data of the reference voltage. According to the present invention, it has the following effects. The inventions of the first to the third patent application scope are due to Yuxi The voltage is selected by the divider resistor Qiu Tian and V ', so the liquid: J is set as the reference of the LCD driver and the error between the temperature mf and the pins. Moreover, the influence caused by the core / no affects the liquid crystal. All the reference rabbit crimp pins of the driver are identified with η on the right, and the signing accuracy of Θ will become the question. In the LCD driver with a voltage ratio of "Tian", the relative fine-tuning is relatively neglected. This can be ignored due to temperature drift. The impact. In other words, it can be accurately measured Type t. According to the invention of the scope of the patent application ^ LV yV n 2 inventions, since the D / A conversion ν 'is divided by 4 of the voltage-dividing resistor section, the earth is the base, and the voltage of the lower bit is 316984 200540437 The data of the data is rounded to ψ ,, #, and f are output to, and stored, and the output of the multiplexer is added to the multiplexer and the multiplexer is output to the liquid crystal driver, so it can maintain a relatively high resolution. Turn out. Π% 可 扣 # According to the inventions in claims 4 and 5 of the scope of the patent application, because the remote control selects the reference voltage plate for dust separation, and executes 00, it is a benchmark that can suppress the crying movement of the LCD bow area. Telestar's drift (d, the impact across all benchmarks of the LCD driver becomes a problem, so it can be ignored due to temperature / thickness; W phase accuracy can be tested accurately. "㈣" produced by ㈣. In other words, since the reference board is detached from the reference board and the board is removable, the board can be easily replaced.
依據申請專利範圍第5項之發明，由於DA =:蒼考繼之分昼為基準，且將例如下位位元之電； 電壓予以輸出，並藉由加算部加算多工器的二4 亚知出至液晶驅動器，因此可維持相對精確度 確地獲得高分解能力的輸出。 寸可知 【實施方式】 [發明之實施形態] ^下使闕式詳細說明本發明^圖為表 之:貫施例之構成圖。在此，與第 凡件符號並省略其說明。 、丁相同 在第1圖中，分壓電阻部7係藉 壓，且由電阻R1至R8所構成+… 生硬數個電 所構成。電阻R]至R8係 316984 9 200540437 接在參考電壓VR到接絀鬥，收夹土； 電厚予以八脉 電壓VR與接地間的 之；且的:二靡之各線係連接於相鄰接 運接2或接地。多工器8係取代D/ 立:設置，且連接於控制匯流叫並輸入電塵資料的： 二：昼電阻部7之電塵，並予以輸出至緩衝器 係連接於控龍流排CB，並輸人電壓資料的 “立兀，且經由電壓匯流排B，將分壓電阻部 =之例如電阻R1、R2之連接點的電位設為基準，將盘 下位位兀對應之電壓輸出至緩衝器4。 、 cB' 將才工制匯〜排CB連接於未圖示之控制 二。^考電塵板RB係印刷基板，係以可卸除方式連接於 :二P’且搭载有分墨電阻部7。複數個電屋產生板μ 2 P刷基板，細可卸除方式連接於底板Bp ，複數個電壓產生部M。 秋兩 =下說明此種裝置之動作。從未圖示之控制部經由控 制匯流排CB，使電壓資料輸入至多工器1、D/A轉換器 多二器8係藉由上位位元之電壓資料，經由電壓匯流： t壓電阻部7之分壓，並經錢衝器3，以輸出所 4的分壓。此外，D/A轉換器9係以電阻^及電阻 们之連接點之電位為基準，經由緩衝器4,將下位位元之 電壓資料的電壓予以輸出。再者，加算部$係用以輸入緩 衝益3、4的輸出並將該等輪出予以加算，且藉由放大哭6 316984 10 200540437 將加算部5的輪出予以放大，並當作贿ι〇的基準電壓 :輸出。再者，DUT 1()係從未圖示之數位信號產生料 被位信號輸人’並根據基準電歷，將與數位信號對應之多 ，電壓予以輪出，且根據該輸出，以1(：測試器判定液晶二 動器是否良好。According to the invention in the scope of application for patent No. 5, since DA =: Cang Kaojii's daylight time is used as the reference, and for example, the electricity of the lower bit is output; the voltage is output, and the multiplexer's 2 4 subdivision is added by the addition unit Out to the liquid crystal driver, it is possible to maintain a relatively accurate output with high resolution. It can be known that [Embodiment] [Implementation Mode of the Invention] The present invention will be described in detail using the formula below. The figure is a table showing the structure of the embodiment. Here, the same reference numerals are used and the description is omitted. Same as Ding In the first figure, the voltage-dividing resistor section 7 is borrowed, and it is composed of resistors R1 to R8 + ... made of several rigid electric units. Resistance R] to R8 are 316984 9 200540437 Connected to the reference voltage VR to the receiver bucket, and the soil is clamped; the electric thickness is between the eight-pulse voltage VR and the ground; and: the two wires of the Ermi line are connected to the adjacent transport Connect 2 or ground. The multiplexer 8 series replaces the D / Li: setting, and is connected to the control bus and inputs the electric dust data: Second: the electric dust of the day resistance section 7 and outputs it to the buffer system is connected to the control dragon current bar CB, And input the voltage data “Liu Wu”, and through the voltage bus B, set the potential of the connection point of the voltage-dividing resistor section = such as resistors R1 and R2 as the reference, and output the voltage corresponding to the lower position of the disk to the buffer 4., cB 'Connect the working system to the row CB to the control not shown in the figure. ^ The test RB is a printed circuit board, which is detachably connected to: two P' and is equipped with an ink separation resistor. Section 7. A plurality of electric house generating boards μ 2 P brush the substrate, which are detachably connected to the bottom plate Bp, and a plurality of voltage generating sections M. Autumn two = the following describes the operation of this device. The control section is not shown Via the control bus CB, the voltage data is input to the multiplexer 1, the D / A converter, and the multiplier 8 is the voltage data from the upper bit, and then the voltage bus: the voltage divided by the t-voltage resistor 7 and the money Pulsator 3 to output the divided voltage of 4. In addition, D / A converter 9 uses resistors ^ and the connection points of the resistors The potential is used as a reference, and the voltage of the voltage data of the lower bits is output through the buffer 4. Furthermore, the adding unit $ is used to input the outputs of the buffer benefits 3 and 4, and to add these rounds out, and borrow Crying by amplification 6 316984 10 200540437 Amplifies the rotation of the adding unit 5 and uses it as the reference voltage of the output: output. In addition, DUT 1 () is a digital signal output from a digital signal not shown in the figure. According to the reference electric calendar, the person's voltage is rounded out as much as the digital signal, and according to the output, 1 (: tester is used to determine whether the liquid crystal second actuator is good.
、如此5由於係由多工器選擇分壓電阻部7之分壓，且 設：DUT 10之基準電壓’因此可抑制贿1〇之：腳間 瞻的决差。而且，由於溫度漂移（drift)產生的影響遍及於 10之所有基準電壓接腳，且在用以輸出電壓比的DUT 中相對精確度會成為問題，因此可忽視因為溫度漂移所 產生的影響。換言之，可精確地進行測試。 亚且，由於並未藉由電阻分壓來分配下位位元之電 位，而是藉由D/A轉換器9輸出下位位元之電位的構成 ^此=會受到下位電位分配時之配線所產生之雜訊等的影 曰藉此由方；D / A轉換器9係以分壓電阻部7之分壓 鲁為基，，且將下録元之電歸料的電壓予以輸出，並藉 由加算部5加算放大器3的輸出，並輸出至DUT ι〇，因 此可維持相對精確度，同時可精確地獲得高分解能力的輸 出0 再者，由於藉由底板BP將參考電壓板、電壓產生 B叹成可卸除之構成，因此可容易進行各板的更換。 另外，本發明並不以該實施例為限，雖顯示設有緩衝 哭 Λ Λ ϋσ 之構成，然而亦可設成多工器8、D / Α轉換器9 直接輪出至加算部5之構成。 316984 200540437 點之年位為美^轉換器9雖顯示係以電阻R1、R2之連雄 “為基準，游電壓予以輸出之 連矣 5壓電阻部7之其他電位(亦 ’:、、'、而亦可使用 電阻之各連接點的電位）。此時/亦可It之外之相鄰接之 到加算部5的路徑上钟 在仅D/α轉換器9 衡器4,設置用以衰二/丁衷減的衰減器，或是取代缓 或者是以加算部5 換器9之輸出的放大器， 再進行加算之構成亦ΙΓ轉換器9之輸出予以衰減後 此外，亦可取代用以輸出下位位元之資斜 換器9,而與分壓電阻部工^、、 A轉 rgr. _ 8 W 樣地，設 W 1 /ΒΕΙ 八 遂電阻部與複數個多工器之構成亦無妨。…個刀 大二二加算部5、放大器6亦可藉由以電阻與運算放 斤構成之加算電路構成。而且，亦可不設置放大哭6， 而設成由加算部5進行放大之構成。 緩衝器4、加算部 多工器8、緩衝器 此外’雖顯示設置D/A轉換器9、 鲁5、放大器6之構成，然而亦可設成藉由 3 ’將基準電壓輸出至DUT 10之構成。 【圖式簡單說明】 第1圖為表示本發明之一實施例之構成圖。 第2圖為表示習知ic測試器之構成圖。 【主要元件符號說明】 、2 D/A(Digital/Ana】og，數位/類比）轉換器 1、4 緩衝？§ (buffer) 5 加算部 > 放大器 7 分壓電阻部 316984 12 200540437 8 多工器 9 D/A轉換器 10 作為被測試對 象之液 晶驅動器（Device Under Test， DUT) B 電壓匯流排 BP 底板 CB 控制匯流排 Μ 電壓產生部 R1至 R8 電阻 RB 參考電壓板 V 電壓 VB 電壓產生板 VR 參考電壓 3169845 This is because the multiplexer selects the voltage division of the voltage division resistor section 7 and sets: the reference voltage of DUT 10 ', so it can suppress the bridging of 10: the difference between the feet. In addition, because the effect of temperature drift (Drift) spreads across all the reference voltage pins, and the relative accuracy in the DUT used to output voltage ratio will become a problem, the effect of temperature drift can be ignored. In other words, testing can be performed accurately. Moreover, since the potential of the lower bit is not distributed by the resistance voltage division, but the structure of the potential of the lower bit is output by the D / A converter 9 ^ this = will be generated by the wiring when the lower potential is allocated The D / A converter 9 is based on the voltage divider of the voltage-dividing resistor section 7, and outputs the voltage of the electrical data of the recording unit. The adding unit 5 adds the output of the amplifier 3 and outputs it to the DUT ι. Therefore, the relative accuracy can be maintained, and at the same time, an output with high resolution can be accurately obtained. Furthermore, the reference voltage plate and the voltage B are generated by the base plate BP. Since it is detachable, it is easy to replace each board. In addition, the present invention is not limited to this embodiment. Although it is shown that a buffer Λ Λ 哭 σ is provided, the multiplexer 8 and the D / Α converter 9 may be directly rotated to the addition unit 5 . 316984 200540437 The year is US ^ Although converter 9 shows that it is based on the resistance of R1 and R2, the other potential of the voltage resistance part 7 (also ': ,,', It is also possible to use the potential of each connection point of the resistor.) At this time, or the path adjacent to the addition section 5 other than It is clocked at only the D / α converter 9 and the weighing device 4, and is set to decay. The attenuator of / minimum reduction can either replace the amplifier that is slow or use the output of the converter 5 and the converter 9 and then perform the addition. The output of the converter 9 is also attenuated. In addition, it can also be used to replace the lower output. Bit-wise converter 9 and the same as the voltage divider resistor section ^ ,, A to rgr. _ 8 W Sample, it is also possible to set up the structure of W 1 / ΒΕΙ Basui resistor section and a plurality of multiplexers .... Each of the knives and the second adding unit 5 and the amplifier 6 can also be constituted by an adding circuit constituted by a resistor and an operating amplifier. Moreover, instead of providing the amplification circuit 6, it can also be constructed by the adding unit 5. 4. Adding unit multiplexer 8. Buffer. In addition, although the D / A converter 9, Lu 5, amplifier 6 are displayed. Structure, however, it is also possible to set the structure to output the reference voltage to the DUT 10 by 3 '. [Brief description of the figure] Figure 1 is a structural diagram showing an embodiment of the present invention. Figure 2 is a conventional IC Structure of the tester. [Description of main component symbols], 2 D / A (Digital / Ana) og converters, 1 and 4 buffering? § (buffer) 5 adding section > amplifier 7 voltage dividing resistor section 316984 12 200540437 8 Multiplexer 9 D / A converter 10 Device under test (DUT) as the test object B Voltage bus BP Backplane CB Control bus M Voltage generation section R1 to R8 Resistor RB Reference voltage board V voltage VB voltage generating board VR reference voltage 316984