TWI263911B - System and method of generating simulated diffraction signals for two-dimensional structures, and computer-readable medium thereof - Google Patents

System and method of generating simulated diffraction signals for two-dimensional structures, and computer-readable medium thereof

Info

Publication number
TWI263911B
TWI263911B TW092128747A TW92128747A TWI263911B TW I263911 B TWI263911 B TW I263911B TW 092128747 A TW092128747 A TW 092128747A TW 92128747 A TW92128747 A TW 92128747A TW I263911 B TWI263911 B TW I263911B
Authority
TW
Taiwan
Prior art keywords
simulated diffraction
diffraction signals
computer
readable medium
dimensional structures
Prior art date
Application number
TW092128747A
Other languages
English (en)
Other versions
TW200413955A (en
Inventor
Joerg Bischoff
Xin-Hui Niu
Original Assignee
Timbre Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Timbre Tech Inc filed Critical Timbre Tech Inc
Publication of TW200413955A publication Critical patent/TW200413955A/zh
Application granted granted Critical
Publication of TWI263911B publication Critical patent/TWI263911B/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4788—Diffraction

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Data Mining & Analysis (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Analysis (AREA)
  • Pure & Applied Mathematics (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Algebra (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
TW092128747A 2002-10-17 2003-10-16 System and method of generating simulated diffraction signals for two-dimensional structures, and computer-readable medium thereof TWI263911B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/274,252 US7427521B2 (en) 2002-10-17 2002-10-17 Generating simulated diffraction signals for two-dimensional structures

Publications (2)

Publication Number Publication Date
TW200413955A TW200413955A (en) 2004-08-01
TWI263911B true TWI263911B (en) 2006-10-11

Family

ID=32093013

Family Applications (1)

Application Number Title Priority Date Filing Date
TW092128747A TWI263911B (en) 2002-10-17 2003-10-16 System and method of generating simulated diffraction signals for two-dimensional structures, and computer-readable medium thereof

Country Status (8)

Country Link
US (1) US7427521B2 (zh)
JP (1) JP4805579B2 (zh)
KR (1) KR101058476B1 (zh)
CN (1) CN100442067C (zh)
AU (1) AU2003279290A1 (zh)
DE (1) DE10393515T5 (zh)
TW (1) TWI263911B (zh)
WO (1) WO2004036142A2 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI472744B (zh) * 2009-09-24 2015-02-11 Asml Netherlands Bv 用於模型化顯微鏡結構之電磁散射特性之方法與裝置及重建顯微鏡結構之方法與裝置

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US7330279B2 (en) * 2002-07-25 2008-02-12 Timbre Technologies, Inc. Model and parameter selection for optical metrology
US20040090629A1 (en) * 2002-11-08 2004-05-13 Emmanuel Drege Diffraction order selection for optical metrology simulation
US7630873B2 (en) * 2003-02-26 2009-12-08 Tokyo Electron Limited Approximating eigensolutions for use in determining the profile of a structure formed on a semiconductor wafer
US7388677B2 (en) * 2004-03-22 2008-06-17 Timbre Technologies, Inc. Optical metrology optimization for repetitive structures
US20080144036A1 (en) * 2006-12-19 2008-06-19 Asml Netherlands B.V. Method of measurement, an inspection apparatus and a lithographic apparatus
US7791727B2 (en) 2004-08-16 2010-09-07 Asml Netherlands B.V. Method and apparatus for angular-resolved spectroscopic lithography characterization
US20060187466A1 (en) * 2005-02-18 2006-08-24 Timbre Technologies, Inc. Selecting unit cell configuration for repeating structures in optical metrology
US7355728B2 (en) * 2005-06-16 2008-04-08 Timbre Technologies, Inc. Optical metrology model optimization for repetitive structures
US7525672B1 (en) 2005-12-16 2009-04-28 N&K Technology, Inc. Efficient characterization of symmetrically illuminated symmetric 2-D gratings
US7428060B2 (en) * 2006-03-24 2008-09-23 Timbre Technologies, Inc. Optimization of diffraction order selection for two-dimensional structures
US20080013107A1 (en) * 2006-07-11 2008-01-17 Tokyo Electron Limited Generating a profile model to characterize a structure to be examined using optical metrology
US8069020B2 (en) * 2007-09-19 2011-11-29 Tokyo Electron Limited Generating simulated diffraction signal using a dispersion function relating process parameter to dispersion
US20110276319A1 (en) * 2010-05-06 2011-11-10 Jonathan Michael Madsen Determination of material optical properties for optical metrology of structures
CN102385569B (zh) * 2011-10-20 2014-07-02 睿励科学仪器（上海）有限公司 一种用于计算周期性介质傅立叶系数的方法
CN103390094B (zh) * 2012-05-10 2016-09-14 睿励科学仪器（上海）有限公司 用于计算光源入射到介质的散射电磁场分布的方法
CN103631761B (zh) * 2012-08-29 2018-02-27 睿励科学仪器（上海）有限公司 并行处理架构进行矩阵运算并用于严格波耦合分析的方法
WO2017063839A1 (en) * 2015-10-12 2017-04-20 Asml Netherlands B.V. Methods and apparatus for simulating interaction of radiation with structures, metrology methods and apparatus, device manufacturing method
CN107345788A (zh) * 2016-05-04 2017-11-14 中国科学院福建物质结构研究所 一种平行光微光斑光学关键尺寸分析装置及检测方法
CN108120371A (zh) * 2016-11-30 2018-06-05 中国科学院福建物质结构研究所 亚波长尺度微电子结构光学关键尺寸测试分析方法及装置
US20200264879A1 (en) * 2019-02-20 2020-08-20 Nanjing Iluvatar CoreX Technology Co., Ltd. (DBA "Iluvatar CoreX Inc. Nanjing") Enhanced scalar vector dual pipeline architecture with cross execution

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JP3551551B2 (ja) * 1995-06-20 2004-08-11 株式会社ニコン 凹凸形状測定方法及び測定装置
US5777729A (en) * 1996-05-07 1998-07-07 Nikon Corporation Wafer inspection method and apparatus using diffracted light
JP4601731B2 (ja) 1997-08-26 2010-12-22 株式会社半導体エネルギー研究所 半導体装置、半導体装置を有する電子機器及び半導体装置の作製方法
US6256100B1 (en) 1998-04-27 2001-07-03 Active Impulse Systems, Inc. Method and device for measuring the thickness of thin films near a sample's edge and in a damascene-type structure
CN1303397C (zh) * 2000-01-26 2007-03-07 音质技术公司 为集成电路周期性光栅产生仿真衍射信号库的方法及系统
US6433878B1 (en) * 2001-01-29 2002-08-13 Timbre Technology, Inc. Method and apparatus for the determination of mask rules using scatterometry
JP2002260994A (ja) * 2001-03-05 2002-09-13 Tokyo Electron Ltd 基板処理装置
US6650422B2 (en) * 2001-03-26 2003-11-18 Advanced Micro Devices, Inc. Scatterometry techniques to ascertain asymmetry profile of features and generate a feedback or feedforward process control data associated therewith
US6864971B2 (en) * 2001-03-27 2005-03-08 Isoa, Inc. System and method for performing optical inspection utilizing diffracted light
US6785638B2 (en) * 2001-08-06 2004-08-31 Timbre Technologies, Inc. Method and system of dynamic learning through a regression-based library generation process
US6721691B2 (en) * 2002-03-26 2004-04-13 Timbre Technologies, Inc. Metrology hardware specification using a hardware simulator

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI472744B (zh) * 2009-09-24 2015-02-11 Asml Netherlands Bv 用於模型化顯微鏡結構之電磁散射特性之方法與裝置及重建顯微鏡結構之方法與裝置

Also Published As

Publication number Publication date
WO2004036142A2 (en) 2004-04-29
TW200413955A (en) 2004-08-01
JP4805579B2 (ja) 2011-11-02
CN100442067C (zh) 2008-12-10
JP2006503294A (ja) 2006-01-26
US20040078173A1 (en) 2004-04-22
WO2004036142A3 (en) 2004-12-02
US7427521B2 (en) 2008-09-23
KR20050051693A (ko) 2005-06-01
AU2003279290A1 (en) 2004-05-04
CN1705888A (zh) 2005-12-07
AU2003279290A8 (en) 2004-05-04
DE10393515T5 (de) 2005-10-06
KR101058476B1 (ko) 2011-08-24

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