TWI231319B - Single crystal manufacturing apparatus and method - Google Patents
Single crystal manufacturing apparatus and method Download PDFInfo
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- TWI231319B TWI231319B TW92110133A TW92110133A TWI231319B TW I231319 B TWI231319 B TW I231319B TW 92110133 A TW92110133 A TW 92110133A TW 92110133 A TW92110133 A TW 92110133A TW I231319 B TWI231319 B TW I231319B
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
- C30B15/305—Stirring of the melt
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Abstract
Description
1231319 Λ 修正 曰 案號 92110133 五、發明說明(1) ____ 發明所屬之技術領域 本發明有關於一種施加磁場之半導體單姓曰制 法,以及供實施該製造方法的製 =日日衣造方 種伽單結晶的製造方法及製造以 直徑能承受大重量之半導體單結晶的上“頊縮部之 位化。 亚可達成無轉 先前技術 單結晶之製造方法雖然有各々 單結晶上拉,用工業量產的 ^做特別是關於矽 (czycrasky)法。 )了月b方式做廣泛的應用的以 第6圖為以CZ法製造矽單結晶的單結 剖面圖。通常,石夕單結晶之製造所使用之=置之縱 造,由内侧之石英掛禍2a與外側之石墨掛概為二層構 坩堝2的周圍配設有石墨製的加熱器3 構成。在 ^加熱器3所融溶”融溶液4。使用作為石 …上拉線5 ’其前端安裝有晶種 上拉 内側之石英坩堝2a藉由與矽融溶液4接觸,表面合 解,並在梦融溶液4中放出氧。由cZ法所製造之單 ^ ^掛瑪2a内的石夕融溶液4上拉而養成的緣故,成長的,、 單結晶含有從坩堝的石英(Si 〇2 )溶出的多量的氧。因 此’ IC及LSI的製程中,即使反覆做熱處理,也難以產生1231319 Λ Amendment No. 92110133 V. Description of the Invention (1) ____ Technical Field of the Invention The present invention relates to a method for manufacturing a semiconductor single name by applying a magnetic field, and a manufacturing method for implementing the manufacturing method. Manufacturing method of single crystal and manufacturing the "condensation part" of semiconductor single crystal whose diameter can withstand large weight. The method of manufacturing single crystal without prior art can be achieved. Although there are various single crystal pull-ups, industrial quantities are used. The production process is especially about the silicon (czycrasky) method.) Figure 6 is a single-junction cross-section view of silicon single crystals produced by the CZ method. The used = vertical structure is composed of a quartz heater 2a on the inner side and a graphite heater 3 on the outer side. The graphite heater 3 is arranged around the crucible 2. The heater 3 is melted and melted. Solution 4. It is used as a stone ... the pull-up wire 5 'is provided with a seed crystal at the front end of the pull-up. The quartz crucible 2a on the inner side is brought into contact with the silicon melting solution 4 and the surface is dissolved, and oxygen is released in the dream melting solution 4. The single crystal ^^^ produced by the cZ method is grown and pulled up, and the growing, single crystal contains a large amount of oxygen dissolved from the crucible's quartz (SiO 2). Therefore, in the process of IC and LSI, even if heat treatment is repeated, it is difficult to produce
7054-5628-PFl(Nl).ptc 第6頁 1231319 修正 曰 -----tit 921101,S3_年 月 五、發明說明(2) =及’曲。因此,内部的氧析出物在接近loot的熱處 不純物开^1密+度之凹陷層,減低存在於晶圓表面區域的 氧氣量董,lnslcgettering)。由溶入單結晶7的 況下,古曰 質產生各種影響的緣故,在使用CZ法的情 ' 有必要抑制進入單結晶7中的氧量。 用至:ί ::進入單結晶中的氧量的方法係將施加磁場並 用至CZ法的方法。該方法稱為MCZ丨 穷卫 ^:口口1 置el二applied以法),藉由設置於半導體 靖溶液施加磁場而提高 固液界面之月抑制矽融溶液的對流,減低伴隨對流的 養成。又,由,而可增進穩定之梦單結晶的 反應,有效地抑制矽單結晶中的氧 〇2) :於」乍為半導體用單結晶之工業量產方式 —般而言’藉由CZ法及MCZ法,最初脾a接= :接觸的種接中,使晶種與…液接:將:種與_ L進行所謂頸縮(neeking)而_2=而傳遞的轉 ^。其次藉由擴肩製矛呈,使結 度細的頸 ft轉位之石夕單結晶上拉。藉此,實施之口徑, ”ing法而廣為人知,用CZ法及MCZ法將=方法為Dash 狀恶之重要的製程。 、夕早結晶上拉的 然而,在MCZ法製造石夕單結晶 田轭加磁場而抑 7054-5628-PFl(N1).ptc 第7頁 1231319 年 月 曰 修正 _案號 92110133 五、發明說明(3) 制矽融溶液之對流,由於接近融溶表面的溫度變動變小, 固液介面成為安定的狀態。該結果使存在於晶種的g位不 向左右方向逃逸而殘留於頸縮部之内部,具有難以無轉位 化的問題。於此,在MCZ法中,為達成無轉位化,使用一 般的CZ法而亦藉由將矽單結晶上拉而使頸縮部的直徑細 直到轉位消除而必須形成較長的頸縮。 卫 ^ 在矽單結晶的製造中,上拉之矽單結晶之重量 部的直徑所限制,若超過限制重量,則頸縮部會 '、目百 有單結晶落下的危險性。特別是,近年來由於伴 晶的大口徑化,而重量增大,MCZ法之大重量夕早曰 之上拉更增加困難。例如,供製造3 0 0mm以上早m曰曰 圓而成長大重量之石夕單結晶的狀況下大口徑晶 發單結晶落下等安全上的問題。 1 & W具有誘 為解決上述之問題,記载於曰本 號公報的MCZ法,藉由在低 」特開干10-7484 部無須變成極細而在大口秤麥又行頸縮製程,頸縮 慢慢提高磁場強度並同時;”:、轉位化。然後,其後 單結晶安全地上拉。 仃擴肩製程,確保大重量之矽 發明内容 發明欲解決之課題 然而,在擴肩製巷士 之對流文到急逮礙p ,若施加簡單的磁場 之狀態變得非常的以縛。藉由該磁場束縛::=溶液 不文疋,矽融溶液的溫/夕融溶液 皿度出現大的變 7054-第8頁 1231319 曰 _案號 92110133 五、發明說明(4) 動。 通常,在無磁場的狀態下, 器的加熱而產生對流。因:匕,由:::的矽融溶液由加熱 掛堝内壁附近的矽融溶液加:所給予的熱對接;^ 流在=内,而使石夕融溶液全體σ=;Τ容液藉由對 對此’在施加磁場的狀熊 m度上升。 對流。因此,由加熱器所給;:敎::掛禍内石夕融溶液的 矽融溶液加熱,之後藉由非矽二t接近坩堝内壁附近的 較慢的向矽融溶液的中心部做;:;(:對;的熱傳導,比 較對流的熱傳量小,為確保坩 4。”、、傳導的熱傳量 點附近,掛堝内壁附近的融溶液的融溶液溫度在熔 在如上所述之擴肩製程中,d亡升。 場狀態變化至所希望的磁場強声=早地,加磁場,從無磁 起劇烈的變化,固液介面由 '、石夕融溶液的對流構造 升,此由實驗確知。融溶液之溫度下降又上 的梦單結晶之形狀控制困上拉 的問題。 /早…日日有產生轉位化 例如,在無磁場的狀態下進行 的接種,做完頸縮後使上拉 =二夕融洛液接觸 度慢慢地上升,石夕融溶液的溫度上使磁場強 縮部急速結晶成長的單社曰::動。該結果使從頸 的狀況下,單結ί形晶且磁場緩緩地上升 狀控制困難疋可以理解的。 又磁场強度緩緩上升,隨著矽融溶液的溫度變動之 7054-5628-PFl(Nl).ptc 第9頁 五、發明說明(5) =果’對頸縮部的直徑反覆地變大、縮小的單結曰^ 將轉位導入一次無轉位化的頸縮部。因此, ,%變動而產生矽融溶液之溫度變動的狀態下製^ : 單結晶有轉位化的可能性。如此磁場強度上男 、σ阳形狀之控制,在大容量的融溶液是困難的。 道μ ί 了解決上述之問題點,本發明之目的係提余 =單結晶之製造方法及製造裝置,不使大口徑、 之+導體單結晶頸縮部產生破裂而可安全地上拉。 1又,本發明之另一目的係提供一種半導體單駕 k方法及製造裝置,進行頸飨制 的轉位。 進仃頌鈿製程之際,可除去釋 解決課題之手段 為達成上述之目的,本於 # 的製造方法,其特徵為在無‘ c為:種 與矽融溶液接觸,並進行將上曰4下,使晶種 停止上述晶種上拉,而開始施力上t而收縮的 ^所希望之強度,☆已施加::二由於磁場強 述晶種。 努的狀恕下,再開始 又本發明之第二發明為如 造方法,其中在施加磁場前,边f 一發明之單結 強度上升至所希望之強度 S磁場強度上升中, 制。 X 進行上述矽融溶液之 又本發明之第三發明為如 造方法,其中在施加磁攻弟一發明之單結 或磁場強度上升中, 做X線 在伴隨 單結 中的單 一種半 大重量 晶之製 縮部中 單結晶 的前端 製程; 度上升 上拉上 晶的製 或磁場 溫度控 晶的製 或磁場 1231319 五、發明規^ 強度上升至 制。希望之強度後,進行上述石夕融溶^溫Μ 徵為:名^月之弟四發明為一種單結晶的赞+ 觸,4無罐場的狀態下,使晶種的前端盘;::!’其特 上拉,·::將上述晶種上拉而收縮的製程:、。溶液接 又±订上述矽融溶液之溫度控制後,門二上述晶種 晶的;々之第五發明為如上述第三或 4::::定的時間後’施制,經過 晶的製造方ίΠΓ月為如上述第二或第四發明… 1本;:上述㈣溶液之上述溫度;::據顯縮部直徑 造方法,复tb之第七發明為如上述第一發明之星έ士曰 上述矽融i上述上拉再開始後,在擴肩製程之二曰曰=製 峨/合夜之溫度控制。 表枉之則,進行 &本發明> @ 造方法,其中上述第—發明之單結晶的製 消伴隨上迷磁場強产==’在擴肩製程中,藉由抵 行石夕融溶液之溫度ς制升的上切融溶液溫度變化,而進 又本發明之第九發 谷上述各構件;其特徵為:在心;磁场;以及腔體’收 _ 在…、磁%的狀態下,使晶種的7054-5628-PFl (Nl) .ptc Page 6 1231319 Amendment ----- tit 921101, S3_Year 5. Description of the invention (2) = and ‘qu. Therefore, the internal oxygen precipitates open at a hot place close to the loot, and the impurity layer opens at a density of ^ 1 density + degree, which reduces the amount of oxygen existing in the wafer surface area (lnslcgettering). In the case where the single crystal 7 is dissolved, the ancient quality has various effects. When the CZ method is used, it is necessary to suppress the amount of oxygen entering the single crystal 7. The method used to: ί :: the amount of oxygen entering the single crystal is a method of applying a magnetic field to the CZ method. This method is called MCZ 丨 Wei Wei ^: Mouth 1 and el 2 are applied). By applying a magnetic field to the semiconductor solution, the solid-liquid interface is increased to suppress convection of the silicon melt solution, and to reduce the formation of convection. In addition, the reaction of the stable single crystal can be improved, and the oxygen in the silicon single crystal can be effectively suppressed. 2): "In the first instance, the industrial mass production method for single crystals for semiconductors-in general, by the CZ method In the MCZ method, the initial splenic a ==: contact seeding, the seed is connected with the liquid: the seed and _L undergo so-called necking and _2 = is transferred. Secondly, by expanding the spear, the Shi Xi single crystal with a narrow neck ft index is pulled up. With this, the implementation of the "" ing method is widely known, using the CZ method and the MCZ method to = method is an important process of Dash-like evil. , Year early crystal pull up However, the MCZ method is used to produce Shixi single crystal field Suppressed by the magnetic field 7054-5628-PFl (N1) .ptc Page 7 Rev. 1231319 _ Case No. 92110133 V. Description of the invention (3) The convection of the silicon melt solution is reduced due to the temperature change near the melt surface The solid-liquid interface is in a stable state. As a result, the g-site existing in the seed crystal does not escape in the left-right direction and remains inside the necked portion, which has a problem that it is difficult to achieve no translocation. Here, in the MCZ method, In order to achieve no indexing, the general CZ method is also used, and the diameter of the necked portion is narrowed by pulling up the silicon single crystal until the index is eliminated, and a longer necking must be formed. Wei ^ In silicon single crystal In manufacturing, the diameter of the weight portion of the silicon single crystal that is pulled up is limited. If the weight exceeds the limit, the necking portion may cause the single crystal to fall. In particular, due to the large diameter of the accompanying crystal in recent years, And the weight increases, the heavy weight of the MCZ method Pull-up is even more difficult. For example, for the production of large-diameter Shi Xi single crystals with a diameter of 300 mm or more and growing large weights, there are safety issues such as the drop of large-diameter single crystals. 1 & W In order to solve the above-mentioned problems, the MCZ method described in Japanese Patent Publication No. 10-7484 does not need to be extremely thin, and the necking process is carried out in large-mouth scale wheat. The necking gradually increases the magnetic field strength. At the same time; ":, transposition. Then, the single crystal is pulled up safely. 肩 Shoulder expansion process to ensure a large weight of silicon. SUMMARY OF THE INVENTION Problems to be solved by the invention. If p is disturbed, if a simple magnetic field is applied, the state becomes very constrained. By this magnetic field confinement:: = solution is not stable, the temperature of the silicon melt solution / the temperature of the melt solution changes greatly. Page 1231319 _Case No. 92110133 V. Description of the invention (4) Generally, convection occurs when the device is heated in the absence of a magnetic field. Because of the dagger, the silicon melt solution is heated by the near wall of the hanging pot: The silicon melt solution plus: the thermal docking given; ^ The flow is within, so that the entire Shi Xirong solution σ =; T capacity liquid rises by the degree of the magnetic field that is applied to it. Convection. Therefore, it is given by the heater; The silicon melting solution of the inner stone melting solution is heated, and then the non-silicon solution is used to approach the center of the silicon melting solution more slowly near the inner wall of the crucible;: (: pair; heat conduction, comparing the heat transfer of convection Small, to ensure crucible 4. ", the temperature of the molten solution near the inner wall of the hanging pot near the point of conductive heat transfer is melted in the shoulder expansion process as described above, and the temperature rises. The strong sound of the desired magnetic field = early, the magnetic field is applied, and the magnetic field changes drastically from non-magnetic. The solid-liquid interface rises from the convective structure of the Shi Xirong solution, which is confirmed by experiments. The shape of the dream single crystal that the temperature of the molten solution drops and the upper part controls the problem of pull-up. / Early ... There is a translocation every day. For example, inoculation performed in a state without a magnetic field, after the necking is done, the pull-up = Erxi Rongluo liquid contact slowly rises, and the temperature of Shixi Rong solution increases. Shan She, which makes the magnetic field strong shrinkage part grow rapidly, said :: Move. This result makes it difficult to control the single-junction crystal and the magnetic field rise slowly under the condition of the neck. It is understandable. In addition, the magnetic field strength gradually rises. With the temperature change of the silicon melt solution, 7054-5628-PFl (Nl) .ptc Page 9 V. Description of the invention (5) = Result: The diameter of the necked portion becomes larger and larger, Reduced single knot ^ Introduce the index to a necked portion without indexation. Therefore, when% is changed and the temperature of the silicon melt solution is changed, the single crystal may be transposed. It is difficult to control the male and sigma shapes in such a magnetic field in a large-capacity molten solution. Dao μ solves the above-mentioned problems, and the object of the present invention is to provide a method and a manufacturing apparatus for manufacturing a single crystal, which can safely pull up without causing a large diameter and a conductor single crystal neck portion to crack. Further, another object of the present invention is to provide a semiconductor single driving method and a manufacturing apparatus for performing indexing of a neck collar. When entering the chanting process, the means to solve the problem can be removed. In order to achieve the above purpose, the manufacturing method of # is characterized by the absence of 'c: the species is in contact with the silicon melt solution, and the above 4 times are performed.使 The desired strength of the seed crystal that stops the seed crystal pull-up and starts to apply force t and contract ☆ has been applied: 2: The seed crystal is said to be strong due to the magnetic field. Without further ado, start again The second invention of the present invention is a manufacturing method, in which the strength of a single junction of the invention f is increased to a desired strength before the magnetic field is applied, and the magnetic field strength is increased. The third invention of the present invention is to perform the above-mentioned silicon melting solution. The third invention of the present invention is a manufacturing method, in which a single junction of the invention is applied or the magnetic field strength is increased, and a single semi-heavy weight of the X-ray in the accompanying single junction is made. The front end process of the single crystal in the crystal shrinking part; the degree rises and pulls up the crystal or the magnetic field temperature controlled crystal or the magnetic field 1231319 5. The invention specifications ^ The intensity rises to the system. After the desired strength, the above-mentioned melting of the stone eve ^ temperature Μ sign is: the name of the ^ four brothers invented as a single crystal of praise + touch, 4 in the state of no tank farm, the seed disk front plate; :: !! ‘Its special pull-up, · :: a process of pulling up and shrinking the seed crystal:,. After the solution is connected to the temperature of the above-mentioned silicon melt solution, the second seed crystal is crystallized; the fifth invention is the same as the third or 4 :::: after a predetermined period of time, and the crystal is manufactured. Fang Yiyi is the second or fourth invention as described above ... 1; The above temperature of the above-mentioned rhenium solution; :: According to the method of making the diameter of the constricted part, the seventh invention of tb is the star of the first invention as described above After the above silicon melting and the above-mentioned pull-up are started again, the second step of the shoulder expansion process is to control the temperature of E / Heye. As shown in the table below, the & the present invention > manufacturing method is performed, in which the above-mentioned invention of the single crystal is eliminated and the magnetic field is strongly produced == 'In the process of expanding the shoulder, by using the Shi Xirong solution The temperature of the upper cutting and melting solution raised by the temperature changes, and the above-mentioned components of the ninth hair valley of the present invention are characterized by: in the heart; the magnetic field; Seeded
7054-5628-PFl(Nl).ptc 第11頁 坩堝’收容成長適當:晶製造裝置,包括: 該融溶液;上拉裳置,::=,溶液;加熱器,加熱 :成長單結晶;磁場施加=内=溶液表面接觸晶種, 1231319 五、發明說明(7) 前端與妙、 _ . _ 阳〉谷液接觸,並進行將上述S插μ ^ ,并:止上述晶種上拉,而開始施加二種上:而收縮的製 希望之強度,在已施加磁場::離:於磁場強度 γ,二:種;具有控制裝置’控制上述上‘壯再開始上 %施加裝置。 述上拉裝置及上述磁 禍,收容ί:ί:亡Ϊ明為一種單結晶製造裝置包括:坩 融溶液;上:事;早;晶的原料融溶液;加熱器,加熱該 成長單結曰·: 在坩堝内之融溶液表面接觸晶種,而 "、夂:磁場施加裝置,施加磁埸、ν : 上述各構件;其 琢,以及腔體,收容 上述石夕融溶液w二蘇二二f加熱器之控制,經過使 ίΐί:斤望之磁場強度,並具有控制裝置加裝置 抑及上述礙場施加裝置。 罝控制上述加熱 實施方式 型能,、妒妓m本毛明之單結晶製造方法及萝造壯罢 t心根據圖—面做詳細之說明。 夂衣4衣置之實施 同-圖圖表中:單,/製造裝置的縱剖^ 為石墨掛瑪2b的;:2為二 上。構成單处日制㈢構仏所構成,並设置於坩堝支拄^ 9 銹鋼所ΐ Γ 造裝置1外觀的腔體9為對矽+ ΐ :ίί,以單結晶上拉轴為中心所染的不 口口 於其中央也:番> σ又之圓同形空: 並加熱掛禍2内之石^又掛禍2,於其外®配設彳包圍坩堝2 内之秒融溶液4的加熱器3。加熱器3由圍等: 7054-5628-PF1(N1).ptc 第12頁 修正 五、發明說明(8) 所構成。由配置於腔體9外的溫度控制器14調 疋電力,並藉此控制加熱器3之溫度。 在加熱器3之外侧包圍加熱器3\ 輸筒η。保溫筒η防止加熱器的熱傷害 寸,並保持保溫筒1 1内之温度於高溫 質主要是碳纖維材質。 保/皿同11之材 s八在腔體9的左右兩側為作為磁場施加裝置的一對磁鐵 刀另1垂直直立的狀態相向配置。磁鐵丨5為電磁鐵與超導 ^磁場強度可變者。另-種施加可變磁場的方法制 ^=鐵與砍融溶液4以可變距離的方式設置而做代用。 , = = =部磁鐵施加尖端磁場亦可。磁鐵15係 猎由磁%控制态1 6對該輸出做控制。 穷斗:Τ面’在坩堝2的上方,從腔體9的上部中央可旋轉 J升降地垂設引線5,料單結晶的 ”央了二轉 有晶種夾8。藉由晶種夾8以置一/、下鈿5又 在旋轉狀態下上升,养此/盥々日日,日日種6藉由引線5 介面上成長單結^ 在與石夕融溶液4的接觸面之固液 η # rA,單結晶製造裝置1為觀測固液介面中單社曰7直 影機19與攝影控制單元2心後, 攝之書面顯干於5 -影控制單元20,將電視攝影機1 9所拍 二= = 二f 可見,^ 化,調整溫度押制哭·! 4、任夂化,根據早結晶7的直徑變 度。另外,代dm定溫度,並控制加熱器3之溫 電視攝衫機1 9或與電視攝影機丨9併用,藉 1231319 年 五、發明說明(9) =外線溫度計等的溫度量測裝置對固液介面之溫度變化 :計測’根據該溫度之變化調整溫度控制器14的設定溫 ::熱器3之溫度。該等操作可由作業員手動操 I、i Ϊ 攝影控制單元2〇與溫度量測裝置及控制器14互 連接’可自動地做回饋的機構亦可。 第囝中雖然省略記載,為了促進單結晶7上拉速;^ 有效地增加’在师…,亦可配設;繞:7拉上之拉速/ 晶7的周圍的輻射 力牌騁q沾广二圓、凡上拉之早、、、口 時,欲%^射井幕在肊體9的底面上設有在發生事故 4之接受^8從掛塌2浅漏的狀況下,供接受該石夕融溶液 及排Ϊ Ϊ 部設有供給口 12 ’而供腔體9之大氣調整 氬氣的:給做經常地供給。 料,氣化後板叙丨貝用之方法即可,使用液態氬氣做為原 1 0,連接直二给至腔體9内。在腔體9的下部設有排出口 而向下方流^幫浦13。氬氣從供給口12供給,越過坩堝2 圖箭號)Γ ,由真空幫浦1 3從排出口 1 0排出(參照第6 苐一實施例 導體t结H J :由半導體單結晶製造裝置,,兒明製造半 放入坩堝2 純度的多結晶矽粗略地打碎而洗乾淨後, 物(添加劑或〇找、,、器3加熱。此同時添加微量的導電型不純 磷(Ρ )及银雜劑)。添加硼(Β )得到Ρ型結晶,添加 及餘(讣)得到Ν型結晶,結晶之阻抗率由不純物 7054-5628-PFl(Nl).Ptc 第14頁 12313197054-5628-PFl (Nl) .ptc Page 11 Crucible 'Contains and grows appropriately: crystal manufacturing equipment, including: the molten solution; pull-up clothes :: =, solution; heater, heating: growing single crystal; magnetic field Applying = internal = solution surface contacts the seed crystal, 1231319 V. Description of the invention (7) The front end is in contact with Miao, _. _ Yang> valley liquid, and the above S is inserted into μ ^, and: the above seed crystal is pulled up, and Start to apply two kinds: while the contraction of the desired strength, the applied magnetic field :: away: from the magnetic field strength γ, two: kinds; have a control device 'control the above' Zhuang and then start to apply the% device. The pull-up device and the magnetic disaster mentioned above are contained. Ί: Ϊ: A single crystal manufacturing device includes: crucible solution; top: thing; early; raw material solution of crystal; heater, heating the growing single knot. ·: The surface of the molten solution in the crucible is in contact with the seed crystal, and ", 夂: magnetic field application device, applying magnetic 埸, ν: each of the above components; its surface, and the cavity, which contains the above-mentioned Shi Xirong solution w 二 苏 二The control of the two f heaters, through the magnetic field strength of the ΐ ΐ :: Jin Wang, and has a control device plus device to suppress the above-mentioned obstacle field application device.罝 Control the heating method described above, the implementation of the model, the production method of the single crystal and the strong manufacturing method of the scented man, and the detailed description will be made according to the drawings. The implementation of 衣衣 4 衣装 Same as in the figure: single, / longitudinal section of the manufacturing device ^ is graphite hanging horse 2b ;: 2 is two on. It consists of a single Japanese structure, and it is set on the crucible support 9 9 rust steel ΐ Γ The cavity 9 of the appearance of the device 1 is silicon + ΐ: ί, dyed with a single crystal pull-up shaft as the center Its mouth is also in its center: Fan > σ and a circle with the same shape: and heating the stone inside Hanging 2 ^ and hanging outside 2, equipped with 彳 outside the second melting solution 4 inside the crucible 2 Heater 3. The heater 3 is composed of an enclosure, etc .: 7054-5628-PF1 (N1) .ptc Page 12 Amendment 5. Description of the invention (8). The temperature is controlled by the temperature controller 14 disposed outside the cavity 9, and the temperature of the heater 3 is controlled by this. The heater 3 \ tube η is surrounded on the outside of the heater 3. The thermal insulation tube η prevents the thermal damage of the heater, and keeps the temperature inside the thermal insulation tube 1 1 to a high temperature. The quality is mainly carbon fiber material. The container / plate is the same as the material of 11. The eighth and right sides of the cavity 9 are opposite to each other in a state of a pair of magnet knives as magnetic field applying devices. The magnet 5 is an electromagnet and a superconducting magnetic field having a variable magnetic field strength. Another method of applying a variable magnetic field ^ = Iron and chopping solution 4 are set in a variable distance manner and used instead. , = = = Some magnets can also apply a tip magnetic field. The magnet 15 is controlled by the magnetic% control state 16 to control this output. The dipper: T surface is above the crucible 2, and the lead wire 5 is rotatably raised and lowered from the center of the upper part of the cavity 9 to the vertical center. Set one /, lower 钿 5 and rise in a rotating state, raise this / wash the day, day and day 6 grow a single junction through the lead 5 interface ^ The solid and liquid on the contact surface with the Shixirong solution 4 η # rA, the single crystal manufacturing device 1 is to observe the solid-liquid interface. After the 7 single camera 19 and the camera control unit 2 are in focus, the written picture is displayed on the 5-camera control unit 20, and the television camera 19 Take two == two f. You can see, ^, adjust the temperature to control crying! 4. Ren Hua, according to the diameter change of early crystal 7. In addition, set the temperature on behalf of dm, and control the temperature of the heater 3 TV camera shirt Camera 19 or used in conjunction with a TV camera 丨 9, borrowing 1231319 V. Invention Description (9) = Temperature measurement device such as an external thermometer on the solid-liquid interface temperature change: measure 'adjust the temperature controller 14 according to the change in temperature Set temperature :: Temperature of heater 3. These operations can be manually operated by the operator I, i Ϊ photography control unit 20 and temperature The measuring device and the controller 14 are interconnected with each other, and a mechanism capable of automatically giving feedback may be used. Although the description is omitted in the second paragraph, in order to promote the pull-up speed of the single crystal 7; Winding: 7 pull-up speed / Radiation force card around the crystal 7 骋 q Zhan Guang Eryuan, when the pull-up early ,,, and mouth, the desire% ^ curtain screen is set on the bottom surface of the carcass 9 In the case of acceptance of accident 4 ^ 8 from the collapse 2, leakage of the Shi Xirong solution and discharge Ϊ 设有 is provided with a supply port 12 ′ and the atmosphere of the cavity 9 is adjusted argon: to do The material is often supplied. After the gasification, the method can be used. The liquid argon gas is used as the original 10, which is connected to the second cavity and fed into the cavity 9. The lower part of the cavity 9 is provided with a discharge port. Downstream ^ pump 13. Argon gas is supplied from the supply port 12 and passes the crucible 2 (arrow in the figure) Γ and is discharged from the vacuum port 13 from the discharge port 10 (refer to the conductor t junction HJ of the sixth embodiment): A semiconductor single crystal manufacturing device is used, and Erming manufactures half-filled crucibles. Polycrystalline silicon of pure purity is roughly broken and washed. The heater is heated. At the same time, a trace amount of conductive type impure phosphorus (P) and silver impurities are added at the same time. Boron (B) is added to obtain P-type crystals, and addition (余) is obtained to obtain N-type crystals. The resistivity of the crystals is determined by Impurities 7054-5628-PFl (Nl) .Ptc Page 14 1231319
1231319 Ά 修正 曰 Μ 號 92110133 五、發明說明(11) ,曰5 =磁場強度上昇率亦可相對於時間經過而為定值, 或者=隨時間經過而變化亦可。磁場強度上升率由如第2 不之磁場控制态! 6做程式控制。例如在固液介面1 7的 磁的情況下’根據電視攝影機19的攝影晝面調整 磁%控制器1 6,可使磁鐵〗5的輸出產生變化。 場強度上升至所希望的值,藉由磁場控制 :16使磁场強度成為一定的值。然後,磁場強度設為一定 U過5分鐘以上後,再開始包圍上拉引線5。最好經過 1 5刀鐘以上後,再開始包圍上拉引線5 〇 主此時相對於上拉速度之頸縮部丨7之直徑的擴大或縮小 的情況下,判定矽融溶液4的溫度狀態是否適切,必要萨 進入加熱器3的溫度修正操作後,亦可移至在擴肩製程白I 成長相。 其^ ’如第3圖所示在施加磁場的狀態下進行擴肩製 程,將單結晶7加粗至所希望的口徑,拉接而形成第i圖衣所 不之^體部。例如在製造直徑3〇〇mm的半導體晶圓的狀況 下’單結晶7的直徑由於擴大至較3 〇 〇min稍微大的直徑而形 成直體部。此時磁場即使保持一定值,或者隨著單結晶7 的口徑變化而做變動亦可。 、在習知技術說明,由於使磁場強度上升中,矽融溶液 4的溫度不穩定而劇烈的上下變動,在該狀態下不宜進行 ,肩製程。但是保持磁場強度一定經過5分鐘以上,矽融 溶液4之溫度穩定了,固液介面的狀態亦穩定,此由實驗 而證明。 '1231319 Ά Amendment No. 92110133 V. Description of the Invention (11), 5 = The rate of increase of the magnetic field strength can also be a fixed value with respect to the passage of time, or = it can change with the passage of time. The rate of increase of the magnetic field intensity is controlled by the magnetic field like the second one! 6 Program control. For example, in the case of the magnetism of the solid-liquid interface 17, the magnetic% controller 16 can be adjusted according to the photographic day surface of the television camera 19, so that the output of the magnet 5 can be changed. The field strength rises to a desired value, and the magnetic field strength is adjusted to a constant value by the magnetic field control: 16. Then, the magnetic field intensity is set to a constant U for 5 minutes or more, and then the pull-up lead 5 is started to be surrounded. It is best to start to surround the pull-up lead 5 after more than 15 knife clocks. ○ When the diameter of the necked portion 7 increases or decreases with respect to the pull-up speed at this time, determine the temperature state of the silicon melt solution 4. Whether it is appropriate or not, after entering the temperature correction operation of the heater 3, it can also be moved to the white I phase in the shoulder expansion process. As shown in FIG. 3, the shoulder expanding process is performed under a state of applying a magnetic field, and the single crystal 7 is thickened to a desired caliber, and is drawn to form a body part which is different from that of the i-th figure. For example, in the case where a semiconductor wafer having a diameter of 300 mm is manufactured, the diameter of the 'single crystal 7' is enlarged to a diameter slightly larger than 300 min to form a straight body portion. At this time, the magnetic field may be maintained at a constant value or may be changed as the diameter of the single crystal 7 changes. In the conventional technical description, the temperature of the silicon melt solution 4 is unstable and violently moves up and down due to the increase of the magnetic field intensity. It is not suitable to perform the shoulder-to-side process in this state. However, the magnetic field strength must be maintained for more than 5 minutes, the temperature of the silicon melt solution 4 is stable, and the state of the solid-liquid interface is also stable. This is proved by experiments. '
1231319 j多正 案號 92110133 五、發明說明(12) ”第一實施例中’在該晶種6停止上拉的狀態下, 攸無磁%慢慢地使磁場強度上升,磁場強度上升至既定值 為=保持在n錢,經過使石夕融溶液4的溫度變 化%疋的相當時間後,再開始晶種6的上 ;果為了石夕融溶液4的對流構造之變動收斂,融 办液溫度穩定後可進行擴肩製程,上拉的矽 s =制變得容易。又由於在無磁場狀態進行頸:曰,曰即使在 7 Λ部17的直徑較大的情況下’亦可達成有效地矽單結晶 7的無轉位化。 /平、口曰曰 弟一貫施例 其次,針對製造半導體單結晶的方法做說明。 在第一實施例中,對矽融溶液4施加磁場,使磁場強 度上升,即使最終之矽融溶液4的溫度上下變動,但 :為此’在第二實施例中,將-併做加熱器:的溫 山首先,與第一實施例相同,藉由設於上拉引線5的下 端的晶種夾8保持晶種6,並將晶種6接觸於矽融溶液*。然 後如第2圖所示之坩堝2及晶種6在旋轉的狀態下將引線5 圍起來,將晶種6向上方上拉。在使晶種6與矽融溶液4接匕 觸的接種中’為了消除從在高密度發生於晶種6的滑移轉 位傳遞出的轉位,直徑12. 7mm的晶種變成5mm —般細,而 進行形成頸縮部1 7的頸縮。 進行頸縮時,停止上拉引線5的包圍,並停止晶 上拉。 、1231319 J Duozheng Case No. 92110133 V. Description of the Invention (12) "In the first embodiment," in the state where the seed crystal 6 has stopped being pulled up, the magnetic field strength gradually increases, and the magnetic field strength rises to a predetermined value. The value = keep at n money, and after a considerable time that the temperature change of Shixirong solution 4 %%, start the seeding 6; if the convective structure changes of Shixirong solution 4 converge, the solution After the temperature is stable, the shoulder expansion process can be performed, and the silicon s = pull-up becomes easy. Because the neck is performed in a magnetic field-free state: "Even if the diameter of the 7 Λ part 17 is large, it can also be effective. Non-transposition of ground silicon single crystal 7. / Flat, mouth, and stubbornly, the second embodiment will be described next, a method for manufacturing a semiconductor single crystal will be described. In the first embodiment, a magnetic field is applied to the silicon melt solution 4 to make the magnetic field. The strength rises, even if the temperature of the final silicon melt solution 4 fluctuates up and down, but for this purpose, in the second embodiment, Wen-Shan is used as a heater: First, the same as the first embodiment, The seed clip 8 at the lower end of the pull-up lead 5 holds the seed crystal 6, The seed crystal 6 is brought into contact with the molten silicon solution *. Then, as shown in FIG. 2, the crucible 2 and the seed crystal 6 are surrounded by the lead wire 5 and the seed crystal 6 is pulled upwards. Inoculation in contact with the silicon melt solution 4 'In order to eliminate the translocation transmitted from the slip inversion which occurred in the seed 6 at a high density, a seed having a diameter of 12.7 mm became as thin as 5 mm and was formed The necking of the necking portion 1 7. When the necking is performed, the surrounding of the pull-up lead 5 is stopped, and the crystal pull-up is stopped.
7〇54-5628-PFl(Nl).ptc 第17頁7〇54-5628-PFl (Nl) .ptc Page 17
1231319 五、發明說明(13) 在第5圖中,表示加熱器溫度以及施加磁場關係的時 間圖。橫軸為時間車由’縱軸為(a )上拉的q n、〇 f f、 ( b )加熱器溫度[°C ]、( c )矽融溶液溫度[°c ]以及(d )磁 場強度[T](tesla) °在第5圖中,將上拉停止點在時間軸 上設為0 [ m i η ]。 停止晶種6之上拉(第5圖a ),經過1〜5分鐘後,藉 由溫度控制器1 4使加熱器3的設定溫度上升(第5圖b ) 〇θ 在本第二實施例中,設定至較通常之加熱器溫度^ι〇〜2〇 °c的程度。伴隨加熱器3的溫度上升,矽融溶液4的溫度亦 上升(第5圖c)。 矽融溶液4的溫度直到穩定需要5〜15分鐘的時間。缺 後,經過使矽融溶液4的溫度穩定的相當的時間後,磁、 場控制器16對磁鐵15做激磁,開始對矽融溶液4施加磁 場。磁鐵15的磁場強度隨者時間的經過缓緩上 -實施例中,花費1小時上升〇.3〜〇4tesla , 1本弟 場強度上昇率亦可相對於時間經過 】θ = ,經過而變化亦可。磁場強度上升率由如第者疋^時 %控制器16做程式控制。例如在固液介面丨 :之磁 的情況下,根據電視攝影機19的攝影晝面 定 1 6,可使磁鐵1 5的輸出產生變化。 琢控制器 J第5圖中表示磁場強度慢慢上升期間,加 J保持一定的例子。加熱器3的溫度變動亦可。;;:3的溫 :加1場的初期’由於矽融溶液4的對流構各二在 化’石夕融溶液4的溫度上下變動得厲害。因此,;迷的變 衣不於第21231319 V. Description of the invention (13) In Figure 5, a time chart showing the relationship between the heater temperature and the applied magnetic field. The horizontal axis is the time car. The vertical axis is (a) qn, 0ff pulled up, (b) heater temperature [° C], (c) silicon melt solution temperature [° c], and (d) magnetic field strength [ T] (tesla) ° In FIG. 5, the pull-up stop point is set to 0 [mi η] on the time axis. Stop pulling on the seed crystal 6 (Fig. 5a), and after 1 to 5 minutes, the set temperature of the heater 3 is raised by the temperature controller 14 (Fig. 5b) 〇θ In this second embodiment In the middle, it is set to a temperature higher than a normal heater temperature of ^ ι˜20 ° C. As the temperature of the heater 3 rises, the temperature of the silicon melt solution 4 also rises (Fig. 5c). It takes 5 to 15 minutes for the temperature of the silicon melt solution 4 to stabilize. After a considerable time has elapsed after the temperature of the silicon melt solution 4 has stabilized, the magnetic field controller 16 excites the magnet 15 and starts to apply a magnetic field to the silicon melt solution 4. The magnetic field strength of the magnet 15 is gradually increased with the passage of time. In the embodiment, it takes 1 hour to increase 0.3 ~ 04tesla, 1 The rate of increase of the field strength of this brother can also change with time. Θ =, and changes with time. can. The rate of increase of the magnetic field intensity is controlled by the program of the% controller 16 as described above. For example, in the case of the solid-liquid interface 丨: magnetic, the output of the magnet 15 can be changed by setting the imaging daytime of the television camera 19 to 16. Figure 5 of the controller J shows an example in which the magnetic field intensity gradually increases while J is maintained constant. The temperature of the heater 3 may be changed. ; :: 3 of the temperature: In the initial stage of adding 1 field, the temperature of the fossil fused solution 4 fluctuates greatly due to the convective structure of the silicon fused solution 4. Therefore, the change of the fan is not better than the second
7054- 5628-PF1(ni).j 第18頁 1231319 -案號921】01沿 五、發明說明(14) 曰 月 圖f施加磁場中,用電視攝影機1 9對停止上拉的頸縮 之直徑的擴大、縮小做攝影由窠 、’、' 法丨丨哭14而接此L 甶械察顯不裔21調節溫度控 制郎14而積極地進行加熱器3溫度的 溶液4的溫度穩定。X, ,此可使石夕融 ^ ^ 4 - ^ ^ ^ ^ j對抵鈉伴酼磁場變動之矽融 命液4 /皿度變動的溫度控制器14做程式控制。 磁鐵15的磁場強度上升至所希望的 Π吏磁場強度成為一定的值'然後,磁4㈡㈣ 值,經過5分鐘以上後,再開始 |又=為一疋 15分鐘以上後,再開始包圍上拉引線5。 攻好經過 此%相對於上拉速度之頸縮部1 7之 的情況下,判定石夕融^的擴大或縮小 义加熱器3的溫度修正操作丫: = ; =二要時 成長相。 7王仕擴肩製程的 ^ 4第3圖所示在施加磁場的狀能下/ 程,將單結晶7加粗至所去珍Μ二0狀L下進行擴肩製 示之直體部。例如在製 3 ^徑’拉接而形成第1圖所 下,單結晶7的直^導體晶圓的狀況 成直體部。此時磁場即使保持一1亩㈣^的直徑而形 的口徑變化而做變動亦可’。、、疋,或者隨著單結晶7 在本第二實施例中, 抵銷施加磁場時矽融 9 …、态々溫度上升,由於 直徑的變動。夕〜氣…降,故可抑制頸= 當然,使施加於 溶液4的溫度平均是上Π暴慢慢上升令,石夕融 _ “下,右抑制加熱器3的溫度 7054-5628-PFl(Nl).ptc 第19頁 1231319 _案號92Π0133_年月曰 修正_ _五、發明說明(15) 的下降更好。 實現第一實施例或第二實施例的如第1〜3圖所示之半 導體單結晶製造裝置1中,晶種6之上拉或停止上拉,溫度 控制器1 4及磁場控制器1 6的控制,藉由公知的控制裝置使 相互連動並藉此可做自動控制。 發明之效果 本發明之單結晶製造方法及製造裝置中,可安全地上 拉大口徑、大重量的半導體單結晶,且頸縮部不會斷裂。 又,本發明之單結晶製造方法及製造裝置中,進行頸 縮製程時可有效地除去頸縮部的轉位。7054- 5628-PF1 (ni) .j Page 18 1231319-Case No. 921] 01 along the fifth, description of the invention (14) in the magnetic field of the moon map f, using a television camera 19 to stop the necking diameter of the pull-up The enlargement and reduction of photography are performed by the method of 窠, ',' 丨 丨 14 crying, and then the 察 machine detects that the person 21 adjusts the temperature control Lang 14 and actively performs the temperature stabilization of the solution 3 of the heater 3 temperature. X,, which can make Shi Xirong ^ ^ 4-^ ^ ^ ^ j temperature control 14 of the silicon melting liquid 4 / dish temperature variation against sodium with magnetic field changes in the program control. The magnetic field strength of the magnet 15 rises to a desired value, and the magnetic field strength becomes a certain value. Then, the value of the magnetic field is 4 minutes, and then starts again after 5 minutes or more. == 15 minutes or more, and then the surrounding pull-up lead 5 is started. . In the case where the percentage of the necking portion 17 is higher than the pull-up speed, it is determined whether the expansion or contraction of Shi Xirong ^ The temperature correction operation of the heater 3: =; = Second phase growth phase. 7 ^ 4 of the shoulder expansion process shown in Figure 3, under the state of the magnetic field application process / process, the single crystal 7 is thickened to the size of the removed body 20 L straight body part shown in the shoulder expansion process. For example, in the case shown in FIG. 1 when the diameter is 3 mm, the straight conductor wafer of the single crystal 7 is formed into a straight body. At this time, the magnetic field may be changed even if it maintains a diameter of 1 mu ㈣ and changes its shape. ' In the second embodiment, the silicon melt 9 is canceled when the magnetic field is applied, and the state temperature rises due to the change in diameter. Xi ~ qi ... lowered, so the neck can be suppressed = Of course, the temperature applied to the solution 4 is an average rise slowly, Shi Xirong_ "Bottom, right suppress the temperature of the heater 3 7054-5628-PFl ( Nl) .ptc Page 19 1231319 _ Case No. 92Π0133_ Year Month Revision _ V. The description of the invention (15) is better. The first or second embodiment is shown in Figures 1 to 3 In the semiconductor single crystal manufacturing device 1, the seed crystal 6 is pulled up or stopped, the temperature controller 14 and the magnetic field controller 16 are controlled, and the phases are interconnected by a well-known control device, so that automatic control can be performed. Effect of the Invention In the single crystal manufacturing method and manufacturing device of the present invention, a large-diameter, large-weight semiconductor single crystal can be safely pulled up, and the necked portion does not break. Also, the single crystal manufacturing method and manufacturing device of the present invention In the necking process, the indexing of the necking portion can be effectively removed.
7054-5628-PFl(Nl).ptc 第20頁 1231319 修正 案號 92110133 圖式簡單說明 第1圖表示本發明之單結晶製造裝置上拉單結晶之狀 態,為縱剖面圖。 第2圖表示本發明之單結晶製造裝置停止上拉單結晶 之狀態,為縱剖面圖。 · 第3圖表示本發明之單結晶製造裝置進行擴肩製程的 狀態,為縱剖面圖。 第4圖表示在第一實施例中上拉的ON、OFF與施加磁場 的關係之時間圖。 第5圖a為上拉的ON、OFF ;第5圖b為加熱器溫度;第5 圖c為石夕融溶液;第5 d圖為分別表示磁場強度的時間圖。 第6圖表示習知技術之單結晶製造裝置的概要,為縱 剖面圖。 符號說明 1〜 單結晶製造裝置; 2〜 坩堝; 2 a ^ ^石英掛塌; 2b - ^石墨坩堝; 2 c ^ ^坩堝支持軸; 3〜 加熱器; 4 梦融溶液; 5〜 引線; 6〜 晶種, 7〜 單結晶; 8〜 晶種爽, 9〜 腔體; 1 0〜排出口; 11 - ^保溫筒; 12 - <供給口 ; 13 - ^真空幫浦; 14 - -溫度控制器; 15 - -磁鐵; 16, ◊磁場控制器; 1 7〜頸縮部;7054-5628-PFl (Nl) .ptc Page 20 1231319 Amendment No. 92110133 Brief Description of Drawings Figure 1 shows the state of pulling up a single crystal in the single crystal manufacturing apparatus of the present invention, and is a longitudinal sectional view. Fig. 2 is a longitudinal sectional view showing a state in which the single crystal production apparatus of the present invention has stopped pulling up the single crystal. Fig. 3 is a longitudinal cross-sectional view showing a state in which the single crystal manufacturing apparatus of the present invention is performing the shoulder expanding process. Fig. 4 is a time chart showing the relationship between the pull-up ON and OFF and the applied magnetic field in the first embodiment. Figure 5a is the ON and OFF of the pull-up; Figure 5b is the heater temperature; Figure 5c is the Shi Xirong solution; Figure 5d is a time chart showing the magnetic field strength respectively. Fig. 6 is a vertical sectional view showing the outline of a conventional single crystal manufacturing apparatus. DESCRIPTION OF SYMBOLS 1 ~ Single crystal manufacturing equipment; 2 ~ Crucible; 2 a ^ ^ Quartz hanging; 2b-^ Graphite crucible; 2 c ^ ^ Crucible support shaft; 3 ~ Heater; 4 Dream melting solution; 5 ~ Lead; 6 ~ Seed, 7 ~ single crystal; 8 ~ seed cool, 9 ~ cavity; 10 ~ exhaust port; 11-^ insulation tube; 12-< supply port; 13-^ vacuum pump; 14--temperature Controller; 15--magnet; 16, ◊ magnetic field controller; 17 ~ necked portion;
7054-5628-PFl(Nl).ptc 第21頁 12313197054-5628-PFl (Nl) .ptc Page 21 1231319
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