TW200307065A - Production method and production device for single crystal - Google Patents

Production method and production device for single crystal Download PDF

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Publication number
TW200307065A
TW200307065A TW92110133A TW92110133A TW200307065A TW 200307065 A TW200307065 A TW 200307065A TW 92110133 A TW92110133 A TW 92110133A TW 92110133 A TW92110133 A TW 92110133A TW 200307065 A TW200307065 A TW 200307065A
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Taiwan
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magnetic field
solution
pull
temperature
single crystal
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TW92110133A
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Chinese (zh)
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TWI231319B (en
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Shigeki Kawashima
Nobuyuki Fukuda
Hiroshi Inagaki
Shoei Kurosaka
Masahiro Shibata
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Komatsu Denshi Kinzoku K K
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    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/30Mechanisms for rotating or moving either the melt or the crystal
    • C30B15/305Stirring of the melt

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

This invention provides a production method and a production device for a semiconductor single crystal. The production device (1) for a single crystal comprises a crucible (2) for storing the material melt (4) of a single crystal (7) to be grown, a heater (3) for heating this melt (4), a wire (5) for bringing a seed crystal (6) into contact with the surface of the melt (4) in the crucible (2) to pull up the single crystal (7), a chamber (9) for housing the above members, and a magnet (15) for applying magnetic field. Necking is carried out in the absence of magnetic field, before pulling is stopped, and the heater (3) is temperature-controlled. Then, magnetic field is gradually applied by the magnet (15) until a magnetic field intensity reaches a desired value, and thereafter pulling is resumed. A large-diameter, heavy-weight semiconductor single crystal can be safely pulled up with dislocation at a restriction part removed and without causing breakage at the restriction part.

Description

200307065200307065

五、發明說明(l) 發明所屬之技術領域 本發明有關於一種施加磁場之半導體單結晶繁造 法,以及供實施該製造方法的製造裝置,特別= :半”單結晶的製造方法及製造裝置,保部 =能承受大重量之半導體單結晶的上拉,並可達成無轉 先前技術V. Description of the invention (l) The technical field to which the invention belongs The present invention relates to a method for producing a semiconductor single crystal by applying a magnetic field, and a manufacturing apparatus for implementing the manufacturing method, in particular =: a semi- "single crystal manufacturing method and manufacturing apparatus, Hobe = can withstand the pull-up of semiconductor single crystals with large weight, and can achieve the previous technology without turning

但特別是關於矽 泛的應用的CZBut especially for CZ applications

單結晶之製造方法雖然有各式各樣, 單結晶上拉,用工業量產的可能方式做廣 (Czycrasky )法 。 第6圖為以CZ法製造矽單結晶的單結晶製 剖面圖。通常,矽單結晶之製造所使用之坩=置之縱 造,由内側之石英坩堝2a與外側之石墨坩 ^為二層構 坩堝2的周圍配設有石墨製的加熱器3, 斤構成。在 由該加熱器3所融溶的矽融溶液4。使用作為矽„。内收容著 裝置的上拉線5,其前端安裝有晶種6。菩,:結晶上拉 下端接觸於矽融溶液4表面’而向上方 …使晶種6的 下端成長單結晶7。 Ή ’错此,於旗Although there are various methods for manufacturing single crystals, single crystals are pulled up, and the Czycrasky method is possible using industrial mass production methods. Fig. 6 is a sectional view of a single crystal made of silicon single crystal by the CZ method. Generally, the crucible used in the manufacture of silicon single crystals is a vertical structure, which is composed of a quartz crucible 2a on the inside and a graphite crucible on the outside as a two-layer structure. The graphite crucible 2 is equipped with a heater 3 made of graphite. In the silicon melt solution 4 melted by the heater 3. It is used as silicon. The pull-up wire 5 containing the device is contained in the front end, and a seed crystal 6 is installed at the front end. Crystal 7. Ή 'wrong this, Yu Qi

μ侧之石央坩堝2a藉由與矽融溶 解’並在石夕融溶液4中放出氧。由CZ法戶=表面會 從石英掛禍2a内的石夕融溶液4上拉而養成:::單結晶 早結晶含有從坩堝的石英( 二-么,成長 此的製程中’即使反覆做熱出處的理The Shiyang crucible 2a on the mu side is dissolved with silicon ', and oxygen is released in the Shixirong solution 4. CZ method = the surface will be pulled up from the stone syrup solution 4 in the quartz hanging disaster 2a and cultivated ::: single crystal early crystallization contains quartz from the crucible (II- ?, in the process of growing this' even if it is repeatedly heated Provenance

200307065 五、發明說明(2) 及二::,此’内部的氧析出物在接近100。。的熱處 不純物〔所:·密度之凹陷層,減低存在於晶圓表面區域的 ^a*^Ba^"7r;rttering) 〇 :兄下,古v 貝產生各種影響的緣故,在使用CZ法的情 4二==:結晶7中的氧量。 用至CZ法6^1古 早、、、D晶中的氧量的方法係將施加磁場並 加二二:該方〗法稱為MCZ法 單結晶製造事詈月napp d cz法),藉由設置於半導體 矽融溶液的動ΐ:的磁石’對矽融溶液施加磁場而提高 藉由二==度::態,將cz法產…單結晶上拉。 固液界面之振動另、::矽Ί谷液的對流,減低伴隨對流的 養成。又,由2 變動’而可增進穩定之矽單結晶的 之反應,有效地進矽融溶液與石英坩㈤(si02) -Λ」切體用單結晶之工業量產方式。 液接觸中精= :MCZ法’最初將晶種與石夕融溶 位,進行所ϋ =度下所產生的滑移轉位而傳遞的轉 縮部。其次藉由Hcking)㈣成2〜5mm程度細的頸 將無轉位之製程,…=至所希望之口徑, Necking法而廣為人日日上拉。藉此,貝把頊縮的方法為Dash 然而,在阶法製造石夕單結晶中,藉由施加磁場而抑200307065 V. Description of the invention (2) and 2: The oxygen precipitates in this' are close to 100. . Impurities in the hot place [So: the density of the recessed layer reduces the ^ a * ^ Ba ^ "7r; rttering) existing on the surface area of the wafer 〇: Under the influence of ancient v shells, CZ is used Case 2 of the law ==: The amount of oxygen in crystal 7. The method used to the amount of oxygen in the CZ method 6 ^ 1 ancient, D, and D crystals is to apply a magnetic field and add 22: This method is called the MCZ method for single crystal manufacturing (napp d cz method). A magnetic field provided in the semiconductor silicon melt solution is used to apply a magnetic field to the silicon melt solution to improve the magnetic properties of the silicon melt solution. The cz method is used to produce a single crystal. The vibration of the solid-liquid interface is also: Convection of the siliceous valley fluid, which reduces the formation of convection. In addition, the change of 2 can increase the reaction of stable silicon single crystals, and it is an industrial mass production method for effectively feeding silicon melt solution and single crystals of quartz crucible (si02) -Λ "cuts. Liquid contact medium precision =: MCZ method 'Initially melts the seed crystal with Shi Xi, and transfers it to the shrinking part that is transferred by the slip generated at the same degree. Secondly, by Hcking), a neck with a thickness of 2 to 5 mm is formed. There is no indexing process, ... = to the desired caliber, Necking method is widely used to pull up day by day. With this, the method of beating curling is Dash. However, in the production of Shi Xi single crystal by the step method, it is suppressed by applying a magnetic field.

第7頁 200307065 ——一 五、發明說明(3) 制石夕融溶液$ #4·^ 固液介面成為安U ί接近融溶表面的溫度變動變小, 6产女士 ί 的狀悲d該結果使存在於晶種的鲑办 丄二門顯Q逃逸而殘留於頸縮部之内部,具有難以I Μ不 此,在MCZ法中,為達成無轉位化,Λ 直到轉由將石夕單結晶上拉而使頸縮部的直Λ: ί : 除而必須形成較長的頸縮。 罝仏更細 石夕單結晶的製造中, 。 部的直徑所限制,若超 ㈡矽:;:之重量被頸縮 有單結晶落下的危險性。特:里进=員:部會斷裂而具 晶的大口徑化,而重量增 ’近年來由,伴隨石夕單結 之上拉更增加困難。例如,供二^大重置的石夕單結晶 圓而成長大重量之矽單紝曰_以上之大口徑晶 發單結晶落下等安全上的° 狀況下,細的頸縮部具有誘 號公報的藉 =低曰本專利特開平1〇_7484 部無須變成極細而在A ㈣縮製程,頸縮 慢慢提高磁場強度並同時轉位化。然後,其後 單結晶安全地上拉。才進仃擴肩製程’確保大重量之矽 發明内容 Φ 發明欲解決之課題 然而,在擴肩製程中,^ a阶奶 之對流受到急速磁場的束縛右的磁場,矽融溶液 _…融溶液的溫度 mm 7054-5628-PF(Nl);Chentf.ptdPage 7 200307065 ——Fifth, description of the invention (3) Shi Xirong solution $ # 4 · ^ The solid-liquid interface becomes safe. The temperature variation near the surface of the melt becomes smaller. As a result, the salmon salmon, which was present in the seed, escaped Q and remained inside the neck constriction, which was difficult to achieve. In the MCZ method, in order to achieve no translocation, Λ until the transfer of Shi Xidan The crystal is pulled up to straighten the necked portion: Λ: In addition, a longer necked portion must be formed.罝 仏 The production of finer Shi Xi single crystals. The diameter of the part is limited, if the weight of super silicon ::: is necked, there is a danger of single crystal falling. Special feature: Lijin = Member: Department will break and become large-caliber with crystal, and weight increase ’In recent years, it is more difficult to pull up with Shi Xi single knot. For example, for a large replacement of the Si Xi single crystal round and the growth of a large weight of silicon single crystal _ above the diameter of the large-diameter crystal single crystal falling, and other safety ° conditions, the thin necked part has a seductive bulletin Borrowing = low. Japanese Patent Laid-Open No. 10-7484 does not need to be extremely thin, but in the A shrinking process, the necking slowly increases the magnetic field strength and is simultaneously indexed. Then, the single crystal is safely pulled up thereafter. Only enter the shoulder expansion process to ensure a large weight of silicon. Contents of the invention. However, in the shoulder expansion process, the convection of the first-order milk is bound by the rapid magnetic field. Temperature mm 7054-5628-PF (Nl); Chentf.ptd

200307065 五、發明說明(4) 動。 通常,在無 器的加熱而產生 坩堝内壁附近的 流在坩堝内循環 對此,在施 對流。因此,由 石夕融溶液加熱, 較慢的向矽融溶 較對流的熱傳量 點附近,掛竭内 在如上所述 場狀態變化至所 起劇烈的變化, 升,此由實驗確 的矽單結晶之形 的問題。 例如,在無 的接種,做完頸 度慢慢地上升, As部急速結晶成 解而使單結晶變 的狀況下,單結 又,磁場強 的矽融 所给予 的矽融 溫度上 坩堝内 近坩堝 對流的 。熱傳 的融溶 上升。 施加磁 融溶液 之溫度 溫度的 晶有 磁場的狀態 對流。因此 石夕融溶液加 ’而使矽融 加磁場的狀 加熱器所給 之後藉由非 液的中心部 小’為確保 壁附近的融 之擴肩製程 希望的磁場 固液介面中 知。該矽融 狀控制困難 下,坩堝内 ,由加熱器 熱,被加熱 溶液全體的 態下,抑制 予的熱對接 石夕融溶液之 做熱的傳遞 掛竭中心部 溶液溫度要 中,簡單地 強度時,石夕 ’矽融溶液 溶液之劇烈 ,甚至矽單 溶液由加熱 的熱對接近 溶液藉由對 升。 石夕融溶液的 内壁附近的 熱傳導,比 導的熱傳量 液溫度在熔 ’從無磁 的對流構造 下降又上 變化對上拉 產生轉位化 狀態:進行使晶種與石夕融溶液接觸 、、? 上拉停止,在該狀態下,使磁場強 液的溫度上下變動。該結果使從頸 ^的早結晶變粗,成長的結晶急速地再溶 咬因此在上拉單結晶且磁場緩緩地上升 晶形狀控制困難是可以理解的。 度緩緩上升,隨著矽融溶液的溫度變動之200307065 V. Description of Invention (4). Normally, the flow near the inner wall of the crucible generated by the heating of the device is circulated in the crucible, and convection is applied. Therefore, when heated by the Shi Xirong solution, the slower melting into silicon is near the convective heat transfer point, and the internal field state as described above changes to a drastic change in the exhaustion ascending. This is confirmed by experiments. The problem of crystalline form. For example, in the case of non-inoculation, the neck degree gradually rises after completion, and the As part rapidly crystallizes into a solution to change the single crystal. In the single junction, the temperature of the silicon melt given by the silicon melt with a strong magnetic field is near the crucible. Crucible convection. Melting of heat transfer rises. The temperature at which the magnetic melting solution is applied. The temperature of the crystal has a magnetic field. Convection. Therefore, the application of Shi Xirong's solution to the silicon to apply a magnetic field to the heater is followed by the non-liquid center portion, which is small. The solid-liquid interface is known for the desired magnetic field in order to ensure the fusion process near the wall. Under the condition that the melting of silicon is difficult to control, the heat in the crucible is heated by the heater and the entire heated solution is suppressed. The heat transfer of the pre-heated butt fusion solution is suppressed. At the same time, Shi Xi's silicon melt solution solution was violent, and even the silicon single solution approached the solution by heating to the solution by the liter. The heat conduction near the inner wall of the Shi Xirong solution, the specific heat transfer fluid temperature drops from the non-magnetic convective structure and then changes up. The state of the pull-up is transposed: the seed is brought into contact with the Shi Xirong solution. ,,? The pull-up is stopped, and in this state, the temperature of the magnetic field strong liquid is changed up and down. This result made the early crystals from the neck thicker, and the growing crystals rapidly re-melted. Therefore, it is understandable that it is difficult to control the crystal shape by pulling up the single crystal and slowly increasing the magnetic field. The temperature rises slowly, as the temperature of the silicon melt solution changes.

200307065 五、發明說明(5) 結果’對頸縮部的直徑反覆地變大、縮小的單結晶做X線 解析,將轉位導入一次無轉位化的頸縮部。因此,在伴隨 磁場變動而產生矽融溶液之溫度變動的狀態下製造單結 晶,單結晶有轉位化的可能性。如此磁場強度上昇中的單 結晶形狀之控制,在大容量的融溶液是困難的。 、 為了解決上述之問題點,本發明之目的係提供一種半 導體單結晶之製造方法及製造裝置,不使大口徑、大重量 之半導體單結晶頸縮部產生破裂而可安全地上拉。200307065 V. Description of the invention (5) Result ′ The X-ray analysis was performed on the single crystal with the diameter of the necked portion repeatedly increasing and shrinking, and the index was introduced into the necked portion without indexing. Therefore, a single crystal is produced in a state where the temperature of the silicon melt solution fluctuates due to a change in the magnetic field, and the single crystal may be transposed. It is difficult to control the shape of the single crystal during the increase of the magnetic field strength in a large-capacity molten solution. In order to solve the above-mentioned problems, an object of the present invention is to provide a method and a device for manufacturing a semiconductor single crystal, which can safely pull up without causing a neck of a large-diameter and heavy semiconductor single crystal to crack.

又,本發明之另一目的係提供一種半導體單結晶之 造方法及製造裝置,進行頸縮製程之際,彳除去頸縮部; 解決課題之手段 為達成上述之目的,本 的製造方法,其特徵為在無 與矽融溶液接觸,並進行將 停止上述晶種上拉,而開始 至所希望之強度,在已施加 述晶種。 發明之第一發明為一種單結晶 磁場的狀態下,使晶種的前端 ^述晶種上拉而收縮的製程; 施加磁場;由於磁場強度上升 磁場的狀態下,再開始上拉上 上述第一發明 或磁場強度上 進行上述矽融 之單結晶的製 升中,或磁場 溶液之溫度控In addition, another object of the present invention is to provide a method and a device for manufacturing a semiconductor single crystal, and perform necking process to remove the necked portion. Means for Solving the Problem To achieve the above-mentioned object, the present manufacturing method includes: It is characterized in that when no contact with the silicon melting solution is performed, the seed crystal is pulled up and stopped to start to a desired strength, and the seed crystal is applied. The first invention of the invention is a process in which the front end of the seed crystal is pulled up and contracted in the state of a single crystal magnetic field; a magnetic field is applied; and the state of the magnetic field is increased due to the strength of the magnetic field, and then the first first pull-up is started. Invention or magnetic field strength to perform the above-mentioned single crystal melting of silicon melting, or temperature control of magnetic field solution

又本發明之第二發明為如 造方法,其中在施加磁場前, 強度上升至所希望之強度後, 制。 又本發明之第三發明為如 k方法’其中在施加磁場前, 或礙塥%命 〜τ、、、口日日的製 每強度上升中,或磁場The second invention of the present invention is a manufacturing method, wherein the strength is raised to a desired strength before applying a magnetic field, and then the system is manufactured. The third invention of the present invention is such as the k-method, wherein, before applying the magnetic field, it may interfere with the 命% life ~ τ, ,, and the daily system. As the intensity increases, or the magnetic field

200307065 II _ 五、發明說明(6) =度上升至所希望之強度後,進行上述矽融溶液之溫度控 徵為又,ί明之第四發明為一種單結晶的製造方法,其特 觸’,並進⑯使晶種的前端與秒融溶液接 上拉;進扞卜t 而收縮的製程;停止上述晶種 又本於i 融溶液之溫度控制後,開始施加磁場。 晶的製造。之明上述第三或第四發明之單結 使上述矽融溶融溶液之溫度控制’經過 又本發明之第六發明為 : 晶的製造方法,豆中广 上忒第一或第四發明之單結 的變化,進行上述融 ,,士拉,而根據頸縮部直徑 泣方法,其中上述上拉再玟^表明之早結晶的製 上述矽融溶液之溫度控制。。後,在擴肩製程之前,進行 造方法,其中上ί上i U=述第-發明之單結晶的製 消伴隨上述磁場強度上二°1 ,在擴肩製程中,藉由抵 行矽融溶液之溫度控制。、述矽融溶液溫度變化,而進 又本發明之第九發明 坩堝,收容成長適當單結曰,早結晶製造裝置,包括: 該融溶液;上拉裝置,』:说原料融溶液;加熱器,加熱 而成長單結晶;磁場施加署内t融溶液表面接觸晶種, 容上述各構件;其特徵、丄知加磁場;以及腔體,收 _ 在無磁場的狀態下,使晶種的 7054-5628-PF(N1);Chent f200307065 II _ V. Description of the invention (6) = After the temperature has risen to the desired strength, the temperature control of the above-mentioned silicon melt solution is performed again. The fourth invention of the invention is a method for manufacturing single crystals. In parallel, the front end of the seed crystal and the second melting solution are pulled up and pulled up; the process of shrinking t is contracted; the above seed crystals are controlled by the temperature of the i melting solution, and then a magnetic field is applied. Crystal manufacturing. It is clear that the single junction of the above third or fourth invention controls the temperature of the above-mentioned silicon melt solution. The sixth invention of the present invention is: a method for manufacturing a crystal, and the first or fourth invention of the invention For the change of the junction, perform the above-mentioned melting, Shila, and the method according to the diameter of the necked portion, wherein the above-mentioned pull-up again indicates the temperature control of the above-mentioned silicon melt solution that crystallizes early. . Then, before the shoulder expansion process, a manufacturing method is performed, in which the above-mentioned invention of the single crystal of the first invention is eliminated with the above magnetic field intensity of 2 ° 1. In the shoulder expansion process, the silicon melt is resisted. Temperature control of solution. The temperature of the silicon melt solution changes, and the ninth invention of the present invention contains a crucible suitable for growth and growth. The early crystallization manufacturing device includes: the melt solution; a pull-up device; , Heating to grow a single crystal; the magnetic field is applied to the surface of the molten solution in contact with the seed crystal, the above components; its characteristics, know the magnetic field; and the cavity, in the absence of magnetic field, the seed crystal 7054 -5628-PF (N1); Chent f

Ptd 第11頁 200307065 -—*— 五、發明說明(7) 前端與石夕融溶液接觸,並進 程,停止上述晶種上拉, 払^述晶種上拉而收縮的製 上升至所希望之強度,在I :轭加磁場;由於磁場強度 拉上述晶種;具有控制裝置广^ f場的狀態下,再開始上 場施加裝置。 、 工制上述上拉裝置及上述磁 又本發明之第十發 _ 。 禍’收容成長適當單結晶的=晶製造裝置包括:掛 融溶液;上拉裝置,在掛禍内之=液;加熱器,加熱該 成長單結晶;磁場施加掌w /谷液表面接觸晶種,而 上述各構件;其特徵為广進行:力;f場;以及腔體,收容 上述矽融溶液之溫度穩定的時間J,σ: 了之控制’經過使 激磁至所望之磁場強度,並具有^制梦^述磁場施加裝置 器及上述磁場施加裝置。 卫制波置,控制上述加熱 實施方式 Φ”匕 '下針對本發明之單結晶製造方法及彭造妒晋 型悲,根據圖面做詳細之說明。 衣仏衣置之實施 =1圖表示單結晶製造裝置的縱剖面圖。 5囷中的付號2為掛禍,内側為石英掛奶2 a ,墨掛,的雙層構造所構成,並設置於掛二a Η則 。構成早 '结晶製造裝置!外觀的腔體二九軸2c 錄鋼所製A ’以單結晶上拉軸為 :圓:染的不 器。於其中央位置配設掛禍2,於其外圍配^ ^形容 並加熱掛禍2内之石夕融溶液4的加熱器3。加熱器3\圍^= 第12頁 7054-5628-PF(Nl);Chentf.ptd 200307065 五、發明說明(8) 所構成。由配置於腔體9外的溫度控制器“ 疋電力,並藉此控制加熱器3之溫度。 在加熱器3之外側包圍加執哭q 的保溫筒U。保溫筒u防止加熱。器己置有原筒狀 並保持保溫筒11内之溫度於高溫二態:“二材 貝主要是碳纖維材質。 /、/凰同11之材 刀⑺土且直立的狀恶相向配置。 磁鐵等磁場強度可變者。s f磁鐵15為電磁鐵與超導 ,,;,^ 又精由上部磁鐵與下部磁鐵 万式。又置而做代用。 藉由,場控制器16對該輸出做控;^磁场亦可。磁鐵15係 及升降地垂設引線5°,:二:釺f腔體9的上部中央可旋轉 有晶種夾8。藉由晶種失8”以保^曰曰的^拉,置,其下端設 在旋轉狀態下上升,蕻+ ★ ^寺阳種6,日日種6藉由引線5 介面上成長單結晶7。3 人矽融溶液4的接觸面之固液 又,單結晶製造妒罟彳盔# 徑之變化,具備電視攝、置固液介面中單結晶7直 將顯示器21連接至攝二=9與“控制單元2。。然後, 攝之畫面顯示於顯示器^制早7020,將電視攝影機19所拍 21的顯示觀測單結晶/的’使料其可見。作業員可從顯示器 化,調整溫度控制器〗4二夂θ ,根據單結晶7的直徑變 度。另外’代替電視攝与二:度,並控制加熱器3之溫 攝衫機19或與電視攝影㈣併用,藉 7054-5628-PF(Nl),Chentf ptd 第13頁 200307065Ptd Page 11 200307065-** V. Description of the invention (7) The front end is in contact with Shi Xirong solution, and progresses, stopping the seed crystal pull-up, the above mentioned seed crystal pull-up and contraction system rises to the desired Intensity, I: add a magnetic field to the yoke; pull the seed crystal due to the magnetic field intensity; and start the field application device with the control device in a wide field. The above-mentioned pull-up device and the above-mentioned magnetic system are the tenth issue of the present invention. The device that contains the appropriate single crystals for growth and growth includes: hanging and melting solution; a pull-up device, the liquid in the hanging device; a heater that heats the growing single crystals; a magnetic field applied to the surface of the w / grain liquid to contact the seed crystals The above-mentioned components are characterized by a wide range of processes: force; f field; and cavity, the time for which the temperature of the silicon melt solution is stable, J, σ: the control of the 'through the excitation to the desired magnetic field strength, and has ^ Making a dream ^ The magnetic field applying device and the magnetic field applying device described above. Under the control of the heating system, the above-mentioned heating mode Φ "dagger" is used to describe the single crystal manufacturing method of the present invention and Peng Zao's jealousy, and will be described in detail based on the drawing. A vertical section view of a crystal manufacturing device. The number 2 in 5 为 is a double-layer structure composed of quartz hanging milk 2 a and ink hanging, and is installed on the hanging 2 aΗ. It forms an early 'crystal Manufacturing device! Appearance of the cavity Twenty-nine shafts 2c A steel made by Lugang uses a single crystal pull-up shaft as a circle: dyed dysfunction. Hanging 2 is installed at its central position, and ^ ^ is described on its periphery Heater 3 for heating the Shixirong solution 4 in Hanging Disaster 2. Heater 3 \ circle ^ = Page 12 7054-5628-PF (Nl); Chentf.ptd 200307065 V. Description of the invention (8). A temperature controller “outside the cavity 9” generates electric power, and thereby controls the temperature of the heater 3. On the outside of the heater 3, the thermal insulation tube U of the plus Q is surrounded. The thermal insulation tube u prevents heating. The device has been placed in the original tube shape and kept the temperature in the thermal insulation tube 11 at a high temperature: "The two clams are mainly made of carbon fiber. / 、 / Huang and 11 are made of shovel and upright and arranged in opposite directions. Magnets, etc. The magnetic field strength is variable. Sf magnet 15 is an electromagnet and a superconductor, and; ^ is further composed of an upper magnet and a lower magnet. It is replaced by a field controller. By means of the field controller 16 controls the output; ^ Magnetic field is also available. The magnet 15 series and the vertical lead 5 ° are vertically arranged: 2: the center of the upper part of the cavity 9 can be rotated with the seed clip 8. The seed is lost 8 "to protect the ^ Pull, place, and set the lower end to rise in the rotating state, 蕻 + ★ ^ Siyang 6 and Japanese 6 grow single crystals through the lead 5 interface. 3 The solid and liquid at the contact surface of the silicon melt solution 4 , The single crystal manufacturing jealous helmet # changes in diameter, with a TV camera, a single crystal 7 in the solid-liquid interface, directly connected the display 21 to the camera = 9 and "control unit 2 .." Then, the picture is displayed on the monitor ^ In the early 7020, the display 21 of the 21 taken by the television camera 19 will be observed to make it visible. The operator can turn it from the display. Temperature controller: 4 2 夂 θ, according to the diameter change of the single crystal 7. In addition, instead of TV camera and 2: degree, and control the temperature camera 19 of the heater 3 or use with TV camera, borrow 7054- 5628-PF (Nl), Chentf ptd p. 13 200307065

由紅外線溫度計等的溫度量測裝置對固液介面之溫度變化 做計測,根據該溫度之變化調整溫度控制器丨4的設定溫 度,並控制加熱器3之溫度。該等操作可由作業員手動操 作’或者是攝影控制單元2 〇與溫度量測裝置及控制器丨4互 相連接,可自動地做回饋的機構亦可。 在第1圖中雖然省略記載,為了促進單結晶7上拉速度 有效地增加,在坩堝2的上方,亦可配設圍繞上拉之單結 晶7的周圍的輻射屏幕。在腔體9的底 時,石夕融溶液4從掛禍2續狀況下,供接 4之接受皿1 8。A temperature measuring device such as an infrared thermometer measures the temperature change of the solid-liquid interface, adjusts the set temperature of the temperature controller 4 according to the temperature change, and controls the temperature of the heater 3. These operations can be manually operated by the operator ’or the photographic control unit 20 and the temperature measurement device and the controller 4 are connected to each other, and a mechanism that can automatically perform feedback may also be used. Although the description is omitted in the first figure, in order to effectively increase the pull-up speed of the single crystal 7, a radiation screen may be provided above the crucible 2 around the periphery of the single crystal 7 to be pulled up. At the bottom of the cavity 9, when the Shi Xirong solution 4 continues from the accident 2 condition, it is used to receive the receiving dish 18 of 4.

在!體9的上部设有供給口 12,而供腔體9之大氣調整 及排出蒸發物的高純度之氬氣從供給口 i 2做經常地供給。 氬氣的供給以一般慣用之方法即可,冑用液態氬氣做為原 料,乱化後供給至腔體9内。在腔體9的下部設有排出口 1〇 ’連接真空幫浦13。氬氣從供給口12供給,越過掛禍2 ^ LI『流動’由真空幫浦13從排出口1〇排出(參照第6 第一貫施例 第1〜3圖表示由半導體 導體單結晶的方法。 首先,將南純度的多結 放入坩堝2用加熱器3加埶。 物(添加劑或摻雜劑)。添 磷(P )及銻(Sb )得到n型 單結晶製造裝置,說明製造半 晶石夕粗略地打碎而洗乾淨後, 此同時添加微量的導電型不純 加爛(B )得到p型結晶,添加 結晶’結晶之組抗率由不純物in! A supply port 12 is provided in the upper portion of the body 9, and a high-purity argon gas for adjusting the atmosphere of the cavity 9 and discharging the vapor is constantly supplied from the supply port i2. The argon gas may be supplied by a generally used method. The liquid argon gas is used as a raw material, and the argon gas is supplied to the cavity 9 after being disordered. A discharge port 10 'is provided at the lower portion of the cavity 9 to connect the vacuum pump 13. The argon gas is supplied from the supply port 12 and passes through the accident 2 ^ LI "flows" and is discharged from the discharge port 10 through the vacuum pump 13 (refer to the sixth first embodiment and the first to third figures show the method of single crystal from a semiconductor conductor) First, put the multi-junction with the purity of South into the crucible 2 and add dysprosium with the heater 3. Add the substance (additive or dopant). Add phosphorus (P) and antimony (Sb) to obtain an n-type single crystal manufacturing device, and explain the manufacture of semi-crystalline After the spar stone is roughly broken and washed clean, at the same time, a trace amount of conductive impurities is added and rotten (B) to obtain p-type crystals.

200307065 一 -—- 五、發明說明(10) 之添加量控制。此時,藉. 非激磁狀態,不施加磁;控制器16將磁鐵15控制於 藉由**又於上拉引線5的下曰 將晶種6接觸於石夕融溶液4。块二、曰曰,夾8保持晶種6,並 種6在旋轉的狀態τ將引# 圖所示之掛瑪2及晶 拉。在使晶種;圍起來’將晶種6向上方上 高密度發生於晶種6的滑r链接觸的接種中’為了消除從在 r: _aa種變成5随-般細,而進行形成頸縮部1;的頸 在習知所實施的MCZ法ψ ι± 液4,由於抑制石夕融溶液中’、/妾種^施加磁場於石夕融溶 定,存在於晶種6的轉位不固液介面的狀態穩 部之内部,難以益轉位化m左右方向逃逸而殘存於頸縮 部的直徑必須縮至2m 因此,習知的MCZ法中,頸縮 在盔磁場纟 ^ 對此,本發明之單結晶製造方法 縮’頸縮部的直徑心m即可。 軸為時間軸(min T,拉與施加磁場的關係的時間圖。橫 [T] (tesla)。者/卜縱軸為上拉的0N、0FF及磁場強度 並停止晶種6的ΛΛ在H ’停止包圍上拉引線5 ’ 時間軸上的(min)。在第4圖中,該上拉停止時間點設為 度後,由磁場^6器^6止上拉的狀態下’經過1 5分鐘的程 4施加磁場。磁鐵丨f 1磁鐵1 5做激磁,開始對矽融溶液 升。在本第一實=,場時間的經過緩緩上 化費1小日寸上升0.3〜〇.4tesla, 7054.5628.PF(Nl),Chentf.ptd 第15頁 200307065 發明說明(u) 磁鐵1 5的磁媒& & 或者是隨時==率亦可相對於時間經過而為定值, 圖所示之磁==化料。磁場強度上升率由如第2 直徑為—定的,jl〗做私式控制。例如在固液介面1 7的 磁場控制号Γ6ϊ::/艮據電視攝影機19的攝影晝面調整 j裔16,可使磁鐵15的輸出產生變化。 载1 5的磁場強度上升至 — 器1 6使磁場強产成 + 希望的值,错由磁場控制 1 5分鐘以上後,再 < 開始包圍上拉引線5。最好經過 上後,再開始包圍上拉引線5。 此呀相對於上拉速度之頸縮部丨7之直徑 其次,如第3圖所示在施加磁場的狀態 程’將單結晶7加粗至所希望的口徑,拉接而形;J = ;之,部。例如在製造直徑30 0mm的半導體晶圓=口 下,早結晶7的直徑由於擴大至較3〇〇inm稍微大的直^大况 成直體部。此時磁場即使保持—定直,或者隨::形 的口徑變化而做變動亦可。 …曰曰f 在習知技術說明,由於使磁場強度上升中,矽1 ^ 4的溫度不穩定而劇烈的上下變動,在該狀態下不^進,及 擴肩製程。但是保持磁場強度一定經過5分鐘以二 浴液4之溫度穩定了,固液介面的狀態亦穩定,此 而證明。 n ^200307065 I ------ V. Description of the invention (10) Addition amount control. At this time, in a non-excitation state, no magnetism is applied; the controller 16 controls the magnet 15 so that the seed crystal 6 is brought into contact with the stone evening solution 4 by pulling the lead 5 again. Block two, said that the clamp 8 holds the seed 6, and the seed 6 is in a rotating state τ, and the magma 2 and the crystal pull shown in the drawing. In the seeding; enclosing 'the seeding 6 upwards occurs in a high-density inoculation of the sliding r chain contact of the seeding 6' in order to eliminate the change from being in the r: _aa seed to 5 as thin as possible, the neck is formed The neck of the shrinkage 1; is in the conventionally implemented MCZ method ψ ± 4 solution, because the inhibition of Shi Xirong solution ', / 妾 species ^ application of a magnetic field to Shi Xi melting solution, existing in the seed 6 translocation Inside the stable part of the state without a solid-liquid interface, it is difficult to translocate. The diameter of the necked part that has escaped in the left and right directions must be reduced to 2 m. Therefore, in the conventional MCZ method, the necked part is in the helmet magnetic field In the single crystal manufacturing method of the present invention, the diameter center m of the necked portion may be sufficient. The axis is the time axis (min T, a time diagram of the relationship between the pull and the applied magnetic field. Horizontal [T] (tesla). The vertical axis is the pull-up 0N, 0FF and magnetic field strength, and stop ΛΛ of seed 6 at H 'Stop enclosing the pull-up lead 5' (min) on the time axis. In Figure 4, after the pull-up stop time point is set to degrees, the magnetic field ^ 6 device ^ 6 stops the pull-up state. 'After 1 5 A magnetic field is applied in a course of 4 minutes. The magnet 丨 f 1 magnet 15 excites and starts to raise the silicon melting solution. In the first case, the passage of the field time is gradually increased by 0.3 to 0.4. 7054.5628.PF (Nl), Chentf.ptd Page 15 200307065 Description of the invention (u) Magnetic medium of magnet 1 & or at any time == rate can also be a fixed value with respect to the passage of time, as shown in the figure Zhi magnetic == chemical material. The rate of increase of the magnetic field intensity is controlled by the private diameter as in the second diameter. For example, the magnetic field control number Γ6ϊ on the solid-liquid interface 1 7 :: / According to the photography of the television camera 19 Adjusting the day and day 16 can change the output of the magnet 15. The magnetic field strength of 15 is increased to-16 to produce a strong magnetic field + a desired value. After making it for more than 15 minutes, < start to surround the pull-up lead 5. It is best to go around and then start to surround the pull-up lead 5. This is second to the diameter of the necked portion 丨 7 of the pull-up speed, as described in As shown in Figure 3, when the magnetic field is applied, the single crystal 7 is thickened to a desired diameter, and is drawn in a shape; J =; ,, part. For example, when manufacturing a semiconductor wafer with a diameter of 300 mm = under the mouth, early Since the diameter of the crystal 7 is enlarged to be slightly larger than 300 inm, it is generally a straight body. At this time, the magnetic field can be maintained or fixed, or it can be changed according to the change of the diameter of the shape: ... f In the conventional technical description, as the magnetic field strength is increased, the temperature of silicon 1 ^ 4 is unstable and violently changes up and down. In this state, it does not advance and the shoulder expansion process. However, the magnetic field strength must be maintained for 5 minutes or more. It is proved that the temperature of the two bath liquid 4 is stable, and the state of the solid-liquid interface is also stable. N ^

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200307065200307065

在本第一實施例中,在該晶種6停止上拉的狀態下, 從無磁場慢慢地使磁場強度上升,磁場強度上升至既定值 為止亚保持在一定值。然後,經過使矽融溶液4的溫度變 化穩定的相當時間後,再開始晶種6的上拉,並移至擴肩 製程。此結果為了矽融溶液4的對流構造之變動收斂,融 溶液溫度穩定後可進行擴肩製程,上拉的矽單結晶7的形 狀=制變得容易。又由於在無磁場狀態進行頸縮,即使在 頸縮部1 7的直徑較大的情況下,亦可達成有效地矽單結晶 7的無轉位化。 第二實施例 其次’針對製造半導體單結晶的方法做說明。 在第一實施例中,對矽融溶液4施加磁場,使磁場強 度上升’即使最中之矽融溶液4的溫度上下變動,但平均 值下降。為此,在第二實施例中,將一併做加熱器3的溫 度控制。 m 首先’與第一實施例相同,藉由設於上拉引線5的下 端的晶種夾8保持晶種6,並將晶種6接觸於矽融溶液4。然 後如第2圖所示之坩堝2及晶種6在旋轉的狀態下將引線5包 圍起來’將晶種6向上方上拉。在使晶種6與矽融溶液$接 觸的接種中’為了消除從在高密度發生於晶種6的滑移轉 位傳遞出的轉位,直徑丨2 · 7mm的晶種變成5mm —般細,而 進行形成頸縮部1 7的頸縮。 進行頸縮時,停止上拉引線5的包圍,並停止晶種6的 上拉。In the first embodiment, in a state where the seed crystal 6 is stopped from being pulled up, the magnetic field intensity is gradually increased from no magnetic field, and the magnetic field intensity is maintained at a constant value until the magnetic field intensity is increased to a predetermined value. Then, after a considerable time has elapsed for the temperature change of the silicon melt solution 4 to stabilize, the pull-up of the seed crystal 6 is started, and the process is shifted to the shoulder expansion process. As a result, in order to converge the variation of the convection structure of the silicon melt solution 4, the shoulder expansion process can be performed after the temperature of the melt solution is stabilized, and the shape of the silicon single crystal 7 to be pulled up becomes easy to manufacture. Since the necking is performed in a magnetic field-free state, even when the diameter of the necked portion 17 is large, the non-translocation of the silicon single crystal 7 can be effectively achieved. Second Embodiment Next, a method for manufacturing a semiconductor single crystal will be described. In the first embodiment, a magnetic field is applied to the silicon melt solution 4 to increase the intensity of the magnetic field ', even if the temperature of the middle silicon melt solution 4 fluctuates up and down, but the average value decreases. For this reason, in the second embodiment, the temperature control of the heater 3 will be performed together. m First 'As in the first embodiment, the seed crystal 6 is held by the seed clip 8 provided at the lower end of the pull-up lead 5, and the seed crystal 6 is brought into contact with the silicon melt solution 4. Then, as shown in FIG. 2, the crucible 2 and the seed crystal 6 surround the lead wire 5 while rotating 'and pull the seed crystal 6 upward. In the seeding in which the seed crystal 6 is brought into contact with the silicon melt solution, 'in order to eliminate the translocation transmitted from the slip indexing which occurs in the seed crystal 6 at a high density, a seed crystal with a diameter of 2 · 7 mm becomes 5 mm—as thin as , And necking to form the necked portion 17 is performed. When necking is performed, the surrounding of the pull-up lead 5 is stopped, and the pull-up of the seed crystal 6 is stopped.

7054-5628-PF(Nl);Chentf.ptd 第17頁7054-5628-PF (Nl); Chentf.ptd p. 17

200307065 五、發明說明(13) 在第5圖中,表示加熱器溫度以及施加磁場關係的時 間圖。橫軸為時間軸,縱軸為(a )上拉的On、〇 f f、( b )加熱器溫度[°C ]、( c )矽融溶液溫度[°C ]以及(d )磁 場強度[T]( tesla)。在第5圖中,將上拉停止點在時間轴 上設為0 [ m i η ]。 停止晶種6之上拉(第5 a圖),經過1〜5分鐘後,藉 由溫度控制器1 4使加熱器3的設定溫度上升(第5b圖)。 在本第二實施例中,設定至較通常之加熱器溫度高丨〇〜2 〇 °C的程度。伴隨加熱器3的溫度上升,矽融溶液4的溫度亦 上升(第5c圖)。 μ Λ 矽 後,經 場控制 场*。磁 一實施 場強度 間經過 場控制 的情況 16,可 在 度保持 施加磁 化,石夕200307065 V. Description of the invention (13) In Figure 5, the time chart showing the relationship between the heater temperature and the applied magnetic field. The horizontal axis is the time axis, and the vertical axis is (a) pull-up On, 0ff, (b) heater temperature [° C], (c) silicon melt solution temperature [° C], and (d) magnetic field strength [T ] (tesla). In Fig. 5, the pull-up stop point is set to 0 [m i η] on the time axis. Stop pulling the seed crystal 6 (Figure 5a), and after 1 to 5 minutes, the set temperature of the heater 3 is raised by the temperature controller 14 (Figure 5b). In the second embodiment, it is set to a temperature higher than the ordinary heater temperature by 0 ° to 20 ° C. As the temperature of the heater 3 rises, the temperature of the silicon melt solution 4 also rises (Figure 5c). After μ Λ silicon, the field control field *. In the case of magnetic field control, the field intensity is controlled by the field. 16

融溶液4的溫度直到穩定需要5〜丨5分鐘的時間。裝 過使矽融溶液4的溫度穩定的相當的時間後,由磁 器16對磁鐵15做激磁,開始對矽融溶液4施加磁 鐵1 5的磁場強度隨者時間的經過緩缓上升。 例中,化費1小日7上升〇 · 3〜〇 · 41 e s (a,磁鐵工5的夺 上昇率'亦可相肖於日寺間經過而μ冑,丨者 :變化亦可。磁場強度上升率由如第2圖所示之: 益1 6做程式控制。例如在固液介面1 7的直徑為一 :二1電視攝影機19的攝影晝面調整磁場护制: 使磁鐵1 5的輸出產生變化。 工制3It takes 5 to 5 minutes for the temperature of the melting solution 4 to stabilize. After a considerable period of time for which the temperature of the silicon melt solution 4 has been stabilized, the magnet 15 is excited by the magnet 16 and the magnetic field strength of the magnetic melt solution 15 applied to the silicon melt solution 4 is gradually increased with the passage of time. In the example, the chemical fee 1 rises 7 days 0.3 to 0.41 es (a, the rise rate of the magnet worker 5 can also be compared to the pass between the temples and μ 胄, or the change: the magnetic field can also be changed. The rate of intensity increase is shown in Fig. 2: Yi 16 is programmed. For example, the diameter of the solid-liquid interface 17 is one: two, one, the television camera 19 adjusts the magnetic field protection, and the magnet 15 protects the magnetic field. The output changes.

第5圖中表示磁場強度慢慢上升 -定的料。加熱器3的 ;:“? 場的初期,由於石々n / A切j例如,在 融溶液4的Λ:夕一:谷液4的對流構造起急速的變 '皿度上下變動得厲害。因此,表示於;Figure 5 shows that the magnetic field strength gradually rises. In the initial stage of the heater 3, due to the stone n / A cut, for example, the convective structure of the molten solution 4 Λ: Xiyi: Valley 4 changes sharply, and the degree changes sharply. Therefore, expressed in

7054-5628-PF(Nl),Chentf ptd 第18頁 200307065 五、發明說明(14) 圖的,加磁場中’用電視攝影機丨9對停止上拉的頸縮部Η 之f住的擴大、縮小做攝影,由觀察顯示器2 1調節溫度控 制器1 4而積極地進行加熱器3溫度的微調,藉此可使石夕融 溶液4的溫度穩定。又,亦可對抵銷伴隨磁場變動之㈣ 洛液4溫度變動的溫度控制器14做程式控制。 強度上升至所希望的值,藉由磁場控制 度成為一定的值。然後,磁場強度設為-定 15八ί m上後’#開始包圍上拉引線5。最好經過 15刀釭以上後,再開始包圍上拉引線5。 此時相對於上拉速度之頸縮部17之直徑 ,下,判定石夕融溶液4的溫度狀態 、次:小 進入加熱器3的溫度修正操作 $要蛉 成長相。 J移至在擴肩製程的 ί ΐ,如第3圖所示在施加磁場的狀態下進行擴戶制 私’將早結晶7加粗至所希望的口徑,拉接 第月衣 不之直體部。例如在萝抨古a Q Λ Λ Α , 成弟1圖所 πτ 口口 π日7 在衣k直徑30 0mm的半導體晶圓的貼、w I古早、,,口日日7的直徑由於擴大至較3〇〇_稍微大的口狀况 成直體部。此時磁場即使保持一定直,或者 仅而形 的口徑變化而做變動亦可。 早結晶7 m f本第二實施例巾,藉由加熱器3的溫度上升山 抵銷施加磁場時矽融溶液4的溫度下降,故 2,由於 1 7直徑的變動。 抑制頸縮部 民心刀口々、γ 浴狹4的磁場慢 溶液4的溫度平均是上升的狀態下,若抑制 中,石夕融 為3的溫度7054-5628-PF (Nl), Chentf ptd Page 18 200307065 V. Description of the invention (14) In the picture, in the magnetic field, 'use a television camera' 9 pairs of neck necks that stop pulling up. When taking a picture, the temperature of the heater 3 is actively adjusted by actively adjusting the temperature of the heater 3 by adjusting the temperature controller 14 by observing the display 21, thereby stabilizing the temperature of the Shixirong solution 4. In addition, the temperature controller 14 that offsets the temperature fluctuation of the liquid 4 that is accompanied by the magnetic field fluctuation may be programmed. The intensity rises to a desired value, and the degree becomes constant by the magnetic field control. Then, the intensity of the magnetic field is set to -15, and it starts to surround the pull-up lead 5. It is best to start around the pull-up lead 5 after 15 knives or more. At this time, with respect to the diameter of the necking portion 17 of the pull-up speed, the temperature state of the Shi Xirong solution 4 is determined, and the time is small. The temperature correction operation of the heater 3 is entered. $ 要 蛉 Growth phase. J moved to ί 肩 in the shoulder expansion process, as shown in Figure 3, under the state of applying a magnetic field to expand the household private system 'Bold the early crystal 7 to the desired caliber, pull the first month of clothes unit. For example, in Luo Qugu a Q Λ Λ Α, Chengdi 1 πτ 口 口 πday 7 In semiconductor k wafers with a diameter of 300 mm, the thickness is larger, and the diameter of the opening day 7 is enlarged Mouth condition slightly larger than 300_ into a straight body. At this time, the magnetic field may be kept straight or the shape of the aperture may be changed and changed. Early crystallization of 7 mf. In the towel of the second embodiment, the temperature rise of the heater 3 offsets the decrease in the temperature of the silicon melt solution 4 when a magnetic field is applied. Neck constriction is suppressed, and the magnetic field of γ-bath 4 is slow. The temperature of solution 4 is rising on average. If the temperature is suppressed, Shi Xirong will reach a temperature of 3.

200307065 五、發明說明(15) 的下降更好。 實現第一實施例或第二實施例的如第1〜3圖所示之半 導體單結晶製造裝置1中,晶種6之上拉或停止上拉,溫度 控制器1 4及磁場控制器1 6的控制,藉由公知的控制裝置使 相互連動並藉此可做自動控制。 發明之效果 本發明之單結晶製造方法及製造裝置中,可安全地上 拉大口徑、大重量的半導體單結晶,且頸縮部不會斷裂。 又,本發明之單結晶製造方法及製造裝置中,進行頸 縮製程時可有效地除去頸縮部的轉位。200307065 V. Description of invention (15) The decline is even better. In the semiconductor single crystal manufacturing apparatus 1 shown in FIGS. 1 to 3 that implements the first or second embodiment, the seed crystal 6 is pulled up or stopped, and the temperature controller 14 and the magnetic field controller 16 are pulled. The control can be performed by a known control device, and the automatic control can be performed. Effects of the Invention In the method and apparatus for manufacturing a single crystal of the present invention, a semiconductor single crystal having a large diameter and a large weight can be safely pulled up, and the necked portion will not break. Further, in the method and apparatus for manufacturing a single crystal of the present invention, the necking portion can be effectively removed during the necking process.

7054-5628-PF(Nl),Chentf ptd 第20頁 200307065 圖式簡單說明 第1圖表示本發明之單結晶製造裝置上拉單結晶之狀 態,為縱剖面圖。 第2圖表示本發明之單結晶製造裝置停止上拉單結晶 之狀態,為縱剖面圖。 第3圖表示本發明之單結晶製造裝置進行擴肩製程的 狀態,為縱剖面圖。 第4圖表示在第一實施例中上拉的ON、OFF與施加磁場 的關係之時間圖。 第5a圖為上拉的ON、OFF ;第5b圖為加熱器溫度;第 5c圖為矽融溶液;第5d圖為分別表示磁場強度的時間圖。 第6圖表示習知技術之單結晶製造裝置的概要,為縱 剖面圖。 符號說明 1〜單結晶製造裝置; 2〜坩堝; 2 a广 、石英坩堝; 2b 〜石墨1# 堝 2 c产 -坩堝支持軸; 3, V加熱器; 1 4 砍融溶液; 5 - V引線; 6〜 晶種, 7〜單結晶; ) 8〜 晶種爽, 9 ’ V腔體; 10 - 〜排出口 ; 11 〜保溫筒 • , 12 - ^供給口 ; 13 〜真空幫 浦 14 - ^溫度控制器; 15 〜磁鐵; 16 - 〜磁場控制器; 17 〜頸縮部7054-5628-PF (Nl), Chentf ptd Page 20 200307065 Brief Description of Drawings Fig. 1 shows the state of pulling up a single crystal in the single crystal manufacturing apparatus of the present invention, and is a longitudinal sectional view. Fig. 2 is a longitudinal sectional view showing a state in which the single crystal production apparatus of the present invention has stopped pulling up the single crystal. Fig. 3 is a longitudinal sectional view showing a state in which the single crystal manufacturing apparatus according to the present invention is performing a shoulder expanding process. Fig. 4 is a timing chart showing the relationship between the pull-up ON and OFF and the applied magnetic field in the first embodiment. Figure 5a is the ON and OFF pull-ups; Figure 5b is the heater temperature; Figure 5c is the silicon melt solution; Figure 5d is the time chart showing the magnetic field strength. Fig. 6 is a vertical sectional view showing the outline of a conventional single crystal manufacturing apparatus. DESCRIPTION OF SYMBOLS 1 ~ Single crystal manufacturing device; 2 ~ Crucible; 2a wide, quartz crucible; 2b ~ graphite 1 # pot 2c production-crucible support shaft; 3, V heater; 1 4 chopping and melting solution; 5-V lead ; 6 ~ seed crystal, 7 ~ single crystal;) 8 ~ seed crystal cool, 9 'V cavity; 10-~ discharge port; 11 ~ insulation tube •, 12-^ supply port; 13 ~ vacuum pump 14-^ Temperature controller; 15 to magnet; 16 to magnetic field controller; 17 to neck

7054-5628-PF(Nl),Chentf ptd 第21頁 2003070657054-5628-PF (Nl), Chentf ptd p. 21 200307065

7054-5628-PF(Nl),Chentf.ptd 第22頁7054-5628-PF (Nl), Chenf.ptd Page 22

Claims (1)

200307065 六、申請專利範圍 1 · 一種單 在無磁場 並進行將上述 停止上述 由於磁場 狀態下,再開 2·如申請 其中在施加磁 至所希望之強 3·如申請 其中在停止上 溫度控制。 4 · 一種單 在無磁場 並進行將上述 停止上述 進行上述 5·如申請 法,其中進行 溶液之溫度穩 6·如申請 法,其中停止 行上述矽融溶 7·如申請200307065 6. Scope of patent application 1. One kind of operation is to stop the above in the absence of a magnetic field and stop the above due to the magnetic field state. 2. To apply, apply the magnetism to the desired strength. 3. To apply, the temperature control is stopped. 4 · A single method without magnetic field and the above will be stopped and the above will be performed. 5 · If the application method is used, the temperature of the solution will be stabilized. 6 · If the application method is used, the above silicon melting will be stopped. 7 · If applied 結晶的 的狀態 晶種上 晶種上 強度上 始上拉 專利範 場前, 度後, 專利範 述晶種 結晶的 的狀態 晶種上 晶種上 秒融溶 專利範 上述石夕 定的時 專利範 上述之 液之上 專利範 製造方法,其特徵為. 下’使晶種的前端偽 拉而收縮的製程;、矽融溶液接觸, 拉,而開始施力π礙場· 升至所希望之強户每’ 上述晶種。 又在已施加磁場的 圍第1項所述之單&amp; 或磁場強度上升中&quot;曰曰的製造方法, 進行上述矽融溶、$ ^或磁場強度上升 圍第丨項所述之單1 之溫度控制。 上拉的狀態下,谁二晶的製造方法, 行上述矽融溶液之 製造方法,其特徵為· 下’使晶種的前☆山 拉而收縮的製程矽融溶液接觸, 拉; 液之溫度控制後, 圍第3或4項所㉛之3 =加磁場。 融溶液之溫度#制、,、D晶的製造方 門铉,浐+ 乂工制,經過使上述矽融 間後’施加磁場。 圍第2或4項所述之 L· Ml ^ rTh iP 4^ - 早、、、σ晶的製造方 上拉而根據頤縮部直彳&amp; &amp;㈣彳 述溫度控制。 I罝仅的變化,進 〈早結晶的製造方法, 圍第1項所述之星纟士The state of the crystal The seed is raised on the seed The strength of the seed is pulled up Before and after the patent field Description of the state of the crystal The state of the seed is crystallized The seed is melted in seconds The patent is above Shi Xiding ’s patent The above-mentioned liquid above the patented manufacturing method is characterized by the following: a process of pseudo-pulling and shrinking the front end of the seed crystal; the silicon melt solution contacts and pulls, and starts to exert force π to prevent the field from rising to the desired level Strong households each of the above seeds. In the manufacturing method described in item 1 of the applied magnetic field or the increase in magnetic field strength, the manufacturing method of said method is to perform the above-mentioned melting of silicon, $ ^, or the method described in item 1 of the magnetic field strength increase. Temperature control. In the state of pull-up, the manufacturing method of the two crystals is the method of manufacturing the above-mentioned silicon melt solution, which is characterized in that the silicon melt solution in the process of making the front of the seed crystal ☆ pull and contract is brought into contact with and pulled; the temperature of the liquid After control, 3 of the 3rd or 4th item = magnetic field. The temperature of the molten solution is manufactured by the manufacturing method of 晶, 、, and D crystals. 浐 + 乂 is manufactured by applying the magnetic field after melting the silicon. The manufacturing method of L · Ml ^ rTh iP 4 ^ as described in item 2 or 4 is pulled up and the temperature control is performed according to the &amp; & The only changes are described below. <Manufacturing method of early crystallization, the star warrior described in item 1 7054-5628-PF(Nl),Chentf.ptd 第23頁 200307065 六 申請專利範圍 其中上述上拉再開始, &quot; 矽融 溶液之溫度控制。σ ,在擴肩製程之前,進行上述 8 ·如申睛專利範圍 ^ 其中上述上拉再開始後第1 液之溫度控制。述夕融溶液溫度變化,而進隨上 9. 一種單a B制Λ 仃砂融溶 _,收 括: 加熱器,加熱該融溶、夜、,ΓΒ曰的原料融溶液; 上拉裝置,在坩禍之5’ 單結晶; 洛液表面接觸晶種, 磁場施加裝置,施 而成長 衣罝鈿加磁場;以 腔體,收容上述各構件. 其特徵為·· ’ 在無磁場的狀態下乂 並進行將上述晶種上拉而收i曰的石夕融溶液接觸, 拉,而開始施加磁場; τ止上述晶種上 由於磁場強度上升至所希望之強戶, 狀;:’再開始上拉上述晶種;具有“ΐί施:磁場的 上拉#置及上述磁場施加裝置。 控制上述 1〇· —種單結晶製造裝置,包括: 坩:收容成長適當單結晶的原料融溶液· 加熱斋,加熱該融溶液; ' 上拉裝置,在掛禍内之融溶液表面接觸晶種,而成長 第24頁 7054-5628-PF(Nl),Chentf ptd 200307065 六、申請專利範圍 _ 單結晶; , 磁場施加裝置,施加磁場;以及 腔體,收容上述各構件; 其特徵為: 進行上述加熱器之控制,經過使上述砍融溶液之溫度 穩定的時間後,將上述磁場施加裝置激磁至所望之磁場強 度,並具有控制裝置,控制上述加熱器及上述磁場施加裝 置。7054-5628-PF (Nl), Chentf.ptd Page 23 200307065 6. Scope of patent application Where the above pull-up is started again, &quot; Temperature control of silicon melt solution. σ, before the shoulder-expanding process, perform the above-mentioned 8. As stated in the patent scope ^ Among them, the temperature control of the first liquid after the pull-up is started again. The temperature of the melting solution is changed, and the above is followed. 9. A single a B-made 仃 仃 sand melting solution, including: a heater, heating the molten, melting solution, raw material melting solution of ΓΒ, a pull-up device, The 5 'single crystal in the crises; the surface of the Luo liquid is in contact with the seed crystals, and the magnetic field is applied by the device to apply a magnetic field; the cavity houses the above components. It is characterized by ... Then, pull up the seed crystal and contact the Shi Xirong solution, and start to apply a magnetic field; τ stop the above seed crystal due to the strength of the magnetic field to rise to the desired strong state, like: 'Restart The above-mentioned seed crystal is pulled up; it has a "pull-up: magnetic field pull-up device" and the above-mentioned magnetic field application device. The above-mentioned single crystal production device is controlled, including: Crucible: Contains a raw material melt solution that grows appropriate single crystals · Heating Fast, heat the molten solution; 'Pull-up device, contact the seed crystal on the surface of the molten solution in the accident, and grow Page 24 7054-5628-PF (Nl), Chentf ptd 200307065 6. Application scope _ Single crystal; Magnetic field A device that applies a magnetic field; and a cavity that houses the above-mentioned components; characterized in that: after controlling the heater, after the time for stabilizing the temperature of the chopping and melting solution, excite the magnetic field application device to a desired magnetic field strength, It also has a control device for controlling the heater and the magnetic field applying device. 7054-5628-PF(Nl),Chentf ptd 第25頁7054-5628-PF (Nl), Chentf ptd Page 25
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