TWD193794S - Semiconductor manufacturing device uses infrared lamp heater to penetrate window - Google Patents

Semiconductor manufacturing device uses infrared lamp heater to penetrate window

Info

Publication number
TWD193794S
TWD193794S TW107301143F TW107301143F TWD193794S TW D193794 S TWD193794 S TW D193794S TW 107301143 F TW107301143 F TW 107301143F TW 107301143 F TW107301143 F TW 107301143F TW D193794 S TWD193794 S TW D193794S
Authority
TW
Taiwan
Prior art keywords
semiconductor manufacturing
infrared lamp
lamp heater
device uses
manufacturing device
Prior art date
Application number
TW107301143F
Other languages
English (en)
Inventor
知明
廣實一幸
原田秋男
布村暢英
高妻豊
Original Assignee
日商日立全球先端科技股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商日立全球先端科技股份有限公司 filed Critical 日商日立全球先端科技股份有限公司
Publication of TWD193794S publication Critical patent/TWD193794S/zh

Links

Abstract

【物品用途】;本設計的物品是半導體製造裝置用紅外線燈加熱器穿透窗,為一種應用於半導體製造裝置上,於真空中對著所載置的晶圓照射紅外線的紅外線燈加熱器穿透窗。;【設計說明】;本物品整體是透明的。各立體圖中,未表現在六面圖的細線,皆為用來呈現立體表面的形狀。

Description

半導體製造裝置用紅外線燈加熱器穿透窗
本設計的物品是半導體製造裝置用紅外線燈加熱器穿透窗,為一種應用於半導體製造裝置上,於真空中對著所載置的晶圓照射紅外線的紅外線燈加熱器穿透窗。
本物品整體是透明的。各立體圖中,未表現在六面圖的細線,皆為用來呈現立體表面的形狀。
TW107301143F 2017-11-10 2018-02-27 Semiconductor manufacturing device uses infrared lamp heater to penetrate window TWD193794S (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2017-25186F JP1605838S (zh) 2017-11-10 2017-11-10
JP2017-025186 2017-11-10

Publications (1)

Publication Number Publication Date
TWD193794S true TWD193794S (zh) 2018-11-01

Family

ID=62239186

Family Applications (1)

Application Number Title Priority Date Filing Date
TW107301143F TWD193794S (zh) 2017-11-10 2018-02-27 Semiconductor manufacturing device uses infrared lamp heater to penetrate window

Country Status (3)

Country Link
US (1) USD864885S1 (zh)
JP (1) JP1605838S (zh)
TW (1) TWD193794S (zh)

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TWD212933S (zh) 2019-06-28 2021-08-01 美商應用材料股份有限公司 用於處理腔室基板支撐件的基底板
USD947914S1 (en) 2020-11-23 2022-04-05 Applied Materials, Inc. Base plate for a processing chamber substrate support
US11887878B2 (en) 2019-06-28 2024-01-30 Applied Materials, Inc. Detachable biasable electrostatic chuck for high temperature applications

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Publication number Priority date Publication date Assignee Title
TWI273344B (en) 2002-06-14 2007-02-11 Asml Holding Nv Method and apparatus for managing actinic intensity transients in a lithography mirror
TWI239558B (en) 2004-12-30 2005-09-11 Metal Ind Res & Dev Ct Device to clean substrate by super-critical fluid

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWD212933S (zh) 2019-06-28 2021-08-01 美商應用材料股份有限公司 用於處理腔室基板支撐件的基底板
TWD214516S (zh) 2019-06-28 2021-10-11 美商應用材料股份有限公司 用於處理腔室基板支撐件的基底板
US11887878B2 (en) 2019-06-28 2024-01-30 Applied Materials, Inc. Detachable biasable electrostatic chuck for high temperature applications
USD947914S1 (en) 2020-11-23 2022-04-05 Applied Materials, Inc. Base plate for a processing chamber substrate support
USD960216S1 (en) 2020-11-23 2022-08-09 Applied Materials, Inc. Base plate for a processing chamber substrate support

Also Published As

Publication number Publication date
JP1605838S (zh) 2018-06-04
USD864885S1 (en) 2019-10-29

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