TW589668B - Modified transfer function deposition baffles and high density plasma ignition therewith in semiconductor processing - Google Patents
Modified transfer function deposition baffles and high density plasma ignition therewith in semiconductor processing Download PDFInfo
- Publication number
- TW589668B TW589668B TW092103594A TW92103594A TW589668B TW 589668 B TW589668 B TW 589668B TW 092103594 A TW092103594 A TW 092103594A TW 92103594 A TW92103594 A TW 92103594A TW 589668 B TW589668 B TW 589668B
- Authority
- TW
- Taiwan
- Prior art keywords
- plasma
- slot
- patent application
- energy
- deposition
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P10/00—Bonding of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/080,496 US6946054B2 (en) | 2002-02-22 | 2002-02-22 | Modified transfer function deposition baffles and high density plasma ignition therewith in semiconductor processing |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200307990A TW200307990A (en) | 2003-12-16 |
| TW589668B true TW589668B (en) | 2004-06-01 |
Family
ID=27752833
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW092103594A TW589668B (en) | 2002-02-22 | 2003-02-20 | Modified transfer function deposition baffles and high density plasma ignition therewith in semiconductor processing |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6946054B2 (https=) |
| JP (1) | JP4740541B2 (https=) |
| KR (1) | KR100955996B1 (https=) |
| CN (1) | CN100440419C (https=) |
| AU (1) | AU2003211138A1 (https=) |
| TW (1) | TW589668B (https=) |
| WO (1) | WO2003073460A1 (https=) |
Families Citing this family (41)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060137821A1 (en) * | 2004-12-28 | 2006-06-29 | Lam Research Coporation | Window protector for sputter etching of metal layers |
| FR2842388B1 (fr) * | 2002-07-11 | 2004-09-24 | Cit Alcatel | Procede et dispositif pour la gravure de substrat par plasma inductif a tres forte puissance |
| JP4775834B2 (ja) * | 2002-08-05 | 2011-09-21 | 東京エレクトロン株式会社 | エッチング方法 |
| US20040129221A1 (en) * | 2003-01-08 | 2004-07-08 | Jozef Brcka | Cooled deposition baffle in high density plasma semiconductor processing |
| KR101001743B1 (ko) * | 2003-11-17 | 2010-12-15 | 삼성전자주식회사 | 헬리컬 자기-공진 코일을 이용한 이온화 물리적 기상 증착장치 |
| US7273533B2 (en) * | 2003-11-19 | 2007-09-25 | Tokyo Electron Limited | Plasma processing system with locally-efficient inductive plasma coupling |
| US7760214B2 (en) | 2004-08-17 | 2010-07-20 | Intel Corporation | Inserting transitions into a waveform that drives a display |
| US7313310B2 (en) * | 2005-05-25 | 2007-12-25 | Honeywell International Inc. | Plasma directing baffle and method of use |
| US20070079936A1 (en) * | 2005-09-29 | 2007-04-12 | Applied Materials, Inc. | Bonded multi-layer RF window |
| US7591935B2 (en) * | 2005-12-14 | 2009-09-22 | Tokyo Electron Limited | Enhanced reliability deposition baffle for iPVD |
| US7959775B2 (en) * | 2006-09-29 | 2011-06-14 | Tokyo Electron Limited | Thermal stress-failure-resistant dielectric windows in vacuum processing systems |
| EP2053631A1 (fr) | 2007-10-22 | 2009-04-29 | Industrial Plasma Services & Technologies - IPST GmbH | Procédé et dispositif pour le traitement par plasma de substrats au défilé |
| WO2009157483A1 (ja) * | 2008-06-26 | 2009-12-30 | ユーテック株式会社 | ファラデーケージ及びこれを有する装置 |
| CN102395704B (zh) * | 2009-02-13 | 2014-02-19 | 盖利姆企业私人有限公司 | 等离子体沉积 |
| US8736177B2 (en) * | 2010-09-30 | 2014-05-27 | Fei Company | Compact RF antenna for an inductively coupled plasma ion source |
| US9129778B2 (en) | 2011-03-18 | 2015-09-08 | Lam Research Corporation | Fluid distribution members and/or assemblies |
| US9293353B2 (en) * | 2011-04-28 | 2016-03-22 | Lam Research Corporation | Faraday shield having plasma density decoupling structure between TCP coil zones |
| US9490106B2 (en) * | 2011-04-28 | 2016-11-08 | Lam Research Corporation | Internal Faraday shield having distributed chevron patterns and correlated positioning relative to external inner and outer TCP coil |
| JP5803706B2 (ja) * | 2012-02-02 | 2015-11-04 | 東京エレクトロン株式会社 | 成膜装置 |
| JP2013191593A (ja) * | 2012-03-12 | 2013-09-26 | Tokyo Electron Ltd | プラズマ処理装置 |
| JP6101031B2 (ja) * | 2012-09-28 | 2017-03-22 | 東京応化工業株式会社 | プラズマ処理装置および積層体の製造方法 |
| SG2013075437A (en) * | 2012-10-23 | 2014-05-29 | Lam Res Corp | Faraday shield having plasma density decouplingstructure between tcp coil zones |
| US10935276B2 (en) | 2015-10-20 | 2021-03-02 | Steven Michalski | Air mixing device |
| US10157733B2 (en) * | 2016-01-29 | 2018-12-18 | Applied Materials, Inc. | Methods for igniting a plasma in a substrate processing chamber |
| JP6620078B2 (ja) * | 2016-09-05 | 2019-12-11 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置 |
| US20180143332A1 (en) | 2016-11-18 | 2018-05-24 | Plasma-Therm Llc | Ion Filter |
| KR102273084B1 (ko) * | 2018-06-29 | 2021-07-06 | 주식회사 엘지화학 | 파라데이 상자를 이용한 플라즈마 식각 방법 |
| JP7257807B2 (ja) * | 2019-02-12 | 2023-04-14 | 東京エレクトロン株式会社 | スパッタ装置 |
| CN110138104B (zh) * | 2019-06-14 | 2023-11-17 | 青岛大学 | 一种用于无线电能传输磁耦合器的复合屏蔽层 |
| US11189464B2 (en) * | 2019-07-17 | 2021-11-30 | Beijing E-town Semiconductor Technology Co., Ltd. | Variable mode plasma chamber utilizing tunable plasma potential |
| KR102189337B1 (ko) * | 2019-07-17 | 2020-12-09 | 주식회사 유진테크 | 플라즈마 처리 장치 |
| JP7236954B2 (ja) * | 2019-08-06 | 2023-03-10 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| CN113543446A (zh) * | 2020-04-13 | 2021-10-22 | 台达电子工业股份有限公司 | 电源产生器的点火方法 |
| US20210391150A1 (en) * | 2020-06-10 | 2021-12-16 | Plasma-Therm Llc | Plasma Source Configuration |
| CN113193312B (zh) * | 2021-04-25 | 2022-05-03 | 电子科技大学 | 圆波导TE0n模式超宽带输出窗结构 |
| CN115404451A (zh) * | 2021-05-28 | 2022-11-29 | 鑫天虹(厦门)科技有限公司 | 磁场调整装置、可产生均匀磁场的薄膜沉积设备及其沉积方法 |
| JP7680123B2 (ja) * | 2021-06-24 | 2025-05-20 | 東京エレクトロン株式会社 | 成膜装置及び成膜方法 |
| CN114231936A (zh) * | 2021-11-09 | 2022-03-25 | 中山市博顿光电科技有限公司 | 防污染装置、电离腔体及射频离子源 |
| CN115295389B (zh) * | 2022-08-23 | 2025-07-15 | 盛吉盛半导体科技(北京)有限公司 | 电感耦合等离子体装置及半导体薄膜设备 |
| JP2024067696A (ja) * | 2022-11-07 | 2024-05-17 | 日新電機株式会社 | プラズマ処理装置 |
| CN119685770B (zh) * | 2024-11-28 | 2025-10-10 | 武汉理工大学 | 一种双靶共镀磁控溅射掺杂比例控制装置及方法 |
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| US3974059A (en) | 1974-10-03 | 1976-08-10 | Yoichi Murayama | High vacuum ion plating device |
| US4431901A (en) | 1982-07-02 | 1984-02-14 | The United States Of America As Represented By The United States Department Of Energy | Induction plasma tube |
| JP3381916B2 (ja) | 1990-01-04 | 2003-03-04 | マトソン テクノロジー,インコーポレイテッド | 低周波誘導型高周波プラズマ反応装置 |
| US5178739A (en) | 1990-10-31 | 1993-01-12 | International Business Machines Corporation | Apparatus for depositing material into high aspect ratio holes |
| US5234529A (en) | 1991-10-10 | 1993-08-10 | Johnson Wayne L | Plasma generating apparatus employing capacitive shielding and process for using such apparatus |
| US5231334A (en) | 1992-04-15 | 1993-07-27 | Texas Instruments Incorporated | Plasma source and method of manufacturing |
| US6190512B1 (en) | 1993-09-07 | 2001-02-20 | Tokyo Electron Arizona Inc. | Soft plasma ignition in plasma processing chambers |
| US5449433A (en) | 1994-02-14 | 1995-09-12 | Micron Semiconductor, Inc. | Use of a high density plasma source having an electrostatic shield for anisotropic polysilicon etching over topography |
| JP3150058B2 (ja) * | 1994-12-05 | 2001-03-26 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
| US5763851A (en) | 1995-11-27 | 1998-06-09 | Applied Materials, Inc. | Slotted RF coil shield for plasma deposition system |
| JP3739137B2 (ja) | 1996-06-18 | 2006-01-25 | 日本電気株式会社 | プラズマ発生装置及びこのプラズマ発生装置を使用した表面処理装置 |
| US6056848A (en) | 1996-09-11 | 2000-05-02 | Ctp, Inc. | Thin film electrostatic shield for inductive plasma processing |
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| JP3846970B2 (ja) | 1997-04-14 | 2006-11-15 | キヤノンアネルバ株式会社 | イオン化スパッタリング装置 |
| US5830330A (en) * | 1997-05-22 | 1998-11-03 | Tokyo Electron Limited | Method and apparatus for low pressure sputtering |
| CN1097491C (zh) | 1997-11-14 | 2003-01-01 | 东京电子株式会社 | 一种等离子体处理系统及清洁等离子体处理系统的方法 |
| US5903106A (en) | 1997-11-17 | 1999-05-11 | Wj Semiconductor Equipment Group, Inc. | Plasma generating apparatus having an electrostatic shield |
| JP2001526459A (ja) | 1997-12-05 | 2001-12-18 | ティーガル コーポレイション | 堆積シールドを具備するプラズマ反応炉 |
| US6287435B1 (en) * | 1998-05-06 | 2001-09-11 | Tokyo Electron Limited | Method and apparatus for ionized physical vapor deposition |
| US6080287A (en) | 1998-05-06 | 2000-06-27 | Tokyo Electron Limited | Method and apparatus for ionized physical vapor deposition |
| US6197165B1 (en) * | 1998-05-06 | 2001-03-06 | Tokyo Electron Limited | Method and apparatus for ionized physical vapor deposition |
| JP3530788B2 (ja) * | 1998-10-29 | 2004-05-24 | キヤノン株式会社 | マイクロ波供給器及びプラズマ処理装置並びに処理方法 |
| US6248251B1 (en) | 1999-02-19 | 2001-06-19 | Tokyo Electron Limited | Apparatus and method for electrostatically shielding an inductively coupled RF plasma source and facilitating ignition of a plasma |
| US6523493B1 (en) * | 2000-08-01 | 2003-02-25 | Tokyo Electron Limited | Ring-shaped high-density plasma source and method |
| US6156164A (en) | 1999-06-22 | 2000-12-05 | Tokyo Electron Limited | Virtual shutter method and apparatus for preventing damage to gallium arsenide substrates during processing |
| EP1144713B1 (en) * | 1999-11-18 | 2003-09-10 | Tokyo Electron Limited | High target utilization magnetic arrangement for a truncated conical sputtering target |
| US6652711B2 (en) * | 2001-06-06 | 2003-11-25 | Tokyo Electron Limited | Inductively-coupled plasma processing system |
-
2002
- 2002-02-22 US US10/080,496 patent/US6946054B2/en not_active Expired - Fee Related
-
2003
- 2003-02-19 KR KR1020047013039A patent/KR100955996B1/ko not_active Expired - Fee Related
- 2003-02-19 JP JP2003572060A patent/JP4740541B2/ja not_active Expired - Fee Related
- 2003-02-19 WO PCT/US2003/004830 patent/WO2003073460A1/en not_active Ceased
- 2003-02-19 AU AU2003211138A patent/AU2003211138A1/en not_active Abandoned
- 2003-02-19 CN CNB03808953XA patent/CN100440419C/zh not_active Expired - Fee Related
- 2003-02-20 TW TW092103594A patent/TW589668B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| JP4740541B2 (ja) | 2011-08-03 |
| WO2003073460A1 (en) | 2003-09-04 |
| CN1647238A (zh) | 2005-07-27 |
| US20030159782A1 (en) | 2003-08-28 |
| CN100440419C (zh) | 2008-12-03 |
| KR20040089656A (ko) | 2004-10-21 |
| KR100955996B1 (ko) | 2010-05-04 |
| TW200307990A (en) | 2003-12-16 |
| US6946054B2 (en) | 2005-09-20 |
| AU2003211138A1 (en) | 2003-09-09 |
| JP2005518480A (ja) | 2005-06-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |