TW588240B - Self-healing memory - Google Patents

Self-healing memory Download PDF

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Publication number
TW588240B
TW588240B TW090128966A TW90128966A TW588240B TW 588240 B TW588240 B TW 588240B TW 090128966 A TW090128966 A TW 090128966A TW 90128966 A TW90128966 A TW 90128966A TW 588240 B TW588240 B TW 588240B
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TW
Taiwan
Prior art keywords
memory
unit
bit
data
column
Prior art date
Application number
TW090128966A
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English (en)
Chinese (zh)
Inventor
Michael B Raynham
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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Application granted granted Critical
Publication of TW588240B publication Critical patent/TW588240B/zh

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/72—Masking faults in memories by using spares or by reconfiguring with optimized replacement algorithms
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1076—Parity data used in redundant arrays of independent storages, e.g. in RAID systems
    • G06F11/1088—Reconstruction on already foreseen single or plurality of spare disks
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/76—Masking faults in memories by using spares or by reconfiguring using address translation or modifications

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Dram (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
TW090128966A 2001-01-19 2001-11-22 Self-healing memory TW588240B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/766,354 US6418068B1 (en) 2001-01-19 2001-01-19 Self-healing memory

Publications (1)

Publication Number Publication Date
TW588240B true TW588240B (en) 2004-05-21

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Family Applications (1)

Application Number Title Priority Date Filing Date
TW090128966A TW588240B (en) 2001-01-19 2001-11-22 Self-healing memory

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US (1) US6418068B1 (enExample)
JP (1) JP2002279795A (enExample)
TW (1) TW588240B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
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TWI393001B (zh) * 2005-11-07 2013-04-11 萬國商業機器公司 測量一受測系統之自主能力的方法

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JP2002279795A (ja) 2002-09-27
US20020097613A1 (en) 2002-07-25
US6418068B1 (en) 2002-07-09

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