TW541538B - Independent asynchronous boot block for synchronous non-volatile memory devices - Google Patents
Independent asynchronous boot block for synchronous non-volatile memory devices Download PDFInfo
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541538 五、發明說明(1) 技術in 本發明係關 種有一獨立非 背景 不變性記憶 件在自裝置除 類型包括快閃 (EEPROM),以 憶體非同步, 體陣列讀取資 列。 不變性裝置 域,用以儲存 統(BIOS)等。 體之相同方式 餘記憶體之陣 其缺點為需要 信號及讀取命 料,而不必設 將需要相對於 操作。 於不變性半導體記憶體裝置之領域,尤指一 同步啟動區塊之同步不變性記憶體裝置。曰 體裝置包括各種半導體記憶體裝置,苴有元 掉電源時維持其資料。+變性記憶體裝置之 記憶體及電可擦除可程式唯讀記憶體 及各種其他裝置構造。一般,此^類型之記 或與一裝置系統時鐘同步操作,以便自記愫 料,及將資料程式設計/寫入至記憶體陣^ 常包括一 特殊程式 通常,資 予以存取 列所使用 在可存取 令。宜於 定時鐘或 記憶體裝 啟動區 諸如操 料在此 。因此 之時鐘 來自啟 能在啟 讀取命 置之正 塊,其為 作系統, 寺啟動區 同步不變 同步在啟 動區塊之 動後立刻 令。要做 規同步主 記憶體 基本輸 塊以存 性裝置 動區塊 資料前 自啟動 到如此 έ己憶體 之一專用區 入/輸出系 取其餘記憶 將會與供其 存取資料。 ’規定時鐘 區塊存取資 啟動區塊 部份非同步 授予Fandrich等人之美國專利5,197 〇34號,揭干— 不變性記憶體,包括一主區塊及—啟動區塊。電路裝 以耦合為接收一控制信號作為控制輸入’以供在控^信號541538 V. Description of the invention (1) The technology in the present invention relates to an independent non-background immutable memory device, which includes flash memory (EEPROM) in its own device. The memory is asynchronous and the array reads the data from the array. Immutable device domain, used to store the system (BIOS), etc. The same way as the physical memory array, the disadvantage is that it requires signals and reads data, without having to set it will need to be relative to the operation. In the field of immutable semiconductor memory devices, in particular, a synchronous invariant memory device of a synchronous start block. The body device includes various semiconductor memory devices, and its data is maintained when the power is turned off. + Memory and electrical erasable programmable read-only memory of denatured memory devices and various other device configurations. In general, this type of note may be operated synchronously with a system clock of the device in order to record data and program / write data to the memory array. Often, it includes a special program. Access order. It is suitable to set the clock or memory to start the area such as the operation here. Therefore, the clock comes from the positive block of the read start setting, which is used as the system, and the temple start area is synchronized. The synchronization is ordered immediately after the start of the block. To do this, synchronize the main memory with the basic input block to store the device. Before moving the data, it must be activated to one of the dedicated memory areas. The input / output system will take the rest of the memory and use it to access the data. ‘Required clock Block access funding Start block Partially asynchronous US Patent No. 5,197,034 granted to Fandrich et al., Debunks — invariant memory, including a main block and — start block. The circuit device uses the coupling to receive a control signal as a control input for the control signal.
541538 五、發明說明(2) 為在第一電壓狀態 為在另一電壓狀態 為實際關機狀態。 授予Akaogi之美 除不變性半導體記 或正常型快閃記憶 一第一擦除單元, 1允許更新啟動區塊,及供在控制信號 日可產生一關機信號,以將記憶體切換成 在規定第 體單元陣 除單元之 作。因此 動區塊快 授予Le 步存取記 重疊記憶 此允許對 啟動常式 不晶片選 本發明 同步存取 步不變性 本發明 一操作模 列之操作 擦除操作 ’改變操 閃記憶體 等人之美 憶體之方 體存取循 較慢速度 之啟動部 擇產生單 之一項目 ,並且仍 國專利5, 憶體裝置 體裝置。 一第二擦 式時,僅 。在規定 ,並起動 作模式單 與正常型 國專利5, 法,其中 壞,自一 記憶體之 位。啟動 元之一部 在裝置初始開機後 在認定一正規同步 的為供 可在同步 記憶體裝置。 之另一目的為提供 ,其可允 記憶體操 4 0 2,3 8 3號,揭示一種電可擦 ,供選擇性使用於啟動區塊型 該裝置有一記憶體單元陣列, 除單元,及一操作規定單元。 一第一擦除單元實施擦除記憶 第二操作模式時,中止第一擦 第二擦除單元,以實施擦除操 元之規定值,可藉以實現在啟 快閃記憶體間之改變。 5 0 2,8 3 5號’說明一種用於同 一積體電路微處理器通過早期 外部記憶體裝置讀取資料,因 有效率存取。電路包括一儲存 部位為L e等人專利之圖1 3中戶斤 份,並且似乎為同步。 一種有一啟動區塊,可予以非 操作予以程式設計/擦除之同 一種同步不變性記憶體裝置, 許非同步啟動區塊為主動,或 作命令時,允許自同步操作切 _____541538 V. Description of the invention (2) It is in the first voltage state, it is in another voltage state, it is the actual shutdown state. The beauty of Akaogi is granted to the invariant semiconductor memory or the normal flash memory, a first erasing unit, 1 to allow the startup block to be updated, and to generate a shutdown signal on the control signal day to switch the memory to the specified body. The unit array is divided into units. Therefore, the moving block quickly grants Le step access memory overlapping memory. This allows the startup routine to select the chip. The present invention synchronizes the access step invariance. The operation erase operation of an operation module of the present invention 'changes the beauty of flash memory and others. The memory access of the cube is selected by the slower startup unit, and it is still the national patent 5, memory device. For a second wipe, only. In the regulations, and start the operation mode list with the normal type national patent 5, law, which is bad, from a bit of memory. A part of the activation unit is considered to be a regular sync device after the device is initially turned on. Another object is to provide, which allows memorizing gymnastics No. 402, 3, 8 and 3, to disclose an electrically erasable, for selective use in the activation block type. The device has an array of memory cells, a division unit, and an operation. Specify the unit. When a first erasing unit implements the second erasing memory operation mode, the first erasing second erasing unit is suspended to implement the specified value of the erasing operation, so as to implement the change between enabling the flash memory. No. 5 02, 8 3 No. 5 'describes a method for the same integrated circuit microprocessor to read data through an early external memory device for efficient access. The circuit includes a storage site in Figure 13 of the patent of Le et al., And appears to be synchronized. One type has a startup block that can be programmed / erased non-operationally. The same type of synchronous invariant memory device allows the asynchronous start-up block to be active, or to allow self-synchronous operation to switch when commanded. _____
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541538 五、發明說明(3) 換’以起動非同步啟動區塊 發明之概沭 以上諸多目的業經藉一種 記憶體區塊及一獨立非同步 達成。在初始開機,及供在 5己憶體控制器構形之系統重 。同步不變性記憶體裝置包 起動後允許非同步啟動區塊 同步模式予以啟動,並且然 緊接自啟動區塊讀取資料, 命令信號。 f施本發明之最佳方式 请參照圖1, 本發明之不 規同步不變性記憶體區塊2 3 。正規同步不變性記憶體區 記憶體電路之區塊,其可包 讀取,程式設計及擦除之行 測放大器,以及輸出緩衝器 插腳21及輸出插腳27,供接 裝置20及自其輸出命令。信 與非同步啟動區塊25之間傳 32予以輸入至非同步啟動區 體區塊前予以反相3 5。 有一與系統時鐘同步操作之主 啟動區塊之不變性記憶體裝置 其中使用該裝置之微處理器/ 設操作時,可使用此裝置構造 括控制邏輯電路,其可在初始 為主動,或可允許啟動區塊在 後切換至非同步模式。這允許 而不必等待規定時鐘或讀取 變性記憶體裝置2 0,係由一正 及一非同步啟動區塊2 5所構成 塊23及非同步啟動區塊25均為 括位址輸入,X及y解碼器,供 選擇,不變性記憶體陣列,感 。記憶體裝置2 0包括許多輪入 收命令以及輸出命令至記憶體 號線31及33在主記憶體區塊23 輪命令。一啟動區塊啟動信號 塊2 5,並在輸入至正規主記憶 請簽照圖2 ’非同步啟動區塊25接收一信號41至區塊49541538 V. Description of the invention (3) Change to start asynchronously starting blocks Overview of the invention Many of the above purposes are achieved by a memory block and an independent asynchronous. At the initial start-up, and for the system configuration of the 5 memory controller. Synchronous invariable memory device package Allows asynchronous boot blocks to be started after synchronization. Synchronous mode is started, and then data is read from the boot block and command signals are issued. fThe best way of applying the present invention Please refer to FIG. 1. The random synchronization invariant memory block 2 3 of the present invention. A block of the memory circuit of the regular synchronous invariable memory area, which can include read, program, and erase line test amplifiers, and output buffer pins 21 and output pins 27 for the device 20 and output commands from it . The signal is transmitted between the asynchronous start block 25 and 32 to be inverted before being input to the asynchronous start block 3 5. An invariable memory device having a main boot block that operates in synchronization with the system clock. When the microprocessor / device operation of the device is used, this device can be used to construct a control logic circuit, which can be active at the beginning, or can be allowed. The boot block then switches to asynchronous mode. This allows without having to wait for the prescribed clock or read the volatile memory device 20, which is composed of a positive and an asynchronous start block 25 and the asynchronous start block 25 are both address inputs, X and y decoder, alternative, invariant memory array, sense. The memory device 20 includes a plurality of round-in commands and output commands to the memory number lines 31 and 33 in the main memory block 23-round commands. A start block start signal block 2 5 and input it into the regular master memory. Please sign as shown in Figure 2 ’asynchronous start block 25 receives a signal 41 to block 49
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y ^ ^ 除、擇42,確定在記憶體區域43中將會選擇 :「:、)供讀取’程式設計’及擦除操作。啟動區塊25也 ^舌1 '貝1放大器45及用以緩衝輸出信號50之輸出緩衝器46 屮ϋ/ΆΤΛ式起動非同步啟動區塊25。—種方式為發 、工暫存益集”(11 Mode Register Set")命令,J:爲 f f同步記憶體操作命令,以起動非同步啟動區塊,”·並 j同步不變性記憶體區塊。在此情形, 模式操作供程式設計及擦除,並以非同步模= 設計及擦除’可存取至非同步啟動_,代替正規主:己: η。=非同步啟動區塊之第二方式為在裝置之開機 J ΐ ?! ν啟動區塊為主動,代替同步不變性記憶體區 鬼。在诸如希望啟動同步主記憶體區塊時之時間,可發 命令1中斷非同步啟動區塊。模式暫存 口口市叩7正吊為一種同步晶片操作。由於人們將會在非同 乂”作模式輸人此命令,故無法中止有些輸入插 腳功此,諸如時鐘,列存取(1^3#),及行存取(cas#)等, 但可在輸入設定至在VIL或VIH之各別非主動狀態,直到其 供輸入命令使用。以此方式’雖然晶片為在非同步啟動區 塊操作模式,但仍可發出程式設計及擦除之同步命令序列 ,並起作用。這可免除設計一組非同步邏輯供程式設計及 擦除非同步啟動區塊所將需要之很大工夫。y ^ ^ Divide and select 42, to confirm that the memory area 43 will be selected: ":,) for reading 'programming' and erasing operations. Start block 25 also ^ Tongue 1 'Bay 1 amplifier 45 and use The non-synchronized start block 25 is started by the output buffer 46 of the buffered output signal 50.-One way is to send and store temporary set of benefits "(11 Mode Register Set ") command, J: ff synchronous memory Command to start the asynchronous start block, and synchronize the invariant memory block. In this case, the mode operation is for programming and erasing, and the asynchronous mode = design and erasure can be saved. Take the asynchronous start_ instead of the regular master: yourself: η. = The second way of the asynchronous start block is to start the device at the device J ΐ?! Ν The startup block is active instead of the ghost of the synchronous invariant memory area. At times such as when you want to start a synchronized main memory block, you can send a command 1 to interrupt the asynchronous start block. The mode temporary port 7 is being suspended as a synchronous chip operation. Enter this command in operation mode, so some input pins cannot be aborted Herein, such as clock, row access (# 1 ^ 3), and the row access (CAS #) and the like, but may be set to a non-active state in the respective VIL or VIH at the inputs until it is used for input commands. In this way, although the chip is operating in the asynchronous start block mode, a synchronous command sequence for programming and erasing can still be issued and function. This can save a lot of time from designing a set of asynchronous logic for programming and erasing the asynchronous boot block.
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五、發明說明(5) 請蒼照3及4,圖示用以啟動及中止非同步啟動區塊之控 制邏輯電路之實例。圖3之電路為一在非同步啟動區塊之 x—解碼器,而圖4之電路為一在同步主記憶體區塊之χ_解 碼器。請參照圖3,X-解碼器邏輯電路6〇包括一NAND(,,反 及)閘65 ’有許多接收輸入信號A0 - An之輸入端子61,69 。輸入端子之一67接收一BOOT —BLOCK —ENABLE信號。NAND 閘65之輸出由反相器66予以反相,在一輸出端子68產生一 輸出信號0 U T。同樣在圖4中,一 N A N D閘7 5接收許多輸入信 號AO -An。輸入端子71,79,包括一在一輸入端子Η之V. Description of the invention (5) Please use Cang Zhao 3 and 4 to show examples of control logic circuits used to start and stop the asynchronous start block. The circuit of FIG. 3 is an x-decoder in an asynchronous start block, and the circuit of FIG. 4 is an x-decoder in a synchronous main memory block. Referring to Fig. 3, the X-decoder logic circuit 60 includes a NAND (,, and) gate 65 'having a plurality of input terminals 61, 69 for receiving input signals A0-An. One of the input terminals 67 receives a BOOT —BLOCK —ENABLE signal. The output of the NAND gate 65 is inverted by an inverter 66 to generate an output signal 0 U T at an output terminal 68. Also in Fig. 4, a N A N D gate 7 5 receives many input signals AO -An. Input terminals 71, 79 include one of the input terminals.
BOOT一BLOCK—ENABLE信號。然而,BOOT一BLOCK一ENABLE信號BOOT_BLOCK_ENABLE signal. However, BOOT-BLOCK-ENABLE signals
在輸入至NAND閘75前予以反相72 °NAND閘75之輸出由反相 器7 6予以反相,產生一輸出7 8。可利用"模式暫存器集”命 令使BOOT一BLOCK-ENABLE信號主動或邏輯高,或可在開機 後使為邏輯高,以便指示起動非同步啟動區塊。如果未起 動非同步啟動區塊,BOOT一BLOCK一ENABLEE信號將為在邏輯 低狀態。在圖3中,唯有BOOT一BLOCK一ENABLEE信號為在邏 輯高狀態,輸出信號OUT才會依循輸入A0至輸入An之邏輯 組合。否則,只要BOOT一BLOCK一ENABLE信號停留在指示未 起動非同步啟動區塊之邏輯低狀態,輸出將會保持在邏輯 低狀態。請參照圖4 ’在同步主記憶體區塊之X —解碼器電 路區塊70,如果BOOT一BLOCK —ENABLE信號為在邏輯低狀態 ’在端子78之輸出信號OUT將會依循輸入信號A0至輪入信 號An之邏輯組合。這指示未起動非同步啟動區塊,並且啟 動正規同步主記憶體區塊。Invert 72 before input to NAND gate 75. The output of NAND gate 75 is inverted by inverter 76 to produce an output 78. The "mode register set" command can be used to make the BOOT_BLOCK-ENABLE signal active or logic high, or it can be set to logic high after power-on to indicate the start of the asynchronous start block. If the asynchronous start block is not started The BOOT_BLOCK_ENABLEE signal will be in a logic low state. In Figure 3, only the BOOT_BLOCK_ENABLEE signal is in a logic high state, the output signal OUT will follow the logical combination of input A0 to input An. Otherwise, As long as the BOOT_BLOCK_ENABLE signal stays at a logic low state indicating that the asynchronous start block is not activated, the output will remain at a logic low state. Please refer to Figure 4 'X in the synchronous main memory block — decoder circuit area In block 70, if the BOOT_BLOCK —ENABLE signal is in a logic low state, the output signal OUT at terminal 78 will follow the logical combination of the input signal A0 to the turn-in signal An. This indicates that the asynchronous start block is not started, and it starts. Formally synchronize main memory blocks.
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請蒼照圖5,圖示啟動區塊及主記憶體區塊之輪出緩衝 器電路。非同步啟動區塊之輸出緩衝器控制邏輯電路8 〇與 同步主記憶體區塊之輸出緩衝器控制邏輯電路9〇合併,因' 為每一緩衝器之輸出88,98在輸出插腳1〇〇提供一輸出信 號。第一邏輯區塊8 0為非同步啟動區塊之輸出緩衝器,其 由一在輸入端子87接收BOOT-BLOCK一ENABLE信號之第一反 相器83所構成,並在反相器83之輸出端子1〇ι產生一中間 控制信號。一N0R(”或非”)閘84有一第一輸入端子丨丨j耦合 至弟一反相為83之輸出端子ιοί,並在第一輸入端子hi接 收中間控制信號。NOR閘84在一第二輸入端子1 1 0接收第一 輸入k號。N 0 R閘8 4在N 0 R閘輸出1 〇 5產生一第一閘信號。Please refer to Fig. 5 for a diagram of the turn-out buffer circuit of the startup block and the main memory block. The output buffer control logic circuit 8 of the asynchronous start block is merged with the output buffer control logic circuit 90 of the synchronous main memory block, because the output of each buffer is 88, 98 at the output pin 1 0. Provide an output signal. The first logic block 80 is an output buffer of the asynchronous start block, which is composed of a first inverter 83 that receives a BOOT-BLOCK-ENABLE signal at the input terminal 87, and outputs at the inverter 83 The terminal 100m generates an intermediate control signal. A NOR ("NOR") gate 84 has a first input terminal, which is coupled to an output terminal whose phase is inverted to 83, and receives an intermediate control signal at the first input terminal hi. The NOR gate 84 receives the first input k number at a second input terminal 110. N 0 R gate 8 4 generates a first gate signal at N 0 R gate output 105.
一NAND 閘 82 在一第一輸入端子1〇8 接收 β〇〇τ —bl〇CK__ENABLEA NAND gate 82 receives β〇〇τ —bl〇CK__ENABLE at a first input terminal 108.
化號’並在一第二輸入端子8 1接收一輸入信號8 1。在 閘8 2之輸出1 〇 3產生一第二閘信號。二閘信號供給至一由 一PM0S電晶體85及一NM0S電晶體86所組成之CM0S(金屬氧 化物半導體)反相器之閘。PM0S電晶體85接收來自NAND閘 82之輸出1 03之閘信號,並且NM0S電晶體86接收來自NOR閘 84之輸出105之閘信號。由PM0S85及NM0S電晶體86所形成 之反相裔在節點8 8產生一輸出信號,其予以發送至輸出插 腳 1 0 0。 同步不變性記憶體裝置區塊之控制邏輯電路g 〇包括一反 相器93 ’其在一第一輸入端子97接收b〇〇t__BLOCK_ENABLE k 3虎’並在其輸出端子1 q 2產生一中間控制信號。一 N A N D 閘92有一第一輸入端子112耦合至第一反相器93之輸出端A serial number 'and receives an input signal 81 at a second input terminal 81. A second gate signal is generated at the output 103 of the gate 82. The two gate signals are supplied to a gate of a CMOS (metal oxide semiconductor) inverter composed of a PMOS transistor 85 and an NMOS transistor 86. The PM0S transistor 85 receives the gate signal of the output 103 from the NAND gate 82, and the NMOS transistor 86 receives the gate signal of the output 105 from the NOR gate 84. The inverting line formed by the PM0S85 and the NMOS transistor 86 generates an output signal at the node 88, which is sent to the output pin 1 0 0. The control logic circuit g of the invariant memory device block includes an inverter 93 'which receives b00t__BLOCK_ENABLE k 3 tiger' at a first input terminal 97 and generates an intermediate control at its output terminal 1 q 2 signal. A N A N D gate 92 has a first input terminal 112 coupled to the output terminal of the first inverter 93
C:\2D-CODE\91-03\90132547.ptd 541538 五、發明說明(7) 子1 0 2,並接收中間控制信號1 〇 2,並且也在一第二輸入端 子91接收第一輸入信號。NAND閘在NAND輸出1〇4產生一第 一閘信號。一NOR閘94在一第一輸入端子97接收BOOT — BLOCK一ΕΝ ABLE信號,並在一第二輸入端子91接收輸入信 號。N 0 R閘9 4在其輸出1 〇 6產生一第二閘信號。第一閑 信號進行至一PM0S電晶體95之閘端子,並且第二閘信號進 行至一NM0S電晶體96之閘端子。PM0S電晶體95及NM0S電晶 體96形成一反相器,其在節點98產生一進行至輸出插腳 1 00之輸出。 以上說明輸入端子87及97直接接收B〇〇T—BL〇CK —ENABLE:如 L號。或則,輸入端子87,97也可接收信號,其為BOOT — BLOCK —ENABLE信號與其他邏輯控制信號邏輯合併之結果。 在起動非同步啟動區塊時,B〇〇T_BL〇CK — ENABLE信號將 為在邏輯高,並且將會允許輸入信號控制邏輯電路,以在 BOOT一BLOCK一ENABLE信號在邏輯高將會關閉邏輯電路9〇之 相同時間驅動輸出1 〇 〇,因而中止輸出缓衝器及同步主記 憶體區塊。在未起動非同步啟動區塊時,b〇〇t_bl〇ck — ENABLE信號將為在一邏輯低值,因而將會中止非同步啟動 區塊8 0之輸出緩衝器,並且將會啟動至同步主記憶體區塊 之輸出緩衝器9 0之低信號。因此,即使二輸出緩衝器均驅他 動輸出墊片1 0 0,但在任一時間僅將允許一輸出緩衝器驅 動塾片’並且另一緩衝器將會在一種三態模式。即使在同 步記憶體區塊已操作後,這也允許啟動及中止非同步啟動 區塊。C: \ 2D-CODE \ 91-03 \ 90132547.ptd 541538 V. Description of the invention (7) Sub 1 0 2 and receive the intermediate control signal 1 0 2 and also receive the first input signal at a second input terminal 91 . The NAND gate generates a first gate signal at the NAND output 104. A NOR gate 94 receives a BOOT_BLOCK_ENABLE signal at a first input terminal 97, and receives an input signal at a second input terminal 91. The N 0 R gate 9 4 generates a second gate signal at its output 106. The first idle signal goes to the gate terminal of a PMOS transistor 95, and the second go signal goes to the gate terminal of a NMOS transistor 96. The PM0S transistor 95 and the NMOS transistor 96 form an inverter which generates an output at the node 98 which proceeds to the output pin 100. The above description input terminals 87 and 97 directly receive BOOT_BLOK_ENABLE: such as L number. Or, the input terminals 87 and 97 can also receive signals, which are the result of the logical combination of the BOOT — BLOCK —ENABLE signal and other logic control signals. When starting the asynchronous start block, BOOT_BL〇CK — the ENABLE signal will be at logic high, and will allow the input signal to control the logic circuit, so that the logic circuit will be closed when the BOOT_BLOCK_ENABLE signal is at logic high The output 100 is driven at the same time as 90, so the output buffer and the main memory block are suspended. When the asynchronous start block is not started, the b00t_block — ENABLE signal will be at a logic low value, so the output buffer of the asynchronous start block 80 will be suspended, and it will start to the synchronous master. Low signal in the output buffer of the memory block. Therefore, even if both output buffers drive the other output pads 100, only one output buffer will be allowed to drive the chip at any one time and the other buffer will be in a tri-state mode. This allows starting and aborting asynchronous start blocks even after the sync memory block has been operated.
C:\2D-CODE\91-03\90132547.ptd 第10頁 541538 反、發明說明 (8) 元件編號之說明 20 不變性記憶體裝置 21 輸入插腳 23 正規同步不變性記憶體區塊 25 非同步啟動區塊號 27 輸出插腳 31 信號線 32 啟動區塊啟動信號 33 信號線 35 反相 41 信號 42 程式設計/擦除選擇 43 記憶體區域 44 行選擇 45 感測放大器 46 測試模式輸出緩衝器 4 7 X-解碼器 48 y -解碼器 49 區塊 50 輸出信號 60 X-解碼器邏輯電路 61 輸入端子 65 NAND(’,反及丨,)閘 66 反相器 ❿C: \ 2D-CODE \ 91-03 \ 90132547.ptd Page 10 541538 Anti-invention description (8) Description of component number 20 Invariant memory device 21 Input pin 23 Regular synchronization invariant memory block 25 Asynchronous Start block number 27 Output pin 31 Signal line 32 Start block start signal 33 Signal line 35 Invert 41 Signal 42 Programming / erase selection 43 Memory area 44 Line selection 45 Sense amplifier 46 Test mode output buffer 4 7 X-decoder 48 y-decoder 49 block 50 output signal 60 X-decoder logic circuit 61 input terminal 65 NAND (', inverse and 丨,) gate 66 inverter ❿
C:\2D-CODE\91-03\90132547.ptd 第11頁 541538 五、發明說明(9) 67 輸入 端 子 68 輸出 端 子 69 輸入 端 子 70 X-解 碼 器 電 路 區 塊 71 輸入 端 子 72 反相 75 NAND 閘 76 反相 器 77 輸入 端 子 78 輸出 79 輸入 端 子 80 輸出 緩 衝 器 控 制 邏 輯 電 路 81 第二 入 端 子 82 NAND 閘 83 第一 反 相 器 84 NOR( π或非” )閘 85 PMOS 電 晶 體 86 NMOS 電 晶 體 87 輸入 端 子 88 緩衝 器 之 出 90 輸出 緩 衝 器 控 制 邏 輯 電 路 91 第二 fm 入 端 子 92 NAND 閘 93 第一 反 相 器 <1C: \ 2D-CODE \ 91-03 \ 90132547.ptd Page 11 541538 V. Description of the invention (9) 67 Input terminal 68 Output terminal 69 Input terminal 70 X-decoder circuit block 71 Input terminal 72 Inverted 75 NAND Gate 76 Inverter 77 Input terminal 78 Output 79 Input terminal 80 Output buffer control logic circuit 81 Second input terminal 82 NAND Gate 83 First inverter 84 NOR (π or not) Gate 85 PMOS transistor 86 NMOS Crystal 87 Input terminal 88 Out of buffer 90 Output buffer control logic 91 Second fm input terminal 92 NAND gate 93 First inverter < 1
C:\2D-CODE\91-03\90132547.ptd 第12頁 541538 五、發明說明(ίο) 94 _閘 95 PMOS電晶體 96 NMOS電晶體 97 輸入端子 98 緩衝器之輸出節點 100 輸出插腳 101 輸出端子 102 輸出端子 103 iA. iLi 104 NAND輸出 105 NOR閘輸出 106 輸出 108 第一輸入端子 110 第二輸入端子 111 第一輸入端子 112 第一輸入端子 <1C: \ 2D-CODE \ 91-03 \ 90132547.ptd Page 12 541538 V. Explanation of the invention (ίο) 94 _Gate 95 PMOS transistor 96 NMOS transistor 97 input terminal 98 buffer output node 100 output pin 101 output Terminal 102 Output terminal 103 iA. ILi 104 NAND output 105 NOR gate output 106 Output 108 First input terminal 110 Second input terminal 111 First input terminal 112 First input terminal < 1
C:\2D-CODE\91-03\90132547.ptd 第13頁 541538 圖式簡單說明 圖1為本發明之同步不變性記憶體裝置之方塊圖。 圖2為非同步啟動區塊之方塊圖。 圖3為在非同步啟動區塊中,一 X -解碼器電路區塊之電 路圖。 圖4為在主記憶體區塊中,一 X -解碼器電路之電路圖。 圖5為啟動區塊及主記憶體區塊之輸出緩衝器之電路圖C: \ 2D-CODE \ 91-03 \ 90132547.ptd Page 13 541538 Brief Description of Drawings Figure 1 is a block diagram of a synchronous invariant memory device of the present invention. Figure 2 is a block diagram of an asynchronous boot block. Figure 3 is a circuit diagram of an X-decoder circuit block in the asynchronous start block. FIG. 4 is a circuit diagram of an X-decoder circuit in a main memory block. Figure 5 is a circuit diagram of the output buffer of the boot block and the main memory block
C:\2D-C0DE\91-03\90132547.ptd 第14頁C: \ 2D-C0DE \ 91-03 \ 90132547.ptd Page 14
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