TW526334B - Test socket - Google Patents
Test socket Download PDFInfo
- Publication number
- TW526334B TW526334B TW088118949A TW88118949A TW526334B TW 526334 B TW526334 B TW 526334B TW 088118949 A TW088118949 A TW 088118949A TW 88118949 A TW88118949 A TW 88118949A TW 526334 B TW526334 B TW 526334B
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- socket
- integrated circuit
- circuit board
- plunger
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
- H01R11/18—End pieces terminating in a probe
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Connecting Device With Holders (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US18473298A | 1998-11-02 | 1998-11-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW526334B true TW526334B (en) | 2003-04-01 |
Family
ID=22678114
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW088118949A TW526334B (en) | 1998-11-02 | 1999-12-07 | Test socket |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP3087965B2 (ja) |
KR (1) | KR20000035134A (ja) |
DE (1) | DE19954041A1 (ja) |
TW (1) | TW526334B (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI550286B (zh) * | 2015-06-18 | 2016-09-21 | Test equipment for electronic components | |
TWI567395B (zh) * | 2016-05-06 | 2017-01-21 | 致茂電子股份有限公司 | 電流探針 |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4197659B2 (ja) | 2003-05-30 | 2008-12-17 | 富士通マイクロエレクトロニクス株式会社 | 電子部品用コンタクタ及びこれを用いた試験方法 |
JP3791689B2 (ja) * | 2004-01-09 | 2006-06-28 | 日本電子材料株式会社 | プローブカード |
KR100654492B1 (ko) | 2005-02-01 | 2006-12-05 | 주식회사 대양기전 | 검사소켓이 슬라이드접촉에 적합한 시소 프로브유니트 |
DE102005030550B3 (de) * | 2005-06-22 | 2006-10-26 | JHS Technik Josef Schäfer | Vorrichtung zum Prüfen von bestückten oder unbestückten Leiterplatten |
DE102005030551B3 (de) * | 2005-06-22 | 2007-01-04 | JHS Technik Josef Schäfer | Vorrichtung zum Übertragen von elektrischen Signalen zwischen einem Tester und einem Prüfadapter |
KR100890975B1 (ko) | 2008-01-08 | 2009-03-27 | 주식회사 휴먼라이트 | 칩 검사장치 |
DE102008008810B4 (de) * | 2008-02-12 | 2012-03-29 | Ep Ants Gmbh | Sockel für ein elektronisches Bauelement, Verfahren zum Bestücken eines Sockels und Verfahren zum Kontaktieren eines elektronischen Bauelements |
WO2017060946A1 (ja) * | 2015-10-05 | 2017-04-13 | ユニテクノ株式会社 | 検査用基板 |
JP7467110B2 (ja) * | 2019-12-26 | 2024-04-15 | 株式会社エンプラス | Icソケット |
US11293976B1 (en) * | 2020-09-25 | 2022-04-05 | Essai, Inc. | Integrated circuit device test tooling with dual angle cavities |
JP7453891B2 (ja) * | 2020-10-06 | 2024-03-21 | 日本航空電子工業株式会社 | 電気部品検査器具 |
-
1999
- 1999-11-01 KR KR1019990047926A patent/KR20000035134A/ko not_active Application Discontinuation
- 1999-11-01 JP JP11310660A patent/JP3087965B2/ja not_active Expired - Fee Related
- 1999-11-02 DE DE19954041A patent/DE19954041A1/de not_active Withdrawn
- 1999-12-07 TW TW088118949A patent/TW526334B/zh active
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI550286B (zh) * | 2015-06-18 | 2016-09-21 | Test equipment for electronic components | |
TWI567395B (zh) * | 2016-05-06 | 2017-01-21 | 致茂電子股份有限公司 | 電流探針 |
Also Published As
Publication number | Publication date |
---|---|
KR20000035134A (ko) | 2000-06-26 |
DE19954041A1 (de) | 2000-05-11 |
JP3087965B2 (ja) | 2000-09-18 |
JP2000162270A (ja) | 2000-06-16 |
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