TW434196B - Selective etching of silicate - Google Patents
Selective etching of silicate Download PDFInfo
- Publication number
- TW434196B TW434196B TW087103296A TW87103296A TW434196B TW 434196 B TW434196 B TW 434196B TW 087103296 A TW087103296 A TW 087103296A TW 87103296 A TW87103296 A TW 87103296A TW 434196 B TW434196 B TW 434196B
- Authority
- TW
- Taiwan
- Prior art keywords
- etching
- silicon dioxide
- silicate glass
- solution
- silicate
- Prior art date
Links
- 238000005530 etching Methods 0.000 title abstract description 38
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 title description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 50
- 239000000203 mixture Substances 0.000 abstract description 29
- 238000000034 method Methods 0.000 abstract description 24
- 239000000377 silicon dioxide Substances 0.000 abstract description 24
- 235000012239 silicon dioxide Nutrition 0.000 abstract description 24
- 239000005368 silicate glass Substances 0.000 abstract description 18
- 150000001875 compounds Chemical class 0.000 abstract description 15
- 239000003960 organic solvent Substances 0.000 abstract description 14
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 abstract description 7
- 150000002148 esters Chemical class 0.000 abstract description 4
- 150000001299 aldehydes Chemical class 0.000 abstract description 3
- 150000001412 amines Chemical class 0.000 abstract description 3
- 150000002576 ketones Chemical class 0.000 abstract description 3
- 150000002596 lactones Chemical class 0.000 abstract description 3
- 239000002904 solvent Substances 0.000 abstract description 3
- 150000001298 alcohols Chemical class 0.000 abstract description 2
- 150000008282 halocarbons Chemical class 0.000 abstract description 2
- HXJUTPCZVOIRIF-UHFFFAOYSA-N sulfolane Chemical class O=S1(=O)CCCC1 HXJUTPCZVOIRIF-UHFFFAOYSA-N 0.000 abstract description 2
- 150000007984 tetrahydrofuranes Chemical class 0.000 abstract description 2
- 150000003949 imides Chemical class 0.000 abstract 1
- 239000000243 solution Substances 0.000 description 22
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 17
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 12
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 10
- -1 fluoride ions Chemical class 0.000 description 10
- 229910052731 fluorine Inorganic materials 0.000 description 10
- 239000011737 fluorine Substances 0.000 description 10
- RUOJZAUFBMNUDX-UHFFFAOYSA-N propylene carbonate Chemical compound CC1COC(=O)O1 RUOJZAUFBMNUDX-UHFFFAOYSA-N 0.000 description 10
- 239000011521 glass Substances 0.000 description 8
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 6
- BGTOWKSIORTVQH-UHFFFAOYSA-N cyclopentanone Chemical compound O=C1CCCC1 BGTOWKSIORTVQH-UHFFFAOYSA-N 0.000 description 6
- QQVIHTHCMHWDBS-UHFFFAOYSA-N isophthalic acid Chemical compound OC(=O)C1=CC=CC(C(O)=O)=C1 QQVIHTHCMHWDBS-UHFFFAOYSA-N 0.000 description 6
- QPJVMBTYPHYUOC-UHFFFAOYSA-N methyl benzoate Chemical compound COC(=O)C1=CC=CC=C1 QPJVMBTYPHYUOC-UHFFFAOYSA-N 0.000 description 6
- XNGIFLGASWRNHJ-UHFFFAOYSA-N phthalic acid Chemical compound OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 description 6
- KKEYFWRCBNTPAC-UHFFFAOYSA-N Terephthalic acid Chemical compound OC(=O)C1=CC=C(C(O)=O)C=C1 KKEYFWRCBNTPAC-UHFFFAOYSA-N 0.000 description 5
- 150000003839 salts Chemical class 0.000 description 5
- DDFHBQSCUXNBSA-UHFFFAOYSA-N 5-(5-carboxythiophen-2-yl)thiophene-2-carboxylic acid Chemical compound S1C(C(=O)O)=CC=C1C1=CC=C(C(O)=O)S1 DDFHBQSCUXNBSA-UHFFFAOYSA-N 0.000 description 4
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 4
- 239000002253 acid Substances 0.000 description 4
- 229910052796 boron Inorganic materials 0.000 description 4
- 235000012431 wafers Nutrition 0.000 description 4
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 3
- WVDDGKGOMKODPV-UHFFFAOYSA-N Benzyl alcohol Chemical compound OCC1=CC=CC=C1 WVDDGKGOMKODPV-UHFFFAOYSA-N 0.000 description 3
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 229910052787 antimony Inorganic materials 0.000 description 3
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 3
- 230000002079 cooperative effect Effects 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 3
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 3
- 125000004494 ethyl ester group Chemical group 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 229940095102 methyl benzoate Drugs 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- ANOBYBYXJXCGBS-UHFFFAOYSA-L stannous fluoride Chemical compound F[Sn]F ANOBYBYXJXCGBS-UHFFFAOYSA-L 0.000 description 3
- 229960002799 stannous fluoride Drugs 0.000 description 3
- XDOFQFKRPWOURC-UHFFFAOYSA-N 16-methylheptadecanoic acid Chemical compound CC(C)CCCCCCCCCCCCCCC(O)=O XDOFQFKRPWOURC-UHFFFAOYSA-N 0.000 description 2
- JWUJQDFVADABEY-UHFFFAOYSA-N 2-methyltetrahydrofuran Chemical compound CC1CCCO1 JWUJQDFVADABEY-UHFFFAOYSA-N 0.000 description 2
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 2
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- 229910052785 arsenic Inorganic materials 0.000 description 2
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 2
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 description 2
- BVKZGUZCCUSVTD-UHFFFAOYSA-N carbonic acid Chemical compound OC(O)=O BVKZGUZCCUSVTD-UHFFFAOYSA-N 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 150000002221 fluorine Chemical class 0.000 description 2
- 150000002222 fluorine compounds Chemical class 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- BDJRBEYXGGNYIS-UHFFFAOYSA-N nonanedioic acid Chemical compound OC(=O)CCCCCCCC(O)=O BDJRBEYXGGNYIS-UHFFFAOYSA-N 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
- 239000011574 phosphorus Substances 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- FOWDZVNRQHPXDO-UHFFFAOYSA-N propyl hydrogen carbonate Chemical group CCCOC(O)=O FOWDZVNRQHPXDO-UHFFFAOYSA-N 0.000 description 2
- 150000003335 secondary amines Chemical class 0.000 description 2
- 150000004760 silicates Chemical class 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 239000002689 soil Substances 0.000 description 2
- 150000003512 tertiary amines Chemical class 0.000 description 2
- RPAJSBKBKSSMLJ-DFWYDOINSA-N (2s)-2-aminopentanedioic acid;hydrochloride Chemical class Cl.OC(=O)[C@@H](N)CCC(O)=O RPAJSBKBKSSMLJ-DFWYDOINSA-N 0.000 description 1
- KVGZZAHHUNAVKZ-UHFFFAOYSA-N 1,4-Dioxin Chemical compound O1C=COC=C1 KVGZZAHHUNAVKZ-UHFFFAOYSA-N 0.000 description 1
- PVOAHINGSUIXLS-UHFFFAOYSA-N 1-Methylpiperazine Chemical compound CN1CCNCC1 PVOAHINGSUIXLS-UHFFFAOYSA-N 0.000 description 1
- RILZRCJGXSFXNE-UHFFFAOYSA-N 2-[4-(trifluoromethoxy)phenyl]ethanol Chemical compound OCCC1=CC=C(OC(F)(F)F)C=C1 RILZRCJGXSFXNE-UHFFFAOYSA-N 0.000 description 1
- 239000005711 Benzoic acid Substances 0.000 description 1
- 102000004190 Enzymes Human genes 0.000 description 1
- 108090000790 Enzymes Proteins 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 1
- 241000220317 Rosa Species 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- COOGPNLGKIHLSK-UHFFFAOYSA-N aluminium sulfide Chemical class [Al+3].[Al+3].[S-2].[S-2].[S-2] COOGPNLGKIHLSK-UHFFFAOYSA-N 0.000 description 1
- GUNJVIDCYZYFGV-UHFFFAOYSA-K antimony trifluoride Chemical compound F[Sb](F)F GUNJVIDCYZYFGV-UHFFFAOYSA-K 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 235000010233 benzoic acid Nutrition 0.000 description 1
- 235000019445 benzyl alcohol Nutrition 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229930188620 butyrolactone Natural products 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 201000010099 disease Diseases 0.000 description 1
- 208000037265 diseases, disorders, signs and symptoms Diseases 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 238000004945 emulsification Methods 0.000 description 1
- 235000019152 folic acid Nutrition 0.000 description 1
- 150000002240 furans Chemical class 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 235000011187 glycerol Nutrition 0.000 description 1
- 210000004251 human milk Anatomy 0.000 description 1
- 235000020256 human milk Nutrition 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 150000002466 imines Chemical class 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 229920005862 polyol Polymers 0.000 description 1
- 150000003077 polyols Chemical class 0.000 description 1
- HNJBEVLQSNELDL-UHFFFAOYSA-N pyrrolidin-2-one Chemical compound O=C1CCCN1 HNJBEVLQSNELDL-UHFFFAOYSA-N 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000005496 tempering Methods 0.000 description 1
- 150000003504 terephthalic acids Chemical class 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- BZWNJUCOSVQYLV-UHFFFAOYSA-H trifluoroalumane Chemical compound [F-].[F-].[F-].[F-].[F-].[F-].[Al+3].[Al+3] BZWNJUCOSVQYLV-UHFFFAOYSA-H 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31105—Etching inorganic layers
- H01L21/31111—Etching inorganic layers by chemical means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C15/00—Surface treatment of glass, not in the form of fibres or filaments, by etching
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K13/00—Etching, surface-brightening or pickling compositions
- C09K13/04—Etching, surface-brightening or pickling compositions containing an inorganic acid
- C09K13/08—Etching, surface-brightening or pickling compositions containing an inorganic acid containing a fluorine compound
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Materials Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Surface Treatment Of Glass (AREA)
- Weting (AREA)
Description
經濟部中央標準局員工消費合作社印製 4,3f4^f 96 a? B7 五、發明説明( 1 .技術範園 本發明是關於矽酸鹽之選擇性蝕刻,特別是以高於二氧 化矽的速率選擇性蝕刻矽酸鹽。此外,本發明關於以高於 二氧化矽的速率選擇性蝕刻矽酸鹽之蝕刻組成物。 2.背景技藝 在微電子元件製程中,如積體電路的製備及晶片的封裝 (用於晶片的連接與保護)等包含許多步驟,其中之一為蚀 刻製程’因此過去發展出許多不同用來除去有時為特定區 域材料的姓刻製程並有不同程度之應用。不同層之蚀刻, 例如在積體電路晶片的製造中,為所有步驟中最嚴苛且重 要的步驟。 在欢蝕刻層表面上覆蓋適當的遮罩,再將該表面與遮罩 一齊浸入能攻擊表面而造成蝕刻的化學溶液,保持遮軍完 整而最多僅會蝕刻該層其他材料之最小範園。 當二氧化矽與矽酸鹽破璃同時共存在同—層而暴露在用 來蝕刻矽酸鹽玻璃的組成物時,會凸顯出選擇性的問題’ 這需要優異的洗淨液或蝕刻液,在蝕刻矽酸鹽玻璃及二氧 化矽兩者間有非常高的選擇性。 因此希望能提供一個具選擇性的蝕刻程序,對矽酸鹽有 很鬲的選擇性而能達成優異的移除效果^ 3 .發明概述 本發明是關於料鹽玻璃之選擇性蚀刻H本發明方 =括以含有約0.05至約3莫耳/每升溶液之含氟化:物與 有機洛劑之㈣线物接觸切㈣與二氧切的物件, -4- ---------¾------1T------.^ (請先閲讀背面之注意事項再填本頁) 本紐尺度翻 t("cNS ) Mim ( 210 X 297¾- 4341 經濟部中央橾準局員工消費合作杜印装 A7 B7 五、發明説明(2 ) 藉此以1¾於一乳化梦的速率選擇性蚀刻碎酸鹽玻璃。 此外,本發明關於較佳的蝕刻組成物,能夠以高於二氧 化矽的速率選擇性蝕刻矽酸鹽玻璃。本發明之較佳组成物 為約0,05至約3莫耳/每升溶液的含氟化合物、有機溶劑及 約0.05至約3莫耳/每升溶液的水。 本發明中的有機溶劑基本上有相當高的閃火點,並能降 低组成物的黏度。合適溶劑包括:喳吩烷(su〖f〇lanes)、呋 喃烷(oxolanes)、酯類、酮類、醛類、内酯類、鹵化烴 類、單元酵類、胺類及醯亞胺類。 由後續僅顯示及描述本發明較佳具體實施例的詳細描 述,對於熟知此項技藝者只需為實現本發明而想像最佳模 式之例證’本發明的其它目的與優點變得顯而易見。明瞭 本發明後,本發明可以有其他不同的具體實施例,且本發 明的一些細節可在不同明顯的觀點下修改,並不會達背本 發明。因此,文件中的圖文僅為說明性質,而不作為本發 明之限制。 4 .實現本發明的最佳與多種模式 本發明是關於矽酸鹽玻璃之選擇性蝕刻,特別是滲雜有 硼、砷、銻及/或磷的矽酸鹽玻璃。根據本發明,欲蝕刻 的已滲雜矽酸鹽玻璃’典型均含有約〇 5至约1 〇重量百分 比,較佳者為含有3至約7重量百分比的摻雜物。此外,含 有矽酸鹽的物件均會含有二氧化矽,其中矽酸鹽與二氧化 矽都會同時與蝕刻组成物接觸。本發明提供能夠有選擇性 的敍刻矽酸鹽破璃之速率至少較二氧化矽為快丨〇〇倍。二 -5- 本紙張尺度適用中國國家標隼(CNS ) A4規格(210X297公竣) ---------拉衣------1T------0 _ (诗先閲讀背面之注意事項再本頁) Α7 Β7 經濟部中央標準局員工消費合作社印製 五、發明説明(3 ) ,化矽以高去、度二氧化矽為較佳,所謂高密度二氧化矽為 為,成—氧化矽或是熱回火後經化學氣相沉積(C V D)或物 理氣相沉積(PVD)所長成的。 根據本發明之蝕刻組成物包括含氟化合物及有機溶劑, 蚀刻沒成物中含氟化合物的含量為約0.05至約3莫耳/每升 :'、、、·較佳為约〇.2至約2.5莫耳/每升溶液,更佳為约0.25 至约1.5莫耳/每升溶液。 △根據本發明,典型提供氟離子來源的化合物如:氫氟 臥、氟化銨 '氟硼酸鹽、氟硼酸 '二氟化錫' 氟化銻、四 氟硼酸四丁基銨及六氟化鋁,亦可使用脂肪族一級、二級 或三級胺之氟鹽,其通式如下: 1 ( 3)反2其中Rl'^2及Κ·3分別代表氫或燒基。一般 而言,R,、及R3的總碳原子數為丨2個或更少。較佳的 氟化物為氳氟酸及氟化按。 氫氟酸一般以49重量百分比水溶液使用。 合適的有機化合物包括:呋喃烷(〇x〇lanes)、噻吩烷 (sulfolanes)、酯類、酮類、醛類、内酯類、鹵化溶劑類、 胺類醯亞胺類及單元醇類《合適的酯類為碳酸、安息香 酸、苯二酸 '異苯二酸及對苯二酸之酯化物,特別是匸ι-ί:6燒基酷 。較佳的 有機溶劑為伸 丙基碳酸酯、 N-甲 基吡咯 啶酮、r -丁内酯 '二氣甲烷、芊醇、Ν•甲醯嗎啉、以_甲 基哌哫'環己酮、環戊酮、苯甲酸甲基酯'二乙二醇二甲 醚、2 -甲基四里呋喃及苯二酸、異苯二酸及對苯二酸之甲 基與乙基酯化物,根據本發明’更佳者為伸丙基碳酸酯、 -6- 本紙張尺度適用中囷國家標準(CNS ) Α4規格(210:)< 297公廣) (請先閲讀背面之注意事項再填,ΐ€本頁) 訂 經濟部中夹樣率局員工消费合作社印製 4-34 β Α7 ------Β7 五、發明説明(4 ) Ν·甲基吡咯啶酮及7_丁内酷’更佳者為伸丙基碳酸醋。 :用於本發明之有機溶劑提供低黏度组成物,使組成物 ^ 喟牧1 j饿刻均勻性^與使用如甘油及 甘醇的多元醇相較下尤然。 根據本發明的較佳狀沉,該組成物亦包括水。若水存在 時,其-般為約0.05至約3.5莫耳/每升溶液,較佳為約〇2 至約2.9莫耳/每升溶液,更佳為01至約1.7莫耳的莫耳/每 升溶液。然而,應當瞭解的是本發明的組成物並不需要 水。 本發明的蝕刻方法一般是在約201至約9{rc的溫度下實 施,較佳為約3〇t至约7(TC。利用提高溫度可增加矽酸鹽 及二氧化矽的蝕刻速率,矽酸鹽經由提高溫度所增加的蝕 刻速率會略高於二氧化矽經由提高溫度所增加的蝕刻速 率,因此略微增加蚀刻碎酸鹽的選擇性。 下列非限制實例更進一步說明本發明。 皇例丄-以1體積份量的49重量百分比氫氟酸水溶液碳酸 與28體積份量伸丙基碳酸酯摻和,形成】莫耳氫氣酸溶於 伸丙基碳酸酯溶液,製成蝕刻組成物。以此蝕刻組成物接 觸毯覆性矽晶圓,該晶圓為交錯於摻雜6重量百分比硼的 矽酸鹽玻璃之下的氮化矽層’該氮化矽層之下尚有熱長成 二氧化矽層。該物件包括通道,因此下層的氮化矽及二氧 化矽通道壁會暴露於蝕刻液。蝕刻在室溫下發生,蝕刻液 以約每分鐘125毫微米的速率蝕刻已摻雜硼的矽酸鹽玻 璃,而僅以約每分鐘0.6毫微米的速率蝕刻二氧化矽。使得 -7- 本紙張尺度適用中國國家標準(CNS ) A4規格(210X 297公釐) ---------^------#-------^ (請先閱讀背面之:沒意事項再垓爲本頁) A7 ____B7 五、發明説明(5 ) 已摻雜硼的矽酸鹽玻璃相對於二氧化矽之姑刻選擇性超過 200 : 1 〇 ^11-將實例1中的溶液之水含量提高至兩倍,並重覆實 施實例1,則本组成物以約每分鐘140毫微米的速率蝕刻已 摻雜棚的矽酸鹽玻璃’而僅以約每分鐘12毫微米的速率蝕 刻一乳化砂’因此触刻速率的選擇性約為115 : 1。 f例3 -重覆實例1 ’但以1體積份量的49重量百分比氫氟 勤·水土液與115體積份量伸丙基碳酸g旨捧和,製成钱刻組 成物,並在60°C下進行蝕刻。矽酸鹽玻璃的蝕刻速率為每 分鐘6 15埃’二氧化矽的蝕刻速率為每分鐘3.6埃,因此蝕 刻速率的選擇性約為1 70 : 1。 在本文中僅顯示及描述本發明較佳具體實施例,但是如 前所述,本發明可以有許多不同的组合,環境亦可變更或 是在本發明所提及的原創性觀念下進行修改° ---------^-------ΐτ-------0 (請先閱讀背面之注意事項再禎寫本頁) 經濟部中央樣準局員工消費合作杜印製 本紙張尺度適用中國國家標準(CNS } A4規格(210X297公釐) 434 434
^ b 第87〖〇3296號專利中請案 申請專利範圍修正本(90年1月) 申請專利範圍 1· 一種選擇性蝕刻;δ夕酸鹽玻璃的方法,包括令含該矽酸鹽 玻璃及二氧化矽的物件與含有〇.05至3莫耳/每升溶液含 氟化合物及有機溶劑之蝕刻组成物接觸,藉此以高於二 氧化矽的速率選擇性蝕刻該矽酸鹽破璃,其中該有機溶 费1係選自包括伸丙基碳酸§旨、Ν -甲基η比洛症網' γ - 丁 内^、一乳甲娱、+醇、Ν -甲酿嗎11 林、Ν -曱基σ泉淀、環 己鲷、環戊酮、苯甲酸曱基酯、二乙二醇二曱醚、2_甲 基四氫呋喃及苯二酸、異苯二酸及對苯二酸之甲基與乙 基酯化物’及其中該含氟化合物係選自包括氫氟酸、氟 化録、氟硼酸鹽、氟硼酸、二氟化錫、氟化銻'四氟硼 酸四丁基銨六氟化鋁’及脂肪族一級'二級或三級胺之 氟鹽。 2.根據申請專利範圍第1項之方法,其中該硬酸鹽玻璃為 至少摻雜一種硼、砷、銻及磷之矽酸鹽玻璃。 根據申請專利範圍第1項之方法,其中該石夕酸鹽玻璃為 捧棚玻璃。 4. 根據申請專利範圍第1項之方法’其中該有機溶劑係選 自包括伸丙基碳酸酯、ν -甲基吡咯啶酮、r _ 丁内醋, 5. 根據申請專利範圍第1項之方法’其中該有機溶劑為伸 丙基碳酸酷β 6·根據申請專利範園第1項之方法,其中該含氟化合物為 氫氟酸或氟化銨. 7.根據申請專利範園第1項之方法’其中該含氟化合物為 氫氟酸。 本紙張MiS财闕家揉準(CNS )从协(21()χ297公着) ---------装-------·ΐτ------^1 (請先聞讀背面之注意ί項再填寫本頁) 經濟部中央標準局負工消費合作社印裝 4341 96 申請專利範圍 :據申請專利範圍第1項之方法,其中該 *度二氧化矽。 氧化矽為高 請專利範圍第8項之方法,”該二氧切選自 氣= 火二氧化― 範圍第8項之方法’其中該二氧化矽為熱 u.根據申請專利範圍第Η之方法,其中語 水 μ組成物另包括 經濟部令央橾準局舅工消費合作社中製 12.根據/請專利範圍第η項之方法,其中水含量為〇. j . 5莫耳/每升溶液。 13‘根據申請專利範圍第Η項 2.9莫耳/每升溶液, R根據中請專利範圍第η項之方法,其中該水之含 0.25至1.7莫耳/每升溶液。 15. 根據申請專利範圍第j項之方法,丨中該氟化物之含量 為〇.2至2.5莫耳/每升j容液。 16. 根據中請專利範圍第1項之方法,纟中該氣化物之含量 為0,25至1.5莫耳/每升溶液。 " 17. 根據申請專利範圍第1項之方法,其中接觸該組成物係 在2 0 °C至9 0 ec的溫度下實施。 18. 根據申請專利範圍第1項之方法,其中接觸該組成物係 在;3 0 °C至7 0 °C的溫度下實施。 19. 一種適合以高於二氧化矽的速率選擇性蝕刻矽酸鹽玫璃 05至 之方法’其中水含量為〇2至 2- 私紙浪Xjt適用中國國家標準(CNS ) A4規格(2丨〇χ297公釐) ---------装-----—-1T------線 (許先閱讀背面之注意事項再填寫本頁) 434196 A8 B8 C8 D8 經濟部令央標準局舅工消费合作社印製 六、申請專利範圍 的蝕刻組成物,其含有〇.〇5至3.0莫耳/每升溶液含氟化 合物,有機溶劑,以及〇.〇5至3,5莫耳/每升溶液的水, 其中效有機溶劑係選自包括伸丙基碳酸酯、N -甲基吡哈 啶酮、r - 丁内酯、二氯甲烷、苄醇' N_甲醯嗎啉、N_ 甲基旅咬' 環己酮、環戊酮、苯甲酸甲基酯、二乙二醇 二甲醚、2 -甲基四氫呋喃及笨二酸、異笨二酸及對苯二 酸之曱基與乙基酯化物’及其中該含氟化合物係選自包 括氫氟酸、氟化銨、氟硼酸鹽、氟硼酸、二氟化錫、氟 化錄、四氟硼酸四丁基銨六氟化鋁’及脂肪族一級、二 級或三級胺之氟鹽。 20-根據申請專利範圍第1 9項之蝕刻组成物,其中該有機溶 劑係選自包括伸丙基碳酸酯、N -曱基吡咯啶酮以及7" _ 丁内酯。 21. 根據申請專利範圍第1 9項之蝕刻组成物,其中該有機溶 劑為伸丙基碳酸酯。 22. 根據申請專利範圍第〖9項之蝕刻組成物,其中該含氟化 合物為氫氟酸或氟化銨。 23. 根據申請專利範圍第〖9項之蝕刻组成物,其中該含氟化 合物為氫氟酸。 24. 根據申請專利範圍第1 9項之蝕刻組成物,其中水含量為 0.2至2.9莫耳/每升溶液。 25-根據申請專利範圍第1 9項之蝕刻组成物,其中該含氟化 合物含量為0.2至2.5莫耳/每升溶液。 26·根據申請專利範圍第1 9項之蝕刻組成物,其中水含量為 本紙張从逍用中國國家揉準(CNS > A娜·( 210X297公董) ---------裝----^—·ΐτ------Φ (請先閎讀背面之注意事項再填寫本頁) 4341 96 A8 BS C8 D8 經濟部中央樣率局員工消費合作杜印製 六、申請專利範圍 0.25至1.7莫耳/每升溶液。27.根據申請專利範圍第1 9項之蝕刻組成物,其中該含氟化 合物含量為0.25至1.5莫耳/每升溶液。 ·ΐτ. 線 (請先閉讀背面之注意事項再填寫本頁) 本紙法尺度逋用中國國家橾準(CNS ) A4規格(210X 297公釐)
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-
1998
- 1998-03-06 TW TW087103296A patent/TW434196B/zh not_active IP Right Cessation
- 1998-04-14 EP EP98302850A patent/EP0887323B1/en not_active Expired - Lifetime
- 1998-04-14 DE DE69801261T patent/DE69801261T2/de not_active Expired - Lifetime
- 1998-05-14 KR KR1019980017437A patent/KR19990006448A/ko active Search and Examination
- 1998-05-21 CN CNB981083374A patent/CN1133600C/zh not_active Expired - Fee Related
- 1998-05-22 MY MYPI98002282A patent/MY118712A/en unknown
- 1998-06-08 JP JP10159678A patent/JP2980585B2/ja not_active Expired - Fee Related
- 1998-06-19 SG SG1998001474A patent/SG77185A1/en unknown
- 1998-12-29 US US09/221,596 patent/US6254796B1/en not_active Expired - Fee Related
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JPH1160275A (ja) | 1999-03-02 |
JP2980585B2 (ja) | 1999-11-22 |
DE69801261D1 (de) | 2001-09-06 |
SG77185A1 (en) | 2000-12-19 |
MY118712A (en) | 2005-01-31 |
EP0887323B1 (en) | 2001-08-01 |
KR19990006448A (ko) | 1999-01-25 |
DE69801261T2 (de) | 2002-05-16 |
EP0887323A1 (en) | 1998-12-30 |
US6254796B1 (en) | 2001-07-03 |
CN1133600C (zh) | 2004-01-07 |
CN1203205A (zh) | 1998-12-30 |
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